CN103094347B - A kind of bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure - Google Patents

A kind of bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure Download PDF

Info

Publication number
CN103094347B
CN103094347B CN201310010494.7A CN201310010494A CN103094347B CN 103094347 B CN103094347 B CN 103094347B CN 201310010494 A CN201310010494 A CN 201310010494A CN 103094347 B CN103094347 B CN 103094347B
Authority
CN
China
Prior art keywords
grid
carbon nanotube
gate structure
effect pipe
nanotube field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201310010494.7A
Other languages
Chinese (zh)
Other versions
CN103094347A (en
Inventor
王伟
夏春萍
肖广然
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nanjing University of Posts and Telecommunications Nantong Institute Limited
Original Assignee
Nanjing Post and Telecommunication University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanjing Post and Telecommunication University filed Critical Nanjing Post and Telecommunication University
Priority to CN201310010494.7A priority Critical patent/CN103094347B/en
Publication of CN103094347A publication Critical patent/CN103094347A/en
Application granted granted Critical
Publication of CN103094347B publication Critical patent/CN103094347B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Abstract

The invention discloses the carbon nanotube field-effect pipe that a kind of bi-material layers owes folded dual material gate structure.This field effect transistor comprises: conducting channel (1), source region (2), drain region (3), grid oxic horizon (4), source electrode (S), drain electrode (D), grid (G), described conducting channel (1), source region (2) and drain region (3) all adopt carbon nano-tube material to make, at described conducting channel (1), source region (2) and drain region (3) are outward, the methods such as atomic deposition are adopted to generate one deck grid oxic horizon (4), layer of metal electrode is precipitated again outward at grid oxic horizon (4), the grid (G) of the carbon nanotube field-effect pipe of folded dual material gate structure is owed as bi-material layers, described grid (G) adopts the conducting metal of two kinds of different work functions to make, form the dual material gate that bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure, there is lower leakage current, higher current on/off ratio, leakage more can be suppressed to cause potential barrier and reduce (DIBL) effect, and better can meet the requirement of ITRS ' 10 related performance indicators.

Description

A kind of bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure
Technical field
The present invention relates to carbon nanotube field-effect pipe field, especially in the structure of carbon nano tube device in the optimization of device performance.
Background technology
From Iijima in 1991 [Iijima S. Helical Microtubules of Graphitic Carbon [J]. Nature, 1991,354 (7): 56-58.] since finding carbon nano-tube, understand its primary attribute and study [the Baughman R H that to make important progress in its potential engineer applied, Zakhidov A A, Heer W A D. Carbon nanotubes-the route toward applications [J]. Science, 2002,297 (5582): 787-792.].Carbon nano-tube (CNT) is the body of seamless, the hollow that the graphene sheet layer formed by carbon atom is rolled into.Its special construction, makes it possess unique character such as electricity, calorifics, mechanics, has important and wide application prospect in nano electron device, field of photovoltaic materials.The carbon nano-tube of different geometry has the band structure of metal mold or semi-conductor type, and metal mold carbon nano-tube can be used as interconnection line, has the advantage that thermal conductivity is high, loss is little; And semiconductor type carbon nano-tube can make active device, such as field effect transistor.This is because carbon nano-tube is compared with usual silica-base material, carrier velocity is very high, can increase current driving ability, improves operating rate and integrated level and cut down power consumption.The high-performance being difficult to realize in usual semiconductor can be reached like this.Such as, use the high frequency and low noise transistor of carbon nano-tube, cut-off frequency [the Lu R F of Terahertz level can be realized, Lu Y P, Lee S Y, et al. Terahertz response in single-walled carbon nanotube transistor:a real-time quantum dynamics simulation [J]. Nanotechnology, 2009,20 (50): 505401 (1-4) .].
First job at room temperature carbon nanotube field-effect pipe (CNTFET) [Tans S J has successfully been made as far back as Tran S J group of TU Delft Polytechnics in 1998, Verschueren A R M, Dekker C. Room-temperature transistor based on a single carbon nanotube [J]. Nature, 1998,393 (7): 49-52.] field effect transistor built based on carbon nano-tube, but in the world is still in the laboratory research stage.Prevailing carbon nanotube field-effect pipe (CNTFET) model having two types at present, one is Schottky barrier CNTFET [Hazeghi A, Krishnamohan T, Wong, H. Schottky-barrier carbon nanotube field-effect transistor modeling [J]. IEEE Transactions on Electron Devices, 2007, 54 (3): 439-445.], in such an embodiment, due to the work function of carbon nano-tube and the work function of both sides electrode different, Schottky barrier is formed in the place of carbon nano-tube two ends and Metal Contact.Just can change this potential barrier by grid voltage, thus control the size of corresponding tunnelling current, because Schottky carbon nanotube field-effect pipe shows dipolar effect, thus greatly reduce device performance.The second is class MOSFET (metal oxide semiconductor field effect tube) type carbon nanotube field-effect pipe [Orouji A A, Arefinia Z. Detailed simulation study of a dual material gate carbon nanotube field-effect transistor [J]. Physica E:Low-dimensional Systems and Nanostructures, 2009, 41 (10): 552-557.], its source electrode, the heavy doping of drain electrode carbon nanotube portion, and be connected with electrode, ohmic contact is made between electrode metal and carbon nano-tube, the work function of doping CNT is different with the work function of raceway groove CNT, potential barrier can be formed in raceway groove after band curvature.
Generally speaking, carbon nano-tube relies on the electrology characteristic of its excellence to have wide prospect in following nanoelectronic application.But because traditional carbon nanotube field-effect pipe there will be bipolar electrode effect, and constantly reduce along with device size, there will be short-channel effect, thus affect device performance.This work, from the angle changing device architecture, proposes a kind of new structure being applicable to improve carbon nanotube field-effect pipe performance.
Summary of the invention
technical problem:the object of the invention is to there will be bipolar electrode effect for traditional carbon nanotube field-effect pipe, and constantly reduce along with device size, there will be short-channel effect and cause device performance decline problem, consider the advantage of owing folded grid (underlap gate) device and dual material gate device, on deficient stacked gate structure basis, grid is adopted to the metal of two kinds of different work functions, to form the dual material gate of MOS, propose the carbon nanometer that a kind of bi-material layers owes folded dual material gate structure
Pipe field effect transistor.
technical scheme:because the current field effect transistor built based on carbon nano-tube is still in the laboratory research stage, for disclosing the Quantum Transport Properties of such device of nanoscale, present invention employs a kind of quantum mechanics model, by being certainly in harmony sub-numerical solution two dimension unbalance distribution (NEGF) equation of full dose and Poisson (Poisson) equation, construct the novel Transport Model of owing folded grid dual material gate CNTFET of the performance being applicable to improve carbon nanotube field-effect pipe, this model comparative analysis is utilized to owe folded grid, the subthreshold slope of dual material gate and deficient folded dual material gate carbon nanotube field-effect pipe, drive current, switch current ratio, drive electric capacity, time delay, and the electrology characteristic such as current gain cutoff frequencies.Result of study shows, owe folded dual material gate device architecture to compare with deficient stacked gate structure with dual material gate device architecture, possesses the advantage of owing folded gate device and dual material gate device, such as: there is lower leakage current, higher current on/off ratio, leakage more can be suppressed to cause potential barrier and to reduce (DIBL) effect, and better can meet the requirement of ITRS ' 10 related performance indicators.
For the depletion region of underlap gate structure after source-contingent charge carrier in conducting channel interface is then widened, extreme influence is transmitted the tunneling rate of charge carrier, reduce the problems such as device on-state performance, on underlap gate architecture basics, grid is adopted to the metal of two kinds of different work functions, to form the dual material gate of MOS, a kind of carbon nanotube field-effect pipe owing folded dual material gate structure is proposed.
The carbon nanotube field-effect pipe that a kind of bi-material layers of the present invention owes folded dual material gate structure comprises: conducting channel, source region, drain region, grid oxic horizon, source electrode, drain electrode, grid; Described conducting channel, source region and drain region all adopt carbon nano-tube material to make, adopt one to levy semiconductor carbon nanometer tube at all, its most mid portion owes the conducting channel of the carbon nanotube field-effect pipe of folded dual material gate structure as bi-material layers, after adopting molecule or metal ion to carry out N-type heavy doping to the two ends of intrinsic semiconductor carbon nano-tube, owe the source region of the carbon nanotube field-effect pipe of folded dual material gate structure, drain region respectively as bi-material layers; Outside described conducting channel, source region and drain region, the methods such as atomic deposition are adopted to generate one deck grid oxic horizon, layer of metal electrode is precipitated again outward at grid oxic horizon, the grid of the carbon nanotube field-effect pipe of folded dual material gate structure is owed as bi-material layers, described grid adopts the conducting metal of two kinds of different work functions to make, and forms the dual material gate that bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure; All there is a segment distance in described source region and drain region with grid respectively, form the deficient folded grid that bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure; Etch source lead hole and drain lead hole respectively being positioned on the grid oxic horizon on source region and drain region, in this source lead hole, prepare described source electrode, the drain electrode in drain lead hole described in preparation; Described grid oxic horizon and grid all in coaxial mode around carbon nano-tube.
Described bi-material layers owes larger than the work function of close drain region metal gate near the metal gate material work function in source region in the dual material gate of the carbon nanotube field-effect pipe of folded dual material gate structure, and the two is isometric, is the half of grid length; The length of described source region and drain region distance grid is respectively l 1, l 2, and l 1with l 2equal; Described source electrode and drain electrode make by conducting metal.
beneficial effect:meaning of the present invention is to improve carbon nano tube device performance, propose the carbon nanotube field-effect pipe that a kind of bi-material layers owes folded dual material gate structure, and based on unbalance distribution (NEGF) equation and Poisson (Poisson) equation, subthreshold slope that folded grid, dual material gate and bi-material layers owe folded dual material gate carbon nanotube field-effect pipe, drive current, switch current ratio, driving electric capacity, time delay are owed in comparative analysis, and the electrology characteristic such as current gain cutoff frequencies.Result of study shows, bi-material layers is owed folded dual material gate device architecture and is compared with deficient stacked gate structure with dual material gate device architecture, possess and owed folded gate device and dual material gate device advantage separately, there is lower leakage current, higher current on/off ratio, leakage more can be suppressed to cause potential barrier and to reduce (DIBL) effect, and better can meet the requirement of ITRS ' 10 related performance indicators.
Accompanying drawing explanation
Fig. 1 vertical cross-section structural representation of the present invention.
Wherein have: conducting channel 1; Source region 2; Drain region 3; Grid oxic horizon 4; Source S; Drain D; Grid G; Distance length between source region and grid l 1; Distance length between drain region and grid l 2.
Embodiment
Thought of the present invention is further described below in conjunction with accompanying drawing.
Fig. 1 is vertical cross-section structural representation of the present invention.
As shown in Figure 1, conducting channel 1, source region 2 and drain region 3 all adopt carbon nano-tube material to make, choose one and levy semiconductor carbon nanometer tube at all, its most mid portion owes the conducting channel 1 of the carbon nanotube field-effect pipe of folded dual material gate structure as bi-material layers, after adopting molecule or metal ion to carry out N-type heavy doping to the two ends of intrinsic semiconductor carbon nano-tube, owe the source region 2 of the carbon nanotube field-effect pipe of folded dual material gate structure, drain region 3 respectively as bi-material layers; Outside conducting channel 1, source region 2 and drain region 3, the methods such as atomic deposition are adopted to generate one deck grid oxic horizon 4, layer of metal electrode is precipitated again outside grid oxic horizon 4, as grid G, grid G adopts the conducting metal of two kinds of different work functions to make, and forms the dual material gate that bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure; All there is a segment distance in source region 2, drain region 3 with grid G, form the deficient folded grid that bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure; Etch source lead hole and drain lead hole respectively being positioned on the grid oxic horizon 4 on source region 2 and drain region 3, in this source lead hole, prepare described source S, in drain lead hole, prepare described drain D; Described grid oxic horizon 4 and grid G all in coaxial mode around carbon nano-tube; Described bi-material layers owes larger than the work function of close drain region 3 metal gate near the metal gate material work function in source region 2 in the dual material gate of the carbon nanotube field-effect pipe of folded dual material gate structure, and the two is isometric, is the half of grid G length; Described source region 2 and drain region 3 are respectively apart from grid G length l 1, l 2, and l 1with l 2equal; Described source S and drain D make by conducting metal.
Bipolar electrode effect is there will be for traditional carbon nanotube field-effect pipe, and constantly reduce along with device size, there will be short-channel effect and cause device performance decline problem, consider the advantage of owing folded grid (underlap gate) device and dual material gate device, propose a kind of new structure being applicable to optimize carbon nano tube device.For disclosing the Quantum Transport Properties of such device of nanoscale, present invention employs a kind of quantum mechanics model, by being certainly in harmony sub-numerical solution two dimension unbalance distribution (NEGF) equation of full dose and Poisson (Poisson) equation, construct the novel Transport Model of owing folded grid dual material gate carbon nanotube field-effect pipe of the performance being applicable to improve carbon nanotube field-effect pipe.
This model is in harmony calculating certainly based on the electromotive force in carbon nanotube field-effect pipe and charge density.Detailed process is a given original trench electromotive force, NEGF equation is utilized to calculate its charge density, again charge density is substituted into Poisson's equation and solve electrostatic potential in carbon nano-tube channel, then again the electromotive force of trying to achieve is substituted in NEGF equation again and calculate, so iterate until obtain self-consistent solution.The calculating of charge density utilizes unbalance distribution method.The sluggish Green's function of device be [DATTA S. Nanoscale device modeling:The Green ' s function method [J]. Superlattices Microstruct, 2000,28 (4): 253 – 278.]:
(1)
In above formula a positive dimensionless, eenergy, h dcarbon pipe regional Electronic the most adjoining like under Hamiltonian, be respectively the self energy item of device source and drain electrode contribution, can be obtained by iteration according to surperficial Green's function.Once obtain Green's function, then in device, the electronics of any position and hole density can try to achieve [VENUGOPAL R according to following formula, PAULSSON M, GOASGUEN S, et al. A simple quantum mechanical treatment of scattering nanoscale transistors [J]. J Appl Phys, 2003,93 (9): 5613-5625.]:
(2)
In formula e ifor the Fermi level of CNT part, e fD (S)for leaking the Fermi level in (source), fermi Dirac distribution function, it is the energy level broadening of source electrode (drain electrode).
The carrier density obtained is updated to self-consistent solution in the Poisson equation of device three-dimensional, the Solving Three-Dimensional poisson Equation of device can be written as with polar coordinates
(3)
In formula ufor electrostatic potential, for dielectric constant, for net charge distribution.
The electromotive force of grid and CNT (carbon nano-tube) contact position ve is determined by Dirichlet boundary condition v=e v g+ Φ cNTΦ g, wherein v gfor grid voltage, Φ cNTwith Φ gbe respectively the work function of CNT (carbon nano-tube) and gate electrode.Do not have the boundary of electrode contact to adopt Neumann boundary condition in source and drain contact zone and other, that is the normal component of borderline potential gradient is zero, to meet the electroneutrality condition of device inside built-in field.
Use this model to obtain channel current to be:
(4)
In above formula eelectron charge, hplanck constant, e fD (S)for leaking the Fermi level in (source), for electronics by the tunnelling coefficient of raceway groove [DATTA S. Nanoscale device modeling:The Green ' s function method [J]. Superlattices Microstruct, 2000,28 (4): 253 – 278.]:
(5)
Utilize quasistatic processing method to assess the high frequency characteristics of carbon nanotube field-effect pipe.The cut-off frequency gram of the intrinsic carbon nano-tube of parasitic capacitance is expressed as:
(6)
Wherein transfer conductance, and be intrinsic gate capacitance, can be expressed as:
(7)
(8)
Wherein, drain current, drain voltage, grid voltage, and it is the total electrical charge of carbon nano-tube.
Under above-mentioned quantum model framework, subthreshold slope that folded grid, dual material gate and bi-material layers owe folded dual material gate carbon nanotube field-effect pipe, drive current, switch current ratio, driving electric capacity, time delay are owed in comparative analysis, and the electrology characteristic such as current gain cutoff frequencies.Result of study shows, bi-material layers is owed folded dual material gate device architecture and is compared with deficient stacked gate structure with dual material gate device architecture, possesses the advantage of owing folded gate device and dual material gate device, such as: there is lower leakage current, higher current on/off ratio, leakage more can be suppressed to cause potential barrier and to reduce (DIBL) effect, and better can meet the requirement of ITRS ' 10 related performance indicators.

Claims (1)

1. bi-material layers owes a carbon nanotube field-effect pipe for folded dual material gate structure, it is characterized in that this field effect transistor comprises: conducting channel (1), source region (2), drain region (3), grid oxic horizon (4), source electrode (S), drain electrode (D), grid (G); Described conducting channel (1), source region (2) and drain region (3) all adopt carbon nano-tube material to make, adopt one to levy semiconductor carbon nanometer tube at all, its most mid portion owes the conducting channel (1) of the carbon nanotube field-effect pipe of folded dual material gate structure as bi-material layers, after adopting molecule or metal ion to carry out N-type heavy doping to the two ends of intrinsic semiconductor carbon nano-tube, owe the source region (2) of the carbon nanotube field-effect pipe of folded dual material gate structure, drain region (3) respectively as bi-material layers; In described conducting channel (1), source region (2) and drain region (3) outward, the methods such as atomic deposition are adopted to generate one deck grid oxic horizon (4), layer of metal electrode is precipitated again outward at grid oxic horizon (4), the grid (G) of the carbon nanotube field-effect pipe of folded dual material gate structure is owed as bi-material layers, described grid (G) adopts the conducting metal of two kinds of different work functions to make, and forms the dual material gate that bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure; All there is a segment distance described source region (2) and drain region (3) with grid (G) respectively, form the deficient folded grid that bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure; Etch source lead hole and drain lead hole respectively being positioned on the grid oxic horizon (4) on source region (2) and drain region (3), in this source lead hole, prepare described source electrode (S), the drain electrode (D) in drain lead hole described in preparation; Described grid oxic horizon (4) and grid (G) all in coaxial mode around carbon nano-tube;
Described bi-material layers owes larger than the work function of close drain region (3) metal gate near the metal gate material work function in source region (2) in the dual material gate of the carbon nanotube field-effect pipe of folded dual material gate structure, and the two is isometric, is the half of grid (G) length; Described source region (2) and drain region (3) distance grid (G) length are respectively l 1, l 2, and l 1with l 2equal; Described source electrode (S) and drain electrode (D) make by conducting metal.
CN201310010494.7A 2013-01-11 2013-01-11 A kind of bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure Active CN103094347B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310010494.7A CN103094347B (en) 2013-01-11 2013-01-11 A kind of bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310010494.7A CN103094347B (en) 2013-01-11 2013-01-11 A kind of bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure

Publications (2)

Publication Number Publication Date
CN103094347A CN103094347A (en) 2013-05-08
CN103094347B true CN103094347B (en) 2015-09-02

Family

ID=48206710

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310010494.7A Active CN103094347B (en) 2013-01-11 2013-01-11 A kind of bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure

Country Status (1)

Country Link
CN (1) CN103094347B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108428738A (en) * 2018-03-27 2018-08-21 南京邮电大学 A kind of deficient stacked gate structure black phosphorus field-effect tube
CN109374712A (en) * 2018-08-29 2019-02-22 南京邮电大学 MOS applied to biosensor2Material dielectric modulates field-effect tube
CN110164958B (en) * 2019-04-25 2020-08-04 华东师范大学 Asymmetric reconfigurable field effect transistor
CN110634946B (en) * 2019-10-28 2023-04-28 中证博芯(重庆)半导体有限公司 Enhanced heterogeneous metal gate AlGaN/GaN MOS-HEMT device and preparation method thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101065811A (en) * 2004-05-25 2007-10-31 国际商业机器公司 Method of fabricating a tunneling nanotube field effect transistor
CN102214694A (en) * 2011-05-30 2011-10-12 西安电子科技大学 Heterogeneous metal stacked grid strained silicon-germanium on insulator p-channel metal oxide semiconductor field effect tube (SSGOI pMOSFET) device structure
CN102629627A (en) * 2012-04-16 2012-08-08 清华大学 Heterogeneous gate tunneling transistor and forming method thereof

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7009265B2 (en) * 2004-06-11 2006-03-07 International Business Machines Corporation Low capacitance FET for operation at subthreshold voltages

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101065811A (en) * 2004-05-25 2007-10-31 国际商业机器公司 Method of fabricating a tunneling nanotube field effect transistor
CN102214694A (en) * 2011-05-30 2011-10-12 西安电子科技大学 Heterogeneous metal stacked grid strained silicon-germanium on insulator p-channel metal oxide semiconductor field effect tube (SSGOI pMOSFET) device structure
CN102629627A (en) * 2012-04-16 2012-08-08 清华大学 Heterogeneous gate tunneling transistor and forming method thereof

Also Published As

Publication number Publication date
CN103094347A (en) 2013-05-08

Similar Documents

Publication Publication Date Title
Lam et al. Device performance of heterojunction tunneling field-effect transistors based on transition metal dichalcogenide monolayer
Cao et al. The future transistors
CN103094347B (en) A kind of bi-material layers owes the carbon nanotube field-effect pipe of folded dual material gate structure
Razavi et al. Influence of channel material properties on performance of nanowire transistors
Dubey et al. A charge plasma-based monolayer transition metal dichalcogenide tunnel FET
Unluer et al. Monolithically patterned wide–narrow–wide all-graphene devices
Li et al. Simulation study on FinFET with tri-material gate
Takiguchi et al. Comparisons of performance potentials of Si and InAs nanowire MOSFETs under ballistic transport
Dargar et al. Analysis of short channel effects in multiple-gate (n, 0) carbon nanotube FETs
CN103247688B (en) A kind of graphene field effect pipe of bi-material layers grid linear doping
Zhang et al. Chemical modification, field effect transistors and voltage-driven spin logic gates of tailored monolayer MoS2 nanoflakes
CN104091829A (en) Bilinear doping drainage heterogeneous material gate oxide layer graphene tunneling field-effect transistor
CN109300985A (en) The single wall MOS of annular grid structure2Nanotube field effect pipe
CN105870170B (en) A kind of schottky junction tunneling field-effect transistor
Van et al. High performance Si nanowire field-effect-transistors based on a CMOS inverter with tunable threshold voltage
Es-Sakhi et al. Multichannel tunneling carbon nanotube field effect transistor (MT-CNTFET)
CN103094349A (en) Three-material heterogeneous grid carbon nano tube field-effect tube with owe gratings
Walia et al. Impact of temperature on the performance of tunnel field effect transistor
Raja Impact of nanoelectronics in the semiconductor field: Past, present and future
Wang et al. Current-voltage spectroscopy of dopant-induced quantum-dots in heavily n-doped junctionless nanowire transistors
Rani et al. Investigation of Schottky barrier, conventional and tunnel carbon nanotube field effect transistor for low power design
Wang et al. High-frequency and switching performance investigations of novel lightly doped drain and source hetero-material-gate CNTFET
Farhana et al. High frequency small signal modeling of CNTFET
Dargar et al. Performance Analysis of High-$ k $ Dielectric Based Double-gate Carbon Nanotube MOSFET
Sadeghi et al. A review on carbon-based materials as on-chip interconnects

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
EE01 Entry into force of recordation of patent licensing contract

Application publication date: 20130508

Assignee: Jiangsu Nanyou IOT Technology Park Ltd.

Assignor: Nanjing Post & Telecommunication Univ.

Contract record no.: 2016320000211

Denomination of invention: Carbon nano tube field effect tube of double-material underlap heterogeneous grid structure

Granted publication date: 20150902

License type: Common License

Record date: 20161114

LICC Enforcement, change and cancellation of record of contracts on the licence for exploitation of a patent or utility model
TR01 Transfer of patent right

Effective date of registration: 20171227

Address after: 210003 Gulou District, Jiangsu, Nanjing new model road, No. 66

Patentee after: Nanjing University of Posts and Telecommunications Asset Management Co., Ltd.

Address before: 210003 Nanjing City, Jiangsu Province, the new model road No. 66

Patentee before: Nanjing Post & Telecommunication Univ.

TR01 Transfer of patent right
EC01 Cancellation of recordation of patent licensing contract

Assignee: Jiangsu Nanyou IOT Technology Park Ltd.

Assignor: Nanjing Post & Telecommunication Univ.

Contract record no.: 2016320000211

Date of cancellation: 20180116

EC01 Cancellation of recordation of patent licensing contract
TR01 Transfer of patent right

Effective date of registration: 20180124

Address after: 226000 Xin Kang Road, Gangzha District, Nantong, Jiangsu Province, No. 33

Patentee after: Nanjing University of Posts and Telecommunications Nantong Institute Limited

Address before: 210003 Gulou District, Jiangsu, Nanjing new model road, No. 66

Patentee before: Nanjing University of Posts and Telecommunications Asset Management Co., Ltd.

TR01 Transfer of patent right
CP02 Change in the address of a patent holder

Address after: 226000 Room 8319, Building 11, Happy New Town, Gangzha District, Nantong City, Jiangsu Province

Patentee after: Nanjing University of Posts and Telecommunications Nantong Institute Limited

Address before: 226000 No. 33 Xinkang Road, Gangzhao District, Nantong City, Jiangsu Province

Patentee before: Nanjing University of Posts and Telecommunications Nantong Institute Limited

CP02 Change in the address of a patent holder