CN103075979B - Three-dimensional surface detecting device and three-dimensional surface detecting method - Google Patents
Three-dimensional surface detecting device and three-dimensional surface detecting method Download PDFInfo
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- CN103075979B CN103075979B CN201210417628.2A CN201210417628A CN103075979B CN 103075979 B CN103075979 B CN 103075979B CN 201210417628 A CN201210417628 A CN 201210417628A CN 103075979 B CN103075979 B CN 103075979B
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Abstract
The present invention provides a three-dimensional surface detecting device which has the following advantages: simple structure, low cost, high detecting speed and high detecting precision. The three-dimensional surface detecting device is used for detecting three-dimensional defects such as surface recess and shape change along with larger scratch on the objects with strong mirror reflection. The three-dimensional surface detecting device mainly comprises the following components: a photographing device 3 which photographs the image of a photographed object X; a light filtering film which covers the circumference of the photographed object and is set to a curved surface; and a curved-surface-shaped structure light projecting unit 5 which projects curved-surface-shaped structure light to the photographed object, wherein the strength of the curved-surface-shaped structure light is in periodical arrangement along the shape of the curved-surface-shaped light filtering film, wherein decoding processing is performed on the image of the detected object which is photographed thorugh the photographing device 3, and the curved-surface-shaped strength arrangement is changed to linear strength arrangement; and a defect detecting unit 13 which detects three-dimensional defects on the surface of the detected object through image processing.
Description
Technical field
The present invention provides a kind of non-contact three-dimensional detection means and 3 D detection method, for detecting automobile and its part etc.
The 3 D stereo defect such as the surface pitting of object and the three-dimensional deformation that produces along with larger cut.
Background technology
In the fields such as automobile production, auto parts and components cycling and reutilization, the cut on body of a motor car surface, indenture, application stripping
The detection falling etc. is very important.However, present these quality testings such as above-mentioned mostly lean on the range estimation of Quality Controller
Carry out.Due to the difference of Quality Controller's professional skill, the result detecting is also uneven.In addition, range estimation detection is not only
Workload is huge, and important due to job specification, also can bring very big mental burden to inspector.Therefore, people's phase
Wait to use the digital camera devices such as digital camera or digital camera, go to realize noncontact, at a high speed, high-precision object table
Face is detected.
There is as body of a motor car the measurement of the object of three-dimensional shape, it is possible to use the method for three-dimensional image measurement.Three
Dimension image measurement can be divided into passive measurement method and active measurement method two big class.The representative method of passive measurement method is binocular vision
Method, it using 2 photographing units from the photo of different viewing angles objects, find on photo corresponding point carry out mating and then
Calculate its three dimensional space coordinate.This method is highly suitable for contour shape of Measuring Object etc. the part of obvious characteristic,
But it is poorly suitable for measuring the rare part of characteristic point or object, such as change slow curved surface etc..
As the representative method of active measurement method, we can enumerate structured light projection measurement method.Structured light projection measures
Method pass through to testee projective structure light, artificially manufactured some characteristic points on testee surface, so even as
The part of characteristic point rareness changing slow curved surface etc. is it is also possible to measure.
In addition, phase shift measurement method is also widely known by the people.This method is such to testee projection such as sine wave
The structure light with space periodic change, then the space phase of moving structure light, using different anti-of multiple space phases
Penetrate light image to be parsed.For example, in order to shorten the three-dimensional image measuring method based on structured light projection principle time of measuring,
Improve certainty of measurement, people have invented the method described in patent documentation 1 and 2.The feature of the method for patent documentation 1 is that it makes
With optimum strength modulated structure light it is only necessary to the three-dimensional image that projection primary structure light just can realize testee is surveyed
Amount, thus shorten time of measuring to improve certainty of measurement.But this method is not particularly suited for the measurement on body of a motor car surface,
Because the surface reflection of body of a motor car is too strong.
The feature of the method that patent documentation 2 is recorded is that it uses the higher measurement structure light of density and benchmark line structure
Light, is measured with the three-dimensional image realizing higher precision.But it is difficult to by stronger for having the surface emitting that bright spot reflects
Object.That is, the general three-dimensional image measuring method based on structured light projection, it is difficult to by for as car body
The object with very high light pool, that is, this method cannot be applied to the stronger object of surface specular reflections.
For the measurement of the stronger object of surface specular reflections intensity, there has been proposed the method for patent documentation 3 and 4.Specially
Sharp document 3 proposes a kind of means of illumination so that the light that lighting source is sent will not shine directly on testee, from
And the measurement of the stronger object of surface reflection is possibly realized.In addition, patent documentation 4 proposes a kind of method, it is using straight
The light and shade structure light of wire projects to testee, and the marginal feature of the light and shade structure light in its reflected image is entered
Row parsing, thus detect the indenture of body surface.It can be used for detecting the concavo-convex defect on car body surface.
The above-mentioned patent documentation quoted is listed as follows:
Patent documentation 1: Japan, JP 2006-145405 publication
Patent documentation 2: Japan, JP 2011-185872 publication
Patent documentation 3: Japan, JP 2010-185820 publication
Patent documentation 4: Japan, JP 2010-85165 publication
Content of the invention
However, the method that above-mentioned patent documentation 3 is proposed, due to using two dimensional image treatment technology, so while
It is capable of detecting when the defect of the bidimensionals such as the scar on car body surface, but cannot detect the three-dimensional informations such as the depth of indenture.
In addition, the method that patent documentation 4 proposes, because it uses side information using light and shade structure light, uses two dimensional image
The processing method of parsing, so while it can detect deformation of unevenness, is but difficult to measure the height of the depth of indenture or projection
Degree.In addition, the method for patent documentation 4 is it is impossible to part beyond the edge of detection structure light, being limited in scope of measurement.
For this reason, a kind of the purpose of the present invention is to propose to three-dimensional table for detecting the stronger testee of surface specular reflections
Face testing equipment and three-dimensional surface detection method, only using simple construction and relatively low cost structure, just can be with high speed and super precision
The degree ground 3 D defects such as the indenture detecting body surface and the 3 D stereo deformation that produces along with larger cut.
Three surface detection apparatus proposed by the present invention include following components: shoot the image of measurand object
Photographic means；It is made into curved and shroud the light filter film around testee；Through light filter film to measurand thing
Body projects the curved-surface structure light projection unit of curved-surface structure light, and the spatial-intensity of this curved-surface structure light is along the curved surface of light filter film
Form periodic spatial intensity distribution；And taken image is decoded processing by the change of its curved intensity distributions
It is changed to linear distribution, and then detect the defect detection unit of the 3 D defects of body surface.
In addition, detection method proposed by the invention has the feature that for being made into curved and shroud tested
Light filter film around object, projects curved-surface structure light through this light filter film to measurand object, this curved-surface structure light
Spatial-intensity forms periodic spatial intensity distribution along the curved surface of light filter film；Obtain measurand thing using photographic means
The image information of body, is decoded process and is transformed to linearly be distributed by its curved intensity distributions to taken image,
And then detect the 3 D defects of body surface.
The present invention due to not directly to measurand project objects structure light but projected by light filter film, therefore
Light source will not directly be mapped by body surface, so even to the very strong object of direct reflection it is also possible to picture does not have mirror
The object of face reflection is equally shot without the problem considering surface reflection.So just it is easy to shoot the figure of testee
Picture simultaneously detects the defect existing for measurand body surface from the image photographing.In this process, it is projected to
The intensity of the projected light on testee be along light filter film curved surface be in period profile.Then, by photographing
Image is decoded processing, and its intensity distributions can be made to be changed into linear from curved.So, due to existing on measured object surface
The intensity distributions of 3 D defects part be non-linear shape, whether we can be just linear according to the intensity distributions of image
To judge whether 3 D defects.
Using methods and apparatus of the present invention, because projected light will not be directly mapped to testee surface, so i.e.
It is for the very strong measurand object of minute surface transmitting it is also possible to simply carry out as to the object not having direct reflection
Take pictures, and simply detect the defect on testee surface from obtained image.So just can be with very low cost
At a high speed, accurately detect the indenture of testee surface presence and along with three-dimensional deformation etc. produced by larger cut
3 D defects.
Brief description
All pie graphs of the three-dimensional surface detection means of Fig. 1 embodiments of the present invention；
Fig. 2 illustrates the structured flowchart of the detailed configuration of all pie graphs of Fig. 1；
The flow chart of the detection process of three-dimensional surface detection means of Fig. 3 embodiments of the present invention；
The signal of the curved spatial intensity distribution structure light of the three-dimensional surface detection means of Fig. 4 embodiments of the present invention
Figure；
Other embodiments of the projecting structural optical of three-dimensional surface detection means of Fig. 5 present invention；
Intensity distributions in the case that the surface of Fig. 6 (a) expression measurand object does not have the change of shape such as indenture are illustrated
Figure, (b) is the intensity distributions of the decoded result of (a)；
Intensity distributions in the case that the surface of Fig. 7 (a) expression measurand object has the change of shape such as indenture are illustrated
Figure, (b) is the intensity distributions of the decoded result of (a).
Specific embodiment
Below, with regard to the embodiment of the three-dimensional surface detection means of the present invention, it is illustrated by means of accompanying drawing.Fig. 1 is this
Invention the three-dimensional surface detection means of embodiment all pie graphs, Fig. 2 for illustrate Fig. 1 all pie graphs detailed
The structured flowchart of thin construction.
The three-dimensional surface detection means of the embodiments of the present invention shown in Fig. 1, be one be used for detecting body of a motor car or
The non-contact detection device of the 3 D defects such as the cut on surface of the measurand object x such as other parts, indenture, it is by following
Part forms: linear light source 1；Light for ensureing linear light source 1 will not shine directly into measurand object x, and
Setting between linear light source 1 and measurand object x, can make the light of linear light source 1 be changed into uniformly dividing simultaneously
The light filter film 2 of cloth；Shoot the photographic means 3 of the image of measurand object x；Connect and control linear light source 1 and photograph
The computer 4 of device 3.
Linear light source 1 can use the general commodity in market circulation, and such as daylight lamp, led illumination etc. is shaped as directly
The ligthing paraphernalia of wire.Light filter film 2 uses trnaslucent materialss, makes the curve forms such as palace shape, tunnel-type, it is to linear
The light of light source 1 carries out dim light and diffusion.Multiple linear light sources 1 are joined in certain intervals along the curve form of light filter film 2
Put.
The light transmittance of light filter film 2 will reflect profit according to the surface of the light intensity of linear light source 2 and measurand object
Rate, to select, generally can select within the scope of 5% to 95%.Photographic means 3 can use various digital cameras,
8,10,12 or 16 bit digital photographing units can be selected, it is possible to use the imageing sensor such as 3ccd, 1ccd, cmos, permissible
Using still camera, nonstatic image pickup device or video camera etc..
Computer 4 has the interface (on the diagram does not represent) connecting linear light source 1 and photographic means 3, by thing
The inspection software (on the diagram does not represent) first weaving, realizes the mnemon 10 shown in Fig. 2, projection structure light control unit
11st, image photography unit 12, defect detection unit 13, size projected unit 14, testing result represent that unit 15 and output are single
The various functions of unit 16.
Projection structure light control unit 11 controls the states such as "ON" and the "Off" of some linear light sources 1, strong to be formed
Degree along light filter film 2 curved surface be in period profile curved intensity distributions structure light, and to measurand project objects.Projection
Structure light control unit 11 used control linear light source 1 various control datas, be also all saved in mnemon 10 it
In.
Image photography unit 12 the best achievement in cinematography state modulator required for image using the ideal for photographing detection
Photographic means 3, shoots the digital picture on the surface of measurand object x, and taken digital picture is input to memory
In unit 10.This best achievement in cinematography parameter includes the various optimal parameters for obtaining the photographing unit required for optimal Detection results
(hereinafter referred to as photographic parameter), is also saved in memory 10.In addition, memory 10 be additionally operable to preserve simultaneously aftermentioned each
The various data such as result of unit.
Defect detection unit 13 parses to the Digital Image Data captured by image photography unit 12, calculates tested
The 3 D defects such as the indenture on target object x surface, the three-dimensional deformation producing along with larger cut.Size projected unit 14 profit
With the method for image analysis, the size (diameter, depth etc.) of the 3 D defects detecting is calculated.
Testing result represents unit 15, by the way of user is easy to understand, by the position of the defect detecting, shape and
The presentation of information such as size are on the display of computer.In addition, it also has and needs to provide on a display screen inspection according to user
That surveys result expands or shrinks expression, all or part expression.Output unit 16, by captured image photograph, testing result
Store on various media etc. information with image file, text, graphic file, form document, database mode, or give
To export.
Separately, as shown in Fig. 2 curved-surface structure light projection unit 5 is by linear light source 1 and projection structure light control unit 11 structure
Become.In addition, for the projecting structural optical required for generating, the integrated location relation of linear projection light source 1, each linear light
Spaced between source and and the distance between light filter film etc., be required for being adjusted in advance.
Below to the three-dimensional surface detection means using present embodiment, to surface pitting of measurand object x etc. three
The process that dimension defect part carries out detection process is illustrated.Fig. 3 is to be entered using the three-dimensional surface detection means of present embodiment
The flow chart of row detection process.
Before being detected using this device, linear light source 1 is configured.During setting, first have to adjust directly
Interval between the position of linear light source 1, each linear light source is the distance between each linear light source (s101).Then
Adjust the distance between each linear light source 1 and light filter film 2, with improve for generate curved intensity distributions structure light needed for
The hardware environment (s102) wanted.Above-mentioned setting only needs to implement once when surface detecting system assembles, and is not to examine each
It is required for enforcement before survey.
During detection, sent instruction, controlled each linear light source by the projection structure light control unit 11 of computer 4 first
Curved spatial intensity distribution structure light (s 103) required for 1 "ON" and "Off", generation detection.Fig. 4 is curved space
The generation schematic diagram of intensity distributions structure light, (a) is configuration and the surface curve shape along light filter film 2 of linear light source 1
In the intensity distributions schematic diagram of the structure light generating about, (b) is to do the curve form on light filter film 2 surface of (a) to shape
The intensity distributions schematic diagram of the structure light after planar development (will circular arc r linearization(-sation)).By Fig. 4 (b) it will be seen that scheming
The intensity distributions of the structure light of curved intensity distributions of 4 (a), become sinusoidal wave shape intensity distributions after launching in the plane.
That is, the structure light of curved intensity distributions is actually a kind of sinusoidal wave shape intensity distributions structure light being bent.
Then, adjusted the photographic parameter of photographic means 3 by image photography unit 12 by computer 4, then by photographic means
Shoot the image of curved intensity distributions structure light of measurand object x reflection and input to computer 4(s104).Image is taken the photograph
Shadow unit 12 analyzes the intensity distributions of captured image, judges whether it can be used as the ideal image for defects detection.As
Really its intensity distributions be preferably then enter next step processing routine, if its intensity distributions are also undesirable,
That just adjusts the photographic parameter of photographic means again, shoots by the curved intensity distributions of image measurand object x reflection
The image of structure light simultaneously carries out intensity analysiss, till obtaining the image of ideal tensile strength distribution (s105).
After obtaining preferable image, decoding process is implemented to this image by defect detection unit 13, it is original
Curved intensity distributions sinusoidal wave-like configuration light be transformed to linear intensity distributions (s106).Do not have on the surface of testee x
In the case of having the change of shape such as indenture, the intensity distributions of the image being photographed will as Fig. 6 (a) be very regular just
The wavy distribution of string, the intensity distributions after so decoded process will become in alignment, as shown in Fig. 6 (b).If however,
If the change of shape such as indenture are existed on the surface of testee x, the phase place of the intensity of indenture change of shape part on image
Will change, sinusoidal wave shape that also just cannot be regular is distributed, as shown in Fig. 7 (a).So, after decoded process, have recessed
The part of trace change of shape will deviate straight line, such as shown in Fig. 7 (b).Therefore we it may be concluded that, deviate straight line place
There is the change of shape (s107) such as concavo-convex.
Size projected unit 14 calculates size dimension and the depth of indenture.As shown in Fig. 7 (b), because deviateing straight line portion
Scope and the size degree of straight line portion that is directly proportional, deviates of indenture be directly proportional to the depth of indenture, so, size calculates single
Unit 14 calculates size dimension and the depth (s108) of indenture according to the size of the scope and degree that deviate straight line.The knot of detection
Really, can represent that unit 15 is represented in intuitively graph image mode on the display of computer 4 by testing result
(s109) it is also possible to being saved it on various memorizeies by output unit 16 or being exported (s100).
In the above-described embodiment, to have sinuous space strong for the structure light of the curved intensity distributions that we use
Degree distribution.Projecting structural optical can also be using the waveform with periodic spatial intensity distribution of other forms, as shown in Figure 5
Platform shape ripple, square wave etc..
In the three-dimensional surface detection means of present embodiment, detection structure light and not directly to measurand object
X projects, but projects to testee after first passing through the dim light of light filter film 2 and DIFFUSION TREATMENT again.Due to projecting structural optical warp
Cross the above-mentioned process of light filter film 2, so even for the stronger object of surface specular reflections, light source also will not direct quilt
Body surface is mapped.So we just can go to shoot measurand thing as shooting the object not having surface mirror surface launching
Body x, and be easy to detect three deformation such as the indenture on measurand object x surface from taken image.This
Process generally only need to time of several seconds to tens seconds.
Further, project to the structure light on measurand object x, the curve form along light filter film divides in periodic intensity
Cloth.For the reflected image of the structure light photographing, by decoding process, its curved intensity distributions is transformed to linearly strong
Degree distribution.So, the part there is 3 D deformation defect on measurand object x surface will deviate from straight line on strength distribution curve
Distribution.Using this meaning feature it is only necessary to the time of several seconds to tens seconds just can simply detect 3 D deformation defect.
The three-dimensional measuring apparatus of the proposition of the present invention and method for three-dimensional measurement, are particularly well-suited to surface specular reflections stronger
The surface pitting of the three-dimensional values of the surface configuration of object, such as automobile and its parts and produce along with larger cut three
The non-contact detecting of dimension deformation.
Wherein, symbol description is as follows:
X measurand object
1 linear light source
2 light filter films
3 photographic means
4 computers
5 curved-surface structure light projection unit
10 memory element
11 projection structure light control units
12 image photography units
13 defect detection units
14 size projected unit
15 testing results represent unit
16 output units.
Claims (2)
1. a kind of surface configuration three-dimensional detection device is it is characterised in that have: shoots the photograph dress of the image of measurand object
Put；Shroud and be arranged to curved light filter film around above-mentioned measurand object；By above-mentioned light filter film to above-mentioned
Measurand object projects the curved-surface structure light projection unit of curved intensity distributions structure light, this curved intensity distributions structure
The intensity of light is in periodic distribution along the shape of above-mentioned curved light filter film；Defect detection unit, it is to by above-mentioned
The image that photographic means photographs enters the decoding process being about to that above-mentioned curved intensity distributions are transformed to linear intensity distributions, enters
And detect the 3 D defects of above-mentioned measurand body surface；
Wherein, described curved-surface structure light projection unit has:
Several the linear light sources being configured along the curved surface of above-mentioned light filter film；With
Projection structure light control unit, the luminance of its control several linear light source above-mentioned is thin along above-mentioned optical filtering to be formed
The surface configuration of film is in the curved intensity distributions structure light of periodic intensity distribution；
Wherein, described curved intensity distributions structure light has the sinusoidal wave shape being bent, rectangle is wavy or platform shape is wavy
Periodic intensity is distributed.
2. a kind of three-dimensional surface detection method it is characterised in that: it has curved surface through shrouding around measurand object
The light filter film of shape, to above-mentioned measurand project objects curved intensity distributions structure light, this curved intensity distributions is tied
The intensity of structure light is in periodic distribution along the curved surface of above-mentioned light filter film, and wherein said curved intensity distributions structure light just has
The periodic intensity distribution that string is wavy, rectangle is wavy or platform shape is wavy；It uses photographic means to shoot above-mentioned measurand object,
And taken image is decoded processing, above-mentioned curved intensity distributions are transformed to linear intensity distributions, and then
Detect the 3 D defects that above-mentioned measurand body surface exists.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011-235267 | 2011-10-26 | ||
| JP2011235267A JP6099115B2 (en) | 2011-10-26 | 2011-10-26 | Three-dimensional surface inspection apparatus and three-dimensional surface inspection method |
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| CN103075979A CN103075979A (en) | 2013-05-01 |
| CN103075979B true CN103075979B (en) | 2017-02-01 |
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| JP6393663B2 (en) * | 2015-07-06 | 2018-09-19 | 株式会社豊田中央研究所 | Surface inspection device |
| CN105627942A (en) * | 2015-12-25 | 2016-06-01 | 华南理工大学 | Imaging apparatus and method for detecting object surface micro deformation through machine vision |
| JP7056131B2 (en) * | 2017-12-15 | 2022-04-19 | オムロン株式会社 | Image processing system, image processing program, and image processing method |
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| CN111260611B (en) * | 2020-01-09 | 2023-03-21 | 深圳市瑞天激光有限公司 | Surface defect detection method and system for reflecting curved surface |
| CN111650215B (en) * | 2020-07-07 | 2023-02-14 | 福建泉州源始物语信息科技有限公司 | Cosmetic bottle cap flaw detection system |
| CN113030101A (en) * | 2021-03-02 | 2021-06-25 | 成都小淞科技有限公司 | Stripe light coating flaw detection device |
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| JP6099115B2 (en) | 2017-03-22 |
| JP2013092465A (en) | 2013-05-16 |
| CN103075979A (en) | 2013-05-01 |
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