CN111260611B - Surface defect detection method and system for reflecting curved surface - Google Patents
Surface defect detection method and system for reflecting curved surface Download PDFInfo
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/514—Depth or shape recovery from specularities
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/529—Depth or shape recovery from texture
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Abstract
The invention discloses a method and a system for detecting surface defects of a reflecting curved surface, wherein the method comprises the following steps: receiving the fringe pattern reflected by the reflecting curved surface to generate a plurality of transverse straight-line segments and a plurality of longitudinal straight-line segments; determining pixel points of the white rectangular regions corresponding to the plurality of transverse straight-line segments and the plurality of longitudinal straight-line segments and fusing to obtain a test pattern; projecting the test pattern to the reflecting curved surface by the projection screen and generating a global pattern; and judging whether the reflection curved surface has defects or not according to the global pattern. The grid-shaped global pattern can be detected intuitively and quickly, so that the detection accuracy reduction caused by uneven application of the flatting agent and the accuracy reduction caused by long-time human eye detection are avoided; the detection precision is improved.
Description
Technical Field
The invention relates to the field of workpiece detection, in particular to a method and a system for detecting surface defects of a reflecting curved surface.
Background
When the reflection curved surface on the surface of the workpiece reflects light, the reflection component is used as a main component, and the diffuse reflection component is used as an auxiliary component, the specular reflection can saturate or over-darken an image, information distortion is generated, the measurement precision is greatly reduced, and even normal measurement is difficult to perform. Aiming at the problem, the simplest method is to coat a layer of matting agent on the surface of a strong-reflection object to enable the surface of the object to present diffuse reflection characteristics, but the matting agent cannot be uniformly coated on the surface of the object, so that the measurement accuracy is greatly reduced. The other method is that when the manual method is directly used for detection, workers try to observe the reflecting curved surface for a long time, eye fatigue is easily caused, eye discomfort is caused, and a large amount of false detection is caused.
Disclosure of Invention
The present invention is directed to at least one of the technical problems in the prior art, and provides a method and a system for detecting surface defects of a reflective curved surface, which can improve the detection accuracy.
The technical scheme adopted by the invention for solving the problems is as follows:
in a first aspect of the present invention, a method for detecting surface defects of a reflective curved surface is provided, which includes the following steps:
step S110, emitting white light to a projection screen to form a first white rectangular area, enabling the projection screen to project the white light to the reflecting curved surface, and receiving a fringe pattern reflected by the reflecting curved surface through a camera;
step S210, fixing the upper edge of the first white rectangular region in step S110 and gradually moving the lower edge of the first white rectangular region downward until a first pattern is generated on the image captured by the camera, where the first pattern satisfies the following conditions: comprises a transverse straight line segment with the position of Y0;
step S220, enabling pixel points of the first white rectangular region corresponding to the pixel points of the transverse straight line segment of the first pattern to form a transverse sub-pattern in a point-by-point trial mode;
step S230, repeating the following steps to obtain a plurality of transverse sub-sample graphs until a new transverse straight-line segment cannot be presented:
step S231, simultaneously increasing the upper edge and the lower edge of the first white rectangular region in step S210, where the increased distances of the upper edge and the lower edge are both n × DO;
step S232, fixing the upper edge of the first white rectangular region obtained in step S231 and gradually moving the lower edge of the first white rectangular region downward until a new transverse straight-line segment is formed, wherein the distance between the new transverse straight-line segment and the previous transverse straight-line segment is DC;
step S233, obtaining a new transverse sub-pattern according to the new transverse straight-line segment in a point-by-point heuristic mode;
step S310, emitting white light to a projection screen to form a second white rectangular area, enabling the projection screen to project the white light to the reflecting curved surface, and receiving a fringe pattern reflected by the reflecting curved surface through a camera;
step S410, fixing the left edge of the second white rectangular region in step S310 and gradually moving the right edge of the second white rectangular region to the right until a second pattern is generated on the image captured by the camera, where the second pattern satisfies the following conditions: comprises a longitudinal straight line segment with the position of X0;
step S420, enabling pixel points of the second white rectangular area corresponding to the pixel points of the longitudinal straight line segment of the second pattern to form a longitudinal sub-pattern in a point-by-point trial mode;
step S430, a plurality of longitudinal sub-sample graphs are obtained by circulating the following steps until a new longitudinal straight-line segment cannot be presented:
step S431, simultaneously increasing the left edge and the right edge of the second white rectangular region in step S410, where the increased distances of the left edge and the right edge are both n × DO;
step S432, fixing the left edge of the second white rectangular region obtained in step S431 and gradually moving the right edge of the second white rectangular region to the right until a new longitudinal straight-line segment is formed, wherein the distance between the new longitudinal straight-line segment and the previous longitudinal straight-line segment is DC;
step S433, obtaining a new longitudinal sub-pattern according to the new longitudinal straight-line segment in a point-by-point heuristic mode;
s500, fusing the plurality of transverse sub-patterns and the plurality of longitudinal sub-patterns to obtain a test pattern;
step S600, projecting the test pattern to the reflecting curved surface by the projection screen, receiving a fringe pattern reflected by the reflecting curved surface, and generating a grid-shaped global pattern;
step S700, repeating the above steps, and making the first pattern in step S210 include a horizontal straight line segment with a position (Y0 + DC/(k-1)) and the second pattern in step S410 include a vertical straight line segment with a position (X0 + DC/(k-1)) to obtain different test patterns, projecting different test patterns to the same reflective surface to generate a plurality of global patterns, and making any one of the plurality of global patterns have the following characteristics compared with the previous one: the displacement of DC/(k-1) is carried out in the horizontal direction and the vertical direction;
step S800, judging whether the reflecting curved surface has defects or not according to the plurality of global patterns;
wherein n =1,2,3 …; DO is a set distance value; DC is the interval of the grid of the global pattern, and k is the total amplitude of the global pattern.
Further, the specific step of judging whether the reflective curved surface has the defect according to the global pattern is as follows: and if the global pattern has irregular curves, broken straight line segments or grids with flaws or spots in the surrounded area, judging that the reflecting curved surface has defects.
Further, the forming of the horizontal sub-pattern by the pixel points of the first white rectangular region corresponding to the pixel points of the horizontal straight line segment of the first pattern in a point-by-point heuristic manner specifically includes:
confirming a pixel point corresponding to a transverse straight line segment of the first pattern on the first white rectangular area by lighting the pixel point of the first white rectangular area point by point;
and enabling all pixel points of the white rectangular area corresponding to the pixel points of the transverse straight-line segments of the first pattern to form a transverse sub-pattern on the projection screen.
Further, the step of forming a longitudinal sub-pattern by using the pixel points of the second white rectangular region corresponding to the pixel points of the longitudinal straight-line segment of the second pattern in a point-by-point heuristic manner specifically includes:
confirming pixel points corresponding to the longitudinal straight line segments of the second pattern on the second white rectangular area by lighting the pixel points of the second white rectangular area point by point;
and enabling all pixel points of the second white rectangular area corresponding to the pixel points of the longitudinal straight-line segment of the second pattern to form a longitudinal sub-pattern on the projection screen.
In a second aspect of the present invention, a surface defect detecting system for a reflective curved surface includes:
a projector for emitting white light and a test pattern;
the projection screen is used for projecting the white light emitted by the projector and the test pattern to the reflecting curved surface;
the camera is used for receiving the fringe pattern reflected by the reflecting curved surface;
and the controller is connected with the projector and the camera and is used for executing the surface defect detection method of the reflecting curved surface according to the first aspect of the invention.
The technical scheme at least has the following beneficial effects: shooting a test pattern reflected by the reflecting curved surface to obtain a latticed global pattern, and judging whether the reflecting curved surface has defects or not according to the global pattern; the detection accuracy reduction caused by uneven application of the flatting agent and the accuracy reduction caused by long-time human eye detection are avoided; the detection precision is improved.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The invention is further illustrated with reference to the following figures and examples.
FIG. 1 is a step diagram of a method for detecting surface defects of a reflective curved surface according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a system for detecting surface defects of a reflective curved surface according to an embodiment of the present invention.
Detailed Description
Reference will now be made in detail to the present preferred embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to like elements throughout.
In the description of the present invention, it should be understood that the orientation or positional relationship referred to in the description of the orientation, such as the upper, lower, front, rear, left, right, etc., is based on the orientation or positional relationship shown in the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.
In the description of the present invention, the meaning of a plurality of means is one or more, the meaning of a plurality of means is two or more, and larger, smaller, larger, etc. are understood as excluding the number, and larger, smaller, inner, etc. are understood as including the number. If the first and second are described for the purpose of distinguishing technical features, they are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present invention, unless otherwise specifically limited, terms such as set, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention by combining the specific contents of the technical solutions.
Referring to fig. 1, an embodiment of the present invention provides a method for detecting surface defects of a reflective curved surface, including the following steps:
step S110, emitting white light to a projection screen to form a first white rectangular area, enabling the projection screen to project the white light to a reflecting curved surface, and receiving a fringe pattern reflected by the reflecting curved surface through a camera; specifically, the white light may be white scattered light;
step S210, fixing the upper edge of the first white rectangular region in step S110 and gradually moving the lower edge of the first white rectangular region downward until a first pattern is generated on the image captured by the camera, where the first pattern satisfies the following conditions: comprises a transverse straight line segment with the position of Y0; of course, in other embodiments, the lower edge of the first white rectangular area may be fixed while the upper edge is gradually moved upward;
step S220, forming a transverse sub-pattern by pixel points of a first white rectangular region corresponding to the pixel points of the transverse straight-line segment of the first pattern in a point-by-point trial mode;
step S230, repeating the following steps to obtain a plurality of transverse sub-sample graphs until a new transverse straight-line segment cannot be presented:
step S231, simultaneously increasing the upper edge and the lower edge of the first white rectangular region in step S210, where the increased distances of the upper edge and the lower edge are both n × DO; it should be noted that the first white rectangular region in this step is a white rectangular region corresponding to the first lateral straight line segment, and the height of the white rectangular region is H0; then the height of the other white rectangular areas is H0+2n do;
step S232, fixing the upper edge of the first white rectangular region obtained in the step S231 and gradually moving the lower edge of the first white rectangular region downwards until a new transverse straight line segment is formed, wherein the distance between the new transverse straight line segment and the previous transverse straight line segment is DC; of course, in other embodiments, the lower edge of the first white rectangular area may be fixed while the upper edge is gradually moved upward;
step S233, obtaining a new transverse sub-pattern according to the new transverse straight-line segment in a point-by-point heuristic mode;
step S310, emitting white light to a projection screen to form a second white rectangular area, enabling the projection screen to project the white light to a reflecting curved surface, and receiving a fringe pattern reflected by the reflecting curved surface through a camera;
step S410, fixing the left edge of the second white rectangular region in step S310 and gradually moving the right edge of the second white rectangular region to the right until a second pattern is generated on the image captured by the camera, the second pattern satisfying the following conditions: comprises a longitudinal straight line segment with the position of X0; of course in other embodiments, the right edge of the second white rectangular area may be fixed while the left edge is gradually moved upward;
step S420, forming a longitudinal sub-pattern by pixel points of a second white rectangular area corresponding to the pixel points of the longitudinal straight-line segment of the second pattern in a point-by-point trial mode;
step S430, a plurality of longitudinal sub-sample graphs are obtained by circulating the following steps until a new longitudinal straight line segment cannot be presented:
step S431, simultaneously adding the left edge and the right edge of the second white rectangular area in step S410, where the added distances of the left edge and the right edge are both n × DO; it should be noted that, the second white rectangular region in this step is a white rectangular region corresponding to the first longitudinal straight line segment, and the width of the white rectangular region is H0; then the width of the other white rectangular regions is H0+2n do;
step S432, fixing the left edge of the second white rectangular area obtained in step S431 and gradually moving the right edge of the second white rectangular area to the right until a new longitudinal straight-line segment is formed, where a distance between the new longitudinal straight-line segment and the previous longitudinal straight-line segment is DC; of course, in other embodiments, the right edge of the second white rectangular region may be fixed while the left edge is gradually moved upward;
step S433, obtaining a new longitudinal sub-pattern according to the new longitudinal straight-line segment in a point-by-point heuristic mode;
s500, fusing a plurality of transverse sub-patterns and a plurality of longitudinal sub-patterns to obtain a test pattern;
step S600, projecting the test pattern to a reflecting curved surface by a projection screen, receiving a fringe pattern reflected by the reflecting curved surface, and generating a grid-shaped global pattern; it should be noted that the grid in the global pattern is a square grid, and the length and width of the grid are both DC;
step S700, repeating the above steps, and making the first pattern in step S210 include a horizontal straight line segment with a position (Y0 + DC/(k-1)) and the second pattern in step S410 include a vertical straight line segment with a position (X0 + DC/(k-1)) to obtain different test patterns, projecting different test patterns on the same reflective surface to generate a plurality of global patterns, and making any one of the plurality of global patterns have the following characteristics compared with the previous one: the displacement of DC/(k-1) is carried out in the horizontal direction and the vertical direction;
step S800, judging whether the reflecting curved surface has defects or not according to the plurality of global patterns;
wherein n =1,2,3 …; DO is a set distance value; DC is the pitch of the grid of the global pattern and k is the total magnitude of the global pattern.
In the embodiment, a test pattern reflected by the reflecting curved surface is shot to obtain a grid-shaped global pattern, and whether the reflecting curved surface has defects is judged according to the global pattern; the detection accuracy reduction caused by uneven application of the flatting agent and the accuracy reduction caused by long-time human eye detection are avoided; the detection precision is improved.
It should be noted that, preferably, the width of the first white rectangular area of the first pattern containing one transverse straight line segment is the width of the projection screen 20; the height of the second white rectangular area for the second pattern comprising one longitudinal straight line segment is the height of the projection screen 20.
In addition, the blank regions of the grids in the single global pattern are detected through the multiple global patterns which are gradually translated, the problem of detection omission of the blank regions among the grids of the single global pattern can be solved, and the detection precision is further improved.
Further, for step S800, the specific step of determining whether the reflective curved surface has the defect according to the global pattern is: if the global pattern has irregular curves, broken straight line segments or grids of the enclosed area containing flaws or spots, the reflecting curved surface is judged to have defects.
When the reflecting curved surface is not smooth and has bulges or depressions, the global pattern has irregular curves, broken straight line segments or grids of enclosed areas containing flaws or spots, which can be quickly identified through a computer algorithm, and at the moment, the reflecting curved surface is judged to have defects.
Specifically, for step S220, forming a horizontal sub-pattern by using pixel points of the first white rectangular region corresponding to the pixel points of the horizontal straight-line segment of the first pattern in a point-by-point heuristic manner specifically includes:
confirming a pixel point corresponding to a transverse straight line segment of the first pattern on the first white rectangular area by lighting the pixel point of the first white rectangular area point by point;
and enabling all pixel points of the white rectangular area corresponding to the pixel points of the transverse straight-line segment of the first pattern to form a transverse sub-pattern on the projection screen.
Further, for step S420, forming a longitudinal sub-pattern by using pixel points of the second white rectangular region corresponding to the pixel points of the longitudinal straight-line segment of the second pattern in a point-by-point heuristic manner specifically includes:
confirming a pixel point corresponding to the longitudinal straight-line segment of the second pattern on the second white rectangular area by lighting the pixel point of the second white rectangular area point by point;
and forming a longitudinal sub-pattern on the projection screen by all pixel points of the second white rectangular area corresponding to the pixel points of the longitudinal straight-line segment of the second pattern.
Referring to fig. 2, another embodiment of the present invention provides a surface defect detecting system for a reflective curved surface, including:
a projector 10 for emitting white light and a test pattern;
a projection screen 20 for projecting the white light and the test pattern emitted from the projector 10 toward a reflective curved surface;
a camera 30 for receiving the fringe pattern reflected by the reflective curved surface; specifically, the camera 30 is a CCD camera;
and a controller 40 connected to the projector 10 and the camera 30 for executing the surface defect detecting method of the reflective curved surface.
It should be noted that, the surface defect detecting system of the reflective curved surface is used for executing the surface defect detecting method of the reflective curved surface as above, and the controller in the system controls the projector 10 to project different white lights and test patterns and controls the camera 30 to receive and perform data processing, so that the surface defect detecting system of the reflective curved surface can execute the surface defect detecting method of the reflective curved surface as above, and the specific data processing flow is not detailed here. Also, the surface defect detecting system for the reflective curved surface has the beneficial effect of improving the precision of surface defect detection on the reflective curved surface.
In another embodiment of the present invention, a storage medium is provided, where the storage medium stores executable instructions for causing the surface defect detecting system for a reflective curved surface to perform the surface defect detecting method for a reflective curved surface.
Examples of storage media include, but are not limited to, phase change memory (PRAM), static Random Access Memory (SRAM), dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), read Only Memory (ROM), electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device.
The above description is only a preferred embodiment of the present invention, and the present invention is not limited to the above embodiment, and the present invention shall fall within the protection scope of the present invention as long as the technical effects of the present invention are achieved by the same means.
Claims (5)
1. A surface defect detection method of a reflecting curved surface is characterized by comprising the following steps: step S110, emitting white light to a projection screen to form a first white rectangular area, enabling the projection screen to project the white light to a reflecting curved surface, and receiving a fringe pattern reflected by the reflecting curved surface through a camera;
step S210, fixing the upper edge of the first white rectangular region in step S110 and gradually moving the lower edge of the first white rectangular region downward until a first pattern is generated on the image captured by the camera, where the first pattern satisfies the following conditions: comprises a transverse straight line segment with the position of Y0;
step S220, enabling pixel points of the first white rectangular region corresponding to the pixel points of the transverse straight line segment of the first pattern to form a transverse sub-pattern in a point-by-point trial mode;
step S230, a plurality of transverse sub-sample graphs are obtained by circulating the following steps until a new transverse straight line segment cannot be presented:
step S231, simultaneously increasing the upper edge and the lower edge of the first white rectangular region in step S210, where the increased distances of the upper edge and the lower edge are both n × DO;
step S232, fixing the upper edge of the first white rectangular region obtained in step S231 and gradually moving the lower edge of the first white rectangular region downward until a new transverse straight-line segment is formed, wherein the distance between the new transverse straight-line segment and the previous transverse straight-line segment is DC;
step S233, obtaining a new transverse sub-pattern according to the new transverse straight-line segment in a point-by-point heuristic mode;
step S310, emitting white light to a projection screen to form a second white rectangular area, enabling the projection screen to project the white light to the reflecting curved surface, and receiving a fringe pattern reflected by the reflecting curved surface through a camera;
step S410, fixing the left edge of the second white rectangular region in step S310 and gradually moving the right edge of the second white rectangular region to the right until a second pattern is generated on the image captured by the camera, where the second pattern satisfies the following conditions: comprises a longitudinal straight line segment with the position of X0;
step S420, enabling pixel points of the second white rectangular area corresponding to the pixel points of the longitudinal straight line segment of the second pattern to form a longitudinal sub-pattern in a point-by-point trial mode;
step S430, a plurality of longitudinal sub-sample graphs are obtained by circulating the following steps until a new longitudinal straight line segment cannot be presented:
step S431, simultaneously increasing the left edge and the right edge of the second white rectangular region in step S410, where the increased distances of the left edge and the right edge are both n × DO;
step S432, fixing the left edge of the second white rectangular region obtained in step S431 and gradually moving the right edge of the second white rectangular region to the right until a new longitudinal straight-line segment is formed, wherein the distance between the new longitudinal straight-line segment and the previous longitudinal straight-line segment is DC;
step S433, obtaining a new longitudinal sub-pattern according to the new longitudinal straight line segment in a point-by-point heuristic mode;
s500, fusing the plurality of transverse sub-patterns and the plurality of longitudinal sub-patterns to obtain a test pattern;
step S600, projecting the test pattern to the reflecting curved surface by the projection screen, receiving a fringe pattern reflected by the reflecting curved surface, and generating a grid-shaped global pattern;
step S700, repeating the above steps, and making the first pattern in step S210 include a horizontal straight line segment with a position (Y0 + DC/(k-1)) and the second pattern in step S410 include a vertical straight line segment with a position (X0 + DC/(k-1)) to obtain different test patterns, projecting different test patterns to the same reflective surface to generate a plurality of global patterns, and making any one of the plurality of global patterns have the following characteristics compared with the previous one: the displacement of DC/(k-1) is carried out in the horizontal direction and the vertical direction;
step S800, judging whether the reflecting curved surface has defects or not according to the plurality of global patterns;
wherein n =1,2,3 …, DO is a set distance value; DC is the interval of the grid of the global pattern, and k is the total amplitude of the global pattern.
2. The method as claimed in claim 1, wherein said determining whether the reflective curved surface has the defect according to the plurality of global patterns specifically comprises: and if the plurality of global patterns have irregular curves, broken straight line segments or grids with flaws or spots in the surrounded area, judging that the reflecting curved surface has defects.
3. The method for detecting surface defects of a reflective curved surface according to claim 1 or 2, wherein the forming of the horizontal sub-pattern by the pixel points of the first white rectangular region corresponding to the pixel points of the horizontal straight line segment of the first pattern in a point-by-point heuristic manner is specifically:
confirming a pixel point corresponding to a transverse straight line segment of the first pattern on the first white rectangular area by lighting the pixel point of the first white rectangular area point by point;
and enabling all pixel points of the first white rectangular area corresponding to the pixel points of the transverse straight line segments of the first pattern to form a transverse sub-pattern on the projection screen.
4. The method for detecting surface defects of a reflective curved surface according to claim 1 or 2, wherein the forming of the longitudinal sub-pattern by the pixel points of the second white rectangular region corresponding to the pixel points of the longitudinal straight line segment of the second pattern in a point-by-point heuristic manner is specifically:
confirming pixel points corresponding to the longitudinal straight line segments of the second pattern on the second white rectangular area by lighting the pixel points of the second white rectangular area point by point;
and enabling all pixel points of the second white rectangular area corresponding to the pixel points of the longitudinal straight line segments of the second pattern to form a longitudinal sub-pattern on the projection screen.
5. A system for detecting surface defects of a curved reflective surface, comprising:
a projector for emitting white light and a test pattern;
the projection screen is used for projecting the white light emitted by the projector and the test pattern to the reflecting curved surface;
the camera is used for receiving the fringe pattern reflected by the reflecting curved surface;
a controller connected to the projector and the camera for executing the method of detecting surface defects of a reflective curved surface according to any one of claims 1 to 4.
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