CN103018649A - Automatic signal delay compensation method and system suitable for radiation effect test - Google Patents
Automatic signal delay compensation method and system suitable for radiation effect test Download PDFInfo
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- CN103018649A CN103018649A CN2012104887138A CN201210488713A CN103018649A CN 103018649 A CN103018649 A CN 103018649A CN 2012104887138 A CN2012104887138 A CN 2012104887138A CN 201210488713 A CN201210488713 A CN 201210488713A CN 103018649 A CN103018649 A CN 103018649A
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Abstract
The invention relates to an automatic signal delay compensation method and system suitable for a radiation effect test. The system provided by the invention comprises a clock phase adjusting module, a verification vector generation module and a delay compensation judgment module. According to the method provided by the invention, signals in long-line transmission are acquired by adopting a clock capable of adjusting phase, the phase of the sampling clock is adjusted to the degree that the signals have enough leading edge margin and lagging edge margin, the signals in long-line transmission can be accurately acquired, and signals synchronous with a system clock can be obtained by acquiring the signals (acquired by the sampling clock) by the system clock. According to the invention, the signal delay problem caused by long-line transmission in the radiation effect test can be solved, field debugging of the test system in a radiation environment caused by long-line data transmission can be avoided, and the test system has adaptive capability for different test environments.
Description
Technical field
The present invention relates to a kind of signal delay automatic calibrating method and system that is suitable for the radiation effect test, particularly relate to a kind of method and system for realizing radiation effect examination image data delay auto-compensation under the Different Irradiation Environment, can be applicable to examination, the test job of space flight, Military Electronics components and parts radiation effect.
Background technology
Along with the development of the development of science and technology, particularly space technology and nuclear energy technology, increasing electronic equipment will be used in the various types of radiation environment.Basic composition-the semiconductor devices of electronic equipment be radiation the most responsive also be the weakest link, the radiation damage of semiconductor devices is the major reason that reduces spacecraft reliability, and the research of radiation effect and the development of radiation hardened component become China's aerospace industry and further develop the problem that must solve.
Radiation effect test based on terrestrial radiation environmental simulation source is the most important means of examination electronic devices and components radiation resistance.In the radiation effect certification test, because the uniqueness of radiation environment, the measured device of radiation effect and testing hardware system can not be placed on the same circuit board, often realize connecting by the data line of certain-length between the two, guarantee that with this hardware testing system is not affected by radiation environment.
Data line between measured device and the testing hardware system is the major reason that causes the unstable or test macro cisco unity malfunction of radiation effect data test.The radiation effect ground simulation test of electronic devices and components comprises the multiple experimental enviroments such as the steady state irradiation test of cobalt source, neutron, proton and heavy ion, kind and the length of the transmission line of different tests environmental requirement are variant, thereby the accurate acquisition capacity of the collection measured device of testing hardware system output data has been proposed challenge.
At present domestic radiation effect test for the radiation effect certification test does not all realize the auto-compensation that it postpones collection signal, so that the secondary development of the testing algorithm that the test of test macro under different test environments may face has brought difficulty for the test job of radiation effect.
Summary of the invention
The object of the invention provides a kind of signal delay automatic compensating method and system that is suitable for the radiation effect test, it has solved existing method because the inaccurate technical matters of data test that data line causes in the radiation effect test environment, can robotization solve the signal delay problem that the transmission of radiation effect test middle or long line causes, thereby the field adjustable of test macro has been realized the adaptive ability of test macro to different test environments under the radiation environment of having avoided causing because of long line data transmission.
Technical solution of the present invention is:
A kind of signal delay automatic compensating method that is suitable for the radiation effect test, its special character is: may further comprise the steps:
1] produces the verification vector, utilize the data of the phase place sampling clock collection measured device consistent with system clock, execution in step 2;
Whether the data that 2] judge to gather are consistent with expected data, if judge inconsistently, then execution in step 3, if judge unanimously, then execution in step 5;
3] phase place 1 that increases sampling clock is spent Resurvey chip under test data; Judge whether the data sampling clock is consistent with expected data, if inconsistent, then repeats this step, until consistent, then mark phase place this moment is N0; Execution in step 4;
4] continue to increase sampling clock phase 1 degree, until image data and expected data are inconsistent, mark phase place this moment is N1, execution in step 7;
5] phase place 1 that increases sampling clock is spent Resurvey chip under test data; Judge whether the data sampling clock is consistent with expected data, if consistent, then repeat this step, until inconsistent, then mark phase place this moment is N0; Execution in step 6;
6] phase shifts of sampling clock is returned 0, reduce sampling clock phase 1 degree, until image data and expected data are inconsistent, mark phase place this moment is N1, N1＜0; Execution in step 7;
7] phase shifts with sampling clock is arranged between the N1 to N0, and then the phase place adjustment of sampling clock is finished; Execution in step 8;
8] utilize the sampling clock of adjusting phase place that the signal of transmission is sampled, obtain the data synchronous with system clock, the auto-compensation that settling signal postpones.
The phase shifts of the sampling clock in the above-mentioned steps 7 is set to (N1+N0)/2.
Comprise clock phase adjusting module, verification vector generation module and delay compensation judge module;
Adjustable continuously from-359 degree to 359 degree of the phase place that described clock phase adjusting module be used for to be realized sampling clock;
Described verification vector generation module is used for generating certain data and is input to measured device as the verification vector;
Described delay compensation judge module is used for judging whether the data of sampling clock collection are consistent with expected data.
Above-mentioned clock phase adjusting module comprises following input port: system clock input port, phase place are adjusted the enable port, phase place is adjusted direction control port, phase place adjustment reseting port; Described clock phase adjusting module comprises following output port: the collection clock port of adjustable phase, phase place are adjusted the complement mark port.
The present invention compared with prior art beneficial effect is: the invention solves the method that radiation effect test middle or long line transmits the signal delay problem that causes, the field adjustable of test macro under the radiation environment of having avoided causing because of long line data transmission, and test macro is to the adaptive ability that has of different test environments.
Description of drawings
Fig. 1 is the theory diagram that the present invention is suitable for the signal delay self compensating system of radiation effect test;
The principle sequential chart of Fig. 2 (a) for transmission delay not being compensated;
The principle sequential chart that Fig. 2 (b) compensates transmission delay for the present invention;
Fig. 3 is the step that automatically performs of signal delay automatic compensating method of the present invention;
Fig. 4 is the method synoptic diagram of the phase alignment in the initial situation that meets expection of sampling;
Fig. 5 is the phase alignment synoptic diagram in the initial situation that does not meet expection of sampling.
Embodiment
As shown in Figure 1, a kind of hardware module that is suitable for the signal delay automatic compensating method of radiation effect test of the present invention comprises clock phase adjusting module 1, verification vector generation module 2, delay compensation judge module 3.
The clock phase adjusting module wants to realize the adjustable continuously of sampling clock phase that the sampling clock phase setting range of clock phase adjusting module is that-359 degree are to 359 degree.Because can there be certain delay in the output data of measured device through behind certain data line.If adopt the system clock image data this moment, just possibly can't guarantee that signal has enough Times Created and retention time, thereby the unstable of test data occur.Utilize this module just can generate the sampling clock that the relative system clock has certain phase shifts, guarantee that data have enough foundation and retention time, have guaranteed data correctness.The input clock of clock adjusting module is system clock among the present invention, and the variable phase clock of output namely is the sampling clock that the present invention is used for image data.The phase place of this module samples clock is the system clock of relatively inputting, and namely this module can realize that sampling clock is with respect to the phase shifts of system clock.
The clock phase adjusting module should comprise following input port: system clock input port, phase place are adjusted the enable port, phase place is adjusted direction control port, phase place adjustment reseting port.This clock phase adjusting module should comprise following output port: the sampling clock port of adjustable phase, phase place are adjusted the complement mark port.
Verification vector generation module is be used to generating the input vector of certain data as measured device in the inventive method, measured device then can respond this verification vector, thereby export certain data, whether meet expection by the response of judging this device, judge the state of delay compensation in the inventive method.
The delay compensation judge module is to be specifically designed to judge whether response device meets expection, process executing the task of each step in this method in the inventive method.
Shown in Fig. 2 a, the signals collecting mode of not considering the test macro of signal delay compensation is to utilize system clock directly to sampling through the signal of long line transmission.Can there be certain delay in signal through after the transmission line of certain-length, and the distortion of certain procedures can appear in the edge of signal.Therefore if in test macro, adopt system clock that signal is sampled, the forward position surplus just may appear not or inadequate along surplus afterwards, cause the unstable of data acquisition.
The present invention has designed a kind of method to the signal transmission delay auto-compensation, shown in Fig. 2 b.But adopted a kind of clock collection of control phase through the signal of long line transmission in the inventive method, this sampling clock phase is adjusted to and can be made signal have enough forward position surpluses and rear along surplus, gathers exactly the signal through long line transmission.Utilize system clock that the signal of sampling clock collection is gathered, can obtain the signal synchronous with system clock.
Figure 3 shows that the process flow diagram of clock delay transmission compensation in the inventive method.
Whether the data that step 2. judge to gather consistent with expected data, if judge inconsistent, execution in step 3,4,7,8 then, if judge consistent, execution in step 5,6,7,8 then.
Be illustrated in figure 4 as step 3,4,7 principle schematic, Fig. 5 is step 5,6,7 principle schematic.The phase place of system clock is interval to N1 at N0, and image data all meets expection.In order to keep enough threshold doseags of data acquisition, the phase place of final sampling clock is set to (N0+N1)/2;
Step 4. continues to increase sampling clock phase 1 degree, until image data and expected data are inconsistent, mark phase place this moment is N1, execution in step 7;
Step 5. adds phase place 1 degree of sampling clock, Resurvey chip under test data.Judge whether the data sampling clock is consistent with expected data, if consistent, then repeat this step.Until the two is inconsistent, then mark phase place this moment is N0;
Step 6. returns 0 with the phase shifts of sampling clock, reduces sampling clock phase 1 degree, until image data and expected data are inconsistent, mark phase place this moment is N1(N1＜0).Execution in step 7;
The phase shifts of step 7. sampling clock is set to (N1+N0)/2, and then the phase place adjustment of sampling clock is finished;
Step 8. system clock is sampled to the data of utilizing the sampling clock collection to obtain, obtains the data synchronous with system clock, and then the auto-compensation of signal delay of the present invention is finished.
Claims (4)
1. one kind is suitable for the signal delay automatic compensating method that radiation effect is tested, and it is characterized in that: may further comprise the steps:
1] produces the verification vector, utilize the data of the phase place sampling clock collection measured device consistent with system clock, execution in step 2;
Whether the data that 2] judge to gather are consistent with expected data, if judge inconsistently, then execution in step 3, if judge unanimously, then execution in step 5;
3] phase place 1 that increases sampling clock is spent Resurvey chip under test data; Judge whether the data sampling clock is consistent with expected data, if inconsistent, then repeats this step, until consistent, then mark phase place this moment is N0; Execution in step 4;
4] continue to increase sampling clock phase 1 degree, until image data and expected data are inconsistent, mark phase place this moment is N1, execution in step 7;
5] phase place 1 that increases sampling clock is spent Resurvey chip under test data; Judge whether the data sampling clock is consistent with expected data, if consistent, then repeat this step, until inconsistent, then mark phase place this moment is N0; Execution in step 6;
6] phase shifts of sampling clock is returned 0, reduce sampling clock phase 1 degree, until image data and expected data are inconsistent, mark phase place this moment is N1, N1＜0; Execution in step 7;
7] phase shifts with sampling clock is arranged between the N1 to N0, and then the phase place adjustment of sampling clock is finished; Execution in step 8;
8] utilize the sampling clock of adjusting phase place that the signal of transmission is sampled, obtain the data synchronous with system clock, the auto-compensation that settling signal postpones.
2. the signal delay automatic compensating method that is suitable for radiation effect test according to claim 1, it is characterized in that: the phase shifts of the sampling clock in the described step 7 is set to (N1+N0)/2.
3. one kind is suitable for the signal delay self compensating system that radiation effect is tested, and it is characterized in that:
Comprise clock phase adjusting module, verification vector generation module and delay compensation judge module;
Adjustable continuously from-359 degree to 359 degree of the phase place that described clock phase adjusting module be used for to be realized sampling clock;
Described verification vector generation module is used for generating certain data and is input to measured device as the verification vector;
Described delay compensation judge module is used for judging whether the data of sampling clock collection are consistent with expected data.
4. the signal delay self compensating system that is suitable for radiation effect test according to claim 3, it is characterized in that: described clock phase adjusting module comprises following input port: system clock input port, phase place adjust that the direction control port is adjusted in enable port, phase place, phase place is adjusted reseting port; Described clock phase adjusting module comprises following output port: the collection clock port of adjustable phase, phase place are adjusted the complement mark port.
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| CN103576079A (en) * | 2013-11-15 | 2014-02-12 | 上海华岭集成电路技术股份有限公司 | Chip testing system and chip testing method |
| CN104703454A (en) * | 2013-12-06 | 2015-06-10 | 华为技术有限公司 | EMI (electro-magnetic interference) control method, EMI control device and electronic equipment |
| CN105897267A (en) * | 2016-04-18 | 2016-08-24 | 西北核技术研究所 | Analog-digital converter single particle effect test method and system thereof |
| CN117490838A (en) * | 2024-01-03 | 2024-02-02 | 成都善思微科技有限公司 | High-reliability flat panel detector data acquisition method, system and computer |
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| CN104703454A (en) * | 2013-12-06 | 2015-06-10 | 华为技术有限公司 | EMI (electro-magnetic interference) control method, EMI control device and electronic equipment |
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| CN105897267A (en) * | 2016-04-18 | 2016-08-24 | 西北核技术研究所 | Analog-digital converter single particle effect test method and system thereof |
| CN105897267B (en) * | 2016-04-18 | 2019-05-07 | 西北核技术研究所 | A kind of analog-digital converter single particle effect test method and system |
| CN117490838A (en) * | 2024-01-03 | 2024-02-02 | 成都善思微科技有限公司 | High-reliability flat panel detector data acquisition method, system and computer |
| CN117490838B (en) * | 2024-01-03 | 2024-03-19 | 成都善思微科技有限公司 | High-reliability flat panel detector data acquisition method, system and computer |
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