CN103000379B - 一种提高全固态电储能器件充电效率的方法 - Google Patents
一种提高全固态电储能器件充电效率的方法 Download PDFInfo
- Publication number
- CN103000379B CN103000379B CN201210395541.XA CN201210395541A CN103000379B CN 103000379 B CN103000379 B CN 103000379B CN 201210395541 A CN201210395541 A CN 201210395541A CN 103000379 B CN103000379 B CN 103000379B
- Authority
- CN
- China
- Prior art keywords
- layer
- energy storage
- solid
- charge
- storage device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004146 energy storage Methods 0.000 title claims abstract description 46
- 238000000034 method Methods 0.000 title claims abstract description 20
- 238000007600 charging Methods 0.000 claims abstract description 45
- 238000003860 storage Methods 0.000 claims abstract description 15
- 239000000872 buffer Substances 0.000 claims description 53
- 239000000463 material Substances 0.000 claims description 27
- -1 quinoline ring metal complex Chemical class 0.000 claims description 19
- 239000000203 mixture Substances 0.000 claims description 18
- RBTKNAXYKSUFRK-UHFFFAOYSA-N heliogen blue Chemical compound [Cu].[N-]1C2=C(C=CC=C3)C3=C1N=C([N-]1)C3=CC=CC=C3C1=NC([N-]1)=C(C=CC=C3)C3=C1N=C([N-]1)C3=CC=CC=C3C1=N2 RBTKNAXYKSUFRK-UHFFFAOYSA-N 0.000 claims description 13
- 238000004528 spin coating Methods 0.000 claims description 11
- 239000011232 storage material Substances 0.000 claims description 11
- 238000007738 vacuum evaporation Methods 0.000 claims description 9
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 7
- 239000007983 Tris buffer Substances 0.000 claims description 7
- NIHNNTQXNPWCJQ-UHFFFAOYSA-N fluorene Chemical class C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 claims description 6
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 claims description 5
- 229910052744 lithium Inorganic materials 0.000 claims description 5
- 229920001467 poly(styrenesulfonates) Polymers 0.000 claims description 5
- 229920002098 polyfluorene Polymers 0.000 claims description 5
- 229960002796 polystyrene sulfonate Drugs 0.000 claims description 5
- 239000011970 polystyrene sulfonate Substances 0.000 claims description 5
- 238000001771 vacuum deposition Methods 0.000 claims description 5
- 238000000231 atomic layer deposition Methods 0.000 claims description 4
- HFACYLZERDEVSX-UHFFFAOYSA-N benzidine Chemical compound C1=CC(N)=CC=C1C1=CC=C(N)C=C1 HFACYLZERDEVSX-UHFFFAOYSA-N 0.000 claims description 4
- 229910052681 coesite Inorganic materials 0.000 claims description 4
- 239000002131 composite material Substances 0.000 claims description 4
- 229920001577 copolymer Polymers 0.000 claims description 4
- 229910052906 cristobalite Inorganic materials 0.000 claims description 4
- 150000002736 metal compounds Chemical class 0.000 claims description 4
- 229910044991 metal oxide Inorganic materials 0.000 claims description 4
- 150000004706 metal oxides Chemical class 0.000 claims description 4
- JKQOBWVOAYFWKG-UHFFFAOYSA-N molybdenum trioxide Chemical compound O=[Mo](=O)=O JKQOBWVOAYFWKG-UHFFFAOYSA-N 0.000 claims description 4
- WCPAKWJPBJAGKN-UHFFFAOYSA-N oxadiazole Chemical compound C1=CON=N1 WCPAKWJPBJAGKN-UHFFFAOYSA-N 0.000 claims description 4
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 claims description 4
- 229920000867 polyelectrolyte Chemical class 0.000 claims description 4
- 239000000377 silicon dioxide Substances 0.000 claims description 4
- 229910052682 stishovite Inorganic materials 0.000 claims description 4
- 229910052905 tridymite Inorganic materials 0.000 claims description 4
- GKWLILHTTGWKLQ-UHFFFAOYSA-N 2,3-dihydrothieno[3,4-b][1,4]dioxine Chemical compound O1CCOC2=CSC=C21 GKWLILHTTGWKLQ-UHFFFAOYSA-N 0.000 claims description 3
- QPLDLSVMHZLSFG-UHFFFAOYSA-N CuO Inorganic materials [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 claims description 3
- TVIVIEFSHFOWTE-UHFFFAOYSA-K tri(quinolin-8-yloxy)alumane Chemical compound [Al+3].C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1 TVIVIEFSHFOWTE-UHFFFAOYSA-K 0.000 claims description 3
- AGJAUFUNZWHLKE-UHFFFAOYSA-N (2E,4E)-N-isobutyl-2,4-tetradecadienamide Natural products CCCCCCCCCC=CC=CC(=O)NCC(C)C AGJAUFUNZWHLKE-UHFFFAOYSA-N 0.000 claims description 2
- FKNIDKXOANSRCS-UHFFFAOYSA-N 2,3,4-trinitrofluoren-1-one Chemical compound C1=CC=C2C3=C([N+](=O)[O-])C([N+]([O-])=O)=C([N+]([O-])=O)C(=O)C3=CC2=C1 FKNIDKXOANSRCS-UHFFFAOYSA-N 0.000 claims description 2
- MUNFOTHAFHGRIM-UHFFFAOYSA-N 2,5-dinaphthalen-1-yl-1,3,4-oxadiazole Chemical compound C1=CC=C2C(C3=NN=C(O3)C=3C4=CC=CC=C4C=CC=3)=CC=CC2=C1 MUNFOTHAFHGRIM-UHFFFAOYSA-N 0.000 claims description 2
- PWFFDTZNRAEFIY-UHFFFAOYSA-N 4-(4-aminophenyl)-3-(4-methoxyphenyl)aniline Chemical compound C1=CC(OC)=CC=C1C1=CC(N)=CC=C1C1=CC=C(N)C=C1 PWFFDTZNRAEFIY-UHFFFAOYSA-N 0.000 claims description 2
- AWXGSYPUMWKTBR-UHFFFAOYSA-N 4-carbazol-9-yl-n,n-bis(4-carbazol-9-ylphenyl)aniline Chemical compound C12=CC=CC=C2C2=CC=CC=C2N1C1=CC=C(N(C=2C=CC(=CC=2)N2C3=CC=CC=C3C3=CC=CC=C32)C=2C=CC(=CC=2)N2C3=CC=CC=C3C3=CC=CC=C32)C=C1 AWXGSYPUMWKTBR-UHFFFAOYSA-N 0.000 claims description 2
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 claims description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 claims description 2
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims description 2
- 229910052779 Neodymium Inorganic materials 0.000 claims description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 claims description 2
- BUCWIXOVQSZCDF-UHFFFAOYSA-N [In].N1=CC=CC2=CC=CC=C12 Chemical compound [In].N1=CC=CC2=CC=CC=C12 BUCWIXOVQSZCDF-UHFFFAOYSA-N 0.000 claims description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 2
- 229910052788 barium Inorganic materials 0.000 claims description 2
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 claims description 2
- 239000004305 biphenyl Substances 0.000 claims description 2
- WGUXTFIVFMTBIL-UHFFFAOYSA-N boron;lithium;quinolin-8-ol Chemical compound [Li].[B].C1=CN=C2C(O)=CC=CC2=C1 WGUXTFIVFMTBIL-UHFFFAOYSA-N 0.000 claims description 2
- 229910052791 calcium Inorganic materials 0.000 claims description 2
- 239000011575 calcium Substances 0.000 claims description 2
- 150000004649 carbonic acid derivatives Chemical class 0.000 claims description 2
- JJKSAEHNIHMQKQ-UHFFFAOYSA-N copper;quinoline Chemical compound [Cu].N1=CC=CC2=CC=CC=C21 JJKSAEHNIHMQKQ-UHFFFAOYSA-N 0.000 claims description 2
- 229910052593 corundum Inorganic materials 0.000 claims description 2
- 238000010894 electron beam technology Methods 0.000 claims description 2
- 150000004820 halides Chemical class 0.000 claims description 2
- 238000010884 ion-beam technique Methods 0.000 claims description 2
- ANYCDYKKVZQRMR-UHFFFAOYSA-N lithium;quinoline Chemical compound [Li].N1=CC=CC2=CC=CC=C21 ANYCDYKKVZQRMR-UHFFFAOYSA-N 0.000 claims description 2
- 125000000040 m-tolyl group Chemical group [H]C1=C([H])C(*)=C([H])C(=C1[H])C([H])([H])[H] 0.000 claims description 2
- 229910052749 magnesium Inorganic materials 0.000 claims description 2
- 239000011777 magnesium Substances 0.000 claims description 2
- 238000001755 magnetron sputter deposition Methods 0.000 claims description 2
- JNBXWZGMEVQJTH-UHFFFAOYSA-N n,n-diphenylaniline;3-methyl-n-phenylaniline Chemical compound CC1=CC=CC(NC=2C=CC=CC=2)=C1.C1=CC=CC=C1N(C=1C=CC=CC=1)C1=CC=CC=C1 JNBXWZGMEVQJTH-UHFFFAOYSA-N 0.000 claims description 2
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 claims description 2
- GNRSAWUEBMWBQH-UHFFFAOYSA-N nickel(II) oxide Inorganic materials [Ni]=O GNRSAWUEBMWBQH-UHFFFAOYSA-N 0.000 claims description 2
- ZKATWMILCYLAPD-UHFFFAOYSA-N niobium pentoxide Inorganic materials O=[Nb](=O)O[Nb](=O)=O ZKATWMILCYLAPD-UHFFFAOYSA-N 0.000 claims description 2
- 150000002823 nitrates Chemical class 0.000 claims description 2
- NFHFRUOZVGFOOS-UHFFFAOYSA-N palladium;triphenylphosphane Chemical compound [Pd].C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 NFHFRUOZVGFOOS-UHFFFAOYSA-N 0.000 claims description 2
- UEZVMMHDMIWARA-UHFFFAOYSA-M phosphonate Chemical compound [O-]P(=O)=O UEZVMMHDMIWARA-UHFFFAOYSA-M 0.000 claims description 2
- 229910052700 potassium Inorganic materials 0.000 claims description 2
- 239000011591 potassium Substances 0.000 claims description 2
- 238000003672 processing method Methods 0.000 claims description 2
- RHIXKTWKRQPYAI-UHFFFAOYSA-N quinoline;zinc Chemical compound [Zn].N1=CC=CC2=CC=CC=C21 RHIXKTWKRQPYAI-UHFFFAOYSA-N 0.000 claims description 2
- 229910052701 rubidium Inorganic materials 0.000 claims description 2
- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical compound [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 claims description 2
- 229910052708 sodium Inorganic materials 0.000 claims description 2
- 239000011734 sodium Substances 0.000 claims description 2
- 239000000243 solution Substances 0.000 claims description 2
- 150000003467 sulfuric acid derivatives Chemical class 0.000 claims description 2
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 claims description 2
- ODHXBMXNKOYIBV-UHFFFAOYSA-N triphenylamine Chemical compound C1=CC=CC=C1N(C=1C=CC=CC=1)C1=CC=CC=C1 ODHXBMXNKOYIBV-UHFFFAOYSA-N 0.000 claims description 2
- ZNOKGRXACCSDPY-UHFFFAOYSA-N tungsten(VI) oxide Inorganic materials O=[W](=O)=O ZNOKGRXACCSDPY-UHFFFAOYSA-N 0.000 claims description 2
- 229910001845 yogo sapphire Inorganic materials 0.000 claims description 2
- 125000001637 1-naphthyl group Chemical group [H]C1=C([H])C([H])=C2C(*)=C([H])C([H])=C([H])C2=C1[H] 0.000 claims 1
- QBPHHMJVKYUQMB-UHFFFAOYSA-N [Cu].C1(C=2C(C(N1)=O)=CC=CC2)=O Chemical compound [Cu].C1(C=2C(C(N1)=O)=CC=CC2)=O QBPHHMJVKYUQMB-UHFFFAOYSA-N 0.000 claims 1
- 238000005442 molecular electronic Methods 0.000 claims 1
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 claims 1
- 238000005036 potential barrier Methods 0.000 abstract description 4
- 230000004888 barrier function Effects 0.000 abstract description 3
- 230000005540 biological transmission Effects 0.000 abstract description 2
- 239000011248 coating agent Substances 0.000 abstract 4
- 238000000576 coating method Methods 0.000 abstract 4
- 238000009825 accumulation Methods 0.000 abstract 1
- 229910052751 metal Inorganic materials 0.000 description 17
- 239000002184 metal Substances 0.000 description 17
- 229920000642 polymer Polymers 0.000 description 13
- 239000010949 copper Substances 0.000 description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 10
- 229910052802 copper Inorganic materials 0.000 description 10
- 238000001704 evaporation Methods 0.000 description 9
- 239000004205 dimethyl polysiloxane Substances 0.000 description 8
- 238000001035 drying Methods 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 8
- 229920000435 poly(dimethylsiloxane) Polymers 0.000 description 8
- DDTHMESPCBONDT-UHFFFAOYSA-N 4-(4-oxocyclohexa-2,5-dien-1-ylidene)cyclohexa-2,5-dien-1-one Chemical compound C1=CC(=O)C=CC1=C1C=CC(=O)C=C1 DDTHMESPCBONDT-UHFFFAOYSA-N 0.000 description 7
- 229920003227 poly(N-vinyl carbazole) Polymers 0.000 description 7
- 238000012360 testing method Methods 0.000 description 7
- 229910052782 aluminium Inorganic materials 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- 239000004642 Polyimide Substances 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- XCJYREBRNVKWGJ-UHFFFAOYSA-N copper(II) phthalocyanine Chemical compound [Cu+2].C12=CC=CC=C2C(N=C2[N-]C(C3=CC=CC=C32)=N2)=NC1=NC([C]1C=CC=CC1=1)=NC=1N=C1[C]3C=CC=CC3=C2[N-]1 XCJYREBRNVKWGJ-UHFFFAOYSA-N 0.000 description 4
- 229920001721 polyimide Polymers 0.000 description 4
- SRPSKMHWJZOLCR-UHFFFAOYSA-N 2,3,4,5-tetraphenyl-1h-silole Chemical compound [SiH2]1C(C=2C=CC=CC=2)=C(C=2C=CC=CC=2)C(C=2C=CC=CC=2)=C1C1=CC=CC=C1 SRPSKMHWJZOLCR-UHFFFAOYSA-N 0.000 description 2
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 description 2
- DIVZFUBWFAOMCW-UHFFFAOYSA-N 4-n-(3-methylphenyl)-1-n,1-n-bis[4-(n-(3-methylphenyl)anilino)phenyl]-4-n-phenylbenzene-1,4-diamine Chemical compound CC1=CC=CC(N(C=2C=CC=CC=2)C=2C=CC(=CC=2)N(C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C=C(C)C=CC=2)C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C=C(C)C=CC=2)=C1 DIVZFUBWFAOMCW-UHFFFAOYSA-N 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- 239000005977 Ethylene Substances 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000004770 highest occupied molecular orbital Methods 0.000 description 2
- 238000004768 lowest unoccupied molecular orbital Methods 0.000 description 2
- 239000005011 phenolic resin Substances 0.000 description 2
- 229920001568 phenolic resin Polymers 0.000 description 2
- 238000009987 spinning Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- AGIJRRREJXSQJR-UHFFFAOYSA-N 2h-thiazine Chemical compound N1SC=CC=C1 AGIJRRREJXSQJR-UHFFFAOYSA-N 0.000 description 1
- CNABXVMSAAGLTN-UHFFFAOYSA-N C[Cu].C1(C=2C(C(N1)=O)=CC=CC2)=O Chemical compound C[Cu].C1(C=2C(C(N1)=O)=CC=CC2)=O CNABXVMSAAGLTN-UHFFFAOYSA-N 0.000 description 1
- 241001391944 Commicarpus scandens Species 0.000 description 1
- 229910021593 Copper(I) fluoride Inorganic materials 0.000 description 1
- 229920000144 PEDOT:PSS Polymers 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- 125000003368 amide group Chemical group 0.000 description 1
- BMRUOURRLCCWHB-UHFFFAOYSA-M copper(i) fluoride Chemical compound [Cu]F BMRUOURRLCCWHB-UHFFFAOYSA-M 0.000 description 1
- 238000001723 curing Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000010325 electrochemical charging Methods 0.000 description 1
- 238000010326 electrochemical discharging Methods 0.000 description 1
- 238000003487 electrochemical reaction Methods 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000003912 environmental pollution Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 229910052747 lanthanoid Inorganic materials 0.000 description 1
- 150000002602 lanthanoids Chemical class 0.000 description 1
- 150000003014 phosphoric acid esters Chemical class 0.000 description 1
- IEQIEDJGQAUEQZ-UHFFFAOYSA-N phthalocyanine Chemical compound N1C(N=C2C3=CC=CC=C3C(N=C3C4=CC=CC=C4C(=N4)N3)=N2)=C(C=CC=C2)C2=C1N=C1C2=CC=CC=C2C4=N1 IEQIEDJGQAUEQZ-UHFFFAOYSA-N 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920000553 poly(phenylenevinylene) Polymers 0.000 description 1
- 229920000172 poly(styrenesulfonic acid) Polymers 0.000 description 1
- 150000008442 polyphenolic compounds Chemical class 0.000 description 1
- 235000013824 polyphenols Nutrition 0.000 description 1
- 229940005642 polystyrene sulfonic acid Drugs 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 125000002943 quinolinyl group Chemical group N1=C(C=CC2=CC=CC=C12)* 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- PWYVVBKROXXHEB-UHFFFAOYSA-M trimethyl-[3-(1-methyl-2,3,4,5-tetraphenylsilol-1-yl)propyl]azanium;iodide Chemical compound [I-].C[N+](C)(C)CCC[Si]1(C)C(C=2C=CC=CC=2)=C(C=2C=CC=CC=2)C(C=2C=CC=CC=2)=C1C1=CC=CC=C1 PWYVVBKROXXHEB-UHFFFAOYSA-M 0.000 description 1
- 238000001291 vacuum drying Methods 0.000 description 1
Landscapes
- Secondary Cells (AREA)
- Photovoltaic Devices (AREA)
Abstract
本发明涉及一种提高全固态电储能器件充电效率的方法,其方法为在器件的电极层和电荷存储层之间引入电荷充电缓冲层,使器件形成正电极/正电荷充电缓冲层/正电荷存储层/绝缘层/电子存储层/电子充电缓冲层/负电极的结构。引入电荷充电缓冲层后,可以降低电极层和电荷存储层之间的界面势垒,提高了电荷的传输速率,从而提高了器件的工作效率和稳定性。
Description
发明领域
本发明涉及一种提高全固态电储能器件充电效率的方法。
背景技术
储能设备在现在社会中具有十分重要的地位,日益普及的便携式电子设备和电动汽车对储能设备的性能提出了较高的要求。与此同时,为摆脱化石能源带来的能源枯竭、环境污染和气候变化问题,发展太阳能、风能等可再生能源已成为社会的共识,可再生能源通常具有的分散性和波动性特征,其应用起来非常不便。储能设备可以解决可再生能源在空间和时间上的缺陷,为其大规模应用奠定基础。制备高性能、绿色环保、安全可靠的储能设备,成为科学界和工业界的迫切任务。
传统的储能设备,如电池和电容器在储能领域发挥了重要的作用,但是电池的能量密度高而其功率密度较低,主要是由于电池要通过电化学反应才能产生电荷,因此充电或放电需要一定的时间,导致其功率密度较低。锂电池是近年来研究的热点,其能量密度和综合循环效率很高,但是在使用过程中容易发生短路、过充等现象,电容量也会缓慢衰退。超级电容是一种介于传统电容器和二次电池之间的新型储能器件,它功率密度大,充放电速度快,寿命长,但其能量密度仍小于锂电池,限制了超级电容器在储能领域的应用。
专利201210376840.9公开了一种新型的全固态电储能器件,其使用电荷存储材料来储能,采用正电极/正电荷存储材料/绝缘材料/电子存储材料/负电极的夹心结构。这种全固态电储能器件具有高的能量密度和功率密度,没有电解质损耗,使用寿命长,安全性高。
这种全固态电储能器件选用的电极为铜、铝等金属电极,正电荷存储材料是聚对苯撑乙烯、聚乙烯咔唑、聚酚噻嗪中的一种或大于一种的复合物,电子存储材料是联苯醌、噻咯中的一种或大于一种的复合物构成。
该全固态电储能器件所使用的正电极的功函数与正电荷存储层的最高占据分子轨道(HOMO)能级,负电荷的功函数和电子存储层的最低未占有轨道(LUOM)的能级相差比较大,导致充电时在电极和储电材料之间形成能量势垒,电荷传输不是理想的欧姆接触,要将加在器件上的电场增大到一定程度才能使电荷充进去,而所用电压的大小取决于能量势垒的高低。
因此该发明的全固态电储能器件在充电时,需要施加较高的电压,以克服电极和电荷存储层之间的势垒,这样不仅需要高的能耗,器件的工作效率下降,而且高的电压也容易使得器件发生击穿而破坏。
发明内容
本发明提供一种提高全固态电储能器件充电效率的方法。
本发明的提高全固态储能器件充电效率的方法是在器件的电极层和电荷存储层之间引入电荷充电缓冲层,使器件形成正电极/正电荷充缓冲层/正电荷存储层/绝缘层/电子存储层/电子充电缓冲层/负电极的结构。
所述的电荷充电缓冲层是由缓冲材料单独成膜,或者缓冲材料与电荷存储材料复合成膜,缓冲材料和电荷存储材料复合的摩尔比为20∶80~80∶20。
所述的电荷充电缓冲层的加工方法,为磁控溅射法,真空蒸镀法,化学气相沉积(CVD),原子层沉积(ALD),等离子体增强化学气相沉积(PECVD),电子束真空沉积,离子束真空沉积,溶液旋涂法等中的一种。
所述的缓冲层的厚度为5nm~100nm。
所述的缓冲材料是电势垒介于电极和电荷存储材料之间,具有较大的电荷迁移率,并且具有很好的稳定性,以及可加工性,分为正电荷缓冲材料和电子缓冲材料。
其中,
1.正电荷缓冲材料为联苯胺类,或者酞菁铜(CuPc)及其衍生物,或者聚3,4-乙撑二氧噻吩(PEDOT)聚苯乙烯磺酸盐(PSS)的混合物,或者金属氧化物类中的一种或几种的混合物。
所述的联苯胺类为N,N′-二(萘-1-基)-N,N′-二苯胺-联苯胺;N,N′-二苯基-N,N′-双(3-甲基苯基)-1,1-二苯基-4,4′-二胺;4,4′,4″-三[N-(3-甲基)-N-苯胺基]三苯胺;4,4′,4″-三偶(3-甲基苯基苯胺)三苯胺;六噻吩;4,4′,4″-[N-2-萘基-N-苯胺基]-三苯胺;4,4′,4″-三-(N-1-萘基-N-苯胺基)-三苯胺;4,4′,4″-三(咔唑-9-基)-三苯胺;N,N,N,N-四(4-甲氧基苯基)-联苯胺等中的一种或几种的混合物;
所述的酞菁铜(CuPc)及其衍生物为磺化酞菁铜、酞酰亚胺甲基酞菁铜、氯甲基化酞菁铜、硝基化酞菁铜、氟代酞菁铜和氨基化酞菁铜等中的一种或几种的混合物;
所述的金属氧化物类为Al2O3,SiO2,CuO,Pr2O3,NiO,Ta2O5,TiO2,WO3,MoO3,TiO2,Nb2O5等中的一种或几种的混合物。
2.电子缓冲材料为金属化合物、或者芴的共聚物及其聚电解质衍生物、或者噁二唑类有机分子、或者喹啉环金属配合物中的一种或几种的混合物。
所述的金属化合物为:碱金属,碱土金属,镧系金属化学物以及它们的混合物,如锂、钠、钾、铷、镁、钙、钡、钕等的氧化物、碳酸化物、卤素化物、硝酸化物、硫酸化物等中的一种或几种的混合物;
所述的芴的共聚物及其聚电解质衍生物为膦酸酯聚芴、胺基聚芴、三硝基芴酮等中的一种或几种的混合物;
所述的噁二唑类有机分子为1-(4-二苯基)-5-(4-叔丁基苯)-1,3,4-噁二唑(PBD);2,5-双(4-萘基)-1,3,4-噁二唑(BND);2,5-二芳基-1,3,4-噁二唑等中的一种或几种的混合物;
所述的喹啉环金属配合物为喹啉锂、喹啉铜、喹啉锌、喹啉铟、三(8-羟基喹啉铝),四(8-羟基喹啉硼锂)等中的一种或几种的混合物。
本发明在全固态电储能器件的电极和电荷存储层之间加入电荷缓冲层,缓冲层的能级介于电极和储电层的能级之间,故能较好地与电极的功函数匹配,从而降低了电荷传递势垒,大大提高电荷传递能力,缩短充电时间,提高充电效率。
附图说明
图1全固态电储能器件结构示意图;
其中,1是正极电极,2是正电荷充电缓冲层,3层是正电荷存储层,4是绝缘层,5是电子存储层,6是电子充电缓冲层,7是负极电极。
图2为PEDOT:PSS,CuPc,m-MTDATA,PF-EP,Alq3的化学结构式。
具体实施方式
下面结合具体实施方法和附图对本发明作进一步地说明。
实施例1
采用真空蒸镀技术在玻璃表面蒸镀面积为10×10cm2,厚度为100nm的金属铜;随后在铜电极上旋涂一层80nm厚的PEDOT:PSS(聚3,4-乙烯二氧噻吩:聚苯乙烯磺酸),在空气中110℃干燥30min;接着真空蒸镀厚度为800nm的3,3′-二甲基-5,5′-二叔丁基联苯醌,厚度为200nm的SiO2作为绝缘层。然后在表面旋涂一层厚度为400nm的聚对苯撑乙烯(平均分子量为8050),干燥固化后,在聚合物表面真空蒸镀一层厚度为20nm的LiF;最后镀上负电极,100nm的金属铜,即得到本发明所述的全固态电储能器件。测试表明,该全固态电储能器件的在充电电压为12.5V时,电流密度为200mA/cm2。
对比例1
采用真空蒸镀技术在玻璃表面依次蒸镀面积为10×10cm2,厚度为100nm的金属铜;厚度为800nm的3,3′-二甲基-5,5′-二叔丁基联苯醌,厚度为200nm的SiO2。然后在表面旋涂一层厚度为400nm的聚对苯撑乙烯(平均分子量为8050)。干燥固化后,在聚合物表面真空蒸镀一层厚度为100nm的金属铜,即得到无充电缓冲层的全固态电储能器件。测试表明,该全固态电储能器件的在充电电压为12.5V时,电流密度为130mA/cm2。
实施例2
采用真空蒸镀技术在金属铝表面制备一层面积为10×10cm2,厚度为40nm的酞菁铜(CuPc)作为正电荷充电缓冲层;接着蒸镀1μm的3,3′-二甲基-5,5′-二叔丁基联苯醌,然后在联苯醌层表面旋涂一层厚度为5μm的聚酰亚胺。最后在聚酰亚胺表面旋涂一层厚度为750nm的聚乙烯咔唑聚合物(平均分子量为19325)。干燥固化后,在聚合物表面真空蒸镀一层20nm的Li3N作为负电荷充电缓冲层,最后蒸镀100nm后的金属Al,即得到本发明所述的全固态电储能器件。测试表明,该全固态电储能器件在充电电压为6.2V时,电流密度为124mA/cm2。
对比例2
采用真空蒸镀技术在金属铝表面制备一层面积为10×10cm2,厚度为1μm的3,3′-二甲基-5,5′-二叔丁基联苯醌,然后在联苯醌层表面旋涂一层厚度为5μm的聚酰亚胺。最后在聚酰亚胺表面旋涂一层厚度为750nm的聚乙烯咔唑聚合物(平均分子量为19325)。干燥固化后,在聚合物表面真空蒸镀一层100nm后的金属Al,即得到无充电电缓冲层的全固态电储能器件。测试表明,该全固态电储能器件在充电电压为6.2V时,电流密度为86mA/cm2。
实施例3
采用真空蒸镀技术在酚醛树脂片表面依次蒸镀面积为10×10cm2,厚度为100nm的金属铜,蒸镀40nm的m-MTDATA作为正电荷缓冲层,厚度为4μm的2,3,4,5-四苯基噻咯,然后在联苯醌层表面旋涂一层厚度为5μm的聚二甲基硅氧烷。最后在聚二甲基硅氧烷层表面旋涂一层厚度为4μm的聚乙烯咔唑聚合物(平均分子量为1930)。干燥后,使用乙醇做溶剂,旋涂一层45nm厚磷酸酯聚芴(PF-EP),55℃真空干燥30min,最后在聚合物表面真空蒸镀一层100nm厚的金属Cu,即得到本发明所述的全固态电储能器件。测试表明,该全固态电储能器件在充电电压为11.3V时,电流密度为156mA/cm2。
对比例3
采用真空蒸镀技术在酚醛树脂片表面依次蒸镀面积为10×10cm2,厚度为100nm的金属铜,厚度为4μm的2,3,4,5-四苯基噻咯,然后在联苯醌层表面旋涂一层厚度为5μm的聚二甲基硅氧烷。最后在聚二甲基硅氧烷层表面旋涂一层厚度为4μm的聚乙烯咔唑聚合物(平均分子量为1930)。干燥固化后,在聚合物表面真空蒸镀一层100nm厚的金属铜,即得无充电缓冲层的全固态电储能器件。测试表明,该全固态电储能器件在充电电压为11.3V时,电流密度108mA/cm2。
实施例4
采用真空蒸镀技术在金属铝表面制备一层面积为10×10cm2,厚度为45nm的MoO3作为正电荷充电缓冲层,接着蒸镀2μm的3,3′-二甲基-5,5′-二叔丁基联苯醌,然后在联苯醌层表面旋涂一层厚度为5μm的聚二甲基硅氧烷。最后在聚二甲基硅氧烷层表面旋涂一层厚度为1.8μm的聚乙烯咔唑聚合物(平均分子量为2330)。干燥固化后,在聚合物表面真空蒸镀一层35nm厚的三(8-羟基喹啉铝)(Alq3)作为电子充电缓冲层,最后是100nm厚的金属Al,即得到本发明所述的全固态电储能器件。测试表明,该全固态电储能器件的在充电电压为17V时,电流密度为184mA/cm2。
对比例4
采用真空蒸镀技术在金属铝表面制备一层面积为10×10cm2,厚度为2μm的3,3’-二甲基-5,5’-二叔丁基联苯醌,然后在联苯醌层表面旋涂一层厚度为5μm的聚二甲基硅氧烷。最后在聚二甲基硅氧烷层表面旋涂一层厚度为1.8μm的聚乙烯咔唑聚合物(平均分子量为2330)。干燥固化后,在聚合物表面真空蒸镀一层100nm厚的金属Al,即得到无充电缓冲层的全固态电储能器件。该全固态电储能器件的在充电电压为17V时,电流密度为139mA/cm2。
Claims (10)
1.一种提高全固态电储能器件充电效率的方法,其特征在于其方法是在器件的电极层和电荷存储层之间引入电荷充电缓冲层,使器件形成正电极/正电荷充电缓冲层/正电荷存储层/绝缘层/电子存储层/电子充电缓冲层/负电极的结构,其中,电荷充电缓冲层由缓冲材料单独成膜或者缓冲材料与电荷存储材料复合成膜,其中,缓冲材料和电荷存储材料复合的摩尔比为20∶80~80∶20;
所述的缓冲材料分为正电荷缓冲材料和电子缓冲材料;
所述的正电荷缓冲材料为联苯胺类或酞菁铜(CuPc)及其衍生物或聚3,4-乙撑二氧噻吩(PEDOT)和聚苯乙烯磺酸盐(PSS)的混合物或金属氧化物中的一种或几种的混合物;
所述的电子缓冲材料为金属化合物或者芴的共聚物及其聚电解质衍生物或者噁二唑类有机分子或者喹啉环金属配合物中的一种或几种的混合物。
2.根据权利要求1所述的一种提高全固态电储能器件充电效率的方法,所述的电荷充电缓冲层的加工方法,为磁控溅射法,真空蒸镀法,原子层沉积(ALD),等离子体增强化学气相沉积(PECVD),电子束真空沉积,离子束真空沉积,溶液旋涂法中的一种。
3.根据权利要求1所述的一种提高全固态电储能器件充电效率的方法,所述的电荷充电缓冲层的厚度为5nm~100nm。
4.根据权利要求1所述的一种提高全固态电储能器件充电效率的方法,所述的联苯胺类正电荷缓冲材料为N,N′-二(萘-1-基)-N,N′-二苯胺-联苯胺;N,N′-二苯基-N,N′-双(3-甲基苯基)-1,1-二苯基-4,4′-二胺;4,4′,4″-三[N-(3-甲基)-N-苯胺基]三苯胺;4,4′,4″-三偶(3-甲基苯基苯胺)三苯胺;六噻吩;4,4′,4″-[N-2-萘基-N-苯胺基]-三苯胺;4,4′,4″-三-(N-1-萘基-N-苯胺基)-三苯胺;4,4′,4″-三(咔唑-9-基)-三苯胺;N,N,N,N-四(4-甲氧基苯基)-联苯胺中的一种或几种的混合物。
5.根据权利要求1所述的一种提高全固态电储能器件充电效率的方法,所述的酞菁铜(CuPc)及其衍生物正电荷缓冲材料为磺化酞菁铜、酞酰亚胺甲基酞菁铜、氯甲基化酞菁铜、硝基化酞菁铜、氟代酞菁铜和氨基化酞菁铜中的一种或几种的混合物。
6.根据权利要求1所述的一种提高全固态电储能器件充电效率的方法,所述的金属氧化物类正电荷缓冲材料为Al2O3,SiO2,CuO,Pr2O3,NiO,Ta2O5,TiO2,WO3,MoO3,TiO2,Nb2O5中的一种或几种的混合物。
7.根据权利要求1所述的一种提高全固态电储能器件充电效率的方法,所述的金属化合物类电子缓冲材料为锂、钠、钾、铷、镁、钙、钡、钕的氧化物、碳酸化物、卤素化物、硝酸化物、硫酸化物中的一种或几种的混合物。
8.根据权利要求1所述的一种提高全固态电储能器件充电效率的方法,所述的芴的共聚物及其聚电解质衍生物类电子缓冲材料为膦酸酯聚芴、胺基聚芴、三硝基芴酮中的一种或几种的混合物。
9.根据权利要求1所述的一种提高全固态电储能器件充电效率的方法,所述的噁二唑类有机分子电子缓冲材料为1-(4-二苯基)-5-(4-叔丁基苯)-1,3,4-噁二唑(PBD);2,5-双(4-萘基)-1,3,4-噁二唑(BND);2,5-二芳基-1,3,4-噁二唑中的一种或几种的混合物。
10.根据权利要求1所述的一种提高全固态电储能器件充电效率的方法,所述的喹啉环金属配合物电子缓冲材料为喹啉锂、喹啉铜、喹啉锌、喹啉铟、三(8-羟基喹啉铝)、四(8-羟基喹啉硼锂)中的一种或几种的混合物。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210395541.XA CN103000379B (zh) | 2012-10-18 | 2012-10-18 | 一种提高全固态电储能器件充电效率的方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210395541.XA CN103000379B (zh) | 2012-10-18 | 2012-10-18 | 一种提高全固态电储能器件充电效率的方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN103000379A CN103000379A (zh) | 2013-03-27 |
CN103000379B true CN103000379B (zh) | 2016-04-20 |
Family
ID=47928835
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201210395541.XA Expired - Fee Related CN103000379B (zh) | 2012-10-18 | 2012-10-18 | 一种提高全固态电储能器件充电效率的方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN103000379B (zh) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1487541A (zh) * | 2002-08-16 | 2004-04-07 | Hc | 作为电解电容器中的固体电解质的取代聚(亚烷基二氧噻吩) |
CN1578993A (zh) * | 2001-11-03 | 2005-02-09 | H.C.施塔克公司 | 使用导电聚合物的薄膜电容器 |
CN101134814A (zh) * | 2006-08-24 | 2008-03-05 | E.I.内穆尔杜邦公司 | 空穴传输聚合物 |
CN102239526A (zh) * | 2008-12-09 | 2011-11-09 | E.I.内穆尔杜邦公司 | 导电聚合物组合物 |
WO2012021289A1 (en) * | 2010-08-12 | 2012-02-16 | Massachusetts Institute Of Technology | Flexible conducting polymer energy storage device |
-
2012
- 2012-10-18 CN CN201210395541.XA patent/CN103000379B/zh not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1578993A (zh) * | 2001-11-03 | 2005-02-09 | H.C.施塔克公司 | 使用导电聚合物的薄膜电容器 |
CN1487541A (zh) * | 2002-08-16 | 2004-04-07 | Hc | 作为电解电容器中的固体电解质的取代聚(亚烷基二氧噻吩) |
CN101134814A (zh) * | 2006-08-24 | 2008-03-05 | E.I.内穆尔杜邦公司 | 空穴传输聚合物 |
CN102239526A (zh) * | 2008-12-09 | 2011-11-09 | E.I.内穆尔杜邦公司 | 导电聚合物组合物 |
WO2012021289A1 (en) * | 2010-08-12 | 2012-02-16 | Massachusetts Institute Of Technology | Flexible conducting polymer energy storage device |
Non-Patent Citations (2)
Title |
---|
Effect of LiF on Capacitance of OLEDs;LI Ying tao 等;《液晶与显示》;20071031;第22卷(第5期);全文 * |
聚 3, 4-乙烯二氧噻吩/聚苯乙烯磺酸;郑华靖等;《光电工程》;20100228;第37卷(第2期);全文 * |
Also Published As
Publication number | Publication date |
---|---|
CN103000379A (zh) | 2013-03-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Yin et al. | Dithieno [3, 2‐b: 2′, 3′‐d] pyrrol‐cored hole transport material enabling Over 21% efficiency dopant‐free perovskite solar cells | |
Zhou et al. | Interface engineering for high-performance perovskite hybrid solar cells | |
Zhang et al. | Recent advance in solution‐processed organic interlayers for high‐performance planar perovskite solar cells | |
Zhang et al. | High efficiency planar p‐i‐n perovskite solar cells using low‐cost fluorene‐based hole transporting material | |
Xu et al. | Crosslinked remote-doped hole-extracting contacts enhance stability under accelerated lifetime testing in perovskite solar cells | |
Yan et al. | Stable high-performance hybrid perovskite solar cells with ultrathin polythiophene as hole-transporting layer | |
Liu et al. | A dopant-free organic hole transport material for efficient planar heterojunction perovskite solar cells | |
Sun et al. | Efficiency enhancement of planar perovskite solar cells by adding zwitterion/LiF double interlayers for electron collection | |
Wang et al. | Molecular‐level designed polymer electrolyte for high‐voltage lithium–metal solid‐state batteries | |
Li et al. | Imide‐functionalized triarylamine‐based donor‐acceptor polymers as hole transporting layers for high‐performance inverted perovskite solar cells | |
US9214255B2 (en) | P-doped conjugated polymer electrolyte and an organic electronic device using the same | |
CN101556988B (zh) | 一种具有非掺杂增益层的有机光电子器件及其制备方法 | |
Peng et al. | An efficient and thickness insensitive cathode interface material for high performance inverted perovskite solar cells with 17.27% efficiency | |
Li et al. | The donor-dependent methoxy effects on the performance of hole-transporting materials for perovskite solar cells | |
US20120266960A1 (en) | Multi layer organic thin film solar cell | |
JP2005294303A (ja) | 有機光電変換素子およびその製造方法 | |
US20230225140A1 (en) | Perovskite photoelectric element and method for manufacturing same | |
Fu et al. | Dimensional Tuning of Perylene Diimide‐Based Polymers for Perovskite Solar Cells with Over 24% Efficiency | |
Wang et al. | Novel 2D material from AMQS-based defect engineering for efficient and stable organic solar cells | |
Kim et al. | A Thiophene based dopant-free hole-transport polymer for efficient and stable perovskite solar cells | |
US9446400B2 (en) | Alcohol-soluble conjugated polymer and use thereof | |
Vasilopoulou et al. | Atomic layer deposited zirconium oxide electron injection layer for efficient organic light emitting diodes | |
Wu et al. | Molecular Regulation of Perylenediimide and Fluorene‐Based Cathode Interfacial Materials for Efficient Inverted Perovskite Solar Cells | |
CN103000379B (zh) | 一种提高全固态电储能器件充电效率的方法 | |
WO2014020989A1 (ja) | 有機薄膜太陽電池の製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160420 Termination date: 20201018 |