CN103000227A - Method for carrying out failure model modeling upon non-volatile memory product - Google Patents
Method for carrying out failure model modeling upon non-volatile memory product Download PDFInfo
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- CN103000227A CN103000227A CN2011102650405A CN201110265040A CN103000227A CN 103000227 A CN103000227 A CN 103000227A CN 2011102650405 A CN2011102650405 A CN 2011102650405A CN 201110265040 A CN201110265040 A CN 201110265040A CN 103000227 A CN103000227 A CN 103000227A
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CN2011102650405A CN103000227A (en) | 2011-09-08 | 2011-09-08 | Method for carrying out failure model modeling upon non-volatile memory product |
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CN2011102650405A CN103000227A (en) | 2011-09-08 | 2011-09-08 | Method for carrying out failure model modeling upon non-volatile memory product |
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CN103000227A true CN103000227A (en) | 2013-03-27 |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1598780A (en) * | 2003-09-16 | 2005-03-23 | 蔚华科技股份有限公司 | Memory shortage diagnostic method using failure mode as guide and its system |
US20070234161A1 (en) * | 2006-01-10 | 2007-10-04 | Blanton Ronald D | Using neighborhood functions to extract logical models of physical failures using layout based diagnosis |
CN101178941A (en) * | 2007-11-16 | 2008-05-14 | 浙江大学 | Method for dynamically estimating memory body characteristic ineffective cause of defect |
CN101241770A (en) * | 2007-01-15 | 2008-08-13 | 三星电子株式会社 | Defect analysis methods for semiconductor integrated circuit devices and defect analysis systems |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1598780A (en) * | 2003-09-16 | 2005-03-23 | 蔚华科技股份有限公司 | Memory shortage diagnostic method using failure mode as guide and its system |
US20070234161A1 (en) * | 2006-01-10 | 2007-10-04 | Blanton Ronald D | Using neighborhood functions to extract logical models of physical failures using layout based diagnosis |
CN101241770A (en) * | 2007-01-15 | 2008-08-13 | 三星电子株式会社 | Defect analysis methods for semiconductor integrated circuit devices and defect analysis systems |
CN101178941A (en) * | 2007-11-16 | 2008-05-14 | 浙江大学 | Method for dynamically estimating memory body characteristic ineffective cause of defect |
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Owner name: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING Free format text: FORMER OWNER: HUAHONG NEC ELECTRONICS CO LTD, SHANGHAI Effective date: 20140108 |
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C41 | Transfer of patent application or patent right or utility model | ||
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Free format text: CORRECT: ADDRESS; FROM: 201206 PUDONG NEW AREA, SHANGHAI TO: 201203 PUDONG NEW AREA, SHANGHAI |
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TA01 | Transfer of patent application right |
Effective date of registration: 20140108 Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech Park No. 1399 Applicant after: Shanghai Huahong Grace Semiconductor Manufacturing Corporation Address before: 201206, Shanghai, Pudong New Area, Sichuan Road, No. 1188 Bridge Applicant before: Shanghai Huahong NEC Electronics Co., Ltd. |
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C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20130327 |