CN102854195A - Method for detecting defect coordinates on color filter - Google Patents

Method for detecting defect coordinates on color filter Download PDF

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Publication number
CN102854195A
CN102854195A CN201210357215XA CN201210357215A CN102854195A CN 102854195 A CN102854195 A CN 102854195A CN 201210357215X A CN201210357215X A CN 201210357215XA CN 201210357215 A CN201210357215 A CN 201210357215A CN 102854195 A CN102854195 A CN 102854195A
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China
Prior art keywords
colored filter
image
mark
color filter
coordinate system
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CN201210357215XA
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CN102854195B (en
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张铁轶
余道平
刘超强
张祥
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BOE Technology Group Co Ltd
Beijing BOE Display Technology Co Ltd
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BOE Technology Group Co Ltd
Beijing BOE Display Technology Co Ltd
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Abstract

The invention discloses a method for detecting defect coordinates on a color filter and relates to the field of industry detection. The method comprises steps of capturing an image of the color filter; processing the image and obtaining a grey scale change critical point on the color filter; capturing a mark of the color filter or an edge of the color filter in accordance with the critical point; and determining a coordinate system of the color filter in accordance with the mark of the color filter or the edge of the color filter and outputting defect coordinates in accordance with the coordinate system. The method has the advantages that a process that a microscope is used for reading a mark is omitted, the coordinate system is established and defect coordinate data are output through image processing, the working period of devices is reduced, the detection efficiency is improved and the detection accuracy of defect coordinates is improved.

Description

The detection method of defect coordinate on the colored filter
Technical field
The present invention relates to the industrial detection technical field, particularly the detection method of defect coordinate on a kind of colored filter.
Background technology
In the prior art, detecting step for defect coordinate on the colored filter is roughly as follows: when colored filter enters AOI(Automatic Optic Inspection, the automated optical detection) after in the equipment, there is microscope to move and reads the Mark(mark), identify Mark, establish coordinate system; TDI CCD(time delay integration charge coupled cell) colored filter is scanned, the coordinate system that reads the Mark establishment by image processing and microscope mates again, the output defect coordinate.Fig. 1 is AOI equipment synoptic diagram, and as shown in Figure 1, described AOI equipment 1 comprises: microscope and TDI CCD, and microscope is arranged on the microscope portal frame 11, and TDI CCD is arranged on the TDI CCD portal frame 12.
There is following defective in existing detection method: after colored filter enters in the AOI equipment, moved by microscope first and read AOI Mark, carry out image scanning by TDI CCD again, read AOI Mark and TDI CCD scanning and be divided into two steps, cause detecting step many, sense cycle is long, and causes the frequency of device fails to rise, and affects the stability of equipment; Microscope portal frame and TDI CCD portal frame belong to two different portal frames, exist the error on the coordinate between them, and the defect coordinate that TDI CCD exports is that the data calculated take microscope are as the basis, the error of defect coordinate will be very large like this, can not process defective exactly, affect the quality of product.
Summary of the invention
The technical matters that (one) will solve
The technical problem to be solved in the present invention is: how the detection method of defect coordinate on a kind of colored filter is provided, to simplify detecting step, improves accuracy of detection.
(2) technical scheme
The detection method of defect coordinate on a kind of colored filter, it comprises step:
A: the image that catches colored filter;
B: described image is processed, obtained the critical point of gray scale variation on the described colored filter;
C: capture mark on the described colored filter or the edge of described colored filter according to described critical point;
D: determine the coordinate system of described colored filter according to the edge of the mark on the described colored filter or described colored filter, according to described coordinate system output defect coordinate.
Wherein, in the described steps A, catch the image of colored filter by the time delay integration charge coupled cell.
Wherein, described step B specifically comprises step:
B1: described image is synthesized;
B2: the image after synthetic is carried out GTG process, obtain the GTG value of each pixel on the described colored filter;
B3: according to the situation of change of described GTG value, find the critical point of gray scale variation on the described colored filter.
Wherein, describedly be labeled as a plurality ofly, be cruciform, be separately positioned on the corner of described colored filter.
Wherein, also comprise step e after described step D: repair apparatus is repaired described colored filter according to described defect coordinate.
(3) beneficial effect
On the colored filter of the present invention the detection method of defect coordinate has following advantage: omitted the step that microscope reads Mark, set up coordinate system and export the defect coordinate data by the image processing, both reduced the work period of equipment, improve detection efficiency, improved again the accuracy of detection to defect coordinate; Avoided because microscope or microscopical portal frame break down, and affected the situation that TDI CCD works, improved the stability of checkout equipment; Defect coordinate by checkout equipment output is more accurate, repairs thereby make the repair apparatus in downstream find out more accurately defective locations, has promoted product quality.
Description of drawings
Fig. 1 is AOI equipment synoptic diagram;
Fig. 2 is the process flow diagram of the detection method of defect coordinate on the described colored filter of the embodiment of the invention;
Fig. 3 is the process flow diagram of described step B;
Fig. 4 is the described position view that is marked on the colored filter;
Fig. 5 is the corresponding critical point synoptic diagram of described mark;
Fig. 6 is the synoptic diagram of the described mark that captures according to critical point;
Fig. 7 is the edge synoptic diagram of the described colored filter that captures according to critical point.
Embodiment
Below in conjunction with drawings and Examples, the specific embodiment of the present invention is described in further detail.Following examples are used for explanation the present invention, but are not used for limiting the scope of the invention.
Fig. 2 is the process flow diagram of the detection method of defect coordinate on the described colored filter of the embodiment of the invention, and as shown in Figure 2, described method comprises step:
A: the image that catches colored filter.
In this step, by the image of time delay integration charge coupled cell (being TDI CCD) seizure colored filter, described image has higher resolution.TDI CCD is applicable to the object imaging to some high-speed mobile, its advantage be same scenery to the imaging of multirow linear array pixel signal plus, comparing with common line array CCD (especially area array CCD) has reduced the unevenness that responds between the pixel.
B: described image is processed, obtained the critical point of gray scale variation on the described colored filter.
Fig. 3 is the process flow diagram of described step B, and as shown in Figure 3, described step B specifically comprises step:
B1: described image is synthesized.
Because colored filter is kept in motion, TDI original image that CCD catches can not reflect complete colored filter, therefore, needs at first described image to be synthesized, to obtain reflecting the image of complete colored filter, so that subsequent treatment.
B2: the image after synthetic is carried out GTG process, obtain the GTG value of each pixel on the described colored filter.
B3: according to the situation of change of described GTG value, find the critical point of gray scale variation on the described colored filter.
The GTG value has represented pixel in the image by the stratum level of the darkest different brightness to the brightest, when comprising mark (being Mark) in the image, the phenomenon of GTG value saltus step can occur at the intersection of mark and background image.In like manner, in the edge of described colored filter, the phenomenon of GTG value saltus step can appear also.The phenomenon of this GTG value saltus step is corresponding to the critical point of a series of gray scale variation, and can capture mark on the described colored filter or the edge of described colored filter according to these critical points.
C: capture mark on the described colored filter or the edge of described colored filter according to described critical point.
Fig. 4 is the described position view that is marked on the colored filter, as shown in Figure 4, in the present embodiment, describedly is labeled as four, is cruciform, is separately positioned on four corners of described colored filter.Described mark can be used for the follow-up coordinate system of setting up described colored filter, considers the needs of setting up coordinate system, and its quantity can also be 3,5 etc.
Fig. 5 is the corresponding critical point synoptic diagram of described mark; Fig. 6 is the synoptic diagram of the described mark that captures according to critical point.As shown in Figure 5 and Figure 6, can clearly capture mark on the described colored filter according to the corresponding critical point of described mark, in the process that obtains described mark, as classic method, not use microscope, thereby simplified treatment step, improved detection efficiency.
Fig. 7 is the edge synoptic diagram of the described colored filter that captures according to critical point, and as shown in Figure 7, the principle based on identical with catching described mark can catch the edge that obtains described colored filter.
D: determine the coordinate system of described colored filter according to the edge of the mark on the described colored filter or described colored filter, according to described coordinate system output defect coordinate.
At first describe with the described example that is labeled as, referring to Fig. 4, according at least three marks among Fig. 4, can set up the rectangular coordinate system of a described colored filter of correspondence, and definite true origin.Such as, the center of lower left corner mark is denoted as an O, the center of upper left corner mark is denoted as a Y, the center of lower right corner mark is denoted as an X, then can set up one take the O point as initial point, take O, X place straight line as the x axle, the rectangular coordinate system take O, Y place straight line as the y axle, can give a coordinate for each point on the described colored filter according to this rectangular coordinate system, thus can be according to this rectangular coordinate system output defect coordinate.
When determining the coordinate system of described colored filter according to the edge of described colored filter, can select two orthogonal edges set up one with the similar rectangular coordinate system of above-mentioned rectangular coordinate system, such as, take the intersection point of left side edge and lower edge as initial point, take left side edge place straight line as the y axle, set up rectangular coordinate system take lower edge place straight line as the x axle, then according to this rectangular coordinate system output defect coordinate.
Because the edge of described colored filter might not standard, so the determined rectangular coordinate system in edge of comparing according to described colored filter according to the definite rectangular coordinate system of described mark has higher precision, resulting defect coordinate is also correspondingly more accurate.
After obtaining described defect coordinate, can adopt repair apparatus according to described defect coordinate described colored filter to be repaired, to guarantee the reliable in quality of described colored filter.
On the described colored filter of the embodiment of the invention detection method of defect coordinate has following advantage: omitted the step that microscope reads Mark, set up coordinate system and export the defect coordinate data by the image processing, both reduced the work period of equipment, improve detection efficiency, improved again the accuracy of detection to defect coordinate; Avoided because microscope or microscopical portal frame break down, and affected the situation that TDI CCD works, improved the stability of checkout equipment; Defect coordinate by checkout equipment output is more accurate, repairs thereby make the repair apparatus in downstream find out more accurately defective locations, has promoted product quality.
Above embodiment only is used for explanation the present invention; and be not limitation of the present invention; the those of ordinary skill in relevant technologies field; in the situation that does not break away from the spirit and scope of the present invention; can also make a variety of changes and modification; therefore all technical schemes that are equal to also belong to category of the present invention, and scope of patent protection of the present invention should be defined by the claims.

Claims (5)

1. the detection method of defect coordinate on the colored filter is characterized in that, comprises step:
A: the image that catches colored filter;
B: described image is processed, obtained the critical point of gray scale variation on the described colored filter;
C: capture mark on the described colored filter or the edge of described colored filter according to described critical point;
D: determine the coordinate system of described colored filter according to the edge of the mark on the described colored filter or described colored filter, according to described coordinate system output defect coordinate.
2. the method for claim 1 is characterized in that, in the described steps A, catches the image of colored filter by the time delay integration charge coupled cell.
3. the method for claim 1 is characterized in that, described step B specifically comprises step:
B1: described image is synthesized;
B2: the image after synthetic is carried out GTG process, obtain the GTG value of each pixel on the described colored filter;
B3: according to the situation of change of described GTG value, find the critical point of gray scale variation on the described colored filter.
4. the method for claim 1 is characterized in that, describedly is labeled as a plurality ofly, is cruciform, is separately positioned on the corner of described colored filter.
5. the method for claim 1 is characterized in that, also comprise step e after described step D: repair apparatus is repaired described colored filter according to described defect coordinate.
CN201210357215.XA 2012-09-21 2012-09-21 Method for detecting defect coordinates on color filter Expired - Fee Related CN102854195B (en)

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104460104A (en) * 2014-12-26 2015-03-25 深圳市华星光电技术有限公司 Method for determining edge of overlapping region of color filtration blocks and black matrix
CN104991391A (en) * 2015-07-30 2015-10-21 武汉华星光电技术有限公司 Repair method for display panel
CN107024484A (en) * 2017-02-28 2017-08-08 张家港康得新光电材料有限公司 Display screen defect estimation apparatus and its maintaining method and display screen to be detected
CN108872240A (en) * 2017-05-11 2018-11-23 京东方科技集团股份有限公司 Microdefect detection device and detection method, microscope
CN109556831A (en) * 2018-11-27 2019-04-02 惠科股份有限公司 Method and device for detecting color filter and computer readable storage medium
WO2019062319A1 (en) * 2017-09-29 2019-04-04 京东方科技集团股份有限公司 Film layer detection method, film layer detection device, and film layer detection system
CN114965500A (en) * 2022-05-18 2022-08-30 江苏道达智能科技有限公司 AOI image detection device and detection method

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4760247A (en) * 1986-04-04 1988-07-26 Bally Manufacturing Company Optical card reader utilizing area image processing
JPH03289544A (en) * 1990-04-06 1991-12-19 Oki Electric Ind Co Ltd Surface inspecting apparatus for color filter
WO1996032690A1 (en) * 1995-04-10 1996-10-17 United Parcel Service Of America, Inc. Method for locating the position and orientation of a fiduciary mark
JP2001228049A (en) * 2000-02-15 2001-08-24 Seiko Epson Corp Apparatus and method for detection of point defect
CN1696746A (en) * 2004-05-12 2005-11-16 统宝光电股份有限公司 Method and device for repairing defect of color filter
CN101086537A (en) * 2006-06-08 2007-12-12 Icf科技有限公司 Color filter detecting system
CN201984043U (en) * 2011-03-23 2011-09-21 京东方科技集团股份有限公司 Automatic optical inspection system
CN102520537A (en) * 2011-12-02 2012-06-27 深圳市华星光电技术有限公司 Automatic optical inspection method and automatic optical inspection equipment

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4760247A (en) * 1986-04-04 1988-07-26 Bally Manufacturing Company Optical card reader utilizing area image processing
JPH03289544A (en) * 1990-04-06 1991-12-19 Oki Electric Ind Co Ltd Surface inspecting apparatus for color filter
WO1996032690A1 (en) * 1995-04-10 1996-10-17 United Parcel Service Of America, Inc. Method for locating the position and orientation of a fiduciary mark
JP2001228049A (en) * 2000-02-15 2001-08-24 Seiko Epson Corp Apparatus and method for detection of point defect
CN1696746A (en) * 2004-05-12 2005-11-16 统宝光电股份有限公司 Method and device for repairing defect of color filter
CN101086537A (en) * 2006-06-08 2007-12-12 Icf科技有限公司 Color filter detecting system
CN201984043U (en) * 2011-03-23 2011-09-21 京东方科技集团股份有限公司 Automatic optical inspection system
CN102520537A (en) * 2011-12-02 2012-06-27 深圳市华星光电技术有限公司 Automatic optical inspection method and automatic optical inspection equipment

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104460104B (en) * 2014-12-26 2017-07-21 深圳市华星光电技术有限公司 The method for determining the edge of color filter block and the overlapping region of black matrix
CN104460104A (en) * 2014-12-26 2015-03-25 深圳市华星光电技术有限公司 Method for determining edge of overlapping region of color filtration blocks and black matrix
WO2016101376A1 (en) * 2014-12-26 2016-06-30 深圳市华星光电技术有限公司 Method for determining edge of overlapping region of color filtration block and black matrix
US9507115B2 (en) 2014-12-26 2016-11-29 Shenzhen China Star Optoelectronics Technology Co., Ltd. Method for determining the edges of an overlapping region between a color filter and a black matrix
CN104991391B (en) * 2015-07-30 2018-01-30 武汉华星光电技术有限公司 The restorative procedure of display panel
CN104991391A (en) * 2015-07-30 2015-10-21 武汉华星光电技术有限公司 Repair method for display panel
CN107024484A (en) * 2017-02-28 2017-08-08 张家港康得新光电材料有限公司 Display screen defect estimation apparatus and its maintaining method and display screen to be detected
CN107024484B (en) * 2017-02-28 2020-05-22 张家港康得新光电材料有限公司 Display screen defect assessment device, maintenance method thereof and display screen to be detected
CN108872240A (en) * 2017-05-11 2018-11-23 京东方科技集团股份有限公司 Microdefect detection device and detection method, microscope
WO2019062319A1 (en) * 2017-09-29 2019-04-04 京东方科技集团股份有限公司 Film layer detection method, film layer detection device, and film layer detection system
CN109556831A (en) * 2018-11-27 2019-04-02 惠科股份有限公司 Method and device for detecting color filter and computer readable storage medium
CN114965500A (en) * 2022-05-18 2022-08-30 江苏道达智能科技有限公司 AOI image detection device and detection method
CN114965500B (en) * 2022-05-18 2024-04-26 江苏道达智能科技有限公司 AOI image detection device and detection method

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