CN102788680A - Method for measuring high reflectivity by using radio frequency ruler method - Google Patents
Method for measuring high reflectivity by using radio frequency ruler method Download PDFInfo
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- CN102788680A CN102788680A CN2011101312971A CN201110131297A CN102788680A CN 102788680 A CN102788680 A CN 102788680A CN 2011101312971 A CN2011101312971 A CN 2011101312971A CN 201110131297 A CN201110131297 A CN 201110131297A CN 102788680 A CN102788680 A CN 102788680A
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- reflectivity
- radio frequency
- line width
- light path
- cavity
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- 238000000034 method Methods 0.000 title claims abstract description 32
- 238000002310 reflectometry Methods 0.000 title claims abstract description 21
- 238000001228 spectrum Methods 0.000 claims abstract description 8
- 230000005622 photoelectricity Effects 0.000 claims description 6
- 230000003287 optical effect Effects 0.000 claims description 4
- 230000003595 spectral effect Effects 0.000 abstract description 2
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 238000005259 measurement Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- CPBQJMYROZQQJC-UHFFFAOYSA-N helium neon Chemical compound [He].[Ne] CPBQJMYROZQQJC-UHFFFAOYSA-N 0.000 description 2
- 238000003556 assay Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000009514 concussion Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000001579 optical reflectometry Methods 0.000 description 1
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- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention discloses a method for measuring high reflectivity by using a radio frequency ruler method. The method comprises application steps of manufacturing a reflector with reflectivity to be measured into a photoelectrical resonant cavity; constructing a light path; conducting photoelectrical phase modulation on incoming lasers to produce positive and negative first-stage sidebands; scanning the photoelectrical resonant cavity through sawtooth waves to obtain spectra; enabling frequency distance between carrier waves and the first-stage sidebands to serve as a radio frequency ruler and measuring the half-peak whole-line width of the carrier waves according to proportion; and calculating the reflectivity of the reflector by using a relation formula between cavity fineness and the spectral line width and the reflectivity of cavity transmitted spectra. By means of the measuring method of the technical scheme, the high reflectivity (R=99.6%) can be measured, and the method is simple.
Description
Technical field
The present invention relates to a kind of measuring method of optical reflectivity, what be specifically related to is a kind of method of utilizing radio frequency scale method to measure high reflectance.
Background technology
At present; Cavity attenuation and vibration technique is a kind of high precision, highly sensitive cavity loss measuring method; It is through measuring the loss factor that die-away time obtain chamber of outside incident light in high Q (quality factor) value passive resonant cavity; Often used and detect with the spectroscopic methodology of high reflection mirror albedo measurement and minimum gas concentration, have measurement result and do not receive the influence of incident intensity fluctuation and cavity loss more little, measuring accuracy is got over advantages of higher.The theoretical foundation of cavity attenuation and vibration technique is to swing the method measuring principle according to around chamber self-energy transformational relation continuous wave-cavity being declined, and measure according to the beam interference theoretical analysis method.Its analytical approach is following: at first according to the universals of the characteristic in quality factor q sign chamber; Make the relation of the concussion angular frequency of light field in Q and gross energy that is stored in energy in the chamber, unit interval internal loss and the chamber; Set up the funtcional relationship of Q and chamber ring-down time, cavity loss then; Set up the equality relation,, carry out assay determination according to the beam interference theoretical analysis method at last according to law of conservation of energy.The chamber method of swinging that declines is calculated reflectivity through the Laser Measurement pulse at the ring-down time that swings in the chamber that declines.This method is more suitable for measuring ultra-high reflectivity (R=99.99%); For the catoptron of middle antiradar reflectivity, use this method, the ring-down time of laser pulse in resonator cavity is extremely short; The response time of detection system is big to the measuring accuracy influence of laser pulse ring-down time, thereby causes that error ratio is bigger.
Summary of the invention
The present invention provides a kind of radio frequency scale method of laser phase modulation of using to measure optics mirror sheet reflectivity according to above-mentioned deficiency.
For realizing above-mentioned purpose, technical scheme of the present invention is a kind of method of utilizing radio frequency scale method to measure high reflectance, and implementation step is following:
1) catoptron with reflectivity to be measured is made into the photoelectricity resonator cavity;
2) build light path;
3) incident laser is carried out the photoelectricity phase modulation (PM), produce positive and negative first order side band;
4) through the sawtooch sweep optical resonator, obtain spectrum;
5) with the frequency difference between carrier wave and the first order side band as the radio frequency scale, measure the half-peak whole-line width of carrier wave in proportion;
6) utilize the line width of chamber fineness and chamber transmitted spectrum and the relation formula of reflectivity, calculate the reflectivity of catoptron.
Described light path is made up of signal generator, acousto-optic modulator, electro-optic phase modulator, sawtooch sweep resonator cavity, photodetector, oscillograph.
The beneficial effect of technique scheme is: the frequency interval that has adopted positive and negative first order side band that the laser phase modulation produces and carrier wave is as the radio frequency scale; Accurately measuring declines swings the shake half-peak whole-line width of transmission spectral line of chamber; Thereby realize high-acruracy survey, easy being easy to get to the optical mirror slip reflectivity.
Embodiment
Do bright specifically below in conjunction with embodiment to the present invention.
A kind of light path of utilizing radio frequency scale method to measure the method for high reflectance of the present invention; Described light path is made up of with this signal generator, acousto-optic modulator, electro-optic phase modulator, flying-spot video generator, sawtooch sweep resonator cavity, photodetector, oscillograph in proper order; Wherein flying-spot video generator carries out phase modulation (PM) through electro-optic phase modulator, and signal generator adopts helium-neon laser (He-Ne laser), and helium-neon laser sends signal; Carry out acoustooptic modulation through acousto-optic modulator; Through the electro-optic phase modulator modulation, signal gets into the catoptron with reflectivity to be measured after ovennodulation, obtains radiofrequency signal simultaneously then; Through after the sawtooch sweep, through on oscillograph, showing behind the photodetector.
A kind of method of utilizing radio frequency scale method to measure high reflectance, implementation step is following:
1) catoptron with reflectivity to be measured is made into the photoelectricity resonator cavity;
2) build light path;
3) incident laser is carried out the photoelectricity phase modulation (PM), produce positive and negative first order side band;
4) through the sawtooch sweep optical resonator, obtain spectrum;
5) with the frequency difference between carrier wave and the first order side band as the radio frequency scale, measure the half-peak whole-line width of carrier wave in proportion;
6) utilize the line width of chamber fineness and chamber transmitted spectrum and the relation formula of reflectivity, calculate the reflectivity of catoptron.
Claims (2)
1. method of utilizing radio frequency scale method to measure high reflectance is characterized in that implementation step is following:
1) catoptron with reflectivity to be measured is made into the photoelectricity resonator cavity;
2) build light path;
3) incident laser is carried out the photoelectricity phase modulation (PM), produce positive and negative first order side band;
4) through the sawtooch sweep optical resonator, obtain spectrum;
5) with the frequency difference between carrier wave and the first order side band as the radio frequency scale, measure the half-peak whole-line width of carrier wave in proportion;
6) utilize the line width of chamber fineness and chamber transmitted spectrum and the relation formula of reflectivity, calculate the reflectivity of catoptron.
2. a kind of light path of utilizing radio frequency scale method to measure the method for high reflectance according to claim 1, it is characterized in that: described light path is made up of signal generator, acousto-optic modulator, electro-optic phase modulator, sawtooch sweep resonator cavity, photodetector, oscillograph.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011101312971A CN102788680A (en) | 2011-05-20 | 2011-05-20 | Method for measuring high reflectivity by using radio frequency ruler method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011101312971A CN102788680A (en) | 2011-05-20 | 2011-05-20 | Method for measuring high reflectivity by using radio frequency ruler method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102788680A true CN102788680A (en) | 2012-11-21 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011101312971A Pending CN102788680A (en) | 2011-05-20 | 2011-05-20 | Method for measuring high reflectivity by using radio frequency ruler method |
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| CN (1) | CN102788680A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106768873A (en) * | 2016-11-22 | 2017-05-31 | 山西大学 | A kind of method and device for measuring high-fineness fineness of cavity |
| CN110031432A (en) * | 2019-04-04 | 2019-07-19 | 浙江中控太阳能技术有限公司 | A kind of measurement method and device of settled date specular reflectivity |
| CN112969909A (en) * | 2018-11-09 | 2021-06-15 | 慕尼黑科技大学 | Multicolor optical resonator for imaging methods |
-
2011
- 2011-05-20 CN CN2011101312971A patent/CN102788680A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106768873A (en) * | 2016-11-22 | 2017-05-31 | 山西大学 | A kind of method and device for measuring high-fineness fineness of cavity |
| CN106768873B (en) * | 2016-11-22 | 2018-12-07 | 山西大学 | A kind of method and device measuring high-fineness fineness of cavity |
| CN112969909A (en) * | 2018-11-09 | 2021-06-15 | 慕尼黑科技大学 | Multicolor optical resonator for imaging methods |
| CN110031432A (en) * | 2019-04-04 | 2019-07-19 | 浙江中控太阳能技术有限公司 | A kind of measurement method and device of settled date specular reflectivity |
| CN110031432B (en) * | 2019-04-04 | 2022-02-18 | 浙江可胜技术股份有限公司 | Method and device for measuring reflectivity of heliostat |
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Application publication date: 20121121 |