CN102753960A - Defect inspection method for LCD panel having laminated sheet polariser - Google Patents
Defect inspection method for LCD panel having laminated sheet polariser Download PDFInfo
- Publication number
- CN102753960A CN102753960A CN2011800084887A CN201180008488A CN102753960A CN 102753960 A CN102753960 A CN 102753960A CN 2011800084887 A CN2011800084887 A CN 2011800084887A CN 201180008488 A CN201180008488 A CN 201180008488A CN 102753960 A CN102753960 A CN 102753960A
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- CN
- China
- Prior art keywords
- liquid crystal
- crystal panel
- polaroid
- fitted
- detected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Abstract
Disclosed is a method for the inspection of defects in an LCD panel having a sheet polariser laminated thereon, said method including signal processing which detects the light transmitted from one surface of the LCD panel when light is irradiated from another surface when the LCD panel is not being driven. The method uses near-infrared rays for light irradiation, and can detect defects which conventional inspection methods using visible light cannot detect.
Description
Technical field
The present invention relates to a kind of defect inspection method that is fitted with the liquid crystal panel of polaroid; Specifically, relate to a kind of method that under the state that does not drive liquid crystal panel, the defective of the liquid crystal panel that is fitted with polaroid is detected.
Background technology
LCD TVs etc. are fitted in polaroid on the Nicol crossed on the two sides of liquid crystal panel and process.
Though defects detection is that resulting parts in the starting material that use, the main manufacture process are carried out, and also can the liquid crystal panel that be fitted with polaroid be carried out.
Defect inspection method as the liquid crystal panel that is fitted with polaroid; Though have through driving the method that liquid crystal panel carries out, need to carry charged driver etc., and in defects detection; In order to repair, to do over again, it is very bothersome then will to unload driver etc.Therefore, preferably do not carry driver, under the state that does not drive liquid crystal panel, the defective of the liquid crystal panel that is fitted with polaroid is detected.
Known have under the state that liquid crystal panel does not drive, and about the situation of the standard black dichroic liquid crystal of not transmission of visible light, the method that the foreign matter in the liquid crystal panel is detected is (for example, referring to TOHKEMY JP2004-77261-A communique.)。Can the foreign matter in the liquid crystal panel be detected as bright spot with this method.
But,, being involved in and diversified defective such as incised wound of foreign matters such as smear metal, air of pastel, film arranged as the defective of the liquid crystal panel that is fitted with polaroid.These since its form etc. can't detect sometimes.Thereby wait in expectation that the existing method of a kind of usefulness to occur be the method that is difficult to detect, can detect the defective of the liquid crystal panel that is fitted with polaroid.
The object of the present invention is to provide that the existing method of a kind of usefulness is difficult to detect, can be under the state that liquid crystal panel is driven, the method that the defective of the liquid crystal panel that is fitted with polaroid is detected.
The present inventor is just under the state that liquid crystal panel is driven; The method that the defective of the liquid crystal panel that is fitted with polaroid is detected; Intently carried out inquiring into research; Its result finds, is difficult to detected defective and has accomplished the present invention finally through shining near infrared ray and detect, can detecting with existing method.
Summary of the invention
That is, the present invention comprises following content:
1, a kind of defect inspection method that is fitted with the liquid crystal panel of polaroid; Said method is included under the state that does not make the liquid crystal panel driving; Carry out rayed from one in the face of the liquid crystal panel that is fitted with polaroid; Transmitted light to from another face detects, and carries out the step of signal Processing, and the irradiation of light is carried out through the irradiation near infrared ray.
2, according to 1 described method, the light source of near infrared irradiation is a Halogen lamp LED, carries out the detection of transmitted light with the CCD camera.
3, according to 1 or 2 described methods; Said method is included in transmitted light is detected and when carrying out signal Processing; In advance will with input to signal processing apparatus from the corresponding periodic figure signal of the cancellate figure of black matrix", eliminate this detected periodic figure signal and the baseline of setting signal.
According to the method for the invention, the defective for the liquid crystal panel of can't be detected with existing method, being fitted with polaroid under the state that liquid crystal panel is driven, can detect, and has such effect.
Description of drawings
Fig. 1 is the mode chart of defect detecting device of the present invention.
Fig. 2 illustrates the transmitance of polaroid when quadrature Niccol state.
Label declaration
1 is fitted with the liquid crystal panel of polaroid
2 light sources
3 cameras
4 signal processing apparatus
Embodiment
When making polaroid and liquid crystal panel, though carry out defects detection usually respectively, fit with flawless polaroid and liquid crystal panel, can't detect defective sometimes, perhaps sneaked into defective polaroid or liquid crystal panel; Be involved in foreign matter or air when perhaps fitting, thereby had defective being fitted with on the liquid crystal panel of polaroid.
Polaroid is usually at the two sides of polarizing coating applying diaphragm, through on its surface by adhesive agent be fitted with diaphragm, barrier film constitutes.
As major defect is when peeling off barrier film and fitting to polaroid on the liquid crystal panel, can produce being involved in of foreign matter and air, adhesive agent piece, scar of the smear metal etc. of film etc.
In addition, about LCD TV etc., though on polaroid, can also fit sometimes phasic difference plate, antiglare film etc., these are to fit in advance and as multilayer film it is fitted on the liquid crystal panel usually.In the present invention, being fitted with the liquid crystal panel of this multilayer film also will be as object.
Defects detection is that a face from the liquid crystal panel that is fitted with polaroid carries out rayed, and the transmitted light (transmitted light of this liquid crystal panel of transmission) from another face is detected.Fig. 1 representes the mode chart of defect detecting device.Configuration light source 2 below the liquid crystal panel that is fitted with polaroid 1; Configuration camera 3 above the liquid crystal panel that is fitted with polaroid 1, Yi Bian the liquid crystal panel that is fitted with polaroid is moved, Yi Bian detect.Being handled and judged by signal processing apparatus 4 from the signal of camera has zero defect.
In the present invention, rayed is to shine through near infrared ray to carry out.Can enumerate Halogen lamp LED as this near infrared light source example of emission.For example, utilize the Halogen lamp LED of 3500 ° of K of color temperature, can near 700nm, reach peak value by emission wavelength, at visible light between the 300-780nm and the near infrared light between 780-2000nm.
If polaroid is fitted on the Nicol crossed, that is, fitted with the state of quadrature at the axis of homology of two polaroids, just transmission hardly of visible light under the state that liquid crystal panel does not drive, and near infrared ray can transmission.The pattern of the transmitance (solid line) when Fig. 2 representes that polaroid is quadrature Niccol state.
As detecting the transmitted light camera, use the CCD camera usually.The CCD camera not only also has light sensitivity to visible light but also near infrared ray.Fig. 2 illustrates the light sensitivity characteristic (dotted line) of CCD.
Signal from camera is handled by signal processing apparatus, and defective is detected.Resulting signal strength values is established threshold value, exceed its, promptly be used as defective.
For example, establishing baseline is 0, will white (brightness is higher than baseline) side, black (brightness is lower than baseline) side representes with 32000 gray scales respectively, and 5000 gray scales are made as threshold value, respectively above 5000 gray scales, promptly be used as defective.
Though with the naked eye be difficult to confirm, can detect cancellate figure from black matrix" with the CCD camera.The signal of periodic pattern that in advance will be corresponding with this cancellate figure is input in the signal processing apparatus, eliminates the signal of detected periodic pattern and sets baseline.Obtain gray scale from this baseline.
In addition, as the imaging apparatus of employed CCD camera, both can be line sensor, also can be face sensor.
Embodiment
Below, though detection method is illustrated with embodiment, the present invention is not limited to this embodiment.
With likewise shown in Figure 1; Be fitted with on the two sides the orthogonal thereto polaroid of its axis of homology liquid crystal panel below dispose light source, be fitted with on the two sides the orthogonal thereto polaroid of its axis of homology liquid crystal panel above dispose camera; The liquid crystal panel that makes the two sides be fitted with polaroid on one side moves, Yi Bian carry out defects detection.The liquid crystal panel that makes the two sides be fitted with polaroid spins upside down, and promptly two sides from face side and rear side detect under the TV situation making.
Light source adopts Halogen lamp LED, and camera adopts the CCD camera, and signal processing apparatus adopts Optics Flame Image Process appearance delection device (KUBOTEK (strain) system) to detect.
Be fitted with the liquid crystal panel of the polaroid of detected object, except the barrier film of polaroid ス ミ カ ラ ミ (registered trademark) (Sumitomo Chemical (strain) system), fit in 37 inches TVs with on the liquid crystal panel.
In signal processing apparatus,, import the periodic pattern signal corresponding in advance, and eliminate detected periodic pattern signal and set baseline with it in order to eliminate periodic pattern from black matrix".
If baseline is 0, dialogue side and black side are set 32000 gray scales respectively, establishing 5000 gray scales is threshold value, exceed 5000 gray scales respectively, promptly are used as defective.
The example that detects defective is shown in the table 1.
Comparative example 1
For the defects detection example of embodiment 1, except that the metal halide lamp that has adopted visible emitting replaced Halogen lamp LED, other were identical with embodiment 1.
Its result is shown in the table 1.
Table 1
In the table 1, what some with liquid crystal panel was configured and detected towards camera represented in the position of camera.Modal representation detects defective as stain or bright spot; No matter * expression stain or bright spot all is not detected.Size is represented with the pixel count of defective plane picture.The defective form is represented the defect condition seen with magnifying glass.
As stated, through near infrared ray irradiation and detect (embodiment 1), can positively detect through existing radiation of visible light and detect (comparative example 1) institute can't detected defective.
Claims (3)
1. defect inspection method that is fitted with the liquid crystal panel of polaroid; It is characterized in that; Said method is included under the state that does not make the liquid crystal panel driving, faces the liquid crystal panel that is fitted with polaroid from one and carries out rayed, and the transmitted light from another face is detected; And carry out the step of signal Processing, the irradiation of light is carried out through the irradiation near infrared ray.
2. the defect inspection method that is fitted with the liquid crystal panel of polaroid according to claim 1 is characterized in that the light source of near infrared irradiation is a Halogen lamp LED, carries out the detection of transmitted light with the CCD camera.
3. the defect inspection method that is fitted with the liquid crystal panel of polaroid according to claim 1 and 2; It is characterized in that; Said method is included in transmitted light is detected and when carrying out signal Processing; In advance will with input to signal processing apparatus from the corresponding periodic figure signal of the cancellate figure of black matrix", eliminate this detected periodic figure signal and the baseline of setting signal.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010025194A JP5556212B2 (en) | 2010-02-08 | 2010-02-08 | Defect inspection method for liquid crystal panel with polarizing plate |
| JP2010-025194 | 2010-02-08 | ||
| PCT/JP2011/052670 WO2011096581A1 (en) | 2010-02-08 | 2011-02-02 | Defect inspection method for lcd panel having laminated sheet polariser |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102753960A true CN102753960A (en) | 2012-10-24 |
Family
ID=44355573
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011800084887A Pending CN102753960A (en) | 2010-02-08 | 2011-02-02 | Defect inspection method for LCD panel having laminated sheet polariser |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP5556212B2 (en) |
| KR (1) | KR20120115531A (en) |
| CN (1) | CN102753960A (en) |
| TW (1) | TW201132959A (en) |
| WO (1) | WO2011096581A1 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103439339A (en) * | 2013-09-02 | 2013-12-11 | 深圳市华星光电技术有限公司 | Defect detection device and method for liquid crystal display panel with polarizing film |
| CN104503118A (en) * | 2015-01-22 | 2015-04-08 | 合肥京东方光电科技有限公司 | Panel lead wire detection device and detection method |
| CN105044130A (en) * | 2014-04-18 | 2015-11-11 | 东友精细化工有限公司 | Defect discrimination method of optical film |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102759532B (en) * | 2012-07-31 | 2014-11-19 | 北京华夏视科图像技术有限公司 | Infrared and visible light combined light source for transillumination |
| JP6127458B2 (en) * | 2012-11-09 | 2017-05-17 | 大日本印刷株式会社 | Pattern measuring apparatus and pattern measuring method |
| JP2019133764A (en) * | 2018-01-29 | 2019-08-08 | トヨタ自動車株式会社 | Inspection method of laminate for all-solid battery |
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| JP2004077261A (en) * | 2002-08-16 | 2004-03-11 | Horiba Ltd | Apparatus and method for inspecting foreign substances in liquid crystal panel |
| JP2006078317A (en) * | 2004-09-09 | 2006-03-23 | Seiko Epson Corp | Inspection method for body under inspection and its device |
| JP2008107100A (en) * | 2006-10-23 | 2008-05-08 | Sharp Corp | Inspection device and method of liquid crystal panel |
| JP5181125B2 (en) * | 2008-04-09 | 2013-04-10 | 日東電工株式会社 | Optical display unit inspection method and optical display unit manufacturing method using the inspection method |
| JP2010266284A (en) * | 2009-05-13 | 2010-11-25 | Micronics Japan Co Ltd | Non-lighting inspection apparatus |
-
2010
- 2010-02-08 JP JP2010025194A patent/JP5556212B2/en not_active Expired - Fee Related
-
2011
- 2011-02-01 TW TW100104007A patent/TW201132959A/en unknown
- 2011-02-02 WO PCT/JP2011/052670 patent/WO2011096581A1/en active Application Filing
- 2011-02-02 KR KR1020127020281A patent/KR20120115531A/en not_active Application Discontinuation
- 2011-02-02 CN CN2011800084887A patent/CN102753960A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2004101194A (en) * | 2002-09-04 | 2004-04-02 | Lasertec Corp | Optical device, and image measuring device and inspection device using the same |
| JP2005265503A (en) * | 2004-03-17 | 2005-09-29 | Seiko Epson Corp | Display inspection method and display inspection dvice |
| JP2007256106A (en) * | 2006-03-23 | 2007-10-04 | Sharp Corp | Display panel inspection device and display panel inspection method using the same |
| JP2009047469A (en) * | 2007-08-15 | 2009-03-05 | Toppan Printing Co Ltd | Method and device for inspecting color filter using diffracted image |
| CN101587081A (en) * | 2008-03-28 | 2009-11-25 | 富士胶片株式会社 | Defect detecting method and device |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103439339A (en) * | 2013-09-02 | 2013-12-11 | 深圳市华星光电技术有限公司 | Defect detection device and method for liquid crystal display panel with polarizing film |
| CN103439339B (en) * | 2013-09-02 | 2015-11-25 | 深圳市华星光电技术有限公司 | Be pasted with defect detecting device and the defect inspection method of the liquid crystal panel of polaroid |
| CN105044130A (en) * | 2014-04-18 | 2015-11-11 | 东友精细化工有限公司 | Defect discrimination method of optical film |
| CN105044130B (en) * | 2014-04-18 | 2019-04-05 | 东友精细化工有限公司 | A kind of defect estimation method of optical film |
| CN104503118A (en) * | 2015-01-22 | 2015-04-08 | 合肥京东方光电科技有限公司 | Panel lead wire detection device and detection method |
| CN104503118B (en) * | 2015-01-22 | 2017-04-26 | 合肥京东方光电科技有限公司 | Panel lead wire detection device and detection method |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2011163846A (en) | 2011-08-25 |
| WO2011096581A1 (en) | 2011-08-11 |
| TW201132959A (en) | 2011-10-01 |
| JP5556212B2 (en) | 2014-07-23 |
| KR20120115531A (en) | 2012-10-18 |
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| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
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Application publication date: 20121024 |