CN102636704B

CN102636704B - Testing method, device and system for electronic product

Info

Publication number: CN102636704B
Application number: CN201210054921.7A
Authority: CN
Inventors: 米杰; 王德武; 游开宗
Original assignee: Shenzhen Invt Electric Co Ltd
Current assignee: Invt Power Electronics Suzhou Co ltd
Priority date: 2012-03-05
Filing date: 2012-03-05
Publication date: 2015-07-15
Anticipated expiration: 2032-03-05
Also published as: CN102636704A

Abstract

The invention provides a testing method, device and system for an electronic product. The testing method comprises the following steps of: obtaining testing information according to an identity of the electronic product; operating testing instructions, and loading corresponding parameters to program codes corresponding to the testing instructions, so as to obtain testing data corresponding to the testing instructions; judging whether all the obtained testing data is in the respective corresponding standard data ranges or not; if all the obtained testing data is in the respective corresponding standard data ranges, judging that the electronic product passes the test; and if any one of the obtained testing data does not accord with the corresponding standard data range, judging that the electronic product does not pass the test. When the testing method disclosed by the embodiment of the invention tests different electronic products, the entire testing process can be completed by only modifying the corresponding parameters in the testing information without developing various testing methods. Therefore, the testing method is simple and practical.

Description

A kind of method of testing of electronic product, Apparatus and system

Technical field

The present invention relates to instrument and field of instrumentation technology, in particular, relate to a kind of electronic product method of testing, Apparatus and system.

Background technology

Researching and developing and producing in the process of electronic product, need to test electronic product, whether meet related request to detect this electronic product, electronic product is tested, exactly each functional module of electronic product is tested.

Along with the development of electronic product, series and the model of electronic product are more and more abundanter, the function difference of electronic product owing to realizing of different series, so method of testing is different, the parameter or the circuit that realize the functional module of identical function in electronic product with a series of different model may be different, thus method of testing is also different, same electronic product may have several functions, may be different to the method for the test of each functional module, so the complexity of electronic product test is also more and more higher.

At present, electronic product method of testing is in traditional manual or semi-automatic test substantially, when electronic product is tested, may need to research and develop various test, use the electronic product of multiple method 1 a pair this series of research and development to test, thus make the test process of electronic product complicated.

Summary of the invention

In view of this, the invention provides a kind of electronic product method of testing, Apparatus and system, to overcome different with model due to electronic product families in prior art, method of testing that is that cause is different, and then the complicated and maintainable low problem of the electronic product test process caused.

For achieving the above object, the invention provides following technical scheme:

A kind of method of testing of electronic product, comprise: the mark according to described electronic product obtains detecting information, wherein, described detecting information comprises at least one for testing the test instruction of the specific function of described electronic product, the normal data scope corresponding with each bar test instruction and running and the parameter of program code that described each bar test instruction is corresponding; Run described each bar test instruction, and load corresponding parameter in the program code corresponding with described each bar test instruction, obtain the test data corresponding with described each bar test instruction; Judge whether each bar test data obtained meets normal data scope corresponding separately; When obtained each bar test data all meets normal data scope corresponding separately, judge that the test of described electronic product is passed through, when arbitrary test data does not meet corresponding normal data scope, judge that the test of described electronic product is not passed through.

Preferably, also comprised before obtaining the step of detecting information according to the mark of described electronic product: after receiving the order of modifying to the parameter run required for the program code relevant to described each bar test instruction, the described order according to receiving is modified to corresponding parameter.

Preferably, in the described each bar test instruction of operation, and load corresponding parameter in the program code corresponding with described each bar test instruction, also comprise before obtaining the step (being called steps A) of the test data corresponding with described each bar test instruction: detect current test instruction the need of execution, if not, then skip described current test instruction to continue to judge that next test instruction is the need of execution, if so, then enters steps A.

Preferably, described each bar test instruction is separate, parameter in described test instruction comprises functional module Selecting All Parameters and test parameter, described functional module Selecting All Parameters is for choosing in tested electronic product the foundation needing certain functional module of testing, described test parameter is the numerical value that in described tested electronic product, each functional module needs when testing, wherein, in the described each bar test instruction of operation, and load corresponding parameter in the program code corresponding with described each bar test instruction, specifically to comprise in the step obtaining the test data corresponding with described each bar test instruction: when current test instruction needs perform, run described current test instruction, and load the functional module Selecting All Parameters corresponding with described current test instruction in corresponding program code, choose in tested electronic product certain functional module needing to test, reload in the test parameter corresponding with described current test instruction to certain functional module described, obtain the test data corresponding with described current test instruction.

Preferably, judging each bar test data obtained also comprises before whether meeting the step of normal data scope corresponding separately: the number category judging the test result corresponding with described each bar test instruction; When the numerical value of test result corresponding to a certain test instruction is decimal, the numerical value of described test result is multiplied by the integral multiple of 10 to convert integer to, and using the integer after conversion as the test data corresponding with described a certain test instruction, when the number of the test result corresponding with arbitrary test instruction is greater than 1, calculate the mean value of each test result, and using the test data of described mean value as described arbitrary test instruction.

Preferably, loading corresponding parameter in the program code corresponding with described each bar test instruction, also to comprise after the step obtaining the test data corresponding with described each bar test instruction: detect the operation whether suspending testing procedure, if, then suspend the operation of testing procedure and show the test data corresponding with current test instruction and corresponding normal data scope, if not, then testing results step is continued; Detect and whether jump to nominative testing instruction, if so, then jump to described nominative testing instruction and perform, if not, then continue to perform follow-up test instruction; And/or, detect whether preserve test data corresponding to current test instruction, if so, then preserve, if not, then do not preserve.

Preferably, the test obtaining described electronic product by or the result do not passed through after, described method of testing also comprises: the mark receiving next electronic product, and obtains corresponding detecting information according to the mark of next electronic product; Or, receive the request backed off after random test exiting the test of described electronic product.

A proving installation for electronic product, comprises and reads identification module, detecting information acquisition module, test data acquisition module and judge module.Read identification module, for reading the mark of tested electronic product; Detecting information acquisition module, described mark for reading according to described reading identification module obtains the detecting information corresponding with this mark, and described detecting information comprises: at least one for testing the test instruction of the specific function of described electronic product, the normal data scope corresponding with each bar test instruction and running and the parameter of program code that described each bar test instruction is corresponding; Test data acquisition module, for running described each bar test instruction, and loading corresponding parameter in the program code corresponding with each bar test instruction, obtaining the test data corresponding with described each bar test instruction; Judge module, for judging whether obtained each bar test data meets normal data scope corresponding separately, when obtained each bar test data all meets normal data scope corresponding separately, judge that the test of described electronic product is passed through, and when arbitrary test data does not meet corresponding normal data scope, judge that the test of described electronic product is not passed through.

Preferably, described proving installation also comprises: parameter adapting module, for after receiving the order of modifying to the parameter running the program code relevant to described each bar test instruction, the described order according to receiving is modified to corresponding parameter.

Preferably, described proving installation also comprises: detect execution module, for detecting current test instruction the need of execution, if not, then skip described current test instruction to continue to judge that next test instruction is the need of execution, if so, then trigger described test data acquisition module.

Preferably, described each bar test instruction is separate, parameter in described test instruction comprises functional module Selecting All Parameters and test parameter, described functional module Selecting All Parameters is for choosing in tested electronic product the foundation needing certain functional module of testing, described test parameter is the numerical value that in described tested electronic product, each functional module needs when testing, and described test data acquisition module specifically comprises:

First running unit, for when described current test instruction needs to perform, run described current test instruction, and load the functional module Selecting All Parameters corresponding with described current test instruction in corresponding program code, choose in tested electronic product certain functional module needing to test;

Second running unit, for after described first running unit is finished, loads in the test parameter corresponding with described current test instruction to certain functional module described, obtains the test data corresponding with described current test instruction;

Acquiring unit, for after described second running unit is finished, obtains corresponding test data.

Preferably, described test data acquisition module specifically also comprises: processing unit, for judging the number category of the test result corresponding with described each bar test instruction, when the numerical value of test result corresponding to a certain test instruction is decimal, then the numerical value of described test result is multiplied by the integral multiple of 10 to convert integer to, and using the integer after conversion as the corresponding test data of described a certain test instruction, and when the number of the corresponding test result of arbitrary test instruction is greater than 1, calculate the mean value of each test result, and using the test data of described mean value as described arbitrary test instruction.

Preferably, described proving installation also comprises: suspend module, for after executing current testing procedure, detect the operation whether suspending testing procedure, if, then suspend the operation of testing procedure and show the test data corresponding with described current test instruction and corresponding normal data scope, if not, then continuing to run follow-up testing procedure; Redirect module, for detecting whether jump to nominative testing instruction, if so, then jumping to described nominative testing instruction and performing, and if not, then continues to perform follow-up test instruction; And/or, preserve module, whether preserving test data corresponding to current test instruction for detecting, if so, then preserving, if not, then not preserving.

Preferably, described proving installation also comprises: trigger module, for the test obtaining described electronic product by or the result do not passed through after, trigger the mark that described reading identification module reads next electronic product; Or, exit test module, for receiving the request backed off after random test exiting the test of described electronic product.

A kind of test macro of electronic product, comprise scanner, host computer, relay switch control box and test data acquisition module, wherein, described scanner is connected with described host computer, described host computer is connected with described relay switch control box by input/output interface, described host computer is connected with described test data acquisition module and described electronic product respectively by serial ports, and described electronic product is connected with described test data acquisition module and described relay switch control box respectively, the mark of described host computer electronic product according to described scanner scanning and obtain detecting information, wherein, described detecting information comprises at least one for testing the test instruction of the specific function of described electronic product, the normal data scope corresponding with each bar test instruction and running and the parameter required for program code that described each bar test instruction is corresponding, described parameter comprises functional module Selecting All Parameters and test parameter, described functional module Selecting All Parameters is for choosing in tested electronic product the foundation needing certain functional module of testing, described test parameter is the numerical value that in described tested electronic product, each functional module needs when testing, described host computer, when running a certain bar test instruction, loads the functional module Selecting All Parameters corresponding with described a certain bar test instruction in corresponding program code, produces control command, the corresponding functional module in described electronic product selected by described relay switch control box according to received described control command, the test parameter corresponding to described a certain bar test instruction is sent in corresponding functional module by described test data acquisition module by described host computer, obtain the test data corresponding with described a certain test instruction, described test data acquisition module obtains and described test data from described tested electronic product, and described test data is sent to described host computer, described test data and corresponding normal data scope carry out contrasting to obtain testing to corresponding functional module the result whether passed through by described host computer.

Known via above-mentioned technical scheme, adopt electronic product test macro disclosed in the embodiment of the present invention, due to detecting information be with the mark of electronic product one to one, after scanner scanning goes out the mark of electronic product, host computer just can obtain corresponding detecting information according to this mark, which functional module that first host computer is determined in electronic product according to functional module Selecting All Parameters needs tested, then corresponding test parameter is being sent to this functional module, this functional module produces test data after testing according to test parameter, described host computer obtains test data from described electronic product, and test data and corresponding normal data are compared, draw the whether satisfactory result of this functional module, like this when testing the electronic product of same electronic product or different series or model, only need to modify to corresponding detecting information.Further, owing to not needing to revise hardware, only need to modify to detecting information, thus do not need to research and develop multiple test circuit, simplified hardware circuit, provided cost savings.

Electronic product method of testing disclosed in the embodiment of the present invention, Apparatus and system, can overcome different with model due to electronic product families in prior art and method of testing that is that cause is different, and then the complicated and maintainable low problem of the electronic product test process caused, the application of various test event robotization is completed by the software of high efficient and flexible, reliability is high, flexible design, and then realize high efficiency test.

Accompanying drawing explanation

In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only embodiments of the invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to the accompanying drawing provided.

The process flow diagram of Fig. 1 electronic product method of testing disclosed in the embodiment of the present invention;

The partial schematic diagram of Fig. 2 detecting information table of electronic product disclosed in the embodiment of the present invention;

The structural representation of Fig. 3 electronic product test device disclosed in the embodiment of the present invention;

The structural representation of Fig. 4 electronic product test macro disclosed in the embodiment of the present invention;

Fig. 5 utilizes the process flow diagram of electronic product test system and test electronic product disclosed in the embodiment of the present invention;

Fig. 6 electronic product test macro disclosed in the embodiment of the present invention enters the schematic diagram of waiting status;

Fig. 7 utilizes a kind of test system structure schematic diagram of electronic product test system and test frequency converter disclosed in the embodiment of the present invention.

Embodiment

Below in conjunction with the accompanying drawing in the embodiment of the present invention, be clearly and completely described the technical scheme in the embodiment of the present invention, obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.

Refer to accompanying drawing 1, the process flow diagram of electronic product method of testing disclosed in the embodiment of the present invention, the method can comprise:

Step S101: the mark according to electronic product obtains detecting information.

Concrete, with the bar code in electronic product as the mark of this electronic product, can utilize the bar code of scanner scanning electronic product, thus obtain the mark of electronic product.After the mark obtaining electronic product, can according to the path corresponding with this mark, such as: ... Invt_test_system Data catalogue, obtain the detecting information of this electronic product, wherein, the electronic product of same model can use same detecting information, and the mark of electronic product is corresponding with the detecting information of this model electronic product.Detecting information can comprise: at least one for testing the test instruction of the specific function of electronic product, the normal data scope corresponding with each bar test instruction and running and the parameter of program code that each bar test instruction is corresponding.Wherein, test instruction is corresponding with program code, test instruction can as the order triggering the operation of corresponding program code, namely after certain test instruction is performed, the operation of the program code corresponding with this test instruction can be triggered, choosing of the program code that each test instruction is corresponding when testing must be correct, otherwise electronic product is after the program code according to mistake is tested, and can not get corresponding test data.

In the present embodiment, before step S101, can also comprise: after receiving the order of modifying to the parameter run required for the program code relevant to each bar test instruction, the described order according to receiving is modified to corresponding parameter.

Preferably, each bar test instruction is separate.Each test instruction is all can independent operating separately, if there is mistake in program code corresponding to a certain bar test instruction, just detect it is that mistake appears in program code corresponding to which bar test instruction easily, program code that can be directly corresponding to this test instruction is modified, improve the maintainability of software, for different tested electronic products, only need load corresponding detecting information, do not need to do any change to program, similarly, when the parameter of electronic product changes and need change detecting information, also only parameter corresponding in detecting information need be changed, and do not need to change program code, improve maintainability and the operability of software.

Preferably, the storage mode of detecting information can store in the mode of two-dimentional form, conveniently, at this, two-dimentional form storing detecting information is called detecting information form, in order to allow detecting information form in those skilled in the art's understanding the present embodiment clearly, need once simply to introduce the detecting information form in practical application, as shown in Figure 2, every a line in this detecting information form can be a test instruction, and a rule test instruction forms the complete testing process of an electronic product.

Refer to accompanying drawing 2, the partial schematic diagram of the detecting information table of electronic product disclosed in the embodiment of the present invention, because detecting information table may have a lot of test instruction, can not enumerate at this, only make an explanation on the whole, as can be seen from Figure 2 detecting information comprises " testing procedure ", " test event ", " item description ", " Code Selection ", " parameter 1 ", " parameter 2 ", " parameter 3 ", " parameter 4 ", " whether suspend ", " lower limit ", " upper limit ", " unit ", " pass through redirect ", " failed redirect ", " result preservation ", the field such as " whether to test ".

" testing procedure " represents the sequence number of test instruction, if all test instructions all need to run, so just runs successively according to the sequence number of test instruction.

" test event " represents the title of each test instruction.

" item description " represents the detailed description of test instruction title, the i.e. object of each test instruction test, be convenient to programming personnel and understand the function of this step or the hardware port title of control, because the test purpose of each test instruction has description, so test instruction is completely transparent to operator, and operator only needs to understand the test purpose of each test instruction and the type of correlation parameter and meaning just easily can complete the complete test procedure of an electronic product.

" Code Selection " represents the program code that each test instruction is corresponding, and wherein, program code must by programming requirement selecting properly, otherwise this system is after tested electronic product test, can not get corresponding test data.

" parameter 1 ", " parameter 2 ", " parameter 3 ", " parameter 4 " represent that program code corresponding to test instruction runs the correlation parameter needed, the i.e. parameter used of the program code of the current operation of detecting information form, wherein, the parameter that some test instructions need may be less than 4, so much remaining parameter instruction automatically can be lost and be ignored, unnecessary 4 of the parameter possibility that some test instructions need, is so modifying to detecting information form.

" whether suspend " and represent whether each test instruction suspends after being finished, can represent with letter " B " (initial caps of Break) and need to suspend, " char " except character " B " or " character string " instruction are all judged to not need to suspend (i.e. non-" b"), such as: " A ", " b ", " EBF " etc. system can judge that this testing procedure does not need to suspend, if therefore need to observe the postrun test data of certain testing procedure, " whether suspending " form place write " B " after this testing procedure, system is detecting whether this " suspends " form place for " B ", then after this testing procedure runs, time out program.In other embodiments, can certainly need to suspend with other character representations, with what character representation needing to suspend does not affect realization of the present invention, so just do not need time-out to make particular determination to what character representation in embodiments of the present invention.

" lower limit " represents the lower limit of normal data.

" upper limit " represents the upper limit of normal data, and wherein, " upper limit " and " lower limit " constitutes the scope of normal data.

" unit " represents the unit that test data is used.

After " passing through redirect " and representing that test instruction is finished, system jumps to automatically " by redirect ", and test instruction that form position specifies continues to perform.

" failed redirect " represents that test instruction performs unsuccessfully, and system jumps to automatically " by redirect ", and testing procedure that form position specifies continues to perform.In this enforcement, " passing through redirect " and " failed redirect " flow process constituted between test instruction turns to, if " passing through redirect " and " failed redirect " corresponding form position is for empty, then runs successively from top to bottom by the testing procedure of form.

" result preservation " represents that test data corresponding to test instruction is the need of preservation, can represent with letter " S " (initial caps of Save) and need to preserve, " char " except character " S " or " character string " instruction are all expressed as not to be carried out preserving (i.e. non-" S "), if therefore need to preserve current test data, " result preservation " form place write " S " after this test instruction, system is detecting that this " result preservation " form place is for " S ", then can preserve test data automatically.In other embodiments, can certainly need to preserve with other character representations, with what character representation needing to preserve does not affect realization of the present invention, so just do not need preservation to make particular determination to what character representation in embodiments of the present invention.

" whether test " and represent that test instruction is the need of operation, can represent with letter " T " (initial caps of Test) and need to run, " char " except character " T " or " character string " instruction are all expressed as and do not run (i.e. non-" T "), if therefore need to shield this test instruction, at " whether testing " form place write non-" T " that this test instruction is corresponding, system is non-" T " detecting whether this " tests " form place, then system is automatically skipped this test instruction and is gone to run next test instruction on having run after a test instruction.In other embodiments, can certainly need to run with other character representations, with what character representation needing to run does not affect realization of the present invention, so just do not need operation to make particular determination to what character representation in embodiments of the present invention.

Please continue to refer to Fig. 1, step S102: run each bar test instruction, and load corresponding parameter in the program code corresponding with each bar test instruction, obtain the test data corresponding with each bar test instruction.

In the present embodiment, because parameter runs the parameter required for the program code corresponding with each bar test instruction, so need parameter to be loaded in corresponding program code, then in program code execution before program code execution.Concrete, running parameter program code required for corresponding with each bar test instruction can have multiple, also one can be had, number of parameters is depending on different actual conditions, if detecting information is stored in detecting information form, so parameter has in several corresponding detecting information form and just has several row, such as, there are four parameters, so just have four row in detecting information form to represent parameter information, " parameter 1 ", " parameter 2 ", " parameter 3 " and " parameter 4 " four as above in Fig. 2 arranges.In actual applications, the parameter that some test instructions need may be less than 4, so much remaining corresponding program code of parameter instruction automatically can be lost and ignore, unnecessary 4 of the parameter possibility that some test instructions need, so in detecting information form, increase corresponding Argument List, also can when setting up detecting information form, be used for the maximal value of the number of parameters of value required for the program code corresponding with each bar test instruction of the columns representing parameter information in detecting information form.

In the present embodiment, parameter in test instruction can comprise functional module Selecting All Parameters and test parameter, functional module Selecting All Parameters is for choosing in tested electronic product the foundation needing certain functional module of testing, test parameter is the numerical value that in tested electronic product, each functional module needs when testing, wherein, step S102 specifically comprises: when current test instruction needs perform, run current test instruction, and load the functional module Selecting All Parameters corresponding with current test instruction in corresponding program code, choose in tested electronic product certain functional module needing to test, reload the test parameter corresponding with current test instruction in this functional module, obtain the test data corresponding with current test instruction.

In the present embodiment, can also comprise before step S102: judge that current test instruction is the need of execution, if yes then enter step S102, if not, then skip current test instruction and judge that next test instruction is the need of execution.Concrete, mainly to see in the detecting information form shown in Fig. 2 on corresponding " the whether testing " field of current test instruction it is character " T " or other characters except character " T " or character string, need to perform if character " T " then represents, if other characters except character " T " or character string are all expressed as do not perform.In other embodiments, can certainly need with other character representations except " T " to run, with what character representation need to run and do not affect realization of the present invention, so just do not need operation to make particular determination to what character representation in embodiments of the present invention.

In the present embodiment, can also comprise after step s 102: detect the operation whether suspending testing procedure, if, then suspend the operation of testing procedure and show the test data corresponding with current test instruction and corresponding normal data scope, if not, then testing results step is continued; Detect and whether jump to nominative testing instruction, if so, then jump to described nominative testing instruction and perform, if not, then continue to perform follow-up test instruction; And/or, detect whether preserve test data corresponding to current test instruction, if so, then preserve, if not, then do not preserve.

Concrete, whether the operation of testing procedure " detect suspend " mainly sees on " the whether suspending " field in the detecting information form shown in Fig. 2 corresponding to current test instruction it is character " B " or other characters except character " B " or character string, need to suspend if character " B " then represents, if other characters except character " B " or character string are all judged to not need to suspend, in other embodiments, can certainly need to suspend with other characters except " B " or string representation, with what character representation need to suspend and do not affect realization of the present invention, so just do not need time-out to make particular determination to what character representation in embodiments of the present invention.

Same, " detect and whether jump to nominative testing instruction " and mainly see " passing through redirect " field in the detecting information form shown in Fig. 2 corresponding to current test instruction and the character on " failed redirect " field, wherein, after " passing through redirect " and referring to test instruction, the test instruction that system jumps to automatically " passing through redirect " field is specified continues to perform, " failed redirect " refers to that test instruction performs unsuccessfully, the test instruction that system jumps to automatically " failed redirect " field is specified continues to perform, " pass through redirect " and " failed redirect " flow process constituted between test instruction turns to, if these two fields are empty in detecting information form, then order performs follow-up test instruction.

Same, " detect whether preserve test data corresponding to current test instruction " mainly sees on " result preservation " field in the detecting information form shown in Fig. 2 corresponding to current test instruction it is character " S " or other characters except character " S " or character string, preserve if character " S " then represents, system, detecting that this " result preservation " field place then can preserve test data automatically for " S ", if other characters except character " S " or character string then represent is not preserved.In other embodiments, can certainly need to preserve with other characters except " S " or string representation, what what with character representation need to carry out preserving not affect realization of the present invention, so just do not make particular determination to character representation to need carrying out preservation with in embodiments of the present invention.

Step S103: judge whether each bar test data obtained meets normal data scope corresponding separately, if so, then enters step S104, if arbitrary test data does not meet corresponding normal data, then enters step S105.

Concrete, if detecting information is stored in detecting information form, so can by judging whether test data is more than or equal to the lower limit of normal data and is less than or equal to the upper limit of normal data, if, then enter step S104, if not, then enter step S105.

In the present embodiment, can also comprise before step S103: the number category judging the test result corresponding with each bar test instruction; When the numerical value of test result corresponding to a certain test instruction is decimal, the numerical value of described test result is multiplied by the integral multiple of 10 to convert integer to, and using the integer after conversion as the test data corresponding with described a certain test instruction, when the number of the test result corresponding with arbitrary test instruction is greater than 1, calculate the mean value of each test result, and using the test data of described mean value as described arbitrary test instruction.

Concrete, this step is mainly in order to process test result, obtain being convenient to the numerical value of machine compared with normal data scope, different to the process operation of test result in different applications, such as: if the carrying load ability of test electronic product, dock loaded electronic product and carry out test acquisition test result 1, again test is carried out to the same electronic product not connecing load and obtain test result 2, process operation now can for getting test result 1 absolute value poor with test result 2, and using this absolute value as test data, if test result 1 is decimal with the absolute value of test result 2 difference, then this numerical value is multiplied by the integral multiple of 10 to convert integer to, and using the integer that changes into as with test data, the test result that certain a certain test instruction obtains after execution is exactly integer, so can directly using this integer as test data corresponding to this test instruction, certainly in different applications, also other operations can be carried out on the basis of integer.

Step S104: judge that the test of electronic product is passed through.

Step S105: judge that the test of electronic product is not passed through.

In the present embodiment, after step S104 or step S105, can also comprise: the mark receiving next electronic product, and obtain corresponding detecting information according to the mark of next electronic product; Or, receive the request backed off after random test exiting the test of described electronic product.

Concrete, after executing all test instructions, final test result can be obtained, then the test of whole electronic product is terminated, if certainly only need to detect when in tested electronic product, whether a certain functional module meets the requirements, also only can perform the test instruction relevant to this functional module, then terminate whole test.After the test terminating whole electronic product, waiting status can be entered, the mark of the next electronic product of wait-receiving mode, then test, or exit the test of test backed off after random electronic product receiving, such as, can be, after test man presses " exiting test " button, exit whole test.

Disclosed in the embodiment of the present invention, the method for testing of this electronic product is compared with conventional test methodologies, because each test instruction all can independent operating separately, if there is mistake in a certain bar test instruction, so just be easy to detect to be that mistake has appearred in which bar test instruction, can directly modify to this test instruction, improve the maintainability of software, for different tested electronic products, only need load corresponding detecting information, do not need to do any change to program, similarly, when the parameter of electronic product changes and need change test parameter, also the corresponding parameter in detecting information need only be changed, and do not need to change program code, such as: if tested electronic product is for controlling three-phase alternating current sensor and frequency converter, and these two instruments are all the communication modules by Mod-bus agreement, just address, the parameters such as function code are different, like this when operating this two instruments, do not need to revise program code corresponding to test instruction, only need the parameter that amendment is corresponding, the code of whole like this method of testing is few, do not have the code of same redundant.And do not need research and development various test just can complete whole test process, and simple and practical.

Describe method in detail in embodiment disclosed in the invention described above, the proving installation of various ways can be adopted to realize for method of the present invention, therefore the invention also discloses a kind of proving installation, provide specific embodiment below and be described in detail.

Refer to Fig. 3, the structural representation of electronic product test device disclosed in the embodiment of the present invention, this electronic product test device can comprise: read identification module 301, detecting information acquisition module 302, test data acquisition module 303 and judge module 304, wherein:

Read identification module 301, for reading the mark of tested electronic product.

Concrete, reading identification module 301 can be scanner, and the mark of electronic product can be the bar code of this electronic product, and the method for the bar code of scanner scanning electronic product can be utilized to obtain the mark of electronic product.

Detecting information acquisition module 302, for the described mark obtained according to described read module, obtains the detecting information corresponding with this mark.

Concrete, after the mark obtaining electronic product, can according to the path corresponding with this mark, such as: ... Invt_test_system Data catalogue, obtain the detecting information of this electronic product, wherein, the electronic product of same model can use same detecting information, and the mark of electronic product is corresponding with the detecting information of this model electronic product.Detecting information comprises: at least one for testing the test instruction of the specific function of described electronic product, the normal data scope corresponding with each bar test instruction and running and the parameter of program code that each bar test instruction is corresponding.Wherein, test instruction is corresponding with program code, test instruction can as the order triggering the operation of corresponding program code, namely after certain test instruction is performed, the operation of the program code corresponding with this test instruction can be triggered, choosing of the program code that each test instruction is corresponding when testing must be correct, otherwise electronic product is after the program code according to mistake is tested, and can not get corresponding test data.

Test data acquisition module 303, for running each bar test instruction, and loading corresponding parameter in the program code corresponding with each bar test instruction, obtaining the test data corresponding with each bar test instruction.

Preferably, each bar test instruction is separate, parameter in test instruction comprises functional module Selecting All Parameters and test parameter, functional module Selecting All Parameters is for choosing in tested electronic product the foundation needing certain functional module of testing, test parameter is the numerical value that in tested electronic product, each functional module needs when testing, and test data acquisition module 303 specifically comprises:

First running unit 3031, for needing to perform in current test instruction, run current test instruction, and load the functional module Selecting All Parameters corresponding with current test instruction in corresponding program code, choose in tested electronic product certain functional module needing to test;

Second running unit 3032, for after the first running unit is finished, loads the test parameter corresponding with current test instruction in certain functional module, obtains the test data corresponding with current test instruction;

Acquiring unit 3033, for after the second running unit is finished, obtains corresponding test data.

Test data acquisition module 303 can also comprise: processing unit 3034, for judging the number category of the test result corresponding with each bar test instruction, when the numerical value of test result corresponding to a certain test instruction is decimal, then the numerical value of test result is multiplied by the integral multiple of 10 to convert integer to, and using the integer after conversion as the corresponding test data of this test instruction, when the number of the corresponding test result of arbitrary test instruction is greater than 1, calculate the mean value of each test result, and using the test data of mean value as this test instruction.

Concrete, different to the process operation of test result in different applications, such as: if the carrying load ability of test electronic product, dock loaded electronic product and carry out test acquisition test result 1, again test is carried out to the same electronic product not connecing load and obtain test result 2, process operation now can for getting test result 1 absolute value poor with test result 2, and using this absolute value as test data, if test result 1 is decimal with the absolute value of test result 2 difference, then this numerical value is multiplied by the integral multiple of 10 to convert integer to, and using the integer that changes into as with test data, the test result that certain a certain test instruction obtains after execution is exactly integer, so can directly using this integer as test data corresponding to this test instruction, certainly in different applications, also other operations can be carried out on the basis of integer.

Judge module 304, for judging whether obtained each bar test data meets normal data scope corresponding separately, when obtained each bar test data all meets normal data scope corresponding separately, judge that the test of electronic product is passed through, when arbitrary test data does not meet corresponding normal data scope, judge that the test of electronic product is not passed through.

Electronic product test device can also comprise: parameter adapting module 305, for after receiving the order of modifying to the parameter running the program code relevant to each bar test instruction, modifies to corresponding parameter according to the order received.

Concrete, each bar test instruction is separate.Each test instruction is all can independent operating separately, if there is mistake in program code corresponding to a certain bar test instruction, just detect it is that mistake appears in program code corresponding to which bar test instruction easily, program code that can be directly corresponding to this test instruction is modified, improve the maintainability of software, for different tested electronic products, only need load corresponding detecting information, do not need to do any change to program, similarly, when the parameter of electronic product changes and need change detecting information, also only parameter corresponding in detecting information need be changed, and do not need to change program code, improve maintainability and the operability of software.

This electronic product test device can also comprise: suspend module 306, for after executing current testing procedure, detect the operation whether suspending testing procedure, if, then suspend the operation of testing procedure and show the test data corresponding with described current test instruction and corresponding normal data scope, if not, then continue to run follow-up testing procedure.Concrete, mainly see on " the whether suspending " field in the detecting information form shown in Fig. 2 corresponding to current test instruction it is character " B " or other characters except character " B " or character string, need to suspend if character " B " then represents, if other characters except character " B " or character string are all judged to not need to suspend, in other embodiments, can certainly need to suspend with other characters except " B " or string representation, with what character representation need to suspend and do not affect realization of the present invention, so just do not need time-out to make particular determination to what character representation in embodiments of the present invention.

This electronic product test device can also comprise: redirect module 307, for detecting whether jump to nominative testing instruction, if so, then jumping to described nominative testing instruction and performing, and if not, then continues to perform follow-up test instruction.Concrete, mainly see " passing through redirect " field in the detecting information form shown in Fig. 2 corresponding to current test instruction and the character on " failed redirect " field, wherein, after " passing through redirect " and referring to test instruction, the test instruction that system jumps to automatically " passing through redirect " field is specified continues to perform, " failed redirect " refers to that test instruction performs unsuccessfully, the test instruction that system jumps to automatically " failed redirect " field is specified continues to perform, " pass through redirect " and " failed redirect " flow process constituted between test instruction turns to, if these two fields are empty in detecting information form, then order performs follow-up test instruction,

And/or whether memory module 308, preserving test data corresponding to current test instruction for detecting, if so, then preserving, if not, then not preserving.Concrete, mainly see on " result preservation " field in the detecting information form shown in Fig. 2 corresponding to current test instruction it is character " S " or other characters except character " S " or character string, preserve if character " S " then represents, system, detecting that this " result preservation " field place then can preserve test data automatically for " S ", if other characters except character " S " or character string then represent is not preserved.In other embodiments, can certainly need to preserve with other characters except " S " or string representation, what what with character representation need to carry out preserving not affect realization of the present invention, so just do not make particular determination to character representation to need carrying out preservation with in embodiments of the present invention.

This electronic product test device can also comprise: trigger module 309, for the test obtaining described electronic product by or the result do not passed through after, trigger the mark that described reading identification module 301 reads next electronic product; Or, exit test module 310, for receiving the request backed off after random test exiting the test of described electronic product.

Electronic product test device can also comprise: detect execution module 311, for detecting current test instruction the need of execution, if not, then skip described current test instruction to continue to judge that next test instruction is the need of execution, if so, then test data acquisition module 303 is triggered.

Electronic product test device disclosed in the embodiment of the present invention is compared with traditional test device, because each test instruction all can independent operating separately, if there is mistake in a certain bar test instruction, so just be easy to detect to be that mistake has appearred in which bar test instruction, can directly modify to this test instruction, improve the maintainability of software, for different tested electronic products, only need load corresponding detecting information, do not need to do any change to program, similarly, when the parameter of electronic product changes and need change test parameter, also the corresponding parameter in detecting information need only be changed, and do not need to change program code, such as: if tested electronic product is for controlling three-phase alternating current sensor and frequency converter, and these two instruments are all the communication modules by Mod-bus agreement, just address, the parameters such as function code are different, like this when operating this two instruments, do not need to revise program code corresponding to test instruction, only need the parameter that amendment is corresponding, the code of whole like this method of testing is few, do not have the code of same redundant.And do not need to research and develop multiple proving installation, the proving installation of electronic product disclosed in the embodiment of the present invention self just can complete whole test process, and simple and practical.

Refer to Fig. 4, the structural representation of the test macro of electronic product disclosed in the embodiment of the present invention, this test macro can comprise scanner 401, host computer 402, relay switch control box 403 and test data acquisition module 303, wherein:

Scanner 401 is connected with host computer 402, host computer 402 is connected with relay switch control box 403 by input/output interface, host computer 402 is connected with test data acquisition module 303 and electronic product 404 respectively by serial ports, and electronic product 404 is connected with test data acquisition module 303 and relay switch control box 403 respectively;

Wherein detailed principle of work is as follows:

Host computer 402 obtains detecting information according to the mark of scanner 401 scanning electron product 404.

Host computer 402, when testing results instruction a, loads the functional module Selecting All Parameters corresponding with test instruction a in corresponding program code, produces control command.

Relay switch control box 403 selects the corresponding functional module in electronic product 404 according to received control command, the test parameter corresponding to test instruction a is sent in corresponding functional module by test data acquisition module 303 by host computer 402, obtain the test data corresponding with test instruction a, test data acquisition module 303 obtains the test data corresponding with test instruction a from electronic product 404, and this test data is sent to host computer 402, described test data and corresponding normal data scope carry out contrasting to obtain testing to corresponding functional module the result whether passed through by host computer 402.

Wherein, described detecting information comprises at least one for testing the test instruction of the specific function of described electronic product, the normal data scope corresponding with each bar test instruction and running and the parameter of program code that described each bar test instruction is corresponding, described parameter comprises functional module Selecting All Parameters and test parameter, described functional module Selecting All Parameters is for choosing in tested electronic product the foundation needing certain functional module of testing, and described test parameter is the numerical value that in described tested electronic product, each functional module needs when testing.

After electronic product test macro is connected with electronic product 404, first electronic product test macro carries out initialization (such as relay switch control box 403 etc.) to each instrument of therein.The mark of scanner 401 scanning electron product is waited for after initialization.This step only needs to perform once after electronic product test macro is opened, after an electronic product is completed, not needing to perform this step when testing another one electronic product, certainly according to different actual conditions, can perform once after often testing an electronic product yet.

Electronic product test macro can also comprise: display 405, and the functional module obtained for showing host computer 402 tests the result whether passed through.Namely judge when this test data drops on corresponding normal data scope that the test of corresponding functional module is passed through, and judge that when this test data does not drop on corresponding normal data scope the test of corresponding functional module is not passed through, and by the result whether display 405 Presentation Function module testing passes through.

In the present embodiment, host computer 402 stores the detecting information of the electronic product 404 of multiple different model, due to detecting information be with model belonging to the mark of electronic product 404 one to one, therefore, after scanner 401 scans the mark of electronic product 404, host computer 402 just can obtain corresponding detecting information according to this mark, which functional module that first host computer 402 is determined in electronic product according to functional module Selecting All Parameters needs tested, again corresponding test parameter is sent to this functional module, after this functional module is tested, host computer 402 is obtaining test data from electronic product 404, and test data and corresponding normal data are compared, draw the whether satisfactory result of this functional module.

This electronic product test macro that the present embodiment provides, when testing the different series of same electronic product or the electronic product of different model, only needs to modify to corresponding detecting information.Further, owing to not needing to revise hardware, only need to modify to detecting information, thus do not need to research and develop multiple test circuit, simplify hardware circuit, provided cost savings, the application of various test event robotization is completed by the software of high efficient and flexible, reliability is high, flexible design, and then realizes high efficiency test.

In order to those skilled in the art better understand the electronic product test macro disclosed in the embodiment of the present invention, detailed is introduced the flow process of electronic product test macro when testing electronic product 404 below.

Refer to Fig. 5, disclosed in the embodiment of the present invention, utilize the process flow diagram of electronic product test system and test electronic product.

Step S501: initiation parameter.

After electronic product test macro is connected with electronic product 404, first electronic product test macro carries out initialization (such as relay switch control box 403 etc.) to each instrument of therein.The mark of operator's scanning electron product 404 is waited for after initialization.

Step S502: the mark of the electronic product 404 that wait-receiving mode scanner 401 scans.

Step S503: after the mark receiving electronic product 404, obtains the detecting information corresponding with this mark.

Step S504: perform current test instruction.

Electronic product test macro once can perform a test instruction, if detecting information is stored in detecting information table, can perform successively according to the sequence number of test instruction (testing procedure namely in Fig. 2 table).

Step S505: after current test instruction is finished, judges whether the test terminating this electronic product, if so, then enters step S506, if not, then returns step S504.

Certain electronic product is tested, all test instructions relevant to this electronic product all can be performed, also only can perform part test instruction.

Step S506: judge whether to terminate test assignment, if so, then enter step S508, if not, then enter step S507.

If want test 6 electronic products, so test assignment is tested 6 electronic products exactly, that is after Current electronic product test, detect and whether continue to test next electronic product, if complete 6 electronic products after testing, so test assignment just finishes, if do not detected 6 electronic products, so just continues to detect next electronic product.

Step S507: judge whether the mark receiving next electronic product, if so, then return step S502, if not, then enter step S508.

Step S508: exit test.

After electronic product is completed, electronic product test macro can enter waiting status, and as shown in Figure 6, disclosed in the embodiment of the present invention, electronic product test macro enters the schematic diagram of waiting status.As can be seen from Figure 6 it is undesirable for going up an electronic product carrying out testing, so display " product is bad ", after being completed of a upper electronic product, electronic product test macro is in waiting status, wait for that the input that next electronic product identifies is " bar code input ", if now there is the mark of electronic product to input, then electronic product test macro receive " OK " button clicked after, follow-up test step will be entered, the button of " exiting test " is also had in Fig. 6, if electronic product test macro receive this button clicked after, test will be exited.

In the application of reality, due to the difference of application scenarios, the particular hardware form of expression of test data acquisition module 303 also may be different, in the test macro of frequency converter, the hardware corresponding with test data acquisition module 303 is: multimeter, RS-232 turn RS-485 module, three-phase alternating current sensor, utilizes the example of this electronic product test system and test frequency converter to show explanation in actual applications below by exemplifying.

Refer to Fig. 7, disclosed in the embodiment of the present invention, utilize a kind of test system structure schematic diagram of electronic product test system and test frequency converter, this system can comprise:

Scanner 401, relay switch control box 403, multimeter 701, RS-232 turn RS-485 module 702, three-phase alternating current sensor 703, host computer 402 and display 405, wherein: host computer 402 stores detecting information, detecting information comprises: at least one test electronic product test instruction, the normal data scope corresponding to each bar test instruction and relevant program code runs the parameter of needs with each bar test instruction, wherein:

Scanner 401 and display 405 are connected with host computer 402; Host computer 402 is connected with relay switch control box 403 by input/output interface (I/O mouth), and relay switch control box 403 is connected with frequency converter 704 and multimeter 701 respectively; Host computer 402 is connected with multimeter 701 by general purpose interface bus (General-PurposeInterface Bus, GPIB) card; Host computer 402 turns RS-485 module 702 by serial ports with RS-232 and is connected, and RS-232 turns RS-485 module 702 and is connected with frequency converter 704 and three-phase alternating current sensor 703 respectively, and three-phase alternating current sensor 703 is connected with frequency converter 704.

Wherein detailed principle of work is as follows:

The mark of the frequency converter 704 that host computer 402 scans according to scanner 401, obtain the detecting information of frequency converter 704, and selected a certain functional module that needs in frequency converter 704 to carry out testing according to functional module Selecting All Parameters by input/output interface pilot relay switch control box 403.

Detailed process is the same with the process described in Fig. 4.

The test parameter that a certain functional module test needs is turned RS-485 module 702 by serial ports and RS-232 and sends to frequency converter 704 by host computer 402, after a certain functional module is tested according to corresponding test parameter, produce test data, host computer 402 obtains this test data by multimeter 701 from relay switch control box 403, or turn RS-485 module 702 by RS-232 and obtain this test data, also or turn RS-485 module 702 by three-phase alternating current sensor 703 with RS-232 and obtain this test data, host computer 402 by obtain described test data compared with corresponding normal data scope, obtain the whether satisfactory result of a certain functional module, and this result is shown in display 405.

Host computer 402 can also before comparing test data with corresponding normal data scope, test data is processed according to pre-defined rule, accordingly, test data after process and corresponding normal data scope compare by host computer 402, obtain the whether satisfactory result of a certain functional module in electronic product.

Adopt system disclosed in the embodiment of the present invention, do not need to research and develop multiple test circuit, simplified hardware circuit, provide cost savings, completed the application of various test event robotization by the software of high efficient and flexible, reliability is high, flexible design, and then realize high efficiency test.

Electronic product method of testing disclosed in above-described embodiment, Apparatus and system can be virtual instrument test platform based on LabVIEW and the electronic product method of testing, the Apparatus and system that design, the test point position of the sub-product of automatic control electric can be carried out, namely automatically detect at the different property indices of functional module to be tested to this electronic product of electronic product, this test platform can realize multi-product, polytypic test, be an open test macro, there is very strong upgrading extended capability.

Moreover, electronic product method of testing disclosed in the embodiment of the present invention, Apparatus and system, do not need to research and develop multiple test circuit, simplify hardware circuit, provide cost savings, completed the application of various test event robotization by the software of high efficient and flexible, reliability is high, flexible design, and then realize high efficiency test.

In this instructions for electronic product test device disclosed in embodiment, because it is corresponding with the electronic product method of testing disclosed in embodiment, so description is fairly simple, relevant part illustrates see electronic product Test Methods section.

Also it should be noted that in this manual, the such as relational terms of first and second grades and so on is only used for an entity or operation to separate with another entity or operational zone, and not necessarily requires or imply the relation that there is any this reality between these entities or operation or sequentially.And, term " comprises ", " comprising " or its any other variant are intended to contain comprising of nonexcludability, thus make to comprise the process of a series of key element, method, article or equipment and not only comprise those key elements, but also comprise other key elements clearly do not listed, or also comprise by the intrinsic key element of this process, method, article or equipment.When not more restrictions, the key element limited by statement " comprising ... ", and be not precluded within process, method, article or the equipment comprising described key element and also there is other identical element.

The software module that the method described in conjunction with embodiment disclosed herein or the step of algorithm can directly use hardware, processor to perform, or the combination of the two is implemented.Software module can be placed in the storage medium of other form any known in random access memory (RAM), internal memory, ROM (read-only memory) (ROM), electrically programmable ROM, electrically erasable ROM, register, hard disk, moveable magnetic disc, CD-ROM or technical field.

To the above-mentioned explanation of the disclosed embodiments, professional and technical personnel in the field are realized or uses the present invention.To be apparent for those skilled in the art to the multiple amendment of these embodiments, General Principle as defined herein can without departing from the spirit or scope of the present invention, realize in other embodiments.Therefore, the present invention can not be restricted to these embodiments shown in this article, but will meet the widest scope consistent with principle disclosed herein and features of novelty.

Claims

1. a method of testing for electronic product, is characterized in that, described method of testing comprises:

Host computer obtains detecting information according to the mark of described electronic product, wherein, described detecting information comprises at least one for testing the test instruction of the specific function of described electronic product, the normal data scope corresponding with each bar test instruction and running and the parameter of program code that described each bar test instruction is corresponding;

Host computer runs described each bar test instruction, and loads corresponding parameter in the program code corresponding with described each bar test instruction, obtains the test data corresponding with described each bar test instruction;

Host computer judges whether each bar test data obtained meets normal data scope corresponding separately;

Host computer is when obtained each bar test data all meets normal data scope corresponding separately, judge that the test of described electronic product is passed through, when arbitrary test data does not meet corresponding normal data scope, judge that the test of described electronic product is not passed through;

Wherein, also comprised before obtaining the step of detecting information according to the mark of described electronic product:

After receiving the order of modifying to the parameter run required for the program code relevant to described each bar test instruction, the described order according to receiving is modified to corresponding parameter;

Described each bar test instruction is separate, parameter in described test instruction comprises functional module Selecting All Parameters and test parameter, described functional module Selecting All Parameters is for choosing in tested electronic product the foundation needing certain functional module of testing, described test parameter is the numerical value that in described tested electronic product, each functional module needs when testing, wherein, in the described each bar test instruction of operation, and load corresponding parameter in the program code corresponding with described each bar test instruction, specifically to comprise in the step obtaining the test data corresponding with described each bar test instruction:

When current test instruction needs to perform, run described current test instruction, and load the functional module Selecting All Parameters corresponding with described current test instruction in corresponding program code, choose in tested electronic product certain functional module needing to test, reload in the test parameter corresponding with described current test instruction to certain functional module described, obtain the test data corresponding with described current test instruction.

2. method of testing according to claim 1, it is characterized in that, in the described each bar test instruction of operation, and load corresponding parameter in the program code corresponding with described each bar test instruction, also comprise before obtaining the step (being called steps A) of the test data corresponding with described each bar test instruction:

Detect current test instruction the need of execution, if not, then skip described current test instruction and continue to judge that next test instruction is the need of execution, if so, then enters steps A.

3. method of testing according to claim 1, is characterized in that, is judging each bar test data obtained also comprises before whether meeting the step of normal data scope corresponding separately:

Judge the number category of the test result corresponding with described each bar test instruction;

When the numerical value of test result corresponding to a certain test instruction is decimal, the numerical value of described test result is multiplied by the integral multiple of 10 to convert integer to, and using the integer after conversion as the test data corresponding with described a certain test instruction, when the number of the test result corresponding with arbitrary test instruction is greater than 1, calculate the mean value of each test result, and using the test data of described mean value as described arbitrary test instruction.

4. method of testing according to claim 1, is characterized in that, is loading in corresponding parameter to the program code corresponding with described each bar test instruction, also to comprise after the step obtaining the test data corresponding with described each bar test instruction:

Detect the operation whether suspending testing procedure, if so, then suspend the operation of testing procedure and show the test data corresponding with current test instruction and corresponding normal data scope, if not, then continuing testing results step;

Detect and whether jump to nominative testing instruction, if so, then jump to described nominative testing instruction and perform, if not, then continue to perform follow-up test instruction;

And/or,

Detect and whether preserve test data corresponding to current test instruction, if so, then preserve, if not, then do not preserve.

5. method of testing according to claim 1, is characterized in that, the test obtaining described electronic product by or the result do not passed through after, described method of testing also comprises:

Receive the mark of next electronic product, and obtain corresponding detecting information according to the mark of next electronic product;

Or,

Receive the request backed off after random test exiting the test of described electronic product.

6. a proving installation for electronic product, is characterized in that, described proving installation comprises:

Read identification module, for reading the mark of tested electronic product;

Detecting information acquisition module, for the described mark read according to described reading identification module, obtain the detecting information corresponding with this mark, described detecting information comprises: at least one for testing the test instruction of the specific function of described electronic product, the normal data scope corresponding with each bar test instruction and running and the parameter of program code that described each bar test instruction is corresponding;

Test data acquisition module, for running described each bar test instruction, and loading corresponding parameter in the program code corresponding with each bar test instruction, obtaining the test data corresponding with described each bar test instruction;

Judge module, for judging whether obtained each bar test data meets normal data scope corresponding separately, when obtained each bar test data all meets normal data scope corresponding separately, judge that the test of described electronic product is passed through, and when arbitrary test data does not meet corresponding normal data scope, judge that the test of described electronic product is not passed through;

Wherein, described proving installation also comprises:

Parameter adapting module, for after receiving the order of modifying to the parameter running the program code relevant to described each bar test instruction, the described order according to receiving is modified to corresponding parameter;

Described each bar test instruction is separate, parameter in described test instruction comprises functional module Selecting All Parameters and test parameter, described functional module Selecting All Parameters is for choosing in tested electronic product the foundation needing certain functional module of testing, described test parameter is the numerical value that in described tested electronic product, each functional module needs when testing, and described test data acquisition module specifically comprises:

7. proving installation according to claim 6, it is characterized in that, described proving installation also comprises:

Detect execution module, for detecting current test instruction the need of execution, if not, then skip described current test instruction and continue to judge that next test instruction is the need of execution, if so, then trigger described test data acquisition module.

8. proving installation according to claim 6, is characterized in that, described test data acquisition module specifically also comprises:

Processing unit, for judging the number category of the test result corresponding with described each bar test instruction, when the numerical value of test result corresponding to a certain test instruction is decimal, then the numerical value of described test result is multiplied by the integral multiple of 10 to convert integer to, and using the integer after conversion as the corresponding test data of described a certain test instruction, and when the number of the corresponding test result of arbitrary test instruction is greater than 1, calculate the mean value of each test result, and using the test data of described mean value as described arbitrary test instruction.

9. proving installation according to claim 6, is characterized in that, described proving installation also comprises:

Suspend module, for after executing current testing procedure, detect the operation whether suspending testing procedure, if, then suspend the operation of testing procedure and show the test data corresponding with described current test instruction and corresponding normal data scope, if not, then continue to run follow-up testing procedure;

Redirect module, for detecting whether jump to nominative testing instruction, if so, then jumping to described nominative testing instruction and performing, and if not, then continues to perform follow-up test instruction;

And/or,

Preserve module, whether preserving test data corresponding to current test instruction for detecting, if so, then preserving, if not, then not preserving.

10. proving installation according to claim 6, is characterized in that, described proving installation also comprises:

Trigger module, for the test obtaining described electronic product by or the result do not passed through after, trigger the mark that described reading identification module reads next electronic product;

Or,

Exit test module, for receiving the request backed off after random test exiting the test of described electronic product.

The test macro of 11. 1 kinds of electronic products, is characterized in that, comprises scanner, host computer, relay switch control box and test data acquisition module, wherein:

Described scanner is connected with described host computer, described host computer is connected with described relay switch control box by input/output interface, described host computer is connected with described test data acquisition module and described electronic product respectively by serial ports, and described electronic product is connected with described test data acquisition module and described relay switch control box respectively;

The mark of described host computer electronic product according to described scanner scanning and obtain detecting information, wherein, described detecting information comprises at least one for testing the test instruction of the specific function of described electronic product, the normal data scope corresponding with each bar test instruction and running and the parameter required for program code that described each bar test instruction is corresponding, described parameter comprises functional module Selecting All Parameters and test parameter, described functional module Selecting All Parameters is for choosing in tested electronic product the foundation needing certain functional module of testing, described test parameter is the numerical value that in described tested electronic product, each functional module needs when testing,

Described host computer, when running a certain bar test instruction, loads the functional module Selecting All Parameters corresponding with described a certain bar test instruction in corresponding program code, produces control command;

The corresponding functional module in described electronic product selected by described relay switch control box according to received described control command, the test parameter corresponding to described a certain bar test instruction is sent in corresponding functional module by described test data acquisition module by described host computer, obtain the test data corresponding with described a certain test instruction, described test data acquisition module obtains and described test data from described tested electronic product, and described test data is sent to described host computer, described test data and corresponding normal data scope carry out contrasting to obtain testing to corresponding functional module the result whether passed through by described host computer,

After receiving the order of modifying to the parameter run required for the program code relevant to described each bar test instruction, the described order according to receiving is modified to corresponding parameter.