CN102636704A

CN102636704A - Testing method, device and system for electronic product

Info

Publication number: CN102636704A
Application number: CN2012100549217A
Authority: CN
Inventors: 米杰; 王德武; 游开宗
Original assignee: Shenzhen Invt Electric Co Ltd
Current assignee: Invt Power Electronics Suzhou Co ltd
Priority date: 2012-03-05
Filing date: 2012-03-05
Publication date: 2012-08-15
Anticipated expiration: 2032-03-05
Also published as: CN102636704B

Abstract

The invention provides a testing method, device and system for an electronic product. The testing method comprises the following steps of: obtaining testing information according to an identity of the electronic product; operating testing instructions, and loading corresponding parameters to program codes corresponding to the testing instructions, so as to obtain testing data corresponding to the testing instructions; judging whether all the obtained testing data is in the respective corresponding standard data ranges or not; if all the obtained testing data is in the respective corresponding standard data ranges, judging that the electronic product passes the test; and if any one of the obtained testing data does not accord with the corresponding standard data range, judging that the electronic product does not pass the test. When the testing method disclosed by the embodiment of the invention tests different electronic products, the entire testing process can be completed by only modifying the corresponding parameters in the testing information without developing various testing methods. Therefore, the testing method is simple and practical.

Description

A kind of method of testing of electronic product, Apparatus and system

Technical field

The present invention relates to instrument and field of instrumentation technology, in particular, relate to a kind of electronic product method of testing, Apparatus and system.

Background technology

In the process of research and development and production electronic product, need test electronic product, whether meet related request to detect this electronic product, electronic product is tested, exactly each functional module of electronic product is tested.

Continuous development along with electronic product; The series and the model of electronic product are more and more abundanter; The electronic product of different series is because the function that realizes is different, and is so method of testing is different, different with the parameter or the circuit possibility of the functional module that realizes identical function in the electronic product of a series of different models; Thereby method of testing is also different; Same electronic product possibly have multiple function, maybe be different to the method for the test of each functional module, so the complexity of electronic product test is also increasingly high.

At present; The electronic product method of testing is in traditional manually perhaps semi-automatic test basically; When electronic product is tested; Possibly need the research and development various test, use a pair of electronic product that should series of the several different methods one of research and development to test, thereby make that the test process of electronic product is complicated.

Summary of the invention

In view of this; The invention provides a kind of electronic product method of testing, Apparatus and system; Overcoming in the prior art owing to the different method of testings that cause with model of electronic product series are different, and then the electronic product test process that causes complicacy and the low problem of maintainability.

For realizing above-mentioned purpose, the present invention provides following technical scheme:

A kind of method of testing of electronic product; Comprise: the sign according to said electronic product is obtained detecting information; Wherein, said detecting information comprise at least one be used to test the specific function of said electronic product test instruction, with the corresponding normal data scope of each bar test instruction and operation and said each bar test instruction corresponding programs code parameters needed; Move said each bar test instruction, and load relevant parameters to said each bar test instruction corresponding programs code in, obtain and the corresponding test data of said each bar test instruction; Judge whether each the bar test data that is obtained meets corresponding separately normal data scope; Each bar test data being obtained all meets under the situation of corresponding separately normal data scope; Judge that the test of said electronic product passes through; Do not meet arbitrary test data under the situation of corresponding normal data scope, judge that the test of said electronic product is not passed through.

Preferably; Before the step of obtaining detecting information according to the sign of said electronic product, also comprise: after receiving the order that the operation program code parameters needed relevant with said each bar test instruction made amendment, relevant parameters is made amendment according to the said order that receives.

Preferably; In said each the bar test instruction of operation, and load relevant parameters to said each bar test instruction corresponding programs code in, whether obtain also to comprise before with the step (being called steps A) of the corresponding test data of said each bar test instruction: detecting current test instruction needs to carry out; If not; Then skip said current test instruction and continue to judge whether next bar test instruction needs to carry out, if then get into steps A.

Preferably; Said each bar test instruction is separate; Parameter in the said test instruction comprises that functional module chooses parameter and test parameter; It is the foundation that is used for choosing certain functional module of tested electronic product needs test that said functional module is chosen parameter, and said test parameter is the numerical value that each functional module needs when test in the said tested electronic product, wherein; In said each the bar test instruction of operation; And load relevant parameters to said each bar test instruction corresponding programs code in, specifically comprise in the step with the corresponding test data of said each bar test instruction obtaining: under the situation that current test instruction need be carried out, move said current test instruction; And loading and the corresponding functional module of said current test instruction are chosen in parameter to the corresponding programs code; Choose in the tested electronic product certain functional module that needs test, reload with the corresponding test parameter of said current test instruction to said certain functional module in, obtain and the corresponding test data of said current test instruction.

The step whether each the bar test data that preferably, is obtained in judgement meets corresponding separately normal data scope also comprises before: judge the numerical value kind with the corresponding test result of said each bar test instruction; Numerical value in the corresponding test result of a certain test instruction is under the situation of decimal; The numerical value of said test result multiply by 10 integral multiple to convert integer to; And integer conduct after will changing and the corresponding test data of said a certain test instruction; With the number of the corresponding test result of arbitrary test instruction greater than 1 situation under, calculate the mean value of each test result, and with the test data of said mean value as said arbitrary test instruction.

Preferably; Load relevant parameters to said each bar test instruction corresponding programs code in; Also comprise after the step with the corresponding test data of said each bar test instruction obtaining: detect the operation that whether suspends testing procedure, if then suspend operation and demonstration and the corresponding test data of current test instruction and the corresponding normal data scope of testing procedure; If, then do not continue the operation testing procedure; Detect whether jump to the nominative testing instruction, if, then jump to said nominative testing instruction and execution, if not, then continue to carry out follow-up test instruction; And/or, detect and whether preserve the corresponding test data of current test instruction, if then preserve, if not, then do not preserve.

Preferably, after the test that obtains said electronic product was through the result who does not perhaps pass through, said method of testing also comprised: receive the sign of next electronic product, and obtain corresponding detecting information according to the sign of next electronic product; Or, withdraw from test after receiving the request withdraw from said electronic product test.

A kind of proving installation of electronic product comprises and reads identification module, detecting information acquisition module, test data acquisition module and judge module.Read identification module, be used to read the sign of tested electronic product; The detecting information acquisition module; Be used for reading the said sign that identification module reads and obtaining the detecting information corresponding with this sign according to said, said detecting information comprises: at least one be used to test the specific function of said electronic product test instruction, with the corresponding normal data scope of each bar test instruction and operation and said each bar test instruction corresponding programs code parameters needed; The test data acquisition module is used to move said each bar test instruction, and load relevant parameters to each bar test instruction corresponding programs code in, obtain and the corresponding test data of said each bar test instruction; Judge module; Be used to judge whether each the bar test data that is obtained meets corresponding separately normal data scope; Each bar test data being obtained all meets under the situation of corresponding separately normal data scope; Judge that the test of said electronic product passes through, and do not meet under the situation of corresponding normal data scope, judge that the test of said electronic product is not passed through arbitrary test data.

Preferably; Said proving installation also comprises: the parameter modification module; Be used for after receiving the order that the operation program code parameters needed relevant with said each bar test instruction made amendment, relevant parameters being made amendment according to the said order that receives.

Preferably, said proving installation also comprises: whether detect execution module, being used to detect current test instruction needs to carry out; If not; Then skip said current test instruction and continue to judge whether next bar test instruction needs to carry out, if then trigger said test data acquisition module.

Preferably; Said each bar test instruction is separate; Parameter in the said test instruction comprises that functional module chooses parameter and test parameter; It is the foundation that is used for choosing certain functional module of tested electronic product needs test that said functional module is chosen parameter, and said test parameter is the numerical value that each functional module needs when test in the said tested electronic product, and said test data acquisition module specifically comprises:

The first operation unit; Be used under the situation that said current test instruction need be carried out; Move said current test instruction; And loading and the corresponding functional module of said current test instruction choose in parameter to the corresponding programs code, chooses certain functional module that needs test in the tested electronic product;

The second operation unit is used for after the said first operation unit is finished, and in loading and the corresponding test parameter of said current test instruction to said certain functional module, obtains and the corresponding test data of said current test instruction;

Acquiring unit is used for after the said second operation unit is finished, obtaining corresponding test data.

Preferably; Said test data acquisition module specifically also comprises: processing unit; Being used to judge the numerical value kind with the corresponding test result of said each bar test instruction, is under the situation of decimal at the numerical value of the corresponding test result of a certain test instruction, then the numerical value of said test result multiply by 10 integral multiple to convert integer to; And the integer after will changing is as the corresponding test data of said a certain test instruction; And the number of the corresponding test result of arbitrary test instruction greater than 1 situation under, calculate the mean value of each test result, and with the test data of said mean value as said arbitrary test instruction.

Preferably; Said proving installation also comprises: suspend module, be used for after executing current testing procedure, detect the operation that whether suspends testing procedure; If; Then suspend operation and demonstration and the corresponding test data of said current test instruction and the corresponding normal data scope of testing procedure,, then continue the follow-up testing procedure of operation if not; The redirect module is used for detection and whether jumps to the nominative testing instruction, if, then jump to said nominative testing instruction and execution, if not, then follow-up test instruction is carried out in continuation; And/or, preserve module, be used to detect and whether preserve the corresponding test data of current test instruction, if then preserve, if not, then do not preserve.

Preferably, said proving installation also comprises: trigger module is used for after the test that obtains said electronic product is through the result who does not perhaps pass through, triggering the said sign that identification module reads next electronic product that reads; Or, withdraw from test module, withdraw from test after being used to receive the request of withdrawing from the test of said electronic product.

A kind of test macro of electronic product; Comprise scanner, host computer, relay switch control box and test data acquisition module; Wherein, said scanner links to each other with said host computer, and said host computer links to each other with said relay switch control box through input/output interface; Said host computer links to each other with said test data acquisition module and said electronic product respectively through serial ports, and said electronic product links to each other with said test data acquisition module and said relay switch control box respectively; Said host computer obtains detecting information according to the sign of the said electronic product of said scanner scanning; Wherein, Said detecting information comprise at least one be used to test the specific function of said electronic product test instruction, with the corresponding normal data scope of each bar test instruction and operation and said each bar test instruction corresponding programs code parameters needed; Said parameter comprises that functional module chooses parameter and test parameter; It is the foundation that is used for choosing certain functional module of tested electronic product needs test that said functional module is chosen parameter, and said test parameter is the numerical value that each functional module needs when test in the said tested electronic product; Said host computer loads with said a certain the corresponding functional module of test instruction and chooses in parameter to the corresponding programs code when a certain test instruction of operation, produces control command; Said relay switch control box is selected the corresponding functional modules in the said electronic product according to received said control command; Said host computer will be sent in the corresponding functional modules through said test data acquisition module with said a certain the corresponding test parameter of test instruction; Obtain and the corresponding test data of said a certain test instruction; Said test data acquisition module obtains and said test data from said tested electronic product; And said test data is sent to said host computer, said host computer compares said test data and corresponding standard data area to obtain the result that whether test is passed through to corresponding functional modules.

Can know via above-mentioned technical scheme; Adopt the disclosed electronic product test macro of the embodiment of the invention; Since detecting information be with the sign of electronic product one to one, go out the sign of electronic product when scanner scanning after, host computer just can obtain corresponding detecting information according to this sign; It is to be tested that host computer is at first chosen which functional module needs that parameter determines in the electronic product according to functional module; Then corresponding test parameter is being sent to this functional module, this functional module is tested the back according to test parameter and is produced test data, and said host computer obtains test data from said electronic product; And test data and corresponding standard data compared; Draw whether satisfactory result of this functional module, when the electronic product of same electronic product or different series or model was tested, only need make amendment to corresponding detecting information got final product like this.Further,, only need make amendment, thereby need not research and develop multiple test circuit, simplify hardware circuit, provide cost savings detecting information owing to need not revise hardware.

The disclosed electronic product method of testing of the embodiment of the invention, Apparatus and system; Can overcome in the prior art owing to the different method of testings that cause with model of electronic product series are different; And then the electronic product test process that causes is complicated and maintainable low problem, accomplishes the application of various test event robotizations through Efficient and Flexible software, and reliability is high; Flexible design, and then realize high efficiency test.

Description of drawings

In order to be illustrated more clearly in the embodiment of the invention or technical scheme of the prior art; To do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art below; Obviously, the accompanying drawing in describing below only is embodiments of the invention, for those of ordinary skills; Under the prerequisite of not paying creative work, can also obtain other accompanying drawing according to the accompanying drawing that provides.

Fig. 1 is the process flow diagram of the disclosed electronic product method of testing of the embodiment of the invention;

Fig. 2 is the part synoptic diagram of the detecting information table of the disclosed electronic product of the embodiment of the invention;

Fig. 3 is the structural representation of the disclosed electronic product proving installation of the embodiment of the invention;

Fig. 4 is the structural representation of the disclosed electronic product test macro of the embodiment of the invention;

Fig. 5 is the disclosed process flow diagram that utilizes electronic product test system and test electronic product of the embodiment of the invention;

Fig. 6 is that the disclosed electronic product test macro of the embodiment of the invention gets into the synoptic diagram of waiting status;

Fig. 7 is the disclosed a kind of test system structure synoptic diagram that utilizes electronic product test system and test frequency converter of the embodiment of the invention.

Embodiment

To combine the accompanying drawing in the embodiment of the invention below, the technical scheme in the embodiment of the invention is carried out clear, intactly description, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills are not making the every other embodiment that is obtained under the creative work prerequisite, all belong to the scope of the present invention's protection.

See also accompanying drawing 1, be the process flow diagram of the disclosed electronic product method of testing of the embodiment of the invention, this method can comprise:

Step S101: the sign according to electronic product is obtained detecting information.

Concrete, can use bar code in the electronic product as the sign of this electronic product, can utilize the bar code of scanner scanning electronic product, thus the sign of electron gain product.After the sign of electron gain product; Can basis identify corresponding path with this; For example: ... catalogue, obtain the detecting information of this electronic product, wherein; The electronic product of same model can be used same detecting information, and the sign of electronic product is corresponding with the detecting information of this model electronic product.Detecting information can comprise: at least one be used to test the specific function of electronic product test instruction, with the corresponding normal data scope of each bar test instruction and operation and each bar test instruction corresponding programs code parameters needed.Wherein, Test instruction is corresponding with program code, and test instruction can be used as the order that triggers corresponding program code operation, just after certain test instruction is performed; Can trigger operation with this test instruction corresponding programs code; Corresponding the choosing of program code of each test instruction must be correct when testing, otherwise electronic product can not get corresponding test data after testing according to the program code of mistake.

In the present embodiment, before step S101, can also comprise: after receiving the order that the operation program code parameters needed relevant with each bar test instruction made amendment, relevant parameters is made amendment according to the said order that receives.

Preferably, each bar test instruction is separate.Each bar test instruction all is an independent operating separately, if mistake has appearred in a certain the corresponding program code of test instruction, just detecting easily is that mistake appears in the corresponding program code of which bar test instruction; Can directly make amendment to the corresponding program code of this test instruction; Improved the maintainability of software,, only needed to load corresponding detecting information and get final product for different tested electronic products; Do not need program is done any change; Similarly, change and when needing the change detecting information, also only need corresponding parameters in the change detecting information when the parameter of electronic product; And need not change program code, improved the maintainability and the operability of software.

Preferably; The storage mode of detecting information can be stored with the mode of two-dimension table; For ease, be called the detecting information form, in order to let those skilled in the art more clearly understand the detecting information form in the present embodiment in this two-dimension table that will store detecting information; Need carry out brief account to the detecting information form in the practical application; As shown in Figure 2, each row in this detecting information form can be a test instruction, and the testing process that electronic product is complete is formed in a rule test instruction.

See also accompanying drawing 2; Part synoptic diagram for the detecting information table of the disclosed electronic product of the embodiment of the invention; Because the detecting information table has a lot of test instructions; Can not enumerate one by one at this; Only make an explanation on the whole, as can be seen from Figure 2 detecting information comprises fields such as " testing procedure ", " test event ", " item description ", " code selection ", " parameter 1 ", " parameter 2 ", " parameter 3 ", " parameter 4 ", " whether suspending ", " lower limit ", " upper limit ", " unit ", " through redirect ", " failure redirect ", " result's preservation ", " whether testing ".

The sequence number of " testing procedure " expression test instruction, if all test instructions all need operation, so just the sequence number according to test instruction moves successively.

" test event " represented the title of each test instruction.

The detailed description of " item description " expression test instruction title; It is the purpose of each test instruction test; Be convenient to the programming personnel and understand the function of this step or the hardware port title of control; Because the test purpose of each test instruction all has description, test instruction is transparent fully to the operator so, and the operator only need understand the test purpose of each test instruction and the type and the meaning of correlation parameter just can easily be accomplished a test procedure that electronic product is complete.

" code selection " represented the program code that each test instruction is corresponding, and wherein, program code must be selected by the programming requirement is correct, otherwise this system can not get corresponding test data after tested electronic product test.

The correlation parameter that " parameter 1 ", " parameter 2 ", " parameter 3 ", the corresponding program code operation of " parameter 4 " expression test instruction need; It is the parameter that the program code of the current operation of detecting information form is used; Wherein, the parameter that the test instruction that has needs possibly be less than 4, and so unnecessary parameter instruction meeting is lost automatically and ignored; The parameter that the test instruction that has needs maybe unnecessary 4, get final product in that the detecting information form is made amendment so.

" whether suspend " and represent whether suspend after each test instruction is finished; Can use letter " B " (initial caps of Break) expression to need to suspend; " char " except that character " B " perhaps " character string " instruction all is judged to be and does not need to suspend (promptly non-" B "), and for example: " A ", " b ", " EBF " or the like system can judge that this testing procedure does not need to suspend, and therefore observes the postrun test data of certain testing procedure if desired; " whether suspending " form place behind this testing procedure writes " B " and gets final product; Whether system " suspends " the form place for " B " detecting this, then after this testing procedure operation finishes, and time out program.In other embodiments, can certainly need to suspend with other character representations, with what character representation need suspend influence realization of the present invention, so just do not make particular determination to what character representation suspending in embodiments of the present invention.

The lower limit of " lower limit " expression normal data.

The upper limit of " upper limit " expression normal data, wherein, " upper limit " and " lower limit " formed the scope of normal data.

The used unit of " unit " expression test data.

After " through redirect " expression test instruction was finished, the test instruction that system jumps to the position appointment of " through redirect " form automatically continued to carry out.

After failure was carried out in " failure redirect " expression test instruction, the testing procedure that system jumps to the position appointment of " through redirect " form automatically continued to carry out.In this enforcement, the flow process that " through redirect " and " failure redirect " formed between the test instruction turns to, if " through redirect " and " failure redirect " correspondence table case is empty, then presses the testing procedure operation successively from top to bottom of form.

Whether the corresponding test data of " result's preservation " expression test instruction needs to preserve; Can use letter " S " (initial caps of Save) expression to need to preserve; " char " except that character " S " perhaps " character string " instruction all is expressed as and does not carry out preserving (promptly non-" S "); Therefore preserve current test data if desired; " result's preservation " form place after this test instruction writes " S " and gets final product, and system is " S " detecting this " result's preservation " form place, then can preserve test data automatically.In other embodiments, can certainly need to preserve with other character representations, with what character representation need preserve influence realization of the present invention, so just do not make particular determination to what character representation preserving in embodiments of the present invention.

" whether test " the expression test instruction and whether need operation; Can use letter " T " (initial caps of Test) expression to need operation; " char " except that character " T " perhaps " character string " instruction all is expressed as and does not move (promptly non-" T "); Therefore shield this test instruction if desired; Write non-" T " at corresponding " whether testing " the form place of this test instruction and get final product, " whether to test " the form place be non-" T " detecting this in system, and then system skips this test instruction automatically and goes to move next test instruction after the test instruction on having moved.In other embodiments, can certainly need operation with other character representations, with what character representation need move does not influence realization of the present invention, so just do not make particular determination to what character representation moving in embodiments of the present invention.

Please continue to consult Fig. 1, step S102: move each bar test instruction, and load relevant parameters to each bar test instruction corresponding programs code in, obtain and the corresponding test data of each bar test instruction.

In the present embodiment, because parameter is operation and each bar test instruction corresponding programs code parameters needed, before program code execution, need parameter be loaded in the corresponding program code so, then in program code execution.Concrete; Operation and each bar test instruction corresponding programs code parameters needed can have a plurality of, also can have one, and number of parameters is looked different situation and decided; If detecting information is stored in the detecting information form; Parameter has in several corresponding detecting information forms several row is just arranged so, for example, four parameters is arranged; Just there are four row to represent parameter information so in the detecting information form, as above " parameter 1 " among Fig. 2, " parameter 2 ", " parameter 3 " and " parameter 4 " four row.In practical application; The parameter that the test instruction that has needs possibly be less than 4; The corresponding program code of so unnecessary parameter instruction can be lost automatically and ignore, and unnecessary 4 of the parameter possibility that the test instruction that has needs increases the relevant parameters row so and gets final product in to the detecting information form; Also can be when setting up the detecting information form, be used in the detecting information form representing parameter information columns value for the maximal value of each bar test instruction corresponding programs code parameters needed number.

In the present embodiment; Parameter in the test instruction can comprise that functional module chooses parameter and test parameter; It is the foundation that is used for choosing certain functional module of tested electronic product needs test that functional module is chosen parameter, and test parameter is the numerical value that each functional module needs when test in the tested electronic product, wherein; Step S102 specifically comprises: under the situation that current test instruction need be carried out; Move current test instruction, and loading and the corresponding functional module of current test instruction choose in parameter to the corresponding programs code, choose certain functional module that needs test in the tested electronic product; Reload with the corresponding test parameter of current test instruction to this functional module, obtain and the corresponding test data of current test instruction.

In the present embodiment, before step S102, can also comprise: judge whether current test instruction needs to carry out,,, then skip current test instruction and judge whether next bar test instruction needs to carry out if not if then get into step S102.Concrete; Mainly be see in the detecting information form shown in Fig. 2 current test instruction be character " T " or other characters or character string except that character " T " on corresponding " whether testing " field; If character " T " then expression need to carry out, if other characters except that character " T " or character string all are expressed as do not carry out.In other embodiments; Can certainly use other character representations except that " T " to need operation; Need move with what character representation does not influence realization of the present invention, so just do not make particular determination to what character representation moving in embodiments of the present invention.

In the present embodiment; After step S102, can also comprise: detect the operation that whether suspends testing procedure; If; Then suspend operation and demonstration and the corresponding test data of current test instruction and the corresponding normal data scope of testing procedure,, then continue the operation testing procedure if not; Detect whether jump to the nominative testing instruction, if, then jump to said nominative testing instruction and execution, if not, then continue to carry out follow-up test instruction; And/or, detect and whether preserve the corresponding test data of current test instruction, if then preserve, if not, then do not preserve.

Concrete; " detecting the operation that whether suspends testing procedure " mainly is to see in the detecting information form shown in Fig. 2 to be character " B " or other characters or character string except that character " B " on current test instruction pairing " the whether suspending " field; If character " B " then expression need to suspend; If all being judged to be, other characters except that character " B " or character string do not need to suspend; In other embodiments; Can certainly use other characters or string representation except that " B " to need to suspend, with what character representation need suspend does not influence realization of the present invention, so just do not make particular determination to what character representation suspending in embodiments of the present invention.

Same; Whether " detect jump to nominative testing instruction " mainly is to see the character on current test instruction pairing " through the redirect " field and " failure redirect " field in the detecting information form shown in Fig. 2; Wherein, After " through redirect " was meant that test instruction finishes, the test instruction that system jumps to appointment on " through redirect " field automatically continued to carry out, after " failure redirect " is meant that failure is carried out in test instruction; The test instruction that system jumps to appointment on " failure redirect " field automatically continues to carry out; The flow process that " through redirect " and " failure redirect " formed between the test instruction turns to, if these two fields are empty in the detecting information form, then order is carried out follow-up test instruction.

Same; " detecting and whether preserve the corresponding test data of current test instruction " mainly is to see in the detecting information form shown in Fig. 2 to be character " S " or other characters or character string except that character " S " on current test instruction pairing " result's preservation " field; If character " S " is then represented to preserve; System is that " S " then can preserve test data automatically detecting this " result's preservation " field place, if other characters except that character " S " or character string are then represented not carry out preserving.In other embodiments; Can certainly use other characters or string representation except that " S " to preserve; Need preserve with what character representation does not influence realization of the present invention, so just do not make particular determination to what character representation preserving in embodiments of the present invention.

Step S103: judge whether each the bar test data that is obtained meets corresponding separately normal data scope, if, then get into step S104, if arbitrary test data do not meet corresponding normal data, then get into step S105.

Concrete, if detecting information is stored in the detecting information form, so can be through judging that whether test data is more than or equal to the lower limit of normal data and the upper limit that is less than or equal to normal data; If; Then get into step S104, if not, then get into step S105.

In the present embodiment, before step S103, can also comprise: judge numerical value kind with the corresponding test result of each bar test instruction; Numerical value in the corresponding test result of a certain test instruction is under the situation of decimal; The numerical value of said test result multiply by 10 integral multiple to convert integer to; And integer conduct after will changing and the corresponding test data of said a certain test instruction; With the number of the corresponding test result of arbitrary test instruction greater than 1 situation under, calculate the mean value of each test result, and with the test data of said mean value as said arbitrary test instruction.

Concrete, this step mainly is in order test result to be handled, to be obtained being convenient to the numerical value that machine is compared with the normal data scope; Processing operation to test result in different application is different, for example: if the carrying load ability of test electronic product docks loaded electronic product and tests acquisition test result 1; Again the same electronic product that does not connect load is tested and obtained test result 2; The processing operation of this moment can be for getting the absolute value of test result 1 and test result 2 differences, and with this absolute value as test data, if the absolute values of test result 1 and test result 2 differences are decimal; Then this numerical value multiply by 10 integral multiple to convert integer to; And with the integer that changes into as with test data, the test result that certain a certain test instruction obtains after execution is exactly an integer, so can be directly with this integer as the corresponding test data of this test instruction; Certainly in different practical applications, also can he operate in the basic enterprising Xingqi of integer.

Step S104: the test of judging electronic product is passed through.

Step S105: the test of judging electronic product is not passed through.

In the present embodiment, after step S104 or step S105, can also comprise: receive the sign of next electronic product, and obtain corresponding detecting information according to the sign of next electronic product; Or, withdraw from test after receiving the request withdraw from said electronic product test.

Concrete; After executing all test instructions; Can obtain final test result, finish the test of whole electronic product then, if only need detect when whether a certain functional module meets the requirements in the tested electronic product certainly; Also can only carry out the test instruction relevant, finish whole test then with this functional module.After the test that finishes whole electronic product, can get into waiting status, wait for the sign that receives next electronic product; Test then, or withdraw from the electronic product test after withdrawing from test receiving, for example; Can be after the test man presses " withdrawing from test " button, to withdraw from whole test.

The method of testing of the disclosed this electronic product of the embodiment of the invention is compared with conventional test methodologies, because each bar test instruction independent operating separately all, if mistake has appearred in a certain test instruction; So just being easy to detect is that mistake has appearred in which bar test instruction, can directly make amendment to this test instruction, has improved the maintainability of software; For different tested electronic products, only need to load corresponding detecting information and get final product, do not need program is done any change; Similarly, change and when needing the change test parameter, also only need the corresponding parameter in the change detecting information when the parameter of electronic product; And need not change program code, for example: if tested electronic product is control three-phase alternating current sensor and frequency converter, and these two instruments all are the communication modules with the Mod-bus agreement; Just parameters such as address, function code are different; When these two instruments of operation, need not revise the corresponding program code of test instruction like this, only need to revise corresponding parameters and get final product; The code of whole measuring method for testing is few like this, does not have the code of same redundant.And it is need not research and develop various test and just can accomplish whole test process, and simple and practical.

Describe method in detail among the disclosed embodiment of the invention described above, can adopt the proving installation of various ways to realize, therefore the invention also discloses a kind of proving installation, provide concrete embodiment below and be elaborated for method of the present invention.

See also Fig. 3; Structural representation for the disclosed electronic product proving installation of the embodiment of the invention; This electronic product proving installation can comprise: read identification module 301, detecting information acquisition module 302, test data acquisition module 303 and judge module 304, wherein:

Read identification module 301, be used to read the sign of tested electronic product.

Concrete, read identification module 301 and can be scanner, the sign of electronic product can be the bar code of this electronic product, can utilize the sign of method electron gain product of the bar code of scanner scanning electronic product.

Detecting information acquisition module 302 is used for the said sign obtained according to said read module, obtains the detecting information corresponding with this sign.

Concrete; After the sign of electron gain product, can basis identify corresponding path with this, for example: ... catalogue; Obtain the detecting information of this electronic product; Wherein, the electronic product of same model can be used same detecting information, and the sign of electronic product is corresponding with the detecting information of this model electronic product.Detecting information comprises: at least one be used to test the specific function of said electronic product test instruction, with the corresponding normal data scope of each bar test instruction and operation and each bar test instruction corresponding programs code parameters needed.Wherein, Test instruction is corresponding with program code, and test instruction can be used as the order that triggers corresponding program code operation, just after certain test instruction is performed; Can trigger operation with this test instruction corresponding programs code; Corresponding the choosing of program code of each test instruction must be correct when testing, otherwise electronic product can not get corresponding test data after testing according to the program code of mistake.

Test data acquisition module 303 is used to move each bar test instruction, and load relevant parameters to each bar test instruction corresponding programs code in, obtain and the corresponding test data of each bar test instruction.

Preferably; Each bar test instruction is separate; Parameter in the test instruction comprises that functional module chooses parameter and test parameter; It is the foundation that is used for choosing certain functional module of tested electronic product needs test that functional module is chosen parameter, and test parameter is the numerical value that each functional module needs when test in the tested electronic product, and test data acquisition module 303 specifically comprises:

The first operation unit 3031; Be used under the situation that current test instruction need be carried out; Move current test instruction, and loading and the corresponding functional module of current test instruction choose in parameter to the corresponding programs code, choose certain functional module that needs test in the tested electronic product;

The second operation unit 3032 is used for after the first operation unit is finished, and loading and the corresponding test parameter of current test instruction obtain and the corresponding test data of current test instruction to certain functional module;

Acquiring unit 3033 is used for after the second operation unit is finished, obtaining corresponding test data.

Test data acquisition module 303 can also comprise: processing unit 3034; Be used to judge numerical value kind with the corresponding test result of each bar test instruction; Numerical value in the corresponding test result of a certain test instruction is under the situation of decimal; Then the numerical value of test result multiply by 10 integral multiple converting integer to, and the integer after will changing is as the corresponding test data of this test instruction, the number of the corresponding test result of arbitrary test instruction greater than 1 situation under; Calculate the mean value of each test result, and with the test data of mean value as this test instruction.

Concrete; Processing operation to test result in different application is different, for example: if the carrying load ability of test electronic product docks loaded electronic product and tests acquisition test result 1; Again the same electronic product that does not connect load is tested and obtained test result 2; The processing operation of this moment can be for getting the absolute value of test result 1 and test result 2 differences, and with this absolute value as test data, if the absolute values of test result 1 and test result 2 differences are decimal; Then this numerical value multiply by 10 integral multiple to convert integer to; And with the integer that changes into as with test data, the test result that certain a certain test instruction obtains after execution is exactly an integer, so can be directly with this integer as the corresponding test data of this test instruction; Certainly in different practical applications, also can he operate in the basic enterprising Xingqi of integer.

Judge module 304; Be used to judge whether each the bar test data that is obtained meets corresponding separately normal data scope; Each bar test data being obtained all meets under the situation of corresponding separately normal data scope; The test of judgement electronic product is passed through, and does not meet arbitrary test data under the situation of corresponding normal data scope, judges that the test of electronic product is not passed through.

The electronic product proving installation can also comprise: parameter modification module 305 is used for after receiving the order that the operation program code parameters needed relevant with each bar test instruction made amendment, according to the order that receives relevant parameters being made amendment.

Concrete, each bar test instruction is separate.Each bar test instruction all is an independent operating separately, if mistake has appearred in a certain the corresponding program code of test instruction, just detecting easily is that mistake appears in the corresponding program code of which bar test instruction; Can directly make amendment to the corresponding program code of this test instruction; Improved the maintainability of software,, only needed to load corresponding detecting information and get final product for different tested electronic products; Do not need program is done any change; Similarly, change and when needing the change detecting information, also only need corresponding parameters in the change detecting information when the parameter of electronic product; And need not change program code, improved the maintainability and the operability of software.

This electronic product proving installation can also comprise: suspend module 306; Be used for after executing current testing procedure; Detect the operation whether suspend testing procedure, if then suspend operation and demonstration and the corresponding test data of said current test instruction and the corresponding normal data scope of testing procedure; If, then do not continue the follow-up testing procedure of operation.Concrete; Mainly be to see in the detecting information form shown in Fig. 2 to be character " B " or other characters or character string except that character " B " on current test instruction pairing " the whether suspending " field; If character " B " then expression need to suspend; Do not need to suspend if other characters except that character " B " or character string all are judged to be, in other embodiments, can certainly use other characters or string representation except that " B " to need to suspend; Need suspend with what character representation does not influence realization of the present invention, so just do not make particular determination to what character representation suspending in embodiments of the present invention.

This electronic product proving installation can also comprise: redirect module 307, and be used for detection and whether jump to the nominative testing instruction, if, then jump to said nominative testing instruction and execution, if not, then follow-up test instruction is carried out in continuation.Concrete; Mainly be to see the character on current test instruction pairing " through the redirect " field and " failure redirect " field in the detecting information form shown in Fig. 2, wherein, after " through redirect " is meant that test instruction finishes; The test instruction that system jumps to appointment on " through redirect " field automatically continues to carry out; After " failure redirect " was meant that failure is carried out in test instruction, the test instruction that system jumps to appointment on " failure redirect " field automatically continued to carry out, and the flow process that " through redirect " and " failure redirect " formed between the test instruction turns to; If these two fields are empty in the detecting information form, then order is carried out follow-up test instruction;

And/or memory module 308 is used to detect and whether preserves the corresponding test data of current test instruction, if then preserve, if not, then do not preserve.Concrete; Mainly be to see in the detecting information form shown in Fig. 2 to be character " S " or other characters or character string except that character " S " on current test instruction pairing " result's preservation " field; If character " S " is then represented to preserve; System is that " S " then can preserve test data automatically detecting this " result's preservation " field place, if other characters except that character " S " or character string are then represented not carry out preserving.In other embodiments; Can certainly use other characters or string representation except that " S " to preserve; Need preserve with what character representation does not influence realization of the present invention, so just do not make particular determination to what character representation preserving in embodiments of the present invention.

This electronic product proving installation can also comprise: trigger module 309 is used for after the test that obtains said electronic product is through the result who does not perhaps pass through, triggering the said sign that identification module 301 reads next electronic product that reads; Or, withdraw from test module 310, withdraw from test after being used to receive the request of withdrawing from the test of said electronic product.

The electronic product proving installation can also comprise: detect execution module 311; Whether need carry out, if not, then skip said current test instruction and continue to judge whether next bar test instruction needs to carry out if being used to detect current test instruction; If then trigger test data acquisition module 303.

The disclosed electronic product proving installation of the embodiment of the invention is compared with the traditional test device, because each bar test instruction independent operating separately all, if mistake has appearred in a certain test instruction; So just being easy to detect is that mistake has appearred in which bar test instruction, can directly make amendment to this test instruction, has improved the maintainability of software; For different tested electronic products, only need to load corresponding detecting information and get final product, do not need program is done any change; Similarly, change and when needing the change test parameter, also only need the corresponding parameter in the change detecting information when the parameter of electronic product; And need not change program code, for example: if tested electronic product is control three-phase alternating current sensor and frequency converter, and these two instruments all are the communication modules with the Mod-bus agreement; Be the address, parameters such as function code are different, like this when these two instruments of operation; Need not revise the corresponding program code of test instruction; Only need to revise corresponding parameters and get final product, the code of whole measuring method for testing is few like this, does not have the code of same redundant.And need not research and develop multiple proving installation, self just can accomplish whole test process the proving installation of the disclosed electronic product of the embodiment of the invention, and simple and practical.

See also Fig. 4, be the structural representation of the test macro of the disclosed electronic product of the embodiment of the invention, this test macro can comprise scanner 401, host computer 402, relay switch control box 403 and test data acquisition module 303, wherein:

Scanner 401 links to each other with host computer 402; Host computer 402 links to each other with relay switch control box 403 through input/output interface; Host computer 402 links to each other with test data acquisition module 303 and electronic product 404 respectively through serial ports, and electronic product 404 links to each other with test data acquisition module 303 and relay switch control box 403 respectively;

Wherein detailed principle of work is following:

Host computer 402 obtains detecting information according to the sign of scanner 401 scanning electron products 404.

Host computer 402 loads with the corresponding functional module of test instruction a and chooses in parameter to the corresponding programs code when operation test instruction a, produces control command.

Relay switch control box 403 is selected the corresponding functional modules in the electronic product 404 according to received control command; Host computer 402 will be sent in the corresponding functional modules with the corresponding test parameter pass test data of test instruction a acquisition module 303; Obtain and the corresponding test data of test instruction a; Test data acquisition module 303 obtains the corresponding test data with test instruction a from electronic product 404; And this test data is sent to host computer 402, host computer 402 compares said test data and corresponding standard data area to obtain the result that whether test is passed through to corresponding functional modules.

Wherein, Said detecting information comprise at least one be used to test the specific function of said electronic product test instruction, with the corresponding normal data scope of each bar test instruction and operation and said each bar test instruction corresponding programs code parameters needed; Said parameter comprises that functional module chooses parameter and test parameter; It is the foundation that is used for choosing certain functional module of tested electronic product needs test that said functional module is chosen parameter, and said test parameter is the numerical value that each functional module needs when test in the said tested electronic product.

With after electronic product 404 is connected, the electronic product test macro at first carries out initialization (for example relay switch control box 403 etc.) to each instrument of self inside at the electronic product test macro.After finishing, initialization waits for the sign of scanner 401 scanning electron products.This step only need be opened the back execution at the electronic product test macro and once got final product; After an electronic product test finishes; When test another one electronic product, need not carry out this step,, also can behind electronic product of every test, carry out once certainly according to different situation.

The electronic product test macro can also comprise: display 405 is used to show the result whether functional module test that host computer 402 obtains is passed through.Just the test of judgement corresponding functional modules is passed through when this test data drops on the corresponding standard data area; And judge that when this test data does not drop on the corresponding standard data area corresponding functional modules test do not pass through, and the result who whether passes through by display 405 Presentation Function module testings.

In the present embodiment; Host computer 402 stores the detecting information of the electronic product 404 of multiple different model and since detecting information be under the sign with electronic product 404 model one to one, therefore; Scan the sign of electronic product 404 when scanner 401 after; Host computer 402 just can obtain corresponding detecting information according to this sign, and it is to be tested that host computer 402 is at first chosen which functional module needs that parameter determines in the electronic product according to functional module, more corresponding test parameter is sent to this functional module; After this functional module is tested; Host computer 402 is obtaining test data from electronic product 404, and test data and corresponding standard data are compared, and draws whether satisfactory result of this functional module.

This electronic product test macro that present embodiment provided is when testing the electronic product of the different series of same electronic product or different model, and only need make amendment to corresponding detecting information gets final product.Further, owing to need not revise hardware, only need make amendment to detecting information; Thereby need not research and develop multiple test circuit, simplify hardware circuit, provide cost savings; Accomplish the application of various test event robotizations through Efficient and Flexible software; Reliability is high, flexible design, and then realize high efficiency test.

For those skilled in the art better understand the disclosed electronic product test macro of the embodiment of the invention, below with the detailed flow process of electronic product test macro when the test electronic product 404 of introducing.

See also Fig. 5, utilize the process flow diagram of electronic product test system and test electronic product for the embodiment of the invention is disclosed.

Step S501: initiation parameter.

With after electronic product 404 is connected, the electronic product test macro at first carries out initialization (for example relay switch control box 403 etc.) to each instrument of self inside at the electronic product test macro.After finishing, initialization waits for the sign of operator's scanning electron product 404.

Step S502: the sign of waiting for the electronic product 404 that receives scanner 401 scannings.

Step S503: after the sign that receives electronic product 404, obtain the detecting information corresponding with this sign.

Step S504: carry out current test instruction.

The electronic product test macro once can be carried out a test instruction, if detecting information is stored in the detecting information table, can carry out successively according to the sequence number (being the testing procedure in Fig. 2 table) of test instruction.

Step S505: after current test instruction is finished, judge whether to finish the test of this electronic product, if then get into step S506, if not, then return step S504.

Certain electronic product is tested, can the test instruction that all are relevant with this electronic product all be carried out, also can an operating part test instruction.

Step S506: judge whether to finish test assignment, if then get into step S508, if not, then get into step S507.

If want to test 6 electronic products; Test assignment is tested 6 electronic products exactly so, that is to say that the test of current electronic product finishes after, detect and whether continue to test next electronic product; If detected 6 electronic products; Test assignment just is through with so, if do not detected 6 electronic products, so just continues to detect next electronic product.

Step S507: judge whether to receive the sign of next electronic product, if then return step S502, if not, then get into step S508.

Step S508: withdraw from test.

After the electronic product test finished, the electronic product test macro can get into waiting status, and was as shown in Figure 6, for the disclosed electronic product test macro of the embodiment of the invention gets into the synoptic diagram of waiting status.It is undesirable as can be seen from Figure 6 going up an electronic product of testing, thus show " product is bad ", after the test of a last electronic product finishes; The electronic product test macro is in waiting status; The input of waiting for next electronic product sign i.e. " bar code input ", if there is this moment the sign of electronic product to import, then the electronic product test macro receives after " OK " button clicked; Will get into the follow-up test step; The button that also has " withdrawing from test " among Fig. 6 if the electronic product test macro receives after this button clicked, will withdraw from test.

In the application of reality; Because the difference of application scenarios; The particular hardware form of expression of test data acquisition module 303 also maybe be different; In the test macro of frequency converter, with test data acquisition module 303 corresponding hardware be: multimeter, RS-232 change RS-485 module, three-phase alternating current sensor, below will give an example in practical application, utilize this electronic product test system and test frequency converter instance to show explanation.

See also Fig. 7, utilize a kind of test system structure synoptic diagram of electronic product test system and test frequency converter for the embodiment of the invention is disclosed, this system can comprise:

Scanner 401, relay switch control box 403, multimeter 701, RS-232 change RS-485 module 702, three-phase alternating current sensor 703, host computer 402 and display 405; Wherein: host computer 402 stores detecting information; Detecting information comprises: the test instruction of at least one test electronic product, move the parameter of needs with corresponding normal data scope of each bar test instruction and the program code relevant with each bar test instruction, wherein:

Scanner 401 and display 405 link to each other with host computer 402; Host computer 402 links to each other with relay switch control box 403 through input/output interface (I/O mouth), and relay switch control box 403 links to each other with frequency converter 704 and multimeter 701 respectively; Host computer 402 through general purpose interface bus (General-PurposeInterface Bus, GPIB) card links to each other with multimeter 701; Host computer 402 changes RS-485 module 702 through serial ports with RS-232 and links to each other, and RS-232 changes RS-485 module 702 and links to each other with frequency converter 704 and three-phase alternating current sensor 703 respectively, and three-phase alternating current sensor 703 links to each other with frequency converter 704.

Wherein detailed principle of work is following:

The sign of the frequency converter 704 that host computer 402 scans according to scanner 401; Obtain the detecting information of frequency converter 704, and choose parameter according to functional module and select a certain functional module that needs are tested in the frequency converter 704 through input/output interface pilot relay switch control box 403.

The process of describing among detailed process and Fig. 4 is the same.

The test parameter that host computer 402 needs a certain functional module test changes RS-485 module 702 through serial ports and RS-232 and sends to frequency converter 704; After a certain functional module is tested according to corresponding test parameter; Produce test data; Host computer 402 obtains this test data, perhaps obtains this test data through RS-232 commentaries on classics RS-485 module 702 through multimeter 701 from relay switch control box 403; Also or through three-phase alternating current sensor 703 and RS-232 commentaries on classics RS-485 module 702 obtain this test data; The said test data that host computer 402 will obtain is compared with the corresponding standard data area, obtains whether satisfactory result of a certain functional module, and in display 405, shows this result.

Host computer 402 can also be before comparing test data and corresponding standard data area; Test data is handled according to pre-defined rule; Accordingly; Test data and corresponding standard data area after host computer 402 will be handled compare, and whether a certain functional module in the electron gain product satisfactory result.

Adopt the disclosed system of the embodiment of the invention, need not research and develop multiple test circuit, simplified hardware circuit; Provide cost savings, accomplish the application of various test event robotizations through Efficient and Flexible software, reliability is high; Flexible design, and then realize high efficiency test.

The disclosed electronic product method of testing of the foregoing description, Apparatus and system can be based on the virtual instrument test platform of LabVIEW and the electronic product method of testing, the Apparatus and system that design; Can control the test point position of electronic product automatically; Just detect automatically in the different functional module to be tested of electronic product each item performance index to this electronic product; This test platform can be realized fecund article, polytypic test; Be an open test macro, have very strong upgrading extended capability.

Moreover, the disclosed electronic product method of testing of the embodiment of the invention, Apparatus and system need not researched and not developed multiple test circuit; Simplified hardware circuit; Provide cost savings, accomplish the application of various test event robotizations through Efficient and Flexible software, reliability is high; Flexible design, and then realize high efficiency test.

For the disclosed electronic product proving installation of embodiment, because it is corresponding with the disclosed electronic product method of testing of embodiment, so description is fairly simple, relevant part gets final product referring to the explanation of electronic product Test Methods section in this instructions.

Also need to prove in this manual; Relational terms such as first and second grades only is used for an entity or operation are made a distinction with another entity or operation, and not necessarily requires or hint relation or the order that has any this reality between these entities or the operation.And; Term " comprises ", " comprising " or its any other variant are intended to contain comprising of nonexcludability; Thereby make and comprise that process, method, article or the equipment of a series of key elements not only comprise those key elements; But also comprise other key elements of clearly not listing, or also be included as this process, method, article or equipment intrinsic key element.Under the situation that do not having much more more restrictions, the key element that limits by statement " comprising ... ", and be not precluded within process, method, article or the equipment that comprises said key element and also have other identical element.

The method of describing in conjunction with embodiment disclosed herein or the step of algorithm can be directly with the software modules of hardware, processor execution, and perhaps the combination of the two is implemented.Software module can place the storage medium of any other form known in random access memory (RAM), internal memory, ROM (read-only memory) (ROM), electrically programmable ROM, electrically erasable ROM, register, hard disk, moveable magnetic disc, CD-ROM or the technical field.

To the above-mentioned explanation of the disclosed embodiments, make this area professional and technical personnel can realize or use the present invention.Multiple modification to these embodiment will be conspicuous concerning those skilled in the art, and defined General Principle can realize under the situation that does not break away from the spirit or scope of the present invention in other embodiments among this paper.Therefore, the present invention will can not be restricted to these embodiment shown in this paper, but will meet and principle disclosed herein and features of novelty the wideest corresponding to scope.

Claims

1. the method for testing of an electronic product is characterized in that, said method of testing comprises:

Sign according to said electronic product is obtained detecting information; Wherein, said detecting information comprise at least one be used to test the specific function of said electronic product test instruction, with the corresponding normal data scope of each bar test instruction and operation and said each bar test instruction corresponding programs code parameters needed;

Move said each bar test instruction, and load relevant parameters to said each bar test instruction corresponding programs code in, obtain and the corresponding test data of said each bar test instruction;

Judge whether each the bar test data that is obtained meets corresponding separately normal data scope;

Each bar test data being obtained all meets under the situation of corresponding separately normal data scope; Judge that the test of said electronic product passes through; Do not meet arbitrary test data under the situation of corresponding normal data scope, judge that the test of said electronic product is not passed through.

2. method of testing according to claim 1 is characterized in that, before the step of obtaining detecting information according to the sign of said electronic product, also comprises:

Reception to the order of making amendment of the operation program code parameters needed relevant with said each bar test instruction after, according to the said order that receives relevant parameters is made amendment.

3. method of testing according to claim 1; It is characterized in that; In said each the bar test instruction of operation; And load relevant parameters to said each bar test instruction corresponding programs code in, obtain also to comprise before with the step (being called steps A) of the corresponding test data of said each bar test instruction:

Whether need carry out, if not, then skip said current test instruction and continue to judge whether next bar test instruction needs to carry out, if then get into steps A if detecting current test instruction.

4. method of testing according to claim 1; It is characterized in that said each bar test instruction is separate, the parameter in the said test instruction comprises that functional module chooses parameter and test parameter; It is the foundation that is used for choosing certain functional module of tested electronic product needs test that said functional module is chosen parameter; Said test parameter is the numerical value that each functional module needs when test in the said tested electronic product, wherein, and in said each the bar test instruction of operation; And load relevant parameters to said each bar test instruction corresponding programs code in, specifically comprise in the step with the corresponding test data of said each bar test instruction obtaining:

Under the situation that current test instruction need be carried out; Move said current test instruction; And loading and the corresponding functional module of said current test instruction are chosen in parameter to the corresponding programs code; Choose in the tested electronic product certain functional module that needs test, reload with the corresponding test parameter of said current test instruction to said certain functional module in, obtain and the corresponding test data of said current test instruction.

5. method of testing according to claim 1 is characterized in that, is judging each the bar test data obtained also comprises before whether meeting the step of corresponding separately normal data scope:

Judge numerical value kind with the corresponding test result of said each bar test instruction;

Numerical value in the corresponding test result of a certain test instruction is under the situation of decimal; The numerical value of said test result multiply by 10 integral multiple to convert integer to; And integer conduct after will changing and the corresponding test data of said a certain test instruction; With the number of the corresponding test result of arbitrary test instruction greater than 1 situation under, calculate the mean value of each test result, and with the test data of said mean value as said arbitrary test instruction.

6. method of testing according to claim 1 is characterized in that, load relevant parameters to said each bar test instruction corresponding programs code in, also comprise after the step with the corresponding test data of said each bar test instruction obtaining:

Detect the operation that whether suspends testing procedure, if, then suspend operation and demonstration and the corresponding test data of current test instruction and the corresponding normal data scope of testing procedure, if deny, then continue the operation testing procedure;

Detect whether jump to the nominative testing instruction, if, then jump to said nominative testing instruction and execution, if not, then continue to carry out follow-up test instruction;

And/or,

Detect and whether preserve the corresponding test data of current test instruction, if then preserve, if not, then do not preserve.

7. method of testing according to claim 1 is characterized in that, after the test that obtains said electronic product was through the result who does not perhaps pass through, said method of testing also comprised:

Receive the sign of next electronic product, and obtain corresponding detecting information according to the sign of next electronic product;

Or,

Reception is withdrawed from test after withdrawing from the request of said electronic product test.

8. the proving installation of an electronic product is characterized in that, said proving installation comprises:

Read identification module, be used to read the sign of tested electronic product;

The detecting information acquisition module; Be used for reading the said sign that identification module reads according to said; Obtain the detecting information corresponding with this sign, said detecting information comprises: at least one be used to test the specific function of said electronic product test instruction, with the corresponding normal data scope of each bar test instruction and operation and said each bar test instruction corresponding programs code parameters needed;

The test data acquisition module is used to move said each bar test instruction, and load relevant parameters to each bar test instruction corresponding programs code in, obtain and the corresponding test data of said each bar test instruction;

Judge module; Be used to judge whether each the bar test data that is obtained meets corresponding separately normal data scope; Each bar test data being obtained all meets under the situation of corresponding separately normal data scope; Judge that the test of said electronic product passes through, and do not meet under the situation of corresponding normal data scope, judge that the test of said electronic product is not passed through arbitrary test data.

9. said according to Claim 8 proving installation is characterized in that said proving installation also comprises:

The parameter modification module is used for after receiving the order that the operation program code parameters needed relevant with said each bar test instruction made amendment, according to the said order that receives relevant parameters being made amendment.

10. said according to Claim 8 proving installation is characterized in that said proving installation also comprises:

Whether detect execution module, being used to detect current test instruction needs to carry out, if not, then skips said current test instruction and continues to judge whether next bar test instruction needs to carry out, if then trigger said test data acquisition module.

11. said according to Claim 8 proving installation; It is characterized in that; Said each bar test instruction is separate, and the parameter in the said test instruction comprises that functional module chooses parameter and test parameter, and it is the foundation that is used for choosing certain functional module of tested electronic product needs test that said functional module is chosen parameter; Said test parameter is the numerical value that each functional module needs when test in the said tested electronic product, and said test data acquisition module specifically comprises:

12. proving installation according to claim 8 is characterized in that, said test data acquisition module specifically also comprises:

Processing unit; Be used to judge numerical value kind with the corresponding test result of said each bar test instruction; Numerical value in the corresponding test result of a certain test instruction is under the situation of decimal; Then the numerical value of said test result multiply by 10 integral multiple converting integer to, and the integer after will changing is as the corresponding test data of said a certain test instruction, and the number of the corresponding test result of arbitrary test instruction greater than 1 situation under; Calculate the mean value of each test result, and with the test data of said mean value as said arbitrary test instruction.

13. proving installation according to claim 8 is characterized in that, said proving installation also comprises:

Suspend module; Be used for after executing current testing procedure; Detect the operation whether suspend testing procedure, if then suspend operation and demonstration and the corresponding test data of said current test instruction and the corresponding normal data scope of testing procedure; If, then do not continue the follow-up testing procedure of operation;

The redirect module is used for detection and whether jumps to the nominative testing instruction, if, then jump to said nominative testing instruction and execution, if not, then follow-up test instruction is carried out in continuation;

And/or,

Preserve module, be used to detect and whether preserve the corresponding test data of current test instruction, if then preserve, if not, then do not preserve.

14. proving installation according to claim 8 is characterized in that, said proving installation also comprises:

Trigger module is used for after the test that obtains said electronic product is through the result who does not perhaps pass through, triggering the said sign that identification module reads next electronic product that reads;

Or,

Withdraw from test module, withdraw from test after being used to receive the request of withdrawing from the test of said electronic product.

15. the test macro of an electronic product is characterized in that, comprises scanner, host computer, relay switch control box and test data acquisition module, wherein:

Said scanner links to each other with said host computer; Said host computer links to each other with said relay switch control box through input/output interface; Said host computer links to each other with said test data acquisition module and said electronic product respectively through serial ports, and said electronic product links to each other with said test data acquisition module and said relay switch control box respectively;

Said host computer obtains detecting information according to the sign of the said electronic product of said scanner scanning; Wherein, Said detecting information comprise at least one be used to test the specific function of said electronic product test instruction, with the corresponding normal data scope of each bar test instruction and operation and said each bar test instruction corresponding programs code parameters needed; Said parameter comprises that functional module chooses parameter and test parameter; It is the foundation that is used for choosing certain functional module of tested electronic product needs test that said functional module is chosen parameter, and said test parameter is the numerical value that each functional module needs when test in the said tested electronic product;

Said host computer loads with said a certain the corresponding functional module of test instruction and chooses in parameter to the corresponding programs code when a certain test instruction of operation, produces control command;

Said relay switch control box is selected the corresponding functional modules in the said electronic product according to received said control command; Said host computer will be sent in the corresponding functional modules through said test data acquisition module with said a certain the corresponding test parameter of test instruction; Obtain and the corresponding test data of said a certain test instruction; Said test data acquisition module obtains and said test data from said tested electronic product; And said test data is sent to said host computer, said host computer compares said test data and corresponding standard data area to obtain the result that whether test is passed through to corresponding functional modules.