CN107038118B - Universal processing method for testing different electronic equipment assemblies - Google Patents
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- CN107038118B CN107038118B CN201710192891.9A CN201710192891A CN107038118B CN 107038118 B CN107038118 B CN 107038118B CN 201710192891 A CN201710192891 A CN 201710192891A CN 107038118 B CN107038118 B CN 107038118B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3688—Test management for test execution, e.g. scheduling of test suites
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Abstract
The invention provides a universal processing method for testing different electronic equipment assemblies, which comprises the following steps: 1. establishing a protocol master file table, a sending variable slave list and a receiving variable slave list which are in one-to-one correspondence with different electronic equipment; 2. adding the protocol instruction into a protocol instruction acquisition strip of a corresponding protocol main file table according to the use specification of the electronic equipment; 3. decomposing the content to be sent into different sending variable names, sending variable remarks and default values according to the description, putting the sending variable remarks and the default values into sending variable acquisition bars of a sending variable slave list, and sequentially and serially connecting the corresponding default values into a sending command to be sent to the electronic equipment; 4. the electronic equipment returns data after receiving the sending command, and the protocol master file table analyzes and places the analyzed variable value into a receiving variable acquisition strip of the receiving variable slave list after receiving the data; 5. and verifying the test logic result of the electronic equipment according to the analyzed variable. The invention improves the compatibility and the rapidity of the test.
Description
Technical Field
The invention relates to the technical field of communication, in particular to a universal processing method for testing different electronic equipment assemblies.
Background
Electronic equipment and a testing method thereof are changing day by day, and corresponding software control and testing processes are changing rapidly. Generally, test software matched with hardware is specially customized only for specific equipment or a certain test flow, when the process flow is changed, the equipment is upgraded or the test flow is modified, the software is changed, the maintenance amount of the software is large, the labor is insufficient, the consumed time is large, and the production is influenced.
The traditional technology is that electronic equipment is used for testing, the electronic equipment refers to different equipment provided by different manufacturers, a communication method of the used electronic equipment is directly fixed in software in a whole testing software system, and a writing method can be customized only for the current test, namely, the electronic equipment is tested only by writing a specific testing software source code, so that when external electronic equipment is replaced, the software source code needs to be changed and can be used after debugging, the time consumption is high, the efficiency is difficult to ensure when the project progress is required, and meanwhile, when the whole testing process flow is changed, the source code of the software needs to be changed and can be used after debugging and verification, and great software engineer human resources are required to be input.
Disclosure of Invention
The technical problem to be solved by the present invention is to provide a universal processing method for testing different electronic devices, which can establish a universal protocol editing mode or rule, and interact with the electronic devices based on the mode, so that when the process flow of the electronic devices is changed, software does not need to be modified, and only scripts can be modified to meet different testing requirements, thereby reducing development cost.
The invention is realized by the following steps:
a universal processing method for testing different electronic equipment assemblies comprises the following steps:
and 5, finishing data interaction with all electronic equipment with serial port or Ethernet communication through each protocol instruction acquisition strip, the sending variable slave list and the receiving variable slave list in the protocol master file table, verifying a corresponding test logic result of the electronic equipment according to the variable analyzed from the corresponding receiving variable slave list in the test process of the electronic equipment, and storing the verification result on a server after all tests of the electronic equipment are finished.
Further, if the default value corresponding to the name of the transmission variable to be transmitted in step 3 is a fixed value, the default values are directly concatenated during transmission to form a complete transmission command; if the default value corresponding to the name of the sending variable to be sent is a variable value, initializing the default value, and then connecting the initialized default values in series to form a complete sending command.
Further, the operation content of the acquisition operation bar in the step 1 includes adding, newly adding copy, deleting, moving up and moving down, and the content of the attribute display bar includes a message ID, a message remark, a sending length, a receiving length, waiting time, a checksum, a segmentation type and a return value; the operation content of the sending operation column comprises adding, copying, adding, deleting, moving upwards, moving downwards, opening, sending and closing, and the content of the sending variable display column comprises a sending variable name, a sending variable remark and a default value; the operation content of the receiving operation column comprises adding, copying adding, deleting, moving up and moving down, and the content of the receiving variable display column comprises a receiving variable name, a receiving variable remark, a value type, a start bit, a bit length, a subscript, a separator and a read value.
The invention has the following advantages: the invention flexibly edits the protocol instruction through the electronic equipment so as to achieve comprehensive and uniform receiving and sending and carry out variable processing on the content of the protocol instruction; no matter how the electronic equipment for providing the test is replaced, the software source code can be directly processed and used under the condition of not changing the software source code, the problem that the system cannot be developed again for dealing with the problem that the communication cannot be carried out due to the replacement of the electronic equipment is avoided, and the compatibility and the rapidness of the test are improved in practical application.
Drawings
The invention will be further described with reference to the following examples with reference to the accompanying drawings.
FIG. 1 is a flow chart of a general processing method for testing different electronic device assemblies according to the present invention.
FIG. 2 is a diagram illustrating the operation of a general process for testing different electronic device assemblies according to the present invention.
FIG. 3 is a second illustration of the operation of a general processing method for testing different electronic device assemblies according to the present invention.
FIG. 4 is a third illustration of the operation of a general processing method for testing different electronic device assemblies according to the present invention.
FIG. 5 is a fourth illustration of the operation of a general processing method for testing different electronic device assemblies according to the present invention.
FIG. 6 is a fifth illustration of the operation of a universal process for testing different electronic device assemblies according to the present invention.
FIG. 7 is a diagram illustrating the operation of a universal process for testing different electronic device assemblies according to a sixth aspect of the present invention.
FIG. 8 is a diagram illustrating a seventh exemplary embodiment of a method for testing electronic devices according to the present invention.
FIG. 9 is an illustration showing an operation of a general processing method for testing different electronic device assemblies according to an embodiment of the present invention.
FIG. 10 is a diagram illustrating the operation of a general processing method for testing different electronic device assemblies according to the present invention.
FIG. 11 is a diagram illustrating an operation of a universal process for testing different electronic device assemblies according to the present invention.
FIG. 12 is an illustration of an operational schematic of a general processing method for testing different electronic device assemblies according to an embodiment of the present invention.
Fig. 13 is an illustration showing an operation of a universal processing method for testing different electronic device assemblies according to the present invention.
FIG. 14 is a thirteen schematic diagram of the operation of a general processing method for testing different electronic device assemblies according to the present invention.
The reference numbers in the figures illustrate:
100-protocol master file list, 101-acquisition operation column, 102-attribute display column and 103-protocol command acquisition bar;
200-sending variable list, 201-sending operation column, 202-sending variable display column and 203-sending variable acquisition bar;
300-receive variables from list, 301-receive operations bar, 302-receive variables display bar, 303-receive variables collection bar.
Detailed Description
In order that the invention may be more readily understood, a preferred embodiment thereof will now be described in detail with reference to the accompanying drawings.
Referring to fig. 1, a general processing method for testing different electronic device assemblies according to the present invention includes the following steps:
a sending variable slave list 200 and a receiving variable slave list 300 are correspondingly arranged under each protocol instruction acquisition bar 103, a sending operation bar 201, a sending variable display bar 202 and a plurality of sending variable acquisition bars 203 which are correspondingly arranged under the sending variable display bar 202 are arranged in the sending variable slave list 200, the operation content of the sending operation bar 201 comprises adding, copying adding, deleting, moving up, moving down, opening, sending and closing, and the content of the sending variable display bar 202 comprises a sending variable name, a sending variable remark and a default value;
the receiving variable slave list 300 is internally provided with a receiving operation column 301, a receiving variable display column 302 and a plurality of receiving variable acquisition bars 303 correspondingly arranged below the receiving variable display column 302, the operation content of the receiving operation column 301 comprises adding, copying adding, deleting, moving up and moving down, and the content of the receiving variable display column 302 comprises a receiving variable name, a receiving variable remark, a value type, a start bit, a bit length, a subscript, a separator and a read value; the different protocol master file tables 100 are identified by unique ID codes;
taking a chrysanthemum water 9201 pressure resistance instrument (electronic device 1) as an example, a protocol main file table 100(1) is correspondingly established, according to the use specification of the relay, the content of the specification is converted into 10 corresponding protocol instructions, the corresponding protocol instructions are sequentially added into a protocol instruction acquisition bar 103(1) to a protocol instruction acquisition bar 103(10) in the protocol main file table 100(1), and according to the operation content of an acquisition operation column 101, corresponding operations of adding, copying, adding, deleting, moving up or moving down are performed, as shown in fig. 7 and 8;
the first embodiment is as follows:
as shown in fig. 7, the left side is a master table, the upper right side and the lower right side are two parallel slave tables, the left side is a protocol master file table 100(1), the upper right side is the specific content of the sending variable slave list 200(6) under the 6 th protocol instruction acquisition bar 103(6) in the protocol master file table 100(1), and the lower right side is the specific content of the variable slave list 200(6) under the 6 th protocol instruction acquisition bar 103(6) in the protocol master file table 100 (1);
because the contents of the protocol instruction can transmit different data and how the contents can provide different parameters in a variable manner, the contents to be transmitted by the protocol instruction are decomposed into different variables, and the variables are put into the transmission variable acquisition bars 203 in the corresponding transmission variable slave list 200;
in the 1 st transmission variable acquisition bar 203(1) in the list 200(6), the transmission variable is: setting a default value corresponding to the voltage prefix V as a fixed value D, namely TES; in the 2 nd transmission variable acquisition bar 203(2), the transmission variable: setting the default value corresponding to the voltage V as a variable value, and directly initializing to set the value of the voltage V to a value required in practical application, such as 1491; in the 3 rd transmission variable acquisition bar 203(3), the transmission variable: the default value corresponding to the current lower limit prefix V is a fixed value; d, LOW; and so on; if all the transmission variable acquisition strips are to be transmitted, the corresponding default values are directly connected in series in sequence to form a complete transmission command, and the transmission command is transmitted to the Jushu 9201 voltage withstanding instrument (electronic equipment 1), such as: TES 1491; LOW … …, the separator is a space character, and the separator can be other symbols; corresponding operations of adding, copying, adding, deleting, moving up, moving down, opening, sending or closing can be performed according to the operation content of the sending operation bar 201;
the pressure resistance instrument (electronic equipment 1) for the chrysanthemum water 9201 receives D, TES 1491; processing the data LOW … …, but not returning any data, because no data is returned, the data is null, and no meaning is provided in the actual use, so the editing can not be performed;
example two:
as shown in fig. 8, the left side is a master table, the upper right side and the lower right side are two parallel slave tables, the left side is a master document table 100(1), the upper right side is the specific content of the slave list 200(9) of the transmission variable under the 9 th protocol instruction acquisition bar 103(9) in the master document table 100(1), and the lower right side is the specific content of the slave list 200(9) of the variable under the 9 th protocol instruction acquisition bar 103(9) in the master document table 100 (1);
in the 9 th transmission variable acquisition bar 203(9) in the list 200(9), the transmission variable: the default value corresponding to the test data R is a fixed value RDATA, if the sending variable acquisition strip is to be sent, the RDATA is directly sent to the chrysanthemums 9201 pressure resistance instrument (electronic device 1), and corresponding operations of adding, copying, adding, deleting, moving up, moving down, opening, sending or closing can be performed according to the operation content of the sending operation column 201;
after receiving the data of RDATA, the Jushu 9201 pressure resistance instrument (electronic equipment 1) processes and returns the data: 1000, 10, wherein the two are separated in a "manner", and the data contents 1000 and 10 obtained after analysis respectively represent 1000V and 10M Ω, and the data are sequentially put into a receiving variable slave list 300(9) in a 9 th protocol instruction acquisition strip 103(9) in a protocol master file table 100 (1);
the receiving variables are collected from the 1 st receiving variable collection bar 303(1) in the list 300 (9): significant number R, variable remarks: insulation resistance test data, value type: string, start bit: -1, bit length: 0, subscript: 0, separator: e, reading the value: 1000, parts by weight; in the 2 nd receiving variable acquisition bar 303(2), the receiving variable: index R, variable remarks: insulation resistance test data, value type: string, start bit: -1, bit length: 0, subscript: 1, separator: e, reading the value: 10;
step 5, completing data interaction with all electronic devices with serial ports or Ethernet communication through the protocol instruction acquisition bars 103, the transmission variable slave list 200 and the reception variable slave list 300 in the protocol master file table 100, verifying corresponding test logic results of the electronic devices according to variables analyzed from the list 300 by the corresponding reception variables in the test process of the electronic devices, and storing required verification results on a server regardless of whether the verification results are correct after all tests of the electronic devices are finished so as to provide data analysis and follow-up at a later period, wherein the verification mode is to calculate by using a commonly used calculation formula which comprises commonly used mathematical functions; thus, for example: the protocol instruction acquisition strips 103, the sending variable slave list 200 and the receiving variable slave list 300 in the protocol master file table 100 form a corresponding complete set of protocol instructions, and data interaction with all electronic equipment with serial ports or Ethernet communication can be realized; all relevant content can be disclosed and can be directly modified according to the situation, and the source code of the software does not need to be modified.
The operation demonstration process of the invention is as follows:
1. inputting a user name and a password, and logging in a Pack Eo test system, as shown in FIG. 2;
2. a management, test and tool are arranged on an interface of the Pack Eo test system, and a BMS tool, a serial port tool and an Ethernet tool are arranged below the tool, as shown in FIG. 3;
3. clicking a serial port tool under the tool to enter a serial port editing tool interface, clicking design, adding, deleting, renaming and newly adding copy under the design, as shown in figure 4;
4. clicking 'add' under 'design' to enter name editing of the category, and clicking 'delete', 'rename' and 'duplicate add' to make corresponding operations, as shown in fig. 5;
5. entering a category scheme design box and inputting the name of a category, such as: chrysanthemum water 9201 pressure resistance instrument, as shown in FIG. 6;
6. entering a protocol main file table corresponding to the Ju Ye 9201 pressure resistance instrument, editing the content of a protocol instruction acquisition bar 103 in the protocol main file table 100 according to the use specification content of the Ju Ye 9201 pressure resistance instrument, transmitting the content of a variable acquisition bar 203 from a list 200 by transmitting variables, and receiving the content of a variable acquisition bar 303 from a list 300 by receiving variables, as shown in FIGS. 7 and 8;
7. clicking 'management' on an interface of the Pack Eo test system, and entering 'project scheme design'. As shown in fig. 9;
8. managing the corresponding content of the chrysanthemum water 9201 pressure resistance instrument as shown in figures 10 to 14.
The invention has the advantages that:
the invention flexibly edits the protocol instruction through the electronic equipment so as to achieve comprehensive and uniform receiving and sending and carry out variable processing on the content of the protocol instruction; no matter how the electronic equipment for providing the test is replaced, the software source code can be directly processed and used under the condition of not changing the software source code, the problem that the system cannot be developed again for dealing with the problem that the communication cannot be carried out due to the replacement of the electronic equipment is avoided, and the compatibility and the rapidity of the test are improved in practical application. The invention aims at any electronic equipment with communication interaction, and can form the test in the same mode even if different test flows and different test instructions are adopted, and the personnel using the object can test by themselves without having professional programming skill requirements.
Although specific embodiments of the invention have been described above, it will be understood by those skilled in the art that the specific embodiments described are illustrative only and are not limiting upon the scope of the invention, and that equivalent modifications and variations can be made by those skilled in the art without departing from the spirit of the invention, which is to be limited only by the appended claims.
Claims (3)
1. A general processing method for testing different electronic equipment assemblies is characterized in that: the method comprises the following steps:
step 1, establishing protocol main file tables corresponding to different electronic devices one by one, wherein each protocol main file table is internally provided with an acquisition operation column, an attribute display column and a plurality of protocol instruction acquisition bars correspondingly arranged below the attribute display column; a sending variable slave list and a receiving variable slave list are correspondingly arranged under each protocol instruction acquisition bar, and a sending operation bar, a sending variable display bar and a plurality of sending variable acquisition bars correspondingly arranged under the sending variable display bar are arranged in the sending variable slave list; the receiving variable slave list is internally provided with a receiving operation bar, a receiving variable display bar and a plurality of receiving variable acquisition bars correspondingly arranged below the receiving variable display bar; different protocol main file tables are identified by unique ID codes;
step 2, editing the specific content of the corresponding protocol main file table according to the unique ID code, converting the content of each application specification into a plurality of corresponding protocol instructions according to the application specifications provided by different electronic equipment, and sequentially adding the corresponding protocol instructions to the protocol instruction acquisition bars in the corresponding protocol main file table according to the acquisition operation column and the attribute display column;
step 3, according to the instruction manual, the content to be sent to the corresponding electronic equipment is decomposed into different sending variable names, sending variable remarks and default values, the sending variable remarks and the default values are placed into the sending variable acquisition bars in the corresponding sending variable list according to the sending operation column and the sending variable display column, the default values corresponding to the sending variable names to be sent are directly and sequentially connected in series, the two default values are separated through a separator, a complete sending command is combined, and the sending command is sent to the corresponding electronic equipment for testing;
step 4, after receiving and processing the sending command, the electronic equipment returns corresponding data to a corresponding protocol master file table, and after receiving the data, the protocol master file table analyzes the data and puts the analyzed variable values into corresponding receiving variable acquisition bars in a receiving variable slave list according to the receiving operation bar and the receiving variable display bar in the receiving variable slave list;
and 5, finishing data interaction with all electronic equipment with serial port or Ethernet communication through each protocol instruction acquisition strip, the sending variable slave list and the receiving variable slave list in the protocol master file table, verifying a corresponding test logic result of the electronic equipment according to the variable analyzed from the corresponding receiving variable slave list in the test process of the electronic equipment, and storing the verification result on a server after all tests of the electronic equipment are finished.
2. The universal process method for testing different electronic device assemblies according to claim 1, wherein: if the default value corresponding to the sending variable name to be sent in the step 3 is a fixed value, the default values are directly connected in series during sending to form a complete sending command; if the default value corresponding to the name of the sending variable to be sent is a variable value, initializing the default value, and then connecting the initialized default values in series to form a complete sending command.
3. The universal process method for testing different electronic device assemblies according to claim 1, wherein: the operation content of the acquisition operation bar in the step 1 comprises adding, copying, adding, deleting, moving up and moving down, and the content of the attribute display bar comprises a message ID, a message remark, a sending length, a receiving length, waiting time, a checksum, a segmentation type and a return value; the operation content of the sending operation column comprises adding, copying, adding, deleting, moving upwards, moving downwards, opening, sending and closing, and the content of the sending variable display column comprises a sending variable name, a sending variable remark and a default value; the operation content of the receiving operation column comprises adding, copying, adding, deleting, moving up and moving down, and the content of the receiving variable display column comprises a receiving variable name, a receiving variable remark, a value type, a start bit, a bit length, a subscript, a separator and a read value.
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| CN108375726B (en) * | 2018-01-31 | 2021-05-11 | 佛山市联动科技实业有限公司 | FPGA-based parameter table testing method |
| CN109634681B (en) * | 2018-11-15 | 2021-08-27 | 福建星云电子股份有限公司 | Method and device for uploading data to manufacturing execution system |
| CN110263082B (en) * | 2019-05-27 | 2022-04-29 | 东软集团股份有限公司 | Data distribution analysis method and device of database, electronic equipment and storage medium |
| CN110557377B (en) * | 2019-08-01 | 2021-08-27 | 福建星云电子股份有限公司 | Method and system for power battery pairing repair equipment to be compatible with multiple communication protocols |
| CN110825617B (en) * | 2019-09-27 | 2023-09-08 | 福建星云电子股份有限公司 | Method and device for simulating communication interaction between devices |
| CN110833996B (en) * | 2019-09-27 | 2021-09-21 | 福建星云电子股份有限公司 | One-stop full-automatic BMS intelligent test system |
| CN114637271B (en) * | 2022-03-16 | 2024-03-15 | 天津津航计算技术研究所 | Testing tool applied to production-drive alignment of interlocking system |
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| CN102636704A (en) * | 2012-03-05 | 2012-08-15 | 深圳市英威腾电气股份有限公司 | Testing method, device and system for electronic product |
| CN106407066A (en) * | 2016-09-26 | 2017-02-15 | 北京经纬恒润科技有限公司 | An end of line detection method and system for electronic products |
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| CN102636704A (en) * | 2012-03-05 | 2012-08-15 | 深圳市英威腾电气股份有限公司 | Testing method, device and system for electronic product |
| CN106407066A (en) * | 2016-09-26 | 2017-02-15 | 北京经纬恒润科技有限公司 | An end of line detection method and system for electronic products |
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