CN114398270A - Sample testing system and method for electronic product - Google Patents

Sample testing system and method for electronic product Download PDF

Info

Publication number
CN114398270A
CN114398270A CN202111655964.6A CN202111655964A CN114398270A CN 114398270 A CN114398270 A CN 114398270A CN 202111655964 A CN202111655964 A CN 202111655964A CN 114398270 A CN114398270 A CN 114398270A
Authority
CN
China
Prior art keywords
test
information
end module
module
sends
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202111655964.6A
Other languages
Chinese (zh)
Inventor
陈智鹏
伍浩淼
杨松昊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guangdong Seneasy Intelligent Technology Co ltd
Original Assignee
Guangdong Seneasy Intelligent Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Guangdong Seneasy Intelligent Technology Co ltd filed Critical Guangdong Seneasy Intelligent Technology Co ltd
Priority to CN202111655964.6A priority Critical patent/CN114398270A/en
Publication of CN114398270A publication Critical patent/CN114398270A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G06F11/3684—Test management for test design, e.g. generating new test cases
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G06F11/3688—Test management for test execution, e.g. scheduling of test suites
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G06F11/3692—Test management for test results analysis

Abstract

The invention discloses a sample test system and a test method of an electronic product, when a sample is required to be tested, a PC test end module is electrically connected with the tested product; the PC test end module sends required test file information and reference data information to the control end module; the control end module acquires test file information through the FTP server and sends the test file information to the PC test end module; the control end module acquires reference data information through the database module and sends the reference data information to the PC test end module; the PC test end module tests the tested product according to the test file information and obtains test data information; the PC test end module compares the reference data information with the test data information and sends the comparison result information to the control end module; the control end module sends the comparison result information to the database module for storage, the whole test process is automatically completed, and the accuracy of the test result is improved.

Description

Sample testing system and method for electronic product
Technical Field
The invention relates to the technical field of sample management of electronic products, in particular to a sample testing system and a testing method of an electronic product.
Background
With the continuous development of electronic products, more and more electronic products enter the production and life of people, so that the demand of the electronic products is larger and larger. The general manufacturers can carry out test production before producing new products, the samples are tested after producing small batches of samples, and the samples are improved or repaired after finding out the problems of the products, so that the products are produced in large batches after having no problems.
However, in the sample detection of the current products, some detection devices are often manually used for detection, so that the detection efficiency is low, the labor cost is increased, and sometimes, the detection result is inaccurate due to misoperation of detection personnel.
Disclosure of Invention
Therefore, there is a need for a system and a method for testing samples of electronic products, which can automatically test samples of various electronic products.
A sample testing system of an electronic product comprises a PC testing end module, a control end module, a database module, an FTP server and a client side, wherein the control end module carries out interactive transmission of data with the PC testing end module, the database module, the FTP server and the client side respectively.
In one embodiment, the client includes a WEB side and a mobile side, and the WEB side and the mobile side perform interactive transmission of data with the control side module respectively.
A testing method of a sample testing system of an electronic product,
s1, electrically connecting the PC test end module with the tested product;
s2, the PC test end module sends the required test file information and the reference data information to the control end module;
s3, the control end module acquires the test file information through the FTP server and sends the test file information to the PC test end module;
s4, the control end module acquires the reference data information through the database module and sends the reference data information to the PC test end module;
s5, the PC test end module tests the tested product according to the test file information and obtains test data information;
s6, the PC test end module compares the reference data information with the test data information and sends the comparison result information to the control end module;
and S7, the control end module sends the comparison result information to the database module for storage.
In one embodiment, after S6, when the comparison result information is abnormal information, the PC test side module sends an abnormal information prompt to the tester.
In one embodiment, the processing method of the exception information includes:
s51, the client side obtains the abnormal information of the tested product through the control end module and sends the abnormal information to the maintenance end;
s52, the client side obtains the factory SN code or product MAC address of the tested product through the control end module;
s53, acquiring production batch information according to the factory SN code or the product MAC address of the tested product;
s54, judging whether the tested product is in a warehouse or not according to the production batch information;
and S55, if yes, performing reworking to a maintenance end for maintenance.
In one embodiment, before S51, the client obtains the reference data information of the product to be tested through the control module, and determines whether the reference data information of the product to be tested is incorrect, and if yes, modifies the reference data information and sends it to the control module.
In one embodiment, the reference data information includes test plug-in management information, test parameter management information, test procedure management information, test data management information, and test flow management information.
According to the sample testing system and the testing method of the electronic product, the PC testing end module, the control end module, the database module and the FTP server are matched, and when a sample is required to be tested, the PC testing end module is electrically connected with the tested product; the PC test end module sends required test file information and reference data information to the control end module; the control end module acquires test file information through the FTP server and sends the test file information to the PC test end module; the control end module acquires reference data information through the database module and sends the reference data information to the PC test end module; the PC test end module tests the tested product according to the test file information and obtains test data information; the PC test end module compares the reference data information with the test data information and sends the comparison result information to the control end module; the control end module sends the comparison result information to the database module for storage, the whole testing process is automatically completed, the testing efficiency is improved, the labor cost is saved, and the accuracy of the testing result is improved.
Drawings
FIG. 1 is a schematic structural diagram of a sample testing system of an electronic product according to an embodiment of the present invention;
fig. 2 is a flowchart illustrating a testing method of the sample testing system of the electronic product according to fig. 1.
Detailed Description
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in detail below. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein.
It will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. In contrast, when an element is referred to as being "directly connected" to another element, there are no intervening elements present.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
As shown in fig. 1, a sample testing system for electronic products includes a PC testing end module 100, a control end module 200, a database module 300, an FTP server 400, and a client 500, where the control end module 200 performs interactive transmission of data with the PC testing end module 100, the database module 300, the FTP server 400, and the client 500, respectively.
In one embodiment, the client 500 includes a WEB side and a mobile side, and the WEB side and the mobile side perform interactive transmission of data with the control side module 200 respectively.
As shown in fig. 2, a method for testing a sample test system of an electronic product,
s1, electrically connecting the PC test end module 100 with the tested product;
s2, the PC test end module 100 sends the required test file information and the reference data information to the control end module 200;
s3, the control end module 200 acquires the test file information through the FTP server 400 and sends the test file information to the PC test end module 100;
s4, the control end module 200 acquires the reference data information through the database module 300 and sends the reference data information to the PC test end module 100;
s5, the PC test end module 100 tests the tested product according to the test file information and obtains the test data information;
s6, the PC test end module 100 compares the reference data information with the test data information and sends the comparison result information to the control end module 200;
and S7, the control module 200 sends the comparison result information to the database module 300 for storage.
In one embodiment, after S6, when the comparison result information is abnormal information, the PC test end module 100 sends an abnormal information prompt to the tester.
In one embodiment, the processing method of the exception information includes:
s51, the client 500 acquires the abnormal information of the tested product through the control end module 200 and sends the abnormal information to the maintenance end;
s52, the client 500 acquires the factory SN code or product MAC address of the tested product through the control end module 200;
s53, acquiring production batch information according to the factory SN code or the product MAC address of the tested product;
s54, judging whether the tested product is in a warehouse or not according to the production batch information;
and S55, if yes, performing reworking to a maintenance end for maintenance.
In one embodiment, before S51, the client 500 obtains the reference data information of the tested product through the control module 200, and determines whether the reference data information of the tested product is incorrect, and if yes, modifies the reference data information and sends the modified reference data information to the control module 200.
In one embodiment, the reference data information includes test plug-in management information, test parameter management information, test procedure management information, test data management information, and test flow management information.
The PC test side module 100 compares the test data information collected by the production test software with the reference data information, and determines a defective product if the index does not reach the standard, for example, the quiescent current collected by the remote controller is not within the standard value range. The PC test end module 100 prompts an alarm after acquiring the return value, and a tester performs subsequent operation on a defective product; whether the test result is successful or not, the test record is stored into the database module 300 through the control end module 200.
The control module 200 has management functions of test file information, reference data information, and test data information. The reference data information and the test data information of different products are stored in the database module 300, and the test file information is stored in the FTP server 400.
The client 500 performs query and report generation of product test data (such as a product first pass rate report and an abnormal analysis report), management and query of the SOP of the test station and corresponding data, and management of subsequent processes of warehouse entry and exit management and shipment management of the tested product.
A testing method of a sample testing system of an electronic product,
s1, electrically connecting the PC test end module 100 with the tested product; the PC test end module 100 judges required test file information and reference data information according to a tested product;
s2, the PC test end module 100 sends the required test file information and the reference data information to the control end module 200; sending test file information and reference data information required by a tested product to the control end module 200;
s3, the control end module 200 acquires the test file information through the FTP server 400 and sends the test file information to the PC test end module 100;
s4, the control end module 200 acquires the reference data information through the database module 300 and sends the reference data information to the PC test end module 100;
s5, the PC test end module 100 tests the tested product according to the test file information and obtains the test data information;
s6, the PC test end module 100 compares the reference data information with the test data information and sends the comparison result information to the control end module 200;
and S7, the control module 200 sends the comparison result information to the database module 300 for storage. The comparison result information of each tested product is provided with a special storage unit in the database module 300 so as to be convenient to consult in the following.
The PC test end module 100 displays the comparison result information through the display screen for the reference of the detection personnel.
In this way, the sample testing system and the testing method of the electronic product are arranged by matching the PC testing end module 100, the control end module 200, the database module 300 and the FTP server 400, and when the sample testing is required, the PC testing end module 100 is electrically connected with the tested product; the PC test end module 100 sends the required test file information and the reference data information to the control end module; the control end module 200 acquires the test file information through the FTP server 400 and sends the test file information to the PC test end module; the control end module 200 acquires the reference data information through the database module 300 and sends the reference data information to the PC test end module 100; the PC test end module 100 tests the tested product according to the test file information and obtains test data information; the PC test end module 100 compares the reference data information with the test data information, and sends the comparison result information to the control end module 200; the control end module 200 sends the comparison result information to the database module 300 for storage, the whole test process is automatically completed, the test efficiency is improved, the labor cost is saved, and the accuracy of the test result is improved.
Further, when the comparison result information is abnormal information, the PC test end module 100 sends the abnormal information to remind the tester, and the processing method of the abnormal information is as follows:
s51, the testing personnel sends a request for obtaining abnormal information to the control end module 200 through the client 500, and the control end module 200 obtains the abnormal information of the tested product through the database module 300 and sends the abnormal information to the maintenance end; a maintenance worker at a maintenance end determines the fault condition of the tested product through the abnormal information;
s52, the tester sends a request for obtaining the factory SN code or product MAC address of the product to be tested to the control module 200 through the client 500, and the control module 200 obtains the factory SN code or product MAC address of the product to be tested through the database module 300 and sends the product SN code or product MAC address to the client 500;
s53, the tester obtains the production batch information through the control end module 200 according to the factory SN code or the product MAC address of the tested product;
s54, the tester judges whether the tested product is in the warehouse according to the production batch information, and the specific warehouse number and the warehouse quantity are specified;
s55, if yes, reworking all tested products in the warehouse to a maintenance end for maintenance;
s56, the maintenance end personnel return all reworked products to the initial placement position of the warehouse after maintaining the reworked products;
and S57, the maintenance personnel re-manufacture the processing technique according to the fault information of the repaired product, upload the improved technique to the control end module 200 through the client 500, and the control end module 200 sends the improved technique to the FTP server 400 for storage. The initial processing method of the same product is placed in the initial file layer, the improved process method is placed in the improved file layer, and the priority of the improved file layer is higher than that of the initial file layer, that is, when the client 500 needs to call the processing method file of the product, the control end module 200 preferentially calls the file in the improved file layer, and if there are a plurality of files in the improved file layer, preferentially calls the file closest to the operation time. Therefore, the quality of the product can be ensured in subsequent processing by modifying the manufacturing process file, so that the product can be conveniently used in subsequent large-scale production.
Further, before S51, the client 500 obtains the reference data information of the tested product through the control module 200, and determines whether the reference data information of the tested product is incorrect, and if yes, modifies the reference data information and sends it to the control module 200.
The reference data information is usually stored in the database module 300, an operator sends a request for obtaining the reference data information of the tested product to the control end module 200 through the client 500, the control end module 200 obtains the reference data information of the tested product through the database module 300 and sends the reference data information to the client 500, the operator obtains the reference data information of the tested product through the client 500 and analyzes the reference data information of the tested product to judge whether the reference data information of the tested product is wrong, if the reference data information of the tested product is wrong, the reference data information of the tested product is modified correctly and sends the modified reference data information to the control end module 200 through the client 500, the control end module 200 sends the modified reference data information to the PC test end module 100 and the database module 300 respectively and sends the modified reference data information to the PC test end module 100 for retesting, so as to determine whether the tested product is a defective product. The modified datum data information is sent to the database module 300 to be stored in a storage unit corresponding to a tested product, the storage unit is divided into a plurality of storage groups, each storage group has different storage addresses, the datum data information is stored in a datum storage group, the modified datum data information is stored in a preset modified storage group, the storage addresses are configured with priorities according to the time close to the current time, the closer the current operation time is, the higher the priority is, the closest modified datum data information is preferentially called when calling is needed, the latest modified datum data information is ensured to be called, other datum data information or modified datum data information is also reserved at the same time, subsequent searching, comparison and analysis are facilitated, and the yield of the product is improved through continuous optimization.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims (7)

1. A sample test system of an electronic product is characterized in that: the system comprises a PC test end module, a control end module, a database module, an FTP server and a client, wherein the control end module respectively carries out interactive transmission of data with the PC test end module, the database module, the FTP server and the client.
2. A sample testing system for electronic products according to claim 1, wherein: the client comprises a WEB end and a mobile end, and the WEB end and the mobile end are respectively in interactive transmission with the control end module.
3. The method of claim 1, wherein:
s1, electrically connecting the PC test end module with the tested product;
s2, the PC test end module sends the required test file information and the reference data information to the control end module;
s3, the control end module acquires the test file information through the FTP server and sends the test file information to the PC test end module;
s4, the control end module acquires the reference data information through the database module and sends the reference data information to the PC test end module;
s5, the PC test end module tests the tested product according to the test file information and obtains test data information;
s6, the PC test end module compares the reference data information with the test data information and sends the comparison result information to the control end module;
and S7, the control end module sends the comparison result information to the database module for storage.
4. The method of claim 3, wherein: after S6, when the comparison result information is abnormal information, the PC test side module sends abnormal information to remind the tester.
5. The method of claim 4, wherein the method comprises: the processing method of the abnormal information comprises the following steps:
s51, the client side obtains the abnormal information of the tested product through the control end module and sends the abnormal information to the maintenance end;
s52, the client side obtains the factory SN code or product MAC address of the tested product through the control end module;
s53, acquiring production batch information according to the factory SN code or the product MAC address of the tested product;
s54, judging whether the tested product is in a warehouse or not according to the production batch information;
and S55, if yes, performing reworking to a maintenance end for maintenance.
6. The method for managing a sample testing system of an electronic product according to claim 5, wherein: before S51, the client obtains the reference data information of the detected product through the control module, and determines whether the reference data information of the detected product is incorrect, and if yes, modifies the reference data information and sends it to the control module.
7. The method for managing a sample testing system of an electronic product according to claim 3, wherein: the reference data information comprises test plug-in management information, test parameter management information, test procedure management information, test data management information and test process management information.
CN202111655964.6A 2021-12-31 2021-12-31 Sample testing system and method for electronic product Pending CN114398270A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202111655964.6A CN114398270A (en) 2021-12-31 2021-12-31 Sample testing system and method for electronic product

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202111655964.6A CN114398270A (en) 2021-12-31 2021-12-31 Sample testing system and method for electronic product

Publications (1)

Publication Number Publication Date
CN114398270A true CN114398270A (en) 2022-04-26

Family

ID=81228122

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202111655964.6A Pending CN114398270A (en) 2021-12-31 2021-12-31 Sample testing system and method for electronic product

Country Status (1)

Country Link
CN (1) CN114398270A (en)

Similar Documents

Publication Publication Date Title
CN109361562B (en) Automatic testing method based on associated network equipment access
CN111736875A (en) Version updating monitoring method, device, equipment and computer storage medium
CN109165170B (en) Method and system for automatic request test
CN111199353B (en) Test method and test system
CN111856249B (en) Chip test monitoring method, client and system
CN111310351A (en) Method and device for monitoring state of workshop equipment, terminal equipment and storage medium
CN111199326B (en) Product yield monitoring method and device and computer readable storage medium
CN111245653A (en) Method and system for quickly establishing topological relation between devices
US20200401596A1 (en) Test data integration system and method thereof
WO2020123417A2 (en) A method for commissioning and maintenance of alarm systems
CN113010394B (en) Machine room fault detection method for data center
CN114793132A (en) Optical module detection method and device, electronic equipment and storage medium
CN112019405B (en) Automatic testing method and system
CN114398270A (en) Sample testing system and method for electronic product
CN115187210A (en) Abnormal information handling method, device, system, electronic equipment and storage medium
CN115147236A (en) Processing method, processing device and electronic equipment
CN110662242B (en) Antenna feeder system detection method, network management equipment and computer readable storage medium
CN113919151A (en) Electrical measurement equipment acceleration reliability test method based on active triggering
CN113033237A (en) Product detection code scanning method
CN106992873B (en) Protection group processing method and device
CN110188034A (en) A kind of method for testing software based on information sharing
CN117226450A (en) Method and system for preventing module from being wrongly assembled in manufacturing and assembling process
CN112256540A (en) Server inspection method and device
CN114264848A (en) Cold head spare part management system and management method of IC chip test equipment
CN115840124A (en) System and method for controlling continuous operation of test fixture machine according to test result

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination