CN102608522B - Constant-temperature crystal oscillator ageing parameter automatic measurement instrument - Google Patents
Constant-temperature crystal oscillator ageing parameter automatic measurement instrument Download PDFInfo
- Publication number
- CN102608522B CN102608522B CN201210065699.0A CN201210065699A CN102608522B CN 102608522 B CN102608522 B CN 102608522B CN 201210065699 A CN201210065699 A CN 201210065699A CN 102608522 B CN102608522 B CN 102608522B
- Authority
- CN
- China
- Prior art keywords
- crystal oscillator
- control panel
- electroplax
- frequency
- control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000013078 crystal Substances 0.000 title claims abstract description 76
- 230000032683 aging Effects 0.000 title claims abstract description 53
- 238000005259 measurement Methods 0.000 title claims abstract description 40
- 238000012360 testing method Methods 0.000 claims abstract description 62
- 230000008054 signal transmission Effects 0.000 claims description 9
- 101100165827 Mus musculus Cables1 gene Proteins 0.000 claims description 6
- 230000011664 signaling Effects 0.000 claims description 3
- 238000013459 approach Methods 0.000 abstract description 2
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 230000003203 everyday effect Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 2
- 238000007405 data analysis Methods 0.000 description 2
- 238000007598 dipping method Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000010923 batch production Methods 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000012812 general test Methods 0.000 description 1
- 238000011031 large-scale manufacturing process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The present invention relates to a kind of constant-temperature crystal oscillator ageing parameter automatic measurement instrument, comprise 1) crystal oscillator adds electroplax: be provided with multiple test bench for grafting crystal oscillator above; 2) logic control panel: each the crystal oscillator output port being added electroplax by concentric cable and crystal oscillator is connected, is connected with control computer by parallel port line; 3) radio frequency control panel: each the crystal oscillator output port being added electroplax by coaxial wire and crystal oscillator is connected, is connected, for obtaining crystal oscillator radiofrequency signal with control computer by parallel port line; 4) frequency measuring instrument: be connected with radio frequency control panel by coaxial wire, is connected with control computer by GPIB line, for measuring the frequency values of each debugging crystal oscillator; 5) computer is controlled.The present invention has following beneficial effect: aging testing rack can carry out the measurement of a hundreds of OCXO ageing parameter altogether simultaneously and not take artificial, and compare traditional approach, measure improved efficiency more than 10 times, measurement data accuracy rate is close to 100%.
Description
Technical field
The present invention relates to a kind of automatic measurement instrument, particularly relate to the automatic measurement instrument of ageing parameter measure batch in the batch production of a kind of constant-temperature crystal oscillator.
Background technology
The production of constant-temperature crystal oscillator (be called for short OCXO), the work more than more than 90% is all measurement for product parameters and debugging, and the difficult point of OCXO mass production, be just the parameter measurement test of mass.
In OCXO product, ageing parameter is one of most important index, also be the index of the most difficult measurement, after ageing parameter needs OCXO to add and power on, continual measurement about 15 to 30 days, measures each OCXO every day twice or repeatedly frequency data, and according to these data, carry out the ageing parameter that statistical separates out each OCXO, comprise a day ageing parameter, the moon ageing parameter and annual aging parameter etc.
Because OCXO product is less, one-shot measurement One's name is legion, traditional hand dipping speed is slow, requires a large amount of survey crew, and records mass data, and for the mass production of OCXO, very improper, seriously constrains the large-scale production of OCXO.Simultaneously because manual measurement speed is slow, easily make mistakes, cause the data out of true measured, also need the data input computer of hand dipping, more easily cause corrupt data, thus cause OCXO final argument measuring error.
Summary of the invention
Technical matters to be solved by this invention is to provide the equipment that a whole set of measures constant-temperature crystal oscillator ageing parameter automatically.
In order to solve the problems of the technologies described above, the present invention by the following technical solutions:
Constant-temperature crystal oscillator ageing parameter automatic measurement instrument, comprises testing jig, power supply, it is characterized in that it also comprises:
1) crystal oscillator adds electroplax: be provided with multiple test bench for grafting crystal oscillator above, and crystal oscillator adds electroplax for providing power supply for crystal oscillator;
2) logic control panel: each the crystal oscillator output port being added electroplax by concentric cable and crystal oscillator is connected, be connected with control computer by parallel port line, accept the control controlling computer, adding each crystal oscillator output port switch of electroplax for controlling crystal oscillator, the signal transmission passage corresponding with crystal oscillator output port being in and opening or closed condition;
3) radio frequency control panel: each the crystal oscillator output port being added electroplax by coaxial wire and crystal oscillator is connected, be connected with control computer by parallel port line, for obtaining crystal oscillator radiofrequency signal, and by radio signal transmission on frequency measuring instrument;
4) frequency measuring instrument: be connected with radio frequency control panel by coaxial wire, is connected with control computer by GPIB line, for measuring the frequency values of each debugging crystal oscillator, and the data of measurement is sent to control computer;
5) control computer: for issuing control instruction, the action of steering logic control panel, the measurement of controlled frequency measuring instrument and digital independent, and calculate ageing parameter according to frequency change situation, matching obtains ageing rate change curve.
Every platform testing jig is divided into 6 layers, and every one deck is installed 2 pieces of crystal oscillators and added electroplax, and every block adds test bench electroplax having 8 crystal oscillators.
10 testing jigs, as a measuring unit, are connected with parallel port line by coaxial wire between every platform testing jig, and parallel port line connects the logic control panel on adjacent two testing jigs, and coaxial wire connects the radio frequency control panel on adjacent two testing jigs.
Described logic control panel specifically includes comparer chip, 4-16 coding chip and concentric cable, the control pin of comparer chip connects parallel port line, output pin connects 4-16 coding chip, and coding chip is connected to concentric cable, the switch of control cables signal transmission passage.
Described radio frequency control panel specifically comprises: Sheffer stroke gate chip, comparer chip, silver-plated concentric cable, signal-transmitting cable bus, the control pin of comparer chip connects parallel port line, output pin connects the output pin of Sheffer stroke gate, the output pin of Sheffer stroke gate connects silver-plated concentric cable, control cables signaling switch, silver-plated concentric cable is connected to signal-transmitting cable bus, and signal-transmitting cable finally delivers to frequency measuring instrument signal.
Described control computer is by computing formula A*ln (x)+f
matching obtains ageing rate change curve,wherein A is changed factor, x be through number of days, frequency based on f.
The present invention compared with prior art has following beneficial effect: aging testing rack can carry out the measurement of a hundreds of OCXO ageing parameter altogether simultaneously and not take artificial, and can be as required, continue the aging testing rack increasing series connection, compare traditional approach, measure improved efficiency more than 10 times, measurement data accuracy rate is close to 100%.
Accompanying drawing explanation
Fig. 1 is the one-piece construction figure of ageing parameter measuring instrument
Fig. 2 is single ageing parameter testing jig structural drawing.
Embodiment
Below in conjunction with accompanying drawing, the present invention is further illustrated.
See Fig. 1, a whole set of automatic measurement instrument comprises: ageing parameter testing jig, frequency measuring instrument, control system.See Fig. 2, ageing parameter testing jig is the place that OCXO carries out testing, and testing jig is provided with crystal oscillator and adds electroplax, radio frequency control panel, logic control panel.The power-supply system of whole system is also arranged in metal frame.
It is carry out the place that OCXO adds electrical testing that crystal oscillator adds electroplax, be provided with multiple test bench for grafting crystal oscillator above, crystal oscillator adds electroplax for providing power supply for crystal oscillator, and OCXO is when measuring, and each is placed on test bench and measures for a long time.Crystal oscillator adds electroplax and comprises: power switch, LED power pilot lamp, the load welding position of test bench, each test bench corresponding; Test bench comprises crystal oscillator jack, against short-circuit backing plate.
Logic control panel: each the crystal oscillator output port being added electroplax by concentric cable and crystal oscillator is connected, be connected with control computer by 25 pin parallel port connecting lines, adding each crystal oscillator output port switch of electroplax for controlling crystal oscillator, the signal transmission passage corresponding with crystal oscillator output port being in and opening or closed condition; System controlling software carrys out selector channel by logic control panel, ensures to only have a road signal to pass through simultaneously, prevents interference.Logic control panel specifically includes comparer chip, 4-16 coding chip and concentric cable.Logic control panel specifically includes comparer chip, 4-16 coding chip and concentric cable, the control pin of comparer chip connects parallel port line, output pin connects 4-16 coding chip, and coding chip is connected to concentric cable, the switch of control cables signal transmission passage.Comparer chip adopts 74HC85N comparer, and 4-16 coding chip adopts CD4514BE demoder.
Radio frequency control panel: each the crystal oscillator output port being added electroplax by coaxial wire and crystal oscillator is connected, be connected with control computer by parallel port line, radio frequency control panel is for obtaining each crystal oscillator radiofrequency signal, carry out frequency conduction, it can connect multiple stage aging testing rack, the radio signal transmission on testing jig on frequency measuring instrument.Radio frequency control panel specifically comprises: Sheffer stroke gate chip, comparer chip, silver-plated concentric cable, signal-transmitting cable bus.Radio frequency control panel specifically comprises: Sheffer stroke gate chip, comparer chip, silver-plated concentric cable, signal-transmitting cable bus, the control pin of comparer chip connects parallel port line, output pin connects the output pin of Sheffer stroke gate, the output pin of Sheffer stroke gate connects silver-plated concentric cable, control cables signaling switch, silver-plated concentric cable is connected to signal-transmitting cable bus, and signal-transmitting cable finally delivers to frequency measuring instrument signal.Sheffer stroke gate chip adopts 74HC00P Sheffer stroke gate.
Frequency measuring instrument: it is connected with the radio frequency control panel of testing jig by coaxial wire; Be connected with control computer by GPIB line, control system reads the frequency of specifying OCXO by GPIB line issue an order controlled frequency tester, frequency measuring instrument accepts the control of control system, for measuring the frequency values of each debugging crystal oscillator, and the data of measurement are sent to control computer, and feed back to control system.The frequency measuring instrument that system uses is frequency meter, and concrete model is Agilent 53131 frequency measuring instrument.
Control system comprises control computer, control software design and instrument controlling module.Controlling computer is carrier, and running control software, instrument controlling module is also installed on computers.Control computer and be used for issuing control instruction, the action of steering logic control panel, the measurement of controlled frequency measuring instrument and digital independent, and calculate ageing parameter according to frequency change situation, matching obtains ageing rate change curve.Control computer by the logic control panel issue an order to ageing parameter testing jig, the switch of controlled frequency passage, to test each OCXO; Control software design controlled frequency measuring instrument, carries out frequency measurement to frequency measuring instrument, the operations such as optimum configurations; Control software design, for the data collected, carries out managing and analyzing, and calculates the aging data of needs.Instrument controlling module is the passage that control computer is connected with ageing parameter testing jig, frequency measuring instrument, includes GPIB agreement card, 25 pin parallel port connecting line and coaxial wires, and control software design is by this module issue an order control hardware.The software of control system is write by VB, mainly contains instrument controlling, data analysis and data sheet three zones module.Instrument controlling be software by connecting line issue an order to operate all hardware systems, to realize the function of specifying; Data analysis refers to that software is by after reading the information that returns of hardware, preserves data, analysis and calculation, finally provides the aging data of each OCXO; Data sheet is to all OCXO crossed by testing of equipment, can derive test data, gives the function that report form is supplied to user.
Through for a long time measure after, find perfect crystal oscillator ageing rate curve, close to logarithmic curve A*ln (x)+f, wherein A is changed factor, x be through number of days, frequency based on f.If therefore there is abundant data point, just can carries out logistic fit to data point, obtain the formula of ageing rate change curve, thus obtain the theoretic frequency value of any a day, reduce the time of measuring.Ratio is if any such one group of data 9999992.348, 9999992.35, 9999992.354, 9999992.359, 9999992.361, 9999992.365, 9999992.366, 9999992.37, 9999992.371, 9999992.374, 9999992.376, 9999992.377, 9999992.379, 9999992.38, 9999992.382, 9999992.384, 9999992.386, 9999992.387, 9999992.389, 9999992.39, 9999992.39, 9999992.392, 9999992.392, the frequency values obtained when representing and measure each time, the aging formula that can obtain after matching is 0.0161689*ln (x)+9999992.3, like this, if want the parameter knowing this crystal oscillator after 50 days aging, only need to substitute into x in formula 50, and do not need continuous 50 days aging.Because measurement data points is maximum, the formula obtained is more accurate, thus according to the requirement of Product Precision, needs to connect measurement and obtains fitting formula over 15 to 30 days.
Power-supply system: power-supply system is divided into two total scores, a part provides power supply to the crystal oscillator of test, is the adjustable Switching Power Supply of power supply, each crystal oscillator testing jig power supply; Another part is that logic control panel provides power supply to the radio frequency control panel on aging testing rack, and the testing jig of multiple stage series connection shares a power supply.
Because the single volume of OCXO is little, each test volume is large, and therefore the amount that can simultaneously test of ageing parameter testing jig is very large.Ageing parameter testing jig is divided into 6 layers, five layers add electroplax for installing crystal oscillator below, every one deck can be installed 2 pieces of crystal oscillators and add electroplax, and each block adds on electroplax and has 8 test benches, an ageing parameter testing jig is provided with a radio frequency control panel and logic control panel, general 10 ageing parameter testing jigs link together as a measuring unit, between every platform testing jig, use concentric cable and winding displacement to couple together.Control computer to be connected with the logic control panel of First testing jig by 25 pin parallel port connecting lines, by GPIB line rate of connections measuring instrument, frequency measuring instrument is connected with the radio frequency control panel of First testing jig by concentric cable, logic control panel on adjacent two testing jigs of 25 pin parallel port connecting line, coaxial wire connects the radio frequency control panel on adjacent two testing jigs.
When reality is tested, crystal oscillator adds OCXO electroplax adding measurement, starts power supply.Logic control panel is according to the control signal of control system, accurate control each power up the switch of a radiofrequency signal, ensure on 10 testing jigs, only having a radiofrequency signal sometime, holding signal pure, radio frequency control panel conducts radiofrequency signal to Frequency tester by concentric cable simultaneously, so just reaches the object accurately measuring each OCXO frequency.
In use, first user needs arranging " machine number " in software, index during nominative testing, directly can use " machine number " and need not set up again when next time tests the OCXO of same index.Each OCXO to be tested has a unique numbering, and on aging testing rack, also there is unique number each position, after user is put into test bench OCXO to be tested, OCXO and location number write software.After the OCXO that all will test has laid, whether the OCXO that software detection is newly laid can be read frequency, if can not, then user needs to revise, and the OCXO newly laid until all can be read frequency.General test He Ne laser carries out at all relative morning and midnight stably in voltage and temperature, and testing software can carry out frequency reading to all OCXO and be stored into database by control instrument.Each time after reading frequency, software all can calculate ageing parameter according to frequency change situation, and show on interface whether qualified: red for defective, green is qualified.
Crystal oscillator aging frequency measures the time to frequency measurement, and environment and the continuation measurement etc. of having no progeny in measuring for a long time have requirement, make the data of measurement can obtain crystal oscillator ageing rate the most accurately.First it is the time of measuring, require electric power when measuring, temperature is all as far as possible similar in every day, owing to needing measurement two secondary data every day, because should be between morning and 5 to 7 at dusk selection of time, within this time period, do not go into operation due to most factory or be off duty, electric power compares balance, is not easy to occur that " hop " resembles, and temperature conditions is now also more similar, reduce temperature as far as possible to the impact of measuring.Next is the regulation to measurement environment, and require that temperature when measuring and temperature keep relative constancy, particularly temperature, General Requirements is constant in 25 degrees centigrade, reduces crystal oscillator temperature influence.Finally that the rear exploration continuing to measure is interrupted for long-time measurement, because aging measurement generally needs continual continuous coverage about month, the situations such as power failure are run into unavoidably in measuring process, when continuing to measure, directly data after power-off are added and make a big impact to result, therefore have no progeny in measurement, must carry out continuous two days uninterruptedly power up operation, make crystal oscillator state close to after the most stable, just measurements and calculations can be proceeded, the result obtained like this be connected measure basically identical, decrease waste of time.
Claims (4)
1. constant-temperature crystal oscillator ageing parameter automatic measurement instrument, comprises testing jig, power supply, it is characterized in that it also comprises:
1) crystal oscillator adds electroplax: be provided with multiple test bench for grafting crystal oscillator above, and crystal oscillator adds electroplax for providing power supply for crystal oscillator;
2) logic control panel: each the crystal oscillator output port being added electroplax by concentric cable and crystal oscillator is connected, be connected with control computer by parallel port line, accept the control controlling computer, each crystal oscillator output port switch of electroplax is added for controlling crystal oscillator, the signal transmission passage corresponding with crystal oscillator output port is in open or closed condition, carry out selector channel by logic control panel, ensure to only have a road signal to pass through simultaneously
;
3) radio frequency control panel: each the crystal oscillator output port being added electroplax by coaxial wire and crystal oscillator is connected, be connected with control computer by parallel port line, for obtaining crystal oscillator radiofrequency signal, and by radio signal transmission on frequency measuring instrument;
4) frequency measuring instrument: be connected with radio frequency control panel by coaxial wire, is connected with control computer by GPIB line, for measuring the frequency values of each debugging crystal oscillator, and the data of measurement is sent to control computer;
5) control computer: for issuing control instruction, the action of steering logic control panel, the measurement of controlled frequency measuring instrument and digital independent, and calculate ageing parameter according to frequency change situation, matching obtains ageing rate change curve;
Every platform testing jig is divided into 6 layers, every one deck is installed 2 pieces of crystal oscillators and is added electroplax, every block adds test bench electroplax having 8 crystal oscillators, 10 testing jigs are as a measuring unit, be connected with parallel port line by coaxial wire between every platform testing jig, parallel port line connects the logic control panel on adjacent two testing jigs, and coaxial wire connects the radio frequency control panel on adjacent two testing jigs.
2. constant-temperature crystal oscillator ageing parameter automatic measurement instrument as claimed in claim 1, it is characterized in that: described logic control panel specifically includes comparer chip, 4-16 coding chip and concentric cable, the control pin of comparer chip connects parallel port line, output pin connects 4-16 coding chip, coding chip is connected to concentric cable, the switch of control cables signal transmission passage.
3. constant-temperature crystal oscillator ageing parameter automatic measurement instrument as claimed in claim 1, it is characterized in that: described radio frequency control panel specifically comprises: Sheffer stroke gate chip, comparer chip, silver-plated concentric cable, signal-transmitting cable bus, the control pin of comparer chip connects parallel port line, output pin connects the output pin of Sheffer stroke gate, the output pin of Sheffer stroke gate connects silver-plated concentric cable, control cables signaling switch, silver-plated concentric cable is connected to signal-transmitting cable bus, and signal-transmitting cable finally delivers to frequency measuring instrument signal.
4. constant-temperature crystal oscillator ageing parameter automatic measurement instrument as claimed in claim 1, is characterized in that described control computer is by computing formula A*ln (x)+f
matching obtains ageing rate change curve,wherein A is changed factor, x be through number of days, frequency based on f.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210065699.0A CN102608522B (en) | 2012-01-13 | 2012-01-13 | Constant-temperature crystal oscillator ageing parameter automatic measurement instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210065699.0A CN102608522B (en) | 2012-01-13 | 2012-01-13 | Constant-temperature crystal oscillator ageing parameter automatic measurement instrument |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102608522A CN102608522A (en) | 2012-07-25 |
| CN102608522B true CN102608522B (en) | 2015-09-16 |
Family
ID=46526039
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210065699.0A Expired - Fee Related CN102608522B (en) | 2012-01-13 | 2012-01-13 | Constant-temperature crystal oscillator ageing parameter automatic measurement instrument |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102608522B (en) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103217600A (en) * | 2013-03-15 | 2013-07-24 | 深圳市三奇科技有限公司 | Testing device and testing method of aging rate of frequency devices |
| CN103207333B (en) * | 2013-03-15 | 2016-08-17 | 深圳市三奇科技有限公司 | A kind of high-frequency frequency automatic testing equipment and method of testing |
| CN103217604B (en) * | 2013-03-26 | 2016-08-24 | 深圳市三奇科技有限公司 | A kind of high-frequency frequency multichannel test device and method of testing |
| CN103698599B (en) * | 2013-12-27 | 2017-01-25 | 广东大普通信技术有限公司 | Method and system for automatically measuring inflection point temperature of oven controlled crystal oscillator |
| CN103698603B (en) * | 2013-12-27 | 2017-03-15 | 深圳芯邦科技股份有限公司 | A kind of chip and its clock test methodology and chip clock test system |
| CN104198846B (en) * | 2014-08-18 | 2017-03-22 | 广东大普通信技术有限公司 | Automatic testing method and system of aging characteristics of crystal oscillator |
| CN105572429B (en) * | 2015-12-22 | 2019-12-20 | 北京无线电计量测试研究所 | Fixing device and monitoring system of crystal oscillator |
| CN107991561B (en) * | 2017-11-29 | 2021-08-17 | 北京无线电计量测试研究所 | Aging performance testing device and method for quartz crystal resonator |
| CN110109342B (en) * | 2018-02-01 | 2024-05-14 | 深圳市英特瑞半导体科技有限公司 | Crystal oscillator frequency time keeping method and time keeping equipment |
| CN112444732B (en) * | 2020-11-10 | 2023-05-05 | 海光信息技术股份有限公司 | Chip aging state monitoring circuit, method, chip and server |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101609126A (en) * | 2009-07-16 | 2009-12-23 | 东莞市大普通信技术有限公司 | The Auto-Test System of temperature compensating crystal oscillator |
-
2012
- 2012-01-13 CN CN201210065699.0A patent/CN102608522B/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101609126A (en) * | 2009-07-16 | 2009-12-23 | 东莞市大普通信技术有限公司 | The Auto-Test System of temperature compensating crystal oscillator |
Non-Patent Citations (3)
| Title |
|---|
| "新型恒温晶体振荡器拐点自动找寻系统";范文晶 等;《计量技术》;20091231(第8期);第21-24页 * |
| "晶体振荡器的对数老化规律";胡锦麟 等;《电子技术》;19801231(第12期);第17-19页 * |
| 赵曙光 等."恒温晶振(OCXO)计算机辅助调试和自动测试系统".《仪器仪表学报》.2002,第23卷(第6期),第642-644页. * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102608522A (en) | 2012-07-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102608522B (en) | Constant-temperature crystal oscillator ageing parameter automatic measurement instrument | |
| CN102650678B (en) | Multi-channel calibration and checking method for power management ICs (integrated circuits) | |
| CN102252820B (en) | On-line automatic testing system in production of optical module | |
| CN102621381A (en) | Automatic temperature-frequency characteristic measuring instrument for thermostatic crystal oscillators | |
| CN110187299B (en) | General calibration system for electrical parameters of aviation support equipment | |
| CN107247249A (en) | A kind of alternating current-direct current ammeter tester calibrating installation and calibration method | |
| CN102565530A (en) | Automatic measuring instrument for crystal inflection point of oven-controlled crystal oscillator (OCXO) | |
| CN106405294B (en) | Portable power distribution product transmission calibrator and implementation test method thereof | |
| CN103257277B (en) | Multifunctional virtual instrument based on constant flow source and control method | |
| CN105785306A (en) | Voltage transformer on-line group calibration method and apparatus | |
| CN102288848A (en) | Automatic current test and analysis system and method for constant-temperature crystal oscillator | |
| CN101865946B (en) | Alternating current parameter testing system and method of programmable digital integrated circuit | |
| CN101452068A (en) | Test method and system for enhancing calibration efficiency of wireless comprehensive test instrument | |
| CN106100764A (en) | The general purpose automatic test system of ultrashort wave radio set | |
| CN200997633Y (en) | Automatic testing system based on graphic testing platform | |
| CN109856582A (en) | A kind of underwater kit detection device automatic calibrator | |
| CN114487691A (en) | Portable cable conduction insulation detection device | |
| CN109270376A (en) | A kind of microcontroller pin automatically testing parameters platform and test method | |
| CN103344937A (en) | Device and method for detecting power consumption of intelligent watt-hour meter | |
| CN112149317A (en) | Design method, system, medium and equipment for improving cable laying length and precision | |
| CN205880191U (en) | A isolated plant for being directed at electric energy meter that possesses CT secondary circuit state monitor function carries out global function and detects | |
| CN106443406A (en) | Acceleration test data automatic acquisition and analysis assessment system of analog integrated circuit | |
| CN106199486A (en) | A kind of measurement system of power meter temperature impact test | |
| CN211123230U (en) | Portable automatic debugging system for calibrator | |
| CN211427149U (en) | Automatic calibration test system of data acquisition equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150916 |