CN102538769A - Deviation ruler - Google Patents
Deviation ruler Download PDFInfo
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- CN102538769A CN102538769A CN2012100093577A CN201210009357A CN102538769A CN 102538769 A CN102538769 A CN 102538769A CN 2012100093577 A CN2012100093577 A CN 2012100093577A CN 201210009357 A CN201210009357 A CN 201210009357A CN 102538769 A CN102538769 A CN 102538769A
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- lattice
- deviation
- judgement
- chi
- millimeter
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Abstract
The invention relates to a deviation ruler. The deviation ruler comprises a graduated scale, a judgment ruler and a cross line; the judgment ruler is positioned above the horizontal line of the cross line; the graduated scale is positioned below the horizontal line of the cross line; and each of the graduated scale and the judgment ruler is divided by the vertical line of the cross line into left and right parts. The graduated scale consists of millimeter scale lines and centimeter lattices; and the centimeter lattices are positioned below the millimeter scale lines. The judgment ruler comprises limit judgment lattices, meter judgment lattices, and millimeter judgment lattices on upper, middle and lower lines. The limit judgment lattices, the meter judgment lattices, the millimeter judgment lattices, the millimeter scale lines and the centimeter lattices are drawn by colors. The deviation ruler is printed into a paper sheet, adhesive sticker is coated on the back of the paper, and the paper is adhered into a paper or plastic film. The deviation ruler is used as an auxiliary measuring tool, and the auxiliary measuring tool can measure the deviation of an object to be measured quickly and accurately; and the deviation ruler is simple in structure, exquisite in design, and low in manufacturing cost, and is convenient to carry and use.
Description
Technical field
The invention belongs to the measurement field of engineering technology, relate to a kind of supplemental measurement tool of Measuring Object straight line deviation, be specifically related to a kind of deviation chi.
Background technology
The construction of skyscraper, high tower, chimney, elevator and heavy construction, equipment need be measured its vertical deviation; It is verticality; Horizontal installed device and surface level need be measured its horizontal departure, and some equipment or object install and be provided with the deviation that needs to measure its straight line to line.Survey instrument to the line deviation is a lot, but the function singleness of survey instrument, every kind of survey instrument is only measured to a kind of or a kind equipment.When measured deviation, there is certain deficiency, as: the measuring vertical deviation adopts hangs normal line method and measures coordinate method, hangs the influence of external environments such as normal line method long, easy wind-engaging stabilization time; Measure the complex steps of coordinate method, can't draw measurement result fast; Measure horizontal departure and adopt high differentiation, need be during measurement by Sopwith staff, but Sopwith staff is difficult to be fixed on the object error that exists secondary to place.Above-mentioned survey instrument complex structure is unfavorable for carrying and using, and manufacturing cost is high.
Summary of the invention
For overcoming the deficiency of above-mentioned prior art, the present invention provides a kind of deviation chi, and as supplemental measurement tool, auxiliary measuring instrument is measured the deviation of testee quickly and accurately, is convenient for carrying and uses.
A kind of deviation chi of the present invention comprises rule, and rule is made up of a millimeter scale mark and centimetre lattice, and centimetre case is under the millimeter scale mark.The deviation chi also comprises crosshair and judgement chi, judges that chi is positioned on the crosshair horizontal line, and rule is positioned under the crosshair horizontal line, and the vertical line of crosshair is divided into left and right sides two parts to rule and judgement chi.The judgement chi comprises limit judgement lattice, rice judgement lattice and millimeter judgement lattice, and limit judgement lattice, rice judgement lattice and millimeter judgement lattice are the upper, middle and lower arrangements.
The limit judges that lattice, rice judgement lattice, millimeter judgement lattice, millimeter scale mark and centimetre lattice are with the colour drafting.The limit is judged lattice, rice judgement lattice, millimeter judgement lattice and centimetre lattice with three kinds of alternate draftings of color, and the millimeter scale mark is with two kinds of alternate draftings of color.The millimeter scale mark be 5 long lines, 5 short-terms alternately.The deviation chi is printed into the scraps of paper, and the back side scribbles adhesive sticker, sticks on paper or the plastic foil.The limit judges that the width (laterally) of lattice is 1 centimetre, and rice judges that the width of lattice is 3 millimeters.
Use the method for deviation chi measurement straight line deviation to do, confirm the datum mark and the measurement point of measured object, the deviation chi is attached to datum mark and measurement point, the center of reticule alignment fiducials point and the measurement point of deviation chi.Place surveying instrument; The crosshair of surveying instrument is aimed at the reference point of measured object, the crosshair of surveying instrument is overlapped with the crosshair of deviation chi, adjust the horizontal level of surveying instrument; The crosshair that rotates surveying instrument is aimed at the deviation chi of measurement point, observes and read deviation.Certain device or object are equipped with certain deviation limit value, qualified as long as the measured value of deviation is in its deviate (limit judgement lattice), exceed its deviate and be defective.Deviation chi of the present invention can be used as the supplemental measurement tool of plumb aligner, level meter or transit, is used for vertical missing and measures, and horizontal departure is measured and the deviation of arbitrary line is measured.
Deviation chi auxiliary measuring instrument of the present invention can be measured the installation of object accurately and rapidly and deviation is set; The vertical missing that is used for bridge, skyscraper, high tower, chimney, elevator and main equipment installation is measured and the horizontal departure measurement, and the deviation that also can be used for mini-plant is measured.The present invention is simple in structure, deft design, cheap, easy to carry and use.
Figure of description
Fig. 1 is the synoptic diagram of deviation chi of the present invention.
Wherein:
1-judge chi, 2-crosshair, 3-rule, 4-limit judge lattice, 5-rice judge lattice, 6 ,-millimeter judgement lattice, 7-millimeter scale mark, 8-centimetre lattice.
Embodiment
Below in conjunction with accompanying drawing the present invention is further described.
Deviation chi of the present invention is as shown in Figure 1, comprises rule 3, judges chi 1 and crosshair 2, and judge that chi is positioned on the crosshair horizontal line, rule is positioned under the crosshair horizontal line, and the vertical line of crosshair is divided into left and right sides two parts to rule and judgement chi.Rule is made up of millimeter scale mark 7 and centimetre lattice 8, and centimetre case is under the millimeter scale mark.The judgement chi comprises limit judgement lattice 4, rice judgement lattice 5 and millimeter judgement lattice 6, and limit judgement lattice, rice judgement lattice and millimeter judgement lattice are the upper, middle and lower arrangements.The limit judges that the width (laterally) of lattice is 1 centimetre, and rice judges that the width of lattice is 3 millimeters.Draw between limit judgement lattice 4, rice judgement lattice 5, millimeter judgement lattice 6 and black, white, grey three form and aspect of centimetre lattice 8 usefulness, black, the white two kinds of alternate draftings of color of millimeter scale mark 7 usefulness, above-mentioned lattice, line can adopt other colour to draw.The millimeter scale mark 7 be 5 long lines, 5 short-terms alternately.The deviation chi is printed into the scraps of paper, and the back side scribbles adhesive sticker, sticks on the paper.
The measuring process of vertical missing as measuring the vertical missing of chimney, is at first confirmed reference point in chimney bottom, and the paper at the deviation chi back side is thrown off, and is attached on the reference point, confirms the deviation chi to be attached on the measurement point measurement point again.Place laser plummet; The crosshair of plumb aligner is aimed at the reference point of measured object, the crosshair of surveying instrument is overlapped with the crosshair 2 of deviation chi, adjust the horizontal level of plumb aligner; The crosshair that rotates plumb aligner is aimed at the deviation chi of measurement point, observes and read deviate.
The measuring process of horizontal departure as measuring the levelness of mounting platform, at first at a definite reference point, is thrown off the paper at the deviation chi back side, is attached on the reference point, confirms measurement point in the other end again, and the deviation chi is attached on the measurement point.Place laser level; The crosshair of spirit-leveling instrument is aimed at the reference point of measured object, the crosshair of spirit-leveling instrument is overlapped with the crosshair 2 of deviation chi, adjust the horizontal level of the wide plumb aligner that continues; The crosshair that rotates surveying instrument is aimed at the deviation chi of measurement point, observes and read deviate.
Claims (5)
1. deviation chi; Comprise rule (3), said rule is made up of millimeter scale mark (7) and centimetre lattice (8), and centimetre case is under the millimeter scale mark; It is characterized in that: said deviation chi also comprises crosshair (2) and judges chi (1); Judge that chi is positioned on the crosshair horizontal line, rule is positioned under the crosshair horizontal line, and the vertical line of crosshair is divided into left and right sides two parts to rule and judgement chi; Said judgement chi comprises limit judgement lattice (4), rice judgement lattice (5) and millimeter judgement lattice (6), and limit judgement lattice, rice judgement lattice and millimeter judgement lattice are the upper, middle and lower arrangements.
2. deviation chi according to claim 1; It is characterized in that: the said limit judges that lattice (4), rice judgement lattice (5), millimeter judgement lattice (6), millimeter scale mark (7) and centimetre lattice (8) are with the colour drafting; The said limit is judged lattice (4), rice judgement lattice (5), millimeter judgement lattice (6) and centimetre lattice (8) with three kinds of alternate draftings of color, and said millimeter scale mark is with two kinds of alternate draftings of color.
3. deviation chi according to claim 2 is characterized in that: said millimeter scale mark (7) be 5 long lines, 5 short-terms alternately.
4. deviation chi according to claim 1 is characterized in that: said deviation chi is printed into the scraps of paper, and the back side scribbles adhesive sticker, sticks on paper or the plastic foil.
5. deviation chi according to claim 1 is characterized in that: the said limit judges that the width of lattice is 1 centimetre, and said rice judges that the width of lattice is 3 millimeters.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100093577A CN102538769A (en) | 2012-01-13 | 2012-01-13 | Deviation ruler |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100093577A CN102538769A (en) | 2012-01-13 | 2012-01-13 | Deviation ruler |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102538769A true CN102538769A (en) | 2012-07-04 |
Family
ID=46346262
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012100093577A Pending CN102538769A (en) | 2012-01-13 | 2012-01-13 | Deviation ruler |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102538769A (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN88200450U (en) * | 1988-01-16 | 1988-12-14 | 浙江省鄞县潘火宋立记建筑营造厂 | Installation instrument of building equipment |
| CN2089616U (en) * | 1990-09-05 | 1991-11-27 | 薄建民 | Multifunctional levelling instrument |
| CN2651706Y (en) * | 2003-10-29 | 2004-10-27 | 陆发顺 | Gravity horizontal vertical angle tester |
| CN201188000Y (en) * | 2008-02-15 | 2009-01-28 | 中国葛洲坝集团股份有限公司 | Leveling ruler capable of measuring arbitrary inclination |
| JP2010100023A (en) * | 2008-10-27 | 2010-05-06 | Kumashiro Hisayoshi | Straight ruler compass |
-
2012
- 2012-01-13 CN CN2012100093577A patent/CN102538769A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN88200450U (en) * | 1988-01-16 | 1988-12-14 | 浙江省鄞县潘火宋立记建筑营造厂 | Installation instrument of building equipment |
| CN2089616U (en) * | 1990-09-05 | 1991-11-27 | 薄建民 | Multifunctional levelling instrument |
| CN2651706Y (en) * | 2003-10-29 | 2004-10-27 | 陆发顺 | Gravity horizontal vertical angle tester |
| CN201188000Y (en) * | 2008-02-15 | 2009-01-28 | 中国葛洲坝集团股份有限公司 | Leveling ruler capable of measuring arbitrary inclination |
| JP2010100023A (en) * | 2008-10-27 | 2010-05-06 | Kumashiro Hisayoshi | Straight ruler compass |
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| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
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| AD01 | Patent right deemed abandoned |
Effective date of abandoning: 20120704 |
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| C20 | Patent right or utility model deemed to be abandoned or is abandoned |