CN102390003A - Laser processing state detection method and apparatus and method for manufacturing solar cell board - Google Patents
Laser processing state detection method and apparatus and method for manufacturing solar cell board Download PDFInfo
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- CN102390003A CN102390003A CN2011103426996A CN201110342699A CN102390003A CN 102390003 A CN102390003 A CN 102390003A CN 2011103426996 A CN2011103426996 A CN 2011103426996A CN 201110342699 A CN201110342699 A CN 201110342699A CN 102390003 A CN102390003 A CN 102390003A
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Abstract
This invention is for examining an optical axis state and an output state of a laser during processing and is capable of examining a processing state of the laser in advance. Based on the examination results, conditions of the laser during processing are provided as feedback in advance to reduce unqualified production rate. In the invention, a laser is irradiated on a workpiece for processing. An image of a processing part of the workpiece is obtained immediately, and the processing state is examined according to the image. According to the invention, the processing state of the laser can be identified simultaneously based on the image obtained right after the laser processing is finished, and the processing state is feedbacked to modify the working conditions for greatly reducing unqualified production rate. In the invention, at least one of optical axis shift, pulse width, pulse height (laser power), or omission pulse is examined to determine the laser state during the processing. A pick-up device is disposed in a light path of the laser for branching and extracting a part of the laser. A light receiving device receives the laser after the branching and extraction, and an examination is implemented according to a light receiving signal.
Description
The application is an original application application number 200910246242.8, and on December 01 2009 applying date, denomination of invention is divided an application for " laser processing state detection method and device and method for manufacturing solar cell board ".
Technical field
The present invention relates to laser processing state detection method and device and solar panel (solar panel) manufacturing approach that a kind of machining state when utilizing laser beam to come film processed etc. is checked, laser processing state detection method and device and method for manufacturing solar cell board that the output state of the machining state when relating in particular to a kind of cut (laser scribe) processed of being carried out when solar panel is made, the optical axis state of laser beam and laser beam is checked.
Background technology
Be on light transmissive substrate (glass substrate), to form metal level, semiconductor layer, transparent electrode layer successively in the solar panel manufacturing step in the past; And utilize laser beam that each layer is processed as slat (comblike form) in each step after formation, thereby accomplish solar cell plate module (solar panel module).When so making the solar cell plate module, be on the film on the glass substrate, to utilize laser beam for example to form line of cut with the 10mm spacing.3 lines that the interval that this line of cut is about 30 μ m and line and line by live width is about 30 μ m constitute.When utilizing laser beam to form line of cut, the glass substrate illuminating laser beam that normally constant speed is moved.Thus, just can form the stable line of cut of the degree of depth and live width.About the manufacturing approach of this type of solar panel (photoelectric conversion device), there is Japanese Patent Laid to open the method that discloses in the 2006-054254 communique (patent documentation 1) as everyone knows.And, to the inspection of generating electricity of the solar cell plate module after accomplishing.About the situation of the inspection of in the solar panel manufacturing step, generating electricity like this, there is Japanese Patent Laid to open situation about disclosing in the 2008-066437 communique (patent documentation 2) as everyone knows.
In the manufacturing approach of the solar panel (photoelectric conversion device) that in patent documentation 1, discloses; Disclosed not is to use single mode (single mode) laser beam; Form line of cut and the laser beam that is to use multimode (multi-mode) is the laser beam of power distribution approximate trapezoid, guarantee high electric insulation property thus.Yet,, confirmed and can produce missing pulse (omission of pulses) with certain fixing probability at the aspect of performance of generating device of laser.If produce this missing pulse, exist the module utilize line of cut to cut apart can be electrically connected each other so and cause the short circuit problem of (causing adjacent unit to be connected to each other).
If because of a missing pulse is connected to each other adjacent unit, will cause voltage to descend so, even if therefore prevent that missing pulse is of crucial importance, but about this missing pulse, present situation in the past is in device, not implement the countermeasure of this missing pulse.And this missing pulse can be because of the life-span or the performance degradation of generating device of laser, and causes probability of happening to uprise, and therefore effectively anti-missing pulse here becomes the stable important topic of making solar panel.
In addition, when skew appearred in the optical axis of laser beam in the process of making solar panel, present situation in the past was after Laser Processing, directly to judge light shaft offset by the Visual Confirmation line of cut.
On the other hand, the solar panel manufacturing step that patent documentation 2 discloses is: process by laser beam and the manufacturing solar cells plate module after, to the inspection of generating electricity of this solar cell plate module.That is, under the whether suitable state of indeterminate laser beam processing still, carry out all processing, have or not laser beam to process caused weld defect defectives such as (secondary adhesions) and in subsequent step, detect.Therefore, defects detection opportunity postpones, thereby (real time) control is in real time removed with air mass flow etc., thus the tendency that existence causes defective generation probability to uprise because of control lag, thus go wrong.
This shows that above-mentioned existing method for manufacturing solar cell board obviously still has inconvenience and defective, and demands urgently further improving in product structure, manufacturing approach and use.In order to solve the problem of above-mentioned existence; Relevant manufacturer there's no one who doesn't or isn't seeks solution painstakingly; But do not see always that for a long time suitable design is developed completion; And common product and method do not have appropriate structure and method to address the above problem, and this obviously is the problem that the anxious desire of relevant dealer solves.Therefore how to found a kind of new laser processing state detection method and device and method for manufacturing solar cell board, real one of the current important research and development problem that belongs to, also becoming the current industry utmost point needs improved target.
Summary of the invention
The present invention develops to form in view of the above problems; A kind of laser processing state detection method and device and method for manufacturing solar cell board are provided; Can man-hour the optical axis state of laser beam and the output state of laser beam be checked adding; But and the state of earlier detection laser beam processing, and in view of the above in early days feedback (feedback) laser beam add the condition in man-hour, thereby reduce defective generation rate.
Laser processing state detection method of the present invention is characterised in that illuminating laser beam is implemented processing to workpiece, immediately obtains the image of the working position of said workpiece, and according to this image inspection machining state.Image after can just finishing according to laser beam processing, the machining state of real-time (realtime) identification laser beam, and can make the processing conditions optimization through it is fed back, obviously reduce defective generation rate.
The 1st characteristic of laser processing state testing fixture of the present invention comprises: maintaining body is used for keeping workpiece; The laser beam irradiation means is to said workpiece illuminating laser beam; And inspection body, after processing, obtain the image of the working position of said workpiece immediately by said laser beam irradiation, and according to said image inspection machining state.The present invention is provided with inspection body in laser processing device in the past; And early stage feedback laser bundle adds the condition in man-hour; To reduce defective generation rate, wherein, said inspection body be obtain laser beam irradiation processing just the image after the end so that machining state is checked.
The 2nd of laser processing state testing fixture of the present invention is characterised in that: in the laser processing state testing fixture of said the 1st characteristic record, also comprise aspirating mechanism; This aspirating mechanism is an aspirating mechanism of drawing the splash that sputters from workpiece because of the irradiation of said laser beam; This aspirating mechanism constitutes: be formed on the spiral groove that is in the trumpet-shaped suction inlet through utilization, make to produce eddy current (vortex flow) near the said suction inlet and suck said splash.The present invention is through in horn-like suction inlet, cutting spiral thread, make near the eddy current (vortex flow) that produces of suction inlet, suction force and suction flow velocity are improved, dispersing from surface of the work thereby effectively remove splash.
The 3rd of laser processing state testing fixture of the present invention is characterised in that: in the laser processing state testing fixture of said the 1st characteristic or the record of the 2nd characteristic, also comprise air knife mechanism; When said workpiece handling is arrived the irradiation position of said laser beam; Through to said surface of the work ejection air, purge the dust of said surface of the work etc.The present invention is when workpiece is moved into the Laser Processing position, by air knife mechanism ejection air, purges attached to the dust on the surface of the work, thereby dust is removed.
The 4th of laser processing state testing fixture of the present invention is characterised in that: in the laser processing state testing fixture of said the 1st characteristic, the 2nd characteristic or the record of the 3rd characteristic, also comprise air knife mechanism; Face said surface of the work ejection air through one in the face of workpiece shines said laser beam,, purge the dust on the said surface of the work.The present invention is provided with air knife mechanism near the workpiece that when Laser Processing, relatively moves, and in the Laser Processing processing procedure, to surface of the work ejection air, to purge the dust on the surface of the work, dust is removed.
Method for manufacturing solar cell board of the present invention is characterised in that: use the laser processing state testing fixture of arbitrary characteristic record in said laser processing state detection method or said the 1st to the 4th characteristic, make solar panel.Use any in said laser processing state detection method or the said laser processing state testing fixture, make solar panel.
The 1st of laser processing state detection method of the present invention is characterised in that: simultaneously shining through laser beam is simultaneously relatively moved to workpiece; When coming that said workpiece implemented the Laser Processing of processing of regulation; Bifurcated extracts a part of said laser beam in the light path of said laser beam, and checks the state of said laser beam according to the laser beam that is extracted.The present invention can extract a part of said laser beam through sampling when Laser Processing, comes real-time inspection to be in the state of the laser beam under the machining state.
The 2nd of laser processing state detection method of the present invention is characterised in that: in the laser processing state detection method of said the 1st characteristic record; According to light shaft offset, pulse width, pulse height and the missing pulse of said laser beam at least one, check the state of said laser beam.The present invention is at least one in the light shaft offset, pulse width, pulse height (laser power), missing pulse of inspection laser beam, the state of laser beam during as Laser Processing.
The 1st characteristic of laser processing state testing fixture of the present invention comprises: maintaining body is used for keeping workpiece; The laser beam irradiation means to said workpiece illuminating laser beam, is implemented the processed of regulation; Extraction mechanism, bifurcated extracts a part of said laser beam in the light path of said laser beam; Optical receiver receives the said laser beam that is extracted by said extraction mechanism; And inspection body, according to signal, check the state of said laser beam from said optical receiver.The present invention can be in the light path of laser beam configuration extraction mechanism; Extract a part of laser beam with bifurcated; And receive behind the laser beam that bifurcated extracts by optical receiver, check light shaft offset, intensity (pulse height) or pulse width, the missing pulse etc. of laser beam according to this light receiving signal.And; Through laser beam that bifurcated extracts because of intensity relatively a little less than, therefore can be through utilizing charge-coupled image sensor (charge coupled device, CCD) direct reception light such as camera; The optical axis position of holding said laser beam is as image, and checks light shaft offset in view of the above.
The 2nd of laser processing state testing fixture of the present invention is characterised in that: in the laser processing state testing fixture of said the 1st characteristic record; Said inspection body is according to the signal from said optical receiver; And, check the state of said laser beam according among light shaft offset, pulse width, pulse height and the missing pulse of said laser beam at least one.The present invention is by the signal of inspection body basis from optical receiver, at least one among the light shaft offset of the laser beam state laser beam during the inspection Laser Processing, pulse width, pulse height (laser power), the missing pulse.
The 3rd characteristic of laser processing state testing fixture of the present invention comprises: maintaining body is used for keeping workpiece; The laser beam irradiation means to said workpiece illuminating laser beam, is implemented the processed of regulation; Extraction mechanism, bifurcated extracts a part of said laser beam in the light path of said laser beam; Opto-electronic conversion mechanism receives the said laser beam that is extracted by said extraction mechanism, and output and the corresponding signal of said laser beam intensity that is received; Image acquisition mechanism receives the said laser beam that is extracted by said extraction mechanism, and obtains the image of said laser beam; And inspection body, according to from the signal of said opto-electronic conversion mechanism and from the light-receiving image of said image acquisition mechanism, check the state of said laser beam.The present invention can be in the light path of laser beam configuration extraction mechanism; Extract the part of laser beam with bifurcated; And will after the laser beam reception that bifurcated extracts, carry out signalling by opto-electronic conversion mechanism and handle; Just can check intensity of laser beam (pulse height) or pulse width, missing pulse etc. thus, and can obtain the light-receiving image of the laser beam that extracts through bifurcated, and check the light shaft offset of laser beam according to the light spot image (spot image) of laser beam by image acquisition mechanism.Through laser beam that bifurcated extracts because of intensity relatively a little less than, therefore can directly receive light through utilizing CCD camera etc., the optical axis position of holding said laser beam is as image, and checks light shaft offset in view of the above.In addition, also can obtain the images of positions that expression shines the laser beam in the opto-electronic conversion mechanism, obtain the light spot image of laser beam through utilizing image acquisition mechanism.
The 4th of laser processing state testing fixture of the present invention is characterised in that: in the laser processing state testing fixture of said the 3rd characteristic record; Said inspection body is according to the signal from said opto-electronic conversion mechanism; Check at least one among pulse width, pulse height and the missing pulse of said laser beam; And, check the light shaft offset of said laser beam according to light-receiving image from said image acquisition mechanism.
Method for manufacturing solar cell board of the present invention is characterised in that: use the laser processing state testing fixture of arbitrary characteristic record in laser processing state detection method or said the 1st to the 4th characteristic of the said the 1st or the 2nd characteristic record, make solar panel.The present invention is to use any in said laser processing state detection method or the said laser processing state testing fixture, makes solar panel.
[effect of invention]
According to the present invention, has following effect: the optical axis state of checking laser beam man-hour and the output state of laser beam can added, and the state of earlier detection laser beam processing, and early stage in view of the above feedback laser bundle adds the condition in man-hour, reduce defective generation rate.
Above-mentioned explanation only is the general introduction of technical scheme of the present invention; Understand technological means of the present invention in order can more to know; And can implement according to the content of specification, and for let of the present invention above-mentioned with other purposes, feature and advantage can be more obviously understandable, below special act preferred embodiment; And conjunction with figs., specify as follows.
Description of drawings
Fig. 1 is the schematic configuration sketch map of the laser processing state testing fixture of an embodiment of the present invention.
Fig. 2 is the optical system member of Fig. 1 and the structural representation of machining state detection optical system member.
Fig. 3 is the sketch map about other embodiment of the solar cell board manufacturing apparatus of said embodiment.
Fig. 4 is the sketch map about another other embodiment of the solar cell board manufacturing apparatus of said embodiment.
Fig. 5 is the schematic configuration sketch map about the laser processing device of an embodiment of the present invention.
Fig. 6 is the detailed structure sketch map of the optical system member of Fig. 5.
Fig. 7 is the structural representation of the laser beam detection optical system member of Fig. 5.
Fig. 8 is the block diagram of detailed process of the control device of presentation graphs 6.
Fig. 9 A-Fig. 9 C is the sketch map that an example of the missing pulse decision mechanism of Fig. 7 is moved.
Figure 10 is the sketch map of the routine waveform exported in the high-speed photodiode by Fig. 9.
1: workpiece
10,101: pedestal
20,201:XY platform
30: travelling carriage
301: framework
31: base plate
33,35: speculum
37: through hole
40,401: generating device of laser
50,501: the optical system member
500: phase type diffraction optical element (DOE)
511～513: the semi reflective mirror
52,54: length measurement system is used in automatic focus
521～528: speculum
531～534: tripper
541～544: collector lens
60,601: machining state detection optical system member
60: the align cameras device
61: detection illumination is penetrated and is used laser instrument
62: photodiode is used in automatic focus
63: the ccd array sensor is used in inspection
70: linear encoder
701: aspirator
80: control device
801～804: the weakening member
81: bifurcated mechanism
82: missing pulse decision mechanism
83: alarm produces mechanism
84: benchmark ccd image storing mechanism
84a: benchmark ccd image
85: light shaft offset measures measuring mechanism
85a: be examined image
86: laser controller
91～93: air knife apparatus
92,93: the light beam sampler
94: high-speed photodiode
96: the CCD camera is used in the optical axis inspection
The specific embodiment
Below, according to graphic embodiment of the present invention is described.Fig. 1 is the schematic configuration sketch map of the laser processing state testing fixture of an embodiment of the present invention.This laser processing state testing fixture constitutes: in laser beam processed (cut) step of solar cell board manufacturing apparatus, said laser processing state is checked.
The solar cell board manufacturing apparatus of Fig. 1 is by formations such as pedestal (pedestal) 10, XY platform 20, generating device of laser 40, optical system member 50, machining state detection optical system member 60 and air conditioning chambers.The air conditioning chamber is formed on the upside of pedestal 10, and the concrete structure for the air conditioning chamber omits explanation here.Be provided with on the pedestal 10 along the X-direction on the pedestal 10 and Y direction (XY plane) by the XY platform 20 of drive controlling.Upside at this XY platform 20 maintains the workpiece 1 as the Laser Processing object.And, on pedestal 10, be provided with: the travelling carriage (slide frame) 30 that simultaneously keeps optical system member and machining state detection optical system member, one side to be slided and drive along Y direction.In addition, in the time can utilizing travelling carriage 30 fully to guarantee the amount of movement of Y direction, XY platform 20 also can constitute and only carry out moving of X-direction.At this moment, XY platform 20 also can be an X shaft platform structure.
On the base plate 31 of travelling carriage 30, be provided with: generating device of laser 40, optical system member 50 and machining state detection optical system member 60.Optical system member 50 is constituted by eyeglass (mirror) and lens (lens), this optical system member 50 will be divided into 4 series by the laser beam that generating device of laser 40 is produced after, on the workpiece 1 on the guiding XY platform 20.In addition, cutting apart of laser beam is not defined as 4 series, also can be below 3 series or 3 series, or 5 series or 5 more than the series, and, also can be a series of not carrying out cutting apart.Actual optical system member 50 is comparatively complicated, simply will illustrate reduced representation in order to make explanation.XY platform 20 receives mobile control along directions X and Y direction.In addition, the driving mechanism of XY platform 20 use ball screw (ball screw) or linear motor (linear motor) etc., but these all omits diagram.
Travelling carriage 30 is installed in the travelling carriage set on four jiaos on the pedestal 10.Travelling carriage 30 receives the mobile control of this travelling carriage along the Y direction.Between base plate 31 (base plate) and travelling carriage, weakening member (not shown) is being set.In addition, though not shown, XY platform 20 constitutes: can be rotated along the θ direction for rotating shaft by the Z axle.
Fig. 2 is the optical system member of Fig. 1 and the structural representation of machining state detection optical system member.Penetrate with laser instrument 61, automatic focus is with photodiode (automatic focus photodiode) 62 and check with 63 formations of charge-coupled image sensor (CCD) sensor array by illumination by detecting for machining state detection optical system member 60.Automatic focus receives by detecting illumination with photodiode 62 and penetrates the reverberation that reflects in the light that is shone with laser instrument 61, from the surface of workpiece 1; And, inspection is adjusted with the height (focus) of ccd array sensor 63 relative workpiece 1 according to this reflection light quantity.Inspection receives by detecting illumination with ccd array sensor 63 and penetrates the reverberation that reflects from the surface of workpiece 1 in the light that is shone with laser instrument 61, and will output in the not shown control device with the corresponding reverberation detection signal of this reflection light quantity.
Control device is according to coming the reverberation detection signal of self-check with ccd array sensor 63; The laser beam that detection is produced by generating device of laser 40 is to the machining state of workpiece 1; And after will processing case studies such as defective, processing conditions; Feed back in the output condition, environment temperature etc. of generating device of laser 40, with the control machining state.
In the solar cell board manufacturing apparatus of Fig. 1 and Fig. 2; Produce laser beam by above-mentioned generating device of laser 40; And by optical system member 50 with on the laser beam direction XY platform 20; Thereby to 1 illuminating laser beam of the workpiece on the XY platform 20, meanwhile XY platform 20 is moved control, make on the surface film of workpiece 1 and form groove.
Fig. 3 is the sketch map about other embodiment of the solar cell board manufacturing apparatus of said embodiment.This solar cell board manufacturing apparatus is the back side illuminaton laser beam from workpiece 1, thereby on the film of surface of the work, forms groove.The difference of the solar cell board manufacturing apparatus of Fig. 3 and the solar cell board manufacturing apparatus of Fig. 1 is: on pedestal 101, carry generating device of laser 401 and optical system member 501, and XY platform 201, machining state detection optical system member 601 and aspirator 701 are arranged on the top of framework 301 (frame).The air conditioning chamber forms with the mode that covers integral device such as pedestal 101, framework 301, XY platform 201, machining state detection optical system member 601 and aspirator 701, but the concrete structure of air conditioning chamber is omitted explanation here.
XY platform 201 constitutes: is installed on the framework 301 across not shown framing component, and along being activated control with the parallel face in XY plane (X-direction (transverse direction among the figure) and Y direction (the depth direction among the figure)) of pedestal 101.Upside at this XY platform 201 maintains the workpiece 1 as the Laser Processing object.And the optical system member of being located on the pedestal 101 501 receives the driving of sliding on pedestal 101 upper edge Y directions (the depth direction among the figure).
Machining state detection optical system member 601 and aspirator 701 constitute: be installed on the framework 301 across not shown framing component, and XY platform 201 is relatively moved.Aspirator 701 utilizes vacuum draw to draw laser beam to add the splash that sputter from the surface of workpiece 1 man-hour.Common aspirator comprises and is trumpet-shaped suction inlet simply, but is in trumpet-shaped side cut spiral groove to be arranged about the aspirator 701 of this embodiment.That is, constitute the spiral groove that is on the trumpet-shaped suction inlet through being formed on, and produce eddy current (vortex flow (scroll flow)) near making suction inlet, and suck splash thus.So; Just can be through horn-like part cutting spiral thread at aspirator 701; And produce eddy current (vortex flow) near making suction inlet; So suction force and suction flow velocity near the aspirator 701 are significantly improved, splash out from workpiece 1 surface thereby can effectively remove splash.
The machining state detection optical system member 60 of the structure of machining state detection optical system member 601 and Fig. 2 is identical, is penetrated with laser instrument, automatic focus by mobile detection illumination to constitute with the ccd array sensor with photodiode and inspection.Automatic focus receives by detecting the reverberation that illumination is penetrated among the light that shines with laser instrument, reflected from the surface of workpiece 1 with photodiode, and according to its reflection light quantity, adjusts with the height (focus) of the relative workpiece 1 of ccd array sensor checking.Inspection receives the reverberation of being penetrated among the light that shines with laser instrument, being reflected from the surface of workpiece 1 by detection illumination with the ccd array sensor, and will output in the not shown control device with the corresponding reverberation detection signal of its reflection light quantity.
Optical system member 501 is made up of the combination of eyeglass and lens, and it will be divided into 4 series by the laser beam that generating device of laser 401 is produced, and on the workpiece 1 on the guiding XY platform 201.In addition, cutting apart of laser beam is not defined as 4 series, also can be below 3 series or 3 series, or 5 series or 5 more than the series, and, also can be a series of not carrying out cutting apart.Actual optical system member 501 is comparatively complicated, simply will illustrate reduced representation in order to make explanation.XY platform 201 receives mobile control along directions X (transverse direction among the figure) and Y direction (the depth direction among the figure).In addition, the driving mechanism of XY platform 201 uses ball screw or linear motor etc., and these all omit diagram.
Framework 301 is across four jiaos the weakening member 801～804 that is located on the pedestal 101, and is provided with at an upper portion thereof.In addition, though not shown, XY platform 201 constitutes: can the Z axle (among the figure vertically) be rotated along the θ direction for rotating shaft.
The control device basis is from the reverberation detection signal of the inspection in the machining state detection optical system member 601 with the ccd array sensor; And detect the laser beam that produced by generating device of laser 401 machining state to workpiece 1; And will process after problems such as defective, processing conditions analyze; Feed back in the output condition, environment temperature etc. of generating device of laser 401, thus the control machining state.
The solar cell board manufacturing apparatus of Fig. 3 is to utilize above-mentioned generating device of laser 401 to produce laser beam; By optical system member 501 with on the said laser beam direction XY platform 201; And to the film illuminating laser beam of the workpiece on the XY platform 201 1; Meanwhile, XY platform 201 is implemented to move control, make on the surface film of workpiece 1 and form groove.So just can utilize the lasser cutting of solar cell board manufacturing apparatus; The defectives such as splatter of thin-film material when each other the caused defective of distance, missing pulse of ditch groove width or the groove that detects the lip-deep groove that is formed on workpiece 1, Laser Processing; Therefore; Can these be processed problem such as defective, processing conditions and analyze, feed back to the output condition, environment temperature of generating device of laser 401 etc., thereby control said machining state in real time (real time).And, also can process whether relatively differentiating of front and back is the caused defective of state before the processing and utilize through before processing, checking.
Fig. 4 is the sketch map about another other embodiment of the solar cell board manufacturing apparatus of said embodiment.When the lasser cutting of solar cell board manufacturing apparatus, will produce non-crystalline silicon (the cutting cut of film of α-Si).Said film is splashed in the atmosphere as stated sometimes, and attached on the workpiece 1, causes cut defective thus.And because of existing attached to workpiece 1 lip-deep various dust etc., and it is defective to cause producing cut.Therefore, in the embodiment of Fig. 4, when the workpiece 1 of the solar cell board manufacturing apparatus of Fig. 2 is moved into, use air knife (air knife) device 91, utilize air purge (air purge) attached to workpiece 1 lip-deep dust etc., thereby with removings such as dust.And this embodiment constitutes: when Laser Processing, air knife apparatus 92,93 is set in the front and back of the workpiece 1 that moves along X-direction (figure middle horizontal square to), thereby before lasser cutting with removings such as dust.For example, when workpiece 1 moved to the right side among the figure, then the air knife apparatus 93 from its opposition side sprayed air; On the contrary, when workpiece 1 moved to the left side among the figure, then the air knife apparatus 92 from its opposition side sprayed air.
In addition, the embodiment of Fig. 4 is: the air ejection of air knife apparatus 92,93 is flowed becomes intersection, but the ejection of air is flowed and also can just in time be intersected at the Laser Processing position.At this moment, regardless of the moving direction of workpiece 1, all can be always from air knife apparatus 92,93 ejection air.Also can air knife apparatus shown in Figure 4 91～93 be applied in the solar cell board manufacturing apparatus of Fig. 3.At this moment, air knife apparatus 92,93 is arranged on the two ends of aspirator 701.At this moment, the dust that purges through air knife etc. is sucked into aspirator 701, therefore can not be distributed in the atmosphere, thus can be effectively with removings such as dust.And the film after also can avoiding evaporating is attached on the optical system.In addition, in the said embodiment, the situation that air knife is arranged on the single face side of workpiece is illustrated, but the air knife setting also can be arranged on the two sides side.
Fig. 5 is the schematic configuration sketch map about the laser processing device of an embodiment of the present invention.This laser processing device is the device that carries out laser beam processed (cut) step of solar cell board manufacturing apparatus.
The solar cell board manufacturing apparatus of Fig. 5 is made up of pedestal 10, XY platform 20, generating device of laser 40, optical system member 50, align cameras device 60, linear encoder (linear encoder) 70, control device 80 and laser beam detection optical system member etc.Be provided with on the pedestal 10: the XY platform 20 that on pedestal 10, is activated control along X-direction and Y direction (XY plane).
Travelling carriage 30 is installed on four jiaos of set travelling carriages on the pedestal 10.Travelling carriage 30 receives the mobile control of this travelling carriage along Y direction.Weakening member (not shown) is being set between base plate 31 and travelling carriage.On the base plate 31 of travelling carriage 30, be provided with: generating device of laser 40, optical system member 50, control device 80 and laser beam detection optical system member.Optical system member 50 is constituted by eyeglass and lens, and it will be divided into 4 series by the laser beam that generating device of laser 40 is produced, and on the workpiece 1 on the guiding XY platform 20.In addition, the number of cutting apart of laser beam is not defined as 4 series, can be 2 series or 2 more than the series.
Near the image that align cameras device 60 obtains on the XY platform 20 and the both ends of workpiece 1 (the front and back edge part of X-direction) is.The image that obtained of align cameras device 60 is outputed in the control device 80 thus.(identity, ID) data are stored in database (data base) mechanism, to be used for the registration process of workpiece 1 subsequently together for the image of control device 80 camera apparatus of autoregistration in the future 60 and the identifier of workpiece 1.Linear encoder 70 is made up of the scale member and the test section of the side of the X axle mobile platform that is arranged on XY platform 20.
As shown in the figure, optical system member 50 is arranged on the lower face side of base plate 31.The speculum 33,35 of the laser beam direction optical system member 50 that is used for from generating device of laser 40, penetrating is arranged on the base plate 31.The laser beam that from generating device of laser 40, the penetrates mirror 33 that is reflected reflexes to speculum 35, and speculum 35 makes the reflection lasering beam from speculum 33, via the through hole and the optics component of a system 50 that leads that are arranged on the base plate 31.In addition, if the laser beam that from generating device of laser 40, penetrates can be through being arranged on the through hole on the base plate 31, and import to the optical system member 50 from upside, optical system member 50 can adopt arbitrary structures so.For example, also can generating device of laser 40 be arranged on the upside of through hole, via through hole directly with laser beam direction optical system member 50.
Fig. 6 is the sketch map of the detailed structure of optical system member 50.The complex structure of actual optical system member 50 is here in order to make explanation simply will illustrate reduced representation.Fig. 6 is from the figure of Fig. 5-X-direction viewing optical system member 50 inside.As shown in Figure 6, on base plate 31, have through hole 37, this through hole 37 is used for being imported in the optical system member 50 by 35 laser light reflected bundles of speculum.Under this through hole 37, the phase type diffraction optical element (Diffractive Optical Element, DOE) 500 that the laser beam of Gauss (Gaussian) intensity distributions are converted into the laser beam of top hat (top hat) intensity distributions are being set.
Convert the laser beam of top hat intensity distributions laser beam (top hat light beam) into by DOE500; Via semi reflective mirror (half mirror) 511 respectively bifurcated be folded light beam and transmitted light beam; Folded light beam is advanced towards right-hand semi reflective mirror 512, and transmitted light beam advances towards the speculum 524 of below.Is folded light beam and transmitted light beam via semi reflective mirror 511 beam reflected by semi reflective mirror 512 further bifurcateds, and folded light beam is advanced towards the speculum 522 of below, and transmitted light beam advances towards right-hand speculum 521.The light beam that penetrates semi reflective mirror 512 is reflected after mirror 521 reflections, shines workpiece 1 via the collector lens 541 of below.Be reflected after mirror 522,523 reflection via semi reflective mirror 512 beam reflected, shine workpiece 1 via the collector lens 542 of below.The light beam that penetrates semi reflective mirror 511 via speculum 524 reflections after, advance towards left.Is folded light beam and transmitted light beam via speculum 524 beam reflected by semi reflective mirror 513 bifurcateds, and folded light beam is advanced towards the speculum 526 of below, and transmitted light beam advances towards the speculum 528 of left.Be reflected after mirror 526,527 reflection via semi reflective mirror 513 beam reflected, shine workpiece 1 via the collector lens 543 of below.The light beam that penetrates semi reflective mirror 513 is reflected after mirror 528 reflections, shines workpiece 1 via the collector lens 544 of below.
By the top hat light beam of DOE500 conversion, after penetrating, reflect via said semi reflective mirror 511～513 and speculum 521～528, and be directed to collector lens 541～544.At this moment, the optical path length till setting from DOE500 to each collector lens 541～544 becomes equal.Promptly; Penetrate semi reflective mirror 512 back, reflex to the optical path length till the collector lens 541 by 511 beam reflected of semi reflective mirror by speculum 521; Reflexed to the optical path length till the collector lens 542 by semi reflective mirror 511 beam reflected respectively by semi reflective mirror 512, speculum 522,523; Be reflected mirror 523, semi reflective mirror 513, speculum 526,527 of the light beam that penetrates semi reflective mirror 511 reflexes to the optical path length till the collector lens 543 respectively; And be reflected mirror 523 reflection and penetrate semi reflective mirror 513 backs and reflex to the optical path length till the collector lens 544 by speculum 528 of the light beam that penetrates semi reflective mirror 511, be respectively equal distance.Thus, even if at the DOE500 of configuration nearby of beam bifurcation, collector lens 541～544 also can likewise lead the laser beam of top hat intensity distributions.
Fig. 7 is the structural representation of laser beam detection optical system member.Like Fig. 5 and shown in Figure 7, laser beam detection optical system member is checked with 96 formations of CCD camera by light beam sampler (beam sampler) 92,93, high-speed photodiode 94 and optical axis.Light beam sampler 92,93 is arranged in the light path that imports to the laser beam in the optical system member 50.In this embodiment, light beam sampler 92,93 is arranged between generating device of laser 40 and the speculum 33.Light beam sampler the 92, the 93rd outputs to component external to a part of laser beam (for example, about light quantity below about 1 one-tenth or 1 one-tenth of laser beam) back bifurcated of sampling.High-speed photodiode 94 disposes with near the mode that the substantial middle of light receiving surface, receives a part of laser beam (specimen beam) of being exported by light beam sampler 92 bifurcateds.Outputed in the control device 80 with the corresponding output signal of the laser beam intensity that is detected by high-speed photodiode 94.The optical axis inspection is disposed with near the mode that the substantial middle of light receiving surface, receives a part of laser beam (specimen beam) of being exported by light beam sampler 93 bifurcateds with CCD camera 96.The image of being taken with CCD camera 96 by the optical axis inspection is outputed in the control device 80.In addition, optical axis inspection also can obtain the image of the laser beam position of representing to shine high-speed photodiode 94 with CCD camera 96, and this image is outputed in the control device 80.
Fig. 8 is the block diagram of the detailed process of expression control device 80.Control device 80 produces mechanism 83, benchmark ccd image storing mechanism 84, light shaft offset measurement measuring mechanism 85 and 86 of laser controllers by bifurcated mechanism 81, missing pulse decision mechanism 82, alarm and constitutes.Bifurcated mechanism 81 makes detection signal (clock pulses (clock the pulse)) bifurcated of linear encoder 70 and outputs in the laser controller 86 of back segment.
Missing pulse decision mechanism 82 input and the detection signal of being exported from the corresponding output signal of the laser beam intensity of high-speed photodiode 94 (diode output) and bifurcated mechanism 81 (clock pulses), and judge the missing pulse of laser beam in view of the above.Fig. 9 is the sketch map of an example of the action of missing pulse decision mechanism 82.Fig. 9 A representes an example of the detection signal (clock pulses) that bifurcated mechanism 81 is exported; Fig. 9 B representes an example of the corresponding output signal of the laser beam intensity of being exported with high-speed photodiode 94 (diode output), and Fig. 9 C representes an example of the alarm signal that missing pulse decision mechanism 82 is exported when missing pulse detects.
Shown in Fig. 9 A-Fig. 9 C, missing pulse decision mechanism 82 will be from the decline of the clock pulses of bifurcated mechanism 81 constantly as triggering (trigger) signal, and judge that the diode output valve is whether more than or equal to the threshold value Th of regulation.When diode output valve during, high level signal is outputed to alarm produce in the mechanism 83 less than threshold value Th.It is outside with following alert notification that alarm produces mechanism 83, and said alarm is represented: the signal from missing pulse decision mechanism 82 is changed to the moment of high level from low level, and produces missing pulse.The notice of alarm utilizes the whole bag of tricks such as image demonstration, pronunciation to carry out.Through producing alarm, the operator can the identification missing pulse produce.And, when this alarm frequently produces, mean the performance degradation or the end-of-life of generating device of laser.
Benchmark ccd image storing mechanism 84 is being stored benchmark ccd image 84a as shown in Figure 8.This benchmark ccd image 84a representes: the image that receives the state of laser beam in the optical axis inspection with the light receiving surface central authorities of CCD camera 96.Export the image 85a that is examined as shown in Figure 8 from optical axis inspection with CCD camera 96.Light shaft offset measures measuring mechanism 85 and obtains from the optical axis inspection and be examined image 85a with CCD camera 96; And will be examined image 85a and benchmark ccd image 84a compares; And the light shaft offset amount is measured, and this side-play amount is outputed in the laser controller 86.For example; When by optical axis inspection with 96 outputs of CCD camera as shown in Figure 8 be examined the image of image 85a that kind the time; So, light shaft offset measures measuring mechanism 85 both is compared the side-play amount with measured X axle and Y direction, and this side-play amount is outputed in the laser controller 86.86 pairs of devices relevant of laser controller, be that feedback adjustment is carried out in the configuration etc. that the ejaculation conditioned disjunction of generating device of laser 40 is used for laser beam is imported to the speculum 33,35 in the optical system member 50, so that be examined image 85a and benchmark ccd image 84a is consistent with the laser beam optical axis.
In the said embodiment, just check that the light shaft offset of laser beam and the situation of missing pulse are illustrated, but shown in figure 10, also can be according to output waveform from high-speed photodiode 94, and the pulse condition of inspection laser beam.For example, among Figure 10, pulse width and pulse height that also can the Laser Measurement bundle, and produce in these pulse widths and pulse height and to give the alarm when unusual.In addition; With regard to the pulse width of laser beam; To reach from the output waveform of high-speed photodiode 94 setting or more than the setting during when being in prescribed limit as normal condition, it is unusual when being greater than or less than this scope, to be judged to be pulse width, and the output alarm.And with regard to the pulse height of laser beam, as normal condition, it is unusual when being greater than or less than this allowed band, to be judged to be pulse height in the time of will being in the allowed band from the output waveform maximum of high-speed photodiode 94, and the output alarm.Like this, because the laser beam of sampling at any time, therefore can the real-time management pulse width, the quality of pulse height laser beams such as (power).If frequently produce aforesaid missing pulse, can judge generating device of laser 40 deteriorations so.
In the said embodiment, only observe the generation of missing pulse, but also can carry out the repairing (repair) of line of cut and handle through obtaining and store the coordinate data (position data) that missing pulse produces the position.
In the said embodiment; To utilizing the optical axis inspection directly to receive a part of laser beam (specimen beam) by the output of light beam sampler 93 bifurcateds with CCD camera 96; And handle the situation of checking light shaft offset and be illustrated through it being carried out image; But also can obtain the image that the light receiving surface central authorities that are illustrated in high-speed photodiode 94 receive the state of laser beam with CCD camera 96, be used as being examined image, and check light shaft offset thus through the optical axis inspection.
In the said embodiment, the light shaft offset of inspection laser beam and the situation of missing pulse are illustrated, but also can be with the state of inspection laser beam after light shaft offset, missing pulse, pulse width and the pulse height difference appropriate combination.
In the said embodiment; To workpiece 1 surface irradiation laser beam from being formed with film; Thereby the situation that on film, forms line of cut (groove) is illustrated, but also can be from the back side illuminaton laser beam of workpiece 1, thereby on the film of surface of the work, forms line of cut.
In the said embodiment; With the solar cell board manufacturing apparatus is that example is illustrated; But the present invention also can be applied in electroluminescent (electroluminescent; EL) (flat panel display, FPD) repair apparatus etc. carries out in the device of Laser Processing for panel manufacturing apparatus, EL panel repair apparatus, flat-panel monitor.
The above only is preferred embodiment of the present invention, is not the present invention is done any pro forma restriction; Though the present invention discloses as above with preferred embodiment; Yet be not in order to limiting the present invention, anyly be familiar with the professional and technical personnel, in not breaking away from technical scheme scope of the present invention; When the method for above-mentioned announcement capable of using and technology contents are made a little change or be modified to the equivalent embodiment of equivalent variations; In every case be the content that does not break away from technical scheme of the present invention, to any simple modification, equivalent variations and modification that above embodiment did, all still belong in the scope of technical scheme of the present invention according to technical spirit of the present invention.
Claims (8)
1. laser processing state detection method is characterized in that:
Laser beam is simultaneously relatively moved to workpiece simultaneously to be shone; So that said workpiece is implemented the Laser Processing of regulation processing; Bifurcated extracts a part of said laser beam in the light path of said laser beam, and checks the state of said laser beam according to the laser beam that is extracted.
2. laser processing state detection method according to claim 1 is characterized in that:
According among light shaft offset, pulse width, pulse height and the missing pulse of said laser beam at least one, check the state of said laser beam.
3. laser processing state testing fixture is characterized in that it comprises:
Maintaining body is used for keeping workpiece;
The laser beam irradiation means is to said workpiece illuminating laser beam, the processed of implementing to stipulate;
Extraction mechanism, bifurcated extracts a part of said laser beam in the light path of said laser beam;
Optical receiver receives the said laser beam that is extracted by said extraction mechanism; And
Inspection body according to the signal from said optical receiver, is checked the state of said laser beam.
4. laser processing state testing fixture according to claim 3 is characterized in that:
Said inspection body is checked the state of said laser beam according to from the signal of said optical receiver and according at least one of light shaft offset, pulse width, pulse height and the missing pulse of said laser beam.
5. laser processing state testing fixture is characterized in that it comprises:
Maintaining body is used for keeping workpiece;
The laser beam irradiation means is to said workpiece illuminating laser beam, the processed of implementing to stipulate;
Extraction mechanism, bifurcated extracts a part of said laser beam in the light path of said laser beam;
Opto-electronic conversion mechanism receives the said laser beam that is extracted by said extraction mechanism, and output and the corresponding signal of said laser beam intensity that is received;
Image acquisition mechanism receives the said laser beam that is extracted by said extraction mechanism, and obtains the light-receiving image; And
Inspection body according to from the signal of said opto-electronic conversion mechanism and from the said light-receiving image of said image acquisition mechanism, is checked the state of said laser beam.
6. laser processing state testing fixture according to claim 5 is characterized in that:
Said inspection body is according to the signal from said opto-electronic conversion mechanism; And check at least one among pulse width, pulse height and the missing pulse of said laser beam; And, check the light shaft offset of said laser beam according to said light-receiving image from said image acquisition mechanism.
7. method for manufacturing solar cell board makes laser beam shine the workpiece one side that simultaneously relatively moves, and said workpiece is implemented the processing of regulation, it is characterized in that:
When said Laser Processing, bifurcated extracts a part of said laser beam in the light path of said laser beam, and
Check the state of said laser beam according to the laser beam that is extracted.
8. method for manufacturing solar cell board according to claim 7 is characterized in that:
According among light shaft offset, pulse width, pulse height and the missing pulse of said laser beam at least one, check the state of said laser beam.
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008-322218 | 2008-12-18 | ||
| JP2008322218A JP2010142839A (en) | 2008-12-18 | 2008-12-18 | Method and apparatus for inspecting laser beam machining state, and method for manufacturing solar panel |
| JP2009031904A JP5460068B2 (en) | 2009-02-13 | 2009-02-13 | Laser light state inspection method and apparatus, and solar panel manufacturing method |
| JP2009-031904 | 2009-02-13 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| CN2009102462428A Division CN101752462B (en) | 2008-12-18 | 2009-12-01 | Laser processing state detection method and apparatus and method for manufacturing solar cell board |
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| CN102390003A true CN102390003A (en) | 2012-03-28 |
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| CN2009102462428A Expired - Fee Related CN101752462B (en) | 2008-12-18 | 2009-12-01 | Laser processing state detection method and apparatus and method for manufacturing solar cell board |
| CN2011103426996A Pending CN102390003A (en) | 2008-12-18 | 2009-12-01 | Laser processing state detection method and apparatus and method for manufacturing solar cell board |
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| CN2009102462428A Expired - Fee Related CN101752462B (en) | 2008-12-18 | 2009-12-01 | Laser processing state detection method and apparatus and method for manufacturing solar cell board |
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| TW (1) | TW201029781A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112139683A (en) * | 2019-06-28 | 2020-12-29 | 株式会社安川电机 | Evaluation device, evaluation method, evaluation system, and recording medium |
| TWI774047B (en) * | 2020-09-01 | 2022-08-11 | 林志遠 | Sheet metal laser processing machine |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6370227B2 (en) * | 2015-01-19 | 2018-08-08 | 株式会社ディスコ | Inspection method of laser beam |
| CN110193750A (en) * | 2019-06-18 | 2019-09-03 | 济南恒力特新机械有限公司 | Environmentally friendly cutting machine |
| CN110717488B (en) * | 2019-09-12 | 2022-11-29 | 武汉大学深圳研究院 | Method and device capable of removing SLM splash particles in real time |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2005086211A1 (en) * | 2004-03-04 | 2005-09-15 | Sharp Kabushiki Kaisha | Method for fabricating a semiconductor device and apparatus for inspecting a semiconductor |
| CN101136346A (en) * | 2007-08-31 | 2008-03-05 | 中山大学 | Chip welding spot on-line detecting, defect identification device and chip packaging device |
-
2009
- 2009-11-17 TW TW098138995A patent/TW201029781A/en unknown
- 2009-12-01 CN CN2009102462428A patent/CN101752462B/en not_active Expired - Fee Related
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112139683A (en) * | 2019-06-28 | 2020-12-29 | 株式会社安川电机 | Evaluation device, evaluation method, evaluation system, and recording medium |
| TWI774047B (en) * | 2020-09-01 | 2022-08-11 | 林志遠 | Sheet metal laser processing machine |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201029781A (en) | 2010-08-16 |
| CN101752462A (en) | 2010-06-23 |
| CN101752462B (en) | 2012-06-06 |
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Application publication date: 20120328 |