CN102353517B - 半导体激光器的温度分级筛选的平台及方法 - Google Patents
半导体激光器的温度分级筛选的平台及方法 Download PDFInfo
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CN103406280B (zh) * | 2013-08-28 | 2015-05-13 | 长贝光电(武汉)有限公司 | 一种不良芯片筛选方法 |
CN106324469A (zh) * | 2016-09-30 | 2017-01-11 | 深圳新飞通光电子技术有限公司 | 适用于光发射组件的多路piv测试系统及其测试方法 |
CN109000734A (zh) * | 2018-08-18 | 2018-12-14 | 成都飞机工业(集团)有限责任公司 | 实时监测光模块工作状态老化过程的方法 |
CN114247661B (zh) * | 2020-09-24 | 2023-04-28 | 长鑫存储技术有限公司 | 半导体产品分级方法和分级系统 |
US20220091175A1 (en) * | 2020-09-24 | 2022-03-24 | Changxin Memory Technologies, Inc. | Semiconductor product grading method and grading system |
Citations (4)
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CN1117136A (zh) * | 1995-08-11 | 1996-02-21 | 吉林大学 | 半导体激光器可靠性检测分析方法及其装置 |
CN2624203Y (zh) * | 2003-06-26 | 2004-07-07 | 惠州市中科光电有限公司 | 一种半导体激光器光电测试装置 |
CN1665080A (zh) * | 2004-03-02 | 2005-09-07 | 华为技术有限公司 | 一种检测激光器失效与老化的装置和方法 |
CN101183136A (zh) * | 2007-12-18 | 2008-05-21 | 吉林大学 | 高功率半导体激光器可靠性检测方法 |
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JPH0718755B2 (ja) * | 1989-10-23 | 1995-03-06 | 安藤電気株式会社 | マルチビーム型ldの発光特性測定装置 |
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CN1117136A (zh) * | 1995-08-11 | 1996-02-21 | 吉林大学 | 半导体激光器可靠性检测分析方法及其装置 |
CN2624203Y (zh) * | 2003-06-26 | 2004-07-07 | 惠州市中科光电有限公司 | 一种半导体激光器光电测试装置 |
CN1665080A (zh) * | 2004-03-02 | 2005-09-07 | 华为技术有限公司 | 一种检测激光器失效与老化的装置和方法 |
CN101183136A (zh) * | 2007-12-18 | 2008-05-21 | 吉林大学 | 高功率半导体激光器可靠性检测方法 |
Non-Patent Citations (2)
Title |
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半导体激光器筛选方法及可行性测试;李锐等;《长春师范学院学报(人文社会科学版)》;20081020(第10期);11-15页 * |
李锐等.半导体激光器筛选方法及可行性测试.《长春师范学院学报(人文社会科学版)》.2008,(第10期), |
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