CN102348965B - 用于使用时间延迟和积分传感器进行成像的时域复用 - Google Patents

用于使用时间延迟和积分传感器进行成像的时域复用 Download PDF

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Publication number
CN102348965B
CN102348965B CN201080011033.6A CN201080011033A CN102348965B CN 102348965 B CN102348965 B CN 102348965B CN 201080011033 A CN201080011033 A CN 201080011033A CN 102348965 B CN102348965 B CN 102348965B
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China
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unit
tdi sensor
light
insensitive
series
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CN201080011033.6A
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Chinese (zh)
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CN102348965A (zh
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E·R·基夫特
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Koninklijke Philips NV
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Koninklijke Philips Electronics NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J3/4406—Fluorescence spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G01N2021/6439—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" with indicators, stains, dyes, tags, labels, marks
    • G01N2021/6441—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" with indicators, stains, dyes, tags, labels, marks with two or more labels

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Spectrometry And Color Measurement (AREA)
CN201080011033.6A 2009-03-10 2010-03-08 用于使用时间延迟和积分传感器进行成像的时域复用 Active CN102348965B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP09305221 2009-03-10
EP09305221.5 2009-03-10
PCT/IB2010/050978 WO2010103448A1 (en) 2009-03-10 2010-03-08 Time domain multiplexing for imaging using time delay and integration sensors

Publications (2)

Publication Number Publication Date
CN102348965A CN102348965A (zh) 2012-02-08
CN102348965B true CN102348965B (zh) 2014-06-04

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CN201080011033.6A Active CN102348965B (zh) 2009-03-10 2010-03-08 用于使用时间延迟和积分传感器进行成像的时域复用

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Country Link
US (1) US8446502B2 (https=)
EP (1) EP2406599B1 (https=)
JP (1) JP5965644B2 (https=)
CN (1) CN102348965B (https=)
WO (1) WO2010103448A1 (https=)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8964088B2 (en) 2011-09-28 2015-02-24 Semiconductor Components Industries, Llc Time-delay-and-integrate image sensors having variable intergration times
JP5738422B2 (ja) * 2011-10-14 2015-06-24 三菱電機株式会社 Ｔｄｉ方式リニアイメージセンサ
CN104541500B (zh) * 2012-10-12 2018-11-06 统雷有限公司 采用ccd成像仪的时间延迟与积分扫描
MX2016011404A (es) * 2014-12-22 2016-11-16 Koninklijke Philips Nv Metodo para captura simultanea de datos de imagen a multiples profundidades de una muestra.
EP3107281B1 (en) * 2015-06-17 2020-03-18 IMEC vzw Device for imaging and method for acquiring a time delay and integration image
US10469782B2 (en) * 2016-09-27 2019-11-05 Kla-Tencor Corporation Power-conserving clocking for scanning sensors
CN108955890B (zh) * 2018-05-07 2019-12-10 上海海事大学 一种点目标探测型红外tdi探测器像元排列设计方法
GB2572662B (en) * 2018-10-05 2020-06-03 Res & Innovation Uk Raman spectrometer
KR102182867B1 (ko) * 2019-07-20 2020-11-25 주식회사 뷰웍스 노출 제어가 가능한 tdi 이미지 센서 및 이를 포함하는 제어 시스템
CN110823374B (zh) * 2019-10-31 2021-07-27 中国科学院西安光学精密机械研究所 同时获取高空间、高光谱分辨率光谱图像的光谱成像方法和系统
WO2026033432A1 (en) * 2024-08-09 2026-02-12 Orbotech Ltd Multi-modality with tdi sensor

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WO2003042644A1 (en) * 2001-11-16 2003-05-22 Amnis Corporation Imaging and analyzing parameters of small moving objects such as cells in broad flat flow
CN1748154A (zh) * 2003-02-10 2006-03-15 皇家飞利浦电子股份有限公司 集成电路的测试
CN101021490A (zh) * 2007-03-12 2007-08-22 3i系统公司 平面基板自动检测系统及方法
US20090311734A1 (en) * 2006-05-12 2009-12-17 Jan Greve Laser Illumination System in Fluorescent Microscopy

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JPH01228278A (ja) * 1988-02-22 1989-09-12 Optische Ind Oude Delft:Bv 撮像装置
US4954900A (en) * 1989-01-06 1990-09-04 Ball Corporation Imaging and wide sector searching apparatus
US5760899A (en) * 1996-09-04 1998-06-02 Erim International, Inc. High-sensitivity multispectral sensor
US5990503A (en) * 1998-01-14 1999-11-23 Dalsa, Inc. Selectable resolution CCD sensor
US6249341B1 (en) * 1999-01-25 2001-06-19 Amnis Corporation Imaging and analyzing parameters of small moving objects such as cells
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US6750963B2 (en) 2002-05-21 2004-06-15 Agilent Technologies, Inc. Imaging systems for signals on a surface
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JP2006014133A (ja) * 2004-06-29 2006-01-12 Lasertec Corp 撮像装置及び撮像方法
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WO2003042644A1 (en) * 2001-11-16 2003-05-22 Amnis Corporation Imaging and analyzing parameters of small moving objects such as cells in broad flat flow
CN1748154A (zh) * 2003-02-10 2006-03-15 皇家飞利浦电子股份有限公司 集成电路的测试
US20090311734A1 (en) * 2006-05-12 2009-12-17 Jan Greve Laser Illumination System in Fluorescent Microscopy
CN101021490A (zh) * 2007-03-12 2007-08-22 3i系统公司 平面基板自动检测系统及方法

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Also Published As

Publication number Publication date
WO2010103448A1 (en) 2010-09-16
CN102348965A (zh) 2012-02-08
US8446502B2 (en) 2013-05-21
US20110317052A1 (en) 2011-12-29
JP2012520455A (ja) 2012-09-06
EP2406599B1 (en) 2021-05-12
EP2406599A1 (en) 2012-01-18
JP5965644B2 (ja) 2016-08-10

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