CN102261895B - 区别对象区与基底区的方法及用该方法测量三维形状的方法 - Google Patents

区别对象区与基底区的方法及用该方法测量三维形状的方法 Download PDF

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Publication number
CN102261895B
CN102261895B CN201110096894.5A CN201110096894A CN102261895B CN 102261895 B CN102261895 B CN 102261895B CN 201110096894 A CN201110096894 A CN 201110096894A CN 102261895 B CN102261895 B CN 102261895B
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China
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area
image
measurement target
target
light
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CN201110096894.5A
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Chinese (zh)
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CN102261895A (zh
Inventor
权达颜
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Gaoying Technology Co ltd
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Koh Young Technology Inc
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Priority claimed from KR1020100035347A external-priority patent/KR101190127B1/ko
Priority claimed from KR1020100035255A external-priority patent/KR101190125B1/ko
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Publication of CN102261895A publication Critical patent/CN102261895A/zh
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/10—Image acquisition
    • G06V10/12—Details of acquisition arrangements; Constructional details thereof
    • G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/143—Sensing or illuminating at different wavelengths
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/10—Image acquisition
    • G06V10/12—Details of acquisition arrangements; Constructional details thereof
    • G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/145—Illumination specially adapted for pattern recognition, e.g. using gratings
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Artificial Intelligence (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
CN201110096894.5A 2010-04-16 2011-04-18 区别对象区与基底区的方法及用该方法测量三维形状的方法 Active CN102261895B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR1020100035347A KR101190127B1 (ko) 2010-04-16 2010-04-16 영역구분 방법
KR10-2010-0035255 2010-04-16
KR10-2010-0035347 2010-04-16
KR1020100035255A KR101190125B1 (ko) 2010-04-16 2010-04-16 3차원 형상 측정 방법

Publications (2)

Publication Number Publication Date
CN102261895A CN102261895A (zh) 2011-11-30
CN102261895B true CN102261895B (zh) 2014-07-09

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CN201110096894.5A Active CN102261895B (zh) 2010-04-16 2011-04-18 区别对象区与基底区的方法及用该方法测量三维形状的方法

Country Status (3)

Country Link
US (1) US8855403B2 (enExample)
JP (3) JP2011227080A (enExample)
CN (1) CN102261895B (enExample)

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CN102694963B (zh) * 2012-04-27 2014-09-17 南京航空航天大学 一种获取无阴影目标图像的方法
KR101590831B1 (ko) * 2013-04-02 2016-02-03 주식회사 고영테크놀러지 기판의 이물질 검사방법
WO2015161388A1 (en) * 2014-04-24 2015-10-29 Orell Füssli Sicherheitsdruck Ag Security device for security document
US10533952B2 (en) 2014-12-08 2020-01-14 Koh Young Technology Inc. Method of inspecting a terminal of a component mounted on a substrate and substrate inspection apparatus
US9747520B2 (en) * 2015-03-16 2017-08-29 Kla-Tencor Corporation Systems and methods for enhancing inspection sensitivity of an inspection tool
CN111788883B (zh) * 2018-02-26 2021-11-05 株式会社高迎科技 部件贴装状态的检查方法、印刷电路板检查装置及计算机可读记录介质
JP2024058314A (ja) * 2022-10-14 2024-04-25 オークマ株式会社 三次元形状測定システム
KR102831163B1 (ko) * 2023-07-11 2025-07-07 충북대학교 산학협력단 Pcb에 실장된 소자 높이 측정 장치 및 방법

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CA2277855A1 (fr) 1999-07-14 2001-01-14 Solvision Methode et systeme de mesure de la hauteur des billes de soudure d'un circuit imprime
US6501554B1 (en) * 2000-06-20 2002-12-31 Ppt Vision, Inc. 3D scanner and method for measuring heights and angles of manufactured parts
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Also Published As

Publication number Publication date
JP6211114B2 (ja) 2017-10-11
US20110255771A1 (en) 2011-10-20
CN102261895A (zh) 2011-11-30
JP2011227080A (ja) 2011-11-10
JP2014197023A (ja) 2014-10-16
US8855403B2 (en) 2014-10-07
JP2016122010A (ja) 2016-07-07

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Address after: Han Guoshouer

Patentee after: Gaoying Technology Co.,Ltd.

Address before: Han Guoshouer

Patentee before: KOH YOUNG TECHNOLOGY Inc.

CP01 Change in the name or title of a patent holder