CN102253326A - Test tool structure - Google Patents
Test tool structure Download PDFInfo
- Publication number
- CN102253326A CN102253326A CN2010101824138A CN201010182413A CN102253326A CN 102253326 A CN102253326 A CN 102253326A CN 2010101824138 A CN2010101824138 A CN 2010101824138A CN 201010182413 A CN201010182413 A CN 201010182413A CN 102253326 A CN102253326 A CN 102253326A
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- CN
- China
- Prior art keywords
- guide member
- carrier
- slide rail
- flat segments
- tool structure
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Abstract
The invention relates to a test tool structure, which comprises a frame body, a carrier plate and a bearing plate, wherein the carrier plate is arranged in accommodating space inside the frame body, and is provided with at least one sliding rail; the sliding rail has a flat section and a bending section which are connected mutually, and an included angle is formed between the flat section and the bending section; and the bearing plate is provided with at least one guiding piece, and slips between the flat section and the bending section in a reciprocating mode, so that the bearing plate can move to a loading position or a test position correspondingly. When the test tool structure is used, the problems of high manufacturing cost of a guide rail and overlarge accommodating space of a tool in the prior art are solved, and a carrier can be guided to be positioned to the test position effectively.
Description
Technical field
The present invention relates to a kind of testing tool structure, offer the testing tool structure that is used for circuit board testing of slide rail on particularly a kind of its support plate with bending segment.
Background technology
Flourish along with electronic industry, various electronic product has been applied in modern's the daily life, for example in large quantities: main frame, the webserver and industrial computer etc.In the exploitation of this electronic product, when the processing procedure final products, manufacturer can be detected the circuit board of main frame before host groups takes on factory, makes a mistake when being used to avoid main frame in the future at present.
Tradition places circuit board on one carrier producing the online test job of carrying out circuit board, and the mode of operation with manually pushes carrier in the tester table.Utilize the left and right sides pressure handle of tester table and pressure handle up and down again, gradation is fixed in circuit board on the test position, again circuit board is electrically connected at test port, to carry out test job.
Yet, these artificial means of conveyance, real be slow and labor intensive, and when a large amount of production, can't meet speed soon and requirement cheaply.Therefore, follow-up developments go out a kind of on the support plate of tester table, have additionally set up a guide rail, make carrier can advance or retreat the testing tool in guide rail.So, though this kind testing tool has solved the problem of aforementioned artificial propelling movement carrier, its manufacturing cost also improves relatively.In addition, because guide rail is to be set up on the support plate of tester table, therefore, the size of integrated testability instrument takes up space also with institute thereby becomes big.In this, not only cause the raising of manufacturing cost, also cause the ccontaining problem in space of testing tool simultaneously.
Further say,, make carrier advance or retreat though this kind testing tool can utilize the structure of its guide rail.But on the practical application aspect, because the promising rectangle of shape, non-rectangle or the irregular geometric configuration of circuit board, when using the guide rail of existing straight structure, carrier only can slide on the guide rail with straight-line displacement, can't make circuit board directly arrive its test position (promptly with test port electric connection place) efficiently.
Secondly, during application on practice, for the assembly of some the electronics spare parts on the testing tool of dodging or the connectivity port of test usefulness etc., the tester must adopt the straight-line displacement campaign of two-period form, and circuit board is pushed on the test position.That is to say that the tester must be by the pressure handle of tester table, with carrier respectively through directly to horizontal two-part be urged on the real test position, to carry out test job.In this, not only cause the operational inconvenience of tester, in order to carry out the motion of two-period form, the design of testing tool on its structure and interlinked mechanism also can be more complicated.
Summary of the invention
Technical matters to be solved by this invention provides a kind of testing tool structure, can solve the manufacturing cost of prior art guide rail too high with the excessive problem of accommodation space instrument, can guide carrier effectively again and carrier is positioned on the test position.
To achieve these goals, the invention provides a kind of testing tool structure, wherein, include:
One support body, inside have an accommodation space;
One support plate is arranged in this accommodation space, and this support plate offers at least one slide rail, and this slide rail has a flat segments and a bending segment that is connected, and has an angle between this flat segments and this bending segment; And
One carrier, activity is installed in this accommodation space, and this carrier has at least one guide member, and wherein this guide member is disposed in this slide rail, and, be moved to a " loaded " position or a test position to drive this carrier correspondence toward polyslip in this flat segments and between this bending segment.
Above-mentioned testing tool structure, wherein, this guide member also has a roller, and this guide member is contacted with this slide rail with this roller, and wherein when the past polyslip in this slide rail of this guide member, this roller is that the axle center rotates with this guide member.
Above-mentioned testing tool structure, wherein, this support plate includes a plurality of these slide rails, and respectively has a spacing between this slide rail.
Above-mentioned testing tool structure, wherein, this flat segments has two relative ends, a wherein end of this flat segments is connected with this bending segment, an other end of this flat segments is an inlet end, be arranged on the side of this support plate, this guide member slips in this flat segments and this bending segment via this inlet end.
Technique effect of the present invention is: the testing tool structure that the present invention proposes, on its support plate, directly offer slide rail, with the manufacturing cost that reduces extra guide rail and the accommodation space of instrument, secondly, also utilize its slide rail to have the architectural feature of flat segments and bending segment, cause carrier to be located on the test position effectively via the design of bending segment.Solved the manufacturing cost of prior art guide rail too high with the excessive problem of accommodation space instrument, and can guide carrier effectively and carrier is positioned on the test position.
Describe the present invention below in conjunction with the drawings and specific embodiments, but not as a limitation of the invention.
Description of drawings
Fig. 1 is the schematic perspective view of testing tool structure according to an embodiment of the invention;
Fig. 2 is the position view before loading according to Fig. 1;
Fig. 3 is the relative exploded view according to Fig. 1;
Fig. 4 A is the " loaded " position synoptic diagram according to Fig. 3;
Fig. 4 B is the test position synoptic diagram according to Fig. 3;
Fig. 5 is the structural drawing according to the guide member of second embodiment of the invention;
Fig. 6 is the structural drawing according to the support plate of third embodiment of the invention.
Wherein, Reference numeral
50 inlet ends
60 first links
62 second links
70 electrically connect port
72 sides
100 testing tool structures
102 support bodys
104 support plates
106 carriers
108 accommodation spaces
110 slide rails
112 guide members
114 flat segments
116 bending segments
200 rollers
The D spacing
The θ angle
P
L" loaded " position
P
TTest position
Embodiment
Below in conjunction with accompanying drawing structural principle of the present invention and principle of work are done concrete description:
Fig. 1 and Fig. 2 are the schematic perspective view according to the testing tool structure 100 of first embodiment of the invention, and as shown in the figure, the testing tool structure 100 of one embodiment of the invention comprises a support body 102, a support plate 104 and a carrier 106.Wherein, the inside of support body 102 has an accommodation space 108.Support plate 104 is arranged in the accommodation space 108, and support plate 104 offers at least one slide rail 110 on the one side.Carrier 106 movable being installed in the accommodation space 108, and Fig. 1 is placed in synoptic diagram in the accommodation space 108 for carrier 106, Fig. 2 is positioned at the outer synoptic diagram of accommodation space 108 for carrier 106.
See also Fig. 3, carrier 106 has at least one guide member 112.Guide member 112 can be positioned at the bottom of carrier 106, with the object that slides as guiding carrier 106.But guide member 112 is not limited to this with the relative position of carrier 106, and guide member 112 also can be positioned at the lateral location of carrier 106, mainly can make carrier 106 be able to slide smoothly get final product.Guide member 112 corresponding configuration are in slide rail 110, and can be toward polyslip in slide rail in 110.
According to the testing tool structure 100 of first embodiment of the invention, in order to make that carrier 106 can be by guide member 112 slippage stably in slide rail 110, support plate 104 offers five slide rails 110, and carrier 106 has five guide members 112.It should be noted that at this, testing tool structure 100 according to the embodiment of the invention, the number of its slide rail 110 and guide member 112 is not as limit, the demand of visual practical application aspect and design its number, one embodiment of the invention, number with slide rail 110 and guide member 112 is five, so that make the following description.
Secondly, by among Fig. 3 also as seen, support plate 104 comprises a plurality of slide rails 110.For make carrier 106 can be by guide member 112 balance slippage and unlikely overturning, but keeping parallelism between each slide rail 110 and has a space D.
As shown in Figure 3, slide rail 110 has a flat segments 114 and a bending segment 116.Wherein flat segments 114 interconnects with bending segment 116, and has an angle theta between flat segments 114 and the bending segment 116.
See also Fig. 4 A and Fig. 4 B because guide member 112 corresponding configuration are in slide rail 110, and can be toward polyslip in flat segments 114 and bending segment 116 between, therefore, guide member 112 can drive carrier 106 correspondences in view of the above and be moved to a " loaded " position P
LAn or test position P
T
Shown in Fig. 4 A, when guide member 112 slippages during in flat segments 114, the glide direction of guide member 112 is moved for the horizontal cross of arrow in figure, and in this, carrier 106 is positioned at " loaded " position P
LThen, shown in Fig. 4 B, when guide member 112 slipped into bending segment 116 through angle theta, the glide direction of guide member 112 was first horizontal cross motion, again along having moving of vertical direction, and cause carrier 106 to be positioned at test position P as the direction of arrow among Fig. 4 B
T
According to the first embodiment of the present invention, support plate 104 also has one and electrically connects port 70, and electric connection port 70 can be connected in a tester table (not shown).Therefore work as carrier 106 and be positioned at test position P
TThe time, tester table can be by being coupled to the electric connection port 70 of the circuit board (not shown) on the carrier 106, to carry out the test job to circuit board.
Therefore, during use on practice, the deviser can be at different circuit boards and carrier 106 (as type, surface structure or shape), to design preferable flat segments 114 length, bending segment 116 length and the angle theta between the two, when causing guide member 112 to slip into bending segment 116 through angle theta, carrier 106 can successfully arrive and be coupled to the test position P that electrically connects port 70
TOn, be beneficial to and carry out follow-up test job circuit board.In sum, testing tool structure 100 not only can reduce the consumption of tool space and manufacturing cost, and can reach the effect of carrier 106 guiding location.
Secondly, in order to reduce the friction force of guide member 112 in slide rail 110 slippages, and increase its slippage efficiency, according to a second embodiment of the present invention, as shown in Figure 5, guide member 112 can have a roller 200, and guide member 112 can be contacted with slide rail 110 by roller 200.Therefore, when guide member 112 in slide rail 110 when the polyslip, roller 200 can guide member 112 be axle center rotation relatively, to reduce the friction force that guide member 112 is produced during slippage in slide rail 110.
Fig. 6 is the support plate 104 according to third embodiment of the invention, and wherein flat segments 114 has one first link 60 and is connected to bending segment 116 mutually, and flat segments 114 has second link 62 with respect to first link 60.As shown in Figure 6, second link 62 is recessed among the support plate 104, and does not touch the side 72 in support plate 104.In this, second link 62 not as described above first embodiment communicate with the external world, so guide member 112 can vertically insert in the slide rail 110 via the top of support plate 104, additionally offers the manufacturing cost of guide member 112 porch to reduce support plate 104.
Therefore,, can utilize the structure of directly offering slide rail on its support plate, with the extra manufacturing cost of minimizing instrument and the accommodation space of instrument according to the testing tool structure of the embodiment of the invention.Secondly, also can utilize slide rail to have the architectural feature of flat segments and bending segment according to the testing tool structure of the embodiment of the invention, after particular design, cause carrier to be positioned on the test position effectively via the angle theta between flat segments and the bending segment.
Certainly; the present invention also can have other various embodiments; under the situation that does not deviate from spirit of the present invention and essence thereof; those of ordinary skill in the art work as can make various corresponding changes and distortion according to the present invention, but these corresponding changes and distortion all should belong to the protection domain of the appended claim of the present invention.
Claims (4)
1. a testing tool structure is characterized in that, includes:
One support body, inside have an accommodation space;
One support plate is arranged in this accommodation space, and this support plate offers at least one slide rail, and this slide rail has a flat segments and a bending segment that is connected, and has an angle between this flat segments and this bending segment; And
One carrier, activity is installed in this accommodation space, and this carrier has at least one guide member, and wherein this guide member is disposed in this slide rail, and, be moved to a " loaded " position or a test position to drive this carrier correspondence toward polyslip in this flat segments and between this bending segment.
2. testing tool structure as claimed in claim 1 is characterized in that this guide member also has a roller, and this guide member is contacted with this slide rail with this roller, and wherein when the polyslip, this roller is that the axle center rotates with this guide member to this guide member in this slide rail.
3. testing tool structure as claimed in claim 1 is characterized in that, this support plate includes a plurality of these slide rails, and respectively has a spacing between this slide rail.
4. testing tool structure as claimed in claim 1, it is characterized in that, this flat segments has two relative ends, a wherein end of this flat segments is connected with this bending segment, an other end of this flat segments is an inlet end, be arranged on the side of this support plate, this guide member slips in this flat segments and this bending segment via this inlet end.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010101824138A CN102253326A (en) | 2010-05-18 | 2010-05-18 | Test tool structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010101824138A CN102253326A (en) | 2010-05-18 | 2010-05-18 | Test tool structure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102253326A true CN102253326A (en) | 2011-11-23 |
Family
ID=44980696
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010101824138A Pending CN102253326A (en) | 2010-05-18 | 2010-05-18 | Test tool structure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102253326A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103662761A (en) * | 2013-12-13 | 2014-03-26 | 苏州博众精工科技有限公司 | Carrier positioning mechanism |
| CN107009315A (en) * | 2017-05-03 | 2017-08-04 | 郑州云海信息技术有限公司 | A kind of tool for assembling server board |
| CN112379111A (en) * | 2020-12-01 | 2021-02-19 | 江苏力德尔电子信息技术有限公司 | Quick detach formula RF accredited testing organization |
-
2010
- 2010-05-18 CN CN2010101824138A patent/CN102253326A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103662761A (en) * | 2013-12-13 | 2014-03-26 | 苏州博众精工科技有限公司 | Carrier positioning mechanism |
| CN107009315A (en) * | 2017-05-03 | 2017-08-04 | 郑州云海信息技术有限公司 | A kind of tool for assembling server board |
| CN112379111A (en) * | 2020-12-01 | 2021-02-19 | 江苏力德尔电子信息技术有限公司 | Quick detach formula RF accredited testing organization |
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| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20111123 |