CN102253046B - 太阳能电池片电致发光缺陷检测与iv检测一体化系统 - Google Patents
太阳能电池片电致发光缺陷检测与iv检测一体化系统 Download PDFInfo
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- CN102253046B CN102253046B CN 201110104821 CN201110104821A CN102253046B CN 102253046 B CN102253046 B CN 102253046B CN 201110104821 CN201110104821 CN 201110104821 CN 201110104821 A CN201110104821 A CN 201110104821A CN 102253046 B CN102253046 B CN 102253046B
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- 238000001514 detection method Methods 0.000 title claims abstract description 53
- 230000007547 defect Effects 0.000 title claims abstract description 24
- 238000005401 electroluminescence Methods 0.000 title claims abstract description 18
- 239000000523 sample Substances 0.000 claims abstract description 63
- 238000003384 imaging method Methods 0.000 claims abstract description 22
- 238000002503 electroluminescence detection Methods 0.000 claims abstract description 12
- 230000007246 mechanism Effects 0.000 claims abstract description 12
- 238000006243 chemical reaction Methods 0.000 claims abstract description 11
- 229910052724 xenon Inorganic materials 0.000 claims description 4
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 claims description 4
- 238000005286 illumination Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 3
- 230000006872 improvement Effects 0.000 description 3
- 208000037656 Respiratory Sounds Diseases 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
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- 238000005259 measurement Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
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CN 201110104821 CN102253046B (zh) | 2011-04-26 | 2011-04-26 | 太阳能电池片电致发光缺陷检测与iv检测一体化系统 |
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CN 201110104821 CN102253046B (zh) | 2011-04-26 | 2011-04-26 | 太阳能电池片电致发光缺陷检测与iv检测一体化系统 |
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CN102253046A CN102253046A (zh) | 2011-11-23 |
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Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
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CN104122266B (zh) * | 2013-04-28 | 2016-12-28 | 苏州中导光电设备有限公司 | 太阳能硅片高速线扫描光致荧光成像检测设备 |
CN103558558B (zh) * | 2013-11-12 | 2016-08-17 | 哈尔滨工业大学 | 一种硅太阳能电池转换效率检测装置及检测方法 |
FR3015770B1 (fr) * | 2013-12-19 | 2016-01-22 | Commissariat Energie Atomique | Procede et systeme de controle de qualite de cellules photovoltaiques |
US9866171B2 (en) | 2015-10-13 | 2018-01-09 | Industrial Technology Research Institute | Measuring device for property of photovoltaic device and measuring method using the same |
CN109427926A (zh) * | 2017-09-01 | 2019-03-05 | 英稳达科技股份有限公司 | 太阳能电池片的检测设备及方法 |
CN107742286B (zh) * | 2017-09-28 | 2021-01-29 | 河北工业大学 | 一种多晶硅太阳能电池片el测试裂纹缺陷检测方法 |
CN108469439A (zh) * | 2018-06-13 | 2018-08-31 | 华南理工大学 | 基于电致发光的太阳能电池片缺陷检测装置及方法 |
JP7149534B2 (ja) * | 2019-10-01 | 2022-10-07 | 株式会社アイテス | 太陽電池パネルの検査装置、及び検査方法 |
CN110648939B (zh) * | 2019-11-06 | 2022-03-22 | 天合光能股份有限公司 | 一种检测太阳能电池片钝化不均匀的方法 |
CN114441551A (zh) * | 2022-02-10 | 2022-05-06 | 南京航空航天大学 | 电池片应变及缺陷检测系统及方法 |
CN115032209B (zh) * | 2022-08-11 | 2022-11-15 | 中国华能集团清洁能源技术研究院有限公司 | 一种透明导电薄膜质量检测方法 |
Citations (3)
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CN201218723Y (zh) * | 2008-05-30 | 2009-04-08 | 上海锡明光电科技有限公司 | 光电非接触式图像检测装置 |
CN101581671A (zh) * | 2009-06-12 | 2009-11-18 | 3i系统公司 | 太阳能电池硅片检测系统 |
CN201637683U (zh) * | 2010-03-23 | 2010-11-17 | 上海伊斯曼电气有限公司 | 一种用于太阳能电池组件隐裂检测仪的自动识别系统 |
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JP2010107471A (ja) * | 2008-10-31 | 2010-05-13 | Mitsubishi Heavy Ind Ltd | キズ検査装置および検査方法 |
US8388204B2 (en) * | 2009-09-22 | 2013-03-05 | Cyberoptics Corporation | High speed, high resolution, three dimensional solar cell inspection system |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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CN201218723Y (zh) * | 2008-05-30 | 2009-04-08 | 上海锡明光电科技有限公司 | 光电非接触式图像检测装置 |
CN101581671A (zh) * | 2009-06-12 | 2009-11-18 | 3i系统公司 | 太阳能电池硅片检测系统 |
CN201637683U (zh) * | 2010-03-23 | 2010-11-17 | 上海伊斯曼电气有限公司 | 一种用于太阳能电池组件隐裂检测仪的自动识别系统 |
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JP特开2010-107471A 2010.05.13 |
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Effective date of registration: 20150115 Address after: 4, building 430000, building 16, hi tech Industrial Park, Wuhan economic and Technological Development Zone, Wuhan, Hubei Patentee after: Wuhan Zhongdao Optoelectronic Equipment Co.,Ltd. Address before: Grand Cayman Islands, British Cayman Islands Patentee before: 3i Systems Corp. |
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Correction item: Patentee|Address Correct: Wuhan Zhong Dao optoelectronic device company limited|4, building 430000, building 16, hi tech Industrial Park, Wuhan economic and Technological Development Zone, Wuhan, Hubei False: Wuhan Zhong Dao optoelectronic device company limited|4, building 430000, building 16, hi tech Industrial Park, Wuhan economic and Technological Development Zone, Wuhan, Hunan Number: 05 Volume: 31 |
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