CN102141515A - Device and method for measuring transmittance of curved-surface materials - Google Patents
Device and method for measuring transmittance of curved-surface materials Download PDFInfo
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- CN102141515A CN102141515A CN 201010599594 CN201010599594A CN102141515A CN 102141515 A CN102141515 A CN 102141515A CN 201010599594 CN201010599594 CN 201010599594 CN 201010599594 A CN201010599594 A CN 201010599594A CN 102141515 A CN102141515 A CN 102141515A
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Abstract
The invention discloses a device for measuring the transmittance of curved-surface materials, which comprises a measuring module, a comparison module, a mobile control module, a storage module and a computing module, wherein the measuring module is used for measuring incident signal data, data on signals to be tested, incident light spot area data and data on area of light spots to be tested; the comparison module is used for comparing incident light spot area data with data on area of the light spots to be tested and transmitting the result to a mobile control module; the mobile control module is used for controlling the movement of the measuring module according to the comparison result of the comparison module so that the incident light spot area data are equal to the data on area of the light spots to be tested; the storage module is used for storing the incident signal data and the data on the signals to be tested; and the computing module is used for computing the transmittance of the curved-surface materials according to the incident signal data and the data on the signals to be tested. The device is directly used for measuring the reflectance of the curved-surface materials, and the accuracy of the measured value is high.
Description
Technical field
The present invention relates to the transmittance field of measuring technique, particularly a kind of curved surface material transmittance measurement mechanism and method.
Background technology
Material known transmittance meter device mainly is divided into two classes at present, and a class can be measured the straight transmittance of material, the another kind of diffuse transmittance that can measure material.The instrument of the straight transmittance class of curved surface material use measured to cause measurement result seriously on the low side.Utilize the instrument of measuring diffuse transmittance to test, owing to the incident light that the reason of focal length can cause placing the curved surface material and not place this two states of curved surface material is injected integrating sphere, and form facula area in the ball inconsistently departed from desirable measuring condition, cause that bigger deviation appears in measurement result, when serious, the transmittance value that can cause measuring surpasses 100%.
Summary of the invention
(1) technical matters that will solve
The technical problem to be solved in the present invention is: a kind of curved surface material transmittance measurement mechanism and method are provided, the accuracy of measured value is improved.
(2) technical scheme
For solving the problems of the technologies described above, the invention provides a kind of curved surface material transmittance measurement mechanism, comprising: measurement module, comparison module, mobile control module, memory module and computing module,
Described measurement module, be used to measure the incoming signal data, the measured signal data, the launching spot area data corresponding with described incoming signal data, the to be measured facula area data corresponding with described measured signal data, and described launching spot area data and facula area data to be measured be sent to described comparison module, described incoming signal data and measured signal data are sent to described memory module, described incoming signal data are for this signal data that records during as measuring object of described measurement module, described measured signal data are for being measuring object with curved surface material to be measured, the signal data that launching spot area data and facula area data to be measured record when equating;
Comparison module is used for more described launching spot area data and described facula area data to be measured, and comparative result is sent to mobile control module;
Mobile control module is used for controlling moving of described measurement module according to the comparative result of described comparison module, and described launching spot area data is equated with described facula area data to be measured;
Described memory module is used to store described incoming signal data and measured signal data;
Described computing module is used for the transmittance according to described incoming signal data and described measured signal data computation curved surface material to be measured.
Wherein, also comprise: display module is used to show the transmittance of described curved surface material to be measured.
Wherein, described measurement module comprises: monochromator, convex lens, semi-transparent semi-reflecting lens, the charge coupled cell imageing sensor, integrating sphere and detector, described monochromator is aimed at the entrance port on the described integrating sphere, be provided with convex lens and semi-transparent semi-reflecting lens between the entrance port on described monochromator and the described integrating sphere, described charge coupled cell imageing sensor is arranged on the reflected light path of described semi-transparent semi-reflecting lens, described detector is located in the described integrating sphere, link to each other with described comparison module with described memory module, under the control of mobile control module, described convex lens can translation between the entrance port on described monochromator and the described integrating sphere.
Wherein, described integrating sphere inwall is provided with baffle plate, and described baffle plate is located at described detector place.
Wherein, under the control of described mobile control module, described integrating sphere can towards or deviate from described monochromator translation.
The invention also discloses a kind of measuring method, may further comprise the steps based on described curved surface material transmittance measurement mechanism:
S1: with measurement module this as measuring object, measure the incoming signal data, and with described incoming signal data storage to memory module;
S2: with curved surface material to be measured this as measuring object, measure the measured signal data, and with described measured signal data storage to memory module;
S3: according to the transmittance of described incoming signal data and described measured signal data computation curved surface material to be measured.
Wherein, step S1 further comprises:
S1.1: convex lens are placed between the entrance port of monochromator and integrating sphere, make the light planoconvex lens that monochromator sends, the entrance port of integrating sphere inject integrating sphere, by detector with the incoming signal data transmission that obtains to described memory module storage;
S1.2: between described convex lens and described entrance port, place semi-transparent semi-reflecting lens, the charge coupled cell imageing sensor is set on the reflected light path of described semi-transparent semi-reflecting lens, the charge coupled cell imageing sensor is collected the light by described semi-transparent semi-reflecting mirror reflection, and the launching spot area data that obtains is sent to comparison module.
Wherein, step S2 further comprises:
S2.1: curved surface material to be measured is placed between described convex lens and the described semi-transparent semi-reflecting lens, and described charge coupled cell imageing sensor obtains facula area data to be measured, and described facula area data to be measured are sent to described comparison module;
S2.2: more described launching spot area data of described comparison module and described facula area data to be measured, and comparative result is sent to mobile control module;
S2.3: the comparative result that mobile control module sends according to described comparison module, adjust the position of convex lens or the position of described integrating sphere, described launching spot area data and described facula area data to be measured are equated;
S2.4: semi-transparent semi-reflecting lens is removed, and described detector obtains the measured signal data and described measured signal data is sent to the memory module storage.
Wherein, among the step S3,,, calculate the transmittance of curved surface material to be measured according to following formula if do not adjust the position of described integrating sphere,
Wherein, τ is the transmittance of curved surface material to be measured, and X is the measured signal data, and B is the incoming signal data; If adjusted the position of described integrating sphere, according to following formula, calculate the transmittance of curved surface material to be measured,
Wherein, τ is the transmittance of curved surface material to be measured, and X is the measured signal data, and B is the incoming signal data, and N is the distance that integrating sphere is adjusted, and L is the distance of monochromator to the integrating sphere distal-most end, M
1After removing convex lens, the signal data that monochromator records during apart from integrating sphere L, M
2After removing convex lens, the signal data that monochromator records during apart from integrating sphere 2L.
Wherein, also comprise step after the step S3:
S4: the transmittance that shows described curved surface material to be measured.
(3) beneficial effect
Curved surface material transmittance measurement mechanism of the present invention and method are directly used in the reflectance of measuring the curved surface material, and the accuracy height of measured value.
Description of drawings
Fig. 1 is according to the structured flowchart of the curved surface material of one embodiment of the present invention projection than measurement mechanism;
Fig. 2 is that curved surface material shown in Figure 1 throws the concrete structure meaning figure than the measurement module of measurement mechanism;
Fig. 3 is based on curved surface material projection shown in Figure 1 process flow diagram than the measuring method of measurement mechanism.
Embodiment
Below in conjunction with drawings and Examples, the specific embodiment of the present invention is described in further detail.Following examples are used to illustrate the present invention, but are not used for limiting the scope of the invention.
Fig. 1 is according to the structured flowchart of the curved surface material of one embodiment of the present invention projection than measurement mechanism, comprising: measurement module 1, comparison module 2, mobile control module 3, memory module 4 and computing module 5,
Described measurement module 1, be used to measure the incoming signal data, the measured signal data, the launching spot area data corresponding with described incoming signal data, the to be measured facula area data corresponding with described measured signal data, and described launching spot area data and facula area data to be measured be sent to described comparison module 2, described incoming signal data and measured signal data are sent to described memory module 4, the signal data of described incoming signal data for recording during as measuring object with 1 of described measurement module, described measured signal data are for being measuring object with curved surface material to be measured, the signal data that launching spot area data and facula area data to be measured record when equating;
Described memory module 4 is used to store described incoming signal data and measured signal data;
Described computing module 5 is used for the transmittance according to described incoming signal data and described measured signal data computation curved surface material to be measured.
Described device also comprises: display module 6 is used to show the transmittance of described curved surface material to be measured.
As shown in Figure 2, described measurement module 1 comprises: monochromator 1-1, convex lens 1-2, semi-transparent semi-reflecting lens 1-3, charge coupled cell imageing sensor 1-4, integrating sphere 1-5 and detector 1-6, described monochromator 1-1 aims at entrance port 1-7 on the described integrating sphere 1-5, be provided with convex lens 1-2 and semi-transparent semi-reflecting lens 1-3 between the entrance port 1-7 on described monochromator 1-1 and the described integrating sphere 1-5, described charge coupled cell imageing sensor 1-4 is arranged on the reflected light path of described semi-transparent semi-reflecting lens 1-3, described detector 1-6 is located among the described integrating sphere 1-5, link to each other with described comparison module 2 with described memory module 4, under the control of mobile control module 3, described convex lens 1-2 can translation between the entrance port 1-7 on described monochromator 1-1 and the described integrating sphere 1-5.
For preventing that incident light from directly entering detector 1-6, preferably, described integrating sphere 1-5 inwall is provided with baffle plate 1-8, and described baffle plate 1-8 is located at described detector 1-6 place.
Under the control of described mobile control module 3, described integrating sphere 1-5 can towards or deviate from described monochromator 1-1 translation.
The invention also discloses a kind of measuring method, as shown in Figure 3, may further comprise the steps based on described curved surface material transmittance measurement mechanism:
S1: with measurement module this as measuring object, measure the incoming signal data, and with described incoming signal data storage to memory module;
S2: with curved surface material to be measured this as measuring object, measure the measured signal data, and with described measured signal data storage to memory module;
S3: according to the transmittance of described incoming signal data and described measured signal data computation curved surface material to be measured.
Step S1 further comprises:
S1.1: convex lens are placed between the entrance port of monochromator and integrating sphere, make the light planoconvex lens that monochromator sends, the entrance port of integrating sphere inject integrating sphere, by detector with the incoming signal data transmission that obtains to described memory module storage;
S1.2: between described convex lens and described entrance port, place semi-transparent semi-reflecting lens, the charge coupled cell imageing sensor is set on the reflected light path of described semi-transparent semi-reflecting lens, the charge coupled cell imageing sensor is collected the light by described semi-transparent semi-reflecting mirror reflection, and the launching spot area data that obtains is sent to comparison module.
Step S2 further comprises:
S2.1: curved surface material to be measured is placed between described convex lens and the described semi-transparent semi-reflecting lens, and described charge coupled cell imageing sensor obtains facula area data to be measured, and described facula area data to be measured are sent to described comparison module;
S2.2: more described launching spot area data of described comparison module and described facula area data to be measured, and comparative result is sent to mobile control module;
S2.3: the comparative result that mobile control module sends according to described comparison module, adjust the position of convex lens or the position of described integrating sphere, described launching spot area data and described facula area data to be measured are equated;
S2.4: semi-transparent semi-reflecting lens is removed, and described detector obtains the measured signal data and described measured signal data is sent to the memory module storage.
Among the step S3,,, calculate the transmittance of curved surface material to be measured according to following formula if do not adjust the position of described integrating sphere,
Wherein, τ is the transmittance of curved surface material to be measured, and X is the measured signal data, and B is the incoming signal data; If adjusted the position of described integrating sphere, according to following formula, calculate the transmittance of curved surface material to be measured,
Wherein, τ is the transmittance of curved surface material to be measured, and X is the measured signal data, and B is the incoming signal data, N be the distance adjusted of integrating sphere (N with towards the monochromator translation for negative, deviate from the monochromator translation for just), L is the distance of monochromator to the integrating sphere distal-most end, M
1After removing convex lens, the signal data that monochromator records during apart from integrating sphere L, M
2After removing convex lens, the signal data that monochromator records during apart from integrating sphere 2L.
Wherein, also comprise step after the step S3:
S4: the transmittance that shows described curved surface material to be measured.
Above embodiment only is used to illustrate the present invention; and be not limitation of the present invention; the those of ordinary skill in relevant technologies field; under the situation that does not break away from the spirit and scope of the present invention; can also make various variations and modification; therefore all technical schemes that are equal to also belong to category of the present invention, and scope of patent protection of the present invention should be defined by the claims.
Claims (10)
1. a curved surface material transmittance measurement mechanism is characterized in that, comprising: measurement module (1), comparison module (2), mobile control module (3), memory module (4) and computing module (5),
Described measurement module (1), be used to measure the incoming signal data, the measured signal data, the launching spot area data corresponding with described incoming signal data, the to be measured facula area data corresponding with described measured signal data, and described launching spot area data and facula area data to be measured be sent to described comparison module (2), described incoming signal data and measured signal data are sent to described memory module (4), described incoming signal data are for this signal data that records during as measuring object of described measurement module (1), described measured signal data are for being measuring object with curved surface material to be measured, the signal data that launching spot area data and facula area data to be measured record when equating;
Comparison module (2) is used for more described launching spot area data and described facula area data to be measured, and comparative result is sent to mobile control module (3);
Mobile control module (3) is used for controlling moving of described measurement module (1) according to the comparative result of described comparison module (2), and described launching spot area data is equated with described facula area data to be measured;
Described memory module (4) is used to store described incoming signal data and measured signal data;
Described computing module (5) is used for the transmittance according to described incoming signal data and described measured signal data computation curved surface material to be measured.
2. curved surface material transmittance measurement mechanism as claimed in claim 1 is characterized in that, also comprises: display module (6) is used to show the transmittance of described curved surface material to be measured.
3. curved surface material transmittance measurement mechanism as claimed in claim 1, it is characterized in that, described measurement module (1) comprising: monochromator (1-1), convex lens (1-2), semi-transparent semi-reflecting lens (1-3), charge coupled cell imageing sensor (1-4), integrating sphere (1-5) and detector (1-6), described monochromator (1-1) is aimed at the entrance port (1-7) on the described integrating sphere (1-5), be provided with convex lens (1-2) and semi-transparent semi-reflecting lens (1-3) between the entrance port (1-7) on described monochromator (1-1) and the described integrating sphere (1-5), described charge coupled cell imageing sensor (1-4) is arranged on the reflected light path of described semi-transparent semi-reflecting lens (1-3), described detector (1-6) is located in the described integrating sphere (1-5), link to each other with described comparison module (2) with described memory module (4), under the control of mobile control module (3), described convex lens (1-2) can translation between the entrance port (1-7) on described monochromator (1-1) and the described integrating sphere (1-5).
4. curved surface material transmittance measurement mechanism as claimed in claim 3 is characterized in that described integrating sphere (1-5) inwall is provided with baffle plate (1-8), and described baffle plate (1-8) is located at described detector (1-6) and is located.
5. curved surface material transmittance measurement mechanism as claimed in claim 3 is characterized in that, under the control of described mobile control module (3), described integrating sphere (1-5) can towards or deviate from described monochromator (1-1) translation.
6. one kind based on the measuring method as each described curved surface material transmittance measurement mechanism of claim 1-5, it is characterized in that, may further comprise the steps:
S1: with measurement module this as measuring object, measure the incoming signal data, and with described incoming signal data storage to memory module;
S2: with curved surface material to be measured this as measuring object, measure the measured signal data, and with described measured signal data storage to memory module;
S3: according to the transmittance of described incoming signal data and described measured signal data computation curved surface material to be measured.
7. curved surface material transmittance measuring method as claimed in claim 6 is characterized in that step S1 further comprises:
S1.1: convex lens are placed between the entrance port of monochromator and integrating sphere, make the light planoconvex lens that monochromator sends, the entrance port of integrating sphere inject integrating sphere, by detector with the incoming signal data transmission that obtains to described memory module storage;
S1.2: between described convex lens and described entrance port, place semi-transparent semi-reflecting lens, the charge coupled cell imageing sensor is set on the reflected light path of described semi-transparent semi-reflecting lens, the charge coupled cell imageing sensor is collected the light by described semi-transparent semi-reflecting mirror reflection, and the launching spot area data that obtains is sent to comparison module.
8. curved surface material transmittance measuring method as claimed in claim 7 is characterized in that step S2 further comprises:
S2.1: curved surface material to be measured is placed between described convex lens and the described semi-transparent semi-reflecting lens, and described charge coupled cell imageing sensor obtains facula area data to be measured, and described facula area data to be measured are sent to described comparison module;
S2.2: more described launching spot area data of described comparison module and described facula area data to be measured, and comparative result is sent to mobile control module;
S2.3: the comparative result that mobile control module sends according to described comparison module, adjust the position of convex lens or the position of described integrating sphere, described launching spot area data and described facula area data to be measured are equated;
S2.4: semi-transparent semi-reflecting lens is removed, and described detector obtains the measured signal data and described measured signal data is sent to the memory module storage.
9. curved surface material transmittance measuring method as claimed in claim 8 is characterized in that, among the step S3, if do not adjust the position of described integrating sphere, according to following formula, calculates the transmittance of curved surface material to be measured,
Wherein, τ is the transmittance of curved surface material to be measured, and X is the measured signal data, and B is the incoming signal data; If adjusted the position of described integrating sphere, according to following formula, calculate the transmittance of curved surface material to be measured,
Wherein, τ is the transmittance of curved surface material to be measured, and X is the measured signal data, and B is the incoming signal data, and N is the distance that integrating sphere is adjusted, and L is the distance of monochromator to the integrating sphere distal-most end, M
1After removing convex lens, the signal data that monochromator records during apart from integrating sphere L, M
2After removing convex lens, the signal data that monochromator records during apart from integrating sphere 2L.
10. curved surface material transmittance measuring method as claimed in claim 6 is characterized in that, also comprises step after the step S3:
S4: the transmittance that shows described curved surface material to be measured.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108519356A (en) * | 2018-05-09 | 2018-09-11 | 宁波纳智微光电科技有限公司 | A kind of vehicle glass transmittance and reflectance detection of mix format apparatus and method |
| CN109752348A (en) * | 2018-09-07 | 2019-05-14 | 中国计量科学研究院 | Transmittance etalon, transmittance measuring device |
| WO2020191545A1 (en) * | 2019-03-22 | 2020-10-01 | 合刃科技（深圳）有限公司 | System for analyzing stress of curved detection sample |
| US11079326B1 (en) | 2020-06-04 | 2021-08-03 | Raytheon Company | Method for testing curved reflective surfaces |
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| US6075612A (en) * | 1999-06-18 | 2000-06-13 | N&K Technology, Inc. | Optical devices having toroidal mirrors for performing reflectance measurements |
| CN1560585A (en) * | 2004-03-12 | 2005-01-05 | 宁波市二轻工业研究设计院 | Quickly measuring method and device for lens transmittivity |
| CN201311325Y (en) * | 2008-11-19 | 2009-09-16 | 中国计量科学研究院 | Integrating sphere and optical measuring system using same |
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| US6075612A (en) * | 1999-06-18 | 2000-06-13 | N&K Technology, Inc. | Optical devices having toroidal mirrors for performing reflectance measurements |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108519356A (en) * | 2018-05-09 | 2018-09-11 | 宁波纳智微光电科技有限公司 | A kind of vehicle glass transmittance and reflectance detection of mix format apparatus and method |
| CN109752348A (en) * | 2018-09-07 | 2019-05-14 | 中国计量科学研究院 | Transmittance etalon, transmittance measuring device |
| WO2020191545A1 (en) * | 2019-03-22 | 2020-10-01 | 合刃科技（深圳）有限公司 | System for analyzing stress of curved detection sample |
| US11079326B1 (en) | 2020-06-04 | 2021-08-03 | Raytheon Company | Method for testing curved reflective surfaces |
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