CN102138078B - 用于测量在电子元件上的电压的至少一个值的装置 - Google Patents

用于测量在电子元件上的电压的至少一个值的装置 Download PDF

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Publication number
CN102138078B
CN102138078B CN200980134044.0A CN200980134044A CN102138078B CN 102138078 B CN102138078 B CN 102138078B CN 200980134044 A CN200980134044 A CN 200980134044A CN 102138078 B CN102138078 B CN 102138078B
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China
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electronic component
signal
switch
time
switching
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Chinese (zh)
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CN102138078A (zh
Inventor
R·黑弗舍尔
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Lemfoerder Electronic GmbH
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Lemfoerder Electronic GmbH
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Analogue/Digital Conversion (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
CN200980134044.0A 2008-08-29 2009-08-12 用于测量在电子元件上的电压的至少一个值的装置 Active CN102138078B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102008044908A DE102008044908A1 (de) 2008-08-29 2008-08-29 Anordnung zur Messung wenigstens eines Wertes einer an einer elektronischen Komponente anliegenden Spannung
DE102008044908.3 2008-08-29
PCT/DE2009/001121 WO2010022700A2 (de) 2008-08-29 2009-08-12 Anordnung zur messung wenigstens eines wertes einer an einer elektronischen komponente anliegenden spannung

Publications (2)

Publication Number Publication Date
CN102138078A CN102138078A (zh) 2011-07-27
CN102138078B true CN102138078B (zh) 2015-08-19

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CN200980134044.0A Active CN102138078B (zh) 2008-08-29 2009-08-12 用于测量在电子元件上的电压的至少一个值的装置

Country Status (7)

Country Link
US (1) US8508215B2 (enExample)
EP (1) EP2318850B1 (enExample)
JP (1) JP5492892B2 (enExample)
CN (1) CN102138078B (enExample)
DE (1) DE102008044908A1 (enExample)
ES (1) ES2770644T3 (enExample)
WO (1) WO2010022700A2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102445590A (zh) * 2011-12-21 2012-05-09 上海博泰悦臻电子设备制造有限公司 用于判断天线状态的电流检测电路
DE102016002896B4 (de) * 2016-03-09 2024-12-19 Diehl Ako Stiftung & Co. Kg Steuervorrichtung und Verfahren zum Erfassen einer Betätigung von in Sensorschaltungen integrierten Bedienelementen durch einen Benutzer
CN109863410B (zh) * 2017-09-19 2021-03-05 深圳市汇顶科技股份有限公司 上电复位时间的测量方法及系统
EP3726255B1 (en) * 2019-04-17 2025-08-13 Mettler-Toledo Safeline Limited Method for operating a metal detector and metal detector
JP7456831B2 (ja) 2019-04-17 2024-03-27 メトラー－トレド・セーフライン・リミテッド 金属検出器を動作させるための方法および金属検出器

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4649341A (en) * 1983-04-21 1987-03-10 Wabco Westinghouse Fahrzeugbremsen Gmbh Inductive measuring arrangement for determining the position of a movable core member
US4683417A (en) * 1984-05-10 1987-07-28 Universite De Rennes I Method and apparatus for rapidly testing capacitors and dielectric materials
EP0288215A2 (en) * 1987-04-24 1988-10-26 Simmonds Precision Products Inc. Determination of electrical capacitance and resistance
DE4100869A1 (de) * 1990-01-15 1991-07-18 Weiss Dieter Verfahren und vorrichtung zum messen physikalischer groessen
US5469364A (en) * 1993-03-15 1995-11-21 Hughey; Bradley W. Apparatus and methods for measuring and detecting variations in the value of a capacitor

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5411712B2 (enExample) * 1972-05-17 1979-05-17
DE3343885C2 (de) * 1983-04-21 1996-12-12 Wabco Gmbh Induktiver Sensor
DE3421873A1 (de) * 1984-06-13 1985-12-19 Brown, Boveri & Cie Ag, 6800 Mannheim Messverfahren zur ermittlung der differenz zwischen einer wechselspannung und einer zweiten spannung sowie messvorrichtung zu seiner anwendung
DE10118299B4 (de) * 2001-04-12 2005-02-10 Conti Temic Microelectronic Gmbh Verfahren zur Bestimmung des ohmschen Anteils des Innenwiderstands eines Kondensators und Vorrichtung zur Durchführung des Verfahrens
JP2003254998A (ja) * 2002-03-04 2003-09-10 Yazaki Corp 組電池のセル電圧測定方法及びその装置
KR100845320B1 (ko) * 2006-07-24 2008-07-10 주식회사 애트랩 배터리를 이용하는 장치 및 이 장치의 배터리 교체 또는재충전 시기 검출 방법
KR100915825B1 (ko) * 2008-02-13 2009-09-07 주식회사 하이닉스반도체 반도체 메모리 장치의 펌핑 전압 감지 회로
US8054090B2 (en) * 2008-10-22 2011-11-08 Atmel Corporation Noise handling in capacitive touch sensors

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4649341A (en) * 1983-04-21 1987-03-10 Wabco Westinghouse Fahrzeugbremsen Gmbh Inductive measuring arrangement for determining the position of a movable core member
US4683417A (en) * 1984-05-10 1987-07-28 Universite De Rennes I Method and apparatus for rapidly testing capacitors and dielectric materials
EP0288215A2 (en) * 1987-04-24 1988-10-26 Simmonds Precision Products Inc. Determination of electrical capacitance and resistance
DE4100869A1 (de) * 1990-01-15 1991-07-18 Weiss Dieter Verfahren und vorrichtung zum messen physikalischer groessen
US5469364A (en) * 1993-03-15 1995-11-21 Hughey; Bradley W. Apparatus and methods for measuring and detecting variations in the value of a capacitor

Also Published As

Publication number Publication date
US8508215B2 (en) 2013-08-13
EP2318850B1 (de) 2020-01-01
WO2010022700A3 (de) 2010-05-14
CN102138078A (zh) 2011-07-27
WO2010022700A2 (de) 2010-03-04
ES2770644T3 (es) 2020-07-02
US20110163734A1 (en) 2011-07-07
DE102008044908A1 (de) 2010-03-04
JP5492892B2 (ja) 2014-05-14
JP2012500978A (ja) 2012-01-12
EP2318850A2 (de) 2011-05-11

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