CN102128968B - Low voltage differential signal testing system and method thereof - Google Patents

Low voltage differential signal testing system and method thereof Download PDF

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CN102128968B
CN102128968B CN201010300229.9A CN201010300229A CN102128968B CN 102128968 B CN102128968 B CN 102128968B CN 201010300229 A CN201010300229 A CN 201010300229A CN 102128968 B CN102128968 B CN 102128968B
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low
voltage
differential signal
voltage differential
signal
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CN102128968A (en
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何瑞雄
苏旺丁
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Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Abstract

一种低压差分信号测试系统,该系统包括:波形获取模块,用于获取低压差分信号的正源信号及负源信号的波形;电压准位测量模块,用于根据获取的正源信号及负源信号的波形测量低压差分信号在差分状态下的高/低电压准位;共模噪声测量模块,用于根据获取的正源信号及负源信号的波形测量低压差分信号的共模噪声;及输出模块,用于输出测量的高/低电压准位及共模噪声。本发明还提供一种低压差分信号测试方法。本发明能够快速准确地对低压差分信号的高/低电压准位及共模噪声实施测试。

A low-voltage differential signal testing system, the system includes: a waveform acquisition module, used to acquire the waveforms of the positive source signal and the negative source signal of the low-voltage differential signal; The waveform of the signal measures the high/low voltage level of the low voltage differential signal in the differential state; the common mode noise measurement module is used to measure the common mode noise of the low voltage differential signal according to the acquired positive source signal and negative source signal waveform; and output Module for outputting measured high/low voltage levels and common mode noise. The invention also provides a low voltage differential signal testing method. The invention can quickly and accurately test the high/low voltage level and common mode noise of the low voltage differential signal.

Description

Low voltage differential signal testing system and method
Technical field
The present invention relates to a kind of signal test system and method, particularly about a kind of low voltage differential signal testing system and method.
Background technology
Low Voltage Differential Signal (Low Voltage Differential Signal, LVDS) be a kind of signal transmission technology of the low amplitude of oscillation, the advantages such as LDVS has at a high speed, low-power consumption, low noise, low cost are widely used in high speed data transfer.
In order to guarantee the correctness of data transmission, need to test high/low voltage quasi position, common-mode noise and the bias voltage of Low Voltage Differential Signal.At present, to the test of Low Voltage Differential Signal, need to rely on the manual operations of operator.Manual method of testing not only efficiency is low, and easily makes mistakes, and can not meet the rival demand that fast and high quality is produced.
Summary of the invention
In view of above content, be necessary to provide a kind of low voltage differential signal testing system, can to Low Voltage Differential Signal, implement test rapidly and accurately.
In addition, be also necessary to provide a kind of low voltage differential signal testing system, can to Low Voltage Differential Signal, implement test rapidly and accurately.
A low voltage differential signal testing system, described Low Voltage Differential Signal comprises positive source signal and negative source signal, this system comprises: waveform acquisition module, for obtaining the waveform of described positive source signal and negative source signal; Voltage quasi position measurement module, for generating the waveform of Low Voltage Differential Signal under differential state according to the positive source signal that obtains and the waveform of negative source signal, and according to the Low Voltage Differential Signal of generation the high/low voltage quasi position of the waveform measurement Low Voltage Differential Signal under differential state under differential state; Common-mode noise measurement module, for generate the waveform of Low Voltage Differential Signal under common-mode state according to the waveform of the positive source signal obtaining and negative source signal, and according to the common-mode noise of the waveform measurement Low Voltage Differential Signal under the common-mode state generating; And output module, for exporting high/low voltage quasi position and the common-mode noise of measurement.
A Low Voltage Differential Signal method of testing, described Low Voltage Differential Signal comprises positive source signal and negative source signal, the method comprises: obtaining step: the waveform that obtains described positive source signal and negative source signal; Voltage quasi position measuring process: according to the waveform of the positive source signal obtaining and negative source signal, generate the waveform of Low Voltage Differential Signal under differential state, and according to the Low Voltage Differential Signal generating the high/low voltage quasi position of the waveform measurement Low Voltage Differential Signal under differential state under differential state; Common-mode noise measuring process: according to the waveform of the positive source signal obtaining and negative source signal, generate the waveform of Low Voltage Differential Signal under common-mode state, and according to the common-mode noise of the waveform measurement Low Voltage Differential Signal under the common-mode state generating; And output step: high/low voltage quasi position and common-mode noise that output is measured.
Low voltage differential signal testing system of the present invention and method, high/low voltage quasi position and the common-mode noise that can test rapidly and accurately Low Voltage Differential Signal.
Accompanying drawing explanation
Fig. 1 is the applied environment schematic diagram of low voltage differential signal testing system preferred embodiment of the present invention.
Fig. 2 is the functional block diagram of Fig. 1 mesolow differential signal test macro.
Fig. 3 is the process flow diagram of Low Voltage Differential Signal method of testing of the present invention preferred embodiment.
Fig. 4 is the positive source signal of Low Voltage Differential Signal and the oscillogram of negative source signal.
Fig. 5 is oscillogram and the histogram of Low Voltage Differential Signal under differential state.
Fig. 6 is the oscillogram of Low Voltage Differential Signal under common-mode state.
Main element symbol description
Low voltage differential signal testing system 10
Data processing equipment 11
Oscillograph 12
Low Voltage Differential Signal 13
Positive source signal 14
Negative source signal 15
Display device 16
Waveform acquisition module 200
Voltage quasi position measurement module 210
Common-mode noise measurement module 220
Bias voltage measurement module 230
Judge module 240
Output module 250
Embodiment
Consulting shown in Fig. 1, is the applied environment schematic diagram of low voltage differential signal testing system preferred embodiment of the present invention.Every a pair of Low Voltage Differential Signal 13 comprises a positive source signal 14 and a negative source signal 15.Described low voltage differential signal testing system 10 (for example: computing machine) runs on data processing equipment 11.This data processing equipment 11 and oscillograph 12 and display device 16 communication connections.Oscillograph 12 is surveyed Low Voltage Differential Signal 13 by test probe.Display device 16 shows the test result of Low Voltage Differential Signal 13.
Consulting shown in Fig. 2, is the functional block diagram of Fig. 1 mesolow differential signal test macro 10.Described low voltage differential signal testing system 10 comprises waveform acquisition module 200, voltage quasi position measurement module 210, common-mode noise measurement module 220, bias voltage measurement module 230, judge module 240 and output module 250.
Described waveform acquisition module 200 is for obtaining the positive source signal 14 of Low Voltage Differential Signal 13 and the waveform of negative source signal 15.In the present embodiment, waveform acquisition module 200 sends wave capture order to oscillograph 12.According to this wave capture order, oscillograph 12 is caught the positive source signal 14 of Low Voltage Differential Signal and the waveform of negative source signal 15, and by the waveform return data treatment facility 11 of the positive source signal 14 of the Low Voltage Differential Signal of catching 13 and negative source signal 15.As shown in Figure 4, solid line 40 represents the waveform of the positive source signal 14 of Low Voltage Differential Signal 13, the waveform of the negative source signal 15 that dotted line 41 representatives are corresponding with this positive source signal 14.
Described voltage quasi position measurement module 210 is for the high/low voltage quasi position under differential state according to the waveform measurement Low Voltage Differential Signal 13 of the positive source signal 14 obtaining and negative source signal 15.In the present embodiment, voltage quasi position measurement module 210 subtracts each other positive source signal 14 and the waveform of negative source signal 15, obtains the waveform of Low Voltage Differential Signal 13 under differential state.Voltage quasi position measurement module 210 statistics Low Voltage Differential Signal 13 frequencies that each magnitude of voltage occurs under differential state, using the highest positive voltage of the frequency of occurrences as Low Voltage Differential Signal 13 the high voltage level under differential state, using the highest negative voltage of the frequency of occurrences as Low Voltage Differential Signal 13 the low-voltage level under differential state.In the present embodiment, voltage quasi position measurement module 210 utilizes statistics with histogram Low Voltage Differential Signal 13 frequency that each magnitude of voltage occurs under differential state.As shown in Figure 5, curve 50 represents the waveform of Low Voltage Differential Signal 13 under differential state, and figure 51 represents the histogram of Low Voltage Differential Signal 13 under differential state.In this histogram, vertical direction represents voltage, and horizontal direction represents the frequency that magnitude of voltage occurs.From this histogram, the high voltage level of Low Voltage Differential Signal 13 under differential state is 0.35V, and low-voltage level is-0.35V.In the present embodiment, voltage quasi position measurement module 210 is also for measuring maximum positive voltage and the maximum negative voltage of Low Voltage Differential Signal 13 under differential state.For example, recording the maximum positive voltage of Low Voltage Differential Signal 13 under differential state is 0.39V, and maximum negative voltage is-0.39V.
The common-mode noise of the positive source signal 14 that described common-mode noise measurement module 220 obtains for basis and the waveform measurement Low Voltage Differential Signal 13 of negative source signal 15.In the present embodiment, common-mode noise measurement module 220 is the waveform adder with negative source signal 15 by the positive source signal of Low Voltage Differential Signal 13 14, obtain the waveform of Low Voltage Differential Signal 13 under common-mode state, calculate the poor of the maximum voltage of Low Voltage Differential Signal 13 under common-mode state and minimum voltage, using the difference of this maximum voltage and minimum voltage as the common-mode noise of Low Voltage Differential Signal 13.For example, suppose that the maximum voltage of Low Voltage Differential Signal 13 under common-mode state is 2.35V, minimum voltage is 2.20V, and the common-mode noise of Low Voltage Differential Signal 13 is 0.15V.As shown in Figure 6, curve 60 represents the waveform of Low Voltage Differential Signal 13 under common-mode state, and the waveform under this common-mode state is added and is obtained by the waveform 40 of positive source signal 14 and the waveform of negative source signal 15 41.
The bias voltage of the positive source signal 14 that described bias voltage measurement module 230 obtains for basis and the waveform measurement Low Voltage Differential Signal 13 of negative source signal 15.In the present embodiment, the bias voltage of bias voltage measurement module 230 waveshape Low Voltage Differential Signal 13 under common-mode state according to Low Voltage Differential Signal 13.Specifically, bias voltage measurement module 230 calculates the mean value of the voltage of Low Voltage Differential Signals 13 under common-mode state, usings 1/2nd bias voltages as Low Voltage Differential Signal 13 of this mean value.For example, the mean value of supposing the voltage of Low Voltage Differential Signal 13 under common-mode state is 2.3V, and the bias voltage of Low Voltage Differential Signal 13 is 1.15V.In other embodiment, can adopt the bias voltage of other method measurement Low Voltage Differential Signal 13.For example, the corresponding voltage of each intersection point of the waveform of the bias voltage measurement module 230 positive source signals 14 of measurement and negative source signal 15, gets the mean value of each intersection point corresponding voltage as the bias voltage of Low Voltage Differential Signal 13.
Described judge module 240 is for judging whether high/low voltage quasi position, common-mode noise and the bias voltage of measurement meets correlation technique standard.For example, suppose that technical manual stipulates that the minimum value of described high voltage level is 0.25V, maximal value is 0.45V, if the high voltage level measuring is 0.35V, meets technical manual.
Described output module 250 is for exporting high/low voltage quasi position, common-mode noise and the bias voltage of measurement.In the present embodiment, output module 250 is presented at described high/low voltage quasi position, common-mode noise and bias voltage on the display device 16 being connected with data processing equipment 11.In addition, output module 250 is also exported the situation that described high/low voltage quasi position, common-mode noise and bias voltage meet technical manual.
Consulting shown in Fig. 3, is the process flow diagram of Low Voltage Differential Signal method of testing of the present invention preferred embodiment.
Step S301, waveform acquisition module 200 obtains the positive source signal 14 of Low Voltage Differential Signal 13 and the waveform of negative source signal 15.In the present embodiment, waveform acquisition module 200 sends wave capture order to oscillograph 12.According to this wave capture order, oscillograph 12 is caught the positive source signal 14 of Low Voltage Differential Signal and the waveform of negative source signal 15, and by the waveform return data treatment facility 11 of the positive source signal 14 of the Low Voltage Differential Signal of catching 13 and negative source signal 15.As shown in Figure 4, solid line 40 represents the waveform of the positive source signal 14 of Low Voltage Differential Signal 13, the waveform of the negative source signal 15 that dotted line 41 representatives are corresponding with this positive source signal 14.
Step S302, voltage quasi position measurement module 210 is the high/low voltage quasi position under differential state according to the waveform measurement Low Voltage Differential Signal 13 of the positive source signal 14 obtaining and negative source signal 15.In the present embodiment, voltage quasi position measurement module 210 subtracts each other positive source signal 14 and the waveform of negative source signal 15, obtains the waveform of Low Voltage Differential Signal 13 under differential state.Voltage quasi position measurement module 210 statistics Low Voltage Differential Signal 13 frequencies that each magnitude of voltage occurs under differential state, using the highest positive voltage of the frequency of occurrences as Low Voltage Differential Signal 13 the high voltage level under differential state, using the highest negative voltage of the frequency of occurrences as Low Voltage Differential Signal 13 the low-voltage level under differential state.In the present embodiment, voltage quasi position measurement module 210 utilizes statistics with histogram Low Voltage Differential Signal 13 frequency that each magnitude of voltage occurs under differential state.As shown in Figure 5, curve 50 represents the waveform of Low Voltage Differential Signal 13 under differential state, and figure 51 represents the histogram of Low Voltage Differential Signal 13 under differential state.In this histogram, vertical direction represents voltage, and horizontal direction represents the frequency that magnitude of voltage occurs.From this histogram, the high voltage level of Low Voltage Differential Signal 13 under differential state is 0.35V, and low-voltage level is-0.35V.In the present embodiment, voltage quasi position measurement module 210 is also for measuring maximum positive voltage and the maximum negative voltage of Low Voltage Differential Signal 13 under differential state.For example, recording the maximum positive voltage of Low Voltage Differential Signal 13 under differential state is 0.39V, and maximum negative voltage is-0.39V.
Step S303, common-mode noise measurement module 220 is according to the common-mode noise of the waveform measurement Low Voltage Differential Signal 13 of the positive source signal 14 obtaining and negative source signal 15.In the present embodiment, common-mode noise measurement module 220 is the waveform adder with negative source signal 15 by the positive source signal of Low Voltage Differential Signal 13 14, obtain the waveform of Low Voltage Differential Signal 13 under common-mode state, calculate the poor of the maximum voltage of Low Voltage Differential Signal 13 under common-mode state and minimum voltage, using the difference of this maximum voltage and minimum voltage as the common-mode noise of Low Voltage Differential Signal 13.For example, suppose that the maximum voltage of Low Voltage Differential Signal 13 under common-mode state is 2.35V, minimum voltage is 2.20V, and the common-mode noise of Low Voltage Differential Signal 13 is 0.15V.As shown in Figure 6, curve 60 represents the waveform of Low Voltage Differential Signal 13 under common-mode state, and the waveform under this common-mode state is added and is obtained by the waveform 40 of positive source signal 14 and the waveform of negative source signal 15 41.
Step S304, bias voltage measurement module 230 is according to the bias voltage of the waveform measurement Low Voltage Differential Signal 13 of the positive source signal 14 obtaining and negative source signal 15.In the present embodiment, the bias voltage of bias voltage measurement module 230 waveshape Low Voltage Differential Signal 13 under common-mode state according to Low Voltage Differential Signal 13.Specifically, bias voltage measurement module 230 calculates the mean value of the voltage of Low Voltage Differential Signals 13 under common-mode state, usings 1/2nd bias voltages as Low Voltage Differential Signal 13 of this mean value.For example, the mean value of supposing the voltage of Low Voltage Differential Signal 13 under common-mode state is 2.3V, and the bias voltage of Low Voltage Differential Signal 13 is 1.15V.In other embodiment, can adopt the bias voltage of other method measurement Low Voltage Differential Signal 13.For example, the corresponding voltage of each intersection point of the waveform of the bias voltage measurement module 230 positive source signals 14 of measurement and negative source signal 15, gets the mean value of each intersection point corresponding voltage as the bias voltage of Low Voltage Differential Signal 13.
Step S305, whether high/low voltage quasi position, common-mode noise and bias voltage that judge module 240 judgements are measured meet correlation technique standard.For example, suppose that technical manual stipulates that the minimum value of described high voltage level is 0.25V, maximal value is 0.45V, if the high voltage level measuring is 0.35V, meets technical manual.
Step S306, high/low voltage quasi position, common-mode noise and bias voltage that output module 250 outputs are measured.In the present embodiment, output module 250 is presented at described high/low voltage quasi position, common-mode noise and bias voltage on the display device 16 being connected with data processing equipment 11.In addition, output module 250 is also exported the situation that described high/low voltage quasi position, common-mode noise and bias voltage meet technical manual.

Claims (10)

1.一种低压差分信号测试系统,所述低压差分信号包括正源信号及负源信号,其特征在于,该系统包括:1. A low-voltage differential signal testing system, said low-voltage differential signal comprising a positive source signal and a negative source signal, characterized in that the system comprises: 波形获取模块,用于获取所述正源信号及负源信号的波形;A waveform acquisition module, configured to acquire the waveforms of the positive source signal and the negative source signal; 电压准位测量模块,用于根据获取的正源信号与负源信号的波形生成低压差分信号在差分状态下的波形,并根据生成的低压差分信号在差分状态下的波形测量低压差分信号在差分状态下的高/低电压准位;The voltage level measurement module is used to generate the waveform of the low-voltage differential signal in the differential state according to the obtained waveforms of the positive source signal and the negative source signal, and measure the low-voltage differential signal in the differential state according to the generated waveform of the low-voltage differential signal in the differential state. The high/low voltage level of the state; 共模噪声测量模块,用于根据获取的正源信号与负源信号的波形生成低压差分信号在共模状态下的波形,并根据生成的共模状态下的波形测量低压差分信号的共模噪声;及The common-mode noise measurement module is used to generate the waveform of the low-voltage differential signal in the common-mode state according to the obtained waveforms of the positive source signal and the negative source signal, and measure the common-mode noise of the low-voltage differential signal according to the generated waveform in the common-mode state ;and 输出模块,用于输出测量的高/低电压准位及共模噪声。The output module is used to output the measured high/low voltage level and common mode noise. 2.如权利要求1所述的低压差分信号测试系统,其特征在于,该系统还包括偏置电压测量模块,用于根据获取的正源信号及负源信号的波形测量低压差分信号的偏置电压,所述输出模块还用于输出测量的偏置电压。2. The low-voltage differential signal test system as claimed in claim 1, wherein the system also includes a bias voltage measurement module for measuring the bias of the low-voltage differential signal according to the waveforms of the positive source signal and the negative source signal obtained voltage, the output module is also used to output the measured bias voltage. 3.如权利要求1所述的低压差分信号测试系统,其特征在于,该系统还包括判断模块,用于判断测量的高/低电压准位及共模噪声是否符合技术规范。3. The low-voltage differential signal test system according to claim 1, further comprising a judging module for judging whether the measured high/low voltage levels and common-mode noise meet technical specifications. 4.如权利要求1所述的低压差分信号测试系统,其特征在于,所述电压准位测量模块利用直方图测量低压差分信号在差分状态下的高/低电压准位。4. The low voltage differential signal testing system according to claim 1, wherein the voltage level measurement module uses a histogram to measure the high/low voltage level of the low voltage differential signal in a differential state. 5.如权利要求1所述的低压差分信号测试系统,其特征在于,所述电压准位测量模块还用于测量低压差分信号在差分状态下的最大正电压及最大负电压。5. The low-voltage differential signal testing system according to claim 1, wherein the voltage level measurement module is also used to measure the maximum positive voltage and the maximum negative voltage of the low-voltage differential signal in a differential state. 6.一种低压差分信号测试方法,所述低压差分信号包括正源信号及负源信号,其特征在于,该方法包括:6. A low-voltage differential signal testing method, said low-voltage differential signal comprising a positive source signal and a negative source signal, characterized in that the method comprises: 获取步骤:获取所述正源信号及负源信号的波形;Obtaining step: obtaining the waveforms of the positive source signal and the negative source signal; 电压准位测量步骤:根据获取的正源信号与负源信号的波形生成低压差分信号在差分状态下的波形,并根据生成的低压差分信号在差分状态下的波形测量低压差分信号在差分状态下的高/低电压准位;Voltage level measurement step: Generate the waveform of the low-voltage differential signal in the differential state according to the waveforms of the acquired positive source signal and the negative source signal, and measure the low-voltage differential signal in the differential state based on the generated waveform of the low-voltage differential signal in the differential state high/low voltage level; 共模噪声测量步骤:根据获取的正源信号与负源信号的波形生成低压差分信号在共模状态下的波形,并根据生成的共模状态下的波形测量低压差分信号的共模噪声;及Common-mode noise measurement step: generating the waveform of the low-voltage differential signal in a common-mode state according to the obtained waveforms of the positive source signal and the negative source signal, and measuring the common-mode noise of the low-voltage differential signal according to the generated waveform in the common-mode state; and 输出步骤:输出测量的高/低电压准位及共模噪声。Output step: output the measured high/low voltage level and common mode noise. 7.如权利要求6所述的低压差分信号测试方法,其特征在于,该方法还包括偏置电压测量步骤:根据获取的正源信号及负源信号的波形测量低压差分信号的偏置电压,所述输出步骤还包括输出测量的偏置电压。7. The low-voltage differential signal testing method as claimed in claim 6, characterized in that, the method also includes a bias voltage measurement step: measuring the bias voltage of the low-voltage differential signal according to the waveforms of the positive source signal and the negative source signal obtained, The outputting step also includes outputting the measured bias voltage. 8.如权利要求6所述的低压差分信号测试方法,其特征在于,该方法还包括判断步骤:判断测量的高/低电压准位及共模噪声是否符合技术规范。8. The low-voltage differential signal testing method according to claim 6, further comprising a judging step: judging whether the measured high/low voltage levels and common-mode noise meet technical specifications. 9.如权利要求6所述的低压差分信号测试方法,其特征在于,所述电压准位测量步骤利用直方图测量低压差分信号在差分状态下的高/低电压准位。9. The low voltage differential signal testing method according to claim 6, wherein the voltage level measuring step uses a histogram to measure the high/low voltage level of the low voltage differential signal in a differential state. 10.如权利要求6所述的低压差分信号测试方法,其特征在于,所述电压准位测量步骤还包括:测量低压差分信号在差分状态下的最大正电压及最大负电压。10 . The low voltage differential signal testing method according to claim 6 , wherein the step of measuring the voltage level further comprises: measuring the maximum positive voltage and the maximum negative voltage of the low voltage differential signal in a differential state. 11 .
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