CN102128968B - Low voltage differential signal testing system and method thereof - Google Patents
Low voltage differential signal testing system and method thereof Download PDFInfo
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- CN102128968B CN102128968B CN201010300229.9A CN201010300229A CN102128968B CN 102128968 B CN102128968 B CN 102128968B CN 201010300229 A CN201010300229 A CN 201010300229A CN 102128968 B CN102128968 B CN 102128968B
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Abstract
The invention relates to a low voltage differential signal testing system, which comprises a waveform acquisition module, a voltage reference position measuring module, a common mode noise measuring module and an output module, wherein the waveform acquisition module is used for acquiring the waveforms of a positive signal and a negative signal of a low voltage differential signal; the voltage reference position measuring module is used for measuring the high/low voltage reference position of the positive signal and the negative signal according to the waveforms of the positive signal and the negative signal; the common mode noise measuring module is used for measuring the common mode noise of the low voltage differential signal according to the waveform of the positive signal and the negative signal; and the output module is used for outputting the measured high/low voltage reference position and common mode noise. The invention further provides a low voltage differential signal testing method. In the invention, the high/low voltage reference position and the common mode noise of the low voltage differential signal can be tested quickly and accurately.
Description
Technical field
The present invention relates to a kind of signal test system and method, particularly about a kind of low voltage differential signal testing system and method.
Background technology
Low Voltage Differential Signal (Low Voltage Differential Signal, LVDS) be a kind of signal transmission technology of the low amplitude of oscillation, the advantages such as LDVS has at a high speed, low-power consumption, low noise, low cost are widely used in high speed data transfer.
In order to guarantee the correctness of data transmission, need to test high/low voltage quasi position, common-mode noise and the bias voltage of Low Voltage Differential Signal.At present, to the test of Low Voltage Differential Signal, need to rely on the manual operations of operator.Manual method of testing not only efficiency is low, and easily makes mistakes, and can not meet the rival demand that fast and high quality is produced.
Summary of the invention
In view of above content, be necessary to provide a kind of low voltage differential signal testing system, can to Low Voltage Differential Signal, implement test rapidly and accurately.
In addition, be also necessary to provide a kind of low voltage differential signal testing system, can to Low Voltage Differential Signal, implement test rapidly and accurately.
A low voltage differential signal testing system, described Low Voltage Differential Signal comprises positive source signal and negative source signal, this system comprises: waveform acquisition module, for obtaining the waveform of described positive source signal and negative source signal; Voltage quasi position measurement module, for generating the waveform of Low Voltage Differential Signal under differential state according to the positive source signal that obtains and the waveform of negative source signal, and according to the Low Voltage Differential Signal of generation the high/low voltage quasi position of the waveform measurement Low Voltage Differential Signal under differential state under differential state; Common-mode noise measurement module, for generate the waveform of Low Voltage Differential Signal under common-mode state according to the waveform of the positive source signal obtaining and negative source signal, and according to the common-mode noise of the waveform measurement Low Voltage Differential Signal under the common-mode state generating; And output module, for exporting high/low voltage quasi position and the common-mode noise of measurement.
A Low Voltage Differential Signal method of testing, described Low Voltage Differential Signal comprises positive source signal and negative source signal, the method comprises: obtaining step: the waveform that obtains described positive source signal and negative source signal; Voltage quasi position measuring process: according to the waveform of the positive source signal obtaining and negative source signal, generate the waveform of Low Voltage Differential Signal under differential state, and according to the Low Voltage Differential Signal generating the high/low voltage quasi position of the waveform measurement Low Voltage Differential Signal under differential state under differential state; Common-mode noise measuring process: according to the waveform of the positive source signal obtaining and negative source signal, generate the waveform of Low Voltage Differential Signal under common-mode state, and according to the common-mode noise of the waveform measurement Low Voltage Differential Signal under the common-mode state generating; And output step: high/low voltage quasi position and common-mode noise that output is measured.
Low voltage differential signal testing system of the present invention and method, high/low voltage quasi position and the common-mode noise that can test rapidly and accurately Low Voltage Differential Signal.
Accompanying drawing explanation
Fig. 1 is the applied environment schematic diagram of low voltage differential signal testing system preferred embodiment of the present invention.
Fig. 2 is the functional block diagram of Fig. 1 mesolow differential signal test macro.
Fig. 3 is the process flow diagram of Low Voltage Differential Signal method of testing of the present invention preferred embodiment.
Fig. 4 is the positive source signal of Low Voltage Differential Signal and the oscillogram of negative source signal.
Fig. 5 is oscillogram and the histogram of Low Voltage Differential Signal under differential state.
Fig. 6 is the oscillogram of Low Voltage Differential Signal under common-mode state.
Main element symbol description
| Low voltage differential |
10 |
| Data processing equipment | 11 |
| Oscillograph | 12 |
| Low Voltage Differential Signal | 13 |
| Positive source signal | 14 |
| Negative source signal | 15 |
| Display device | 16 |
| |
200 |
| Voltage quasi |
210 |
| Common-mode |
220 |
| Bias |
230 |
| |
240 |
| |
250 |
Embodiment
Consulting shown in Fig. 1, is the applied environment schematic diagram of low voltage differential signal testing system preferred embodiment of the present invention.Every a pair of Low Voltage Differential Signal 13 comprises a positive source signal 14 and a negative source signal 15.Described low voltage differential signal testing system 10 (for example: computing machine) runs on data processing equipment 11.This data processing equipment 11 and oscillograph 12 and display device 16 communication connections.Oscillograph 12 is surveyed Low Voltage Differential Signal 13 by test probe.Display device 16 shows the test result of Low Voltage Differential Signal 13.
Consulting shown in Fig. 2, is the functional block diagram of Fig. 1 mesolow differential signal test macro 10.Described low voltage differential signal testing system 10 comprises waveform acquisition module 200, voltage quasi position measurement module 210, common-mode noise measurement module 220, bias voltage measurement module 230, judge module 240 and output module 250.
Described waveform acquisition module 200 is for obtaining the positive source signal 14 of Low Voltage Differential Signal 13 and the waveform of negative source signal 15.In the present embodiment, waveform acquisition module 200 sends wave capture order to oscillograph 12.According to this wave capture order, oscillograph 12 is caught the positive source signal 14 of Low Voltage Differential Signal and the waveform of negative source signal 15, and by the waveform return data treatment facility 11 of the positive source signal 14 of the Low Voltage Differential Signal of catching 13 and negative source signal 15.As shown in Figure 4, solid line 40 represents the waveform of the positive source signal 14 of Low Voltage Differential Signal 13, the waveform of the negative source signal 15 that dotted line 41 representatives are corresponding with this positive source signal 14.
Described voltage quasi position measurement module 210 is for the high/low voltage quasi position under differential state according to the waveform measurement Low Voltage Differential Signal 13 of the positive source signal 14 obtaining and negative source signal 15.In the present embodiment, voltage quasi position measurement module 210 subtracts each other positive source signal 14 and the waveform of negative source signal 15, obtains the waveform of Low Voltage Differential Signal 13 under differential state.Voltage quasi position measurement module 210 statistics Low Voltage Differential Signal 13 frequencies that each magnitude of voltage occurs under differential state, using the highest positive voltage of the frequency of occurrences as Low Voltage Differential Signal 13 the high voltage level under differential state, using the highest negative voltage of the frequency of occurrences as Low Voltage Differential Signal 13 the low-voltage level under differential state.In the present embodiment, voltage quasi position measurement module 210 utilizes statistics with histogram Low Voltage Differential Signal 13 frequency that each magnitude of voltage occurs under differential state.As shown in Figure 5, curve 50 represents the waveform of Low Voltage Differential Signal 13 under differential state, and figure 51 represents the histogram of Low Voltage Differential Signal 13 under differential state.In this histogram, vertical direction represents voltage, and horizontal direction represents the frequency that magnitude of voltage occurs.From this histogram, the high voltage level of Low Voltage Differential Signal 13 under differential state is 0.35V, and low-voltage level is-0.35V.In the present embodiment, voltage quasi position measurement module 210 is also for measuring maximum positive voltage and the maximum negative voltage of Low Voltage Differential Signal 13 under differential state.For example, recording the maximum positive voltage of Low Voltage Differential Signal 13 under differential state is 0.39V, and maximum negative voltage is-0.39V.
The common-mode noise of the positive source signal 14 that described common-mode noise measurement module 220 obtains for basis and the waveform measurement Low Voltage Differential Signal 13 of negative source signal 15.In the present embodiment, common-mode noise measurement module 220 is the waveform adder with negative source signal 15 by the positive source signal of Low Voltage Differential Signal 13 14, obtain the waveform of Low Voltage Differential Signal 13 under common-mode state, calculate the poor of the maximum voltage of Low Voltage Differential Signal 13 under common-mode state and minimum voltage, using the difference of this maximum voltage and minimum voltage as the common-mode noise of Low Voltage Differential Signal 13.For example, suppose that the maximum voltage of Low Voltage Differential Signal 13 under common-mode state is 2.35V, minimum voltage is 2.20V, and the common-mode noise of Low Voltage Differential Signal 13 is 0.15V.As shown in Figure 6, curve 60 represents the waveform of Low Voltage Differential Signal 13 under common-mode state, and the waveform under this common-mode state is added and is obtained by the waveform 40 of positive source signal 14 and the waveform of negative source signal 15 41.
The bias voltage of the positive source signal 14 that described bias voltage measurement module 230 obtains for basis and the waveform measurement Low Voltage Differential Signal 13 of negative source signal 15.In the present embodiment, the bias voltage of bias voltage measurement module 230 waveshape Low Voltage Differential Signal 13 under common-mode state according to Low Voltage Differential Signal 13.Specifically, bias voltage measurement module 230 calculates the mean value of the voltage of Low Voltage Differential Signals 13 under common-mode state, usings 1/2nd bias voltages as Low Voltage Differential Signal 13 of this mean value.For example, the mean value of supposing the voltage of Low Voltage Differential Signal 13 under common-mode state is 2.3V, and the bias voltage of Low Voltage Differential Signal 13 is 1.15V.In other embodiment, can adopt the bias voltage of other method measurement Low Voltage Differential Signal 13.For example, the corresponding voltage of each intersection point of the waveform of the bias voltage measurement module 230 positive source signals 14 of measurement and negative source signal 15, gets the mean value of each intersection point corresponding voltage as the bias voltage of Low Voltage Differential Signal 13.
Described judge module 240 is for judging whether high/low voltage quasi position, common-mode noise and the bias voltage of measurement meets correlation technique standard.For example, suppose that technical manual stipulates that the minimum value of described high voltage level is 0.25V, maximal value is 0.45V, if the high voltage level measuring is 0.35V, meets technical manual.
Described output module 250 is for exporting high/low voltage quasi position, common-mode noise and the bias voltage of measurement.In the present embodiment, output module 250 is presented at described high/low voltage quasi position, common-mode noise and bias voltage on the display device 16 being connected with data processing equipment 11.In addition, output module 250 is also exported the situation that described high/low voltage quasi position, common-mode noise and bias voltage meet technical manual.
Consulting shown in Fig. 3, is the process flow diagram of Low Voltage Differential Signal method of testing of the present invention preferred embodiment.
Step S301, waveform acquisition module 200 obtains the positive source signal 14 of Low Voltage Differential Signal 13 and the waveform of negative source signal 15.In the present embodiment, waveform acquisition module 200 sends wave capture order to oscillograph 12.According to this wave capture order, oscillograph 12 is caught the positive source signal 14 of Low Voltage Differential Signal and the waveform of negative source signal 15, and by the waveform return data treatment facility 11 of the positive source signal 14 of the Low Voltage Differential Signal of catching 13 and negative source signal 15.As shown in Figure 4, solid line 40 represents the waveform of the positive source signal 14 of Low Voltage Differential Signal 13, the waveform of the negative source signal 15 that dotted line 41 representatives are corresponding with this positive source signal 14.
Step S302, voltage quasi position measurement module 210 is the high/low voltage quasi position under differential state according to the waveform measurement Low Voltage Differential Signal 13 of the positive source signal 14 obtaining and negative source signal 15.In the present embodiment, voltage quasi position measurement module 210 subtracts each other positive source signal 14 and the waveform of negative source signal 15, obtains the waveform of Low Voltage Differential Signal 13 under differential state.Voltage quasi position measurement module 210 statistics Low Voltage Differential Signal 13 frequencies that each magnitude of voltage occurs under differential state, using the highest positive voltage of the frequency of occurrences as Low Voltage Differential Signal 13 the high voltage level under differential state, using the highest negative voltage of the frequency of occurrences as Low Voltage Differential Signal 13 the low-voltage level under differential state.In the present embodiment, voltage quasi position measurement module 210 utilizes statistics with histogram Low Voltage Differential Signal 13 frequency that each magnitude of voltage occurs under differential state.As shown in Figure 5, curve 50 represents the waveform of Low Voltage Differential Signal 13 under differential state, and figure 51 represents the histogram of Low Voltage Differential Signal 13 under differential state.In this histogram, vertical direction represents voltage, and horizontal direction represents the frequency that magnitude of voltage occurs.From this histogram, the high voltage level of Low Voltage Differential Signal 13 under differential state is 0.35V, and low-voltage level is-0.35V.In the present embodiment, voltage quasi position measurement module 210 is also for measuring maximum positive voltage and the maximum negative voltage of Low Voltage Differential Signal 13 under differential state.For example, recording the maximum positive voltage of Low Voltage Differential Signal 13 under differential state is 0.39V, and maximum negative voltage is-0.39V.
Step S303, common-mode noise measurement module 220 is according to the common-mode noise of the waveform measurement Low Voltage Differential Signal 13 of the positive source signal 14 obtaining and negative source signal 15.In the present embodiment, common-mode noise measurement module 220 is the waveform adder with negative source signal 15 by the positive source signal of Low Voltage Differential Signal 13 14, obtain the waveform of Low Voltage Differential Signal 13 under common-mode state, calculate the poor of the maximum voltage of Low Voltage Differential Signal 13 under common-mode state and minimum voltage, using the difference of this maximum voltage and minimum voltage as the common-mode noise of Low Voltage Differential Signal 13.For example, suppose that the maximum voltage of Low Voltage Differential Signal 13 under common-mode state is 2.35V, minimum voltage is 2.20V, and the common-mode noise of Low Voltage Differential Signal 13 is 0.15V.As shown in Figure 6, curve 60 represents the waveform of Low Voltage Differential Signal 13 under common-mode state, and the waveform under this common-mode state is added and is obtained by the waveform 40 of positive source signal 14 and the waveform of negative source signal 15 41.
Step S304, bias voltage measurement module 230 is according to the bias voltage of the waveform measurement Low Voltage Differential Signal 13 of the positive source signal 14 obtaining and negative source signal 15.In the present embodiment, the bias voltage of bias voltage measurement module 230 waveshape Low Voltage Differential Signal 13 under common-mode state according to Low Voltage Differential Signal 13.Specifically, bias voltage measurement module 230 calculates the mean value of the voltage of Low Voltage Differential Signals 13 under common-mode state, usings 1/2nd bias voltages as Low Voltage Differential Signal 13 of this mean value.For example, the mean value of supposing the voltage of Low Voltage Differential Signal 13 under common-mode state is 2.3V, and the bias voltage of Low Voltage Differential Signal 13 is 1.15V.In other embodiment, can adopt the bias voltage of other method measurement Low Voltage Differential Signal 13.For example, the corresponding voltage of each intersection point of the waveform of the bias voltage measurement module 230 positive source signals 14 of measurement and negative source signal 15, gets the mean value of each intersection point corresponding voltage as the bias voltage of Low Voltage Differential Signal 13.
Step S305, whether high/low voltage quasi position, common-mode noise and bias voltage that judge module 240 judgements are measured meet correlation technique standard.For example, suppose that technical manual stipulates that the minimum value of described high voltage level is 0.25V, maximal value is 0.45V, if the high voltage level measuring is 0.35V, meets technical manual.
Step S306, high/low voltage quasi position, common-mode noise and bias voltage that output module 250 outputs are measured.In the present embodiment, output module 250 is presented at described high/low voltage quasi position, common-mode noise and bias voltage on the display device 16 being connected with data processing equipment 11.In addition, output module 250 is also exported the situation that described high/low voltage quasi position, common-mode noise and bias voltage meet technical manual.
Claims (10)
1. a low voltage differential signal testing system, described Low Voltage Differential Signal comprises positive source signal and negative source signal, it is characterized in that, this system comprises:
Waveform acquisition module, for obtaining the waveform of described positive source signal and negative source signal;
Voltage quasi position measurement module, for generating the waveform of Low Voltage Differential Signal under differential state according to the positive source signal that obtains and the waveform of negative source signal, and according to the Low Voltage Differential Signal of generation the high/low voltage quasi position of the waveform measurement Low Voltage Differential Signal under differential state under differential state;
Common-mode noise measurement module, for generate the waveform of Low Voltage Differential Signal under common-mode state according to the waveform of the positive source signal obtaining and negative source signal, and according to the common-mode noise of the waveform measurement Low Voltage Differential Signal under the common-mode state generating; And
Output module, for exporting high/low voltage quasi position and the common-mode noise of measurement.
2. low voltage differential signal testing system as claimed in claim 1, it is characterized in that, this system also comprises bias voltage measurement module, the bias voltage of the positive source signal obtaining for basis and the waveform measurement Low Voltage Differential Signal of negative source signal, described output module is also for exporting the bias voltage of measurement.
3. low voltage differential signal testing system as claimed in claim 1, is characterized in that, this system also comprises judge module, for judging whether high/low voltage quasi position and the common-mode noise of measurement meets technical manual.
4. low voltage differential signal testing system as claimed in claim 1, is characterized in that, described voltage quasi position measurement module utilizes histogram to measure the high/low voltage quasi position of Low Voltage Differential Signal under differential state.
5. low voltage differential signal testing system as claimed in claim 1, is characterized in that, described voltage quasi position measurement module is also for measuring maximum positive voltage and the maximum negative voltage of Low Voltage Differential Signal under differential state.
6. a Low Voltage Differential Signal method of testing, described Low Voltage Differential Signal comprises positive source signal and negative source signal, it is characterized in that, the method comprises:
Obtaining step: the waveform that obtains described positive source signal and negative source signal;
Voltage quasi position measuring process: according to the waveform of the positive source signal obtaining and negative source signal, generate the waveform of Low Voltage Differential Signal under differential state, and according to the Low Voltage Differential Signal generating the high/low voltage quasi position of the waveform measurement Low Voltage Differential Signal under differential state under differential state;
Common-mode noise measuring process: according to the waveform of the positive source signal obtaining and negative source signal, generate the waveform of Low Voltage Differential Signal under common-mode state, and according to the common-mode noise of the waveform measurement Low Voltage Differential Signal under the common-mode state generating; And
Output step: high/low voltage quasi position and common-mode noise that output is measured.
7. Low Voltage Differential Signal method of testing as claimed in claim 6, it is characterized in that, the method also comprises bias voltage measuring process: according to the bias voltage of the waveform measurement Low Voltage Differential Signal of the positive source signal obtaining and negative source signal, described output step also comprises the bias voltage that output is measured.
8. Low Voltage Differential Signal method of testing as claimed in claim 6, is characterized in that, the method also comprises determining step: whether high/low voltage quasi position and common-mode noise that judgement is measured meet technical manual.
9. Low Voltage Differential Signal method of testing as claimed in claim 6, is characterized in that, described voltage quasi position measuring process utilizes histogram to measure the high/low voltage quasi position of Low Voltage Differential Signal under differential state.
10. Low Voltage Differential Signal method of testing as claimed in claim 6, is characterized in that, described voltage quasi position measuring process also comprises: measure maximum positive voltage and the maximum negative voltage of Low Voltage Differential Signal under differential state.
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| CN104034995B (en) * | 2014-05-15 | 2016-09-21 | 武汉精测电子技术股份有限公司 | LVDS signal is opened short-circuit detecting device and opens method for detecting short circuit |
| CN107390113A (en) * | 2017-08-16 | 2017-11-24 | 上海华岭集成电路技术股份有限公司 | A kind of method of ATE tests differential signal level |
| CN110930914B (en) * | 2019-12-17 | 2023-07-21 | 京东方科技集团股份有限公司 | Signal detection circuit, signal detection method and display device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6215427B1 (en) * | 1997-10-14 | 2001-04-10 | Thomson Multimedia | Analog-digital conversion device comprising a differential comparator |
| CN201035160Y (en) * | 2007-01-23 | 2008-03-12 | 张亦翔 | Difference output passive infrared double-inspected prober of bi-heat electric-dispelling infrared sensor |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6215427B1 (en) * | 1997-10-14 | 2001-04-10 | Thomson Multimedia | Analog-digital conversion device comprising a differential comparator |
| CN201035160Y (en) * | 2007-01-23 | 2008-03-12 | 张亦翔 | Difference output passive infrared double-inspected prober of bi-heat electric-dispelling infrared sensor |
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