CN102115833A - Gold beryllium alloy material for semiconductor devices and preparation method and application thereof - Google Patents
Gold beryllium alloy material for semiconductor devices and preparation method and application thereof Download PDFInfo
- Publication number
- CN102115833A CN102115833A CN2009102445579A CN200910244557A CN102115833A CN 102115833 A CN102115833 A CN 102115833A CN 2009102445579 A CN2009102445579 A CN 2009102445579A CN 200910244557 A CN200910244557 A CN 200910244557A CN 102115833 A CN102115833 A CN 102115833A
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- CN
- China
- Prior art keywords
- gold
- beryllium
- alloy
- preparation
- golden
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 title claims abstract description 76
- 239000010931 gold Substances 0.000 title claims abstract description 76
- 229910052737 gold Inorganic materials 0.000 title claims abstract description 72
- 229910000952 Be alloy Inorganic materials 0.000 title claims abstract description 55
- 239000000956 alloy Substances 0.000 title claims abstract description 54
- 239000004065 semiconductor Substances 0.000 title claims abstract description 38
- 238000002360 preparation method Methods 0.000 title claims abstract description 29
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 claims abstract description 44
- 229910052790 beryllium Inorganic materials 0.000 claims abstract description 43
- 238000000034 method Methods 0.000 claims abstract description 41
- 229910045601 alloy Inorganic materials 0.000 claims abstract description 36
- 239000000463 material Substances 0.000 claims abstract description 25
- 230000008569 process Effects 0.000 claims abstract description 14
- 150000001875 compounds Chemical class 0.000 claims abstract description 11
- 238000010438 heat treatment Methods 0.000 claims abstract description 10
- 238000007670 refining Methods 0.000 claims abstract description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 6
- 238000009749 continuous casting Methods 0.000 claims abstract description 5
- 239000002994 raw material Substances 0.000 claims abstract description 4
- 238000005303 weighing Methods 0.000 claims abstract description 3
- 239000000203 mixture Substances 0.000 claims description 12
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 8
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 6
- 238000000137 annealing Methods 0.000 claims description 6
- 239000007772 electrode material Substances 0.000 claims description 6
- 238000009826 distribution Methods 0.000 claims description 5
- 239000007858 starting material Substances 0.000 claims description 5
- 238000005491 wire drawing Methods 0.000 claims description 4
- 229910052786 argon Inorganic materials 0.000 claims description 3
- 239000007789 gas Substances 0.000 claims description 3
- 239000012535 impurity Substances 0.000 claims description 3
- 229910001020 Au alloy Inorganic materials 0.000 abstract 2
- 238000003723 Smelting Methods 0.000 abstract 1
- 238000001816 cooling Methods 0.000 abstract 1
- 238000002844 melting Methods 0.000 abstract 1
- 230000008018 melting Effects 0.000 abstract 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 abstract 1
- 238000009792 diffusion process Methods 0.000 description 21
- 125000004429 atom Chemical group 0.000 description 6
- 238000005275 alloying Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 231100000252 nontoxic Toxicity 0.000 description 3
- 230000003000 nontoxic effect Effects 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- PWOSZCQLSAMRQW-UHFFFAOYSA-N beryllium(2+) Chemical compound [Be+2] PWOSZCQLSAMRQW-UHFFFAOYSA-N 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 238000000354 decomposition reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 229910000765 intermetallic Inorganic materials 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 229910052745 lead Inorganic materials 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 238000012946 outsourcing Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 125000004437 phosphorous atom Chemical group 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000005204 segregation Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/43—Manufacturing methods
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/43—Manufacturing methods
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/4501—Shape
- H01L2224/45012—Cross-sectional shape
- H01L2224/45015—Cross-sectional shape being circular
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00011—Not relevant to the scope of the group, the symbol of which is combined with the symbol of this group
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H01—ELECTRIC ELEMENTS
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01004—Beryllium [Be]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
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- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
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- H01L2924/01—Chemical elements
- H01L2924/01014—Silicon [Si]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01015—Phosphorus [P]
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- H01L2924/01—Chemical elements
- H01L2924/01023—Vanadium [V]
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- H01L2924/01—Chemical elements
- H01L2924/01051—Antimony [Sb]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
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- H—ELECTRICITY
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
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- H—ELECTRICITY
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01327—Intermediate phases, i.e. intermetallics compounds
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/1026—Compound semiconductors
- H01L2924/1032—III-V
- H01L2924/10329—Gallium arsenide [GaAs]
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacture And Refinement Of Metals (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
Description
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2009102445579A CN102115833B (en) | 2009-12-30 | 2009-12-30 | Gold beryllium alloy material for semiconductor devices and preparation method and application thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2009102445579A CN102115833B (en) | 2009-12-30 | 2009-12-30 | Gold beryllium alloy material for semiconductor devices and preparation method and application thereof |
Publications (2)
Publication Number | Publication Date |
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CN102115833A true CN102115833A (en) | 2011-07-06 |
CN102115833B CN102115833B (en) | 2013-11-27 |
Family
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Family Applications (1)
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CN2009102445579A Active CN102115833B (en) | 2009-12-30 | 2009-12-30 | Gold beryllium alloy material for semiconductor devices and preparation method and application thereof |
Country Status (1)
Country | Link |
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CN (1) | CN102115833B (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102912176A (en) * | 2012-09-21 | 2013-02-06 | 宁波康强电子股份有限公司 | High-end packaging silver alloy bonding wire and method for manufacturing same |
CN104353669A (en) * | 2014-09-12 | 2015-02-18 | 北京科技大学 | Preparation method of high-performance gold coated copper bonding wire |
CN109536770A (en) * | 2018-12-04 | 2019-03-29 | 有研亿金新材料有限公司 | A kind of semiconductor device gold beryllium alloy material and preparation method |
CN114921678A (en) * | 2022-05-06 | 2022-08-19 | 紫金矿业集团黄金珠宝有限公司 | Ultrahigh-strength gold material, and preparation method and equipment thereof |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1010906B (en) * | 1988-07-15 | 1990-12-19 | 厦门大学 | Technology for preparing electrode of gallium phosphide led |
JP2000299346A (en) * | 1999-04-16 | 2000-10-24 | Nippon Steel Corp | Bonding wire for mounting semiconductor |
JP2005294681A (en) * | 2004-04-02 | 2005-10-20 | Sumitomo Metal Mining Co Ltd | Bonding wire for semiconductor element, and manufacturing method thereof |
JP4617902B2 (en) * | 2005-01-31 | 2011-01-26 | 信越半導体株式会社 | Light emitting device and method for manufacturing light emitting device |
CN100394592C (en) * | 2006-07-11 | 2008-06-11 | 中国印钞造币总公司 | Gold bonding wire and method for manufacturing same |
-
2009
- 2009-12-30 CN CN2009102445579A patent/CN102115833B/en active Active
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102912176A (en) * | 2012-09-21 | 2013-02-06 | 宁波康强电子股份有限公司 | High-end packaging silver alloy bonding wire and method for manufacturing same |
CN102912176B (en) * | 2012-09-21 | 2014-12-17 | 宁波康强电子股份有限公司 | High-end packaging silver alloy bonding wire and method for manufacturing same |
CN104353669A (en) * | 2014-09-12 | 2015-02-18 | 北京科技大学 | Preparation method of high-performance gold coated copper bonding wire |
CN104353669B (en) * | 2014-09-12 | 2016-08-17 | 北京科技大学 | A kind of preparation method of high-performance gold copper-clad bonding microfilament |
CN109536770A (en) * | 2018-12-04 | 2019-03-29 | 有研亿金新材料有限公司 | A kind of semiconductor device gold beryllium alloy material and preparation method |
CN109536770B (en) * | 2018-12-04 | 2020-10-16 | 有研亿金新材料有限公司 | Gold-beryllium alloy material for semiconductor device and preparation method thereof |
CN114921678A (en) * | 2022-05-06 | 2022-08-19 | 紫金矿业集团黄金珠宝有限公司 | Ultrahigh-strength gold material, and preparation method and equipment thereof |
CN114921678B (en) * | 2022-05-06 | 2023-04-11 | 紫金矿业集团黄金珠宝有限公司 | Ultrahigh-strength gold material, and preparation method and equipment thereof |
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Publication number | Publication date |
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CN102115833B (en) | 2013-11-27 |
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Denomination of invention: Gold beryllium alloy material for semiconductor devices and preparation method and application thereof Effective date of registration: 20140415 Granted publication date: 20131127 Pledgee: Beijing rural commercial bank, Limited by Share Ltd, Sijiqing branch Pledgor: Beijing Non-ferrous Metal and Rare-earth Application Inst. Registration number: 2014990000267 |
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Date of cancellation: 20160922 Granted publication date: 20131127 Pledgee: Beijing rural commercial bank, Limited by Share Ltd, Sijiqing branch Pledgor: Beijing Non-ferrous Metal and Rare-earth Application Inst. Registration number: 2014990000267 |
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PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: Gold beryllium alloy material for semiconductor devices and preparation method and application thereof Effective date of registration: 20160922 Granted publication date: 20131127 Pledgee: Beijing rural commercial bank, Limited by Share Ltd, Sijiqing branch Pledgor: Beijing Non-ferrous Metal and Rare-earth Application Inst. Registration number: 2016990000811 |
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PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20170925 Granted publication date: 20131127 Pledgee: Beijing rural commercial bank, Limited by Share Ltd, Sijiqing branch Pledgor: Beijing Non-ferrous Metal and Rare-earth Application Inst. Registration number: 2016990000811 |