CN102103027A - Novel platinum film resistance test clip - Google Patents

Novel platinum film resistance test clip Download PDF

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Publication number
CN102103027A
CN102103027A CN2009100734593A CN200910073459A CN102103027A CN 102103027 A CN102103027 A CN 102103027A CN 2009100734593 A CN2009100734593 A CN 2009100734593A CN 200910073459 A CN200910073459 A CN 200910073459A CN 102103027 A CN102103027 A CN 102103027A
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CN
China
Prior art keywords
platinum
pair
test clip
test
clip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2009100734593A
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Chinese (zh)
Inventor
王凡
张洪泉
姜国光
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CETC 49 Research Institute
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CETC 49 Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CETC 49 Research Institute filed Critical CETC 49 Research Institute
Priority to CN2009100734593A priority Critical patent/CN102103027A/en
Publication of CN102103027A publication Critical patent/CN102103027A/en
Pending legal-status Critical Current

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Abstract

The invention discloses a novel platinum film resistance test clip, which solves the requirement that the platinum film resistance precision is not more than 0.05 percent, is miniaturized and easily placed into a protective tube to measure the platinum film resistance, realizes isolation of pollution of oil and water on the platinum film resistor, changes the vector mode of the conventional test clip, and reaches the requirement that the contact resistance is less than 10m omega.

Description

A kind of novel platinum-membrane resistor test clip
(1) technical field
The invention belongs to sensor test technology and preparation field, relate to a kind of design and preparation method of platinum-membrane resistor (Pt100) test clip of little contact resistance of miniaturization of novel no oil contamination.
(2) background technology
Manufacture the field at platinum-membrane resistor (Pt100) temperature sensor, the usual method that detects platinum-membrane resistor is with the test clip of 300mm * 40mm * 40mm platinum-membrane resistor to be gone between to clamp directly to put into oil groove or tank is demarcated, this test clip belongs to radially clamp method, picking and placeing when making things convenient for platinum-membrane resistor to detect, but it is big to exist volume, can not realize isolating the test of oil and water pollution, need after the detection to clean and baking operation, increase production cost, be not easy for platinum-membrane resistor (Pt100) test of high-precision requirement and the problem of demarcating.The present invention be directed to the platinum-membrane resistor (Pt100) of being used to army's graticule production high-precision requirement (being not more than 0.05%) tests and demarcates and a kind of novel platinum-membrane resistor (Pt100) test clip of design and manufacturing, all parts all adopt machine finishing technology and the preparation of printed circuit board (PCB) fabrication technique, the test fixture that assembles with four-wire system measure, volume is little, contact resistance between the clamp electrode less than 10m Ω, do not contact the performance and the characteristics of oil or water test, satisfy the test and the calibration request of high precision platinum-membrane resistor (Pt100) fully.
(3) summary of the invention
The objective of the invention is for solve high precision platinum-membrane resistor (Pt100) test and demarcate in the following problem that exists: (1) has solved the platinum-membrane resistor lead-in wire and has been welded on the test-strips after the test with scolding tin, through 500 ℃ of high temperature agings, tin element in the lead-in wire is sucked out, and the easily broken problem that becomes fragile goes between; (2) solved the little element size that causes of clamp and processed between the bad assurance electrode contact resistance less than the problem of 10m Ω, all parts are processed all by the free tolerance requirement, be easy to processing and preparing, the test clip assembly technology is simple, has satisfied the requirement of platinum-membrane resistor test; (3) because test clip has been realized miniaturization, solved the detection problem that platinum-membrane resistor does not have oil contamination.
The invention provides a kind of preparation method of novel platinum-membrane resistor (Pt100) test clip.
The preparation method who relates among the present invention is made up of following processing step: parts finishing-printed board manufacturing-parts cleaning-parts are gold-plated-and the test of test clip assembling-contact resistance.
(4) description of drawings
Fig. 1 is a platinum-membrane resistor test clip preparation technology FB(flow block); Fig. 2 is a pcb map; Fig. 3 is the fixed electorde manuscript; Fig. 4 is the float electrode manuscript; Fig. 5 is the little spring manuscript; Fig. 6 is the pull bar manuscript; Fig. 7 is the arm-tie manuscript; Fig. 8 primary nut manuscript; Fig. 9 pull bar slideway manuscript.
(5) embodiment
The preparation of platinum-membrane resistor test clip is undertaken by process flow diagram, this flow process is summarized for: parts finishing and (is solved the finding processing problems, gold-plated (anti-electrode is oxidized and reduce contact resistance, and thickness of coating requires to be not less than 0.1mm comprising small spring preparation, printed board preparation, parts.), test clip is easy to assembly, retaining element can be welded in the printed board with high temperature scolding tin, make fixed electorde form solid and reliable being connected with four cablings at the printed board back side with slideway, it is that lead-in wire with the platinum-membrane resistor of 10mm is placed between pair of stationary electrodes and the float electrode and clamps that test clip can obtain temperature stability, contact resistance test result preferably, measure contact resistance with the numerous power block four-wire system with table of numeral, measured value is 4m Ω under room temperature environment; The isolated tube of clamp being put into Φ 10 is 3m Ω at 0 ℃ of environment measured value; The isolated tube of clamp being put into Φ 10 is 6m Ω at 100 ℃ of environment measured values; In this way repeated measurement 10 several times, the repeatability of the contact resistance of this test clip is between 1~2m Ω.This result has proved that the temperature stability of this test clip is good, satisfies the requirement of contact resistance less than 10m Ω fully.

Claims (4)

1. manufacture and design by printed board according to claim 1 clamp and form, it is characterized in that one side is wiring side, another side is for laying part surface, by plated through-hole with part with scolding tin firmly and printed board welded together, make two electrodes and cabling conducting good, test clip is stable and reliable for performance in high and low temperature environment.
2. do not have the oil contamination test according to claim 2 platinum-membrane resistor, it is characterized by pair of conductive metal clip cloth and be placed in the wide printed board of 8mm, clamping Pt100 platinum-membrane resistor is shut metal tube for one that puts into Φ 10 reliably, has realized isolating the purpose of oil contamination.
3. according to the contact resistance of claim 3 less than 10m Ω, it is characterized by the pair of conductive metal clip and be designed to pair of stationary electrodes, a pair of float electrode, a pair of pull bar and an arm-tie, can make float electrode be drawn back simultaneously and clamp simultaneously, make things convenient for picking and placeing of Pt100 platinum-membrane resistor, float electrode is respectively with a spring push-tight, make every pair of electrode can both obtain maximum holding force respectively, realize reducing the purpose that electrode gets an electric shock indirectly and hinders.
4. according to the appearance design of claim 4 platinum-membrane resistor test clip, it is characterized by the arrow power mode that has changed test clip, reducing is axial holding force to holding force, makes the test clip miniaturization.
CN2009100734593A 2009-12-18 2009-12-18 Novel platinum film resistance test clip Pending CN102103027A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2009100734593A CN102103027A (en) 2009-12-18 2009-12-18 Novel platinum film resistance test clip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2009100734593A CN102103027A (en) 2009-12-18 2009-12-18 Novel platinum film resistance test clip

Publications (1)

Publication Number Publication Date
CN102103027A true CN102103027A (en) 2011-06-22

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN2009100734593A Pending CN102103027A (en) 2009-12-18 2009-12-18 Novel platinum film resistance test clip

Country Status (1)

Country Link
CN (1) CN102103027A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107990993A (en) * 2017-12-11 2018-05-04 中国电子科技集团公司第四十六研究所 A kind of strip line temperature coefficient tester thermometric fixture and application method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2611990Y (en) * 2003-03-03 2004-04-14 上海华园微电子技术有限公司 Testing clamp of IC card modulator
CN1614727A (en) * 2004-09-28 2005-05-11 宁夏星日电子股份有限公司 Lamellar element ageing apparatus
WO2007098153A2 (en) * 2006-02-21 2007-08-30 Cisco Technology, Inc. Method and apparatus for strain monitoring of printed circuit board assemblies
CN201112803Y (en) * 2007-05-10 2008-09-10 曹宏国 40 wire ceramic lead-wire-free sheet type carrier aging testing socket

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2611990Y (en) * 2003-03-03 2004-04-14 上海华园微电子技术有限公司 Testing clamp of IC card modulator
CN1614727A (en) * 2004-09-28 2005-05-11 宁夏星日电子股份有限公司 Lamellar element ageing apparatus
WO2007098153A2 (en) * 2006-02-21 2007-08-30 Cisco Technology, Inc. Method and apparatus for strain monitoring of printed circuit board assemblies
CN201112803Y (en) * 2007-05-10 2008-09-10 曹宏国 40 wire ceramic lead-wire-free sheet type carrier aging testing socket

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107990993A (en) * 2017-12-11 2018-05-04 中国电子科技集团公司第四十六研究所 A kind of strip line temperature coefficient tester thermometric fixture and application method

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Application publication date: 20110622