CN102066919B - 衬底的声学镜上的压电声学谐振器的装置、用于制造该装置的方法以及该装置的应用 - Google Patents

衬底的声学镜上的压电声学谐振器的装置、用于制造该装置的方法以及该装置的应用 Download PDF

Info

Publication number
CN102066919B
CN102066919B CN200980122904.9A CN200980122904A CN102066919B CN 102066919 B CN102066919 B CN 102066919B CN 200980122904 A CN200980122904 A CN 200980122904A CN 102066919 B CN102066919 B CN 102066919B
Authority
CN
China
Prior art keywords
mirror
layer
substrate
resonator
insulation course
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN200980122904.9A
Other languages
English (en)
Chinese (zh)
Other versions
CN102066919A (zh
Inventor
D.皮策尔
M.施雷特
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Baioman Western Europe Co.,Ltd.
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of CN102066919A publication Critical patent/CN102066919A/zh
Application granted granted Critical
Publication of CN102066919B publication Critical patent/CN102066919B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02Analysing fluids
    • G01N29/022Fluid sensors based on microsensors, e.g. quartz crystal-microbalance [QCM], surface acoustic wave [SAW] devices, tuning forks, cantilevers, flexural plate wave [FPW] devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02Analysing fluids
    • G01N29/036Analysing fluids by measuring frequency or resonance of acoustic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/24Probes
    • G01N29/2437Piezoelectric probes
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H3/00Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
    • H03H3/007Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
    • H03H3/02Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
    • H03H3/04Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks for obtaining desired frequency or temperature coefficient
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02Details
    • H03H9/05Holders; Supports
    • H03H9/0538Constructional combinations of supports or holders with electromechanical or other electronic elements
    • H03H9/0547Constructional combinations of supports or holders with electromechanical or other electronic elements consisting of a vertical arrangement
    • H03H9/0557Constructional combinations of supports or holders with electromechanical or other electronic elements consisting of a vertical arrangement the other elements being buried in the substrate
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/15Constructional features of resonators consisting of piezoelectric or electrostrictive material
    • H03H9/17Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
    • H03H9/171Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
    • H03H9/172Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
    • H03H9/175Acoustic mirrors
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H3/00Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
    • H03H3/007Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
    • H03H3/02Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
    • H03H2003/025Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks the resonators or networks comprising an acoustic mirror
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/42Piezoelectric device making

Landscapes

  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Engineering & Computer Science (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Transducers For Ultrasonic Waves (AREA)
CN200980122904.9A 2008-06-20 2009-06-15 衬底的声学镜上的压电声学谐振器的装置、用于制造该装置的方法以及该装置的应用 Active CN102066919B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102008029378A DE102008029378B4 (de) 2008-06-20 2008-06-20 Anordnung eines piezoakustischen Resonators auf einem akustischen Spiegel eines Substrats, Verfahren zum Herstellen der Anordnung und Verwendung der Anordnung
DE102008029378.4 2008-06-20
PCT/EP2009/057341 WO2009153235A1 (fr) 2008-06-20 2009-06-15 Agencement d’un résonateur piézoacoustique sur un miroir acoustique d’un substrat, procédé pour produire un tel agencement et utilisation de ce dernier

Publications (2)

Publication Number Publication Date
CN102066919A CN102066919A (zh) 2011-05-18
CN102066919B true CN102066919B (zh) 2014-07-23

Family

ID=40934124

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200980122904.9A Active CN102066919B (zh) 2008-06-20 2009-06-15 衬底的声学镜上的压电声学谐振器的装置、用于制造该装置的方法以及该装置的应用

Country Status (6)

Country Link
US (1) US8536764B2 (fr)
EP (1) EP2288912B1 (fr)
JP (1) JP5006989B2 (fr)
CN (1) CN102066919B (fr)
DE (1) DE102008029378B4 (fr)
WO (1) WO2009153235A1 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013140648A1 (fr) 2012-03-21 2013-09-26 オリンパスメディカルシステムズ株式会社 Instrument de traitement endoscopique
US9862592B2 (en) 2015-03-13 2018-01-09 Taiwan Semiconductor Manufacturing Co., Ltd. MEMS transducer and method for manufacturing the same
DE102015220855A1 (de) * 2015-10-26 2017-04-27 Robert Bosch Gmbh Sensorvorrichtung zur Erfassung mindestens einer Strömungseigenschaft eines fluiden Mediums
US20180003677A1 (en) * 2016-06-30 2018-01-04 Intel Corporation Piezoelectric package-integrated chemical species-sensitive resonant devices
US10686425B2 (en) 2017-06-30 2020-06-16 Texas Instruments Incorporated Bulk acoustic wave resonators having convex surfaces, and methods of forming the same
EP3733310A1 (fr) * 2019-04-30 2020-11-04 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk Onderzoek TNO Réseaux de transducteurs à membrane piézoélectrique acoustique avec vibrations de membrane localisées

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004017063A2 (fr) * 2002-07-19 2004-02-26 Siemens Aktiengesellschaft Dispositif et procede pour detecter une substance
CN1864063A (zh) * 2003-10-08 2006-11-15 皇家飞利浦电子股份有限公司 体声波传感器

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US201305A (en) * 1878-03-12 Improvement in sheet-metal-flanging machines
US125489A (en) * 1872-04-09 Improvement in money-pockets for garments
US48802A (en) * 1865-07-18 Improvement in shirt-collars
DE10147075A1 (de) * 2001-09-25 2003-04-30 Infineon Technologies Ag Piezoelektrisches Bauelement und Verfahren zu dessen Herstellung
US7989851B2 (en) * 2002-06-06 2011-08-02 Rutgers, The State University Of New Jersey Multifunctional biosensor based on ZnO nanostructures
DE20221966U1 (de) * 2002-06-06 2010-02-25 Epcos Ag Mit akustischen Wellen arbeitendes Bauelement mit einem Anpaßnetzwerk
JP2004187204A (ja) 2002-12-06 2004-07-02 Sony Corp 音響共振器および信号処理装置
US6992400B2 (en) * 2004-01-30 2006-01-31 Nokia Corporation Encapsulated electronics device with improved heat dissipation
DE102004058064A1 (de) * 2004-12-01 2006-06-08 Siemens Ag Biochemisches Halbleiterchiplabor mit angekoppeltem Adressier- und Steuerchip und Verfahren zur Herstellung desselben
US7248131B2 (en) * 2005-03-14 2007-07-24 Avago Technologies Wireless Ip (Singapore) Pte. Ltd. Monolithic vertical integration of an acoustic resonator and electronic circuitry
US7436269B2 (en) * 2005-04-18 2008-10-14 Avago Technologies Wireless Ip (Singapore) Pte. Ltd. Acoustically coupled resonators and method of making the same
FR2890490A1 (fr) 2005-09-05 2007-03-09 St Microelectronics Sa Support de resonateur acoustique et circuit integre correspondant
US7378781B2 (en) * 2005-09-07 2008-05-27 Nokia Corporation Acoustic wave resonator with integrated temperature control for oscillator purposes
FR2927743B1 (fr) * 2008-02-15 2011-06-03 St Microelectronics Sa Circuit de filtrage comportant des resonateurs acoustiques couples

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004017063A2 (fr) * 2002-07-19 2004-02-26 Siemens Aktiengesellschaft Dispositif et procede pour detecter une substance
CN1864063A (zh) * 2003-10-08 2006-11-15 皇家飞利浦电子股份有限公司 体声波传感器

Also Published As

Publication number Publication date
EP2288912B1 (fr) 2019-05-29
DE102008029378B4 (de) 2010-04-15
DE102008029378A1 (de) 2009-12-31
CN102066919A (zh) 2011-05-18
WO2009153235A1 (fr) 2009-12-23
US20110089786A1 (en) 2011-04-21
JP2011524709A (ja) 2011-09-01
US8536764B2 (en) 2013-09-17
JP5006989B2 (ja) 2012-08-22
EP2288912A1 (fr) 2011-03-02

Similar Documents

Publication Publication Date Title
US11539344B2 (en) Elastic wave device and method for producing the same
US10263598B2 (en) Acoustic resonator and method of manufacturing the same
CN100546178C (zh) 制造压电薄膜器件的方法和压电薄膜器件
CN102066919B (zh) 衬底的声学镜上的压电声学谐振器的装置、用于制造该装置的方法以及该装置的应用
US6271619B1 (en) Piezoelectric thin film device
JP2006140271A (ja) 半導体装置
WO2014138376A1 (fr) Systèmes et procédés pour détection de champ magnétique
US9837598B2 (en) Piezoelectric bulk wave device, and method of manufacturing the piezoelectric bulk wave device
US9780292B2 (en) Piezoelectric bulk wave device, and method of manufacturing the piezoelectric bulk wave device
CN104764802A (zh) 利用具有绝缘层的薄膜谐振器探测物质的装置和方法
JP2002344279A (ja) 圧電薄膜共振子
JP2011004035A (ja) 屈曲振動片および屈曲振動片の製造方法
US9530956B2 (en) Piezoelectric bulk wave device, and method of manufacturing the piezoelectric bulk wave device
CN108631742A (zh) 声波谐振器及其制造方法
US7179392B2 (en) Method for forming a tunable piezoelectric microresonator
JP2007201772A (ja) 弾性波素子の製造方法、電子機器の製造方法、マスクおよびマスクの製造方法
JP5184179B2 (ja) 薄膜共振子、フィルタおよびデュプレクサ
US7950282B2 (en) Acceleration sensor incorporating a piezoelectric device
US11716070B2 (en) Film bulk acoustic sensors using thin LN-LT layer
US20200171541A1 (en) Microelectromechanical systems, devices, and methods for fabricating a microelectromechanical systems device, and methods for generating a plurality of frequencies
JP2014099779A (ja) 弾性波デバイスおよびその製造方法
US8519598B1 (en) Microelectromechanical resonators having piezoelectric layers therein that support actuation and sensing through a longitudinal piezoelectric effect
US20230327637A1 (en) Transversely-excited film bulk acoustic resonator with thick dielectric layer for improved coupling
JP2009100367A (ja) 圧電振動装置
CN113965181B (zh) 用于电极结构制作的方法、电极结构和体声波谐振器

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20210817

Address after: Tampere

Patentee after: Baioman Western Europe Co.,Ltd.

Address before: Munich, Germany

Patentee before: SIEMENS AG

TR01 Transfer of patent right