CN102053618A - MCU truthlikeness check method and checking circuit thereof - Google Patents

MCU truthlikeness check method and checking circuit thereof Download PDF

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Publication number
CN102053618A
CN102053618A CN 201110026559 CN201110026559A CN102053618A CN 102053618 A CN102053618 A CN 102053618A CN 201110026559 CN201110026559 CN 201110026559 CN 201110026559 A CN201110026559 A CN 201110026559A CN 102053618 A CN102053618 A CN 102053618A
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mcu
truthlikeness
adc
circuit
value
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CN 201110026559
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Chinese (zh)
Inventor
陆英武
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Zhejiang Taizhou Aishida Electrical Equipment Co Ltd
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Dongguan Bubugao Electrical Appliances Co Ltd
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Abstract

The invention discloses an MCU (Micro Control Unit) truthlikeness check method. The check method comprises the following steps: 1, starting a truthlikeness check process; 2, switching the ADC detection port of the MCU to change the ADC detection state into the common IO state; 3, outputting high level and keeping for a while; 4, switching the common IO state to ADC detection state and reading the current AD value; 5, judging whether the current AD value is within the normal range or not; 6, going to step 8 when the current AD value is within the normal range and the function of the ADC detection port is normal, and performing step 7 when the AD value is not within the normal range and the function of the ADC detection port is abnormal; 7, entering the corresponding protection process; and 8, conducting the next cycle program. A checking circuit for the application of the MCU truthlikeness check method comprises a partial pressure circuit, a capacitor circuit and an MCU circuit. The method can conveniently realize the check of the MCU truthlikeness, greatly improves the reliability of products and the efficiency, and reduces cost.

Description

A kind of MCU truthlikeness inspection method and check circuit thereof
Technical field
The present invention relates to a kind of inspection method and check circuit thereof, particularly relate to a kind of MCU truthlikeness inspection method and check circuit thereof.
Background technology
Small household electrical appliance is such as the promulgation along with new national standard such as electromagnetic oven, soy bean milk making machine, more and more need to force to add fuse-link, but GB has stipulated also can substitute by the mode of software evaluation the effect of fuse-link, and the present invention is the cost effective method that designs for the truthlikeness inspection that realizes microprocessor MCU (abbreviation of English Micro Control Unit) pin.The truthlikeness inspection is exactly that a kind of fail/fault control technology of checking with procedure order, timing or the data that determine whether to allow is carried out, imports or exported to program.
Summary of the invention
The objective of the invention is to overcome the deficiencies in the prior art, a kind of MCU truthlikeness inspection method and check circuit thereof are provided, can easily realize the truthlikeness inspection of MCU, improved reliability of products greatly, and improved efficient, reduced cost.
In order to achieve the above object, the technical solution used in the present invention is, a kind of MCU truthlikeness inspection method, and its step is as follows:
Step 1, truthlikeness scrutiny program begin;
The ADC of step 2, switching MCU detects mouth and becomes common IO state by the ADC detected state;
Step 3, export high level and keep a period of time;
Step 4, more common IO state is switched to the ADC detected state, read current AD value;
Step 5, judge that whether current AD value is in normal range;
Step 6, current AD value are in normal range, and then ADC detection mouthful function is normal, skips to step 8; Current AD value is not in normal range, and it is impaired that then ADC detects mouthful function, execution in step 7;
Step 7, enter the corresponding protection program;
Step 8, the next loop program of carrying out.
A kind of truthlikeness check circuit that utilizes described MCU truthlikeness inspection method is located on the PCB circuit board, and this circuit is made up of bleeder circuit, condenser network and MCU circuit successively.Bleeder circuit is made up of pull-up resistor R1 and pull down resistor R2, and condenser network is made up of the capacitor C 1 that plays pressure stabilization function, and the MCU circuit is by the abbreviation that has A/D converter ADC(Analog-to-Digital Converter) MCU that detects mouth forms.Pull-up resistor R1 one termination power VDD, VDD is a constant voltage source, another termination pull down resistor R2, pull down resistor R2 other end ground connection, the ADC of MCU detects mouth and is connected between pull-up resistor R1 and the pull down resistor R2, and capacitor C 1 one ends connect ADC interface, other end ground connection.
Compared with prior art, the invention has the beneficial effects as follows: the simple and efficient MCU truthlikeness is checked of the method energy, and under normal condition, can be used as testing circuits such as temperature sensor, pressure transducer at circuit based on the truthlikeness inspection method, when starting the truthlikeness scrutiny program as the truthlikeness check circuit, realized the purpose of two kinds of functions of a kind of circuit, reduce the use of components and parts, greatly reduced the cost of product design, improved reliability of products simultaneously.
Description of drawings
Fig. 1 is a software flow pattern of the present invention; Fig. 2 is circuit theory diagrams of the present invention.
Embodiment
Purport of the present invention is to overcome the deficiencies in the prior art, and a kind of MCU truthlikeness inspection method and testing circuit thereof are provided, and can check out whether the MCU detection mouth of household electrical appliance such as electromagnetic oven, soy bean milk making machine damages simply and easily, is beneficial to timely maintenance.
To use the ADC of MCU to detect a mouthful function under the normal condition, to guarantee that at first ADC detects the work that mouth itself can be safe and reliable, the method of Cai Yonging is generally speaking: common constant voltage source VDD of extra increase outside check circuit, because the voltage of constant voltage source is known, it should be certain detecting mouthful data that read by ADC, such as voltage source is 5V, ADC detects a mouthful value that reads also should be 5V, just represent that it is not damage that this ADC detects mouth, if but when detecting a value that mouth reads for other value, ADC detects mouthful a damage own, if detecting mouth itself damages, it just may be wrong detecting mouthful data that read by this so, and these data have not just had meaning, so the purpose of truthlikeness inspection will guarantee that it itself is not damage that ADC detects mouth.
Be elaborated with reference to accompanying drawing below in conjunction with embodiment, so that technical characterictic of the present invention and advantage are carried out more deep annotation.
Circuit theory diagrams of the present invention as shown in Figure 1, a kind of MCU truthlikeness inspection method, its step is as follows:
Step 1, truthlikeness scrutiny program begin;
The ADC of step 2, switching MCU detects mouth and becomes common IO state by the ADC detected state;
Step 3, export high level and keep a period of time;
Step 4, more common IO state is switched to the ADC detected state, read current AD value;
Step 5, judge that whether current AD value is in normal range;
Step 6, current AD value are in normal range, and then ADC detection mouthful function is normal, skips to step 8; Current AD value is not in normal range, and it is impaired that then ADC detects mouthful function, execution in step 7;
Step 7, enter the corresponding protection program;
Step 8, the next loop program of carrying out.
A kind of truthlikeness check circuit that utilizes described truthlikeness inspection method is located on the PCB circuit board, and this circuit is made up of bleeder circuit, condenser network and MCU circuit successively.Bleeder circuit is made up of pull-up resistor R1 and pull down resistor R2, and condenser network is made up of the capacitor C 1 that plays pressure stabilization function, and the MCU circuit is by the abbreviation that has A/D converter ADC(Analog-to-Digital Converter) MCU that detects mouth forms.Pull-up resistor R1 one termination power VDD, VDD is a constant voltage source, another termination pull down resistor R2, pull down resistor R2 other end ground connection, the ADC of MCU detects mouth and is connected between pull-up resistor R1 and the pull down resistor R2, and capacitor C 1 one ends connect ADC interface, other end ground connection.
When operate as normal, because the dividing potential drop effect of resistance R 1 and R2, the voltage that obtains at the ADC of MCU detection mouth is:
Figure 743263DEST_PATH_IMAGE001
If but export a fixing level for the voltage detecting mouth of MCU A period of time, Be high level or low level,
Figure 318842DEST_PATH_IMAGE002
Level will become VDD or GND, change in a short period of time then by ADC and detect a mouthful inspection peripheral circuit voltage, because the voltage at capacitor C 1 two ends can not suddenly change fixed voltage
Figure 686369DEST_PATH_IMAGE002
Can not change at once
Figure 114945DEST_PATH_IMAGE003
, by checking fixed voltage
Figure 327752DEST_PATH_IMAGE002
Intensity of variation in the set time just can judge that this MCU detects mouth and whether occurs damaging, if to be the level with output just now identical or change very little for the voltage that is checked through, the ADC detection mouth that MCU is described is normal, if change a lot, the ADC detection mouth that MCU is described just might be impaired, and the data that collect from peripheral circuit are exactly insecure like this.
The peripheral circuit that bleeder circuit and condenser network are formed also be used in other purposes, just finishing the truthlikeness inspection in very short time, change R1 into temperature sensor or pressure transducer, then is temperature or pressure check circuit, not needing increases power module in addition, and has effectively reduced cost.
Made clear and complete description although how the present invention carries out the truthlikeness inspection by instantiation to truthlikeness inspection method and circuit thereof, but the present invention is not limited only to described embodiment, and to reach same or similar effect be contingent and all be included in the present invention by simple reprogramming or circuit structure.

Claims (7)

1. MCU truthlikeness inspection method, its step is as follows:
Step 1, truthlikeness scrutiny program begin;
The ADC of step 2, switching MCU detects mouth and becomes common IO state by the ADC detected state;
Step 3, export high level and keep a period of time;
Step 4, more common IO state is switched to the ADC detected state, read current AD value;
Step 5, judge that whether current AD value is in normal range;
Step 6, current AD value are in normal range, and then ADC detection mouthful function is normal, skips to step 8; Current AD value is not in normal range, and it is impaired that then ADC detects mouthful function, execution in step 7;
Step 7, enter the corresponding protection program;
Step 8, the next loop program of carrying out.
2. an application rights requires the check circuit of 1 described MCU truthlikeness inspection method, is located on the PCB circuit board, and it is characterized in that: this circuit is made up of bleeder circuit, condenser network and MCU circuit successively.
3. check circuit according to claim 2 is characterized in that: the bleeder circuit of described truthlikeness check circuit is made up of pull-up resistor R1 and pull down resistor R2.
4. check circuit according to claim 3 is characterized in that: the condenser network of described truthlikeness check circuit is made up of the capacitor C 1 that plays pressure stabilization function.
5. check circuit according to claim 4 is characterized in that: the MCU circuit of described truthlikeness check circuit is made up of the MCU that ADC detects mouth.
6. according to each described check circuit in the claim 1~5, it is characterized in that: described pull-up resistor R1 one termination power VDD, another termination pull down resistor R2, pull down resistor R2 other end ground connection, the ADC of MCU detects mouth and is connected between pull-up resistor R1 and the pull down resistor R2, capacitor C 1 one ends connect ADC interface, other end ground connection.
7. check circuit according to claim 6 is characterized in that: described power vd D is a constant voltage source.
CN 201110026559 2011-01-25 2011-01-25 MCU truthlikeness check method and checking circuit thereof Pending CN102053618A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110673013A (en) * 2019-09-02 2020-01-10 武汉光庭科技有限公司 Automatic detection method and device for switch and switch circuit

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101226224A (en) * 2008-01-16 2008-07-23 深圳国人通信有限公司 Test system and method for circuit board
CN201322770Y (en) * 2008-12-25 2009-10-07 和芯微电子(四川)有限公司 IO port detecting circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101226224A (en) * 2008-01-16 2008-07-23 深圳国人通信有限公司 Test system and method for circuit board
CN201322770Y (en) * 2008-12-25 2009-10-07 和芯微电子(四川)有限公司 IO port detecting circuit

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
《电子测试》 20100131 鞠家欣等 基于Credence Gemini500的内嵌式AD转换器测试方法研究 第34-37,43页 1-7 , 第01期 2 *
《计算机工程》 20080930 王益等 嵌入式测试系统设计 第237-238,250页 1-7 第34卷, 第18期 2 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110673013A (en) * 2019-09-02 2020-01-10 武汉光庭科技有限公司 Automatic detection method and device for switch and switch circuit
CN110673013B (en) * 2019-09-02 2022-05-24 武汉光庭科技有限公司 Automatic detection method and device for switch and switch circuit

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Address after: 314112, Qian Tang Road, Huimin street, Jiashan County, Zhejiang Province, 18

Applicant after: Zhejiang Taizhou Aishida Electrical Equipment Co., Ltd.

Address before: The town of Changan city of Dongguan province Guangdong 523860 Wu Sha Cun Chen Wu Xin'an Industrial Park Dongguan city BBK home appliance Co. Ltd.

Applicant before: Dongguan Bubugao Electrical appliances Co., Ltd.

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Application publication date: 20110511