CN101968533B - 一种led灯具的老化和温度试验方法 - Google Patents
一种led灯具的老化和温度试验方法 Download PDFInfo
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- CN101968533B CN101968533B CN 201010278914 CN201010278914A CN101968533B CN 101968533 B CN101968533 B CN 101968533B CN 201010278914 CN201010278914 CN 201010278914 CN 201010278914 A CN201010278914 A CN 201010278914A CN 101968533 B CN101968533 B CN 101968533B
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- 230000032683 aging Effects 0.000 title claims abstract description 25
- 238000010998 test method Methods 0.000 title claims abstract description 9
- 238000012360 testing method Methods 0.000 claims abstract description 21
- 238000000034 method Methods 0.000 claims abstract description 11
- 230000008569 process Effects 0.000 claims abstract description 5
- 230000008859 change Effects 0.000 claims abstract description 3
- 230000005855 radiation Effects 0.000 claims description 3
- 230000007613 environmental effect Effects 0.000 abstract description 4
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 238000001782 photodegradation Methods 0.000 abstract 2
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- 230000009286 beneficial effect Effects 0.000 description 1
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CN 201010278914 CN101968533B (zh) | 2010-08-31 | 2010-08-31 | 一种led灯具的老化和温度试验方法 |
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CN 201010278914 CN101968533B (zh) | 2010-08-31 | 2010-08-31 | 一种led灯具的老化和温度试验方法 |
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CN101968533A CN101968533A (zh) | 2011-02-09 |
CN101968533B true CN101968533B (zh) | 2012-05-23 |
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Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
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US8927944B2 (en) | 2011-11-14 | 2015-01-06 | Kla-Tencor Corporation | High throughput hot testing method and system for high-brightness light-emitting diodes |
CN102680872B (zh) * | 2012-03-30 | 2014-11-05 | 威力盟电子(苏州)有限公司 | 灯管检测装置及灯管检测方法 |
CN102680207A (zh) * | 2012-05-04 | 2012-09-19 | 黄智辉 | Led灯具生产老化测试方法及其老化测试装置 |
CN102890249A (zh) * | 2012-10-18 | 2013-01-23 | 桂林电子科技大学 | 基于子系统分解的led照明灯具加速试验方法 |
CN103048605B (zh) * | 2012-12-22 | 2015-10-14 | 三峡电力职业学院 | 一种led老化的检测筛选方法 |
CN103149523A (zh) * | 2013-02-18 | 2013-06-12 | 南京汉德森科技股份有限公司 | 基于光电参数自动采集的多应力加速寿命监控测试系统 |
CN104849677A (zh) * | 2014-02-17 | 2015-08-19 | 浙江云时代光电科技有限公司 | 一种led灯寿命的测试方法 |
CN104655406A (zh) * | 2014-06-18 | 2015-05-27 | 潘军铁 | Led灯的温度及光衰检测方法 |
CN104655405A (zh) * | 2014-06-18 | 2015-05-27 | 潘军铁 | 照明灯具光衰检测方法 |
CN105258924A (zh) * | 2015-11-06 | 2016-01-20 | 苏州耀腾光电有限公司 | Led灯综合测试仪 |
CN106771693A (zh) * | 2015-11-20 | 2017-05-31 | 神讯电脑(昆山)有限公司 | 老化自动测试系统及方法 |
CN107831391B (zh) * | 2017-11-28 | 2019-06-07 | 英特尔产品(成都)有限公司 | 一种用于老化测试的方法、装置和设备 |
CN109596964B (zh) * | 2018-12-26 | 2021-01-01 | 山东阅芯电子科技有限公司 | 可兼容多种环境老化试验的方法及系统 |
Family Cites Families (5)
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JP2004257980A (ja) * | 2003-02-27 | 2004-09-16 | Mire Kk | 半導体素子テスト用ハンドラ |
EP2154541B1 (en) * | 2003-08-18 | 2011-02-02 | Advantest Corporation | Temperature control device |
CN101093241A (zh) * | 2006-06-20 | 2007-12-26 | 北京航空航天大学 | 控制晶体管结温的稳态工作寿命试验设备 |
CN201112800Y (zh) * | 2007-05-10 | 2008-09-10 | 曹宏国 | 84线陶瓷四边引线片式载体老化测试插座 |
JP5080228B2 (ja) * | 2007-12-13 | 2012-11-21 | 株式会社シスウェーブ | 温度制御方式 |
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