CN101925982B - 使用同轴倾斜的改良式高倾斜注入角度效能 - Google Patents

使用同轴倾斜的改良式高倾斜注入角度效能 Download PDF

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Publication number
CN101925982B
CN101925982B CN2008801257237A CN200880125723A CN101925982B CN 101925982 B CN101925982 B CN 101925982B CN 2008801257237 A CN2008801257237 A CN 2008801257237A CN 200880125723 A CN200880125723 A CN 200880125723A CN 101925982 B CN101925982 B CN 101925982B
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CN
China
Prior art keywords
workpiece
ion beam
dimension
angle
ion
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Expired - Fee Related
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CN2008801257237A
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English (en)
Chinese (zh)
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CN101925982A (zh
Inventor
阿塔尔·古普塔
约瑟·C·欧尔森
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Varian Semiconductor Equipment Associates Inc
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Varian Semiconductor Equipment Associates Inc
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Publication of CN101925982A publication Critical patent/CN101925982A/zh
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    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G21K5/10—Irradiation devices with provision for relative movement of beam source and object to be irradiated
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Physical Vapour Deposition (AREA)
CN2008801257237A 2007-12-28 2008-12-18 使用同轴倾斜的改良式高倾斜注入角度效能 Expired - Fee Related CN101925982B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/005,991 US7820985B2 (en) 2007-12-28 2007-12-28 High tilt implant angle performance using in-axis tilt
US12/005,991 2007-12-28
PCT/US2008/087406 WO2009085939A1 (en) 2007-12-28 2008-12-18 Improved high tilt implant angle performance using in-axis tilt

Publications (2)

Publication Number Publication Date
CN101925982A CN101925982A (zh) 2010-12-22
CN101925982B true CN101925982B (zh) 2012-01-11

Family

ID=40796977

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2008801257237A Expired - Fee Related CN101925982B (zh) 2007-12-28 2008-12-18 使用同轴倾斜的改良式高倾斜注入角度效能

Country Status (6)

Country Link
US (1) US7820985B2 (enExample)
JP (1) JP5469091B2 (enExample)
KR (1) KR101502534B1 (enExample)
CN (1) CN101925982B (enExample)
TW (1) TWI443716B (enExample)
WO (1) WO2009085939A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8350236B2 (en) * 2010-01-12 2013-01-08 Axcelis Technologies, Inc. Aromatic molecular carbon implantation processes
US8664100B2 (en) 2010-07-07 2014-03-04 Varian Semiconductor Equipment Associates, Inc. Manufacturing high efficiency solar cell with directional doping
KR20120050269A (ko) 2010-11-10 2012-05-18 현대자동차주식회사 차량용 헤드램프
US8378317B1 (en) * 2011-09-07 2013-02-19 Gtat Corporation Ion implant apparatus and method of ion implantation
US8895944B2 (en) * 2012-01-20 2014-11-25 Advanced Ion Beam Technology, Inc. Scan head and scan arm using the same
US8993980B1 (en) * 2013-10-22 2015-03-31 Varian Semiconductor Equipment Associates, Inc. Dual stage scanner for ion beam control
CN105097509B (zh) * 2014-05-06 2017-10-03 稳懋半导体股份有限公司 高电子迁移率电晶体植入硼隔离结构的制作方法
JP6509089B2 (ja) * 2015-09-30 2019-05-08 住友重機械イオンテクノロジー株式会社 イオン注入装置
DE102017117999B4 (de) * 2017-08-08 2025-12-11 Infineon Technologies Ag Ionenimplantationsvorrichtung und verfahren zum herstellen vonhalbleitervorrichtungen
US11340530B2 (en) * 2018-12-14 2022-05-24 Xia Tai Xin Semiconductor (Qing Dao) Ltd. Implanting method and apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6677599B2 (en) * 2000-03-27 2004-01-13 Applied Materials, Inc. System and method for uniformly implanting a wafer with an ion beam
US7166854B2 (en) * 2003-12-09 2007-01-23 Varian Semiconductor Equipment Associates, Inc. Uniformity control multiple tilt axes, rotating wafer and variable scan velocity

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62145729A (ja) * 1985-12-19 1987-06-29 Toshiba Corp イオン注入方法およびそのための装置
JP2551637Y2 (ja) * 1991-12-19 1997-10-27 日新電機株式会社 イオン注入装置
US5898179A (en) * 1997-09-10 1999-04-27 Orion Equipment, Inc. Method and apparatus for controlling a workpiece in a vacuum chamber
US6329703B1 (en) * 1998-02-25 2001-12-11 Infineon Technologies Ag Contact between a monocrystalline silicon region and a polycrystalline silicon structure and method for producing such a contact
US6200863B1 (en) 1999-03-24 2001-03-13 Advanced Micro Devices, Inc. Process for fabricating a semiconductor device having assymetric source-drain extension regions
US6437350B1 (en) 2000-08-28 2002-08-20 Varian Semiconductor Equipment Associates, Inc. Methods and apparatus for adjusting beam parallelism in ion implanters
US6777695B2 (en) * 2002-07-12 2004-08-17 Varian Semiconductors Equipment Associates, Inc. Rotating beam ion implanter
US6933507B2 (en) * 2002-07-17 2005-08-23 Kenneth H. Purser Controlling the characteristics of implanter ion-beams
US6992310B1 (en) * 2004-08-13 2006-01-31 Axcelis Technologies, Inc. Scanning systems and methods for providing ions from an ion beam to a workpiece
US6949796B1 (en) 2004-09-21 2005-09-27 International Business Machines Corporation Halo implant in semiconductor structures
US7462844B2 (en) * 2005-09-30 2008-12-09 Varian Semiconductor Equipment Associates, Inc. Method, system, and apparatus for improving doping uniformity in high-tilt ion implantation
JP4812480B2 (ja) * 2006-03-22 2011-11-09 富士通セミコンダクター株式会社 半導体装置の製造方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6677599B2 (en) * 2000-03-27 2004-01-13 Applied Materials, Inc. System and method for uniformly implanting a wafer with an ion beam
US7166854B2 (en) * 2003-12-09 2007-01-23 Varian Semiconductor Equipment Associates, Inc. Uniformity control multiple tilt axes, rotating wafer and variable scan velocity

Also Published As

Publication number Publication date
KR20100111693A (ko) 2010-10-15
KR101502534B1 (ko) 2015-03-13
TWI443716B (zh) 2014-07-01
WO2009085939A1 (en) 2009-07-09
TW200939314A (en) 2009-09-16
US20090166566A1 (en) 2009-07-02
JP2011509504A (ja) 2011-03-24
JP5469091B2 (ja) 2014-04-09
CN101925982A (zh) 2010-12-22
US7820985B2 (en) 2010-10-26

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