CN101911491A - 用于分析扫描链和确定扫描链中的保持时间故障的数目或位置的方法 - Google Patents
用于分析扫描链和确定扫描链中的保持时间故障的数目或位置的方法 Download PDFInfo
- Publication number
- CN101911491A CN101911491A CN2008801235435A CN200880123543A CN101911491A CN 101911491 A CN101911491 A CN 101911491A CN 2008801235435 A CN2008801235435 A CN 2008801235435A CN 200880123543 A CN200880123543 A CN 200880123543A CN 101911491 A CN101911491 A CN 101911491A
- Authority
- CN
- China
- Prior art keywords
- scan chain
- style
- value
- described scan
- retention time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- Mathematical Physics (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
Description
Claims (28)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/931,847 | 2007-10-31 | ||
US11/931,847 US7853846B2 (en) | 2007-10-31 | 2007-10-31 | Locating hold time violations in scan chains by generating patterns on ATE |
US12/058,768 US8010856B2 (en) | 2007-10-31 | 2008-03-31 | Methods for analyzing scan chains, and for determining numbers or locations of hold time faults in scan chains |
US12/058,768 | 2008-03-31 | ||
PCT/US2008/082088 WO2009059207A1 (en) | 2007-10-31 | 2008-10-31 | Methods for analyzing scan chains, and for determining numbers or locations of hold time faults in scan chains |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101911491A true CN101911491A (zh) | 2010-12-08 |
CN101911491B CN101911491B (zh) | 2013-07-10 |
Family
ID=40584468
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200880123543.5A Expired - Fee Related CN101911491B (zh) | 2007-10-31 | 2008-10-31 | 用于分析扫描链和确定扫描链中的保持时间故障的数目或位置的方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US8010856B2 (zh) |
JP (1) | JP2011502267A (zh) |
KR (1) | KR101592042B1 (zh) |
CN (1) | CN101911491B (zh) |
TW (1) | TWI442071B (zh) |
WO (1) | WO2009059207A1 (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104569792A (zh) * | 2013-10-09 | 2015-04-29 | 辉达公司 | 扫描系统和方法 |
CN105652102A (zh) * | 2014-12-01 | 2016-06-08 | 联发科技股份有限公司 | 感测电路 |
CN111650499A (zh) * | 2020-05-29 | 2020-09-11 | Oppo广东移动通信有限公司 | 扫描链故障的诊断方法、装置、测试设备及存储介质 |
CN116106729A (zh) * | 2023-02-10 | 2023-05-12 | 无锡玖熠半导体科技有限公司 | 基于代价损失因子的扫描链及组合逻辑故障诊断方法 |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI497328B (zh) * | 2010-02-12 | 2015-08-21 | Synopsys Shanghai Co Ltd | Consider the reconstruction method and device of the scan chain of the program group |
US8555121B2 (en) * | 2010-02-16 | 2013-10-08 | Apple Inc. | Pulse dynamic logic gates with LSSD scan functionality |
US8578226B2 (en) * | 2010-08-17 | 2013-11-05 | Eigenix | Apparatus and system for implementing variable speed scan testing |
TWI472912B (zh) * | 2012-09-11 | 2015-02-11 | Univ Nat Cheng Kung | 以電路內部事件作為觸發條件之除錯控制系統及其方法 |
US9188643B2 (en) * | 2012-11-13 | 2015-11-17 | Globalfoundries Inc. | Flexible performance screen ring oscillator within a scan chain |
US10310015B2 (en) * | 2013-07-19 | 2019-06-04 | Advanced Micro Devices, Inc. | Method and apparatus for providing clock signals for a scan chain |
US9128151B1 (en) | 2014-05-08 | 2015-09-08 | International Business Machines Corporation | Performance screen ring oscillator formed from paired scan chains |
US9097765B1 (en) | 2014-05-08 | 2015-08-04 | International Business Machines Corporation | Performance screen ring oscillator formed from multi-dimensional pairings of scan chains |
US9618579B2 (en) * | 2015-04-28 | 2017-04-11 | Lattice Semiconductor Corporation | Programmable circuits for correcting scan-test circuitry defects in integrated circuit designs |
US10449879B2 (en) * | 2016-04-15 | 2019-10-22 | The Boeing Company | Protective removable cover |
US11681843B2 (en) * | 2018-01-17 | 2023-06-20 | Siemens Industry Software Inc. | Input data compression for machine learning-based chain diagnosis |
US10838449B2 (en) * | 2018-07-05 | 2020-11-17 | International Business Machines Corporation | Automatic detection of clock grid misalignments and automatic realignment |
TWI681200B (zh) | 2018-10-19 | 2020-01-01 | 瑞昱半導體股份有限公司 | 晶片 |
US11041906B2 (en) * | 2019-04-19 | 2021-06-22 | Siemens Industry Software Inc. | Optimized scan chain diagnostic pattern generation for reversible scan architecture |
US11579191B2 (en) * | 2020-06-19 | 2023-02-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and system for testing an integrated circuit |
US11768239B1 (en) * | 2021-05-12 | 2023-09-26 | Marvell Asia Pte Ltd | Method and apparatus for timing-annotated scan-chain testing using parallel testbench |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3783254A (en) * | 1972-10-16 | 1974-01-01 | Ibm | Level sensitive logic system |
US4293919A (en) * | 1979-08-13 | 1981-10-06 | International Business Machines Corporation | Level sensitive scan design (LSSD) system |
US6085345A (en) * | 1997-12-24 | 2000-07-04 | Intel Corporation | Timing control for input/output testability |
US6516432B1 (en) | 1999-12-22 | 2003-02-04 | International Business Machines Corporation | AC scan diagnostic method |
TW530521B (en) * | 2000-08-28 | 2003-05-01 | Koninkl Philips Electronics Nv | Circuit device for operating a high-pressure discharge lamp with successive current phases |
US6954887B2 (en) * | 2001-03-22 | 2005-10-11 | Syntest Technologies, Inc. | Multiple-capture DFT system for scan-based integrated circuits |
US7058869B2 (en) * | 2003-01-28 | 2006-06-06 | Syntest Technologies, Inc. | Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits |
JP2005032102A (ja) * | 2003-07-09 | 2005-02-03 | Matsushita Electric Ind Co Ltd | スキャンテスト設計方法、スキャンテスト回路、スキャンフリップフロップ回路、スキャンテスト回路挿入用cadプログラム、大規模集積回路及び携帯デジタル機器 |
US7225374B2 (en) * | 2003-12-04 | 2007-05-29 | International Business Machines Corporation | ABIST-assisted detection of scan chain defects |
US7107502B2 (en) * | 2004-01-29 | 2006-09-12 | International Business Machines Corporation | Diagnostic method for detection of multiple defects in a Level Sensitive Scan Design (LSSD) |
US7234090B2 (en) * | 2004-09-02 | 2007-06-19 | International Business Machines Corporation | Method and apparatus for selective scan chain diagnostics |
US7395470B2 (en) * | 2005-06-09 | 2008-07-01 | International Business Machines Corporation | Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain |
US7840862B2 (en) * | 2006-02-17 | 2010-11-23 | Mentor Graphics Corporation | Enhanced diagnosis with limited failure cycles |
US7788561B2 (en) * | 2006-08-14 | 2010-08-31 | Yu Huang | Diagnosing mixed scan chain and system logic defects |
US7568139B2 (en) * | 2006-12-12 | 2009-07-28 | Inovys Corporation | Process for identifying the location of a break in a scan chain in real time |
US8615695B2 (en) * | 2007-04-04 | 2013-12-24 | Mentor Graphics Corporation | Fault dictionary-based scan chain failure diagnosis |
-
2008
- 2008-03-31 US US12/058,768 patent/US8010856B2/en active Active
- 2008-10-30 TW TW097141777A patent/TWI442071B/zh active
- 2008-10-31 KR KR1020107011990A patent/KR101592042B1/ko active IP Right Grant
- 2008-10-31 CN CN200880123543.5A patent/CN101911491B/zh not_active Expired - Fee Related
- 2008-10-31 WO PCT/US2008/082088 patent/WO2009059207A1/en active Application Filing
- 2008-10-31 JP JP2010532295A patent/JP2011502267A/ja active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104569792A (zh) * | 2013-10-09 | 2015-04-29 | 辉达公司 | 扫描系统和方法 |
CN105652102A (zh) * | 2014-12-01 | 2016-06-08 | 联发科技股份有限公司 | 感测电路 |
CN111650499A (zh) * | 2020-05-29 | 2020-09-11 | Oppo广东移动通信有限公司 | 扫描链故障的诊断方法、装置、测试设备及存储介质 |
CN111650499B (zh) * | 2020-05-29 | 2022-08-16 | Oppo广东移动通信有限公司 | 扫描链故障的诊断方法、装置、测试设备及存储介质 |
CN116106729A (zh) * | 2023-02-10 | 2023-05-12 | 无锡玖熠半导体科技有限公司 | 基于代价损失因子的扫描链及组合逻辑故障诊断方法 |
CN116106729B (zh) * | 2023-02-10 | 2024-06-07 | 无锡玖熠半导体科技有限公司 | 基于代价损失因子的扫描链及组合逻辑故障诊断方法 |
Also Published As
Publication number | Publication date |
---|---|
TW200931045A (en) | 2009-07-16 |
JP2011502267A (ja) | 2011-01-20 |
US20090113263A1 (en) | 2009-04-30 |
KR101592042B1 (ko) | 2016-02-05 |
TWI442071B (zh) | 2014-06-21 |
US8010856B2 (en) | 2011-08-30 |
WO2009059207A1 (en) | 2009-05-07 |
KR20100086024A (ko) | 2010-07-29 |
CN101911491B (zh) | 2013-07-10 |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: ADVANTEST (SINGAPORE) PTE. LTD. Free format text: FORMER OWNER: VERIGY (SINGAPORE) PTE. LTD. Effective date: 20120426 |
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C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20120426 Address after: Singapore Singapore Applicant after: Verigy Pte Ltd Singapore Address before: Singapore Singapore Applicant before: Inovys Corp. |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: ADVANTEST CORP. Free format text: FORMER OWNER: ADVANTEST (CHINA) CO., LTD. Effective date: 20150506 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20150506 Address after: Tokyo, Japan, Japan Patentee after: ADVANTEST CORP Address before: Singapore Singapore Patentee before: Verigy Pte Ltd Singapore |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130710 Termination date: 20161031 |
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CF01 | Termination of patent right due to non-payment of annual fee |