CN1019052B - 拱形光敏传感组件 - Google Patents

拱形光敏传感组件

Info

Publication number
CN1019052B
CN1019052B CN89102013.6A CN89102013A CN1019052B CN 1019052 B CN1019052 B CN 1019052B CN 89102013 A CN89102013 A CN 89102013A CN 1019052 B CN1019052 B CN 1019052B
Authority
CN
China
Prior art keywords
light activated
activated element
additional optical
group
word
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CN89102013.6A
Other languages
English (en)
Chinese (zh)
Other versions
CN1037965A (zh
Inventor
丹羽猛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of CN1037965A publication Critical patent/CN1037965A/zh
Publication of CN1019052B publication Critical patent/CN1019052B/zh
Expired legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/02016—Circuit arrangements of general character for the devices
    • H01L31/02019—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02024—Position sensitive and lateral effect photodetectors; Quadrant photodiodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
    • H01L31/035272—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN89102013.6A 1988-03-09 1989-03-09 拱形光敏传感组件 Expired CN1019052B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP63-31401 1988-03-09
JP31401/88 1988-03-09
JP1988031401U JPH01134245U (US07709020-20100504-C00041.png) 1988-03-09 1988-03-09

Publications (2)

Publication Number Publication Date
CN1037965A CN1037965A (zh) 1989-12-13
CN1019052B true CN1019052B (zh) 1992-11-11

Family

ID=12330236

Family Applications (1)

Application Number Title Priority Date Filing Date
CN89102013.6A Expired CN1019052B (zh) 1988-03-09 1989-03-09 拱形光敏传感组件

Country Status (5)

Country Link
US (1) US4977314A (US07709020-20100504-C00041.png)
EP (1) EP0332440B1 (US07709020-20100504-C00041.png)
JP (1) JPH01134245U (US07709020-20100504-C00041.png)
CN (1) CN1019052B (US07709020-20100504-C00041.png)
DE (1) DE68920347T2 (US07709020-20100504-C00041.png)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2715604B2 (ja) * 1989-12-18 1998-02-18 株式会社島津製作所 レーザ回折・散乱式粒度分布測定装置
JP2522880B2 (ja) * 1992-03-30 1996-08-07 日機装株式会社 粒度分布測定装置
JP3394262B2 (ja) 1997-02-06 2003-04-07 セラセンス、インク． 小体積インビトロ被検体センサー
US6338790B1 (en) 1998-10-08 2002-01-15 Therasense, Inc. Small volume in vitro analyte sensor with diffusible or non-leachable redox mediator
GB0103757D0 (en) * 2001-02-16 2001-04-04 Univ Hertfordshire Methods and apparatus for the detection and characterisation of liquid-borne a rticles
DE202008001018U1 (de) * 2008-01-29 2009-06-25 Pepperl + Fuchs Gmbh Sensor zum Nachweis von Objekten durch Lichtbeugung
USD741539S1 (en) * 2014-02-28 2015-10-20 Leeo, Inc. Nightlight and air sensor
USD741728S1 (en) * 2014-02-28 2015-10-27 Leeo, Inc. Nightlight and air sensor
USD742059S1 (en) * 2014-02-28 2015-10-27 Leeo, Inc. Nightlight and air sensor
US10056518B2 (en) 2014-06-23 2018-08-21 Qorvo Us, Inc. Active photonic device having a Darlington configuration
US9933304B2 (en) * 2015-10-02 2018-04-03 Qorvo Us, Inc. Active photonic device having a Darlington configuration with feedback
US10147833B2 (en) 2016-04-15 2018-12-04 Qorvo Us, Inc. Active photonic device having a Darlington configuration with feedback

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3689772A (en) * 1971-08-18 1972-09-05 Litton Systems Inc Photodetector light pattern detector
US3785735A (en) * 1972-01-19 1974-01-15 Bio Physics Systems Inc Photoanalysis method
US4150360A (en) * 1975-05-29 1979-04-17 Grumman Aerospace Corporation Method and apparatus for classifying biological cells
US4231053A (en) * 1979-03-05 1980-10-28 The United States Of America As Represented By The Secretary Of The Navy High electrical frequency infrared detector
US4274741A (en) * 1979-09-26 1981-06-23 Compagnie Industrielle Des Lasers Device for determining the granulometric composition of a mixture of particles by diffraction of light

Also Published As

Publication number Publication date
DE68920347D1 (de) 1995-02-16
US4977314A (en) 1990-12-11
EP0332440B1 (en) 1995-01-04
DE68920347T2 (de) 1995-06-14
JPH01134245U (US07709020-20100504-C00041.png) 1989-09-13
EP0332440A2 (en) 1989-09-13
EP0332440A3 (en) 1991-07-03
CN1037965A (zh) 1989-12-13

Similar Documents

Publication Publication Date Title
CN1019052B (zh) 拱形光敏传感组件
Buta Galactic rings revisited–I. CVRHS classifications of 3962 ringed galaxies from the Galaxy Zoo 2 Database
Emsellem et al. The SAURON project–IX. A kinematic classification for early-type galaxies
Sandin The influence of diffuse scattered light-II. Observations of galaxy haloes and thick discs and hosts of blue compact galaxies
Cornillault Particle size analyzer
CA1113763A (en) Dark field illuminator and collector apparatus and method
Hardalupas et al. Shadow Doppler technique for sizing particles of arbitrary shape
Apellániz et al. The Villafranca catalog of Galactic OB groups-I. Systems with O2–O3. 5 stars
Hakobyan et al. Supernovae and their host galaxies–V. The vertical distribution of supernovae in disc galaxies
Battinelli et al. An objective determination of blue star groupings in the Andromeda galaxy.
Maguire et al. Construct validity and achievement assessment.
JPS61139747A (ja) 粒子解析装置
Whitbourne et al. An Eriksonian measure of personality development in college students: A reexamination of Constantinople's data and a partial replication.
Wang et al. In situ particle size measurements using a two-color laser scattering technique
Saunders et al. Assessing the cognitive stress of graduate students.
Keel Recognition and classification of galaxies with optical jets
Kawara Corneal topography using moiré contour fringes
Song et al. Optimization of the optical particle counter for online particle measurement in pressure-changing natural gas
Gerken et al. Not all procedural learning tasks are difficult for adults with developmental language disorder
Lucero et al. Radio continuum and star formation in CO-rich early-type galaxies
Blackwell The evaluation of interior lighting on the basis of visual criteria
Kingslake The" absolute" hartmann test
SE465338B (sv) Saett och anordning foer detektering av partiklar i stroemmande medier
Davis Determination of turbulent flow properties by a penetrating beam dynamic shadowgraph method
Lopes Droplet sizes, dynamics and deposition in vertical annular flow

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C13 Decision
GR02 Examined patent application
C14 Grant of patent or utility model
GR01 Patent grant
C19 Lapse of patent right due to non-payment of the annual fee
CF01 Termination of patent right due to non-payment of annual fee