CN101876930A - Keyboard automatic test system - Google Patents
Keyboard automatic test system Download PDFInfo
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- CN101876930A CN101876930A CN2009101375174A CN200910137517A CN101876930A CN 101876930 A CN101876930 A CN 101876930A CN 2009101375174 A CN2009101375174 A CN 2009101375174A CN 200910137517 A CN200910137517 A CN 200910137517A CN 101876930 A CN101876930 A CN 101876930A
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Abstract
The invention relates to a keyboard automatic test system which comprises a computer, an automatic test program and a test base. A keyboard circuit board to be tested is placed on the test base, and the automatic test program produces a test signal so that the test base outputs an analog keying signal according to the test signal and conducts a keying junction point corresponding to the analog keying signal. Subsequently, the keyboard circuit board outputs a keying scan code corresponding to the keying junction point to the computer, so that the automatic test program judges whether the keying scan code is received by the computer within a preset period of time. The invention has the advantages of no manual operation and high test speed.
Description
Technical field
The present invention relates to test macro, relate in particular to a kind of keyboard test system in order to the test keyboard.
Background technology
Science and technology arrived with the epoch of information, no matter be work or amusement and recreation, computing machine with and peripherals be a part in everyone daily life, input media as the bridge between computing machine and user also is subjected to sizable attention, and input media comprises mouse, keyboard and trace ball etc., especially can utilize a plurality of button input instructions to give the key board unit of computing machine the most important.
See also Fig. 1, it is the surface structure synoptic diagram of existing key board unit 1.The surface of existing key board unit 1 is provided with a plurality of buttons, those buttons are classified as general key 10, numerical key 11 and function key 12 etc., those buttons press with finger for the user and produce corresponding signal to computing machine, make computing machine carry out corresponding key function-general key 10 in order to symbols such as inputting English letters, numerical key 11 is in order to input digit, function key 12 is then in order to provide various functions, for example F1～F12 etc.
But key board unit must be through test to guarantee the key board unit operate as normal in manufacture process.And the test of key board unit comprises to the test of the circuit board of key board unit and to the key board unit of finishing and carries out complete test, to the test of circuit board is for fear of finding that after the key board unit assembling is finished the circuit board defectiveness exists, and must dismantle the disappearance of wasting in man-hour that key board unit comes debug to cause.
At first explanation has the internal circuit of key board unit now.See also Fig. 2, it is the internal circuit synoptic diagram of existing key board unit.Key board unit 1 comprises a microprocessor 13 and a keyboard scan matrix 14, and microprocessor 13 is connected in keyboard scan matrix 14 by a plurality of pins, and microprocessor 13 remainders are then extensively known for those of ordinary skills, so do not give unnecessary details.Intermesh by multi-strip scanning incoming line X0～X7 and multi-strip scanning output line Y0～Y17 as for 14 in keyboard scan matrix and to form, as shown in Figure 2.Keyboard scan matrix 14 is 8 * 18, can be so can produce 144 contacts corresponding to key board unit 1 lip-deep a plurality of buttons, that is to say that if on the key board unit 1 when 144 buttons are arranged, key board unit 1 inside then must be provided with 26 scanning incoming lines and scanning output line at least.
Next the method for keyboard device circuit board is tested in explanation.After the circuit board manufacturing of key board unit is finished, circuit board is connected in a test module, test module comprises 26 switches and 26 light emitting diodes, wherein 26 switches correspond respectively to multi-strip scanning incoming line X0～X7 and multi-strip scanning output line Y0～Y17, and 26 light emitting diodes are then corresponding to 26 switches.Next press 26 switches in regular turn with manual type, behind touch-pressure switch, can be luminous corresponding to the light emitting diode of this switch to represent by test.If but behind the touch-pressure switch, not luminous corresponding to the light emitting diode of this switch, then represent to take place unusual corresponding to the scanning incoming line or the scanning output line of this switch.Whether the tester can come the decision circuitry plate normal according to the luminous situation of light emitting diode.
Though the method for existing testing circuit board is simple, but through a large amount of key board unit circuit board testings, the tester can repeat to press same switch or leakage unavoidably and the false touch problem such as press, just need thus this circuit board is tested again and lost time, moreover, utilize manpower to carry out the efficient of test job and cost and modernized industry and move towards the trend of robotization and run in the opposite direction fully.
Summary of the invention
The technical matters that the present invention mainly solves is at the prior art above shortcomings, to provide a kind of keyboard automatic test system that need not utilize manpower to test.
Another technical matters that the present invention will solve is at the prior art above shortcomings, to provide a kind of keyboard automatic test system of testing fast.
The technical solution adopted for the present invention to solve the technical problems provides a kind of keyboard automatic test system, be applied to a keyboard pcb of a key board unit is tested automatically, and this keyboard pcb comprises a plurality of button contacts and the corresponding key scan sign indicating number of each this button contact, and this keyboard automatic test system comprises:
One computing machine;
One autotest program is installed in this computing machine, in order to producing a test signal, and has a Preset Time; And
One test bench, be connected in this computing machine and this keyboard pcb, in order to producing an analogue-key signal according to this test signal, and conducting makes this keyboard pcb output give this computing machine corresponding to a key scan sign indicating number of this button contact corresponding to a button contact of this analogue-key signal;
Wherein, when this key scan sign indicating number was not transferred to this computing machine as yet in this Preset Time, this autotest program was exported an error message.
When this key scan sign indicating number was transferred to this computing machine in this Preset Time, this autotest program judged then whether this key scan sign indicating number is correct.
When this key scan sign indicating number was judged as mistake, this autotest program was exported this error message; When this key scan sign indicating number is judged as when correct, information is passed through in this autotest program output one test.
This autotest program is preset with a test button script, and this autotest program produces this corresponding test signal according to this test button script.
This autotest program also comprises a key scan coding schedule, makes this autotest program judge according to this scan code script and this key scan coding schedule whether these a plurality of key scan sign indicating numbers are correct.
This test bench also comprises:
One control panel is in order to export this analogue-key signal according to this test signal;
A plurality of thimbles contact with this keyboard pcb, give this keyboard pcb in order to transmit this analogue-key signal;
One power lead is connected in this computing machine, gives this test bench in order to the electric power that transmits this computing machine; And
Signal wire is connected in this computing machine, in order to transmit this test signal.
This power lead is a USB (universal serial bus) (USB) connecting line.
When this signal wire was connected in this computing machine, this test signal was exported by this autotest program and is transferred to this control panel by this signal wire.
This signal wire is a RS232 connecting line.
This control panel also comprises an analog switch, is connected in this a plurality of thimbles, and when this keyboard pcb was placed on this test bench and contacts with these a plurality of thimbles, this analog switch was connected to this a plurality of button contacts.
When this control panel receives this test signal and exports this analogue-key signal, this analog switch with this analogue-key signal conducting corresponding to this button contact of this analogue-key signal.
This analog switch is a CD4066 switch.
This computing machine is connected in a screen, in order to show a test interface.
This test interface shows a plurality of buttons hurdle, the button contact hurdle corresponding to these a plurality of button contacts, test number of keys hurdle and test mode district.
This button contact is formed by multi-strip scanning incoming line and multi-strip scanning output line.
This multi-strip scanning incoming line is 8, and this multi-strip scanning output line is 18.
Keyboard automatic test system of the present invention utilizes described test bench to come conducting button contact to test automatically with the touched action of analogue-key, need not to utilize manual operation, and can carry out timing and judge that whether tested button contact is correct in to finish complete automatic test, has the accuracy and the speed of automatic test by autotest program; In addition, described test bench can be connected in computing machine by power lead and obtain electric power from computing machine, does not need to be connected in addition other external power source; The present invention also can learn the existing mistake of tested keyboard pcb by test interface, and can carry out debug and more can save time at this keyboard pcb part that makes a mistake.
Description of drawings
Fig. 1 is the surface structure synoptic diagram of existing key board unit;
Fig. 2 is the internal circuit synoptic diagram of existing key board unit;
Fig. 3 is the block schematic diagram of keyboard automatic test system preferred embodiment of the present invention;
Fig. 4 is the schematic appearance of the test bench of keyboard automatic test system preferred embodiment of the present invention;
Fig. 5 is the internal circuit synoptic diagram of the test bench of keyboard automatic test system preferred embodiment of the present invention;
Fig. 6, Fig. 7, Fig. 8, Fig. 9 are the synoptic diagram of the test interface of keyboard automatic test system preferred embodiment of the present invention.
Embodiment
In order to improve the inconvenience of prior art, the invention provides a kind of keyboard automatic test system that need not utilize manpower to test.See also Fig. 3, it is for the block schematic diagram of keyboard automatic test system preferred embodiment of the present invention.Keyboard automatic test system 2 comprises computing machine 20, autotest program 201, test bench 21 and screen 23, tested keyboard pcb 22 comprises a plurality of button contacts and the corresponding key scan sign indicating number of each this button contact, and keyboard pcb 22 is placed on the test bench 21 with tested.Autotest program 201 is installed in the computing machine 20, and in order to the generation test signal, and autotest program 201 has a Preset Time.Test bench 21 is connected in computing machine 20 and keyboard pcb 22, in order to produce the analogue-key signal according to test signal, and conducting makes keyboard pcb 22 outputs give computing machine 20 corresponding to a key scan sign indicating number of this button contact corresponding to the button contact of analogue-key signal.Screen 23 is in order to show a test interface 231, for user's observation test situation.
Please consult Fig. 3 and Fig. 4 simultaneously, Fig. 4 is the schematic appearance of the test bench of keyboard automatic test system preferred embodiment of the present invention.Test bench 21 also comprises control panel 213, a plurality of thimbles 214, power lead 211 and signal wire 212, control panel 213 is in order to export the corresponding simulating push button signalling according to test signal, power lead 211 is connected in computing machine 20, electric power in order to transmission computing machine 20 is given test bench 21, and signal wire 212 also is connected in computing machine 20, in order to transmitted test signal, a plurality of thimbles 214 contact with keyboard pcb 22, give keyboard pcb 22 in order to the transportation simulator push button signalling, in this preferred embodiment, power lead is a USB (universal serial bus) (USB) connecting line, and signal wire is a RS232 connecting line.
What need special instruction is, a plurality of button contacts of keyboard pcb 22 are formed by multi-strip scanning incoming line and multi-strip scanning output line, that is to say, each scanning incoming line can form a plurality of button contacts with the multi-strip scanning output line, in this preferred embodiment, keyboard pcb 22 is used in 8 * 18 the key board unit, therefore the multi-strip scanning incoming line is 8, and this multi-strip scanning output line is 18, that is to say that the button circuit board 22 in this preferred embodiment has 144 button contacts, and each button contact is corresponding to a keyboard.
Moreover, autotest program 201 is preset with a test button script, make autotest program 201 produce corresponding test signal according to test button script, and test button script is being put down in writing the tested a plurality of buttons of desire and the testing sequence of these a plurality of buttons, in this preferred embodiment, the button contact of autotest program 201 desires test is 18, and wherein these 18 button contacts are corresponding to 18 different scanning output lines.Because the button contact is formed by scanning incoming line and scanning output line, but so only test 18 button contacts and can learn whether normal operation of button circuit board 22.
The operation workflow of Auto-Test System 2 of the present invention is as follows: autotest program 201 is according to test button script output test signal, test bench 21 receives test signal and exports analogue-key signal corresponding to test signal, and test bench 21 conductings are corresponding to a button contact of this analogue-key signal, make keyboard pcb 22 outputs give computing machine 20 corresponding to a key scan sign indicating number of button contact, when the key scan sign indicating number was not transferred to computing machine 02 as yet in Preset Time, 201 of autotest programs judged that test makes a mistake; And when the key scan sign indicating number was transferred to computing machine 20 in Preset Time, 20 of autotest programs judged whether this key scan sign indicating number is correct.Whether and correct for the key scan sign indicating number of judging output, autotest program 201 also comprises a key scan coding schedule, makes this autotest program judge according to this scan code script and this key scan coding schedule whether these a plurality of key scan sign indicating numbers are correct.
Next the internal circuit of test bench 21 is described, sees also Fig. 5, it is the internal circuit synoptic diagram of the test bench of keyboard automatic test system preferred embodiment of the present invention.The signal wire 212 that is connected in computing machine 20 is connected in control panel 213 by a photistor ISO, and control panel 213 also comprises analog switch U1～U4, be connected in a plurality of thimbles 214, when keyboard pcb 22 is placed on this test bench 21 and contacts with a plurality of thimbles 214, analog switch U1～U4 is connected to a plurality of button contacts and sets up multi-strip scanning incoming line A1, B1, C1, D1～H1 and multi-strip scanning output line A2, B2, C2, D2～R2 and is connected with 21 of test benches, in this preferred embodiment, analog switch U1～U4 is the CD4066 switch.
In this preferred embodiment, being about to tested a plurality of buttons in the test button script is A, B, C, D, E, F, G, H, I, J, K, L, M, N, O, Num Lock, Caps Lock and Scroll Lock, and those buttons are corresponding to a plurality of button contacts that are made of multi-strip scanning incoming line and multi-strip scanning output line.A illustrates with button, button contact corresponding to button A is made of scanning incoming line A1 and scanning output line A2, therefore when the button contact corresponding to button A is switched on (promptly scan incoming line A1 and scan output line A2 and be switched on), the key scan sign indicating number of keyboard pcb 22 outputs is A1A2, all the other key scan sign indicating numbers then by that analogy, those key scan sign indicating numbers then are stored in the key scan coding schedule and inquire about comparison for autotest program 201.
See also Fig. 6 to Fig. 9, it is respectively the synoptic diagram of the test interface of keyboard automatic test system preferred embodiment of the present invention when different situation.When autotest program 201 is activated, screen 23 can show a test interface 231, this test interface 231 comprises button hurdle 2311, button contact hurdle 2312, test number of keys hurdle 2313, test mode district 2314, abnormality district 2315, beginning option 2316, stops option 2317 and replacement option 2318, as shown in Figure 6.Button hurdle 2311 shows tested a plurality of button A, B, C, D, E, F, G, H, I, J, K, L, M, N, O, Num Lock, Caps Lock and ScrollLock, 2312 demonstrations in button contact hurdle are corresponding to the multi-strip scanning incoming line A1～H1 and the multi-strip scanning output line A2～R2 of a plurality of buttons, and test number of keys hurdle 2313 shows and always presses number of keys, presses number of keys and do not press number of keys, test mode district 2314 is in order to show test results the state when abnormality district 2315 then shows test errors.Beginning option 2316 is tested automatically in order to beginning, and stops 2317 of options in order to stopping automatic test, replacement option 2318 then with all field initializations to test again or next keyboard pcb tested.
Next the operative scenario of keyboard automatic test system 2 of the present invention is described, please consult Fig. 3 and Fig. 5 simultaneously, when keyboard pcb 22 be placed on this test bench 21 and with a plurality of thimbles 214 (seeing also Fig. 4) when contacting, start autotest program 201 and show a test interface 231 on screen 23, as shown in Figure 6.Click the beginning option 2316 in the test interface 231, thereby autotest program 201 is activated and exports a test signal in order to test button A and begin keyboard pcb 22 is tested automatically, this test signal is transferred to control panel 213 by signal wire 212, and wherein photistor ISO is switched on because of test signal.213 of control panels produce an analogue-key signal according to this test signal, and transmit this analogue-key signal to the analog switch U1 that is connected in scanning incoming line A1 and scanning output line A2, make the button contact (be conducting scanning incoming line A1 and scanning output line A2) of analog switch U1 conducting, make keyboard pcb 22 outputs give computing machine 20 corresponding to the key scan sign indicating number (being A1A2) of this button contact corresponding to button A.
When the key scan sign indicating number was not transferred to computing machine 20 as yet in Preset Time, autotest program 20 was exported error messages and it is shown in test mode district 2314, as shown in Figure 7.In the test interface 231, test number of keys hurdle 2313 shows that always pressing number of keys is 18, but pressed number of keys is 17, and do not press number of keys is 1, be illustrated in and still have a button not tested as yet in the Preset Time, and we can learn from a plurality of buttons hurdle 2311 that the button that is not labeled is not tested button, be i.e. button E, and also can learn the wrong existence of scanning output line E2 of keyboard pcb 22 by the button contact hurdle 2312 shown scanning output line E2 that are not labeled.
When the key scan sign indicating number is transferred to computing machine 20 in Preset Time, autotest program 201 judges whether the key scan sign indicating number is correct, and wherein autotest program 201 judges according to key scan sign indicating number script and key scan coding schedule whether the key scan sign indicating number is correct.When the key scan sign indicating number was judged as mistake, autotest program 201 output error messages were in test mode district 2314, as shown in Figure 8.2315 in abnormality district in the test interface 231 shows short-circuit condition, and button contact hurdle 2312 reading scan output line G1 are indicated with different colours, and expression scanning output line G1 is short-circuited.And be judged as when correct when the key scan sign indicating number, autotest program 20 outputs one test by information in test mode district 2314, as shown in Figure 9.
Keyboard automatic test system 2 of the present invention utilizes test bench 21 to come conducting button contact can carry out the automatic test that impersonal force is operated with the touched action of analogue-key, and carries out timing and judge whether tested button contact is correct in to finish complete automatic test by autotest program 201.In addition, thereby test bench 21 obtains electric power from computing machine 20 by power lead 211 being connected in computing machine 20, and does not need to be connected in addition other external power source.Compared with the prior art, keyboard automatic test system 2 of the present invention is except accuracy and speed with automatic test, also can learn tested keyboard pcb 22 existing mistakes by test interface 231, thereby can carry out debug at this keyboard pcb 22 part that makes a mistake, therefore more save time.
The above is preferred embodiment of the present invention only, is not in order to limiting practical range of the present invention, and therefore all other do not break away from the equivalence of being finished under the disclosed spirit and change or modify, and all should be included in protection scope of the present invention.
Claims (16)
1. keyboard automatic test system, be applied to a keyboard pcb of a key board unit is tested automatically, and this keyboard pcb comprises and it is characterized in that this keyboard automatic test system comprises by the corresponding key scan sign indicating number of this button contact of a plurality of button contacts and each:
One computing machine;
One autotest program is installed in this computing machine, in order to producing a test signal, and has a Preset Time; And
One test bench, be connected in this computing machine and this keyboard pcb, in order to producing an analogue-key signal according to this test signal, and conducting makes this keyboard pcb output give this computing machine corresponding to a key scan sign indicating number of this button contact corresponding to a button contact of this analogue-key signal;
Wherein, when this key scan sign indicating number was not transferred to this computing machine as yet in this Preset Time, this autotest program was exported an error message.
2. Auto-Test System as claimed in claim 1 is characterized in that: when this key scan sign indicating number was transferred to this computing machine in this Preset Time, this autotest program judged whether this key scan sign indicating number is correct.
3. Auto-Test System as claimed in claim 2 is characterized in that: when this key scan sign indicating number was judged as mistake, this autotest program was exported this error message; When this key scan sign indicating number is judged as when correct, information is passed through in this autotest program output one test.
4. Auto-Test System as claimed in claim 3 is characterized in that: this autotest program is preset with a test button script, and this autotest program produces this corresponding test signal according to this test button script.
5. Auto-Test System as claimed in claim 4, wherein this autotest program also comprises a key scan coding schedule, makes this autotest program judge according to this scan code script and this key scan coding schedule whether these a plurality of key scan sign indicating numbers are correct.
6. Auto-Test System as claimed in claim 1 is characterized in that this test bench also comprises a control panel, in order to export this analogue-key signal according to this test signal;
A plurality of thimbles contact with this keyboard pcb, give this keyboard pcb in order to transmit this analogue-key signal;
One power lead is connected in this computing machine, gives this test bench in order to the electric power that transmits this computing machine; And
One signal wire is connected in this computing machine, in order to transmit this test signal.
7. Auto-Test System as claimed in claim 6 is characterized in that: this power lead is a USB (universal serial bus) connecting line.
8. Auto-Test System as claimed in claim 6 is characterized in that: when this signal wire was connected in this computing machine, this test signal was exported by this autotest program and is transferred to this control panel by this signal wire.
9. Auto-Test System as claimed in claim 6 is characterized in that: this signal wire is a RS232 connecting line.
10. Auto-Test System as claimed in claim 6, it is characterized in that: this control panel also comprises an analog switch, be connected in this a plurality of thimbles, when this keyboard pcb was placed on this test bench and contacts with these a plurality of thimbles, this analog switch was connected to this a plurality of button contacts.
11. Auto-Test System as claimed in claim 10, it is characterized in that: when this control panel receives this test signal and exports this analogue-key signal, this analog switch with this analogue-key signal conducting corresponding to this button contact of this analogue-key signal.
12. Auto-Test System as claimed in claim 10 is characterized in that: this analog switch is a CD4066 switch.
13. Auto-Test System as claimed in claim 1 is characterized in that: this computing machine is connected in a screen, in order to show a test interface.
14. Auto-Test System as claimed in claim 13 is characterized in that: this test interface shows a plurality of buttons hurdle, the button contact hurdle corresponding to these a plurality of button contacts, test number of keys hurdle and test mode district.
15. Auto-Test System as claimed in claim 1 is characterized in that: this button contact is formed by multi-strip scanning incoming line and multi-strip scanning output line.
16. Auto-Test System as claimed in claim 15 is characterized in that: this multi-strip scanning incoming line is 8, and this multi-strip scanning output line is 18.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101375174A CN101876930B (en) | 2009-04-28 | 2009-04-28 | Keyboard automatic test system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101375174A CN101876930B (en) | 2009-04-28 | 2009-04-28 | Keyboard automatic test system |
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| CN101876930A true CN101876930A (en) | 2010-11-03 |
| CN101876930B CN101876930B (en) | 2012-08-08 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2009101375174A Expired - Fee Related CN101876930B (en) | 2009-04-28 | 2009-04-28 | Keyboard automatic test system |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102163169A (en) * | 2010-12-30 | 2011-08-24 | 东莞市长田电子有限公司 | Testing device of keyboard type circuit board |
| CN102539987A (en) * | 2010-12-08 | 2012-07-04 | 致伸科技股份有限公司 | Testing method for key circuit boards and system |
| CN102760091A (en) * | 2011-04-25 | 2012-10-31 | 致伸科技股份有限公司 | Keyboard testing method |
| CN104808103A (en) * | 2015-05-22 | 2015-07-29 | 江西森科实业股份有限公司 | Integrated device for automatically simulating test of keyboard |
| CN109254239A (en) * | 2017-07-14 | 2019-01-22 | 致伸科技股份有限公司 | Keyboard pcb detection system |
| CN112114249A (en) * | 2019-06-21 | 2020-12-22 | 致伸科技股份有限公司 | Infinite multitask key test system |
| CN115471958A (en) * | 2021-06-10 | 2022-12-13 | 深圳市怡化时代科技有限公司 | Long key processing method, device, equipment and medium |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1257241A (en) * | 1998-12-17 | 2000-06-21 | 英群企业股份有限公司 | Keyboard test system |
| CN100383540C (en) * | 2002-12-28 | 2008-04-23 | 鸿富锦精密工业（深圳）有限公司 | Key detector and method |
| CN1641596A (en) * | 2004-01-16 | 2005-07-20 | 顺德市顺达电脑厂有限公司 | Keyboard measuring method |
| CN101370230A (en) * | 2008-10-08 | 2009-02-18 | 嘉兴闻泰通讯科技有限公司 | Automatic test system and method for mobile phone keyboard |
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2009
- 2009-04-28 CN CN2009101375174A patent/CN101876930B/en not_active Expired - Fee Related
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102539987A (en) * | 2010-12-08 | 2012-07-04 | 致伸科技股份有限公司 | Testing method for key circuit boards and system |
| CN102163169A (en) * | 2010-12-30 | 2011-08-24 | 东莞市长田电子有限公司 | Testing device of keyboard type circuit board |
| CN102760091A (en) * | 2011-04-25 | 2012-10-31 | 致伸科技股份有限公司 | Keyboard testing method |
| CN104808103A (en) * | 2015-05-22 | 2015-07-29 | 江西森科实业股份有限公司 | Integrated device for automatically simulating test of keyboard |
| CN109254239A (en) * | 2017-07-14 | 2019-01-22 | 致伸科技股份有限公司 | Keyboard pcb detection system |
| CN109254239B (en) * | 2017-07-14 | 2021-02-05 | 致伸科技股份有限公司 | Keyboard circuit board detection system |
| CN112114249A (en) * | 2019-06-21 | 2020-12-22 | 致伸科技股份有限公司 | Infinite multitask key test system |
| CN112114249B (en) * | 2019-06-21 | 2023-08-08 | 致伸科技股份有限公司 | Infinite multitasking key test system |
| CN115471958A (en) * | 2021-06-10 | 2022-12-13 | 深圳市怡化时代科技有限公司 | Long key processing method, device, equipment and medium |
| CN115471958B (en) * | 2021-06-10 | 2023-11-10 | 深圳市怡化时代科技有限公司 | Processing method, device, equipment and medium for long key |
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|---|---|
| CN101876930B (en) | 2012-08-08 |
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