CN101846723A - 跨导参数的量测方法 - Google Patents
跨导参数的量测方法 Download PDFInfo
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- CN101846723A CN101846723A CN200910132310A CN200910132310A CN101846723A CN 101846723 A CN101846723 A CN 101846723A CN 200910132310 A CN200910132310 A CN 200910132310A CN 200910132310 A CN200910132310 A CN 200910132310A CN 101846723 A CN101846723 A CN 101846723A
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- 238000000691 measurement method Methods 0.000 title 1
- 238000000034 method Methods 0.000 claims abstract description 45
- 230000010355 oscillation Effects 0.000 claims abstract 3
- 238000013459 approach Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 51
- 230000003534 oscillatory effect Effects 0.000 description 64
- 239000000725 suspension Substances 0.000 description 10
- NAWXUBYGYWOOIX-SFHVURJKSA-N (2s)-2-[[4-[2-(2,4-diaminoquinazolin-6-yl)ethyl]benzoyl]amino]-4-methylidenepentanedioic acid Chemical compound C1=CC2=NC(N)=NC(N)=C2C=C1CCC1=CC=C(C(=O)N[C@@H](CC(=C)C(O)=O)C(O)=O)C=C1 NAWXUBYGYWOOIX-SFHVURJKSA-N 0.000 description 3
- 239000003990 capacitor Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
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CN 200910132310 CN101846723B (zh) | 2009-03-25 | 2009-03-25 | 跨导参数的量测方法 |
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CN 200910132310 CN101846723B (zh) | 2009-03-25 | 2009-03-25 | 跨导参数的量测方法 |
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CN101846723A true CN101846723A (zh) | 2010-09-29 |
CN101846723B CN101846723B (zh) | 2012-12-19 |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102565650A (zh) * | 2010-12-07 | 2012-07-11 | 中国科学院微电子研究所 | 一种GaN HEMT器件跨导频散特性的测量系统及方法 |
CN102854391A (zh) * | 2012-08-20 | 2013-01-02 | 浙江师范大学 | 一种无绝缘音频轨道电路一次参数测量及校正方法 |
CN104417514A (zh) * | 2013-09-06 | 2015-03-18 | 大陆-特韦斯贸易合伙股份公司及两合公司 | 用于监控传输路径的方法 |
CN107144775A (zh) * | 2017-05-22 | 2017-09-08 | 西安电子科技大学 | 一种cmos反相器跨导系数的测量装置和方法 |
CN109765469A (zh) * | 2017-11-03 | 2019-05-17 | 日月光半导体制造股份有限公司 | 用于测试集成电路及包含所述集成电路的电路板的测试系统、方法 |
CN119224543A (zh) * | 2024-11-28 | 2024-12-31 | 南京星问科技有限公司 | 一种用于开关稳压器芯片跨导参数的测量方法及电路 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH08201475A (ja) | 1995-01-20 | 1996-08-09 | Oki Electric Ind Co Ltd | Lsi回路使用環境モニタ回路 |
US6198301B1 (en) * | 1998-07-23 | 2001-03-06 | Lucent Technologies Inc. | Method for determining the hot carrier lifetime of a transistor |
GB0223635D0 (en) * | 2002-10-11 | 2002-11-20 | Aoti Operating Co Inc | Semiconductor monitoring instrument |
CN100403038C (zh) * | 2003-12-30 | 2008-07-16 | 上海贝岭股份有限公司 | 双卢瑟福横向双扩散场效应晶体管导通电阻的测试电路 |
JP2006184047A (ja) * | 2004-12-27 | 2006-07-13 | Agilent Technol Inc | Fetの特性測定方法 |
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2009
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Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102565650A (zh) * | 2010-12-07 | 2012-07-11 | 中国科学院微电子研究所 | 一种GaN HEMT器件跨导频散特性的测量系统及方法 |
CN102565650B (zh) * | 2010-12-07 | 2013-12-25 | 中国科学院微电子研究所 | 一种GaN HEMT器件跨导频散特性的测量系统及方法 |
CN102854391A (zh) * | 2012-08-20 | 2013-01-02 | 浙江师范大学 | 一种无绝缘音频轨道电路一次参数测量及校正方法 |
CN102854391B (zh) * | 2012-08-20 | 2015-01-21 | 浙江师范大学 | 一种无绝缘音频轨道电路一次参数测量及校正方法 |
CN104417514A (zh) * | 2013-09-06 | 2015-03-18 | 大陆-特韦斯贸易合伙股份公司及两合公司 | 用于监控传输路径的方法 |
CN104417514B (zh) * | 2013-09-06 | 2018-09-18 | 大陆-特韦斯贸易合伙股份公司及两合公司 | 用于监控传输路径的方法 |
CN107144775A (zh) * | 2017-05-22 | 2017-09-08 | 西安电子科技大学 | 一种cmos反相器跨导系数的测量装置和方法 |
CN107144775B (zh) * | 2017-05-22 | 2020-02-21 | 西安电子科技大学 | 一种cmos反相器跨导系数的测量装置和方法 |
CN109765469A (zh) * | 2017-11-03 | 2019-05-17 | 日月光半导体制造股份有限公司 | 用于测试集成电路及包含所述集成电路的电路板的测试系统、方法 |
CN109765469B (zh) * | 2017-11-03 | 2022-06-24 | 日月光半导体制造股份有限公司 | 用于测试集成电路及包含所述集成电路的电路板的测试系统、方法 |
CN119224543A (zh) * | 2024-11-28 | 2024-12-31 | 南京星问科技有限公司 | 一种用于开关稳压器芯片跨导参数的测量方法及电路 |
CN119224543B (zh) * | 2024-11-28 | 2025-03-25 | 南京星问科技有限公司 | 一种用于开关稳压器芯片跨导参数的测量方法及电路 |
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CN101846723B (zh) | 2012-12-19 |
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Application publication date: 20100929 Assignee: Universal technology (Shenzhen) Co., Ltd. Assignor: Pucheng Science and Technology Co., Ltd. Contract record no.: 2013990000901 Denomination of invention: Measuring method of transconductance parameters Granted publication date: 20121219 License type: Exclusive License Record date: 20131231 |
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Application publication date: 20100929 Assignee: Universal technology (Shenzhen) Co., Ltd. Assignor: Pucheng Science and Technology Co., Ltd. Contract record no.: 2013990000901 Denomination of invention: Measuring method of transconductance parameters Granted publication date: 20121219 License type: Exclusive License Record date: 20131231 |
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