CN101846723A - 跨导参数的量测方法 - Google Patents
跨导参数的量测方法 Download PDFInfo
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- CN101846723A CN101846723A CN200910132310A CN200910132310A CN101846723A CN 101846723 A CN101846723 A CN 101846723A CN 200910132310 A CN200910132310 A CN 200910132310A CN 200910132310 A CN200910132310 A CN 200910132310A CN 101846723 A CN101846723 A CN 101846723A
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CN 200910132310 CN101846723B (zh) | 2009-03-25 | 2009-03-25 | 跨导参数的量测方法 |
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CN 200910132310 CN101846723B (zh) | 2009-03-25 | 2009-03-25 | 跨导参数的量测方法 |
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CN101846723A true CN101846723A (zh) | 2010-09-29 |
CN101846723B CN101846723B (zh) | 2012-12-19 |
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CN 200910132310 Expired - Fee Related CN101846723B (zh) | 2009-03-25 | 2009-03-25 | 跨导参数的量测方法 |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102565650A (zh) * | 2010-12-07 | 2012-07-11 | 中国科学院微电子研究所 | 一种GaN HEMT器件跨导频散特性的测量系统及方法 |
CN102854391A (zh) * | 2012-08-20 | 2013-01-02 | 浙江师范大学 | 一种无绝缘音频轨道电路一次参数测量及校正方法 |
CN104417514A (zh) * | 2013-09-06 | 2015-03-18 | 大陆-特韦斯贸易合伙股份公司及两合公司 | 用于监控传输路径的方法 |
CN107144775A (zh) * | 2017-05-22 | 2017-09-08 | 西安电子科技大学 | 一种cmos反相器跨导系数的测量装置和方法 |
CN109765469A (zh) * | 2017-11-03 | 2019-05-17 | 日月光半导体制造股份有限公司 | 用于测试集成电路及包含所述集成电路的电路板的测试系统、方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6198301B1 (en) * | 1998-07-23 | 2001-03-06 | Lucent Technologies Inc. | Method for determining the hot carrier lifetime of a transistor |
GB0223635D0 (en) * | 2002-10-11 | 2002-11-20 | Aoti Operating Co Inc | Semiconductor monitoring instrument |
CN100403038C (zh) * | 2003-12-30 | 2008-07-16 | 上海贝岭股份有限公司 | 双卢瑟福横向双扩散场效应晶体管导通电阻的测试电路 |
JP2006184047A (ja) * | 2004-12-27 | 2006-07-13 | Agilent Technol Inc | Fetの特性測定方法 |
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2009
- 2009-03-25 CN CN 200910132310 patent/CN101846723B/zh not_active Expired - Fee Related
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102565650A (zh) * | 2010-12-07 | 2012-07-11 | 中国科学院微电子研究所 | 一种GaN HEMT器件跨导频散特性的测量系统及方法 |
CN102565650B (zh) * | 2010-12-07 | 2013-12-25 | 中国科学院微电子研究所 | 一种GaN HEMT器件跨导频散特性的测量系统及方法 |
CN102854391A (zh) * | 2012-08-20 | 2013-01-02 | 浙江师范大学 | 一种无绝缘音频轨道电路一次参数测量及校正方法 |
CN102854391B (zh) * | 2012-08-20 | 2015-01-21 | 浙江师范大学 | 一种无绝缘音频轨道电路一次参数测量及校正方法 |
CN104417514A (zh) * | 2013-09-06 | 2015-03-18 | 大陆-特韦斯贸易合伙股份公司及两合公司 | 用于监控传输路径的方法 |
CN104417514B (zh) * | 2013-09-06 | 2018-09-18 | 大陆-特韦斯贸易合伙股份公司及两合公司 | 用于监控传输路径的方法 |
CN107144775A (zh) * | 2017-05-22 | 2017-09-08 | 西安电子科技大学 | 一种cmos反相器跨导系数的测量装置和方法 |
CN107144775B (zh) * | 2017-05-22 | 2020-02-21 | 西安电子科技大学 | 一种cmos反相器跨导系数的测量装置和方法 |
CN109765469A (zh) * | 2017-11-03 | 2019-05-17 | 日月光半导体制造股份有限公司 | 用于测试集成电路及包含所述集成电路的电路板的测试系统、方法 |
CN109765469B (zh) * | 2017-11-03 | 2022-06-24 | 日月光半导体制造股份有限公司 | 用于测试集成电路及包含所述集成电路的电路板的测试系统、方法 |
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CN101846723B (zh) | 2012-12-19 |
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Application publication date: 20100929 Assignee: Universal technology (Shenzhen) Co., Ltd. Assignor: Pucheng Science and Technology Co., Ltd. Contract record no.: 2013990000901 Denomination of invention: Measuring method of transconductance parameters Granted publication date: 20121219 License type: Exclusive License Record date: 20131231 |
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Application publication date: 20100929 Assignee: Universal technology (Shenzhen) Co., Ltd. Assignor: Pucheng Science and Technology Co., Ltd. Contract record no.: 2013990000901 Denomination of invention: Measuring method of transconductance parameters Granted publication date: 20121219 License type: Exclusive License Record date: 20131231 |
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