CN101799517A - Sealing chip and sealing chip testing system - Google Patents
Sealing chip and sealing chip testing system Download PDFInfo
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- CN101799517A CN101799517A CN201010143081A CN201010143081A CN101799517A CN 101799517 A CN101799517 A CN 101799517A CN 201010143081 A CN201010143081 A CN 201010143081A CN 201010143081 A CN201010143081 A CN 201010143081A CN 101799517 A CN101799517 A CN 101799517A
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Abstract
The embodiment of the invention discloses a sealing chip and a sealing chip testing system, which relates to the technical field of electronics and solves the technical problem of high cost of package tests of the traditional sealing chip. The sealing chip comprises a first bare chip, a second bare chip, a bridge circuit and a sealing base pin. The bridge circuit is used for receiving a control instruction from the sealing base pin connected with the bridge circuit and receiving a bare chip test signal according to the control instruction; the bare chip test signal is transmitted to an internal functional circuit of the second bare chip, or a normal function signal sent by an internal functional circuit of the second bare chip is transmitted to the internal functional circuit of the second bare chip; and/or an interconnecting signal for the interaction of the internal functional circuit of the second bare chip and the internal functional circuit of the first bare chip through a data transmission line is output from the sealing base pin connected with the bridge circuit, or the normal function signal sent by the first bare chip is output from the sealing base pin connected with the bridge circuit. The sealing chip testing system is used for testing the sealing chip.
Description
Technical field
The present invention relates to electronic technology field, be specifically related to a kind ofly close sealing chip and close the sealing chip test macro.
Background technology
Along with the development and the evolution of chip technology, chip functions becomes increasingly complex, and the difficulty of chip testing is also in continuous lifting.
At present, ATE (Automatic Test Equipment is used in the chip manufacturing field usually, ATE (automatic test equipment)) comes the integrality of integrate circuit function in the detection chip, the integrality that detects integrate circuit function is the last flow process that integrated circuit is manufactured, and is used to the quality of guaranteeing that integrated circuit is manufactured.
In order on complex chip, to realize the ATE test function, need be used for chip testing with regard to increasing special additional circuit in the design phase, this method for designing be called as Testability Design (Design For Test, DFT).
Along with chip technology promotes, chip area constantly descends, when the chip shipment amount is enough big, the manufacturing cost of single-chip constantly descends, but the rising of ATE testing complex degree requires also upgrading thereupon of testing tool, and the test duration also constantly increases, and finally causes testing cost constantly to rise, therefore, the key factor that influences chip cost has become the ATE testing cost from the chip manufacturing cost gradually.
(System in Package SiP) is the system integration technology of a kind of Highgrade integration, firmwaring to system in package.In up-to-date system in package technology, microprocessor, storer (for example: EPROM and DRAM), FPGA (Field-Programmable Gate Array, field programmable gate array), resistor, electric capacity and inductor can be incorporated in the encapsulation of an outfit as many as four or five nude films.The system in package technology not only can shorten the product development Time To Market greatly, and can effectively reduce plate level design complexities, shortens signal delay time, reduces noise and reduce capacity effect, makes signal speed faster.Power consumption is also lower.
As shown in Figure 1, existing employing system in package forms closes sealing chip, comprise first nude film 1, second nude film 2, two-way closes tube sealing pin 4, substrate 5 and covers at shell 9 on one of them sides of first nude film 1, second nude film 2 and 5 two sides of substrate at least, one the tunnel closes tube sealing pin 4 comprises that at least one closes tube sealing pin 4, wherein:
First nude film 1, second nude film 2 respectively by lead 50 with close tube sealing pin 4 and link to each other;
First nude film, 1 inner function circuit links to each other by data line with the inner function circuit of second nude film 2;
The inner function circuit of first nude film 1 is based on Digital Logic, this nude film is also referred to as primary processor numeral nude film and (or claims: the master controller nude film, " nude film " English is: Die), the inner function circuit of second nude film 2 is based on analog logic, and this nude film is also referred to as the simulation nude film;
First nude film 1 and second nude film 2 are fixed on one of them side of 5 two sides of substrate, close tube sealing pin 4 and are fixedly arranged on wherein another sides of 5 two sides of substrate promptly on the side away from shell 9, close tube sealing pin 4 and extend outside the substrate 5;
One the tunnel closes tube sealing pin 4 links to each other with the inner function circuit of first nude film 1, and one the tunnel closes tube sealing pin 4 links to each other with the inner function circuit of second nude film 2.
Normal use adopt that system in package forms close sealing chip the time, to close the tube sealing pin links to each other with external unit, the inner function circuit of first nude film can close the tube sealing pin to normal function signals such as external unit sending controling instruction or data processed result by what link to each other with external unit, thereby the control external unit is finished various operations or to external unit output data result.Simultaneously, the inner function circuit of first nude film can also be to normal function signals such as the inner function circuit sending controling instruction of second nude film or data processed result, thereby control the inner function circuit of second nude film, make the inner function circuit of second nude film finish corresponding operation or realize function corresponding.
Test that above-mentioned employing system in package forms close sealing chip the time, (for example: ATE) link to each other will close tube sealing pin and testing apparatus, testing apparatus is closed the tube sealing pin by one the tunnel and is linked to each other with the inner function circuit of second nude film, can close the tube sealing pin by this road and finish test the inner function circuit partial function of second nude film, but (for example: the transmission performance of data line for the inner function circuit of second nude film function relevant with the inner function circuit of first nude film, interaction capabilities between the inner function circuit of the inner function circuit of second nude film and first nude film, the responding ability of the normal function signal that the inner function circuit of first nude film is sent) can't test.
For reaching test, and then realize mainly there are following two kinds of methods in the full test of the inner function circuit of second nude film in the prior art to the correlation function of the inner function circuit of the inner function circuit of second nude film and first nude film:
A kind of method is the test vector of constructing second nude film by first nude film, realize mutual, Combined Treatment test between nude film, promptly closing on the sealing chip, by existing inner function circuit input test vector, the structure function corresponding vector that closes the tube sealing pin to first nude film, and then import the inner function circuit of second nude film, thereby realize full test to the second nude film function and performance by the test vector that the inner function circuit of first nude film is constructed the inner function circuit of first nude film by data line.
There is following defective at least in employed above-mentioned method of testing in the prior art:
On the one hand, the structure difficulty of test vector that is used to test the second nude film performance in this method is very big, and it is more to expend time in, and causes that debug time increases, cost rises;
On the other hand, too Fu Za test vector can cause the coverage rate of testing to descend, and makes problem chip test leakage probability increase, and can cause the rising of final cost equally.
As depicted in figs. 1 and 2, in order to reduce the difficulty of test of said method one in the prior art, available technology adopting following method two:
Closing on the sealing chip on original basis of closing tube sealing pin 4, increase the quantity of closing tube sealing pin 4, data line between the inner function circuit 20 of the inner function circuit 10 of first nude film 1 and second nude film 2 is linked to each other with the tube sealing pin 4 that closes that increases newly, interconnected signal mutual between the inner function circuit 10 with the inner function circuit 20 of second nude film 2 and first nude film 1 (for example: ATE) 12 leads to testing apparatus by the tube sealing pin 4 that closes that increases newly, simultaneously, testing apparatus 12 sends the nude film test signals by close tube sealing pin 4 and the data line that increases newly to second nude film 2, and the inner function circuit 20 of second nude film 2 can produce feedback signal after receiving the nude film test signal; Testing apparatus 12 can receive interconnected signal by the tube sealing pin 4 that closes that is connected on the data line that increases newly, close tube sealing pin 4 receiving feedback signals by what link to each other, and judge the performance of the inner function circuit 20 of second nude film 2 according to interconnected signal and/or feedback signal with second nude film 2.
Like this, testing apparatus 12 can directly be closed tube sealing pin 4 and close original direct test of closing 4 realizations of tube sealing pin to the inner function circuit 20 of second nude film 2 on the sealing chip by what increase newly, owing to need not to construct test vector in the test process, so solved vectorial complex structure, technical matters such as vector generates and the difficulty of debugging is excessive.
The inventor finds in realizing process of the present invention, though prior art has solved the technical matters of vectorial complex structure, has following problem at least:
Need to increase the quantity of closing tube sealing pin 4 in the prior art, by the tube sealing pin 4 that closes that increases newly interconnected signal is led to testing apparatus 12, and the nude film test signal is sent to second nude film 2 from data line, because the number of interconnected signal and nude film test signal is often all very many, if these interconnected signals are all drawn by the tube sealing pin 4 that closes that increases newly, and the nude film test signal is all imported by the tube sealing pin 4 that closes that increases, must need to increase and close the number that closes tube sealing pin 4 on the sealing chip, and the space of closing the area of substrate of sealing chip and substrate periphery is very limited, increase the quantity close tube sealing pin 4 not only can increase close sealing chip and with the difficulty of the hardware design of closing the external unit that tube sealing pin 4 links to each other, and increase the operating procedure complexity close tube sealing pin 4, difficulty is bigger, finally causes closing the packaging and testing cost of sealing chip than higher.
Summary of the invention
The embodiment of the invention provide a kind of close sealing chip and be provided with that this closes sealing chip close the sealing chip test macro, solved the existing sealing chip packaging and testing cost that closes and compared technical problems of high.
For achieving the above object, embodiments of the invention adopt following technical scheme:
This closes sealing chip, comprises that first nude film, at least one second nude film, bridgt circuit and at least three tunnel close the tube sealing pin, wherein:
The inner function circuit of described first nude film links to each other with the one tunnel described tube sealing pin that closes at least, and described bridgt circuit links to each other with the one tunnel described tube sealing pin that closes at least, and the inner function circuit of each described second nude film links to each other with the one tunnel described tube sealing pin that closes at least;
Described first nude film is a primary processor numeral nude film, and the inner function circuit of described first nude film links to each other by data line with the inner function circuit of described second nude film;
Described bridgt circuit is used for receiving steering order from a road described tube sealing pin that closes that links to each other with described bridgt circuit, and according to described steering order, the a road described nude film test signal of closing the input of tube sealing pin that reception links to each other from the inner function circuit with described first nude film, described nude film test signal is transferred to the inner function circuit of described second nude film, or transfer to the inner function circuit of described second nude film according to the normal function signal that described steering order is sent the inner function circuit of described first nude film;
And/or, described bridgt circuit is used for receiving described steering order from a road described tube sealing pin that closes that links to each other with described bridgt circuit, according to described steering order the inner function circuit of described second nude film is carried out mutual interconnected signal by the described data line and the inner function circuit of described first nude film and a road describedly close the output of tube sealing pin, or the normal function signal that will described first nude film sends according to described steering order is described exports from a road described tube sealing pin that closes that links to each other with described bridgt circuit from what link to each other with described bridgt circuit.
This closes the sealing chip test macro, comprises closing sealing chip and chip measure and control device, and the described sealing chip that closes comprises that first nude film, at least one second nude film, bridgt circuit and at least three tunnel close the tube sealing pin, wherein:
The inner function circuit of described first nude film links to each other with the one tunnel described tube sealing pin that closes at least, and described bridgt circuit links to each other with the one tunnel described tube sealing pin that closes at least, and the inner function circuit of each described second nude film links to each other with the one tunnel described tube sealing pin that closes at least;
Described first nude film is a primary processor numeral nude film, and the inner function circuit of described first nude film links to each other by data line with the inner function circuit of described second nude film;
Described bridgt circuit is used for receiving steering order from a road described tube sealing pin that closes that links to each other with described bridgt circuit, and according to described steering order, the a road described nude film test signal of closing the input of tube sealing pin that reception links to each other from the inner function circuit with described first nude film, described nude film test signal is transferred to the inner function circuit of described second nude film, or transfer to the inner function circuit of described second nude film according to the normal function signal that described steering order is sent the inner function circuit of described first nude film;
And/or, described bridgt circuit is used for receiving described steering order from a road described tube sealing pin that closes that links to each other with described bridgt circuit, according to described steering order the inner function circuit of described second nude film is carried out mutual interconnected signal by the described data line and the inner function circuit of described first nude film and a road describedly close the output of tube sealing pin, or the normal function signal that will described first nude film sends according to described steering order is described exports from a road described tube sealing pin that closes that links to each other with described bridgt circuit from what link to each other with described bridgt circuit;
Described chip measure and control device links to each other with the described tube sealing pin that closes, wherein:
Described chip measure and control device is used for by a road described tube sealing pin that closes that links to each other with described bridgt circuit described bridgt circuit being sent described steering order, and a road described tube sealing pin that closes that the inner function circuit with first nude film links to each other is imported described nude film test signal and/or received described interconnected signal from a road described tube sealing pin that closes that links to each other with described bridgt circuit;
The inner function circuit of described second nude film can produce feedback signal after receiving described nude film test signal;
Described chip measure and control device also is used for receiving described feedback signal by a road described tube sealing pin that closes that the inner function circuit with described second nude film links to each other, and judges the performance of the function that the described second nude film inner function circuit is relevant with the inner function circuit of described first nude film according to described interconnected signal and/or described feedback signal.
Compared with prior art, the arbitrary technical scheme in above-mentioned two technical schemes provided by the present invention all can produce following technique effect:
Owing to close in the embodiment of the invention and be provided with bridgt circuit in the sealing chip, when the chip measure and control device when closing the tube sealing pin and link to each other, the chip measure and control device can be realized the complete detection to the second nude film performance; The chip measure and control device is used to import the nude film test signal, receive interconnected signal and feedback signal close the tube sealing pin, it itself is transmission normal function signal between the inner function circuit of the inner function circuit that is used for externally equipment and first nude film, second nude film, compare with art methods two, present embodiment need not by the tube sealing pin that closes that increases newly interconnected signal to be led to testing apparatus, also need not by the tube sealing pin that closes that increases newly the nude film test signal to be sent to second nude film from data line;
Because a road of the input control order that is used for that is increased in the embodiment of the invention closes the tube sealing pin and only needs one or several to close the tube sealing pin usually to get final product, compared with prior art present embodiment closes many that the number that closes the tube sealing pin newly-increased on the sealing chip will lack, and the hardware design difficulty that bridgt circuit is set is closed the difficulty of tube sealing stiffness of foot in children spare design far below increase, so reduced close sealing chip and with the difficulty of the hardware design of closing the external unit that the tube sealing pin links to each other, and then solved the existing sealing chip packaging and testing cost that closes and compared technical problems of high.
Description of drawings
In order to be illustrated more clearly in the embodiment of the invention or technical scheme of the prior art, to do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art below, apparently, accompanying drawing in describing below only is some embodiments of the present invention, for those of ordinary skills, under the prerequisite of not paying creative work, can also obtain other accompanying drawing according to these accompanying drawings.
The synoptic diagram that closes a kind of inner structure of sealing chip that Fig. 1 forms for existing employing system in package technology encapsulation;
Fig. 2 is the existing annexation synoptic diagram that closes sealing chip and testing apparatus shown in Figure 1;
Fig. 3 is the synoptic diagram of a kind of embodiment of the annexation of closing inner each parts of sealing chip that embodiments of the invention provided;
Fig. 4 is the synoptic diagram of another embodiment of the annexation of closing inner each parts of sealing chip that embodiments of the invention provided;
Fig. 5 is for testing a kind of circuit connection diagram of closing sealing chip that the embodiment of the invention provided by the chip measure and control device;
Another closed a circuit connection diagram of sealing chip to Fig. 6 for the embodiment of the invention provides by chip measure and control device test;
Another closed a circuit connection diagram of sealing chip to Fig. 7 for the embodiment of the invention provides by chip measure and control device test;
Another closed a circuit connection diagram of sealing chip to Fig. 8 for the embodiment of the invention provides by chip measure and control device test.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the invention, the technical scheme in the embodiment of the invention is clearly and completely described, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills belong to the scope of protection of the invention not making the every other embodiment that is obtained under the creative work prerequisite.
The embodiment of the invention provides a kind of sealing chip packaging and testing cost is lower, test coverage is higher close sealing chip and close the sealing chip test macro of closing.
As shown in Figure 3 and Figure 4, the embodiment of the invention provided closes sealing chip, comprises that first nude film 1, at least one second nude film 2, bridgt circuit 6 and at least three tunnel close tube sealing pin 4, wherein:
The inner function circuit 10 of first nude film 1 closes tube sealing pin 4 and links to each other with one the tunnel at least, and bridgt circuit 6 closes tube sealing pin 4 and links to each other with one the tunnel at least, and the inner function circuit 20 of each second nude film 2 closes tube sealing pin 4 and links to each other with one the tunnel at least;
First nude film 1 is a primary processor numeral nude film, and the inner function circuit 10 of first nude film 1 links to each other by data line 5 with the inner function circuit 20 of second nude film 2;
And/or, bridgt circuit 6 is used for from what link to each other with bridgt circuit 6 a road closing tube sealing pin 4 and receiving steering orders, according to steering order the inner function circuit 20 of second nude film 2 is carried out mutual interconnected signal by the data line 5 and the inner function circuit 10 of first nude film 1 and a road close 4 outputs of tube sealing pin, or the normal function signal that first nude film 1 is sent according to steering order a road closes tube sealing pin 4 and exports from what link to each other with bridgt circuit 6 from what link to each other with bridgt circuit 6.
Owing to close in the embodiment of the invention and be provided with bridgt circuit 6 in the sealing chip, when as the chip measure and control device 8 shown in Fig. 5 or Fig. 7 or Fig. 8 are arbitrary when closing tube sealing pin 4 and link to each other, chip measure and control device 8 can a road close 4 pairs of bridgt circuit 6 sending controling instructions of tube sealing pin by what link to each other with bridgt circuit 6, a road closes tube sealing pin 4 input nude film test signals and/or a road closes the interconnected signal of tube sealing pin 4 receptions from what link to each other with bridgt circuit 6 what link to each other with the inner function circuit 10 of first nude film 1; The inner function circuit 20 of second nude film 2 can produce feedback signal after receiving the nude film test signal; Chip measure and control device 8 can a road close tube sealing pin 4 receiving feedback signals by what link to each other with the inner function circuit 20 of second nude film 2, and judge the performance of the function that the inner function circuit 10 of second nude film, 2 inner function circuits and first nude film 1 is relevant, and then realize complete detection to second nude film, 2 performances according to interconnected signal and feedback signal;
Because chip measure and control device 8 is used to import the nude film test signal, what receive interconnected signal and feedback signal closes tube sealing pin 4, itself be to be used for the externally inner function circuit 10 of equipment and first nude film 1, transmission normal function signal between the inner function circuit 20 of second nude film 2, and then realize normal function that this closes sealing chip, compare with art methods two, present embodiment need not by the tube sealing pin 4 that closes that increases newly interconnected signal to be led to testing apparatus 81, also need not by the tube sealing pin 4 that closes that increases newly the nude film test signal to be sent to second nude film 2 from data line 5;
Because the number of interconnected signal and nude film test signal is often all very many in the prior art, need the number of closing tube sealing pin 4 of increase also quite a lot of, and a road of the input control order that is used for that is increased in the embodiment of the invention closes tube sealing pin 4 and only needs one or several to close tube sealing pin 4 usually to get final product, as seen, compared with prior art close many that the number that closes tube sealing pin 4 newly-increased on the sealing chip will lack in the present embodiment, so can make the space of the area that closes substrate in the sealing chip and substrate periphery more abundant, simultaneously, because the hardware design difficulty that bridgt circuit 6 is set is closed the difficulty of tube sealing pin 4 hardware design far below increase, so reduced close sealing chip and with the difficulty of the hardware design of closing the external unit that tube sealing pin 4 links to each other, solved the existing sealing chip packaging and testing cost that closes and compared technical problems of high.
Close the tube sealing pin that closes that closes normal function signal that tube sealing pin 4 and the interconnected signal of output or first nude film 1 send that receives steering order in the sealing chip in the present embodiment was arranged and can avoids signal to disturb in 4 minutes, simultaneously, when closing tube sealing pin 4 and link to each other with chip measure and control device 8, chip measure and control device 8 can receive the normal function signal that the interconnected signal or first nude film 1 send in input control order.
Certainly, close in the present embodiment receive steering order in the sealing chip close closing tube sealing pin 4 and also can being the same tube sealing pin 4 that closes of normal function signal that tube sealing pin 4 and the interconnected signal of output or first nude film 1 send.At this moment, when closing tube sealing pin 4 and link to each other with chip measure and control device 8, chip measure and control device 8 can use and samely close tube sealing pin 4 input control orders, receive the normal function signal that interconnected signal or first nude film 1 send in the different time periods.
As Fig. 5, Fig. 7 and shown in Figure 8, bridgt circuit 6 is arranged in first nude film 1.Because first nude film 1 is a primary processor numeral nude film, there is bridgt circuit in the existing part primary processor numeral nude film, though, bridgt circuit in the existing part primary processor numeral nude film is not to be applied to test chip, but it can be transformed, transforming the cost of chip compares lower with the cost that increases bridgt circuit 6 on a new chip, so the embodiment of the invention can select for use the primary processor numeral nude film that has bridgt circuit as first nude film 1, thereby further reduces the packaging and testing cost that closes sealing chip.
Certainly, bridgt circuit 6 also can be arranged in second nude film 2 or is arranged at as shown in Figure 6 between first nude film 1 and second nude film 2 in the present embodiment.
Steering order is the high-low level form.1), (be recorded as: 0) two states has undistorted, sensitive characteristics to the end level steering order of high-low level form has high level and (is recorded as:.Certainly, steering order also can be the extended formatting outside the high-low level form in the present embodiment.
As shown in Figure 5, bridgt circuit 6 comprises first selector 61, and a road of reception steering order is closed tube sealing pin 4 and linked to each other with the enable pin of first selector 61, wherein:
One of them input pin of first selector 61 is connected in a road closing on the tube sealing pin 4 of linking to each other with the inner function circuit 10 of first nude film 1, and this input pin is used for receiving the nude film test signals from closing tube sealing pin 4;
Wherein another input pin of first selector 61 links to each other with the inner function circuit 10 of first nude film 1, is used to receive the normal function signal that the inner function circuit 10 of first nude film 1 sends;
The enable pin of first selector 61 is used for closing tube sealing pin 4 from coupled a road and receives steering orders, and selects the data transmission path conducting between the output pin of one of them input pin on it and first selector 61 according to the height of level on the enable pin on it;
The output pin of first selector 61 links to each other with the inner function circuit 20 of second nude film 2, is used for the normal function signal that nude film test signal or first nude film 1 send is transferred to the inner function circuit 20 of second nude film 2.
When the enable pin with first selector 61 is linked to each other close tube sealing pin 4 and promptly receive a road of steering order and close tube sealing pin 4 input high levels the time, the enable pin of first selector 61 is after close tube sealing pin 4 and receive high level signal, be connected in the data transmission path conducting between the output pin that closes input pin on the tube sealing pin 4 and first selector 61 that links to each other with the input port of the inner function circuit 10 of first nude film 1 in two input pins of first selector 61, at this moment, chip measure and control device 8 just can send the nude film test signal from closing 4 pairs second nude films of tube sealing pin 2;
When the enable pin with first selector 61 is linked to each other close tube sealing pin 4 input low levels the time, the enable pin of first selector 61 is after close tube sealing pin 4 and receive low level signal, data transmission path conducting between another input pin that links to each other with the inner function circuit 10 of first nude film 1 on the first selector 61 and the output pin of first selector 61, at this moment, the normal function signal that sends of the inner function circuit 10 of first nude film 1 can transfer to second nude film 2 by first selector 61.
As shown in Figure 7, bridgt circuit 6 comprises second selector 62, a road of reception steering order is closed tube sealing pin 4 and is linked to each other with the enable pin of second selector 62, export a road of normal function signal that the interconnected signal or first nude film 1 send and close tube sealing pin 4 and link to each other with the output pin of second selector 62, wherein:
One of them input pin of second selector 62 links to each other with data line 5, and the inner function circuit 20 that is used to receive second nude film 2 exports the interconnected signal of the inner function circuit 10 of first nude film 1 to by data line 5;
Wherein another input pin of second selector 62 links to each other with the inner function circuit 10 of first nude film 1, is used to receive the normal function signal that the inner function circuit 10 of first nude film 1 sends;
The enable pin of second selector 62 is used for closing tube sealing pin 4 from coupled a road and receives steering orders, and selects one of them input pin on it and the data transmission path conducting between the output pin according to the height of level on the enable pin;
The output pin of second selector 62 is used for interconnected signal or normal function signal are closed 4 outputs of tube sealing pin from coupled a road.
When the enable pin with second selector 62 is linked to each other close tube sealing pin 4 and promptly receive a road of steering order and close tube sealing pin 4 input high levels the time, when the enable pin of second selector 62 receives high level signal from closing tube sealing pin 4, data transmission path conducting between the input pin that links to each other with data line 5 in two input pins of second selector 62 and the output pin of second selector 62, at this moment, the inner function circuit 20 of the second nude film 2 interconnected signal that exports the inner function circuit 10 of first nude film 1 to just can close 4 outputs of tube sealing pin by the output pin of second selector 62; When chip measure and control device 8 linked to each other with the output pin of second selector 62, chip measure and control device 8 just can export the interconnected signal of the inner function circuit 10 of first nude film 1 by the inner function circuit 20 that closes tube sealing pin 4 receptions second nude film 2 to by data line 5;
When the enable pin with second selector 62 is linked to each other close tube sealing pin 4 and promptly receive a road of steering order and close tube sealing pin 4 input low levels the time, the enable pin of second selector 62 receives low level signal from closing tube sealing pin 4, data transmission path conducting between the input pin that links to each other with the output port of the inner function circuit 10 of first nude film 1 on the second selector 62 and the output pin of second selector 62, at this moment, the inner function circuit 10 of first nude film 1 just can be exported the normal function signal by the output pin of second selector 62 from closing tube sealing pin 4.When external unit links to each other with the output pin of second selector 62, just can be by closing the normal function signal that tube sealing pin 4 receives inner function circuit 10 outputs of first nude film 1.
Since close in the present embodiment tube sealing pin 4 respectively with the inner function circuit 10 of first nude film 1, the inner function circuit 20 of second nude film 2 and bridgt circuit 6 link to each other, when chip measure and control device 8 be connected in link to each other with the inner function circuit 20 of second nude film 2 close on the tube sealing pin 4 time, because the inner function circuit of the second dissimilar nude films 2 20 needs the function of test different with performance, inner function circuit 20 for part second nude film 2, only need its input nude film test signal, whether chip measure and control device 8 just can receive the reaction of 20 pairs of nude film test signals of inner function circuit of the nude film test signal and second nude film 2 by closing of linking to each other with the inner function circuit 20 of second nude film 2 inner function circuit 20 that tube sealing pin 4 detects second nude film 2, finishes the test to the inner function circuit 20 of second nude film 2;
In like manner, inner function circuit 20 for part second nude film 2, the inner function circuit 20 that only needs to detect second nude film 2 exports the inner function circuit 10 of first nude film 1 to by data line 5 interconnected signal just can be finished the detection to the inner function circuit 20 of second nude film 2, so bridgt circuit 6 both can both comprise first selector 61 in the present embodiment, comprise second selector 62 again, can also only comprise first selector 61, second selector 62 one of them.
As shown in Figure 8, bridgt circuit 6 comprises third selector 63, the 4th selector switch 64, the 5th selector switch 65 and circuit gating device 66, the inner function circuit 10 of first nude film 1 closes tube sealing pin 4 with two-way at least and links to each other, a road of reception steering order is closed tube sealing pin 4 and is linked to each other with the enable pin of third selector 63, the 4th selector switch 64 and the 5th selector switch 65 respectively, export a road of normal function signal that the interconnected signal or first nude film 1 send and close tube sealing pin 4 and link to each other with the output pin of third selector 63, wherein:
Wherein another input pin of third selector 63 links to each other with data line 5, and this input pin is used for receiving interconnected signals or sending to the normal function signal of the inner function circuit 20 of second nude film 2 from the inner function circuit 10 that data line 5 receives first nude film 1 by data line 5 from data line 5;
The output pin of the 4th selector switch 64 links to each other with the input end of circuit gating device 66, one of them input pin of the 4th selector switch 64 links to each other with the inner function circuit 10 of first nude film 1, and the inner function circuit 10 that this input pin is used to receive first nude film 1 sends to the normal function signal of the inner function circuit 20 of second nude film 2;
Wherein another input pin of the 4th selector switch 64 is connected in a road closing on the tube sealing pin 4 of linking to each other with the inner function circuit 10 of first nude film 1, and this input pin is used to receive the nude film test signal of closing 4 inputs of tube sealing pin from this road;
The output pin of the 5th selector switch 65 links to each other with the control end of circuit gating device 66, one of them input pin of the 5th selector switch 65 links to each other with the inner function circuit 10 of first nude film 1, and this input pin is used to receive the conducting steering order that the inner function circuit 10 of first nude film 1 sends;
Wherein another input pin of the 5th selector switch 65 is connected in another road that links to each other with the inner function circuit 10 of first nude film 1 and closes on the tube sealing pin 4, and this input pin is used to receive the conducting steering order of closing 4 inputs of tube sealing pin from this road;
The output terminal of circuit gating device 66 links to each other with data line 5, circuit gating device 66 is used for receiving the conducting steering order by its control end from the output pin of the 5th selector switch 65, and according to whether conducting of the data transmission path between the output terminal of the input end of conducting steering order control circuit gating device 66 and circuit gating device 66;
In the time of need testing the inner function circuit 20 of this second nude film 2, close tube sealing pin 4 input low levels to what link to each other with the enable pin of third selector 63, the 4th selector switch 64 and the 5th selector switch 65 respectively, at this moment,
Data transmission path conducting between input pin that links to each other with data line 5 on the third selector 63 and third selector 63 output terminals, between the inner function circuit 10 of first nude film 1 and the inner function circuit 20 of second nude film 2 mutual interconnected signal, just can export to and close tube sealing pin 4 by third selector 63;
The 4th selector switch 64 be connected in link to each other with the inner function circuit 10 of first nude film 1 close input pin on the tube sealing pin 4 and the data transmission path conducting between the 4th selector switch 64 output terminals, the 4th selector switch 64 can receive the nude film test signal from closing tube sealing pin 4, with the input end of nude film test signal input circuit gating device 66, the nude film test signal can be imported the inner function circuit 20 of second nude film 2 by circuit gating device 66;
The 5th selector switch 65 be connected in link to each other with the inner function circuit 10 of first nude film 1 close input pin on the tube sealing pin 4 and the data transmission path conducting between the 5th selector switch 65 output terminals, can close tube sealing pin 4 input conducting steering orders by this, whether control circuit gating device 66 imports the nude film test signal inner function circuit 20 of second nude film 2, if make the nude film test signal import the inner function circuit 20 of second nude film 2, then can finish test to the inner function circuit 20 of this second nude film 2.
Need normally when using this to close sealing chip, close tube sealing pin 4 input high levels what link to each other with the enable pin of third selector 63, the 4th selector switch 64 and the 5th selector switch 65 respectively, at this moment,
Data transmission path conducting between input pin that links to each other with the inner function circuit 10 of first nude film 1 on the third selector 63 and third selector 63 output terminals, at this moment, the inner function circuit 10 of first nude film 1 can be exported the normal function signal by third selector 63 from the tube sealing pin 4 that closes that links to each other with third selector 63 output terminals, if this moment, the tube sealing pin 4 that closes that links to each other with third selector 63 output terminals links to each other with external unit, then the inner function circuit 10 of first nude film 1 can external unit to normal function signals such as transmitting control commands or data processed result;
Data transmission path conducting between input pin that links to each other with the inner function circuit 10 of first nude film 1 on the 4th selector switch 64 and the 4th selector switch 64 output terminals, the normal function signal that the inner function circuit 10 of first nude film 1 sends can export circuit gating device 66 to by third selector 63, at this moment, can control the inner function circuit 20 whether normal function signal that the inner function circuit 10 of first nude film 1 sends imports second nude film 2 by control circuit gating device 66 control ends;
Data transmission path conducting between input pin that links to each other with the inner function circuit 10 of first nude film 1 on the 5th selector switch 65 and the 5th selector switch 65 output terminals, the normal function signal that the inner function circuit 10 of first nude film 1 sends can export the control end of circuit gating device 66 by the 5th selector switch 65 to, thus whether conducting of the data transmission path between the output terminal of the input end of control circuit gating device 66 and circuit gating device 66.
In the present embodiment between the inner function circuit 20 of the inner function circuit 10 of first nude film 1 and second nude film 2 mutual interconnected signal be two-way signaling.Two-way signaling is for input, the signal that carries out synchronously of output, when interconnected signal is two-way signaling, can test the two-way pin of the inner function circuit 20 of second nude film 2.
Because there is not two-way pin in the inner function circuit 20 of part second nude film 2 or does not have the functional module of reception, identification two-way signaling, then this moment, need not to be provided with third selector 63, the 4th selector switch 64, the 5th selector switch 65 and circuit gating device 66 in the present embodiment bridgt circuit 6.
Certainly, also exist part second nude film 2 only to need to test two-way pin or have the functional module of reception, identification two-way signaling performance, at this moment, bridgt circuit 6 only needs to be provided with third selector 63, the 4th selector switch 64, the 5th selector switch 65 and circuit gating device 66 in the present embodiment, and first selector 61, second selector 62 need not be set, so the function of the inner function circuit 20 of second nude film 2 that bridgt circuit 6 can be tested as required in the present embodiment need to determine whether which or which selector switch and circuit gating device 66.
The conducting steering order of high-low level form not only controls fast, accurately, and the conducting steering order of high-low level form is difficult for decay when transmission.
When the control end of circuit gating device 66 is end level or high level in the present embodiment, data transmission path conducting between the output terminal of the input end of circuit gating device 66 and circuit gating device 66, otherwise, when the control end of circuit gating device 66 was high level or low level, the data transmission path between the output terminal of the input end of circuit gating device 66 and circuit gating device 66 ended or disconnects.
Certainly, circuit gating device 66 also can be selected other circuit gating devices outside the ternary controller for use in the present embodiment.
Close sealing chip and also comprise substrate, first nude film 1 and second nude film 2 all are fixed on one of them side of two sides of substrate, one of them links to each other each wherein end that closes tube sealing pin 4 with first nude film 1, second nude film 2 or bridgt circuit 6 respectively, and each wherein other end that closes tube sealing pin 4 extends wherein another side of two sides of substrate.
That substrate not only can play is fixing, the effect of protection first nude film 1 and second nude film 2, and conveniently closes tube sealing pin 4 and close tube sealing pin 4 and be connected with the circuit of chip measure and control device 8 or other external units.
Second nude film 2 is wherein a kind of of simulation nude film, storage nude film or digital nude film in the present embodiment.Primary processor in the numeral nude film inner function circuit is based on Digital Logic.The test vector simple structure of numeral nude film inner function circuit, the test of being more convenient for.The primary processor of simulation nude film is based on analog logic.Second nude film 2 can be expanded first nude film, 1 function, for example: the storage space that can expand first nude film 1 when second nude film 2 is the storage nude film.Certainly, second nude film 2 nude film that also can be used with digital nude film for digital nude film or other.When present embodiment closed sealing chip and comprises a plurality of second nude film 2, second nude film 2 both can be identical, also can have nothing in common with each other.
As Fig. 5, Fig. 7 and shown in Figure 8, the embodiment of the invention provided closes the sealing chip test macro, and what comprise that the invention described above embodiment provided closes sealing chip and chip measure and control device 8; Chip measure and control device 8 with close tube sealing pin 4 and link to each other, wherein:
Chip measure and control device 8 is used for a road closing 4 pairs of bridgt circuit 6 sending controling instructions of tube sealing pin by what link to each other with bridgt circuit 6, a road closes tube sealing pin 4 input nude film test signals and/or a road closes the interconnected signal of tube sealing pin 4 receptions from what link to each other with bridgt circuit 6 what link to each other with the inner function circuit 10 of first nude film 1;
The inner function circuit 20 of second nude film 2 can produce feedback signal after receiving the nude film test signal;
Chip measure and control device 8 also is used for a road closing tube sealing pin 4 receiving feedback signals by what link to each other with the inner function circuit 20 of second nude film 2, and judges the performance of the inner function circuit 20 of second nude film 2 according to interconnected signal and/or feedback signal.
Present embodiment chips measure and control device 8 comprises testing apparatus 81 and opertaing device 82, wherein:
The performance of the function that the inner function circuit 20 that can judge second nude film 2 by testing apparatus 81 and the inner function circuit of first nude film 1 10 are relevant, and then finish complete detection to the inner function circuit 20 of second nude film 2, after detection is finished, normal use that the invention described above embodiment provided close sealing chip the time, external unit can link to each other by each device in closing tube sealing pin 4 and closing sealing chip.
The above; only be the specific embodiment of the present invention, but protection scope of the present invention is not limited thereto, anyly is familiar with those skilled in the art in the technical scope that the present invention discloses; can expect easily changing or replacing, all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of claim.
Claims (12)
1. one kind is closed sealing chip, it is characterized in that: comprise that first nude film, at least one second nude film, bridgt circuit and at least three tunnel close the tube sealing pin, wherein:
The inner function circuit of described first nude film links to each other with the one tunnel described tube sealing pin that closes at least, and described bridgt circuit links to each other with the one tunnel described tube sealing pin that closes at least, and the inner function circuit of each described second nude film links to each other with the one tunnel described tube sealing pin that closes at least;
Described first nude film is a primary processor numeral nude film, and the inner function circuit of described first nude film links to each other by data line with the inner function circuit of described second nude film;
Described bridgt circuit is used for receiving steering order from a road described tube sealing pin that closes that links to each other with described bridgt circuit, and according to described steering order, the a road described nude film test signal of closing the input of tube sealing pin that reception links to each other from the inner function circuit with described first nude film, described nude film test signal is transferred to the inner function circuit of described second nude film, or transfer to the inner function circuit of described second nude film according to the normal function signal that described steering order is sent the inner function circuit of described first nude film;
And/or, described bridgt circuit is used for receiving described steering order from a road described tube sealing pin that closes that links to each other with described bridgt circuit, according to described steering order the inner function circuit of described second nude film is carried out mutual interconnected signal by the described data line and the inner function circuit of described first nude film and a road describedly close the output of tube sealing pin, or the normal function signal that will described first nude film sends according to described steering order is described exports from a road described tube sealing pin that closes that links to each other with described bridgt circuit from what link to each other with described bridgt circuit.
2. the sealing chip that closes according to claim 1, it is characterized in that: described bridgt circuit links to each other with the described tube sealing pin that closes of two-way at least, described steering order is received by the one tunnel described tube sealing pin that closes wherein, and the normal function signal that described interconnected signal or described first nude film send closes the output of tube sealing pin by another road wherein is described.
3. the sealing chip that closes according to claim 2 is characterized in that: described bridgt circuit is arranged in described first nude film, and described steering order is the high-low level form.
4. the sealing chip that closes according to claim 3, it is characterized in that: described bridgt circuit comprises first selector, a road described tube sealing pin that closes that receives described steering order links to each other with the enable pin of described first selector, wherein:
One of them input pin of described first selector is connected in a road closing on the tube sealing pin of linking to each other with the inner function circuit of described first nude film, and this input pin is used for receiving described nude film test signal from the described tube sealing pin that closes;
Wherein another input pin of described first selector links to each other with the inner function circuit of described first nude film, is used to receive the normal function signal that the inner function circuit of described first nude film sends;
The enable pin of described first selector is used for receiving described steering order from a road coupled described tube sealing pin that closes, and selects the data transmission path conducting between the output pin of one of them described input pin on it and described first selector according to the height of level on the described enable pin on it;
The described output pin of described first selector links to each other with the inner function circuit of described second nude film, is used for the normal function signal that described nude film test signal or described first nude film send is transferred to the inner function circuit of described second nude film.
5. the sealing chip that closes according to claim 3, it is characterized in that: described bridgt circuit comprises second selector, the a road described tube sealing pin that closes that receives described steering order links to each other with the enable pin of described second selector, the a road described tube sealing pin that closes of exporting the normal function signal that described interconnected signal or described first nude film send links to each other with the described output pin of described second selector, wherein:
One of them input pin of described second selector links to each other with described data line, and the inner function circuit that is used to receive described second nude film exports the described interconnected signal of the inner function circuit of described first nude film to by described data line;
Wherein another input pin of described second selector links to each other with the inner function circuit of described first nude film, is used to receive the normal function signal that the inner function circuit of described first nude film sends;
The enable pin of described second selector is used for receiving described steering order from a road coupled described tube sealing pin that closes, and selects one of them described input pin on it and the data transmission path conducting between the described output pin according to the height of level on the described enable pin;
The described output pin of described second selector is used for described interconnected signal or described normal function signal are exported from a road coupled described tube sealing pin that closes.
6. the sealing chip that closes according to claim 3, it is characterized in that: described bridgt circuit comprises third selector, the 4th selector switch, the 5th selector switch and circuit gating device, the inner function circuit of described first nude film links to each other with the described tube sealing pin that closes of two-way at least, receive described steering order a road described close the tube sealing pin respectively with described third selector, the enable pin of the 4th selector switch and the 5th selector switch links to each other, the a road described tube sealing pin that closes of exporting the normal function signal that described interconnected signal or described first nude film send links to each other with the described output pin of described third selector, wherein:
One of them input pin of described third selector links to each other with the inner function circuit of described first nude film, and this input pin is used to receive the described normal function signal that the inner function circuit of described first nude film sends;
Wherein another input pin of described third selector links to each other with described data line, and this input pin is used for sending to by described data line from the inner function circuit that described data line receives described interconnected signal or receives described first nude film from described data line the normal function signal of the inner function circuit of described second nude film;
The output pin of described the 4th selector switch links to each other with the input end of described circuit gating device, one of them input pin of described the 4th selector switch links to each other with the inner function circuit of described first nude film, and the inner function circuit that this input pin is used to receive described first nude film sends to the normal function signal of the inner function circuit of described second nude film;
Wherein another input pin of described the 4th selector switch is connected in a road described the closing on the tube sealing pin that links to each other with the inner function circuit of first nude film, and this input pin is used to receive the described described nude film test signal of closing the input of tube sealing pin from this road;
The output pin of described the 5th selector switch links to each other with the control end of described circuit gating device, one of them input pin of described the 5th selector switch links to each other with the inner function circuit of described first nude film, and this input pin is used to receive the conducting steering order that the inner function circuit of described first nude film sends;
Wherein another input pin of described the 5th selector switch is connected in another road that links to each other with the inner function circuit of first nude film and closes on the tube sealing pin, and this input pin is used to receive the described conducting steering order of closing the input of tube sealing pin from this road;
The output terminal of described circuit gating device links to each other with described data line, described circuit gating device is used for receiving described conducting steering order by its control end from the output pin of described the 5th selector switch, and controls the whether conducting of data transmission path between the output terminal of the input end of described circuit gating device and described circuit gating device according to described conducting steering order;
Described third selector, described the 4th selector switch and described the 5th selector switch all be used for according to the height of level on its enable pin separately select its separately one of them input pin and the data transmission path conducting between its output pin separately.
7. the sealing chip that closes according to claim 6, it is characterized in that: described circuit gating device is ternary controller, described conducting steering order is the high-low level form, and described circuit gating device is controlled the whether conducting of data transmission path between the output terminal of the input end of described circuit gating device and described circuit gating device according to the height of its control end level.
8. according to the arbitrary described sealing chip that closes of claim 1 to 4, it is characterized in that: the described sealing chip that closes also comprises substrate, described first nude film and described second nude film all are fixed on one of them side of two sides of substrate, every road is described closes the tube sealing pin and comprises that at least one closes the tube sealing pin, each is described closes the wherein end of tube sealing pin one of them links to each other with described first nude film, described second nude film or described bridgt circuit respectively, and each described wherein other end that closes the tube sealing pin extends wherein another side of two sides of described substrate.
9. according to the arbitrary described sealing chip that closes of claim 1 to 4, it is characterized in that: described second nude film is wherein a kind of of simulation nude film, storage nude film or digital nude film.
10. one kind is closed the sealing chip test macro, it is characterized in that: comprise and close sealing chip and chip measure and control device, the described sealing chip that closes comprises that first nude film, at least one second nude film, bridgt circuit and at least three tunnel close the tube sealing pin, wherein:
The inner function circuit of described first nude film links to each other with the one tunnel described tube sealing pin that closes at least, and described bridgt circuit links to each other with the one tunnel described tube sealing pin that closes at least, and the inner function circuit of each described second nude film links to each other with the one tunnel described tube sealing pin that closes at least;
Described first nude film is a primary processor numeral nude film, and the inner function circuit of described first nude film links to each other by data line with the inner function circuit of described second nude film;
Described bridgt circuit is used for receiving steering order from a road described tube sealing pin that closes that links to each other with described bridgt circuit, and according to described steering order, the a road described nude film test signal of closing the input of tube sealing pin that reception links to each other from the inner function circuit with described first nude film, described nude film test signal is transferred to the inner function circuit of described second nude film, or transfer to the inner function circuit of described second nude film according to the normal function signal that described steering order is sent the inner function circuit of described first nude film;
And/or, described bridgt circuit is used for receiving described steering order from a road described tube sealing pin that closes that links to each other with described bridgt circuit, according to described steering order the inner function circuit of described second nude film is carried out mutual interconnected signal by the described data line and the inner function circuit of described first nude film and a road describedly close the output of tube sealing pin, or the normal function signal that will described first nude film sends according to described steering order is described exports from a road described tube sealing pin that closes that links to each other with described bridgt circuit from what link to each other with described bridgt circuit;
Described chip measure and control device links to each other with the described tube sealing pin that closes, wherein:
Described chip measure and control device is used for by a road described tube sealing pin that closes that links to each other with described bridgt circuit described bridgt circuit being sent described steering order, and a road described tube sealing pin that closes that the inner function circuit with first nude film links to each other is imported described nude film test signal and/or received described interconnected signal from a road described tube sealing pin that closes that links to each other with described bridgt circuit;
The inner function circuit of described second nude film can produce feedback signal after receiving described nude film test signal;
Described chip measure and control device also is used for receiving described feedback signal by a road described tube sealing pin that closes that the inner function circuit with described second nude film links to each other, and judges the performance of the inner function circuit of described second nude film according to described interconnected signal and/or described feedback signal.
11. the sealing chip test macro that closes according to claim 10 is characterized in that: described chip measure and control device comprises testing apparatus and opertaing device, wherein:
Described testing apparatus is used for a road described tube sealing pin that closes that the inner function circuit with first nude film links to each other is imported described nude film test signal and/or received described interconnected signal from a road described tube sealing pin that closes that links to each other with described bridgt circuit;
Described testing apparatus also is used for receiving described feedback signal by a road described tube sealing pin that closes that the inner function circuit with described second nude film links to each other, and judges the performance of the function that the described second nude film inner function circuit is relevant with the inner function circuit of described first nude film according to described interconnected signal and/or described feedback signal;
Described opertaing device is used for by a road described tube sealing pin that closes that links to each other with described bridgt circuit described bridgt circuit being sent described steering order.
12. the sealing chip test macro that closes according to claim 11 is characterized in that: described opertaing device is a register.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010101430812A CN101799517B (en) | 2010-04-09 | 2010-04-09 | Sealing chip and sealing chip testing system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010101430812A CN101799517B (en) | 2010-04-09 | 2010-04-09 | Sealing chip and sealing chip testing system |
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| CN101799517B CN101799517B (en) | 2011-12-21 |
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| CN2010101430812A Active CN101799517B (en) | 2010-04-09 | 2010-04-09 | Sealing chip and sealing chip testing system |
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| CN102034528A (en) * | 2010-09-26 | 2011-04-27 | 钰创科技股份有限公司 | System encapsulation integrated circuit for providing input reference voltage thereby |
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| CN111856242A (en) * | 2020-06-22 | 2020-10-30 | 深圳米飞泰克科技有限公司 | Detection method and device for sealed chip and electronic equipment |
| CN111856242B (en) * | 2020-06-22 | 2021-09-07 | 深圳米飞泰克科技有限公司 | Detection method and device for sealed chip and electronic equipment |
| CN114167335A (en) * | 2020-09-10 | 2022-03-11 | 长鑫存储技术有限公司 | Qualification inspection method and system for newly added detection tool |
| CN114167335B (en) * | 2020-09-10 | 2022-10-18 | 长鑫存储技术有限公司 | Qualification inspection method and system for newly added detection tool |
| CN112799686A (en) * | 2020-12-28 | 2021-05-14 | 广州粒子微电子有限公司 | Sealed chip and sealed chip programming method |
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Address after: 518129 Building 2, B District, Bantian HUAWEI base, Longgang District, Shenzhen, Guangdong. Patentee after: Huawei terminal (Shenzhen) Co.,Ltd. Address before: 518129 Building 2, B District, Bantian HUAWEI base, Longgang District, Shenzhen, Guangdong. Patentee before: HUAWEI DEVICE Co.,Ltd. |
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Effective date of registration: 20181226 Address after: 523808 Southern Factory Building (Phase I) Project B2 Production Plant-5, New Town Avenue, Songshan Lake High-tech Industrial Development Zone, Dongguan City, Guangdong Province Patentee after: HUAWEI DEVICE Co.,Ltd. Address before: 518129 Building 2, B District, Bantian HUAWEI base, Longgang District, Shenzhen, Guangdong. Patentee before: Huawei terminal (Shenzhen) Co.,Ltd. |