CN101762782B - 系统芯片外建自测试数据的压缩方法及专用解码单元 - Google Patents
系统芯片外建自测试数据的压缩方法及专用解码单元 Download PDFInfo
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- CN101762782B CN101762782B CN201010046534XA CN201010046534A CN101762782B CN 101762782 B CN101762782 B CN 101762782B CN 201010046534X A CN201010046534X A CN 201010046534XA CN 201010046534 A CN201010046534 A CN 201010046534A CN 101762782 B CN101762782 B CN 101762782B
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CN102262209B (zh) * | 2011-04-15 | 2014-01-01 | 詹文法 | 一种基于广义折叠集的自动测试向量生成方法 |
CN102305912B (zh) * | 2011-07-29 | 2014-06-04 | 清华大学 | 数据可压缩的低功耗集成电路测试装置及其方法 |
CN106124962B (zh) * | 2016-06-15 | 2017-08-25 | 安庆师范学院 | 一种一次翻转选择网络及其翻转序列解压结构与解压方法 |
US10473717B2 (en) * | 2016-11-09 | 2019-11-12 | Texas Instruments Incorporated | Methods and apparatus for test insertion points |
CN106610469A (zh) * | 2016-12-07 | 2017-05-03 | 吴海峰 | 一种交替循环翻转的测试数据压缩方法 |
CN110045268A (zh) * | 2019-05-07 | 2019-07-23 | 广东工业大学 | 一种芯片检测系统 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1279697A (zh) * | 1997-11-21 | 2001-01-10 | 纳幕尔杜邦公司 | 含高氟化具有羟基的添加剂的涂料组合物 |
EP1584937A1 (en) * | 2004-04-05 | 2005-10-12 | AGILENT TECHNOLOGIES, INC. (n. d. Gesetzen d. Staates Delaware) | Systems and methods for processing automatically generated test patterns |
CN1862274A (zh) * | 2006-05-27 | 2006-11-15 | 合肥工业大学 | 一种多扫描链的大规模集成电路测试数据压缩方法 |
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CN1279697A (zh) * | 1997-11-21 | 2001-01-10 | 纳幕尔杜邦公司 | 含高氟化具有羟基的添加剂的涂料组合物 |
EP1584937A1 (en) * | 2004-04-05 | 2005-10-12 | AGILENT TECHNOLOGIES, INC. (n. d. Gesetzen d. Staates Delaware) | Systems and methods for processing automatically generated test patterns |
CN1862274A (zh) * | 2006-05-27 | 2006-11-15 | 合肥工业大学 | 一种多扫描链的大规模集成电路测试数据压缩方法 |
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