CN101726657B - Device for measurement and conversion of voltage signal - Google Patents
Device for measurement and conversion of voltage signal Download PDFInfo
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- CN101726657B CN101726657B CN2009103122508A CN200910312250A CN101726657B CN 101726657 B CN101726657 B CN 101726657B CN 2009103122508 A CN2009103122508 A CN 2009103122508A CN 200910312250 A CN200910312250 A CN 200910312250A CN 101726657 B CN101726657 B CN 101726657B
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Abstract
The invention discloses a device for measurement and conversion of a voltage signal, comprising a difference PGA, the difference PGA is respectively connected with an input signal buffer and a comparison voltage generator, the comparison voltage generator is connected with a microcontroller, one output end of the difference PGA is connected with the microcontroller by a analog to digital converter, the input signal buffer, the comparison voltage generator, the microcontroller, the difference PGA and the analog to digital converter are respectively power-supplied by a power module, and the other output end of the difference PGA is connected with ATE equipment, the microcontroller is connected with the ATE equipment by a digital bus, and the comparison voltage generator is composed of the analog to digital converter and a voltage follower which are connected; the device can lead an integration circuit ATE system to measure a microvolt level signal accurately under a condition of a long lead wire.
Description
Technical field
The invention belongs to the integrated circuit testing field of measuring technique, relate to a kind of measurement and conversion equipment that is used for voltage signal.
Background technology
In integrated circuit automated test device (ATE equipment), during particularly at the final test of integrated circuit, because mechanical arm (Handler) and ATE be the relation of size and profile separately, source/table on the integrated circuit board among measured device (DUT) and the ATE directly can't be docked, so must DUT be linked to each other with ATE with one section long lead-in wire, the short then 1-2 rice of the length of lead-in wire, long meeting reaches 5 meters.Because the introducing of long lead has brought the lead-in wire error inevitably and has aggravated the interference of external electromagnetic field to signal-under-test.Though the Kelvin's wiring adopted among the ATE and the method for electromagnetic screen can reduce measuring error on certain program, in some cases, still can't satisfy test request, as: measuring accuracy requires below 1 millivolt or 1 millivolt; The output of signal-under-test is bigger, impedance is very big, is the light current gesture.
If disregard the error that long lead brings, the measuring accuracy of simulation ATE can reach millivolt substantially, and the measuring accuracy of digital ATE will be more than tens millivolts.Therefore even without the introducing of long lead, more than two kinds of situations in test, also can't satisfy the measurement requirement of microvolt class precision.
Summary of the invention
The purpose of this invention is to provide a kind of measurement and conversion equipment that is used for voltage signal,, make ATE equipment under the situation that the long lead influence is arranged, can test the signal of microvolt class precision exactly to realize the accurate measurement and the conversion of integrated circuit voltage signal.
The technical solution adopted in the present invention is, a kind of measurement and conversion equipment that is used for voltage signal, comprise difference PGA, difference PGA is connected with comparison voltage generator with the buffer input signal device respectively, comparison voltage generator is connected with microcontroller, the output terminal of difference PGA is connected with microcontroller by analog to digital converter, the buffer input signal device, comparison voltage generator, microcontroller, difference PGA, analog to digital converter is powered by power module respectively, another output terminal of difference PGA is connected with ATE equipment, microcontroller output PGA control signal, microcontroller is connected with ATE equipment by number bus, described comparison voltage generator is made up of digital to analog converter that is connected and voltage follower, and described ATE equipment is meant the integrated circuit automated test device.
Measurement of the present invention and conversion equipment, its feature also is:
The inner structure of described difference PGA is, by multiway analog switch I and multiway analog switch II, differential operational amplifier is formed, differential operational amplifier inside comprises that one-level amplifier and two-stage amplifier are linked in sequence and forms, multiway analog switch II and multiway analog switch I are linked in sequence, the negative pole of multiway analog switch II and one-level amplifier+the 1N utmost point is connected, the output terminal of multiway analog switch II respectively with the negative pole of multiway analog switch I and two-stage amplifier-the 1N utmost point is connected, the output terminal of multiway analog switch I and the output terminal of two-stage amplifier are connected to form the output terminal of difference PGA.
The general input/output port of described microcontroller is connected with toggle switch I, toggle switch II, toggle switch III respectively.
The beneficial effect of apparatus of the present invention is under the prerequisite that increases ATE equipment hardly, by the improvement of structure, to make the voltage measurement precision of ATE equipment improve two more than the order of magnitude, the accurate measurement of realization millivolt level and the following signal of millivolt.
Description of drawings
Fig. 1 is the structured flowchart of apparatus of the present invention;
Fig. 2 is the inner structure synoptic diagram of the comparison voltage generator in apparatus of the present invention;
Fig. 3 is the inner structure synoptic diagram of the difference PGA in apparatus of the present invention;
Fig. 4 is the inner structure synoptic diagram of the microcontroller in apparatus of the present invention;
Fig. 5 is the workflow synoptic diagram of apparatus of the present invention.
Among the figure, 1.ATE equipment, 2. buffer input signal device, 3. comparison voltage generator, 4. microcontroller, 5. difference PGA, 6. analog to digital converter, 8. toggle switch I, 9. toggle switch II, 10. toggle switch III, 11. digital to analog converters, 12. voltage followers, 13. multiway analog switch I, 14. differential operational amplifiers, 15. multiway analog switch II, 16. the one-level amplifier, 17. two-stage amplifiers.
Embodiment
The present invention is described in detail below in conjunction with the drawings and specific embodiments.
Fig. 1 is the structured flowchart of apparatus of the present invention, comprise difference PGA5, difference PGA5 is connected with comparison voltage generator 3 with buffer input signal device 2 respectively, comparison voltage generator 3 is connected with microcontroller 4, the output terminal of difference PGA5 is connected with microcontroller 4 by analog to digital converter 6, buffer input signal device 2, comparison voltage generator 3, microcontroller 4, difference PGA5, analog to digital converter 6 are powered by power module respectively, another output terminal of difference PGA5 is connected with ATE equipment 1, and microcontroller 4 is connected with ATE equipment 1 by number bus.
Power module from the outside obtain ± the 15V power supply after, convert to respectively ± 12V ,+5V, 3.3V voltage, be used for providing correspondent voltage to buffer input signal device 2, comparison voltage generator 3, microcontroller 4, difference PGA5, analog to digital converter 6 each submodules.Tested input signal inputs to difference PGA5 jointly through the output voltage of buffer input signal device 2 buffering conditioning back and comparison voltage generator 3, the output voltage of comparison voltage generator 3 is to be provided with according to the measuring voltage of expecting, about 5V, then the output voltage of comparison voltage generator is set to 5V such as the voltage that will test.Difference PGA5 makes these two voltages difference and amplifies the signal of back one tunnel as simulation output according to the enlargement factor of setting, and measures for ATE equipment 1; One the tunnel enters analog to digital converter 6 and converts digital signal to and reads for microcontroller 4.Microcontroller 4 is sent to ATE equipment 1 by number bus again with the digital quantity that reads.This shows, it is directly to give ATE equipment 1 by the output of difference PGA5 that signal-under-test has after processed two approach to deliver to 1, one of ATE equipment, and this passage is at simulation ATE, because the voltage measurement ratio of precision of simulation ATE is higher, can directly read this magnitude of voltage; Another is to deliver to ATE equipment 1 by the number bus of microcontroller 4, this path is at digital ATE, the voltage measurement ratio of precision of numeral ATE is relatively poor, but can read the digital quantity of process conversion by this path, after converting, obtain the magnitude of voltage of measured signal, thereby guaranteed measuring accuracy.
Fig. 2 is the cut-away view of the comparison voltage generator 3 in apparatus of the present invention, and comparison voltage generator 3 is connected in sequence with voltage follower 12 by high-precision digital to analog converter 11.The digital quantity of measured value of expection is written in the high-precision digital to analog converter 11 by microcontroller 4, the analog quantity of digital to analog converter 11 outputs behind voltage follower 12 as the input of late-class circuit.
Fig. 3 is the cut-away view of the difference PGA in apparatus of the present invention, by multiway analog switch I 13, multiway analog switch II 15 and high-precision differential operational amplifier 14 are formed, differential operational amplifier 14 inside comprise two amplifiers (one-level amplifier 16 and two-stage amplifier 17), and being linked in sequence forms, finish the work that calculus of differences amplifies, multiway analog switch II 15 and multiway analog switch I 13 are linked in sequence, the negative pole of multiway analog switch II 15 and one-level amplifier 16+the 1N utmost point is connected, the negative pole of the output terminal of multiway analog switch II15 and multiway analog switch I 13 and two-stage amplifier 17-the 1N utmost point, the three is connected, and the output terminal of the output terminal of multiway analog switch I 13 and two-stage amplifier 17 is connected to form the output terminal of difference PGA5.Multiway analog switch I 13 and multiway analog switch II 15 are subjected to the control of microcontroller 4, amplify to select suitable enlargement factor that two signals that input to differential operational amplifier 14 are carried out difference.The output of difference PGA can directly be read for simulation ATE.
Fig. 4 is the cut-away view of the microcontroller in apparatus of the present invention, the general input/output port of microcontroller 4 is connected respectively with toggle switch I 8, toggle switch II 9, toggle switch III 10 simultaneously, microcontroller 4 is gathered the state of three toggle switchs (toggle switch I 8, toggle switch II 9, toggle switch III 10) in real time, send control signal according to set condition, control comparison voltage generator 3 and difference PGA5 respectively.Wherein toggle switch I 8 is used for the mode of operation of setting device, selection be operated in the digital ATE interface of ATE equipment 1 or with simulation ATE interface, when being chosen as and simulating the ATE interface, toggle switch II 9 is used to be provided with expection measuring voltage value, and toggle switch II 9 is used to be provided with the enlargement factor of difference PGA.When toggle switch I 8 was chosen as with digital ATE interface, all settings were the I by device
2The C communication port is provided with the communicating by letter of Logic passage of ATE, so under this pattern, toggle switch II 9 and toggle switch III 10 do not participate in work.
Embodiment:
If the output reference voltage desired value of the chip of testing is 5.0V ± 0.1%, the output of non-defective unit just should be at 4.995V-5.005V, have only ± scope of 5mV, if directly test with test machine, will there be the very big possibility of manslaughtering and misplacing in the measuring accuracy of test machine like this at ± 1mV.If consider the influence of long lead again, situation will be more serious.
With reference to Fig. 5, before using this device to test, earlier toggle switch I 8 is chosen as the digital ATE interface with ATE equipment 1, promptly digital ATE pattern, after device powered on, microcontroller 4 was at first checked the interface mode (this example is digital ATE pattern) that toggle switch I 8 is set.When test, ATE is by the I of device
2C communication port comparative voltage is that 5.0V, enlargement factor are made as 1000 times of two parameters and issue, after device is received order is set, microcontroller 4 is made as 5.0V with the output voltage of comparison voltage generator 3, and by control multiway analog switch I 13 and multiway analog switch II 15 enlargement factor of difference PGA5 is made as 1000 times.Wait for (about 2 milliseconds) after the loop stability that ATE equipment 1 just can issue reading order, after device is received reading order, with measurement device to magnitude of voltage pass through I
2The C communication port is recycled to ATE.
Value of reading of ATE=(reference voltage value-comparing voltage value) * enlargement factor
Value of reading of reference voltage value=ATE/enlargement factor+comparing voltage value
By formula as can be seen the value of reading of ATE equipment 1 removed an enlargement factor 1000 last, just error has been dwindled 1000 times, thereby has reached the purpose that improves measuring accuracy.
Voltage signal of the present invention is measured and conversion equipment, concentrate near a certain desired value characteristics at measured magnitude of voltage in the integrated circuit testing, utilizing programmable differential amplifier that actual value and desired value are carried out the result being returned equipment to ATE again after difference is amplified on the test board, make integrated circuit ATE system under the long lead situation, can accurately measure microvolt level signal, one-piece construction is simple, operation easily, cost is low.
Claims (3)
1. a measurement and conversion equipment that is used for voltage signal, it is characterized in that: comprise difference PGA (5), difference PGA (5) is connected with comparison voltage generator (3) with buffer input signal device (2) respectively, comparison voltage generator (3) is connected with microcontroller (4), the output terminal of difference PGA (5) is connected with microcontroller (4) by analog to digital converter (6), buffer input signal device (2), comparison voltage generator (3), microcontroller (4), difference PGA (5), analog to digital converter (6) is powered by power module respectively, another output terminal of difference PGA (5) is connected with ATE equipment (1), microcontroller (4) is connected with ATE equipment (1) by number bus, microcontroller (4) output PGA control signal, described comparison voltage generator (3) is made up of digital to analog converter that is connected (11) and voltage follower (12), and described ATE equipment (1) is meant the integrated circuit automated test device.
2. measurement according to claim 1 and conversion equipment, it is characterized in that: the inner structure of described difference PGA is, by multiway analog switch I (13) and multiway analog switch II (15), differential operational amplifier (14) is formed, differential operational amplifier (14) inside comprises that one-level amplifier (16) and two-stage amplifier (17) are linked in sequence and forms, multiway analog switch II (15) and multiway analog switch I (13) are linked in sequence, the negative pole of multiway analog switch II (15) and one-level amplifier (16)+the 1N utmost point is connected, the output terminal of multiway analog switch II (15) respectively with the negative pole of multiway analog switch I (13) and two-stage amplifier (17)-the 1N utmost point is connected, the output terminal of the output terminal of multiway analog switch I (13) and two-stage amplifier (17) is connected to form the output terminal of difference PGA (5).
3. measurement according to claim 1 and conversion equipment is characterized in that: the general input/output port of described microcontroller (4) is connected with toggle switch I (8), toggle switch II (9), toggle switch III (10) respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009103122508A CN101726657B (en) | 2009-12-25 | 2009-12-25 | Device for measurement and conversion of voltage signal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009103122508A CN101726657B (en) | 2009-12-25 | 2009-12-25 | Device for measurement and conversion of voltage signal |
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| Publication Number | Publication Date |
|---|---|
| CN101726657A CN101726657A (en) | 2010-06-09 |
| CN101726657B true CN101726657B (en) | 2011-11-02 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2009103122508A Expired - Fee Related CN101726657B (en) | 2009-12-25 | 2009-12-25 | Device for measurement and conversion of voltage signal |
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Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106501577A (en) * | 2016-12-14 | 2017-03-15 | 绍兴芯谷科技有限公司 | A kind of test system of accurate test IC reference voltages and method of testing |
| CN111323643A (en) * | 2020-04-13 | 2020-06-23 | 深圳市华星光电半导体显示技术有限公司 | Voltage measuring device and voltage measuring method |
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Owner name: XI'AN TESEMI TECHNOLOGY CO., LTD. Free format text: FORMER OWNER: XI'AN MINGTAI SEMICONDUCTOR TESTING CO., LTD. Effective date: 20110810 |
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Effective date of registration: 20110810 Address after: 710077 Shaanxi city of Xi'an province high tech Zone Jinye Road No. 69 business R & D Park C District No. 1 building six layer 605 gazelle Valley E Applicant after: Xi'an Tesemi Technology Co., Ltd. Address before: 710065, new industrial park, B-1, 28 Kam Yip Road, hi tech Zone, Shaanxi, Xi'an Applicant before: Xian Tesemi Technology Co., Ltd. |
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Application publication date: 20100609 Assignee: Jiangsu Haodi Energy-Saving Photoelectric Technology Co.,Ltd. Assignor: Xi'an Tesemi Technology Co., Ltd. Contract record no.: 2013320010019 Denomination of invention: Device for measurement and conversion of voltage signal Granted publication date: 20111102 License type: Common License Record date: 20130305 |
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Assignee: Jiangsu Haodi Energy-Saving Photoelectric Technology Co.,Ltd. Assignor: Xi'an Tesemi Technology Co., Ltd. Contract record no.: 2013320010019 Date of cancellation: 20140821 |
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