CN101694922A - System for controlling stability of high-stability semiconductor laser light source - Google Patents
System for controlling stability of high-stability semiconductor laser light source Download PDFInfo
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- CN101694922A CN101694922A CN200910153383A CN200910153383A CN101694922A CN 101694922 A CN101694922 A CN 101694922A CN 200910153383 A CN200910153383 A CN 200910153383A CN 200910153383 A CN200910153383 A CN 200910153383A CN 101694922 A CN101694922 A CN 101694922A
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Abstract
The invention discloses a system for controlling the stability of a high-stability semiconductor laser light source, which integrates the control policies for physical parameters, such as current of a light source tube core, temperature of a thermistor, refrigerating capacity of a thermoelectric refrigerator, and the like, and adopts a first junction voltage sampling circuit, a second junction voltage sampling circuit, a light power sampling circuit, a light wavelength detecting circuit, an internal temperature sampling circuit, an external temperature sampling circuit, a multi-channel A/D sampling device, a main control chip, two D/A converters, a precision current source circuit and a refrigerator driving circuit. The system can simultaneously sample stability evaluating indexes of the light source, such as the temperature, junction voltage, light power, light wavelength and the like of the light source, can reasonably set the specific gravity of each control parameter aiming at different application occasions, and achieve higher control precision, wider application range and more stable light source control.
Description
Technical field
The present invention is a kind of system for controlling stability of high-stability semiconductor laser light source.
Background technology
Semiconductor laser light resource is as the source of photoelectric device, and its stability is very important for the accuracy and the reliability of measurement result.Therefore its stability is to weigh the important indicator of light source always.
The semiconductor light sources of using always in the reality has surface light emitting diode (LED), laser diode (LD), super-radiance light emitting diode (SLD) etc., and be " constant-current source+digital temperature control " substantially to their stabilitrak at present, though this system can regulate control procedure very flexibly, but this control of machine-made employing certainly will influence the control effect, this system's controlling object is indeterminate simultaneously, lack specific aim, the scope of application is restricted, thereby only be suitable for the less demanding occasion of control precision, and have specific (special) requirements and the demanding occasion of control precision just to expose its drawback for some.
Summary of the invention
Content of the present invention is the deficiency at present controlling schemes, proposes a kind of system for controlling stability of high-stability semiconductor laser light source.
System for controlling stability of high-stability semiconductor laser light source comprises by the light source tube core, thermistor, the light source assembly that thermoelectric refrigerating unit is formed, also comprise the first junction voltage sample circuit, the second junction voltage sample circuit, the luminous power sample circuit, the optical wavelength testing circuit, interior temperature sampling circuit, outer temperature sampling circuit, multichannel A/D sampler, main control chip CPU, first D/A converter, second D/A converter, precision current source circuit and refrigerator drive circuit, the first junction voltage sample circuit, the second junction voltage sample circuit, the luminous power sample circuit, the optical wavelength testing circuit, interior temperature sampling circuit, outer temperature sampling circuit links to each other with light source assembly respectively, the first junction voltage sample circuit, the second junction voltage sample circuit is used for the junction voltage of sampled light source capsule core, the luminous power sample circuit, the optical wavelength testing circuit is respectively applied for the luminous power and the optical wavelength of sampled light source capsule core, interior temperature sampling circuit, outer temperature sampling circuit is used for the temperature signal of sampled light source component, the first junction voltage sample circuit, the second junction voltage sample circuit, the luminous power sample circuit, the optical wavelength testing circuit, interior temperature sampling circuit, multichannel A/D sampler is sent in the output of outer temperature sampling circuit respectively; Multi-channel a/d converter is sent the sampled signal that receives into main control chip CPU; Main control chip CPU handles the back with sampled signal and divides two-way output: the one tunnel sends into the precision current source circuit through second D/A converter, and output links to each other with light source assembly, for the light source tube core provides drive current; The refrigerator drive circuit is sent in another road output, output links to each other with light source assembly, in order to drive thermoelectric refrigerating unit work, main control chip CPU exports one road voltage signal and sends into the first junction voltage sample circuit through first D/A converter in addition, for the first junction voltage sample circuit provides the benchmark voltage signal.
Described by the light source tube core, thermistor, the internal module annexation of the light source assembly that thermoelectric refrigerating unit is formed is: light source tube core and interior thermistor are close to the upper surface of Heat Conduction Material, the lower surface of Heat Conduction Material is close to the upper surface of thermoelectric refrigerating unit, the lower surface of thermoelectric refrigerating unit is close to the inner surface of light source assembly shell, by light source assembly shell and extraneous heat-shift, outer thermistor is close to the outer surface of light source assembly shell, temperature signal with sampled light source component shell, first interface of light source assembly, the 4th interface of light source assembly, the 6th interface of light source assembly, the 7th interface of light source assembly, the 8th interface of light source assembly respectively with the first junction voltage sample circuit, the precision current source circuit, interior temperature sampling circuit, outer temperature sampling circuit, the refrigerator drive circuit links to each other, second interface of light source assembly, the 3rd interface of light source assembly links to each other with the second junction voltage sample circuit, the 5th interface of light source assembly and luminous power sample circuit, the optical wavelength testing circuit links to each other.
The drive current of described light source tube core is from the 4th interface of light source assembly, after connect precision resistance, be sampled at first interface of light source assembly, second interface of light source assembly, the 3rd interface of light source assembly, first interface of light source assembly links to each other with the first junction voltage sample circuit, and second interface of light source assembly, the 3rd interface of light source assembly link to each other with the second junction voltage sample circuit.
The described first junction voltage sample circuit is from first interface of light source assembly, the 9th interface sampled signal of first D/A converter; pass out to the tenth interface of multichannel A/D sampler after amplification, filtering, buffering, protection, first interface of light source assembly links to each other with light source tube core negative output terminal.
The described second junction voltage sample circuit is from second interface of light source assembly, the 3rd interface sampled signal of light source assembly, pass out to the 11 interface of multichannel A/D sampler after amplification, filtering, buffering, second interface of light source assembly, the 3rd interface of light source assembly are connected to the precision resistance two ends of light source tube core.
System for controlling stability of high-stability semiconductor laser light source of the present invention, sample the simultaneously light source stability evaluation index such as temperature, junction voltage, luminous power, optical wavelength of light source, the proportion of each Control Parameter rationally is set at the different application occasion, control precision is higher, range of application is wider, and light source control is more stable.
Description of drawings
Fig. 1 is the structured flowchart of system for controlling stability of high-stability semiconductor laser light source;
Fig. 2 is a light source assembly device connection diagram of the present invention;
Fig. 3 is that light source tube core of the present invention is electrically connected schematic diagram;
Fig. 4 is the first junction voltage sample circuit schematic diagram of the present invention;
Fig. 5 is the second junction voltage sample circuit schematic diagram of the present invention.
Embodiment
Further specify the present invention below in conjunction with accompanying drawing.
As shown in Figure 1, system for controlling stability of high-stability semiconductor laser light source comprises by light source tube core 1, thermistor 2, the light source assembly that thermoelectric refrigerating unit 3 is formed, also comprise the first junction voltage sample circuit 4, the second junction voltage sample circuit 5, luminous power sample circuit 6, optical wavelength testing circuit 7, interior temperature sampling circuit 8, outer temperature sampling circuit 9, multichannel A/D sampler 10, main control chip CPU11, first D/A converter 12, second D/A converter 13, precision current source circuit 14 and refrigerator drive circuit 15, the first junction voltage sample circuit 4, the second junction voltage sample circuit 5, luminous power sample circuit 6, optical wavelength testing circuit 7, interior temperature sampling circuit 8, outer temperature sampling circuit 9 links to each other with light source assembly respectively, the first junction voltage sample circuit 4, the second junction voltage sample circuit 5 is used for the junction voltage of sampled light source capsule core 1, luminous power sample circuit 6, optical wavelength testing circuit 7 is respectively applied for the luminous power and the optical wavelength of sampled light source capsule core 1, interior temperature sampling circuit 8, outer temperature sampling circuit 9 is used for the temperature signal of sampled light source component, the first junction voltage sample circuit 4, the second junction voltage sample circuit 5, luminous power sample circuit 6, optical wavelength testing circuit 7, interior temperature sampling circuit 8, multichannel A/D sampler 10 is sent in the output of outer temperature sampling circuit 9 respectively; Multi-channel a/d converter 10 is sent the sampled signal that receives into main control chip CPU11; Main control chip CPU11 handles the back with sampled signal and divides two-way output: the one tunnel sends into precision current source circuit 14 through second D/A converter 13, and output links to each other with light source assembly, for light source tube core 1 provides drive current; Refrigerator drive circuit 15 is sent in another road output, output links to each other with light source assembly, in order to drive thermoelectric refrigerating unit 3 work, main control chip CPU11 exports one road voltage signal and sends into the first junction voltage sample circuit 4 through first D/A converter 12 in addition, for the first junction voltage sample circuit provides the benchmark voltage signal.
As shown in Figure 2, light source tube core 1, thermistor 2, the internal module annexation of the light source assembly that thermoelectric refrigerating unit 3 is formed is: light source tube core 1 and interior thermistor 2-1 are close to the upper surface of Heat Conduction Material 17, the temperature transfer of light source tube core 1 and interior thermistor 2-1 is passed to Heat Conduction Material 17, the lower surface of Heat Conduction Material 17 is close to the upper surface of thermoelectric refrigerating unit 3, the lower surface of thermoelectric refrigerating unit 3 is close to the inner surface of light source assembly shell 18, thermoelectric refrigerating unit 3 passes to the external world to the heat of Heat Conduction Material 17 by light source assembly shell 18, outer thermistor 2-2 is close to the outer surface of light source assembly shell 18, temperature signal with sampled light source component shell 18, the first interface J1 of light source assembly, the 4th interface J4 of light source assembly, the 6th interface J6 of light source assembly, the 7th interface J7 of light source assembly, the 8th interface J8 of light source assembly respectively with the first junction voltage sample circuit 4, precision current source circuit 14, interior temperature sampling circuit 8, outer temperature sampling circuit 9, refrigerator drive circuit 15 links to each other, the second interface J2 of light source assembly links to each other with the second junction voltage sample circuit 5 with the 3rd interface J3 of light source assembly, the 5th interface J5 and the luminous power sample circuit 6 of light source assembly, optical wavelength testing circuit 7 links to each other.
As shown in Figure 3; the drive current of light source tube core D31 is from the 4th interface J4 of light source assembly; after meet precision resistance R31 and flow into the earth; capacitor C 31 plays the slow function that starts; prevent drive current drastic change; effectively protect the light source tube core; the first interface J1 at light source assembly; the second interface J2 of light source assembly; the 3rd interface J3 place of light source assembly is sampled; the negative terminal voltage of light source tube core is sampled for the first junction voltage sample circuit (4) by the first interface J1 of light source assembly; the second junction voltage sample circuit is by the second interface J2 of light source assembly; the voltage at the 3rd interface J3 sampling precision resistance R31 two ends of light source assembly, the 4th interface J4 of light source assembly links to each other with precision current source circuit 14.
As shown in Figure 4; the first junction voltage sample circuit 4 is from the first interface J1 of light source assembly; the 9th interface J9 place sampled signal of first D/A converter 12; through resistance R 41; capacitor C 41; resistance R 42; send into precision instrument amplifier U41 after the RC filter circuit filtering that capacitor C 42 is formed; amplify after resistance R 43; R44; enter operational amplifier U42 after the T type filter circuit filtering that capacitor C 43 is formed; the follower that resistance R 45 is formed; follower output enters by diode D41; voltage-stabiliser tube D42; resistance R 46; the protective circuit that capacitor C 44 is formed; guarantee that voltage is in normal sample range; output is sent to the tenth interface J10 of multichannel A/D sampler 10, and the first interface J1 of light source assembly links to each other with light source tube core negative output terminal.
As shown in Figure 5, the second junction voltage sample circuit 5 is from the second interface J2 of light source assembly, the 3rd interface J3 place sampled signal of light source assembly, through resistance R 51, capacitor C 51, resistance R 52, send into precision instrument amplifier U51 after the RC filter circuit filtering that capacitor C 52 is formed, amplify after capacitor C 53, C54, enter operational amplifier U52 after the π type filter circuit filtering that L51 forms, the follower that resistance R 55 is formed, the 11 interface J11 of multichannel A/D sampler 10, the second interface J2 of light source assembly are sent in output, the 3rd interface J3 of light source assembly is connected to the precision resistance R31 two ends of light source tube core 1.
This scheme concrete operation process and application scenario are as follows:
Main control chip CPU11 obtains 6 characteristic parameter A1 of light source assembly respectively by the first junction voltage sample circuit 4, the second junction voltage sample circuit 5, luminous power sample circuit 6, optical wavelength testing circuit 7, interior temperature sampling circuit 8,9 these 6 tunnel samplings of outer temperature sampling circuit, A2, A3, A4, A5, A6, with these 6 characteristic parameters is that controlling object obtains output variable U1, U2 and delivers to second D/A converter 13 and refrigerator drive circuit 15 respectively, in order to adjustment tube core drive current and refrigerator drive current, thus the operating state of change light source.Therefore the function that can regard 2 output variables as 6 characteristic parameters:
U1＝f
1(K1·A1+K2·A2+K3·A3+K4·A4+K5·A5+K6·A6)
U2＝f
2(K1·A1+K2·A2+K3·A3+K4·A4+K5·A5+K6·A6)
Wherein, K1, K2, K3, K4, K5, K6 are respectively the coefficient of characteristic parameter A1, A2, A3, A4, A5, A6, represent its shared proportion.
At different requirements and controlling object, the proportion of rationally regulating a parameter can obtain different control effects.
Getting K1=K2=K3=K4=K6=0, is that object is implemented temperature control with interior temperature signal, and the precision current source circuit provides constant current, promptly obtains " constant-current source+digital temperature control " controlling schemes, the LED of low required precision in being applicable to, LD, light sources such as SLD;
Getting K1=K2=K4=K6=0, is that object is implemented temperature control with interior temperature signal, is that object is regulated the tube core drive current with the luminous power, can obtain " automated power controlling schemes ", is applicable to the extra high occasion of optical power stability requirement;
Getting K1=K2=K3=K6=0, is that object is implemented temperature control with interior temperature signal, is that object is implemented FEEDBACK CONTROL with the output wavelength drift, can obtain " wavelength locking scheme ", is applicable to that to output wavelength drift has the occasion of specific (special) requirements;
Get K5 ≠ 0, K6 ≠ 0, inside and outside temperature sampling circuit is used, and can predict variation of temperature in advance, is applicable to the occasion that variations in temperature is violent;
Get K1 ≠ 0, K2 ≠ 0 as controlling object, guarantees the High Accuracy Control of tube core drive current with light source tube core junction voltage, is applicable to the semiconductor laser light resource of high-precision requirement.
The light source shell can exert an influence to light source and optical coupling efficiency because of warm varying stress, the minor variations of precision current also can cause the variation of light source junction voltage simultaneously, therefore in high-precision light source will consider control to junction voltage and light source assembly skin temperature, need this moment six parameters are controlled simultaneously, regulate the shared proportion of each parameter and will obtain ideal control effect.
Claims (5)
1. system for controlling stability of high-stability semiconductor laser light source, it is characterized in that comprising by light source tube core (1), thermistor (2), the light source assembly that thermoelectric refrigerating unit (3) is formed, also comprise the first junction voltage sample circuit (4), the second junction voltage sample circuit (5), luminous power sample circuit (6), optical wavelength testing circuit (7), interior temperature sampling circuit (8), outer temperature sampling circuit (9), multichannel A/D sampler (10), main control chip CPU (11), first D/A converter (12), D/A converter (13), precision current source circuit (14) and refrigerator drive circuit (15), the first junction voltage sample circuit (4), the second junction voltage sample circuit (5), luminous power sample circuit (6), optical wavelength testing circuit (7), interior temperature sampling circuit (8), outer temperature sampling circuit (9) links to each other with light source assembly respectively, the first junction voltage sample circuit (4), the second junction voltage sample circuit (5) is used for the junction voltage of sampled light source capsule core (1), luminous power sample circuit (6), optical wavelength testing circuit (7) is respectively applied for the luminous power and the optical wavelength of sampled light source capsule core (1), interior temperature sampling circuit (8), outer temperature sampling circuit (9) is used for the temperature signal of sampled light source component, the first junction voltage sample circuit (4), the second junction voltage sample circuit (5), luminous power sample circuit (6), optical wavelength testing circuit (7), interior temperature sampling circuit (8), multichannel A/D sampler (10) is sent in the output of outer temperature sampling circuit (9) respectively; Multi-channel a/d converter (10) is sent the sampled signal that receives into main control chip CPU (11); Main control chip CPU (11) handles the back with sampled signal and divides two-way output: the one tunnel sends into precision current source circuit (14) through D/A converter (13), and output links to each other with light source assembly, for light source tube core (1) provides drive current; Refrigerator drive circuit (15) is sent in another road output, output links to each other with light source assembly, in order to drive thermoelectric refrigerating unit (3) work, main control chip CPU (11) output one road voltage signal is sent into the first junction voltage sample circuit (4) through first D/A converter (12) in addition, for the first junction voltage sample circuit provides the benchmark voltage signal.
2. a kind of system for controlling stability of high-stability semiconductor laser light source according to claim 1, its feature also is, described by light source tube core (1), thermistor (2), the internal module annexation of the light source assembly that thermoelectric refrigerating unit (3) is formed is: light source tube core (1) and interior thermistor (2-1) are close to the upper surface of Heat Conduction Material (17), the lower surface of Heat Conduction Material (17) is close to the upper surface of thermoelectric refrigerating unit (3), the lower surface of thermoelectric refrigerating unit (3) is close to the inner surface of light source assembly shell (18), by light source assembly shell (18) and extraneous heat-shift, outer thermistor (2-2) is close to the outer surface of light source assembly shell (18), temperature signal with sampled light source component shell (18), first interface (J1) of light source assembly, the 4th interface (J4) of light source assembly, the 6th interface (J6) of light source assembly, the 7th interface (J7) of light source assembly, the 8th interface (J8) of light source assembly respectively with the first junction voltage sample circuit (4), precision current source circuit (14), interior temperature sampling circuit (8), outer temperature sampling circuit (9), refrigerator drive circuit (15) links to each other, second interface (J2) of light source assembly, the 3rd interface (J3) of light source assembly links to each other with the second junction voltage sample circuit (5), the 5th interface (J5) of light source assembly and luminous power sample circuit (6), optical wavelength testing circuit (7) links to each other.
3. a kind of system for controlling stability of high-stability semiconductor laser light source according to claim 2, it is characterized in that, the drive current of described light source tube core (1) is from the 4th interface (J4) of light source assembly, after connect precision resistance (R31), first interface (J1) at light source assembly, second interface (J2) of light source assembly, the 3rd interface (J3) of light source assembly locates to be sampled circuit sampling, first interface (J1) of light source assembly links to each other with the first junction voltage sample circuit (4), second interface (J2) of light source assembly, the 3rd interface (J3) of light source assembly links to each other with the second junction voltage sample circuit (5).
4. a kind of system for controlling stability of high-stability semiconductor laser light source according to claim 1; its feature also is; the described first junction voltage sample circuit (4) is from first interface (J1) of light source assembly, the 9th interface (J9) sampled signal of first D/A converter (12); pass out to the tenth interface (J10) of multichannel A/D sampler (10) after amplification, filtering, buffering, protection, first interface (J1) of light source assembly links to each other with light source tube core negative output terminal.
5. a kind of system for controlling stability of high-stability semiconductor laser light source according to claim 1, its feature also is, the described second junction voltage sample circuit (5) is from second interface (J2) of light source assembly, the 3rd interface (J3) sampled signal of light source assembly, pass out to the 11 interface (J11) of multichannel A/D sampler (10) after amplification, filtering, buffering, second interface (J2) of light source assembly, the 3rd interface (J3) of light source assembly are connected to precision resistance (R31) two ends of light source tube core (1).
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101877457A (en) * | 2010-06-25 | 2010-11-03 | 武汉电信器件有限公司 | Device for fine adjusting laser wavelength in real time, and method thereof |
| CN102364405A (en) * | 2011-09-29 | 2012-02-29 | 北京航空航天大学 | Device for detecting temperature control property of light source driving circuit |
| CN102801105A (en) * | 2012-08-09 | 2012-11-28 | 无锡沃浦光电传感科技有限公司 | Package of quantum cascade laser with thermoelectric refrigerator |
| CN106370395A (en) * | 2016-11-15 | 2017-02-01 | 江汉大学 | Semiconductor laser light source body optimal temperature detection method |
| CN106410604A (en) * | 2016-10-21 | 2017-02-15 | 北京信息科技大学 | Butterfly packaged SG-DBR (Sampled Grating Distributed Bragg Reflector) tunable semiconductor laser module control method |
| CN106441809A (en) * | 2016-11-15 | 2017-02-22 | 江汉大学 | Semiconductor laser light source body optimal temperature detection device |
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| CN1442933A (en) * | 2003-03-28 | 2003-09-17 | 中国科学院上海光学精密机械研究所 | Method and device of stabilizing high power semiconductor laser output wave length |
| CN2831538Y (en) * | 2005-01-21 | 2006-10-25 | 南昌航空工业学院 | Digital semiconductor laser driving power source |
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- 2009-10-19 CN CN2009101533835A patent/CN101694922B/en not_active Expired - Fee Related
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| CN101877457A (en) * | 2010-06-25 | 2010-11-03 | 武汉电信器件有限公司 | Device for fine adjusting laser wavelength in real time, and method thereof |
| CN102364405A (en) * | 2011-09-29 | 2012-02-29 | 北京航空航天大学 | Device for detecting temperature control property of light source driving circuit |
| CN102801105A (en) * | 2012-08-09 | 2012-11-28 | 无锡沃浦光电传感科技有限公司 | Package of quantum cascade laser with thermoelectric refrigerator |
| CN106410604A (en) * | 2016-10-21 | 2017-02-15 | 北京信息科技大学 | Butterfly packaged SG-DBR (Sampled Grating Distributed Bragg Reflector) tunable semiconductor laser module control method |
| CN106410604B (en) * | 2016-10-21 | 2019-05-07 | 北京信息科技大学 | Butterfly encapsulates SG-DBR semiconductor laser with tunable module control method |
| CN106370395A (en) * | 2016-11-15 | 2017-02-01 | 江汉大学 | Semiconductor laser light source body optimal temperature detection method |
| CN106441809A (en) * | 2016-11-15 | 2017-02-22 | 江汉大学 | Semiconductor laser light source body optimal temperature detection device |
| CN106441809B (en) * | 2016-11-15 | 2019-02-05 | 江汉大学 | Semiconductor laser light source body optimum temperature detection device |
| CN106370395B (en) * | 2016-11-15 | 2019-06-07 | 江汉大学 | Semiconductor laser light source body optimum temperature detection method |
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