CN101556305B - Automatic diagnostic method and equipment of parallel ports of embedded type equipment - Google Patents
Automatic diagnostic method and equipment of parallel ports of embedded type equipment Download PDFInfo
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- CN101556305B CN101556305B CN2008100708753A CN200810070875A CN101556305B CN 101556305 B CN101556305 B CN 101556305B CN 2008100708753 A CN2008100708753 A CN 2008100708753A CN 200810070875 A CN200810070875 A CN 200810070875A CN 101556305 B CN101556305 B CN 101556305B
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Abstract
The invention discloses an automatic diagnostic method of parallel ports of embedded type equipment, comprising the following steps: (1) stitches of parallel ports are tested, i.e. stitches of the parallel ports are mutually connected to form four different loop circuits, input stitches of each loop circuit send signals in turn, and stitches corresponding to the input stitches receive the corresponding signals to judge; (2) testing result of the stitches of each parallel port is displayed, and special testing equipment is designed aiming at the previous three main steps. The invention can automatically test the stitches of each parallel port without manpower, can test various types of parallel ports of the embedded type equipment and can effectively verify the stitches of each parallel port.
Description
[technical field]
The present invention relates to a kind of embedded device parallel port automatic diagnosis method and diagnostic device thereof, belong to the embedded device field tests.
[background technology]
The parallel port method of testing of embedded device use at present, all be by artificial mode, use simple testing tool to test, can't accomplish to carry out automatically, need Attended mode, and the coverage of each interface pin test is lower, only is confined to the sending and receiving signal testing of data, the test result that provides is fairly simple, and is not obvious to the effect that the quality that guarantees the embedded device interface plays.
[summary of the invention]
One of the technical problem to be solved in the present invention is to be to provide a kind of embedded device parallel port automatic diagnosis method, realize the parallel port test operation automatically of embedded device, and each stitch that guarantees each interface can both be tested, and has greatly improved the coverage and the validity of parallel port test.
Above-mentioned technical scheme is achieved in that a kind of embedded device parallel port automatic diagnosis method, comprises the steps:
The test of step 1, parallel port stitch: each stitch of parallel port is interconnected to form four different loops, and the input stitch to each loop sends signal in turn, and judges receiving corresponding signal with the corresponding stitch of this input stitch;
Step 2, show test results: the test result that shows each parallel port.
Wherein, described parallel port is 25 core parallel ports of standard, and four loops that each stitch of parallel port forms in the step 1 are respectively: stitch 1, stitch 2, stitch 6 and stitch 13 form a loop; Stitch 3, stitch 7, stitch 12 and stitch 14 form a loop; Stitch 4, stitch 8, stitch 10 and stitch 16 form a loop; Stitch 5, stitch 9, stitch 11, stitch 15 and stitch 17 form a loop, and stitch 1, stitch 14, stitch 16, stitch 17 be respectively the output stitch, and all the other stitch are the input stitch.
In the above-mentioned steps one each stitch of parallel port being interconnected to form the parallel port that reinitializes after four different loops is EPP (Enhanced Parallel Ports strengthens parallel port) pattern.
Two of the technical problem to be solved in the present invention is to be to provide a kind of parallel port testing apparatus that is used to realize embedded device parallel port automatic diagnosis method.
Above-mentioned technical scheme is achieved in that a kind of parallel port testing apparatus that is used to realize embedded device parallel port automatic diagnosis method, this parallel port testing apparatus is a kind of web member that has with the identical stitch in 25 core parallel ports of standard, the stitch distribution distributes corresponding with the stitch of 25 core parallel ports of standard, its shape also can be similar to the parallel port shape, and the stitch 1 of this parallel port testing apparatus, stitch 2, stitch 6 and stitch 13 connect; Stitch 3, stitch 7, stitch 12 and stitch 14 connect; Stitch 4, stitch 8, stitch 10 and stitch 16 connect; Stitch 5, stitch 9, stitch 11, stitch 15 and stitch 17 connect.
The present invention has following beneficial effect:
1, takes method of the present invention and corresponding testing apparatus can be able to carry out the parallel port test automatically, and need not manually the stitch of each parallel port be tested, greatly improved testing efficiency;
2, the present invention can test the various full signals 25 core parallel ports of embedded device, and the stitch of each parallel port can both effectively verify, and is convenient and practical.
[description of drawings]
In conjunction with the embodiments the utility model is further described with reference to the accompanying drawings.
Fig. 1 is an embedded device of the present invention parallel port automatic diagnosis method operating process synoptic diagram.
Fig. 2 is the stitch connection diagram that the present invention is used to realize the parallel port testing apparatus of embedded device parallel port automatic diagnosis method.
[embodiment]
The parallel port of the tested embedded device of the present invention is 25 core parallel ports of standard, wherein, stitch 1 be gating end (low level is effective), stitch 2 for data 0, stitch 3 for data 1, stitch 4 for data 2, stitch 5 for data 3, stitch 6 for data 4, stitch 7 for data 5, stitch 8 for data 6, stitch 9 for data 7, stitch 10 confirm (low level is effective), stitch 11 for busy, stitch 12 for lack paper, stitch 13 for select, stitch 14 is ground connection for mistake, stitch 16 initialization, stitch 17 for selecting input, stitch 18 to stitch 25 for line feed automatically, stitch 15.
See also shown in Figure 1ly, its embedded device parallel port automatic diagnosis method is divided into following several steps:
Begin test.
Step 1, the test of parallel port stitch: each stitch of parallel port is interconnected to form four different loops, and these four loops are respectively: stitch 1, stitch 2, stitch 6 and stitch 13 form a loop; Stitch 3, stitch 7, stitch 12 and stitch 14 form a loop; Stitch 4, stitch 8, stitch 10 and stitch 16 form a loop; Stitch 5, stitch 9, stitch 11, stitch 15 and stitch 17 form a loop, and stitch 1, stitch 14, stitch 16, stitch 17 be respectively the output stitch, and all the other stitch are the input stitch.
For each stitch of more effective test parallel port, the parallel port is initialized as the EPP pattern, the EPP agreement is that a kind of and spp are compatible and can finish the agreement (traditional parallel port mode is the SPP pattern, can only output data can not import data under this pattern) of bidirectional data transfers
Then,, in turn input stitch (i.e. all the other stitch except that stitch 1, stitch 14, stitch 16, stitch 17) is sent signal, and judge receiving corresponding signal with the corresponding stitch of this input stitch according to the order of connection of each stitch of parallel port; Whether checking signal is correct, if the parallel port of test errors and relevant stitch are warned and demonstrated to incorrect then jingle bell.
Step 2, show test results: after end of test (EOT), will show the test result of each parallel port, and, then can show it is which stitch of which parallel port tests out problem if go wrong in the test process.
Again as shown in Figure 2, above-mentioned embedded device parallel port automatic diagnosis method, wherein step 1 can adopt following parallel port testing apparatus to test, this parallel port testing apparatus is a kind of web member that has with the identical stitch in 25 core parallel ports of standard, the stitch distribution distributes corresponding with the stitch of 25 core parallel ports of standard, its shape also can be similar to the parallel port shape, and the stitch 1 of this parallel port testing apparatus, stitch 2, stitch 6 and stitch 13 connect; Stitch 3, stitch 7, stitch 12 and stitch 14 connect; Stitch 4, stitch 8, stitch 10 and stitch 16 connect; Stitch 5, stitch 9, stitch 11, stitch 15 and stitch 17 connect.(one of this parallel port testing apparatus and parallel port to be measured are male when this parallel port testing apparatus is docked in the mode of male/female with parallel port to be measured, one of be female), will make each stitch of parallel port to be measured be interconnected to form four different loops described in the above-mentioned steps one.
Claims (3)
1. an embedded device parallel port automatic diagnosis method is characterized in that, comprises the steps:
The test of step 1, parallel port stitch: each stitch of parallel port is interconnected to form four different loops, and the input stitch to each loop sends signal in turn, and judges receiving corresponding signal with the corresponding stitch of this input stitch;
Step 2, show test results: the test result that shows each parallel port.
Described parallel port is 25 core parallel ports of standard, and four loops that each stitch of parallel port forms in the step 1 are respectively: stitch 1, stitch 2, stitch 6 and stitch 13 form a loop; Stitch 3, stitch 7, stitch 12 and stitch 14 form a loop; Stitch 4, stitch 8, stitch 10 and stitch 16 form a loop; Stitch 5, stitch 9, stitch 11, stitch 15 and stitch 17 form a loop, and stitch 1, stitch 14, stitch 16, stitch 17 be respectively the output stitch, and all the other stitch are the input stitch.
2. embedded device as claimed in claim 1 parallel port automatic diagnosis method is characterized in that: in the step 1 each stitch of parallel port is interconnected to form four different loops and reinitializes the parallel port afterwards for strengthening parallel port.
3. parallel port testing apparatus that is used to realize embedded device parallel port automatic diagnosis method, it is characterized in that: this parallel port testing apparatus is a kind of web member that has with the identical stitch in 25 core parallel ports of standard, the stitch distribution is corresponding with the stitch distribution of 25 core parallel ports of standard, and the stitch 1 of this parallel port testing apparatus, stitch 2, stitch 6 and stitch 13 connect; Stitch 3, stitch 7, stitch 12 and stitch 14 connect; Stitch 4, stitch 8, stitch 10 and stitch 16 connect; Stitch 5, stitch 9, stitch 11, stitch 15 and stitch 17 connect.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008100708753A CN101556305B (en) | 2008-04-10 | 2008-04-10 | Automatic diagnostic method and equipment of parallel ports of embedded type equipment |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008100708753A CN101556305B (en) | 2008-04-10 | 2008-04-10 | Automatic diagnostic method and equipment of parallel ports of embedded type equipment |
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| Publication Number | Publication Date |
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| CN101556305A CN101556305A (en) | 2009-10-14 |
| CN101556305B true CN101556305B (en) | 2011-07-27 |
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| CN2008100708753A Expired - Fee Related CN101556305B (en) | 2008-04-10 | 2008-04-10 | Automatic diagnostic method and equipment of parallel ports of embedded type equipment |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103760894B (en) * | 2014-01-24 | 2016-05-25 | 杭州正嘉数控设备有限公司 | Digital control system full-automatic test system |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2418519Y (en) * | 2000-03-13 | 2001-02-07 | 神基科技股份有限公司 | Detection device for automatically detecting input and output interface |
| CN2519336Y (en) * | 2002-01-11 | 2002-10-30 | 田明儒 | Computer serial interface test apparatus |
| CN1963778A (en) * | 2005-11-11 | 2007-05-16 | 鸿富锦精密工业（深圳）有限公司 | System and method for testing serial port of mainboard |
| CN200993779Y (en) * | 2006-12-22 | 2007-12-19 | 山东超越数控电子有限公司 | Computer serial single test module |
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2008
- 2008-04-10 CN CN2008100708753A patent/CN101556305B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2418519Y (en) * | 2000-03-13 | 2001-02-07 | 神基科技股份有限公司 | Detection device for automatically detecting input and output interface |
| CN2519336Y (en) * | 2002-01-11 | 2002-10-30 | 田明儒 | Computer serial interface test apparatus |
| CN1963778A (en) * | 2005-11-11 | 2007-05-16 | 鸿富锦精密工业（深圳）有限公司 | System and method for testing serial port of mainboard |
| CN200993779Y (en) * | 2006-12-22 | 2007-12-19 | 山东超越数控电子有限公司 | Computer serial single test module |
Non-Patent Citations (1)
| Title |
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| 陈淼波.用VisualC++.Net2003实现通用工控串行通信.《电脑编程技巧与维护》.2007,48-54. * |
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