CN101556304B - Automatic diagnostic method and equipment of serial ports of embedded type equipment - Google Patents

Automatic diagnostic method and equipment of serial ports of embedded type equipment Download PDF

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Publication number
CN101556304B
CN101556304B CN2008100708749A CN200810070874A CN101556304B CN 101556304 B CN101556304 B CN 101556304B CN 2008100708749 A CN2008100708749 A CN 2008100708749A CN 200810070874 A CN200810070874 A CN 200810070874A CN 101556304 B CN101556304 B CN 101556304B
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Prior art keywords
stitch
serial ports
testing apparatus
embedded device
loop
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CN2008100708749A
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CN101556304A (en
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蔡国凤
张辉
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Fujian Centerm Information Co Ltd
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Fujian Centerm Information Co Ltd
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Abstract

The invention discloses an automatic diagnostic method of serial ports of embedded type equipment, comprising the following steps: (1) complete signal serial port testing, i.e. stitches of the serial ports form three different loop circuits, input stitches of each loop circuit send signals, and other stitches connected with the input stitches receive the corresponding signals to judge; (2) electrified serial port testing of a stitch 1; (3) carrier detect stitch electrification and serial port testing only with signals of a stitch 2, a stitch 3, a stitch 4 and a stitch 7; (4) testing result display, and special testing equipment is designed aiming at the previous three main steps. The invention can automatically test the stitches of each serial port without manpower, also test various typesof serial ports of the embedded type equipment effectively verify the stitches of each serial port.

Description

Embedded device serial ports automatic diagnosis method and diagnostic device thereof
[technical field]
The present invention relates to a kind of embedded device serial ports automatic diagnosis method and diagnostic device thereof, belong to the embedded device field tests.
[background technology]
The serial ports method of testing of embedded device use at present, all be by artificial mode, use simple testing tool to test, can't accomplish to carry out automatically, need Attended mode, and the coverage of each interface pin test is lower, only is confined to the sending and receiving signal testing of data, the test result that provides is fairly simple, and is not obvious to the effect that the quality that guarantees the embedded device interface plays.
[summary of the invention]
One of the technical problem to be solved in the present invention is to be to provide a kind of embedded device serial ports automatic diagnosis method, realize the serial ports test operation automatically of embedded device, and each stitch that guarantees each interface can both be tested, and has greatly improved the coverage and the validity of serial ports test.
Above-mentioned technical scheme is achieved in that a kind of embedded device serial ports automatic diagnosis method, and described serial ports is 9 core serial ports of standard, comprises the steps:
Step 1, full signal serial ports test: be that each stitch of serial ports is formed three different loops, send signal, and receive corresponding signal at other stitch that is connected with this input stitch and judge from the input stitch of each loop;
The serial ports test of step 2, stitch 1 power taking;
Step 3, carrier wave detect the stitch power taking and have only the serial ports test of stitch 2, stitch 3, stitch 4, stitch 7 signals;
Step 4, show test results.
Wherein, three loops that each stitch of serial ports forms in the described step 1 are respectively: stitch 3 and stitch 2 are connected to form a loop; Stitch 4, stitch 1, stitch 6 and stitch 9 are connected to form a loop; Stitch 7 and stitch 8 are connected to form a loop.
Described step 2 is with stitch 1 power taking, and stitch 1, stitch 2 and stitch 3 are connected to form a loop; Stitch 4, stitch 6 and stitch 9 are connected to form a loop; Stitch 7 and stitch 8 are connected to form a loop; Take with door by diode again stitch 1 is judged; Send signal and receive corresponding signal and judge from stitch 3,7 three inputs of stitch 4 and stitch stitch at the stitch that is connected with this input stitch.And be connected a diode between stitch 2 and stitch 3, the anode of this diode is connected with stitch 2, and negative electrode is connected with stitch 3.
Described step 3 is with stitch 1 power taking, simultaneously stitch 3, stitch 4 and stitch 7 is formed three loops with stitch 2 respectively, sends signal from stitch 3, stitch 4 and stitch 7 respectively, obtains signal by stitch 2 again and judges.Be connected a diode respectively in three loops of described stitch 3, stitch 4 and stitch 7 and stitch 2 formation, the anode of three diodes all links to each other with stitch 2, and negative electrode then is connected with stitch 3, stitch 4 and stitch 7 respectively.
Two of the technical problem to be solved in the present invention is to be to provide a kind of serial ports testing apparatus that is used to realize embedded device serial ports automatic diagnosis method,
Above-mentioned technical scheme is achieved in that a kind of serial ports testing apparatus that is used to realize embedded device serial ports automatic diagnosis method, described serial ports is 9 core serial ports of standard, this serial ports testing apparatus is a kind of web member that has with the identical stitch of serial ports, stitch distributes corresponding with the stitch distribution of serial ports, and the stitch 3 of this serial ports testing apparatus is connected with stitch 2; Stitch 4, stitch 1, stitch 6 and stitch 9 are connected; Stitch 7 is connected with stitch 8; Stitch 5 ground connection.
Three of the technical problem to be solved in the present invention is to be to provide another kind to be used to realize the serial ports testing apparatus of embedded device serial ports automatic diagnosis method,
Above-mentioned technical scheme is achieved in that a kind of serial ports testing apparatus that is used to realize embedded device serial ports automatic diagnosis method, described serial ports is 9 core serial ports of standard, this serial ports testing apparatus is a kind of web member that has with the identical stitch of serial ports, stitch distributes and distributes corresponding with the stitch of serial ports, and stitch 1 power taking of this serial ports testing apparatus, and be connected with stitch 2 with stitch 3; Stitch 4, stitch 6 and stitch 9 are connected; Stitch 7 is connected with stitch 8; Stitch 5 ground connection.
Four of the technical problem to be solved in the present invention is to be to provide another to be used to realize the serial ports testing apparatus of embedded device serial ports automatic diagnosis method,
Above-mentioned technical scheme is achieved in that a kind of serial ports testing apparatus that is used to realize embedded device serial ports automatic diagnosis method, described serial ports is 9 core serial ports of standard, this serial ports testing apparatus is a kind of web member that has with the identical stitch of serial ports, stitch distributes and distributes corresponding with the stitch of serial ports, and stitch 1 power taking of this serial ports testing apparatus, be connected with stitch 2 again after simultaneously stitch 3, stitch 4 and stitch 7 being connected a diode respectively, the anode of described three diodes all links to each other with stitch 2, and negative electrode then is connected with stitch 3, stitch 4 and stitch 7 respectively.
The present invention has following beneficial effect:
1, takes method of the present invention and corresponding testing apparatus can be able to carry out the serial ports test automatically, and need not manually the stitch of each serial ports be tested, greatly improved testing efficiency;
2, the present invention can test the various 9 core serial ports of embedded device, and the stitch of each serial ports can both effectively verify, and is convenient and practical.
[description of drawings]
In conjunction with the embodiments the utility model is further described with reference to the accompanying drawings.
Fig. 1 is an embedded device serial ports automatic diagnosis method operating process synoptic diagram of the present invention.
Fig. 2 is the stitch connection diagram that the present invention is used to realize the serial ports testing apparatus of embedded device serial ports automatic diagnosis method for first kind.
Fig. 3 is the stitch connection diagram that the present invention is used to realize the serial ports testing apparatus of embedded device serial ports automatic diagnosis method for second kind.
Fig. 4 be the present invention the third be used to realize the stitch connection diagram of the serial ports testing apparatus of embedded device serial ports automatic diagnosis method.
[embodiment]
The serial ports of the tested embedded device of the present invention is 9 core serial ports of standard, and stitch 1 is RI (jingle bell indicator) for RTS (request sends), stitch 8 for CTS (allowing to send), stitch 9 for DSR (communication apparatus is ready to), stitch 7 for GND (ground signalling), stitch 6 for DTR (DTR), stitch 5 for TXD (transmission data), stitch 4 for RXD (reception data), stitch 3 for CD (carrier wave detection), stitch 2.
See also shown in Figure 1ly, its embedded device serial ports automatic diagnosis method is divided into following several steps:
Begin test.
Step 1, the test of full signal serial ports: be that each stitch of serial ports is formed three different loops, wherein, three loops that each stitch of serial ports forms in this step are respectively: stitch 3 and stitch 2 are connected to form a loop; Stitch 4, stitch 1, stitch 6 and stitch 9 are connected to form a loop; Stitch 7 and stitch 8 are connected to form a loop; Because stitch 5 is the GND ground signalling, therefore do not need this is tested.
According to the order of connection of above-mentioned each stitch of serial ports, comprise that from the input stitch stitch 3, stitch 4 and stitch 7 send signal then, and receive corresponding signal at other stitch that is connected with this input stitch and judge.At this moment, if being attached thereto the stitch that connects has received corresponding signal, prove that then the stitch of this connection is normal; Otherwise then stitch has problem, and serial ports will send jingle bell and warn this moment, and show the stitch of makeing mistakes on screen.
The serial ports test of step 2, stitch 1 power taking: described step 2 is with stitch 1 power taking, takes with door by diode stitch 1 is judged; Stitch 1, stitch 2 and stitch 3 are connected to form a loop, for the state of stitch 2 is tested better, and are connected a diode between stitch 2 and stitch 3, and the anode of this diode is connected with stitch 2, and negative electrode is connected with stitch 3; Stitch 4, stitch 6 and stitch 9 are connected to form a loop; Stitch 7 and stitch 8 are connected to form a loop.
According to the order of connection of above-mentioned each stitch of serial ports, send signal and receive corresponding signal and judge then at the stitch that is connected with this input stitch from stitch 3,7 three inputs of stitch 4 and stitch stitch.At this moment, if being attached thereto the stitch that connects has received corresponding signal, prove that then the stitch of this connection is normal; Otherwise then stitch has problem, and serial ports will send jingle bell and warn this moment.
Step 3, stitch 1 power taking and have only the serial ports test of stitch 2, stitch 3, stitch 4, stitch 7 signals: be with stitch 1 power taking, simultaneously stitch 3, stitch 4 and stitch 7 are formed three loops with stitch 2 respectively, connect a diode in three loops respectively, the anode of three diodes all links to each other with stitch 2, and negative electrode then is connected with stitch 3, stitch 4 and stitch 7 respectively.
According to the order of connection of above-mentioned each stitch of serial ports, send signal from stitch 3, stitch 4 and stitch 7 respectively then, can obtain signal by stitch 2 and judge.When stitch 3 and stitch 2 forms when being connected, the signal that stitch 3 sends will be obtained by stitch 2; When stitch 4 and stitch 2 forms when being connected, the signal that stitch 4 sends will be obtained by stitch 2; When stitch 7 and stitch 2 forms when being connected, the signal that stitch 7 sends will be obtained by stitch 2; When the signal that obtains and the signal that sends stitch test errors then simultaneously not, serial ports will send jingle bell and warn this moment, and show the stitch of makeing mistakes on screen.
Step 4, show test results: after end of test (EOT), will show the test result of each serial ports, and, then can show it is which stitch of which serial ports tests out problem if go wrong in the test process.
Again as shown in Figure 2, above-mentioned embedded device serial ports automatic diagnosis method, wherein step 1 can adopt following first serial testing apparatus to test, this serial ports testing apparatus is a kind of web member that has with the identical stitch of serial ports, stitch distributes and distributes corresponding with the stitch of serial ports, its shape also can be similar to the serial ports shape, and the stitch 3 of this serial ports testing apparatus is connected with stitch 2; Stitch 4, stitch 1, stitch 6 and stitch 9 are connected; Stitch 7 is connected with stitch 8; Stitch 5 ground connection.(one of this serial ports testing apparatus and serial ports to be measured are male when serial ports to be measured docks in the mode of male/female when this serial ports testing apparatus, one of be female, to make each stitch of serial ports to be measured be interconnected to form three different loops described in the above-mentioned steps one down together).
Again as shown in Figure 3, above-mentioned embedded device serial ports automatic diagnosis method, wherein step 2 can adopt following second serial testing apparatus to test, this serial ports testing apparatus is a kind of web member that has with the identical stitch of serial ports, stitch distributes and distributes corresponding with the stitch of serial ports, its shape also can be similar to the serial ports shape, and stitch 1 power taking of this serial ports testing apparatus, and be connected with stitch 2 with stitch 3; Stitch 4, stitch 6 and stitch 9 are connected; Stitch 7 is connected with stitch 8; Stitch 5 ground connection.When this serial ports testing apparatus when serial ports to be measured docks in the mode of male/female, will make each stitch of serial ports to be measured be interconnected to form required connected mode in the above-mentioned steps two.
Again as shown in Figure 4, above-mentioned embedded device serial ports automatic diagnosis method, wherein step 3 can adopt the 3rd following serial ports testing apparatus to test, this serial ports testing apparatus is a kind of web member that has with the identical stitch of serial ports, stitch distributes and distributes corresponding with the stitch of serial ports, its shape also can be similar to the serial ports shape, and stitch 1 power taking of this serial ports testing apparatus, simultaneously with stitch 3, stitch 4 and stitch 7 are connected with stitch 2 after connecting a diode respectively again, the anode of described three diodes all links to each other with stitch 2, negative electrode then respectively with stitch 3, stitch 4 and stitch 7 connect.

Claims (9)

1. embedded device serial ports automatic diagnosis method, described serial ports is 9 core serial ports of standard, it is characterized in that, comprises the steps:
Step 1, full signal serial ports test: be that each stitch of serial ports is formed three different loops, send signal, and receive corresponding signal at other stitch that is connected with this input stitch and judge from the input stitch of each loop;
The serial ports test of step 2, stitch 1 power taking: be with stitch 1 power taking, by diode take with the door stitch 1 state is judged, and with three different loops of other stitch formation, send signal from the input stitch of each loop, and receive corresponding signal at other stitch that is connected with this input stitch and judge;
Step 3, stitch 1 power taking and have only the serial ports test of stitch 2, stitch 3, stitch 4, stitch 7 signals: be with stitch 1 power taking, and with stitch 2, stitch 3, stitch 4, three different loops of stitch 7 formation, send signal from the input stitch of each loop, and receive corresponding signal at other stitch that is connected with this input stitch and judge;
Step 4, show test results.
2. embedded device serial ports automatic diagnosis method as claimed in claim 1 is characterized in that: three loops in the step 1 are respectively: stitch 3 and stitch 2 are connected to form a loop; Stitch 4, stitch 1, stitch 6 and stitch 9 are connected to form a loop; Stitch 7 and stitch 8 are connected to form a loop, and stitch 3, stitch 4 and stitch 7 are respectively the input stitch of three loops.
3. embedded device serial ports automatic diagnosis method as claimed in claim 1 is characterized in that: three loops in the step 2 are respectively: stitch 1, stitch 2 and stitch 3 are connected to form a loop; Stitch 4, stitch 6 and stitch 9 are connected to form a loop; Stitch 7 and stitch 8 are connected to form a loop; And stitch 3, stitch 4 and stitch 7 are respectively the input stitch of three loops.
4. embedded device serial ports automatic diagnosis method as claimed in claim 3 is characterized in that: be connected a diode in the step 2 between stitch 2 and stitch 3, the anode of this diode is connected with stitch 2, and negative electrode is connected with stitch 3.
5. embedded device serial ports automatic diagnosis method as claimed in claim 1, it is characterized in that: step 3 further specifically is with stitch 1 power taking, simultaneously stitch 3, stitch 4 and stitch 7 are formed three loops with stitch 2 respectively, send signal from stitch 3, stitch 4 and stitch 7 respectively, obtain signal by stitch 2 again and judge.
6. embedded device serial ports automatic diagnosis method as claimed in claim 5, it is characterized in that: be connected a diode respectively in three loops of described stitch 3, stitch 4 and stitch 7 and stitch 2 formation, the anode of three diodes all links to each other with stitch 2, and negative electrode then is connected with stitch 3, stitch 4 and stitch 7 respectively.
7. serial ports testing apparatus that is used to realize embedded device serial ports automatic diagnosis method, described serial ports is 9 core serial ports of standard, it is characterized in that: this serial ports testing apparatus is a kind of web member that has with the identical stitch of serial ports, stitch distributes corresponding with the stitch distribution of serial ports, and the stitch 3 of this serial ports testing apparatus is connected with stitch 2; Stitch 4, stitch 1, stitch 6 and stitch 9 are connected; Stitch 7 is connected with stitch 8; Stitch 5 ground connection.
8. serial ports testing apparatus that is used to realize embedded device serial ports automatic diagnosis method, described serial ports is 9 core serial ports of standard, it is characterized in that: this serial ports testing apparatus is a kind of web member that has with the identical stitch of serial ports, stitch distributes and distributes corresponding with the stitch of serial ports, and stitch 1 power taking of this serial ports testing apparatus, and be connected with stitch 2 with stitch 3; Stitch 4, stitch 6 and stitch 9 are connected; Stitch 7 is connected with stitch 8; Stitch 5 ground connection.
9. serial ports testing apparatus that is used to realize embedded device serial ports automatic diagnosis method, described serial ports is 9 core serial ports of standard, it is characterized in that: this serial ports testing apparatus is a kind of web member that has with the identical stitch of serial ports, stitch distributes and distributes corresponding with the stitch of serial ports, and stitch 1 power taking of this serial ports testing apparatus, be connected with stitch 2 again after simultaneously stitch 3, stitch 4 and stitch 7 being connected a diode respectively, the anode of described three diodes all links to each other with stitch 2, and negative electrode then is connected with stitch 3, stitch 4 and stitch 7 respectively.
CN2008100708749A 2008-04-10 2008-04-10 Automatic diagnostic method and equipment of serial ports of embedded type equipment Expired - Fee Related CN101556304B (en)

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CN103630790B (en) * 2012-08-24 2016-09-07 神讯电脑(昆山)有限公司 COM port loop test fixture
CN103777087B (en) * 2012-10-24 2018-01-30 研祥智能科技股份有限公司 serial port test device
CN104375053A (en) * 2014-11-24 2015-02-25 中国科学院苏州生物医学工程技术研究所 Pin wiring detection device
CN104750588B (en) * 2015-03-04 2018-08-31 广东好帮手电子科技股份有限公司 A kind of method for testing pressure based on serial communication
CN105975368A (en) * 2016-05-23 2016-09-28 浪潮电子信息产业股份有限公司 DB9 serial port automatic testing loop jig and testing method thereof
CN108957213B (en) * 2018-08-17 2024-03-15 北京中航瑞博航空电子技术有限公司 Cable testing method and testing equipment
CN111880976B (en) * 2020-07-14 2024-03-15 深圳市同泰怡信息技术有限公司 RS232 communication serial port testing method and device

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