CN101551560A - Liquid crystal display unit with broken wire restoring function and restoring method thereof - Google Patents
Liquid crystal display unit with broken wire restoring function and restoring method thereof Download PDFInfo
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- CN101551560A CN101551560A CNA2008100356608A CN200810035660A CN101551560A CN 101551560 A CN101551560 A CN 101551560A CN A2008100356608 A CNA2008100356608 A CN A2008100356608A CN 200810035660 A CN200810035660 A CN 200810035660A CN 101551560 A CN101551560 A CN 101551560A
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- metal layer
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Abstract
The invention discloses a liquid crystal display unit with a broken wire restoring function and a restoring method thereof. The liquid crystal display unit comprises an array base plate, a plurality of display cells, a plurality of thin film transistors and a plurality of source electrode metal layer figures. The array base plate is provided with a plurality of data wires, grid electrode scan wires and public electrode wires; each display cell is encircled by two data wires, a grid electrode scan wire and a public electrode wire; each thin film transistor corresponds to a display cell, wherein the thin film transistor is provided with a source electrode; and each source electrode metal layer figure is connected with a source electrode, wherein both ends of the source electrode metal layer figure respectively have an overlapping area with a grid electrode scan wire. The restoring method comprises the following steps: respectively performing laser beam dotting processing at the overlapping areas of both ends of each source electrode metal layer figure and the grid electrode scan wire, and leading the electric potential of the grid electrode scan wire at one side of a broken wire position of the grid electrode scan wire onto the grid electrode scan wire at the other side of the broken wire position, so as to restore the grid electrode scan wire with broken wires.
Description
Technical field
The present invention relates to a kind of liquid crystal indicator, particularly a kind of liquid crystal indicator and restorative procedure with broken wire restoring function.
Background technology
Characteristics such as Thin Film Transistor-LCD (TFT-LCD) is frivolous with it, energy-saving and environmental protection become the main flow of current kinds of displays part development gradually.Fig. 1 has provided a display unit of TN of the prior art (TwistNematic, twisted-nematic) type liquid crystal indicator, and each display unit is surrounded by two data lines, a controlling grid scan line and a public electrode wire.Wherein, each display unit is also to there being a thin film transistor (TFT), this transistor has one source pole 103, and this source electrode 103 is guided to pixel electrode area a source metal layer pattern 101, and this source metal layer pattern 101 has an overlapping region on right side and controlling grid scan line 102.
TFT-LCD array base palte one side is thick with many data lines and controlling grid scan line, and the broken string of each bar data line or controlling grid scan line can make that all line defect appears in the TFT-LCD panel, thereby influences the qualification rate of product.Generally, controlling grid scan line is thicker than data line, and the radical of controlling grid scan line also lacks than the radical of data line.So, though up to the present proposed the method for designing that many broken strings are repaired, but mainly all be reparation, the restorative procedure of broken data wire all is provided as U.S. Pat 6111621, US6014191, US5969779 carrying out after breaking at data line.
Because controlling grid scan line is generally thick than data line, so it is just lower that the probability of broken string takes place on controlling grid scan line.When but the controlling grid scan line broken string takes place, will on liquid crystal indicator, see a line defect.
There is following problem in existing broken string recovery technique:
1, is used for technology that controlling grid scan line broken string repairs at present seldom.
If 2 methods that will be used for the broken data wire reparation are applied to the reparation of controlling grid scan line, then following points deficiency:
1., the broken string number that can repair is limited;
2., the repair structure that is used for repairing broken string need be at the outside of array base palte design driven amplifying circuit, the cost of designing and developing of increase.
3., occurring two breakpoints on the same controlling grid scan line just can not repair.
Summary of the invention
The purpose of this invention is to provide a kind of liquid crystal indicator and corresponding restorative procedure, with the cost of realizing that hundred-percent broken string reparation and reduction are designed and developed with controlling grid scan line broken wire restoring function.
The objective of the invention is to be achieved through the following technical solutions: a kind of liquid crystal indicator with broken wire restoring function, its characteristics are that it comprises: array basal plate, it has many data lines, controlling grid scan line and public electrode wire; A plurality of display units, each display unit is surrounded by two data lines, a controlling grid scan line and a public electrode wire; A plurality of thin film transistor (TFT)s, the corresponding display unit of each thin film transistor (TFT), wherein this thin film transistor (TFT) has one source pole; A plurality of source electrode metal layer image, each source metal layer pattern is connected with one source pole, and wherein there is an overlapping region at the two ends of this source metal layer pattern with a controlling grid scan line respectively.
Another technical scheme of the present invention is: a kind of method of utilizing above-mentioned liquid crystal indicator reparation broken string, when broken string takes place in a controlling grid scan line, its characteristics are, implement laser beam in the overlapping region of source metal layer pattern two ends and this controlling grid scan line respectively and get processing ready, the controlling grid scan line current potential of controlling grid scan line broken string position one side is directed to by the source metal layer pattern on the controlling grid scan line of broken string position opposite side, to repair the controlling grid scan line that broken string takes place.
Wherein, the center section of this source metal layer pattern is parallel to controlling grid scan line.
Wherein, this controlling grid scan line is drawn one scan line metal layer image, and this sweep trace metal layer image and this source metal layer pattern constitute an overlapping region away from an end of source electrode.
Wherein, this source metal layer pattern extends until forming an overlapping region to this controlling grid scan line away from an end of source electrode.
Wherein, this source metal layer pattern is the square shape away from an end of source electrode.
Wherein, this source metal layer pattern is the elongate strip shape away from an end of source electrode.
Wherein, one scan line metal layer image is respectively drawn at these source metal layer pattern two ends of this gated sweep alignment respectively, and these two sweep trace metal layer image constitute two overlapping regions with the two ends of this source metal layer pattern respectively.
Positive progressive effect of the present invention is:
1, utilizes broken string provided by the invention to repair design proposal, can carry out the absolutely reparation of broken string, do not have the restriction that to repair several broken strings.
2, adopt broken string provided by the invention to repair design proposal, can both repair one by one, do not exist and occur two restrictions that breakpoint just can't be repaired on the same sweep trace even if a plurality of breakpoints on same controlling grid scan line, occur.
3, adopt broken string provided by the invention to repair design proposal, the length of repairing line is not very long, and the impedance of bringing into after the reparation neither be very big.Need not reduce the cost of designing and developing at the outside of array base palte design driven amplifying circuit.
Description of drawings
Fig. 1 is the display unit of a TN type liquid crystal indicator.
Fig. 2 is first embodiment of broken string reparation design of the present invention.
Fig. 3 a is second embodiment (square shape) of broken string reparation design of the present invention.
Fig. 3 b is second embodiment (strip) of broken string reparation design of the present invention.
Fig. 4 is the 3rd embodiment of broken string reparation design of the present invention.
Fig. 5 is the 4th embodiment of broken string reparation design of the present invention.
Embodiment
Provide preferred embodiment of the present invention below in conjunction with accompanying drawing, to describe technical scheme of the present invention in detail.
Embodiment 1
Liquid crystal indicator of the present invention comprises array basal plate, and it has many data lines, controlling grid scan line and public electrode wire; A plurality of display units, each display unit is surrounded by two data lines, a controlling grid scan line and a public electrode wire; A plurality of thin film transistor (TFT)s, the corresponding display unit of each thin film transistor (TFT), wherein this thin film transistor (TFT) has one source pole; A plurality of source electrode metal layer image, each source metal layer pattern is connected with one source pole, and wherein there is an overlapping region at the two ends of this source metal layer pattern with a controlling grid scan line respectively.Figure 2 shows that a display unit of liquid crystal indicator of the present invention, this display unit is surrounded by two data lines 203, a controlling grid scan line 202 and a public electrode wire 205.Also to a thin film transistor (TFT) should be arranged, wherein this thin film transistor (TFT) has one source pole 206 to this display unit.This source electrode 206 is guided to pixel electrode area a source metal layer pattern 201, and the center section of source metal layer pattern 201 is parallel to controlling grid scan line 202, and this source metal layer pattern 201 has an overlapping region on right side and controlling grid scan line 202.
It is exactly to utilize this source metal layer pattern 201 to repair the controlling grid scan line 202 that broken string takes place that the sweep trace broken string of introduction of the present invention is repaired thought.As shown in Figure 2, in source metal layer pattern 201 of the left side of source metal layer pattern 201 design and controlling grid scan line 202 overlapping areas.At this time will introduce a sweep trace metal layer image 204 to source metal layer pattern 201 right-hand members in the zone of left data line 203 and sweep trace 202 intersections.This sweep trace metal layer image 204 has an overlapping region at the right-hand member and the source metal layer pattern 201 of source metal layer pattern 201.Compared to Figure 1, the display cell structure with controlling grid scan line broken wire restoring function of Fig. 2 introduction is exactly this overlapping region that has had more between source metal layer pattern 201 and the controlling grid scan line metal layer image 204.
The sweep trace broken string of introduction of the present invention is repaired and is utilized the source metal layer pattern to repair.As shown in Figure 2, if breakpoint occurred on sweep trace, it is as follows to repair operation steps so accordingly:
1, in the overlapping region of source metal layer pattern 201 left sides and controlling grid scan line 202, get through source metal layer pattern 201 and controlling grid scan line 202 with laser beam, the current potential of controlling grid scan line 202 is imported in the source metal layer pattern 201.
2, in the overlapping region of source metal layer pattern 201 right side transistor portions and controlling grid scan line 202, get through source metal layer pattern 201 and controlling grid scan line 202 with laser beam, the controlling grid scan line current potential on the source metal 201 is imported in the controlling grid scan line 202 on right side.
As mentioned above, getting processing ready in the overlapping region of source metal layer pattern 201 left and right sides and controlling grid scan line 202 enforcement laser beam respectively just can be directed to the controlling grid scan line current potential in controlling grid scan line breakpoint left side on the controlling grid scan line 202 on breakpoint right side by source metal layer pattern 201.Thereby realized the repairing effect of controlling grid scan line breakpoint.
For the distribution of each layer film in the described display unit of clear and definite Fig. 2, introduce the manufacture method of this controlling grid scan line broken string repair structure provided by the invention below: a glass substrate in LCD device array substrates one side; One is formed at the first metal layer on the glass substrate, and the controlling grid scan line 202, the public electrode wire 205 that form with this first metal layer, the patterns such as controlling grid scan line metal layer image 204 of guiding to source metal layer pattern 201 left ends; One is formed at the insulating film layer on the first metal layer; One is formed at second metal level on the insulating film layer, and the data line 203, the transistor source 206 that form with this second metal level and drain 207, be parallel to the patterns such as source metal 201 of sweep trace 202; One is formed at the passivation layer on second metal level; One is formed at the via hole on the passivation layer; One is formed at the conductive film on the via hole, and the patterns such as pixel electrode that form with this layer conductive film.
With repair structure shown in Figure 2 is example, specifies the design of this type repair structure and repairs operation.In Fig. 2, transistorized channel laterally width is 20um, and longitudinal length is 6um, and drain electrode 207 is 4um with the longitudinal overlap spacing of controlling grid scan line 202.The distance that transistor source 206 leaves right side data line 203 is 6um, and the distance that source metal layer pattern 201 left ends leave left data line 203 also is 6um.The width of source metal layer pattern 201 is 6um.The size of source metal layer pattern 201 left end squares is 6um*6um.Cover one deck sweep trace metal layer image 204 below aspect the left end of source metal 201, outstanding each 2um of source metal left end square all around comprehensively.
According to the various sizes of introducing above, the overlapping area that can calculate source metal layer pattern 201 left ends and sweep trace 202 is 36um
2, and source metal 201 left ends are 80um in the overlapping area of source electrode 206 and sweep trace 202
2If the breakpoint of sweep trace, so corresponding to repair operation be exactly to get processing ready in the overlapping region of source metal layer pattern 201 left and right sides and controlling grid scan line 202 enforcement laser beam respectively between source metal layer pattern two ends, 201 left and right sides and sweep trace 202 overlapping regions.The controlling grid scan line current potential in controlling grid scan line breakpoint left side is directed on the controlling grid scan line 202 on breakpoint right side by source metal layer pattern 201.Thereby realized the repairing effect of controlling grid scan line breakpoint.
Except foregoing broken string repair structure, according to the difference of original display cell structure, and the difference of repair ability, can also carry out following several different structural design according to actual needs on the described architecture basics of Fig. 2 in front.
As shown in Figure 3, do not draw the sweep trace metal layer image especially at left data line and controlling grid scan line intersection region.The left end of source metal layer pattern 301 extends to controlling grid scan line 302, and is covered on the controlling grid scan line 302.The shape of overlapping region designs as required, and source metal layer pattern 301 left ends of overlapping region are the square shape shown in Fig. 3 a, and source metal layer pattern 301 left ends of overlapping region shown in Fig. 3 b are the elongate strip shape.
When breakpoint as shown in Figure 3 occurring on sweep trace, corresponding reparation operation is exactly to implement laser beam in the overlapping region of source metal layer pattern 301 left and right sides and controlling grid scan line 302 respectively to get processing ready.The controlling grid scan line current potential in controlling grid scan line breakpoint left side is directed on the controlling grid scan line 302 on breakpoint right side by source metal layer pattern 301.Thereby realized the repairing effect of controlling grid scan line breakpoint.
Embodiment 3
As shown in Figure 4, on the structure basis of invariable that keeps Fig. 2, from the controlling grid scan line 402 that is positioned at right side data line 403 and controlling grid scan line 402 intersection regions, draw a sweep trace metal layer image 404 again to source metal layer pattern 401 right-hand members.This strip metal layer 404 and source metal layer pattern 401 right-hand members have an overlapping region.
When breakpoint as shown in Figure 4 occurring on sweep trace, corresponding reparation operation is exactly to implement laser beam in the overlapping region of source metal layer pattern 401 left and right sides and controlling grid scan line 402 respectively to get processing ready.The controlling grid scan line current potential in controlling grid scan line breakpoint left side is directed on the controlling grid scan line 402 on breakpoint right side by source metal layer pattern 401.Thereby realized the repairing effect of controlling grid scan line breakpoint.
Embodiment 4
On the basis that does not break away from controlling grid scan line reparation thought provided by the invention, in different display mode such as IPS (In PlaneSwitching), VA (Vertical Alignment), perhaps in transistor arrangements such as non-symmetric transistor, longitudinal channel transistor, also can correspondingly carry out the reparation design of controlling grid scan line broken string.The non-symmetric transistor that Fig. 5 has adopted a raceway groove vertically to place, except the variation of transistor arrangement, other structures are consistent with first embodiment shown in Figure 2.
When breakpoint as shown in Figure 5 occurring on sweep trace, corresponding reparation operation is exactly to implement laser beam in the overlapping region of source metal layer pattern 501 left and right sides and controlling grid scan line 502 respectively to get processing ready.The controlling grid scan line current potential in controlling grid scan line breakpoint left side is directed on the controlling grid scan line 502 on breakpoint right side by source metal layer pattern 501.Thereby realized the repairing effect of controlling grid scan line breakpoint.
In sum, technique effect of the present invention is: can carry out the absolutely reparation of broken string, not have the restriction that can only repair several broken strings; Can both repair one by one even if a plurality of breakpoints on same controlling grid scan line, occur, not exist and occur two restrictions that breakpoint just can't be repaired on the same sweep trace; The length of repairing line is not very long, and the impedance of bringing into after the reparation neither be very big, need not reduce the cost of designing and developing at the outside of array base palte design driven amplifying circuit.
Though more than described the specific embodiment of the present invention, it will be understood by those of skill in the art that these only illustrate, under the prerequisite that does not deviate from principle of the present invention and essence, can make numerous variations or modification to these embodiments.Therefore, protection scope of the present invention is limited by appended claims.
Claims (8)
1, a kind of liquid crystal indicator with broken wire restoring function is characterized in that it comprises:
Array basal plate, it has many data lines, controlling grid scan line and public electrode wire;
A plurality of display units, each display unit is surrounded by two data lines, a controlling grid scan line and a public electrode wire;
A plurality of thin film transistor (TFT)s, the corresponding display unit of each thin film transistor (TFT), wherein this thin film transistor (TFT) has one source pole;
A plurality of source electrode metal layer image, each source metal layer pattern is connected with one source pole, and wherein there is an overlapping region at the two ends of this source metal layer pattern with a controlling grid scan line respectively.
2, liquid crystal indicator as claimed in claim 1 is characterized in that, the center section of this source metal layer pattern is parallel to controlling grid scan line.
3, liquid crystal indicator as claimed in claim 2 is characterized in that, this controlling grid scan line is drawn one scan line metal layer image, and this sweep trace metal layer image and this source metal layer pattern constitute an overlapping region away from an end of source electrode.
4, liquid crystal indicator as claimed in claim 2 is characterized in that, this source metal layer pattern extends until forming an overlapping region to this controlling grid scan line away from an end of source electrode.
5, liquid crystal indicator as claimed in claim 4 is characterized in that, this source metal layer pattern is the square shape away from an end of source electrode.
6, liquid crystal indicator as claimed in claim 4 is characterized in that, this source metal layer pattern is the elongate strip shape away from an end of source electrode.
7, liquid crystal indicator as claimed in claim 2, it is characterized in that, one scan line metal layer image is respectively drawn at these source metal layer pattern two ends of this gated sweep alignment respectively, and these two sweep trace metal layer image constitute two overlapping regions with the two ends of this source metal layer pattern respectively.
8, a kind of method of utilizing the described liquid crystal indicator reparation broken string of claim 1, when broken string takes place in a controlling grid scan line, it is characterized in that, implement laser beam in the overlapping region of source metal layer pattern two ends and this controlling grid scan line respectively and get processing ready, the controlling grid scan line current potential of controlling grid scan line broken string position one side is directed to by the source metal layer pattern on the controlling grid scan line of broken string position opposite side, to repair the controlling grid scan line that broken string takes place.
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| Application Number | Priority Date | Filing Date | Title |
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| CNA2008100356608A CN101551560A (en) | 2008-04-03 | 2008-04-03 | Liquid crystal display unit with broken wire restoring function and restoring method thereof |
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| CNA2008100356608A CN101551560A (en) | 2008-04-03 | 2008-04-03 | Liquid crystal display unit with broken wire restoring function and restoring method thereof |
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| CN101551560A true CN101551560A (en) | 2009-10-07 |
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| CNA2008100356608A Pending CN101551560A (en) | 2008-04-03 | 2008-04-03 | Liquid crystal display unit with broken wire restoring function and restoring method thereof |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102809857A (en) * | 2012-07-24 | 2012-12-05 | 深圳市华星光电技术有限公司 | Liquid crystal display panel and liquid crystal display device |
| CN104765170A (en) * | 2015-04-17 | 2015-07-08 | 深圳市华星光电技术有限公司 | Long-line repair method of COA array substrate |
-
2008
- 2008-04-03 CN CNA2008100356608A patent/CN101551560A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102809857A (en) * | 2012-07-24 | 2012-12-05 | 深圳市华星光电技术有限公司 | Liquid crystal display panel and liquid crystal display device |
| WO2014015494A1 (en) * | 2012-07-24 | 2014-01-30 | 深圳市华星光电技术有限公司 | Liquid crystal display panel and liquid crystal display device |
| CN102809857B (en) * | 2012-07-24 | 2015-06-10 | 深圳市华星光电技术有限公司 | Liquid crystal display panel and liquid crystal display device |
| US9753344B2 (en) | 2012-07-24 | 2017-09-05 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Liquid crystal display panel and liquid crystal display device |
| CN104765170A (en) * | 2015-04-17 | 2015-07-08 | 深圳市华星光电技术有限公司 | Long-line repair method of COA array substrate |
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Open date: 20091007 |