CN101551345B - Spectrometer based on X ray inspired light source - Google Patents
Spectrometer based on X ray inspired light source Download PDFInfo
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- CN101551345B CN101551345B CN2009100669768A CN200910066976A CN101551345B CN 101551345 B CN101551345 B CN 101551345B CN 2009100669768 A CN2009100669768 A CN 2009100669768A CN 200910066976 A CN200910066976 A CN 200910066976A CN 101551345 B CN101551345 B CN 101551345B
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Abstract
The present invention relates to a spectrum test device used for material detection, and especially to a spectrometer based on X ray inspired light source. The spectrometer comprises an X ray generator, a vacuum channel, a limiting slit, a rotation sample table for placing the tested sample, an optical fiber, an incidence slit, a diffraction grating, an emergence slit, a concave mirror, a lens, a photomultiplier tube and a computer processing system. The X ray emitted from the X ray generator passes through a limiting slit of vacuum channel outlet and is irradiated to the tested sample on the rotation sample table. The inspired light of sample is transmitted to the incidence slit through the optical fiber, and is emitted out from the emergence slit after light splitting of diffraction grating. The inspired light is assembled to the photomultiplier tube after the concave mirror and lens. The photomultiplier tube is connected with the computer processing system through an A/D converter. The spectrometer of the invention settles a technical problem that the prior technical means can not realize the accurate and whole detection to the luminescent spectrum of luminescent material under the inspiration of X ray.
Description
Technical field
The present invention relates to be used for the spectrum test instrument of material tests, particularly a kind of spectrum test instrument that under excitation of X-rays, detects luminescent material that is applicable to.
Background technology
At present, traditional fluorescence spectrophotometer adopts xenon lamp (150W) as excitation source substantially, and the luminescent spectrum that can only be used for embedded photoluminescent material detects.And can not measure the luminescent material that those must use excitation of X-rays, want to measure this type of material, two instruments of common employing method for measuring respectively carry out, both at first material was excited on x-ray apparatus, be displaced to immediately on the fluorescence spectrophotometer then, measure the spectral distribution curve and the twilight sunset of the corresponding luminous intensity of its wavelength.
Because twilight sunset is made up of two parts, a both fast process and slow processes that relative intensity slowly descends that instantaneous descends rapidly.After sample stops X-radiation, move on to when carrying out spectroscopic assay on the fluorescence spectrophotometer, can not measure this material and excite luminous change curve down along with firing time, and the wavelength of measuring obviously descends corresponding to the luminous intensity of luminous intensity spectral distribution curve, and the fast process of twilight sunset is measured not exclusively, can only measure slow process.Therefore, can't measure twilight sunset accurately, so be an incomplete testing result to the spectral analysis of this kind material along with time changing curve and definite after time.
Summary of the invention
The objective of the invention is to for solving at present under excitation of X-rays, the defective of the spectrum detection technique means of luminescent material provides a kind of spectrometer based on the excitation of X-rays light source, to satisfy the spectrum detection technique requirement of this technical field.
The present invention is based on the spectrometer of excitation of X-rays light source, comprise specimen rotating holder, optical fiber, entrance slit, diffraction grating, exit slit, concave mirror, lens, photomultiplier and the computer processing system of x ray generator, control shutter, vacuum passage, restriction slit, placement sample;
The X-ray that described x ray generator sends, by the control shutter, enter vacuum passage, restriction slit via the vacuum passage outlet, shine on the sample on the specimen rotating holder, the light that is excited of sample, penetrates from exit slit after the diffraction grating beam split to described entrance slit by fiber optic conduction again, be gathered in photomultiplier through described concave mirror and lens, photomultiplier is connected with computer processing system by A/D converter.
The input end of described optical fiber is clamped on the universal stage, makes it corresponding to the sample on the described specimen rotating holder so that adjust the input end of optical fiber.
Tested luminescent material sample is posted on the table top of the specimen rotating holder of this spectrometer, and the turn specimen rotating holder to be to adjust the incident angle of X ray with respect to table top, adjusts optical fiber and makes its input end aim at sample on sample stage; Open the control shutter of x ray generator, sample be excited and produce luminous, promptly by optical fiber receive conduct to the diffraction grating beam split after, received by computer processing system and realize that the characteristics of luminescence of tested luminescent material under excitation of X-rays carried out real time spectrum to be detected through photomultiplier and A/D converter again.
Employing the present invention is based on the spectrometer of excitation of X-rays light source, can record the spectral distribution curve of the corresponding luminous intensity of the wavelength of luminescent material under excitation of X-rays in real time, accurately; Luminous intensity is along with the firing time change curve; Decay of afterglow is along with time changing curve and after time.Solved the technical barrier that present technological means can not realize the luminescent spectrum of luminescent material under accurate, the complete detection excitation of X-rays.
Description of drawings
Fig. 1 is the structural representation that the present invention is based on the spectrometer of excitation of X-rays light source;
Fig. 2 adopts this spectrometer to detect the material overall process curve map that luminous intensity changed along with the time under excitation of X-rays that embodiment obtained.
Embodiment
The embodiment that provides below in conjunction with accompanying drawing is described in further detail the present invention.
As shown in Figure 1, a kind of fluorescence spectrophotometer based on the excitation of X-rays light source comprises x ray generator 1, control shutter K, vacuum passage 2, restriction slit S
1, place specimen rotating holder 3, optical fiber 4, the entrance slit S of sample
2, diffraction grating 5, exit slit S
3, concave mirror M, lens L, photomultiplier 6 and computer processing system 7;
The X-ray that described x ray generator 1 sends by control shutter K, enters vacuum passage 2, via the restriction slit S of vacuum passage outlet
1, shining on the sample on the specimen rotating holder 3, the light that is excited of sample is transmitted to described entrance slit S by optical fiber 4
2, again after diffraction grating 5 beam split from exit slit S
3Penetrate, be gathered in photomultiplier 6 through described concave mirror M and lens L, photomultiplier 6 is connected with computer processing system 7 by A/D converter.
The input end of described optical fiber 4 is clamped on the universal stage and (does not indicate among the figure), makes it corresponding to the sample on the described specimen rotating holder 3 so that adjust the input end of optical fiber.
Below be the example that adopts spectrometer test material of the present invention:
Mix up rare earth long-afterglow luminescent material as specimen with a kind of silicate, supervisory wavelength 505nm measures luminous intensity along with the firing time change curve; Decay of afterglow is along with time changing curve.As shown in Figure 2, when shutter is not opened, mensuration be instrument back of the body end noise; Open control soon behind the door, material is excited, produce a rapid fast process that strengthens of moment luminous intensity at once, grow with time and the slow process of gradual slow enhancing with a luminous intensity, close soon behind the door, stop to excite, what measured this moment is the twilight sunset of material, the relative slow process slowly that descends of fast process that twilight sunset exists a luminous intensity to descend rapidly too with one, afterglow intensity drops to its intensity 1/10th from maximal value, the used time is exactly the after time of this material.And adopt the method for measuring respectively of two instruments, can only measure part fast process and slow process that afterglow intensity descends.
Claims (2)
1. the spectrometer based on the excitation of X-rays light source is characterized in that: the specimen rotating holder (3), optical fiber (4), entrance slit (S2), diffraction grating (5), exit slit (S3), concave mirror (M), lens (L), photomultiplier (6) and the computer processing system (7) that comprise x ray generator (1), control shutter (K), vacuum passage (2), restriction slit (S1), placement sample;
The X-ray that described x ray generator (1) sends, by control shutter (K), enter vacuum passage (2), restriction slit (S1) via the vacuum passage outlet, shine on the sample on the specimen rotating holder (3), the light that is excited of sample is transmitted to described entrance slit (S2) by optical fiber (4), after diffraction grating (5) beam split, penetrate again from exit slit (S3), be gathered in photomultiplier (6) through described concave mirror (M) and lens (L), photomultiplier (6) is connected with computer processing system (7) by A/D converter.
2. the spectrometer based on the excitation of X-rays light source according to claim 1, the input end that it is characterized in that described optical fiber (4) is clamped on the universal stage, makes it corresponding to the sample on the described specimen rotating holder (3) so that adjust the input end of optical fiber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009100669768A CN101551345B (en) | 2009-05-20 | 2009-05-20 | Spectrometer based on X ray inspired light source |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009100669768A CN101551345B (en) | 2009-05-20 | 2009-05-20 | Spectrometer based on X ray inspired light source |
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| Publication Number | Publication Date |
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| CN101551345A CN101551345A (en) | 2009-10-07 |
| CN101551345B true CN101551345B (en) | 2011-09-28 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2009100669768A Expired - Fee Related CN101551345B (en) | 2009-05-20 | 2009-05-20 | Spectrometer based on X ray inspired light source |
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Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102589691B (en) * | 2012-03-28 | 2014-02-19 | 北京理工大学 | Auto-collimation straight grating spectrometer |
| CN103076352B (en) * | 2012-12-28 | 2015-02-25 | 中国科学院高能物理研究所 | Method for obtaining high-quality X-ray absorption spectrum of thin film sample |
| CN103175857B (en) * | 2013-03-14 | 2015-06-03 | 中国科学院高能物理研究所 | Device specially used for grazing incidence XAFS (X-ray Absorption Fine Structure) experiment and regulating method of device |
| CN103674981A (en) * | 2013-12-04 | 2014-03-26 | 中国科学院上海硅酸盐研究所 | Microsecond scintillation afterglow measuring device for scintillating material |
| CN103713003A (en) * | 2014-01-07 | 2014-04-09 | 中国科学院上海硅酸盐研究所 | Device and method for testing afterglow of scintillating material |
| CN107357044A (en) * | 2017-08-28 | 2017-11-17 | 重庆三峡医药高等专科学校 | A kind of step multimode fibre optical tweezer based on skew ray annular light field |
| JP6943090B2 (en) * | 2017-09-05 | 2021-09-29 | 株式会社島津製作所 | X-ray imaging device |
| CN109507220B (en) * | 2018-10-31 | 2021-07-23 | 东华理工大学 | Multi-axis special-shaped sample X-ray fluorescence spectrum analysis device |
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- 2009-05-20 CN CN2009100669768A patent/CN101551345B/en not_active Expired - Fee Related
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