CN103674981A - Microsecond scintillation afterglow measuring device for scintillating material - Google Patents
Microsecond scintillation afterglow measuring device for scintillating material Download PDFInfo
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- CN103674981A CN103674981A CN201310640830.6A CN201310640830A CN103674981A CN 103674981 A CN103674981 A CN 103674981A CN 201310640830 A CN201310640830 A CN 201310640830A CN 103674981 A CN103674981 A CN 103674981A
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- 239000000463 material Substances 0.000 title claims abstract description 48
- 238000004458 analytical method Methods 0.000 claims abstract description 42
- 238000005259 measurement Methods 0.000 claims abstract description 34
- 230000005855 radiation Effects 0.000 claims abstract description 33
- 238000006243 chemical reaction Methods 0.000 claims abstract description 29
- 230000001678 irradiating effect Effects 0.000 claims abstract 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 4
- 229910052710 silicon Inorganic materials 0.000 claims description 4
- 239000010703 silicon Substances 0.000 claims description 4
- 238000013480 data collection Methods 0.000 claims 1
- 238000000034 method Methods 0.000 description 7
- 239000000523 sample Substances 0.000 description 7
- 238000005516 engineering process Methods 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 238000007405 data analysis Methods 0.000 description 3
- 238000009206 nuclear medicine Methods 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 230000005260 alpha ray Effects 0.000 description 1
- ORCSMBGZHYTXOV-UHFFFAOYSA-N bismuth;germanium;dodecahydrate Chemical compound O.O.O.O.O.O.O.O.O.O.O.O.[Ge].[Ge].[Ge].[Bi].[Bi].[Bi].[Bi] ORCSMBGZHYTXOV-UHFFFAOYSA-N 0.000 description 1
- XQPRBTXUXXVTKB-UHFFFAOYSA-M caesium iodide Chemical compound [I-].[Cs+] XQPRBTXUXXVTKB-UHFFFAOYSA-M 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 201000010099 disease Diseases 0.000 description 1
- 208000037265 diseases, disorders, signs and symptoms Diseases 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- ADOANNTYRWJJIS-UHFFFAOYSA-N lutetium silicic acid Chemical compound [Lu].[Si](O)(O)(O)O ADOANNTYRWJJIS-UHFFFAOYSA-N 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 229920002545 silicone oil Polymers 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
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Abstract
本发明涉及闪烁材料的微秒闪烁余辉测量装置。该闪烁余辉测量装置包括：用于对闪烁材料辐照后使其闪烁发光的辐射源；用于将在所述辐射源停止辐照后所述闪烁材料释放的闪烁余辉的光信号转换为电信号的光电转换单元；用于采集转换后的所述电信号的数据采集单元；以及控制所述辐射源、并对所述数据采集单元采集到的电信号进行分析以得到所述闪烁余辉的性能的控制分析单元。根据本发明，可准确、方便地测量100微秒以内闪烁余辉性能。
The invention relates to a microsecond flicker afterglow measuring device for scintillating materials. The flicker afterglow measurement device includes: a radiation source used to irradiate the scintillation material to make it flicker and glow; used to convert the light signal of the scintillation afterglow released by the scintillation material after the radiation source stops irradiating into an electrical signal a photoelectric conversion unit; a data acquisition unit for collecting the converted electrical signal; and a device for controlling the radiation source and analyzing the electrical signal collected by the data acquisition unit to obtain the performance of the flicker afterglow Control analysis unit. According to the invention, the flicker afterglow performance within 100 microseconds can be measured accurately and conveniently.
Description
Technical field
The invention belongs to photoelectron field of detecting, particularly, relate to a kind of flicker afterglow measurement device of scintillation material.
Background technology
Scintillation material can be converted into pulse visible ray (being flashing) by the entrained portion of energy of high energy particle (as X ray etc.).Particularly, scintillation material is under the shock of the high energy particles such as X ray, changes the kinetic energy of high energy particle into luminous energy and the scintillation crystal that flashes.For example, cesium iodide, bismuth germanium oxide, silicic acid lutetium etc.
Due to this specific character of scintillation material, it has irreplaceable purposes in fields such as nuclear medicine, the sampling observation of weapon performance, anti-terrorism, safety inspection, high-energy physics experiment, drug law enforcement, geologic prospecting and deep space probings.Inorganic scintillation material has the advantages such as density is large, light output is high and detection efficiency is high, energy resolution is better, thereby is widely used.
Modern nuclear medicine technology has the advantages such as real-time, non-destruction, high-resolution and high-accuracy, in fields such as medical diagnosis on disease, biotechnologies, is used widely.The core component of high-end nucleus medical image equipment is the probe of being prepared by inorganic scintillation material.The performance of probe has directly determined the image quality of above-mentioned image documentation equipment, and the performance of probe depends mainly on the quality of scintillation material used.The x-ray tomography imager (CT machine) of take is example, except requiring the scintillation material of preparation probe to have high density, High Light Output, die-away time faster, also require scintillation material to have extremely low twilight sunset.
Along with the progress of modern nuclear medicine technology, image taking speed is constantly accelerated, and imaging is sharply shortened interval time.Shorten for raising image quality, reduction irradiation dose at imaging interval all positive role.At present, advanced x-ray imaging equipment imaging interval is less than 100 microseconds.Thereby, need to measure the flicker twilight sunset of 100 microsecond time-amplitudes.
In traditional scintillation material afterglow property measuring equipment principle, adopt, for example: 1) shutter blocked method (or other principles roughly consistent improving one's methods): high-speed shutter blocks the mode of continuous X-rays, can obtain the x-ray source that negative edge is about 3 milliseconds; The method can Measuring Time amplitude in more than 10 milliseconds twilight sunset.2) turn at a high speed target x-ray method: electronics bombards the fan-shaped target of high-speed rotation, can obtain the X ray of negative edge approximately 200 microseconds; The method can Measuring Time amplitude in more than 500 milliseconds twilight sunset.But, comprise and adopt the of the prior art various flicker afterglow measurement devices of said method all can not effectively measure the flicker twilight sunset in 100 microseconds.
Summary of the invention
For the above-mentioned problems in the prior art, technical matters to be solved by this invention is to provide a kind of 100 microseconds of can measuring accurately, easily with the flicker afterglow measurement device of the scintillation material of interior flicker afterglow property.
In order to solve the problems of the technologies described above, the invention provides a kind of flicker afterglow measurement device of scintillation material, comprising: for to making the radiation source of its flashing after scintillation material irradiation; For the light signal of the flicker twilight sunset that after stopping irradiation at described radiation source, described scintillation material discharges being converted to the photoelectric conversion unit of electric signal; Data acquisition unit for the described electric signal after Collect conversion; And control described radiation source and electric signal analysis that described data acquisition unit is collected obtains the control analysis unit of the performance of described flicker twilight sunset.
According to the flicker afterglow measurement device of scintillation material of the present invention, under the control of control analysis unit, make radiation source produce ray, scintillation material to be measured is carried out to irradiation, make this scintillation material excited by irradiation, send passage of scintillation light; The irradiation of ray stops, and for the scintillation material that has twilight sunset, after irradiation stops, this scintillation material will constantly discharge flicker twilight sunset; Twilight sunset signal, be that light signal is converted to electric signal by photoelectric conversion unit, and collect and by control analysis unit carries out data analysis, obtain the performance of the flicker twilight sunset of this scintillation material by data acquisition unit.Wherein, the performance of this flicker twilight sunset can comprise afterglow intensity and after time parameter.Flicker afterglow measurement apparatus structure of the present invention is compact, simple, and the data of measurement are accurate, reproducible, and can measure easily 100 microseconds with performance interior, more than microsecond flicker twilight sunset.
Again, in the present invention, also can, described radiation source is pulsed X-ray light source.
According to the present invention, this radiation source is pulsed X-ray light source, thereby can produce the pulsed X-ray that scintillation material to be measured is carried out to irradiation, and irradiation stop after end-of-pulsing.Preferably, this pulsed X-ray light source can be X-ray tube, thereby can effectively produce pulsed X-ray.
Again, in the present invention, also can, the pulse halfwidth of the X ray that described pulsed X-ray light source produces was less than for 200 nanoseconds.
According to the present invention, the advantage that the pulse halfwidth of the X ray that pulsed X-ray light source produces was less than for 200 nanoseconds be its negative edge much smaller than 100 nanoseconds, can meet the needs of flicker twilight sunset 100 microseconds measurements completely.
Again, in the present invention, also can, described photoelectric conversion unit comprises photomultiplier or silicon photo diode.
According to the present invention, adopt photomultiplier or silicon photo diode to form photoelectric conversion unit, can effectively realize the conversion of photosignal, be conducive to the light signal of flicker twilight sunset to be converted to electric signal.
Again, in the present invention, also can, also comprise the radiation source control module of control so that the generation of described radiation source ray is controlled of accepting described control analysis unit.
According to the present invention, radiation source control module can make radiation source produce required ray under the control of control analysis unit, so that scintillation material to be measured is carried out to irradiation.
Again, in the present invention, also can, the roentgen dose X rate that described radiation source produces by described control analysis unit adjustable control.
According to the present invention, can by control analysis unit adjustable control the roentgen dose X that radiation source produces, thereby the measurement of the twilight sunset that is conducive to glimmer.
Again, in the present invention, also can, also comprise that the control of accepting described control analysis unit is with the photoelectric conversion unit power supply to described photoelectric conversion unit power supply.
According to the present invention, by photoelectric conversion unit, use power supply under the control of control analysis unit, to described photoelectric conversion unit, to power.
Again, in the present invention, also can, the voltage that described photoelectric conversion unit provides described photoelectric conversion unit with power supply by described control analysis unit adjustable control.
According to the present invention, can by control analysis unit adjustable control the height of the voltage that photoelectric conversion unit provides described photoelectric conversion unit with power supply, thereby the measurement of the twilight sunset that is conducive to glimmer.
Again, in the present invention, also can, described data acquisition unit automatically gathers described electric signal according to the control of described control analysis unit, and the described electric signal collecting is inputed to described control analysis unit to carry out automatic analysis.
According to the present invention, the electric signal obtaining after being changed by photoelectric conversion unit by the light signal of flicker twilight sunset, automatically after being collected by data acquisition unit, input to this control analysis unit and carry out automated data analysis to obtain the performance of twilight sunset under the control of control analysis unit, for example, afterglow intensity and after time parameter.
The present invention can comprise the combination in any of disclosed at least two structures in claims and/or instructions and/or accompanying drawing.The plural combination in any of every claim that especially, the present invention comprises claims.
According to following embodiment and with reference to accompanying drawing, will understand better above-mentioned and other object of the present invention, feature and advantage.
Accompanying drawing explanation
Fig. 1 is according to the structural representation of an example of the flicker afterglow measurement device of scintillation material of the present invention;
Fig. 2 is for adopting the twilight sunset-time curve of the scintillation material sample of the flicker afterglow measurement measurement device shown in Fig. 1.
Embodiment
Below in conjunction with accompanying drawing and concrete example, technical scheme of the present invention is further elaborated.
Fig. 1 is according to the structural representation of an example of the flicker afterglow measurement device of scintillation material of the present invention.As shown in Figure 1, the flicker afterglow measurement device of scintillation material of the present invention, comprises for generation of to making the radiation source 1 of the ray of its flashing after scintillation material 3 irradiation to be measured.In this example, this radiation source 1 can be for example pulsed X-ray light source, thereby can produce the pulsed X-ray that scintillation material 3 to be measured is carried out to irradiation, and irradiation stop after end-of-pulsing.Preferably, this pulsed X-ray light source can be X-ray tube, thereby can effectively produce pulsed X-ray.And the pulse halfwidth of the X ray that more preferably, this pulsed X-ray light source produces was less than for 200 nanoseconds.But the invention is not restricted to this, this radiation source 1 can be also any radiation source that can produce other rays (such as alpha ray or gamma-rays etc.) that make scintillation material stimulated luminescence.
And flicker afterglow measurement device of the present invention also comprises that the light signal of the flicker twilight sunset discharging for scintillation material after the irradiation at ray stops 3 being converted to the photodetector 4 as photoelectric conversion unit of electric signal.This photodetector 4 can comprise photomultiplier or silicon photo diode, thereby can effectively realize the conversion of photosignal, is conducive to the light signal of flicker twilight sunset to be converted to electric signal.
Again, flicker afterglow measurement device of the present invention also comprises the data acquisition unit 6 for the above-said current signal after Collect conversion, and controls the generation of ray of radiation source 1 the control analysis unit 7 of the performance of the flicker twilight sunset that electric signal analysis that data acquisition unit 6 is collected obtains this scintillation material 3 to be measured.This data acquisition unit 6 automatically gathers by the light signal strength of flicker twilight sunset over time according to the control of control analysis unit 7, after changing by photoelectric conversion unit, obtain analog electrical signal intensity over time, and the analog electrical signal collecting is inputed to control analysis unit 7.Control analysis unit 7 carries out analog to digital conversion by described analog electrical signal and obtains glimmering twilight sunset with intensity over time, by being built in the parameter of 7 inside, control analysis unit, and matching parameter after time that obtains glimmering.
Thus, by flicker afterglow measurement device of the present invention, under the control of control analysis unit 7, make radiation source 1 produce ray, scintillation material 3 to be measured is carried out to irradiation, make this scintillation material 3 excited by irradiation, send passage of scintillation light; The irradiation of ray stops, and for the scintillation material that has twilight sunset, after irradiation stops, this scintillation material 3 will constantly discharge flicker twilight sunset; Twilight sunset signal, be that light signal is converted to electric signal by photodetector 4, and collect and by control analysis unit 7 carries out data analysis, obtain the performance of the flicker twilight sunset of this scintillation material 3 by data acquisition unit 6.Wherein, the performance of this flicker twilight sunset can comprise afterglow intensity and after time parameter etc.Flicker afterglow measurement apparatus structure of the present invention is compact, simple, and the data of measurement are accurate, reproducible.Owing to having adopted halfwidth to be less than Pulsed Xray source and the digital collection unit of 200 nanoseconds, can measure easily 100 microseconds with performance interior, more than microsecond flicker twilight sunset.
In addition,, with further reference to Fig. 1, flicker afterglow measurement device of the present invention can also comprise the radiation source control module 2 of control so that the generation of the ray of radiation source 1 is controlled of accepting control analysis unit 7.It in this example, is for example light source controller 2.This light source control 2 can make radiation source produce required ray under the control of control analysis unit 7, so that scintillation material 3 to be measured is carried out to irradiation.And the roentgen dose X that radiation source produces, the x-ray dose that for example above-mentioned pulsed X-ray light source produces can by control analysis unit 7 adjustable control, thereby the measurement of the twilight sunset that is conducive to glimmer.
Again, flicker afterglow measurement device of the present invention can also comprise the control of accepting control analysis unit 7 with to the power supply 5 for photoelectric conversion unit of photoelectric conversion unit 4 power supplies, be detector power supply 5.By this detector power supply 5, can under the control of control analysis unit 7, to photodetector 4, power.And, can by control analysis unit 7 adjustable control the height of the voltage that 5 pairs of photodetectors 4 of detector power supply provide, thereby the measurement of the twilight sunset that is conducive to glimmer.
The following course of work that describes the flicker afterglow measurement device that adopts scintillation material of the present invention according to an example of the present invention of Fig. 1 in detail.
Embodiment
As shown in Figure 1, by a scintillation crystal sample 3 use silicone oil and photodetector 4 couplings, the power supply of make pulse X-ray tube 1 and light source controller 2, setting X-ray tube high pressure; Connect detector power supply 5, set detector voltage; After stable, by control analysis unit 7, to light source controller 2, send instruction and make pulsed X-ray pipe 1 send pulsed X-ray sample is carried out to irradiation to excite, pulsed X-ray later irradiation finishes, and scintillation crystal discharges twilight sunset, passes in time twilight sunset and weakens gradually.From pulsed X-ray pipe send pulsed X-ray constantly, data acquisition unit 6 starts working, and transfers to control analysis parts 7 to process the signal of collecting, result as shown in Figure 2.
Flicker twilight sunset and time relationship that Fig. 2 is the scintillation material that obtains with measurement device of the present invention.In figure, time-amplitude is that the flicker twilight sunset of 5 microseconds, 20 microseconds, 50 microseconds, 75 microseconds, 100 microseconds is respectively 20%, 17.8%, 12.5%, 5% and 2.5%.
Do not departing under the aim of essential characteristic of the present invention, the present invention can be presented as various ways, therefore the example in the present invention is to be illustrative rather than definitive thereof, due to scope of the present invention, be defined by the claims but not limited by instructions, and drop on the scope that claim defines, or all changes in the full scope of equivalents of its scope defining are all understood to include in claims.
Claims (9)
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108535770A (en) * | 2018-05-09 | 2018-09-14 | 同方威视技术股份有限公司 | Twilight sunset detection device and twilight sunset detection method |
| CN110609314A (en) * | 2019-10-30 | 2019-12-24 | 北京物资学院 | A scintillator afterglow test device |
| CN112034505A (en) * | 2020-08-31 | 2020-12-04 | 中国科学院西安光学精密机械研究所 | Accurate measurement device and method for afterglow of scintillator |
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Cited By (4)
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| CN110609314A (en) * | 2019-10-30 | 2019-12-24 | 北京物资学院 | A scintillator afterglow test device |
| CN112034505A (en) * | 2020-08-31 | 2020-12-04 | 中国科学院西安光学精密机械研究所 | Accurate measurement device and method for afterglow of scintillator |
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Application publication date: 20140326 |