CN101446621B - 集成电路的测试系统及方法 - Google Patents
集成电路的测试系统及方法 Download PDFInfo
- Publication number
- CN101446621B CN101446621B CN2008101773590A CN200810177359A CN101446621B CN 101446621 B CN101446621 B CN 101446621B CN 2008101773590 A CN2008101773590 A CN 2008101773590A CN 200810177359 A CN200810177359 A CN 200810177359A CN 101446621 B CN101446621 B CN 101446621B
- Authority
- CN
- China
- Prior art keywords
- signal
- integrated circuit
- radio frequency
- frequency identification
- baseband signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 95
- 238000000034 method Methods 0.000 claims abstract description 25
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 230000008569 process Effects 0.000 description 10
- 238000012545 processing Methods 0.000 description 9
- 238000012546 transfer Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 230000000630 rising effect Effects 0.000 description 4
- 238000004891 communication Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 208000018747 cerebellar ataxia with neuropathy and bilateral vestibular areflexia syndrome Diseases 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000004064 dysfunction Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31712—Input or output aspects
- G01R31/31716—Testing of input or output with loop-back
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims (10)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/946,806 US7795895B2 (en) | 2007-11-28 | 2007-11-28 | Loop-back testing method and apparatus for IC |
US11/946,806 | 2007-11-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101446621A CN101446621A (zh) | 2009-06-03 |
CN101446621B true CN101446621B (zh) | 2012-08-22 |
Family
ID=40669155
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008101773590A Expired - Fee Related CN101446621B (zh) | 2007-11-28 | 2008-11-18 | 集成电路的测试系统及方法 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7795895B2 (zh) |
CN (1) | CN101446621B (zh) |
TW (1) | TWI388865B (zh) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2397976B1 (en) * | 2007-10-02 | 2013-05-08 | Sharp Kabushiki Kaisha | Semiconductor storage device and storage system |
JP5290054B2 (ja) * | 2009-06-02 | 2013-09-18 | ルネサスエレクトロニクス株式会社 | 半導体集積回路の試験システム |
IT1399914B1 (it) * | 2010-04-29 | 2013-05-09 | St Microelectronics Srl | Circuito di test di un circuito integrato su wafer del tipo comprendente almeno una antenna di tipo embedded e relativo circuito integrato ottenuto mediante singolazione a partire da una porzione di wafer dotata di un tale circuito di test. |
CN102854455A (zh) * | 2012-09-21 | 2013-01-02 | 成都市中州半导体科技有限公司 | 集成电路测试系统及集成电路测试系统的控制方法 |
US9402148B1 (en) * | 2013-05-23 | 2016-07-26 | Mediatek Singapore Pte. Ltd. | Loop back scheme for NFC |
CN105281852B (zh) * | 2015-10-30 | 2018-06-01 | 四川九洲电器集团有限责任公司 | 一种l波段测试设备及测试方法 |
FR3045246B1 (fr) * | 2015-12-14 | 2018-01-05 | Thales | Procede de verification de bon fonctionnement par rebouclage d'un dispositif d'emission/reception |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6104291A (en) * | 1998-01-09 | 2000-08-15 | Intermec Ip Corp. | Method and apparatus for testing RFID tags |
US6236223B1 (en) * | 1998-11-09 | 2001-05-22 | Intermec Ip Corp. | Method and apparatus for wireless radio frequency testing of RFID integrated circuits |
CN1542937A (zh) * | 2003-11-07 | 2004-11-03 | 爱德万测试(苏州)有限公司上海分公 | 用数字信号和射频信号发射/识别电路测试rfid芯片的方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070273481A1 (en) * | 2006-05-25 | 2007-11-29 | Symbol Technologies, Inc. | RFID tag with programmable read range |
JP4974613B2 (ja) * | 2006-08-29 | 2012-07-11 | 株式会社日立製作所 | Icメモリ並びにicメモリ用のアクセス装置及び正当性検証方法 |
US20080100329A1 (en) * | 2006-10-31 | 2008-05-01 | Symbol Technologies, Inc. | System and method for multi-up inline testing of radio frequency identification (RFID) inlays |
-
2007
- 2007-11-28 US US11/946,806 patent/US7795895B2/en not_active Expired - Fee Related
-
2008
- 2008-11-07 TW TW097143080A patent/TWI388865B/zh not_active IP Right Cessation
- 2008-11-18 CN CN2008101773590A patent/CN101446621B/zh not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6104291A (en) * | 1998-01-09 | 2000-08-15 | Intermec Ip Corp. | Method and apparatus for testing RFID tags |
US6236223B1 (en) * | 1998-11-09 | 2001-05-22 | Intermec Ip Corp. | Method and apparatus for wireless radio frequency testing of RFID integrated circuits |
CN1542937A (zh) * | 2003-11-07 | 2004-11-03 | 爱德万测试(苏州)有限公司上海分公 | 用数字信号和射频信号发射/识别电路测试rfid芯片的方法 |
Also Published As
Publication number | Publication date |
---|---|
TW200923390A (en) | 2009-06-01 |
US7795895B2 (en) | 2010-09-14 |
US20090134903A1 (en) | 2009-05-28 |
CN101446621A (zh) | 2009-06-03 |
TWI388865B (zh) | 2013-03-11 |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right |
Effective date of registration: 20201012 Address after: No. 1, Xingzhu Road, Hsinchu Science Park, Taiwan, China Patentee after: MEDIATEK Inc. Address before: No. 1, Xingzhu Road, Hsinchu Science Park, Taiwan, China Patentee before: MEDIATEK Inc. Patentee before: MSTAR SEMICONDUCTOR Inc. Effective date of registration: 20201012 Address after: No. 1, Xingzhu Road, Hsinchu Science Park, Taiwan, China Patentee after: MEDIATEK Inc. Patentee after: MSTAR SEMICONDUCTOR Inc. Address before: 4 building 518057, block C, Institute of international technology innovation, South tech ten road, Shenzhen hi tech Zone, Guangdong Patentee before: Mstar Semiconductor,Inc. Patentee before: MSTAR SEMICONDUCTOR Inc. |
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TR01 | Transfer of patent right |
Effective date of registration: 20220517 Address after: Ontario, Canada Patentee after: Xueshan Technology Co.,Ltd. Address before: No. 1, Xingzhu Road, Hsinchu Science Park, Taiwan, China Patentee before: MEDIATEK Inc. |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120822 |
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CF01 | Termination of patent right due to non-payment of annual fee |