CN101210951B - Built-in illuminating source photo-sensor detection device and test bench possessing same - Google Patents
Built-in illuminating source photo-sensor detection device and test bench possessing same Download PDFInfo
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- CN101210951B CN101210951B CN 200610148092 CN200610148092A CN101210951B CN 101210951 B CN101210951 B CN 101210951B CN 200610148092 CN200610148092 CN 200610148092 CN 200610148092 A CN200610148092 A CN 200610148092A CN 101210951 B CN101210951 B CN 101210951B
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Abstract
The invention discloses a test apparatus for an optical sensor with a light source therein, comprising a base and a cover on the base. At least one LBD is arranged on the cover and is used as the light source between the light source and to-be-tested optical sensor in the cover for the test. No high pressure discharge lamp or optical processing device is required in the invention, reducing the time waste in changing light source. In addition, the invention also discloses a test equipment of the test apparatus for optical sensor with inner light source.
Description
Technical field
The present invention relates to a kind of photo-sensor detection, be meant a kind of photo-sensor detection of tool built-in illuminating source especially; The invention still further relates to the tester table of photo-sensor detection with built-in illuminating source.
Background technology
No matter in mobile phone, in security monitoring field or the industrial detection equipment, widely adopt as electric coupling assembly optical sensors such as (CCD or CMOS).Therefore, the detection demand of optical sensor is increased day by day, because the many most structure cells by the array shape of optical sensor are constituted, whether each structure cell is identical for the response power of same intensity light beam, promptly determines the spatially uniform of this optical sensor; And whether each structure cell is identical for the response of different wave length light beam, determines promptly whether this optical sensor can reach white balance; As for the speed of each structure cell, then determine the reaction rate of optical sensor to the incident beam response; These just determine the main optical property of optical sensor quality.
Be the spatially uniform that obtains optical sensor and white balance data whether, as shown in Figures 1 and 2, the tester table 1 of traditional test optical sensor includes a high-pressure discharge lamp 10, one light processor 11 and a photosensitive detection equipment, wherein high-pressure discharge lamp 10 is in order to provide the different wave length light beam to light processor 11, via the halo 110 in the light processor 11 and follow-up optical lens group with light uniformization after, even light after handling is projected to optical sensor holder 12 places, the evenly light perforation 121 of loam cake 120 of passing through, and expose to optical sensor to be measured 13, for example on the CMOS chip, each structure cell sensing incident light intensity in the optical sensor 13, and the sensing signal that converts correspondence to is exported, via the complex lead 122 that is electrically connected with this optical sensor the sensing signal is reached in the control device (not indicating among the figure), can learn test result.And carry out classification (OQC) according to test result, reduce the picture element of defective products in the tolerance interval still and GTG and as operations such as sub-quality products shipment.
Yet traditional light sensor test board 1 need be provided with devices such as above-mentioned high-pressure discharge lamp 10, light processor 11 and holder 12, and especially very big with the shared entity space of light processor, cost is higher relatively; High-pressure discharge lamp 10 is to adopt based on halogen bulb again, not only the wavelength numerical value of each wavelength components is understood drift and instability in the light source, therefore and the bulb loss is fast, needs the Wavelength stabilized fatal defective that verifies as of light source during for test, more more changes the bulb and also causes relative cost to improve.
Summary of the invention
At the above-mentioned deficiency of prior art, one of technical matters to be solved by this invention provides the photo-sensor detection that integrated testability board cost is dwindled, can be reduced to a kind of overall volume, emission wavelength is stable and the life-span is long, can effectively promote the built-in illuminating source of detection rates.
Two of technical matters to be solved by this invention provides a kind of above-mentioned tester table with photo-sensor detection of built-in illuminating source.
In order one of to solve the problems of the technologies described above, the photo-sensor detection of built-in illuminating source provided by the invention is used to test the photometry sensor for the treatment of with plural pin, and it comprises:
One pedestal, this pedestal have one for putting and be electrically connected the supporting part that this treats photometry sensor;
One loam cake, be covered on this pedestal top on being somebody's turn to do, and can move for this being treated the photometry sensor packing is electrically connected between the make-position of this supporting part for inserting/shift out this open site to one for the treatment of photometry sensor one, and has the LED source that a light emission direction is configured to treat towards this photometry sensor in this loam cake with respect to this pedestal.
As optimal technical scheme, said base supporting part of the present invention preferably is provided with this and treats that the photometry sensor pin is corresponding and power supply connects, treats the plural lead foot of photometry sensor signal for transmitting this.
As another optimal technical scheme, the above-mentioned loam cake of the present invention preferably is hubbed at this pedestal through a pivot.
As an optimal technical scheme again, the above-mentioned loam cake of the present invention preferably caves inward in the one side of this pedestal relatively and is formed with a groove, and this light emitting diode is arranged in this groove.
As another optimal technical scheme, the above-mentioned LED source of the present invention preferably includes three luminescent grains that are respectively red, green, blue, preferably also comprise one be arranged at be used to disperse between this light source and this supporting part and homogenising from the optical module of these crystal grain light beams.
As an optimal technical scheme again, the present invention comprises also that preferably one is arranged at the liquid-crystal apparatus that is used to show an image data between this light source and this supporting part.
For solve the problems of the technologies described above two, tester table provided by the invention is used to test the photometry sensor for the treatment of with plural pin, it comprises a power supply and a photo-sensor detection, this photo-sensor detection comprises:
One pedestal, this pedestal have one for putting and be electrically connected the supporting part that this treats photometry sensor;
One loam cake, be covered on this pedestal top on being somebody's turn to do, and can move for this being treated the photometry sensor packing is electrically connected between the make-position of this supporting part for inserting/shift out this open site to one for the treatment of photometry sensor one, and have one in this loam cake at least and be subjected to this power supply activation and light emission direction to be configured to treat the LED source of photometry sensor towards this with respect to this pedestal;
One accessory drive, this accessory drive comprise a processor and are subjected to this processor instruction and drive the driver of this loam cake.
As optimal technical scheme, the above-mentioned tester table of the present invention comprises also that preferably a pneumatic cylinder and is subjected to this pneumatic cylinder to drive and connect and activate the mechanical arm of this loam cake.
As another optimal technical scheme, the above-mentioned tester table of the present invention preferably also comprises one in order to show the display device from these accessory drive data.
As an optimal technical scheme again, the above-mentioned tester table of the present invention preferably also comprises one in order to noting down this light source irradiation to this supporting part brightness distribution data, and is used for this processor and records the memory storage of data comparison with treat photometry sensor from this.
With respect to prior art, the tester table of photo-sensor detection of the present invention and this device of tool is owing to be covered with at least one light emitting diode last, in order to treat as light source in the photometry sensor to carry out test jobs, need not assemblies such as high-pressure discharge lamp and light processor, just can significantly dwindle the overall volume of pick-up unit, thereby also can reduce cost; But and acceleration detection speed and promote accuracy of detection; And the time waste that reduces the replacing light source.
Description of drawings
Fig. 1 is the front elevational schematic of traditional light sensor test board system;
Fig. 2 is the part structure for amplifying synoptic diagram of pick-up unit among Fig. 1;
Fig. 3 is the structural representation of one of photo-sensor detection of the present invention preferred embodiment;
Fig. 4 is a pedestal vertical view (base-plates surface of pick-up unit is described) partly among Fig. 3;
Fig. 5 is the structural representation of another preferred embodiment of photo-sensor detection of the present invention;
Fig. 6 is to use the structure calcspar of one of photo-sensor detection of the present invention tester table;
Fig. 7 is the structural representation of the 3rd preferred embodiment of photo-sensor detection of the present invention.
Wherein: 1 is tester table; 2 is photo-sensor detection; 3 for treating photometry sensor; 4 is pneumatic cylinder; 5 is power supply; 6 is control device; 7 is display device; 8 is tester table; 9 is memory storage; 10 is high-pressure discharge lamp; 11 is light processor; 12 is holder; 13 is optical sensor; 20,20 ' is pedestal; 21,21 ', 120 is loam cake; 22,221 ', 222 ', 223 ' is light emitting diode; 23,23 ' is shallow storage space; 24,24 ' is the metal lead foot; 25 is liquid crystal board; 25 ' is dodging device; 40 is mechanical arm; 110 is halo; 121 are perforation; 122 is lead; 200 is supporting part; 210 is groove.
Embodiment
Aforementioned and other technology contents, characteristics and effect about the present invention in the detailed description of following conjunction with figs. and several preferred embodiments, can clearly present.
As shown in Figure 3-4, the photo-sensor detection 2 of the built-in illuminating source that provides of a preferred embodiment of the present invention comprises a pedestal 20, a loam cake 21 and at least one light emitting diode 22.Pedestal 20 has a supporting part 200, in the present embodiment, is formed with a square shallow storage space 23 on this supporting part 200, treats photometry sensor 3 (for example a CMOS or CCD chip) storing for one.This shallow storage space 23 is not limited to above-mentioned shape, also can be a groove or other any common limit configuration.As shown in Figure 4, supporting part 200 evenly is provided with most metal lead foots 24 in the present embodiment around the diapire that forms shallow storage space 23, treat pin and its electric connection of photometry sensor 3 for this, and these metal lead foots 24 are arranged in parallel by this supporting part 200 and extend to the perisporium place of close pedestal 20 to the direction for the treatment of photometry sensor 3 away from this.Optical sensor 3 obtains to drive from the electric energy of board by this, and is electric signal output with the Beam Transformation that records.Loam cake 21 is fixedly arranged on pedestal 20 tops through a pivot, and can be for being a closure or openness state with respect to this pedestal 20 pivotally.Loam cake 21 caves inward in the relative one side of this pedestal 20 and forms a groove 210, and the white light emitting diode crystal grain 22 in the present embodiment promptly is arranged in this groove 210.
As shown in Figure 3-4, during actual the test, at first loam cake 21 is placed opening (shown in dotted line), and will treat that photometry sensor 3 inserts in the shallow storage space 23 of pedestal.Then cover this loam cake 21, will treat that photometry sensor 3 downward packings are to being electrically connected these lead foots 24.Light emitting diode 22 is enabled luminous subsequently, and make the luminous bundle of institute treat photometry sensor 3 surfaces via for example investing this as one of optical module liquid crystal board 25, treat that each sensing cell in the photometry sensor 3 (is structure cell, indicate among the figure) receive through the shown image data of liquid crystal board 25, and convert corresponding sensing signal to, via lead foot 24 these sensing signals are reached in the control device, thereby learn test result, and in follow-uply compensate, classification (OQC), and reduce the operations such as picture element number, GTG of sub-quality products.
Because the driven for emitting lights technology of light emitting diode 22 is extremely ripe, no matter be control luminous intensity, image striped, figure etc., all be highly susceptible to reaching, and luminous Wavelength stabilized, make that the luminous bundle of light source institute is quite desirable, thereby promote the precision of measuring.
And whether the activation by power supply is controlled, change the speed of the luminous signal of light source institute, more convenient and quick than the machinery control variation of conventional art rotation halo, not only cause the volume of tester table significantly to reduce, more obvious shortening detects required spended time, thereby promotes detection efficiency.
As shown in Figure 5, the photo-sensor detection of the built-in illuminating source that another preferred embodiment of the present invention provides, it is to be that the loam cake 21 of present embodiment is to be connected a mechanical arm 40 that driven by pneumatic cylinder 4 with last embodiment main difference place, interlock loam cake 21 moves up and down in order to do driving this mechanical arm 40 with pneumatic cylinder 4, after making loam cake 21 insert optical sensor to be measured in pedestal 20, packing downwards is to closure state; And after finishing, test upwardly opens.
Certainly, can understand easily in this operator as ripe, the optical module of last embodiment is also inessential, preferable based on the used stability of light source of present embodiment, therefore can be when calibration in advance, earlier an optimal light sample sensor is placed supporting part, with measure each crystal grain luminous bundle expose to pattern when treating photometry sensor, and be recorded in the memory storage 9.So when using the tester table 8 of photo-sensor detection 2 of the present invention, as shown in Figure 6, behind power supply 5 activation photo-sensor detections 2, will be from the measurement signal input control device 6 of photo-sensor detection 2, and the record data that prestore in this signal and the memory storage 9 are compared, and relevant information is shown on the display device 7 by control device 6.
The control device 6 of present embodiment is one to include the calculator device of processor, can carry out calculation process according to built-in program, to export corresponding instruction or data; 5 of power supplies can be subjected to the corresponding voltage of control output of this control device 6, in order to the keying and the brightness of the light emitting diode 22 in the control photo-sensor detection 2.9 of memory storages in order to note down this light source irradiation to these supporting part 200 brightness distribution data, and record the data comparison with treat photometry sensor 3 from this for the processor in this control device 6, display device 7 (for example being a LCD) is given operating personnel for the demonstration test data and is supervised.
By above-mentioned structure, owing to will be built in the light emitting diode 22 in the loam cake 21 of photo-sensor detection 2,, not only significantly dwindle the overall volume of photo-sensor detection 2 because built-in illuminating source is arranged, manufacturing cost is significantly reduced.Its wavelength of the light intensity of light emitting diode 22 can be controlled and change again, and have Wavelength stabilized characteristic, and than the various requirement of coincidence detection, not only control is easier, also can effectively promote detection rates and degree of accuracy; And the life-span of light emitting diode 22 is longer, therefore need not often change light source, and cost also greatly reduces.
As shown in Figure 7, the photo-sensor detection of the built-in illuminating source that the present invention's the 3rd preferred embodiment provides, except that the pedestal 20 ' identical, loam cake 21 ', shallow storage space 23 ' with previous embodiment, and structure such as lead foot 24 ', and the red, green, blue three-color LED 221 ', 222 ' that separates with each coloured light, 223 ' alignment arrangements are as light source; And can select respectively activation luminous or colour mixture is luminous according to demand.Certainly, can understand easily in this operator as ripe, according to the disclosed structure of present embodiment, it is more undesirable to have luminous uniformity coefficient only, therefore as when not needing when detecting to judge at the quality of each structure cell with specific pattern, shown in present embodiment, will be at light emitting diode 221 ', 222 ', 223 ' and treat 3 of photometry sensors, additionally be provided with one disperse and homogenising from the optical module of these LED crystal particle 221 ', 222 ', 223 ' light beam; Adopt for example dodging device 25 ' herein, as dispersing projecting beam, making light beam evenly be projected to the optical module for the treatment of photometry sensor 3; Certainly, also can adopt for example common optical devices such as optical lens group.
Claims (10)
1. the photo-sensor detection of a built-in illuminating source is used to test the photometry sensor for the treatment of with plural pin, it is characterized in that it comprises:
One pedestal, this pedestal have one for putting and be electrically connected the supporting part that this treats photometry sensor;
One loam cake, this loam cake is hubbed at this pedestal top through a pivot, and can move for this being treated the photometry sensor packing is electrically connected between the make-position of this supporting part for inserting/shift out this open site to one for the treatment of photometry sensor one, and has the LED source that a light emission direction is configured to treat towards this photometry sensor in this loam cake with respect to this pedestal.
2. the photo-sensor detection of built-in illuminating source according to claim 1 is characterized in that, this pedestal supporting part is provided with this and treats that the photometry sensor pin is corresponding and power supply connects, treats the plural lead foot of photometry sensor signal for transmitting this.
3. the photo-sensor detection of built-in illuminating source according to claim 1 is characterized in that, this loam cake caves inward in the relative one side of this pedestal and is formed with a groove, and this light emitting diode is arranged in this groove.
4. the photo-sensor detection of built-in illuminating source according to claim 1 is characterized in that, this LED source comprises three luminescent grains that are respectively red, green, blue.
5. the photo-sensor detection of built-in illuminating source according to claim 4 is characterized in that, also comprise one be arranged at be used to disperse between this light source and this supporting part and homogenising from the optical module of these crystal grain light beams.
6. the photo-sensor detection of built-in illuminating source according to claim 1 is characterized in that, comprises that also one is arranged at the liquid-crystal apparatus that is used to show an image data between this light source and this supporting part.
7. a tester table is used to test the photometry sensor for the treatment of with plural pin, it is characterized in that, it comprises a power supply and a photo-sensor detection, and this photo-sensor detection comprises:
One pedestal, this pedestal have one for putting and be electrically connected the supporting part that this treats photometry sensor;
One loam cake, this loam cake is hubbed at this pedestal top through a pivot, and can move for this being treated the photometry sensor packing is electrically connected between the make-position of this supporting part for inserting/shift out this open site to one for the treatment of photometry sensor one, and have one in this loam cake at least and be subjected to this power supply activation and light emission direction to be configured to treat the LED source of photometry sensor towards this with respect to this pedestal;
One accessory drive, this accessory drive comprise a processor and are subjected to this processor instruction and drive the driver of this loam cake.
8. tester table according to claim 7 is characterized in that, comprises that also a pneumatic cylinder and is subjected to this pneumatic cylinder to drive and connect and activate the mechanical arm of this loam cake.
9. tester table according to claim 7 is characterized in that, also comprises one in order to show the display device from these accessory drive data.
10. tester table according to claim 7 is characterized in that, also comprises one in order to noting down this light source irradiation to this supporting part brightness distribution data, and is used for this processor and records the memory storage of data comparison with treat photometry sensor from this.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200610148092 CN101210951B (en) | 2006-12-27 | 2006-12-27 | Built-in illuminating source photo-sensor detection device and test bench possessing same |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200610148092 CN101210951B (en) | 2006-12-27 | 2006-12-27 | Built-in illuminating source photo-sensor detection device and test bench possessing same |
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| CN101210951A CN101210951A (en) | 2008-07-02 |
| CN101210951B true CN101210951B (en) | 2010-12-22 |
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Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101726404B (en) * | 2008-10-15 | 2012-10-10 | 中茂电子(深圳)有限公司 | Detection platform for luminous component with a plurality of luminous elements and detection method thereof |
| TWI454722B (en) * | 2010-12-03 | 2014-10-01 | Lextar Electronics Corp | Inspection machine, inspecting method and inspecting system |
| US9083946B2 (en) * | 2012-02-21 | 2015-07-14 | Rockwell Automation Technologies, Inc. | System to detect failed pixels in a sensor array |
| US8872113B2 (en) * | 2012-02-21 | 2014-10-28 | Rockwell Automation Technologies, Inc. | System to test performance of pixels in a sensor array |
| CN103808981B (en) * | 2012-11-13 | 2016-12-21 | 昆山西钛微电子科技有限公司 | There is the image sensor dice test fixture of testing light source |
| TWI464434B (en) * | 2013-05-15 | 2014-12-11 | Upi Semiconductor Corp | Auto testing apparatus and auto testing method thereof |
| CN103267938B (en) * | 2013-05-17 | 2016-03-30 | 嘉兴景焱智能装备技术有限公司 | CIS wafer becomes survey machine |
| TWI561635B (en) * | 2014-11-14 | 2016-12-11 | Ind Tech Res Inst | Constant-temperature rotation device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN2393107Y (en) * | 1999-10-12 | 2000-08-23 | 汎太半导体股份有限公司 | Detection device for image sensing apparatus |
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Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2393107Y (en) * | 1999-10-12 | 2000-08-23 | 汎太半导体股份有限公司 | Detection device for image sensing apparatus |
Non-Patent Citations (3)
| Title |
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| JP特开2003-209862A 2003.07.25 |
| JP特开2004-287368A 2004.10.14 |
| JP特开平9-269276A 1997.10.14 |
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