CN103616167B - A kind of Automatic detection system for luminance uniformity of backlight source - Google Patents
A kind of Automatic detection system for luminance uniformity of backlight source Download PDFInfo
- Publication number
- CN103616167B CN103616167B CN201310651298.8A CN201310651298A CN103616167B CN 103616167 B CN103616167 B CN 103616167B CN 201310651298 A CN201310651298 A CN 201310651298A CN 103616167 B CN103616167 B CN 103616167B
- Authority
- CN
- China
- Prior art keywords
- backlight
- measured
- track structure
- detector
- photo
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The present invention relates to a kind of Automatic detection system for luminance uniformity of backlight source, it is characterized in that, comprising: a chamber, darkroom, be provided with a chamber door on front side of chamber, described darkroom, two sides bottom symmetrical is provided with two windows, transmits backlight to be measured for streamline framework; One drives interface; One control panel; One photo-detector; One mechanical component; One marker assemblies; And an operation control module, connect described driving interface, control panel, photo-detector, mechanical component and marker assemblies, carry out the collection of data and control in real time.Photo-detector of the present invention can all around move freely up and down, adopts driving interface able to programme, and compatible good, can arrange different parameters and test difference backlight to be measured, pipelining is convenient and swift.
Description
Technical field
The present invention relates to backlight detection field, especially a kind of Automatic detection system for luminance uniformity of backlight source.
Background technology
Backlight is positioned at liquid crystal display (LCD) a kind of light source behind, and its illumination effect will directly have influence on LCD MODULE (LCM) visual effect.Liquid crystal display itself is not luminous, and its display graphics or character are the results that it is modulated light.
Common backlight has point source of light (LED), linear light source (CCFL, HCFL), flat light source (VFD, EL, OLED, FED), wherein light guide plate is also needed to be converted into area source as point source of light and linear light source, to ensure the homogeneity of backlight entirety.
The technology such as LCD usually use backlight, the quality of backlight directly has influence on the performance of LCD screen complete machine, the unevenness of backlight also just means the uneven of later stage red, green, blue three primary colours, cause the aberration of picture zones of different, even white balance is unbalance, and this is also the meaning that backlight uniformity of luminance detects.
Existing industrial backlight homogeneity detects and adopts semi-automatic detection or manual detection often, and these two kinds of method efficiency are low, out of true, machinery must be adopted to substitute manually so have.Existing light source detection technology has, but also little for the technology of backlight homogeneity detection, therefore has its necessity for the invention that backlight homogeneity detects.
Summary of the invention
In view of this, the object of this invention is to provide a kind of Automatic detection system for luminance uniformity of backlight source, by the intensity signal of photo-detector acquisition time backlight zones of different to be measured, judge its homogeneity.
The present invention adopts following scheme to realize: a kind of Automatic detection system for luminance uniformity of backlight source, is characterized in that, comprising:
One chamber, darkroom, be provided with a chamber door on front side of chamber, described darkroom, two sides bottom symmetrical is provided with two windows, transmits backlight to be measured for streamline framework;
One drives interface, is arranged on described streamline framework, for connecting described backlight to be measured;
One control panel, is arranged at outside chamber, described darkroom, for showing and arranging mode of operation and parameter;
One photo-detector, for gathering the light-emitting data of described backlight to be measured;
One mechanical component, for fixing and mobile described photo-detector, enables described photo-detector move up and down all around;
Whether qualified one marker assemblies is for marking described backlight to be measured; And
One operation control module, connects described driving interface, control panel, photo-detector, mechanical component and marker assemblies, carries out the collection of data and controls in real time.
In an embodiment of the present invention, described mechanical component comprises:
One first track structure, described first track structure comprises four parallel to each other and tracks be fixed on inside chamber, described darkroom two, and its direction is vertical direction;
One second track structure, described second track structure comprises two parallel to each other and tracks be articulated with on described first track structure, and its direction is horizontal direction, and described second track structure can slide up and down on described first track structure; Described second track structure comprises stop, and described stop is for regulating and fix the vertical position of described second track structure;
One the 3rd track structure, is articulated with on described second track structure, can moves left and right along the second track structure; And
One arm, described photo-detector is fixed on described arm, and described arm to be articulated with on described 3rd track structure and can to move forward and backward on described 3rd track structure.
In an embodiment of the present invention, when described backlight to be measured accesses described driving interface, and enter chamber, described darkroom through the transmission of described streamline framework, described operation control module is according to the mode of operation arranged, electric signal is transferred to described backlight to be measured through described driving interface, described backlight to be measured is divided into some regions time-sharing work, described photo-detector gathers the illuminated message of zones of different and transfers described operation control module analyzing and processing, and it is whether qualified that described operation control module controls the described backlight to be measured of described marker assemblies mark according to analysis result.
In an embodiment of the present invention, described operation control module contains the reference data in qualified uniform backlight source, the reference data in the illuminated message that described photo-detector gathers by described operation control module and described qualified uniform backlight source contrasts, whether qualified to judge described backlight to be measured.
In an embodiment of the present invention, described operation control module directly calculates each segmented areas light intensity theoretical value according to described backlight to be measured and described photo-detector spacing, described backlight size to be measured, described photo-detector useful area information, whether qualified to judge described backlight to be measured.
In an embodiment of the present invention, described homogeneity automatic checkout system can form streamline with existing detection system, saves cost.
In an embodiment of the present invention, described backlight to be measured is area source or pointolite array.
In an embodiment of the present invention, described driving interface is programmable interface, according to the difference of backlight kind to be measured and model, arranges and drives interface voltage, I/O pig's tongue number information to facilitate the compatibility of different backlight to be measured.
In an embodiment of the present invention, described backlight to be measured is of a size of 4 inches ~ 100 inches, and size setting in chamber, described darkroom is greater than described backlight size to be measured.
In an embodiment of the present invention, some regions are divided into carry out respectively testing its illumination effect described backlight to be measured by programming Control.
Remarkable advantage of the present invention is that backlight to be measured can detect Using Free Partition, and photo-detector can move freely up and down, adopt driving interface able to programme all around, compatible good, can arrange different parameters to test difference backlight to be measured, pipelining is convenient and swift.
Accompanying drawing explanation
Fig. 1 is a kind of Automatic detection system for luminance uniformity of backlight source one-piece construction figure provided by the invention.
Fig. 2 is mechanical component structural representation in the present invention.
Fig. 3 is backlight piecemeal schematic diagram to be measured in the present invention.
Fig. 4 is photo-detector of the present invention probe and backlight location diagram to be measured.
Illustrate: chamber, 11-darkroom, 111-chamber door, 112-window, 12-drives interface, 13-control panel, 14-photo-detector, 15-mechanical component, 151-first track structure, 152-second track structure, 153-the 3rd track structure, 154-arm, 16-marker assemblies, 17-operation control module, 18-streamline framework, 19-backlight to be measured.
Embodiment
For making object of the present invention, technical scheme and advantage clearly understand, below by specific embodiment and relevant drawings, the present invention will be described in further detail.In the drawings, the mechanical hook-ups such as cavity, track, streamline are simplified model, should not be considered to strictly show its parameter, physical dimension.At this, reference diagram is the schematic diagram of idealized embodiments of the present invention, and illustrated embodiment should not be considered to the given shape being only limitted to the region shown in figure, but comprises obtained shape, such as manufactures the deviation caused.Part accessory in the present embodiment, the expression in figure is schematic, but this should not be considered to limit the scope of the invention.
As shown in Figure 1, the invention provides a kind of Automatic detection system for luminance uniformity of backlight source, comprising:
One chamber, darkroom 11, is provided with a chamber door 111 on front side of chamber, described darkroom 11, two sides, chamber, darkroom 11 bottom symmetrical is provided with two windows 112, transmits backlight 19 to be measured for streamline framework 18;
One drives interface 12, is arranged on described streamline framework 18, for connecting described backlight to be measured 19;
One control panel 13, is arranged at outside chamber, described darkroom 11, for showing and arranging mode of operation and parameter;
One photo-detector 14, for gathering the light-emitting data of described backlight to be measured 19;
One mechanical component 15, for fixing and mobile described photo-detector 14, makes described photo-detector 14 move freely up and down all around;
Whether qualified one marker assemblies 16 is for marking described backlight to be measured 19; And
One operation control module 17, connects described driving interface 12, control panel 13, photo-detector 14, mechanical component 15 and marker assemblies 16, carries out the collection of data and controls in real time.
As shown in Figure 2, described mechanical component 15 comprises:
One first track structure 151, described first track structure 151 comprise four parallel to each other and be fixed on the track of 11 liang of inner sides, chamber, described darkroom, and its direction is vertical direction;
One second track structure 152, described second track structure 152 comprises two parallel to each other and tracks be articulated with on described first track structure 151, and its direction is horizontal direction, described second track structure 152 can slide up and down on described first track structure 151; Described second track structure 152 comprises stop (not shown), and described stop is for regulating and fix the vertical position of described second track structure 152;
One the 3rd track structure 153, is articulated with on described second track structure 152, can moves left and right along the second track structure 152; And
One arm 154, described photo-detector 14 is fixed on described arm 154, and described arm 154 to be articulated with on described 3rd track structure 153 and can to move forward and backward on described 3rd track structure 153.
It is worth mentioning that described mechanical component 15 also should comprise necessary driving arrangement (as motor), connection, fixing and locking accessory, stop etc., simplify in the present embodiment.
When described backlight to be measured accesses described driving interface, and enter chamber, described darkroom through the transmission of described streamline framework, the mode of operation of described operation control module set by user, electric signal is transferred to described backlight to be measured through described driving interface, described backlight to be measured is divided into some regions time-sharing work and (utilizes described mechanical component can control photo-detector all around to move freely up and down, can according to difference backlight to be measured, different positions is selected to detect), described photo-detector gathers the illuminated message of zones of different and transfers described operation control module analyzing and processing, it is whether qualified that described operation control module controls the described backlight to be measured of described marker assemblies mark according to analysis result.
Preferably, described operation control module contains the reference data in qualified uniform backlight source, the reference data in the illuminated message that described photo-detector gathers by described operation control module and described qualified uniform backlight source carries out contrasting (uniformity of luminance error ± 1% ~ ± 5%), whether qualified to judge described backlight to be measured, it is worth mentioning that described backlight reference data is normal backlight source test gained, or be empirical value gained.
It is worth mentioning that, described operation control module also can be directly calculate each segmented areas light intensity theoretical value (uniformity of luminance error ± 1% ~ ± 5%) according to information such as described backlight to be measured and described photo-detector spacing, described backlight size to be measured, described photo-detector useful area, whether qualified to judge described backlight to be measured.
Obtain according to square distance law of reciprocity:
The radiation flux that the isotropy area unit that ∵ radiance is L again launches in the circular cone of subtended angle for α is:
As shown in Figure 4, obtain with backlight geometry to be measured and position relationship according to photo-detector probe:
R
2=x
2+y
2+h
2（4），
Wherein, φ is pointolite radiation flux, and R is photo-detector probe and the infinitesimal distance on light source to be measured.
Simultaneous (1), (2), (3), (4) obtain:
Preferably, described homogeneity automatic checkout system can form streamline with other existing detection systems, saves cost; Described backlight to be measured is area source or pointolite array; Described driving interface is programmable interface, according to the difference of backlight kind to be measured and model, arranges and drives the information such as interface voltage, I/O pig's tongue number to facilitate the compatibility of different backlight to be measured; Described backlight to be measured is of a size of 4 inches ~ 100 inches, and size setting in chamber, described darkroom is slightly larger than described backlight size to be measured.
Some regions can be divided into carry out respectively testing its illumination effect (user according to demand, can carry out array piecemeal to described backlight to be measured) described backlight to be measured by programming Control.As shown in Figure 3, described backlight to be measured is divided into 4 × 4 arrays.
The principle of work of the present embodiment is described below: described mechanical component regulates described photo-detector to move up and down and regulates its height, described backlight to be measured connects driving interface, backlight to be measured is sent in chamber, darkroom by described streamline, described backlight to be measured controls to carry out subregion work by operation control module, described mechanical component drives described photo-detector block-by-block to move, record the photometric data of backlight regional to be measured respectively, and judge that whether backlight to be measured is even.
Backlight to be measured is divided into some pieces by the present invention, drives each block luminous respectively and gathers its illumination intensity information by photo-detector, analyzing backlight uniformity of luminance to be measured, filter out unacceptable product by internal arithmetic control module.
Above-listed preferred embodiment; the object, technical solutions and advantages of the present invention are further described; be understood that; the foregoing is only preferred embodiment of the present invention; not in order to limit the present invention; within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (9)
1. an Automatic detection system for luminance uniformity of backlight source, is characterized in that, comprising:
One chamber, darkroom, be provided with a chamber door on front side of chamber, described darkroom, two sides bottom symmetrical is provided with two windows, transmits backlight to be measured for streamline framework;
One drives interface, is arranged on described streamline framework, for connecting described backlight to be measured;
One control panel, is arranged at outside chamber, described darkroom, for showing and arranging mode of operation and parameter;
One photo-detector, for gathering the light-emitting data of described backlight to be measured;
One mechanical component, for fixing and mobile described photo-detector, enables described photo-detector move up and down all around;
Whether qualified one marker assemblies is for marking described backlight to be measured; And
One operation control module, connects described driving interface, control panel, photo-detector, mechanical component and marker assemblies, carries out the collection of data and controls in real time;
Described mechanical component comprises:
One first track structure, described first track structure comprises four parallel to each other and tracks be fixed on inside chamber, described darkroom two, and its direction is vertical direction;
One second track structure, described second track structure comprises two parallel to each other and tracks be articulated with on described first track structure, and its direction is horizontal direction, and described second track structure can slide up and down on described first track structure; Described second track structure comprises stop, and described stop is for regulating and fix the vertical position of described second track structure;
One the 3rd track structure, is articulated with on described second track structure, can moves left and right along the second track structure; And
One arm, described photo-detector is fixed on described arm, and described arm to be articulated with on described 3rd track structure and can to move forward and backward on described 3rd track structure.
2. a kind of Automatic detection system for luminance uniformity of backlight source according to claim 1, it is characterized in that: when described backlight to be measured accesses described driving interface, and enter chamber, described darkroom through the transmission of described streamline framework, described operation control module is according to the mode of operation arranged, electric signal is transferred to described backlight to be measured through described driving interface, described backlight to be measured is divided into some regions time-sharing work, described photo-detector gathers the illuminated message of zones of different and transfers described operation control module analyzing and processing, it is whether qualified that described operation control module controls the described backlight to be measured of described marker assemblies mark according to analysis result.
3. a kind of Automatic detection system for luminance uniformity of backlight source according to claim 2, it is characterized in that: described operation control module contains the reference data in qualified uniform backlight source, the reference data in the illuminated message that described photo-detector gathers by described operation control module and described qualified uniform backlight source contrasts, whether qualified to judge described backlight to be measured.
4. a kind of Automatic detection system for luminance uniformity of backlight source according to claim 2, it is characterized in that: described operation control module directly calculates each segmented areas light intensity theoretical value according to described backlight to be measured and described photo-detector spacing, described backlight size to be measured, described photo-detector useful area information, whether qualified to judge described backlight to be measured.
5. a kind of Automatic detection system for luminance uniformity of backlight source according to claim 1, is characterized in that: described homogeneity automatic checkout system can form streamline with existing detection system, saves cost.
6. a kind of Automatic detection system for luminance uniformity of backlight source according to claim 1, is characterized in that: described backlight to be measured is area source or pointolite array.
7. a kind of Automatic detection system for luminance uniformity of backlight source according to claim 1, it is characterized in that: described driving interface is programmable interface, according to the difference of backlight kind to be measured and model, arrange and drive interface voltage, I/O pig's tongue number information to facilitate the compatibility of different backlight to be measured.
8. a kind of Automatic detection system for luminance uniformity of backlight source according to claim 1, is characterized in that: described backlight to be measured is of a size of 4 inches ~ 100 inches, and size setting in chamber, described darkroom is greater than described backlight size to be measured.
9. a kind of Automatic detection system for luminance uniformity of backlight source according to claim 1, is characterized in that: be divided into some regions to carry out respectively testing its illumination effect described backlight to be measured by programming Control.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310651298.8A CN103616167B (en) | 2013-12-05 | 2013-12-05 | A kind of Automatic detection system for luminance uniformity of backlight source |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310651298.8A CN103616167B (en) | 2013-12-05 | 2013-12-05 | A kind of Automatic detection system for luminance uniformity of backlight source |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103616167A CN103616167A (en) | 2014-03-05 |
| CN103616167B true CN103616167B (en) | 2016-03-09 |
Family
ID=50166873
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310651298.8A Active CN103616167B (en) | 2013-12-05 | 2013-12-05 | A kind of Automatic detection system for luminance uniformity of backlight source |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103616167B (en) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104931233B (en) * | 2015-07-03 | 2018-04-27 | 东莞市彤光电子科技有限公司 | A kind of leaded light board checking device |
| CN105049836B (en) * | 2015-07-08 | 2017-03-01 | 四川长虹电器股份有限公司 | The quick inspection method in LED television backlight subarea |
| CN108447430B (en) * | 2018-03-09 | 2021-03-26 | Oppo广东移动通信有限公司 | Backlight detection device and backlight detection method |
| CN108776002B (en) * | 2018-05-28 | 2024-04-12 | 中国科学院西安光学精密机械研究所 | Uniform light source angle uniformity testing device and method |
| CN109029920A (en) * | 2018-07-18 | 2018-12-18 | 台龙电子（昆山）有限公司 | A kind of detection device with the flexible luminescent screen light source of adjusting |
| CN109269635A (en) * | 2018-08-02 | 2019-01-25 | 苏州汇影光学技术有限公司 | A kind of light source power detection device and method |
| CN109443707A (en) * | 2018-11-26 | 2019-03-08 | 中国科学院长春光学精密机械与物理研究所 | A kind of area source brightness uniformity detection device and method |
| CN110319927B (en) * | 2019-06-27 | 2021-10-08 | 歌尔股份有限公司 | Calibration device |
| CN114495776B (en) * | 2021-12-28 | 2024-06-18 | 深圳市艾比森光电股份有限公司 | Device and method for collecting luminous data of display screen |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101118719A (en) * | 2007-08-29 | 2008-02-06 | 浙江大学 | Gantry type four dimensional automatic measurement used for detecting display screen color performance |
| CN101466999A (en) * | 2006-06-12 | 2009-06-24 | 夏普株式会社 | End inclination angle measuring method, inspecting method and inspecting apparatus for objects having undulations, method for determining the position of illuminating means, irregularity inspecting ap |
| CN102621155A (en) * | 2011-02-01 | 2012-08-01 | 郭上鲲 | Apparatus for optical inspection |
| CN102803917A (en) * | 2009-06-18 | 2012-11-28 | 夏普株式会社 | Defect inspection method and defect inspection device for display panel |
| CN103210294A (en) * | 2010-11-15 | 2013-07-17 | 富士胶片株式会社 | Optical characteristic measuring device and method |
| CN103257467A (en) * | 2013-05-10 | 2013-08-21 | 京东方科技集团股份有限公司 | Module inspecting device for liquid crystal display (LCD) |
-
2013
- 2013-12-05 CN CN201310651298.8A patent/CN103616167B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101466999A (en) * | 2006-06-12 | 2009-06-24 | 夏普株式会社 | End inclination angle measuring method, inspecting method and inspecting apparatus for objects having undulations, method for determining the position of illuminating means, irregularity inspecting ap |
| CN101118719A (en) * | 2007-08-29 | 2008-02-06 | 浙江大学 | Gantry type four dimensional automatic measurement used for detecting display screen color performance |
| CN102803917A (en) * | 2009-06-18 | 2012-11-28 | 夏普株式会社 | Defect inspection method and defect inspection device for display panel |
| CN103210294A (en) * | 2010-11-15 | 2013-07-17 | 富士胶片株式会社 | Optical characteristic measuring device and method |
| CN102621155A (en) * | 2011-02-01 | 2012-08-01 | 郭上鲲 | Apparatus for optical inspection |
| CN103257467A (en) * | 2013-05-10 | 2013-08-21 | 京东方科技集团股份有限公司 | Module inspecting device for liquid crystal display (LCD) |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103616167A (en) | 2014-03-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103616167B (en) | A kind of Automatic detection system for luminance uniformity of backlight source | |
| US9454024B1 (en) | Composite repairing apparatus for liquid crystal panel | |
| US20090219521A1 (en) | Inspection apparatus for liquid crystal display device and inspection method using the same | |
| CN203981379U (en) | A kind of optical characteristic test board of flat-panel monitor | |
| CN103630332B (en) | Backlight brightness uniformity measuring device and method | |
| KR101068364B1 (en) | inspection equipment of LCD and method for inspecting the same | |
| CN203444234U (en) | Lens testing device | |
| CN102590221A (en) | Apparent defect detecting system and detecting method of polarizer | |
| CN103336404B (en) | A kind of lens test device and method | |
| CN106556607B (en) | Identify the device and method of panel surface dust | |
| CN105548217A (en) | Appearance inspection device and method of film coating product | |
| CN104345481A (en) | Liquid crystal display quality inspection method, device and equipment | |
| CN103032838A (en) | Fixing device and detection system | |
| CN103177660A (en) | Image display apparatus | |
| CN202177589U (en) | Full-automatic optical detecting system for ITO electro-conductive glass | |
| CN101210951A (en) | Built-in illuminating source photo-sensor detection device and test bench possessing same | |
| CN205103181U (en) | Transparent slice product appearance defect imaging system | |
| CN204009279U (en) | LCDs visual angle testing jig | |
| CN204229077U (en) | LCD LCD screen detection device | |
| CN106128314A (en) | A kind of indoor full-color mosaic screen and bearing calibration thereof | |
| CN201170819Y (en) | System for detecting and locating panel bad point of planar display | |
| CN202916071U (en) | Transparent display device test device | |
| CN204989681U (en) | Acquire LCD screen detection images's device | |
| CN201438108U (en) | Visual identifying system | |
| CN202166618U (en) | Detection device for solar cell piece of satellite solar wing |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |