CN205103181U - Transparent slice product appearance defect imaging system - Google Patents
Transparent slice product appearance defect imaging system Download PDFInfo
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- CN205103181U CN205103181U CN201520918047.6U CN201520918047U CN205103181U CN 205103181 U CN205103181 U CN 205103181U CN 201520918047 U CN201520918047 U CN 201520918047U CN 205103181 U CN205103181 U CN 205103181U
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- linear array
- light source
- acquisition system
- scattering light
- array images
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Abstract
The utility model relates to a transparent slice product appearance defect imaging system, examine the article carrier including linear array image acquisition system, face scattering light source and quilt, linear array image acquisition system includes linear array camera, camera lens, industrial computer, the camera lens is installed on the linear array camera, and the linear array camera is connected with the industry control is electromechanical, diffusing panel, LED lamp, heat dissipation base are drawn together to face scattered light source packet, the LED lamp fixing is on the heat dissipation base, and the diffusing panel is installed in LED lamp the place ahead, the article carrier of examining lies in a scattering light source below, linear array image acquisition ystem installation is being examined article carrier top, and the optical axis of linear array image acquisition system is greater than 45 with the normal line contained angle of being examined article carrier upper surface and is less than 90, the article carrier of examining moves on can following the horizontal direction, and the diffusing panel of face scattering light source is not crossing about the image line of normal line with the optical axis of linear array image acquisition system. The advantage: clear can the observation of whole defect formation of image, tiny defect can be observed, various types of defects regional order of severity reach unanimity with actual conditions.
Description
Technical field
The utility model belongs to machine vision and gauge check technical field, relates to a kind of transparent sheet-like product appearance defect imaging system; Be specially adapted to all kinds of transparent and translucent sheet industrial products, as the finished product of display screen, the open defect Machine Vision Detection of semi-manufacture and required various flaky material or assembly.
Background technology
The imaging performance of any imaging system is all be decided by four key factors: the image capturing system type selected is face battle array or linear array, the three installation site relativeness of the shape of the light source selected, the luminescence feature of light source selected, tested product and light source and image capturing system;
A large amount of practice and theoretical analysis confirm, transparent sheet-like product appearance defect imaging system, generally need the optical axis of image capturing system to be not orthogonal to tested product surface, could obtain good imaging effect.Therefore all forms selecting face battle array image capturing system, all exist focal plane can not with tested product planes overlapping, and then can not the problem of blur-free imaging; And select the form of linear array images acquisition system, when coordinating linear array images acquisition system to use, two kinds of defects can be there are in various backlight, various strip source or various quasi-parallel light source; The first, if the installation site of light source can not make linear array images acquisition system by the mirror image of tested area planar or transmission Functional observation to bright field, so, this system just only effectively can identify the defect point of defect area inter normal direction in specific smaller angle interval, causes the unintelligible problem that even can not be observed of general defect imaging; It two is, if the installation site of light source, linear array images acquisition system can be made by the mirror image of tested area planar or transmission Functional observation to bright field, so, the background gray scale that this system just exists image is higher, cause the problem that picture contrast declines, some tiny defects are enhanced gray scale due to the impact of periphery high gray areas or the low-pass effect of imaging process itself, are finally difficult to be observed in the picture.
Existing detection system shortcoming is: only effectively can identify the defect point of defect area inter normal direction in specific smaller angle interval, causes that general defect imaging is unintelligible even can not be observed; Image background gray scale is higher, causes picture contrast to decline, and some tiny defects, is enhanced gray scale, thus is difficult to be observed in the picture due to the impact of periphery high gray areas or the low-pass effect of imaging process itself; And adopt the system of strip source, the incident light received due to defect area is all from same direction, and there is different normal directions at each point interface in tested product defect area, the brightness of light source zones of different cannot be regulated by difference, the order of severity of all kinds defect area in the image of acquisition and actual conditions are reached unanimity, and this will cause the inaccurate of testing result.
Summary of the invention
The utility model discloses a kind of transparent sheet-like product appearance defect imaging system, to solve in prior art because the inner branch of defect area can not be observed, cause that general defect imaging is unintelligible even can not be observed; Image is high gray scale background, causes that contrast is low, tiny defect is difficult to be found; The defect of different characteristic, the order of severity shown in the picture and actual conditions disproportionate, cause the problems such as testing result is inaccurate.
The utility model comprises linear array images acquisition system, area scattering light source and tested product carrier; Linear array images acquisition system comprises line-scan digital camera, camera lens, industrial computer; Camera lens is arranged on line-scan digital camera, and line-scan digital camera is electrically connected with industrial computer; Area scattering light source comprises diffusing panel, LED, heat dissipation base; LED is arranged on heat dissipation base, and diffusing panel is installed in LED front; Inspection product carrier is positioned at below area scattering light source; Linear array images acquisition system is arranged on the top of tested product carrier, and the optical axis of linear array images acquisition system and the normal angle of tested product submounts upper surface are greater than 45 ° and are less than 90 °; Inspection product carrier can above in the horizontal direction move, and the diffusing panel of area scattering light source is not crossing relative to the image line on tested product surface with the optical axis of linear array images acquisition system.
Effective imaging viewing field scope of linear array images acquisition system is a line segment of tested product submounts upper surface, and the optical axis of this line segment and linear array images acquisition system intersects vertically; Area scattering light source perpendicular to the minimum level length on field range direction and the area scattering light source luminescent face each point that is greater than 2 times to the ultimate range of tested product submounts upper surface.
The course of work is as follows: checked object lies in a horizontal plane on tested product carrier, and inspection product carrier is lifted in tested product horizontal direction and moved; Area scattering light source is to the tested product illumination that tested product carrier carries; Reflected light is observed by line-scan digital camera through the camera lens of image capturing system, and the electric signal of generation is transferred to industrial computer by electrical connection and is stored in the hard disk of industrial computer; When needing the obvious degree adjusting dissimilar defect area in image further, when making it closer to actual conditions, the brightness of the LED on light direction can be entered by the difference attempting adjusting one by one corresponding field of view, corresponding imaging effect is optimized more.
Good effect of the present utility model: general defect imaging clearly observable; Picture contrast is high, and tiny defect can be observed; Regulated the brightness of light source zones of different by difference, the order of severity of various types of defect area in acquisition image and actual conditions can be made to reach unanimity.
Accompanying drawing explanation
Fig. 1 is the utility model structural front view;
Fig. 2 is the utility model structure upward view;
In figure: 1 linear array images acquisition system, 1.1 line-scan digital camera, 1.2 camera lens, 1.3 industrial computer, 2 area scattering light sources, 2.1 diffusing panel, 2.2LED lamp, 2.3 heat dissipation base, 3 tested product carriers, the optical axis of L1 linear array images acquisition system, the optical axis of L2 linear array images acquisition system is about the image line of normal, W1 area scattering light source perpendicular to the minimum level length on field range direction with the ultimate range of H area scattering light source luminescent face each point to tested product submounts upper surface, the minimum widith of W2 area scattering source parallel on this field range direction, effective imaging viewing field scope of W3 linear array images acquisition system, A horizontal line, B normal, the optical axis of α linear array images acquisition system and normal angle, the angle of β normal and L2, α=β.
Embodiment
An embodiment of the present utility model is described in detail below in conjunction with accompanying drawing.
The utility model embodiment as shown in Figure 1 and Figure 2, comprises linear array images acquisition system 1, area scattering light source 2 and tested product carrier 3; Linear array images acquisition system comprises line-scan digital camera 1.1, camera lens 1.2, industrial computer 1.3; Camera lens 1.2 is arranged on line-scan digital camera 1.1, and line-scan digital camera 1.1 is electrically connected with industrial computer 1.3; Area scattering light source 2 comprises 1 diffusing panel 2.1, several LED 2.2,1 heat dissipation base 2.3; LED 2.2 is arranged on heat dissipation base 2.3, and diffusing panel 2.1 is installed in LED 2.2 front; Inspection product carrier 3 is positioned at below area scattering light source 2; Linear array images acquisition system 1 is arranged on the top of tested product carrier 3, and the optical axis L 1 of linear array images acquisition system is greater than 45 ° with the normal B angle α of tested product carrier 3 upper surface and is less than 90 °; Inspection product carrier 3 can move along in horizontal line A horizontal direction, and the diffusing panel 2.1 of area scattering light source 2 is not crossing about the image line L2 of tested product carrier 3 upper surface with the optical axis of linear array images acquisition system.
Effective imaging viewing field scope W3 of linear array images acquisition system 1 is tested one of the product carrier 3 upper surface line segment intersected vertically with the optical axis L 1 of linear array images acquisition system; The minimum widith W2 of area scattering source parallel on this field range direction is greater than effective imaging viewing field scope W3(W2>W3); Area scattering light source at the area scattering light source luminescent face each point being greater than 2 times with W1 perpendicular to the minimum level length on field range direction to the ultimate range H(W1>2H of tested product submounts upper surface);
The course of work is as follows: checked object lies in a horizontal plane on tested product carrier 3, and inspection product carrier 3 is lifted in tested product horizontal direction and moved; Area scattering light source 2 is to the tested product illumination of carrying on tested product carrier 3; Reflected light is observed by line-scan digital camera 1.1 through the camera lens 1.2 of image capturing system 1, and the electric signal of generation is transferred to industrial computer 1.3 by electrical connection and is stored in the hard disk of industrial computer; When needing the obvious degree adjusting dissimilar defect area in image further, when making it closer to actual conditions, the brightness of the LED 2.2 on light direction can be entered by the difference attempting adjusting one by one corresponding field of view, corresponding imaging effect is optimized more.
Claims (2)
1. a transparent sheet-like product appearance defect imaging system; It is characterized in that: comprise linear array images acquisition system, area scattering light source and tested product carrier; Linear array images acquisition system comprises line-scan digital camera, camera lens, industrial computer; Camera lens is arranged on line-scan digital camera, and line-scan digital camera is electrically connected with industrial computer; Area scattering light source comprises diffusing panel, LED, heat dissipation base; LED is arranged on heat dissipation base, and diffusing panel is installed in LED front; Inspection product carrier is positioned at below area scattering light source; Linear array images acquisition system is arranged on the top of tested product carrier, and the optical axis of linear array images acquisition system and the normal angle of tested product submounts upper surface are greater than 45 ° and are less than 90 °; Inspection product carrier can above in the horizontal direction move, and the diffusing panel of area scattering light source is not crossing relative to the image line on tested product surface with the optical axis of linear image acquisition system.
2. a kind of transparent sheet-like product appearance defect imaging system according to claim 1; It is characterized in that: effective imaging viewing field scope of linear array images acquisition system is a line segment of tested product submounts upper surface, and the optical axis of this line segment and linear array images acquisition system intersects vertically; Area scattering light source perpendicular to the minimum level length on field range direction and the area scattering light source luminescent face each point that is greater than 2 times to the ultimate range of tested product submounts upper surface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520918047.6U CN205103181U (en) | 2015-11-18 | 2015-11-18 | Transparent slice product appearance defect imaging system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520918047.6U CN205103181U (en) | 2015-11-18 | 2015-11-18 | Transparent slice product appearance defect imaging system |
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| Publication Number | Publication Date |
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| CN205103181U true CN205103181U (en) | 2016-03-23 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201520918047.6U Expired - Fee Related CN205103181U (en) | 2015-11-18 | 2015-11-18 | Transparent slice product appearance defect imaging system |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106645196A (en) * | 2016-12-15 | 2017-05-10 | 广东威创视讯科技股份有限公司 | Dust detector of projection lens and dust remover |
| CN109642787A (en) * | 2016-07-20 | 2019-04-16 | 穆拉有限公司 | The System and method for of 3D surface measurement |
| CN112098333A (en) * | 2020-11-17 | 2020-12-18 | 北京领邦智能装备股份公司 | High-precision imaging system and method, image acquisition device and detection equipment |
| CN112345555A (en) * | 2020-10-30 | 2021-02-09 | 凌云光技术股份有限公司 | High bright imaging light source system of visual inspection machine |
-
2015
- 2015-11-18 CN CN201520918047.6U patent/CN205103181U/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109642787A (en) * | 2016-07-20 | 2019-04-16 | 穆拉有限公司 | The System and method for of 3D surface measurement |
| CN109642787B (en) * | 2016-07-20 | 2021-10-29 | 穆拉有限公司 | System and method for 3D surface measurement |
| CN106645196A (en) * | 2016-12-15 | 2017-05-10 | 广东威创视讯科技股份有限公司 | Dust detector of projection lens and dust remover |
| CN106645196B (en) * | 2016-12-15 | 2020-08-11 | 广东威创视讯科技股份有限公司 | Dust detection device and dust removing device of projection lens |
| CN112345555A (en) * | 2020-10-30 | 2021-02-09 | 凌云光技术股份有限公司 | High bright imaging light source system of visual inspection machine |
| CN112098333A (en) * | 2020-11-17 | 2020-12-18 | 北京领邦智能装备股份公司 | High-precision imaging system and method, image acquisition device and detection equipment |
| CN112098333B (en) * | 2020-11-17 | 2021-04-02 | 北京领邦智能装备股份公司 | High-precision imaging system and method, image acquisition device and detection equipment |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160323 Termination date: 20211118 |
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| CF01 | Termination of patent right due to non-payment of annual fee |