CN101208595A - 用于测量含有至少一种易裂变材料的基体中的各向异性的方法和相应设备 - Google Patents
用于测量含有至少一种易裂变材料的基体中的各向异性的方法和相应设备 Download PDFInfo
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- CN101208595A CN101208595A CNA2006800230223A CN200680023022A CN101208595A CN 101208595 A CN101208595 A CN 101208595A CN A2006800230223 A CNA2006800230223 A CN A2006800230223A CN 200680023022 A CN200680023022 A CN 200680023022A CN 101208595 A CN101208595 A CN 101208595A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
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- General Health & Medical Sciences (AREA)
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- Immunology (AREA)
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- Investigating Or Analysing Materials By Optical Means (AREA)
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Abstract
Description
Claims (11)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0505276 | 2005-05-25 | ||
FR0505276A FR2886404B1 (fr) | 2005-05-25 | 2005-05-25 | Procede de mesure de l'anisotropie dans un element comprenant au moins un materiau fissile et installation correspondante. |
US68706805P | 2005-06-03 | 2005-06-03 | |
US60/687,068 | 2005-06-03 | ||
PCT/IB2006/001289 WO2006126051A1 (en) | 2005-05-25 | 2006-05-16 | Method for measuring the anisotropy in an element comprising at least one fissile material and a corresponding installation. |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101208595A true CN101208595A (zh) | 2008-06-25 |
CN101208595B CN101208595B (zh) | 2011-01-26 |
Family
ID=35594811
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2006800230223A Expired - Fee Related CN101208595B (zh) | 2005-05-25 | 2006-05-16 | 用于测量含有至少一种易裂变材料的基体中的各向异性的方法和相应设备 |
Country Status (3)
Country | Link |
---|---|
CN (1) | CN101208595B (zh) |
FR (1) | FR2886404B1 (zh) |
ZA (1) | ZA200709904B (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110646424A (zh) * | 2018-12-29 | 2020-01-03 | 广东韶钢松山股份有限公司 | 一种金相组织各向异性快速定量评价方法 |
CN112781729A (zh) * | 2020-12-30 | 2021-05-11 | 平顶山学院 | 规避其它核反应生成物对目标核反应截面测量影响的方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3972619A (en) * | 1975-08-11 | 1976-08-03 | General Atomic Company | Method and apparatus for surface analysis |
US5028138A (en) * | 1989-05-23 | 1991-07-02 | Wolff Lawrence B | Method of and apparatus for obtaining object data by machine vision form polarization information |
KR100272329B1 (ko) * | 1994-12-07 | 2000-11-15 | 이중구 | 비디오 마이크로스코프 |
FR2805343B1 (fr) * | 2000-02-22 | 2002-05-17 | Thomson Csf | Dispositif de controle de l'etat d'une surface |
JP3447654B2 (ja) * | 2000-03-24 | 2003-09-16 | Necエレクトロニクス株式会社 | 異方性薄膜評価法及び評価装置 |
FR2810737B1 (fr) * | 2000-06-23 | 2003-04-18 | Oreal | Appareil et procede d'examen d'une surface |
US7807348B2 (en) * | 2002-03-20 | 2010-10-05 | Wisconsin Alumni Research Foundation | Optical imaging of nanostructured substrates |
-
2005
- 2005-05-25 FR FR0505276A patent/FR2886404B1/fr not_active Expired - Fee Related
-
2006
- 2006-05-16 CN CN2006800230223A patent/CN101208595B/zh not_active Expired - Fee Related
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2007
- 2007-11-16 ZA ZA200709904A patent/ZA200709904B/xx unknown
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110646424A (zh) * | 2018-12-29 | 2020-01-03 | 广东韶钢松山股份有限公司 | 一种金相组织各向异性快速定量评价方法 |
CN112781729A (zh) * | 2020-12-30 | 2021-05-11 | 平顶山学院 | 规避其它核反应生成物对目标核反应截面测量影响的方法 |
CN112781729B (zh) * | 2020-12-30 | 2023-08-25 | 平顶山学院 | 规避其它核反应生成物对目标核反应截面测量影响的方法 |
Also Published As
Publication number | Publication date |
---|---|
ZA200709904B (en) | 2009-12-30 |
FR2886404A1 (fr) | 2006-12-01 |
FR2886404B1 (fr) | 2008-03-07 |
CN101208595B (zh) | 2011-01-26 |
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