CN101201367A - Intelligentized test system for electric coupler - Google Patents
Intelligentized test system for electric coupler Download PDFInfo
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- CN101201367A CN101201367A CNA2007100191225A CN200710019122A CN101201367A CN 101201367 A CN101201367 A CN 101201367A CN A2007100191225 A CNA2007100191225 A CN A2007100191225A CN 200710019122 A CN200710019122 A CN 200710019122A CN 101201367 A CN101201367 A CN 101201367A
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- electric coupler
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Abstract
An intelligent test system for the electrical connector comprises a computer, a test control unit and an adaptor for the electrical connector. The adaptor comprises two retractable casings, one casing is equipped with an insulating core, and the other casing is equipped with a testing needle. The test control unit comprises a test unit for on-and-off resistance microcontroller, a test unit for withstanding voltage microcontroller and a test unit for the insulation resistance microcontroller. A control device of the microcontroller and a control device of the matrix switching and driving are positioned between the test control unit and the computer. The invention is suitable for the precise test of various parameters of various kinds of the electrical connector, has the advantages of complete function, accurate test and high efficiency.
Description
Technical field
The present invention relates to a kind of Intelligentized test system of electronic product, be specifically related to various Intelligentized test system for electric coupler.
Background technology
At present, the various parameters of this electronic product of electric connector have strict national standard, need in actual applications it is done various tests, judge that whether qualified the electricity function index of electric connector is.For example: connector on off test, the test of contact element contact resistance, the test of withstand voltage leakage current and megger test or the like.
Present stage, these tests need to test respectively one by one, the mode of test is that the tester operates corresponding various testing tool and carries out, and the out of true as a result of test, for example: when the contact resistance of test connector, because will carry out continuity test, also there is connection resistance in the two ends of actual contact resistance, that is to say that each contact resistance is all corresponding two connection resistance when conducting.Existing test mode can't be tested actual contact resistance, but this contact resistance measured and two ends be connected resistance, the resistance of actual measurement be this resistance and, though contact resistance is a requirement qualitatively in national standard, but at some contact resistance is required point-device field, as: aerospace field etc.
This present situation of connector and test mode have also been brought other shortcoming and defect, particularly:
1, tests each project one by one respectively.
1) cause workload big.The connecting portion of connector is that contact element (pin, hole) is connected, often this contact element (pin, hole) cooperate be have much right, if any 32 pairs of contact elements (pin, hole), 64 pairs of contact elements (pin, hole), even more reach more than 100 contact element (pin, hole), during the manual testing, need test very big, time-consuming, the effort of workload to every pair of contacts (pin, hole) one by one.
When 2) successively testing, back one test event is when test, and the result of the project that can test the front exerts an influence also uncertainly, impacts the hidden danger of test result.
2, test mode is that the tester operates corresponding various testing tool and carries out, and introduces the measuring error that human factor causes, and there is influence in test result.
3, waste resource, cost is very big.Whenever do a test, need some staff's follow-on tests, workload is huge, the waste resource.
Summary of the invention
The invention provides a kind of Intelligentized test system for electric coupler, when it has solved test result out of true in the background technology and test fee, the technical matters of effort.
Technical solution of the present invention is:
A kind of Intelligentized test system for electric coupler, comprise computing machine and the unit of testing and controlling that is connected with computing machine, its special character is: the adapter that also comprises electric connector, described adapter comprises can open two housings 1, be provided with insulation inner core 2 in the described housing 1, be provided with testing needle 3 in another housing; Described unit of testing and controlling comprises break-make and contact resistance single-chip microcomputer test cell, withstand voltage single-chip microcomputer test cell and insulation resistance single-chip microcomputer test cell; Described break-make and contact resistance single-chip microcomputer test cell are used to detect the break-make situation of electric connector and detect the contact resistance parameter; Described withstand voltage single-chip microcomputer test cell is used to detect the withstand voltage parameter of electric connector; Described insulation resistance single-chip microcomputer test cell is used to detect the insulation parameter of electric connector; Also being provided with monolithic processor control device and matrix between described unit of testing and controlling and the computing machine switches and driving control device, described monolithic processor control device is controlled respectively and is drawn together break-make and contact resistance single-chip microcomputer test cell, withstand voltage single-chip microcomputer test cell and insulation resistance single-chip microcomputer test cell, described matrix switching and driving control device are connected with monolithic processor control device, switch in order to the test in described unit of testing and controlling switching and a plurality of holes of connector.
Above-mentioned break-make and contact resistance single-chip microcomputer are the AT89S52 single-chip microcomputer.
Above-mentioned withstand voltage single-chip microcomputer is the AT89S52 single-chip microcomputer.
Above-mentioned insulation resistance single-chip microcomputer is the AT89S52 single-chip microcomputer.
Single-chip microcomputer in the above-mentioned monolithic processor control device is the AT89S52 single-chip microcomputer.
The above-mentioned two housings opened 1 is for being threaded or clamping.
Above-mentioned computing machine also comprises database and display, the various canonical parameters of this database storing electric connector, and the parameter and the various canonical parameter of relatively each test cell test, and described display is used to show the result of comparison.
Above-mentioned computing machine also comprises the user authority management unit, is used for the encryption and the safe operation of this system.
Above-mentioned computing machine also is connected with printer.
But last test macro item-dividing test or robotization are all tested.
Discrete in the past method of testing has been done the improvement of essence by system integration technology.Once connect and to test the electric parameter of being had a few.
The present invention has the following advantages:
1, telotism.The present invention combines the test of the various parameters of electric connector, can realize once connecting the function of testing all electrical quantitys.
2, test accurately.The improvement of connecting unit for electrical connector (adapter) makes the parameter of electric connector contact point to survey, because the total parameter value of connector can be measured, and the parameter value of the tie point at contact point two ends also can measure, and total parameter value deducts the parameter value of tie point, can draw the parameter value of contact point.
3, efficient, quick.Matrix switches and driving control device can realize that unit of testing and controlling is switched and the many tests to contact element (pin, hole) of connector are switched, and is efficient, quick.
4, easy to use.During use, only need the relevant parameter of input can finish test, obtain a result.
5, handling safety.The user authority management unit makes encrypting of this system, handling safety.
6, test parameter can store, printable, the convenient reinspection.
Description of drawings
Fig. 1 is a structural principle block diagram of the present invention.
Fig. 2 is the adapter structure schematic diagram.
Fig. 3 is insulation core arrangement synoptic diagram.
Fig. 4 is the testing needle structural representation.
Drawing reference numeral explanation: 1-housing; The 2-inner core that insulate; The 3-testing needle.
Embodiment
Referring to Fig. 1, Fig. 2, a kind of Intelligentized test system for electric coupler, comprise computing machine and the unit of testing and controlling that is connected with computing machine, the adapter that also comprises electric connector, adapter comprises can open two housings 1, referring to Fig. 3, Fig. 4, is provided with insulation inner core 2 in the housing 1, be provided with testing needle 3 in another housing, two housings 1 is for being threaded; Computing machine also comprises database and display, the sharp canonical parameter of each of this database storing electric connector, and the parameter and the various canonical parameter of relatively each test cell test, and described display is used to show the result of comparison.
Unit of testing and controlling comprises break-make and contact resistance single-chip microcomputer test cell, withstand voltage single-chip microcomputer test cell and insulation resistance single-chip microcomputer test cell; Break-make and contact resistance single-chip microcomputer test cell are used to detect the break-make situation of electric connector and detect the contact resistance parameter; Withstand voltage single-chip microcomputer test cell is used to detect the withstand voltage parameter of electric connector; Insulation resistance single-chip microcomputer test cell is used to detect the insulation parameter of electric connector; Also being provided with monolithic processor control device and matrix between unit of testing and controlling and the computing machine switches and driving control device, monolithic processor control device is controlled respectively and is drawn together break-make and contact resistance single-chip microcomputer test cell, withstand voltage single-chip microcomputer test cell and insulation resistance single-chip microcomputer test cell, matrix switching and driving control device are connected with monolithic processor control device, switch in order to the test in unit of testing and controlling switching and a plurality of holes of connector.
The said single-chip microcomputer in front can be the AT89S52 single-chip microcomputer.
Matrix switches and driving control device is finished the work as follows:
As master controller, choose lock cun device and impact damper that corresponding matrix dot is controlled by the AT89S52 single-chip microcomputer, finally reach the purpose of controlling independent switching point with matrix by the line decoded mode.Such as: find head end first point, promptly get final product, be embodied as A (1,1)=1 by first of X-axis and Y-axis first put 1 operation, A (1 by that analogy, 16)=1 just choose the 16th point, whenever increase 16 X-axis and add 1, up to A (8,16)=1 (being head end 128 points), represent terminal 1 ~ 128 point equally from B (1,1) to B (8,16).Expansion is more counted as need, only need expand and can realize corresponding matrix circuit.
Discrete in the past method of testing has been done the improvement of essence by system integration technology.Once connect and to test the electric parameter of being had a few.
Computing machine also is connected with printer.But test macro item-dividing test or robotization are all tested.
During work, test parameter need be set earlier, parameter comprises the parameter setting of continuity test, conducting resistance test, Insulation test, four projects of voltage-withstand test, the naming method of test point, the shielding setting of test point, and to showing, the setting of functions such as warning, printing, that this partial function is used for is newly-built, revise test parameter, and these titles of setting with user's appointment are kept in the database, calls when test automatically.
The database of native system is as the backstage of total system, be used for storing and manage information such as various test parameter settings, each test result, self-detection result, measuring error table, adopt unified way to manage, integrated inquiry, statistical function can back up and restore database easily.
Adapter is with after tested connector is connected, can import different test parameters to system, can finish continuity test, conducting resistance test, Insulation test and voltage-withstand test, obtain different test results, be transferred to database, the test result that system can be different with these compares with the test parameter that formerly is provided with, and store and export, show, in the time of if desired, can connect printer, finish printing.This system can realize a plurality of test functions such as continuity test, conducting resistance test, Insulation test and voltage-withstand test, can finish test simultaneously, also substep individual event test as required.
Computing machine also comprises the user authority management unit, is used for the encryption and the safe operation of this system.
This service management unit can be specified multiple user right rank, the user uses the password login system of oneself, the software section that can only an operation manager allows authority, such as slip-stick artist's authority test parameter can be set, the backup restore database, system is carried out self check etc., and the operator does not then have this authority, can not operate; Other user of supervisor level then can carry out total system user's configuration.
Claims (10)
1. Intelligentized test system for electric coupler, comprise computing machine and the unit of testing and controlling that is connected with computing machine, it is characterized in that: the adapter that also comprises electric connector, described adapter comprise can open be provided with in two housings (1), the described housing (1) insulation inner core (2), be provided with testing needle (3) in another housing (1); Described unit of testing and controlling comprises break-make and contact resistance single-chip microcomputer test cell, withstand voltage single-chip microcomputer test cell and insulation resistance single-chip microcomputer test cell; Described break-make and contact resistance single-chip microcomputer test cell are used to detect the break-make situation of electric connector and detect the contact resistance parameter; Described withstand voltage single-chip microcomputer test cell is used to detect the withstand voltage parameter of electric connector; Described insulation resistance single-chip microcomputer test cell is used to detect the insulation parameter of electric connector; Also being provided with monolithic processor control device and matrix between described unit of testing and controlling and the computing machine switches and driving control device, described monolithic processor control device is controlled respectively and is drawn together break-make and contact resistance single-chip microcomputer test cell, withstand voltage single-chip microcomputer test cell and insulation resistance single-chip microcomputer test cell, described matrix switching and driving control device are connected with monolithic processor control device, switch in order to the test in described unit of testing and controlling switching and a plurality of holes of connector.
2. Intelligentized test system for electric coupler according to claim 1 is characterized in that: described break-make and contact resistance single-chip microcomputer are the AT89S52 single-chip microcomputer.
3. Intelligentized test system for electric coupler according to claim 1 is characterized in that: described withstand voltage single-chip microcomputer is the AT89S52 single-chip microcomputer.
4. Intelligentized test system for electric coupler according to claim 1 is characterized in that: described insulation resistance single-chip microcomputer is the AT89S52 single-chip microcomputer.
5. Intelligentized test system for electric coupler according to claim 1 is characterized in that: the single-chip microcomputer in the described monolithic processor control device is the AT89S52 single-chip microcomputer.
6. Intelligentized test system for electric coupler according to claim 1 is characterized in that: the described two housings (1) of opening is for being threaded or clamping.
7. according to the arbitrary described Intelligentized test system for electric coupler of claim 1～6, it is characterized in that: described computing machine also comprises database and display, the various canonical parameters of this database storing electric connector, and the parameter and the various canonical parameter of relatively each test cell test, described display is used to show the result of comparison.
8. Intelligentized test system for electric coupler according to claim 7 is characterized in that: described computing machine also comprises the user authority management unit, is used for the encryption and the safe operation of this system.
9. Intelligentized test system for electric coupler according to claim 8 is characterized in that: described computing machine also is connected with printer.
10. Intelligentized test system for electric coupler according to claim 9 is characterized in that: but this test macro item-dividing test or robotization are all tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2007100191225A CN101201367A (en) | 2007-11-20 | 2007-11-20 | Intelligentized test system for electric coupler |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2007100191225A CN101201367A (en) | 2007-11-20 | 2007-11-20 | Intelligentized test system for electric coupler |
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| Publication Number | Publication Date |
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| CN101201367A true CN101201367A (en) | 2008-06-18 |
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| CNA2007100191225A Pending CN101201367A (en) | 2007-11-20 | 2007-11-20 | Intelligentized test system for electric coupler |
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Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101793933A (en) * | 2010-03-26 | 2010-08-04 | 浙江大学 | Online measuring system for contact resistors of electric connector |
| CN101718835B (en) * | 2009-11-23 | 2011-01-26 | 泰兴市航联电连接器有限公司 | Comprehensive insulation and voltage resistance testing device of electric connector |
| CN102269781A (en) * | 2011-05-10 | 2011-12-07 | 贵州航天电器股份有限公司 | Auxiliary device for testing on-resistance of throwing line connector |
| CN102466772A (en) * | 2010-11-09 | 2012-05-23 | 常熟市福莱德连接器科技有限公司 | Connector testing device |
| CN102621418A (en) * | 2012-03-27 | 2012-08-01 | 科纳技术(苏州)有限公司 | Electric performance test system based on NI (national instruments) data acquisition equipment for multi-pin connectors |
| CN101825675B (en) * | 2009-03-02 | 2012-10-10 | 中兴通讯股份有限公司 | Handheld device and method for detecting the connectivity of connector in handheld device |
| CN102944823A (en) * | 2012-11-30 | 2013-02-27 | 中国北车集团大连机车车辆有限公司 | High-voltage holding test method of wiring harness connector |
| CN103913603A (en) * | 2013-01-04 | 2014-07-09 | 航天科工防御技术研究试验中心 | Test adaptor of electric connector |
| CN104175313A (en) * | 2013-05-27 | 2014-12-03 | 富泰华工业（深圳）有限公司 | Circuit board test monitoring system and method |
| CN108469569A (en) * | 2018-01-15 | 2018-08-31 | 航天科工防御技术研究试验中心 | A kind of Intelligentized test system for electric coupler |
| CN109507483A (en) * | 2018-11-20 | 2019-03-22 | 北京邮电大学 | A kind of multi-line connector electric property multi-path detection system |
| CN110672998A (en) * | 2019-10-17 | 2020-01-10 | 上海工艺美术职业学院 | Conduction and withstand voltage test method and conduction and withstand voltage test assembly of connector |
| CN110940911A (en) * | 2019-12-23 | 2020-03-31 | 东莞市联纲光电科技有限公司 | Connector testing method and device |
-
2007
- 2007-11-20 CN CNA2007100191225A patent/CN101201367A/en active Pending
Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101825675B (en) * | 2009-03-02 | 2012-10-10 | 中兴通讯股份有限公司 | Handheld device and method for detecting the connectivity of connector in handheld device |
| CN101718835B (en) * | 2009-11-23 | 2011-01-26 | 泰兴市航联电连接器有限公司 | Comprehensive insulation and voltage resistance testing device of electric connector |
| CN101793933A (en) * | 2010-03-26 | 2010-08-04 | 浙江大学 | Online measuring system for contact resistors of electric connector |
| CN101793933B (en) * | 2010-03-26 | 2011-11-09 | 浙江大学 | Online measuring system for contact resistors of electric connector |
| CN102466772A (en) * | 2010-11-09 | 2012-05-23 | 常熟市福莱德连接器科技有限公司 | Connector testing device |
| CN102269781A (en) * | 2011-05-10 | 2011-12-07 | 贵州航天电器股份有限公司 | Auxiliary device for testing on-resistance of throwing line connector |
| CN102621418A (en) * | 2012-03-27 | 2012-08-01 | 科纳技术(苏州)有限公司 | Electric performance test system based on NI (national instruments) data acquisition equipment for multi-pin connectors |
| CN102944823A (en) * | 2012-11-30 | 2013-02-27 | 中国北车集团大连机车车辆有限公司 | High-voltage holding test method of wiring harness connector |
| CN103913603A (en) * | 2013-01-04 | 2014-07-09 | 航天科工防御技术研究试验中心 | Test adaptor of electric connector |
| CN104175313A (en) * | 2013-05-27 | 2014-12-03 | 富泰华工业（深圳）有限公司 | Circuit board test monitoring system and method |
| CN104175313B (en) * | 2013-05-27 | 2018-04-17 | 深圳市精捷能电子有限公司 | Circuit board testing monitoring system and method |
| CN108469569A (en) * | 2018-01-15 | 2018-08-31 | 航天科工防御技术研究试验中心 | A kind of Intelligentized test system for electric coupler |
| CN109507483A (en) * | 2018-11-20 | 2019-03-22 | 北京邮电大学 | A kind of multi-line connector electric property multi-path detection system |
| CN110672998A (en) * | 2019-10-17 | 2020-01-10 | 上海工艺美术职业学院 | Conduction and withstand voltage test method and conduction and withstand voltage test assembly of connector |
| CN110940911A (en) * | 2019-12-23 | 2020-03-31 | 东莞市联纲光电科技有限公司 | Connector testing method and device |
| CN110940911B (en) * | 2019-12-23 | 2022-04-12 | 联纲光电科技股份有限公司 | Connector testing method and device |
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