CN201107383Y - Electric connector intelligent test system - Google Patents

Electric connector intelligent test system Download PDF

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Publication number
CN201107383Y
CN201107383Y CNU2007201264341U CN200720126434U CN201107383Y CN 201107383 Y CN201107383 Y CN 201107383Y CN U2007201264341 U CNU2007201264341 U CN U2007201264341U CN 200720126434 U CN200720126434 U CN 200720126434U CN 201107383 Y CN201107383 Y CN 201107383Y
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China
Prior art keywords
chip microcomputer
test
control device
proving installation
test system
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Expired - Fee Related
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CNU2007201264341U
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Chinese (zh)
Inventor
冯军
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Shanxi Yonghui Measurement And Control Technology Co Ltd
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Shanxi Yonghui Measurement And Control Technology Co Ltd
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Priority to CNU2007201264341U priority Critical patent/CN201107383Y/en
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Abstract

An electric connector intelligent test system includes a computer, a test controller and an adapter of the electric connector; the adapter includes two shells which can be opened, one of which is provided with an insulating inner core and the other is provided with a testing needle; the test controller includes an on-off and contact resistor single-chip microcomputer tester, a pressure resistant single-chip microcomputer tester and an insulating resistor single-chip microcomputer tester; a single-chip microcomputer controller and a matrix switch and drive controller are arranged between the test controller and the computer. The electric connector intelligent test system is applicable in fine testing of a plurality of parameter of all electric connectors, and has the advantages of comprehensive functions, accurate testing and high-efficiency.

Description

Intelligentized test system for electric coupler
Technical field
The utility model relates to a kind of Intelligentized test system of electronic product, is specifically related to various Intelligentized test system for electric coupler.
Background technology
At present, the various parameters of this electronic product of electric connector have strict national standard, need in actual applications it is done various tests, judge that whether qualified the electricity function index of electric connector is.For example: connector on off test, the test of contact element contact resistance, the test of withstand voltage leakage current and megger test or the like.
Present stage, these tests need to test respectively one by one, the mode of test is that the tester operates corresponding various testing tool and carries out, and the out of true as a result of test, for example: when the contact resistance of test connector, because will carry out continuity test, also there is connection resistance in the two ends of actual contact resistance, that is to say that each contact resistance is all corresponding two connection resistance when conducting.Existing test mode can't be tested actual contact resistance, but this contact resistance measured and two ends be connected resistance, the resistance of actual measurement be this resistance and, though contact resistance is a requirement qualitatively in national standard, but at some contact resistance is required point-device field, as: aerospace field etc.
This present situation of connector and test mode have also been brought other shortcoming and defect, particularly:
1, tests each project one by one respectively.
1) cause workload big.The connecting portion of connector is that contact element (pin, hole) is connected, often this contact element (pin, hole) cooperate be have much right, if any 32 pairs of contact elements (pin, hole), 64 pairs of contact elements (pin, hole), even more reach more than 100 contact element (pin, hole), during the manual testing, need test very big, time-consuming, the effort of workload to every pair of contacts (pin, hole) one by one.
When 2) successively testing, back one test event is when test, and the result of the project that can test the front exerts an influence also uncertainly, impacts the hidden danger of test result.
2, test mode is that the tester operates corresponding various testing tool and carries out, and introduces the measuring error that human factor causes, and there is influence in test result.
3, waste resource, cost is very big.Whenever do a test, need some staff's follow-on tests, workload is huge, the waste resource.
The utility model content
The utility model provides a kind of Intelligentized test system for electric coupler, when it has solved test result out of true in the background technology and test fee, the technical matters of effort.
Technical solution of the present utility model is:
A kind of Intelligentized test system for electric coupler, comprise computing machine and the test control device that is connected with computing machine, its special character is: the adapter that also comprises electric connector, described adapter comprises can open two housings 1, be provided with insulation inner core 2 in the described housing 1, be provided with testing needle 3 in another housing; Described test control device comprises break-make and contact resistance single-chip microcomputer proving installation, withstand voltage single-chip microcomputer proving installation and insulation resistance single-chip microcomputer proving installation; Described break-make and contact resistance single-chip microcomputer proving installation are used to detect the break-make situation of electric connector and detect the contact resistance parameter; Described withstand voltage single-chip microcomputer proving installation is used to detect the withstand voltage parameter of electric connector; Described insulation resistance single-chip microcomputer proving installation is used to detect the insulation parameter of electric connector; Also being provided with monolithic processor control device and matrix between described test control device and the computing machine switches and driving control device, described monolithic processor control device is controlled respectively and is drawn together break-make and contact resistance single-chip microcomputer proving installation, withstand voltage single-chip microcomputer proving installation and insulation resistance single-chip microcomputer proving installation, described matrix switching and driving control device are connected with monolithic processor control device, switch in order to the test in described test control device switching and a plurality of holes of connector.
Above-mentioned break-make and contact resistance single-chip microcomputer are the AT89S52 single-chip microcomputer.
Above-mentioned withstand voltage single-chip microcomputer is the AT89S52 single-chip microcomputer.
Above-mentioned insulation resistance single-chip microcomputer is the AT89S52 single-chip microcomputer.
Single-chip microcomputer in the above-mentioned monolithic processor control device is the AT89S52 single-chip microcomputer.
The above-mentioned two housings opened 1 is for being threaded or clamping.
Above-mentioned computing machine also comprises database and display, the various canonical parameters of this database storing electric connector, and the parameter and the various canonical parameter of relatively each proving installation test, and described display is used to show the result of comparison.
Above-mentioned computing machine also comprises the user authority management device, is used for the encryption and the safe operation of this system.
Above-mentioned computing machine also is connected with printer.
But last test macro item-dividing test or robotization are all tested.
Discrete in the past method of testing has been done the improvement of essence by system integration technology.Once connect and to test the electric parameter of being had a few.
The utlity model has following advantage:
1, telotism.The utility model is combined the test of the various parameters of electric connector, can realize once connecting the function of testing all electrical quantitys.
2, test accurately.The improvement of connecting unit for electrical connector (adapter) makes the parameter of electric connector contact point to survey, because the total parameter value of connector can be measured, and the parameter value of the tie point at contact point two ends also can measure, and total parameter value deducts the parameter value of tie point, can draw the parameter value of contact point.
3, efficient, quick.Matrix switches and driving control device can realize that test control device switches and the many tests to contact element (pin, hole) of connector are switched, and is efficient, quick.
4, easy to use.During use, only need the relevant parameter of input can finish test, obtain a result.
5, handling safety.The user authority management device makes encrypting of this system, handling safety.
6, test parameter can store, printable, the convenient reinspection.
Description of drawings
Fig. 1 is the utility model structural principle block diagram.
Fig. 2 is the adapter structure schematic diagram.
Fig. 3 is insulation core arrangement synoptic diagram.
Fig. 4 is the testing needle structural representation.
Drawing reference numeral explanation: 1-housing; The 2-inner core that insulate; The 3-testing needle.
Embodiment
Referring to Fig. 1, Fig. 2, a kind of Intelligentized test system for electric coupler, comprise computing machine and the test control device that is connected with computing machine, the adapter that also comprises electric connector, adapter comprises can open two housings 1, referring to Fig. 3, Fig. 4, is provided with insulation inner core 2 in the housing 1, be provided with testing needle 3 in another housing, two housings 1 is for being threaded; Computing machine also comprises database and display, the various canonical parameters of this database storing electric connector, and the parameter and the various canonical parameter of relatively each proving installation test, and described display is used to show the result of comparison.
Test control device comprises break-make and contact resistance single-chip microcomputer proving installation, withstand voltage single-chip microcomputer proving installation and insulation resistance single-chip microcomputer proving installation; Break-make and contact resistance single-chip microcomputer proving installation are used to detect the break-make situation of electric connector and detect the contact resistance parameter; Withstand voltage single-chip microcomputer proving installation is used to detect the withstand voltage parameter of electric connector; Insulation resistance single-chip microcomputer proving installation is used to detect the insulation parameter of electric connector; Also being provided with monolithic processor control device and matrix between test control device and the computing machine switches and driving control device, monolithic processor control device is controlled respectively and is drawn together break-make and contact resistance single-chip microcomputer proving installation, withstand voltage single-chip microcomputer proving installation and insulation resistance single-chip microcomputer proving installation, matrix switching and driving control device are connected with monolithic processor control device, switch in order to the test in test control device switching and a plurality of holes of connector.The said single-chip microcomputer in front can be the AT89S52 single-chip microcomputer.
Matrix switches and driving control device is finished the work as follows:
As master controller, choose lock cun device and impact damper that corresponding matrix dot is controlled by the AT89S52 single-chip microcomputer, finally reach the purpose of controlling independent switching point with matrix by the line decoded mode.Such as: find head end first point, promptly get final product, be embodied as A (1,1)=1 by first of X-axis and Y-axis first put 1 operation, A (1 by that analogy, 16)=1 just choose the 16th point, whenever increase 16 X-axis and add 1, up to A (8,16)=1 (being head end 128 points), represent terminal 1 ~ 128 point equally from B (1,1) to B (8,16).Expansion is more counted as need, only need expand and can realize corresponding matrix circuit.
Discrete in the past method of testing has been done the improvement of essence by system integration technology.Once connect and to test the electric parameter of being had a few.
Computing machine also is connected with printer.
But test macro item-dividing test or robotization are all tested.
During work, test parameter need be set earlier, parameter comprises the parameter setting of continuity test, conducting resistance test, Insulation test, four projects of voltage-withstand test, the naming method of test point, the shielding setting of test point, and to showing, the setting of functions such as warning, printing, that this partial function is used for is newly-built, revise test parameter, and these titles of setting with user's appointment are kept in the database, calls when test automatically.
The database of native system is as the backstage of total system, be used for storing and manage information such as various test parameter settings, each test result, self-detection result, measuring error table, adopt unified way to manage, integrated inquiry, statistical function can back up and restore database easily.
Adapter is with after tested connector is connected, can import different test parameters to system, can finish continuity test, conducting resistance test, Insulation test and voltage-withstand test, obtain different test results, be transferred to database, the test result that system can be different with these compares with the test parameter that formerly is provided with, and store and export, show, in the time of if desired, can connect printer, finish printing.This system can realize a plurality of test functions such as continuity test, conducting resistance test, Insulation test and voltage-withstand test, can finish test simultaneously, also substep individual event test as required.
Computing machine also comprises the user authority management device, is used for the encryption and the safe operation of this system.
This user management device can be specified multiple user right rank, the user uses the password login system of oneself, the software section that can only an operation manager allows authority, such as slip-stick artist's authority test parameter can be set, the backup restore database, system is carried out self check etc., and the operator does not then have this authority, can not operate; Other user of supervisor level then can carry out total system user's configuration.

Claims (9)

1. Intelligentized test system for electric coupler, comprise computing machine and the test control device that is connected with computing machine, it is characterized in that: the adapter that also comprises electric connector, described adapter comprise can open be provided with in two housings (1), the described housing (1) insulation inner core (2), be provided with testing needle (3) in another housing (1); Described test control device comprises break-make and contact resistance single-chip microcomputer proving installation, withstand voltage single-chip microcomputer proving installation and insulation resistance single-chip microcomputer proving installation; Described break-make and contact resistance single-chip microcomputer proving installation are used to detect the break-make situation of electric connector and detect the contact resistance parameter; Described withstand voltage single-chip microcomputer proving installation is used to detect the withstand voltage parameter of electric connector; Described insulation resistance single-chip microcomputer proving installation is used to detect the insulation parameter of electric connector; Also being provided with monolithic processor control device and matrix between described test control device and the computing machine switches and driving control device, described monolithic processor control device is controlled respectively and is drawn together break-make and contact resistance single-chip microcomputer proving installation, withstand voltage single-chip microcomputer proving installation and insulation resistance single-chip microcomputer proving installation, and described matrix switching and driving control device are connected with monolithic processor control device.
2. Intelligentized test system for electric coupler according to claim 1 is characterized in that: described break-make and contact resistance single-chip microcomputer are the AT89S52 single-chip microcomputer.
3. Intelligentized test system for electric coupler according to claim 1 is characterized in that: described withstand voltage single-chip microcomputer is the AT89S52 single-chip microcomputer.
4. Intelligentized test system for electric coupler according to claim 1 is characterized in that: described insulation resistance single-chip microcomputer is the AT89S52 single-chip microcomputer.
5. Intelligentized test system for electric coupler according to claim 1 is characterized in that: the single-chip microcomputer in the described monolithic processor control device is the AT89S52 single-chip microcomputer.
6. Intelligentized test system for electric coupler according to claim 1 is characterized in that: the described two housings (1) of opening is for being threaded or clamping.
7. according to the arbitrary described Intelligentized test system for electric coupler of claim 1~6, it is characterized in that: described computing machine also comprises database and display.
8. Intelligentized test system for electric coupler according to claim 7 is characterized in that: described computing machine also is connected with printer.
9. Intelligentized test system for electric coupler according to claim 8 is characterized in that: but this test macro item-dividing test or robotization are all tested.
CNU2007201264341U 2007-11-20 2007-11-20 Electric connector intelligent test system Expired - Fee Related CN201107383Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNU2007201264341U CN201107383Y (en) 2007-11-20 2007-11-20 Electric connector intelligent test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNU2007201264341U CN201107383Y (en) 2007-11-20 2007-11-20 Electric connector intelligent test system

Publications (1)

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102590684A (en) * 2012-03-08 2012-07-18 江苏新亚高电压测试设备有限公司 Full-automatic insulated comprehensive testing device
CN104569504A (en) * 2013-10-24 2015-04-29 珠海格力电器股份有限公司 Test device
CN104596688A (en) * 2015-02-02 2015-05-06 河北工业大学 Testing method and tester for contact pressure of electric connector based on ultrasonic wave
CN105445658A (en) * 2015-12-15 2016-03-30 长春轨道客车股份有限公司 Contactor performance detection device
CN107179454A (en) * 2017-04-25 2017-09-19 通标标准技术服务(上海)有限公司 Efficient safety regulation testing system
CN109507483A (en) * 2018-11-20 2019-03-22 北京邮电大学 A kind of multi-line connector electric property multi-path detection system
CN110672998A (en) * 2019-10-17 2020-01-10 上海工艺美术职业学院 Conduction and withstand voltage test method and conduction and withstand voltage test assembly of connector

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102590684A (en) * 2012-03-08 2012-07-18 江苏新亚高电压测试设备有限公司 Full-automatic insulated comprehensive testing device
CN104569504A (en) * 2013-10-24 2015-04-29 珠海格力电器股份有限公司 Test device
CN104569504B (en) * 2013-10-24 2017-11-17 珠海格力电器股份有限公司 Test device
CN104596688A (en) * 2015-02-02 2015-05-06 河北工业大学 Testing method and tester for contact pressure of electric connector based on ultrasonic wave
CN105445658A (en) * 2015-12-15 2016-03-30 长春轨道客车股份有限公司 Contactor performance detection device
CN105445658B (en) * 2015-12-15 2018-09-14 长春轨道客车股份有限公司 A kind of device for detecting performance of contactor
CN107179454A (en) * 2017-04-25 2017-09-19 通标标准技术服务(上海)有限公司 Efficient safety regulation testing system
CN109507483A (en) * 2018-11-20 2019-03-22 北京邮电大学 A kind of multi-line connector electric property multi-path detection system
CN110672998A (en) * 2019-10-17 2020-01-10 上海工艺美术职业学院 Conduction and withstand voltage test method and conduction and withstand voltage test assembly of connector

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C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20080827

Termination date: 20151120

EXPY Termination of patent right or utility model